Method and system for pattern interconversion between multiple platforms

Abstract

The application relates to a multi-platform test pattern mutual conversion implementation method and system, which sequentially comprises the following steps: setting a current pattern spec, wherein the current pattern spec is a standard format file matched with chip test requirements; verifying the correctness of the current pattern spec; if the current pattern spec is verified to be correct, generating a specific pattern of a specific test platform according to the current pattern spec; thus, by setting the current pattern spec, i.e. by setting a standard format file, when conversion between multiple actual test platforms is required, the pattern of other actual test platforms can be converted only according to the current pattern spec of the standard format file, conversion errors and conversion troubles which are prone to occur when the pattern of one test platform is converted into the pattern of another platform are avoided, the accuracy of the pattern is ensured, there is no difference between patterns of various test platforms, and the pattern debugging efficiency is greatly optimized through the unified pattern spec file.

Description

Technical Field

[0001] This application relates to the field of pattern testing technology, and in particular to a method and system for implementing cross-platform pattern conversion. Background Technology

[0002] When semiconductor manufacturers conduct factory testing on chips, one of the most important tests is the CP (Chip Probing) development phase. CP testing, also known as wafer probing, aims to identify defective chips before packaging, thereby saving packaging costs and providing a more direct understanding of the wafer yield.

[0003] In CP testing, a crucial test is the Digital Functional Test, which involves running test vectors (patterns). The pattern is generated by the design company's DFT engineers using the ATPG (auto test pattern generation) tool. Pattern testing essentially involves adding stimuli, capturing the output, and then comparing it with the expected value.

[0004] During testing, if production capacity encounters bottlenecks and needs to be expanded, or if different analysis tools are used at different stages, testing needs to be conducted on multiple testing platforms. This necessitates pattern conversion, such as changing a pattern from one testing platform to another. However, each testing platform's pattern needs to be generated and debugged separately. The patterns have poor readability, making them inconvenient to check. Furthermore, poor readability makes it difficult to detect errors, hinders efficient saving, and significantly reduces the efficiency of pattern debugging. Summary of the Invention

[0005] Therefore, it is necessary to provide a method and system for converting test patterns across multiple platforms to improve the efficiency of pattern debugging, in order to address the aforementioned technical problems.

[0006] The technical solution of this invention is as follows:

[0007] A method for converting test patterns across multiple platforms, the method comprising:

[0008] Step S100: Set the current patternspec, wherein the current patternspec is a standard format file that matches the chip testing requirements;

[0009] Step S200: Verify the correctness of the current patternspec;

[0010] Step S300: If the current patternspec is verified to be correct, a specific pattern for a specific test platform is generated based on the current patternspec, wherein the specific pattern is used for debugging and verification by the specific test platform.

[0011] Specifically, the specific test platform includes multiple actual test platforms; the step of generating a specific pattern for a specific test platform based on the current patternspec specifically includes:

[0012] Step S310: Obtain the selected test platform from each actual test platform in the specific test platform;

[0013] Step S320: Generate a specific pattern for the selected test platform based on the current patternspec and the selected test platform.

[0014] Specifically, step S200: verifying the correctness of the current patternspec, including:

[0015] Step S210: Convert the current patternspec into a test pattern for a preset platform;

[0016] Step S220: Debug the test pattern. When the test pattern is correct, the current patternspec is determined to be correct.

[0017] Specifically, step S100: Set the current patternspec, which includes:

[0018] Step S110: Obtain chip testing requirements;

[0019] Step S120: Set the current patternspec according to the chip testing requirements.

[0020] Specifically, a multi-platform test pattern conversion system is provided, the system comprising:

[0021] The file settings module is used to set the current patternspec, wherein the current patternspec is a standard format file that matches the chip testing requirements;

[0022] The correctness verification module is used to verify the correctness of the current patternspec;

[0023] The debugging and verification module is used to generate a specific pattern for a specific test platform based on the current patternspec if the current patternspec is verified to be correct. The specific pattern is used for debugging and verification by the specific test platform.

[0024] Specifically, the debugging and verification module is also used to obtain the selected test platform from each actual test platform in the specific test platform;

[0025] Step S320: Generate a specific pattern for the selected test platform based on the current patternspec and the selected test platform.

[0026] Specifically, the correct verification module is also used for:

[0027] The current patternspec is converted into a test pattern for a preset platform; the test pattern is debugged, and if the test pattern is correct, the current patternspec is determined to be correct.

[0028] Specifically, the file settings module is also used for:

[0029] Obtain chip testing requirements; set the current patternspec according to the chip testing requirements.

[0030] A computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the steps described in the multi-platform test pattern conversion method above.

[0031] A computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps described in the above-described method for converting test patterns between multiple platforms.

[0032] The technical effects achieved by this invention are as follows:

[0033] The aforementioned method and system for converting test patterns across multiple platforms involves: first, setting a current patternspec, where the current patternspec is a standard format file matching the chip's testing requirements; verifying the correctness of the current patternspec; and second, generating a specific pattern for a specific test platform based on the current patternspec, where the current patternspec is correct. By setting the current patternspec, i.e., by setting a standard format file, when conversions between multiple actual test platforms are required, only the current patternspec in the standard format file is used for pattern conversion between other actual test platforms. This avoids the conversion errors and cumbersome problems that easily occur when converting a pattern from one test platform to another, ensuring pattern accuracy and consistency between patterns across different test platforms. The unified patternspec file significantly optimizes pattern debugging efficiency. Attached Figure Description

[0034] Figure 1 This is a flowchart illustrating a method for implementing pattern conversion across multiple platforms in one embodiment.

[0035] Figure 2 This is a flowchart illustrating a method for implementing multi-platform test pattern conversion in the prior art, as shown in one embodiment.

[0036] Figure 3 This is a simplified flowchart illustrating a method for implementing pattern conversion across multiple platforms in one embodiment.

[0037] Figure 4 This is a block diagram of a system for implementing multi-platform test pattern conversion in one embodiment;

[0038] Figure 5 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0039] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0040] In one embodiment, a terminal is provided for setting a current patternspec, wherein the current patternspec is a standard format file that matches the chip testing requirements; verifying the correctness of the current patternspec; if the current patternspec is verified to be correct, generating a specific pattern for a specific test platform based on the current patternspec, wherein the specific pattern is used for debugging and verification by the specific test platform.

[0041] The terminal may be, but is not limited to, various personal computers, laptops, smartphones, tablets, and portable wearable devices.

[0042] In one embodiment, such as Figure 1 As shown, a method for cross-platform test pattern conversion is provided, the method including:

[0043] Step S100: Set the current patternspec, wherein the current patternspec is a standard format file that matches the chip testing requirements;

[0044] Step S200: Verify the correctness of the current patternspec;

[0045] Step S300: If the current patternspec is verified to be correct, a specific pattern for a specific test platform is generated based on the current patternspec, wherein the specific pattern is used for debugging and verification by the specific test platform.

[0046] In this embodiment, the following steps are taken sequentially: First, a current patternspec is set, which is a standard format file matching the chip testing requirements. Then, the correctness of the current patternspec is verified. If the current patternspec is verified as correct, a specific pattern for a specific test platform is generated based on the current patternspec. By setting the current patternspec, i.e., by setting a standard format file, when conversion between multiple actual test platforms is required, only the current patternspec in the standard format file is used to convert the patterns for other actual test platforms. This avoids the conversion errors and cumbersome problems that easily occur when converting a pattern from one test platform to another, ensuring the accuracy of the pattern and ensuring no difference between patterns from different test platforms. Through a unified patternspec file, the efficiency of pattern debugging is greatly optimized.

[0047] In this embodiment, the format of the current patternspec is as follows:

[0048] usermode 01 00 0.001 usermode 96 usermode 69 usermode A8 testmode D0 001400 00 testmode D0 001501 00 testmode 66 testmode 99 usermode 06 usermode 01 9C 0.001 usermode 05 9F 10

[0049] The term "mode" includes user mode and test mode. User mode is the chip instruction set developed for customers. Test mode contains instructions that can only be used in test mode. "cmd" represents the instruction. The "addr" and "data" following the instruction are fixed-format content for that instruction. These can be found in the product's datasheet and test rules. Standard data only specifies distance; actual testing can be performed according to specific needs, and this application does not impose specific limitations.

[0050] In one embodiment, the specific test platform includes multiple actual test platforms; the step of generating a specific pattern for a specific test platform based on the current patternspec specifically includes:

[0051] Step S310: Obtain the selected test platform from each actual test platform in the specific test platform;

[0052] Step S320: Generate a specific pattern for the selected test platform based on the current patternspec and the selected test platform.

[0053] In existing technologies, patterns for each testing platform have their own platform-specific format, making them inconvenient to read. This inconsistency in format makes conversion from one platform to another difficult and prone to errors. In practice, conversion is typically accomplished through the development of small tools followed by extensive manual checking and debugging. This application solves these problems by using a unified patternspec file.

[0054] like Figure 2 The diagram shows a conventional side view in the prior art. In this case, if multi-platform testing is to be performed, the pattern of test platform 1 needs to be manually or using tools converted to the pattern required by test platform 2, which is prone to errors. However, in this application, as shown... Figure 3 By setting the unified patternspec file, and assuming the patternspec file is correct, it is possible to convert the pattern to any test platform using the patternspec file, thus achieving high-efficiency debugging and high-accuracy conversion.

[0055] In one embodiment, step S200: verifying the correctness of the current patternspec, specifically includes:

[0056] Step S210: Convert the current patternspec into a test pattern for a preset platform;

[0057] Step S220: Debug the test pattern. When the test pattern is correct, the current patternspec is determined to be correct.

[0058] In one embodiment, step S100: setting the current patternspec specifically includes:

[0059] Step S110: Obtain chip testing requirements;

[0060] Step S120: Set the current patternspec according to the chip testing requirements.

[0061] In one embodiment, a multi-platform test pattern conversion implementation system includes:

[0062] The file settings module is used to set the current patternspec, wherein the current patternspec is a standard format file that matches the chip testing requirements;

[0063] The correctness verification module is used to verify the correctness of the current patternspec;

[0064] The debugging and verification module is used to generate a specific pattern for a specific test platform based on the current patternspec if the current patternspec is verified to be correct. The specific pattern is used for debugging and verification by the specific test platform.

[0065] In one embodiment, the debugging and verification module is further configured to obtain the selected test platform selected from each actual test platform in the specific test platform;

[0066] Step S320: Generate a specific pattern for the selected test platform based on the current patternspec and the selected test platform.

[0067] In one embodiment, the correct verification module is further configured to:

[0068] The current patternspec is converted into a test pattern for a preset platform; the test pattern is debugged, and if the test pattern is correct, the current patternspec is determined to be correct.

[0069] In one embodiment, the file settings module is further configured to:

[0070] Obtain chip testing requirements; set the current patternspec according to the chip testing requirements.

[0071] In one embodiment, such as Figure 3 As shown, a computer device includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the steps described in the above-described multi-platform test pattern conversion method.

[0072] A computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps described in the above-described method for converting test patterns between multiple platforms.

[0073] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0074] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0075] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A method for implementing cross-platform test pattern conversion, characterized in that, The method includes: Obtain chip testing requirements; The current patternspec is set according to the chip testing requirements. The current patternspec is a standard format file that matches the chip testing requirements. The current patternspec includes the fields of mode, cmd, addr_start, addr_stop, addr_step, dummy, data, and delay. The mode includes user mode and test mode. Verifying the correctness of the current patternspec includes: converting the current patternspec into a test pattern for a preset platform; debugging the test pattern; and determining that the current patternspec is correct when the test pattern is correct. If the current patternspec is verified to be correct, then a specific pattern for a specific test platform is generated based on the current patternspec, including: obtaining a selected test platform from each actual test platform in the specific test platform; generating a specific pattern for the selected test platform based on the current patternspec and the selected test platform; wherein, the specific test platform includes multiple actual test platforms, and the specific pattern is used for debugging and verification of the specific test platform.

2. A system for converting test patterns across multiple platforms, characterized in that, The system includes: The file setting module is used to obtain chip testing requirements; and to set the current patternspec according to the chip testing requirements. The current patternspec is a standard format file that matches the chip testing requirements. The current patternspec includes the fields of mode, cmd, addr_start, addr_stop, addr_step, dummy, data, and delay. The mode includes user mode and test mode. The correctness verification module is used to verify the correctness of the current patternspec, including: converting the current patternspec into a test pattern of a preset platform; debugging the test pattern; and determining that the current patternspec is correct when the test pattern is correct. The debugging and verification module is used to generate a specific pattern for a specific test platform based on the current patternspec if the current patternspec is verified to be correct. This includes: obtaining a selected test platform from each actual test platform in the specific test platform; generating a specific pattern for the selected test platform based on the current patternspec and the selected test platform; wherein the specific test platform includes multiple actual test platforms, and the specific pattern is used for debugging and verification of the specific test platform.

3. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method of claim 1.

4. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the method of claim 1.

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