Management system, management device, management method, and program

Abstract

A management system has: a production-related data acquisition unit that acquires production-related data that is information containing a production condition related to production of a product; an optimum value calculation unit that calculates, from the production-related data, an optimum production condition that is an optimum production condition related to production of the product; an optimum value adoption determination unit that determines whether or not the optimum production condition can be adopted as a new production condition in the production device; and an optimum value setting unit that performs a process of setting the optimum production condition to the production device in accordance with a prescribed condition, the optimum value adoption determination unit determining that the optimum production condition can be adopted as a new production condition in the production device when the production condition currently adopted at the time of the determination is the same as the production condition that is a prerequisite for the optimum value calculation unit to calculate the optimum production condition.

Description

Technical Field

[0001] This invention relates to technologies for quality management and process improvement in production lines. Background Technology

[0002] In production lines for products that are becoming increasingly automated and labor-saving, inspection devices are installed in intermediate and final stages to automate defect detection and classification. Furthermore, efforts are being made to estimate the causes of defects based on the inspection results, which can then be used for quality management and production equipment maintenance.

[0003] For example, a component mounting substrate production line typically includes a process of printing solder paste on a printed wiring substrate (printing process), a process of mounting components on a substrate with printed solder paste (mounting process), a process of heating the substrate after component mounting to solder the components onto the substrate (reflow soldering process), and an inspection is performed after each process.

[0004] Furthermore, systems are known in which, in production lines with this structure, the optimal inspection criteria for optimizing the inspection of each process are calculated based on information obtained from inspections after each process, and this information is fed back to each inspection device (e.g., Patent Documents 1 and 2). In addition, systems are known in which, based on information obtained from inspections after each process, correction information for the manufacturing process (or parameters) of the manufacturing apparatus used to correct components in each process is generated and fed back to each manufacturing apparatus.

[0005] For example, Patent Documents 1 and 2 describe the following: using the inspection results of inspections performed after each process, calculating the optimal inspection standard for a certain process, and providing the user with information indicating the optimality of the calculated inspection standard; and setting the calculated inspection standard on the inspection device based on the user's approval.

[0006] Furthermore, Patent Document 3 describes the following: during the inspection after the mounting process, inspection information including the positional offset of the component mounted on the substrate is detected; based on the detected positional offset, a correction amount is calculated for the component mounting device to correct the mounting position and mount the component on the substrate; based on the correction amount, the component mounting device is used to correct the mounting position.

[0007] Furthermore, Patent Document 4 describes the following: if no abnormal offset of the component on the substrate is found in the inspection results after the mounting process, but an abnormal offset of the component is found in the inspection results after the reflow soldering process, the parameters related to the fixation of the component relative to the substrate in the reflow soldering process (temperature distribution of the reflow oven) are changed.

[0008] As described above, the optimal manufacturing conditions and inspection standards are automatically calculated based on the inspection results and applied to the manufacturing and inspection equipment. This effectively suppresses the generation of defects and missed inspections, as well as the over-inspection of defects during inspection (so-called over-inspection).

[0009] Existing technical documents

[0010] Patent documents

[0011] Patent Document 1: Japanese Patent Application Publication No. 2019-125693

[0012] Patent Document 2: Japanese Patent Application Publication No. 2019-125694

[0013] Patent Document 3: Japanese Patent Application Publication No. 2018-056447

[0014] Patent Document 4: Japanese Patent Application Publication No. 2020-043159 Summary of the Invention

[0015] The problem that the invention aims to solve

[0016] Furthermore, even if the manufacturing-related parameters (hereinafter referred to as manufacturing conditions) in the manufacturing equipment or the inspection standards in the inspection equipment are optimized based on the information from the inspection results after each process, and the optimized manufacturing conditions and inspection standards are applied to each equipment, sometimes the manufacturing efficiency and inspection efficiency will decrease instead.

[0017] Specifically, for example, in the case of a manufacturing apparatus, sometimes when the optimized manufacturing conditions are applied to the manufacturing apparatus, the manufacturing conditions currently applied are different from the manufacturing conditions on which the optimal manufacturing conditions are based. In this case, the premise of optimization changes, and therefore sometimes the expected effect is not produced or the opposite effect is produced.

[0018] Furthermore, regarding inspection devices, there are situations where changes to conditions other than the inspection reference (such as extracting inspection coordinates or parameters of the inspection object) cause changes in the measured values, making it inappropriate to apply the optimal inspection reference calculated using the measured values ​​before the change to the timing of the inspection device.

[0019] The present invention was made in view of the above circumstances, and its object is to provide a technology for making equipment maintenance and quality management more efficient in product manufacturing equipment.

[0020] Methods for solving problems

[0021] To achieve the above objectives, the present invention employs the following structure: a management system for a product production equipment, comprising: a production-related data acquisition unit that acquires production-related data containing information about production conditions related to the production of the product; an optimal value calculation unit that calculates optimal production conditions, which are the best production conditions related to the production of the product, based on the production-related data; an optimal value adoption determination unit that determines whether the optimal production conditions can be adopted as new production conditions in the production equipment; and an optimal value setting unit that performs a process of setting the optimal production conditions to the production equipment according to predetermined conditions, wherein the optimal value adoption determination unit determines that the optimal production conditions can be adopted as new production conditions in the production equipment if the production conditions currently adopted at the time of determination are the same as the production conditions that the optimal value calculation unit uses as a premise for calculating the optimal production conditions.

[0022] Here, "production equipment" refers to all equipment used to produce products, including manufacturing apparatus, inspection apparatus, and combinations thereof (i.e., multiple apparatus groups). Furthermore, "production conditions" refers to various processes, parameters, and standards related to product production, such as parameters used in manufacturing apparatus and inspection conditions (including various inspection standards) used in inspection apparatus. Additionally, "production-related data" may include the names and revisions of information processing programs executed in each production apparatus. Furthermore, in this specification, the term "setting" is used to also include the meaning of change. Moreover, in this specification, the term "product" is used to include not only finished products but also so-called intermediate products.

[0023] An inspection system with the structure described above can prevent situations where the calculated optimal production conditions (e.g., manufacturing conditions, inspection standards) differ from the current production conditions used in the equipment, thus directly applying the calculated optimal production conditions. Therefore, in situations where the optimal production conditions should not be reflected (i.e., it is unclear whether the conditions are optimal), accidental changes to production conditions can be prevented, and maintenance of the production equipment can be made more efficient without compromising quality.

[0024] Alternatively, if the result of the determination in the optimal value setting unit is acceptable, the optimal value setting unit may perform a process of setting the optimal production conditions on the production equipment.

[0025] With such a structure, if the judgment result is acceptable, the optimal production conditions can be automatically reflected in each production equipment. Therefore, the time spent setting production conditions can be reduced, which can help to improve the efficiency of production equipment.

[0026] Alternatively, the management system may also include: an output unit that outputs at least the result of the determination; and an input unit that, when the optimal value setting unit receives an instruction via the input unit that it intends to reflect the optimal production conditions in the production equipment, performs the process of setting the optimal production conditions in the production equipment.

[0027] With this structure, production equipment managers can determine whether the optimal production conditions are actually reflected after confirming the determination result of the determination unit for the optimal value. Thus, for example, regardless of the differences between the production conditions used as a basis for calculating the optimal production conditions and the currently used production conditions, the optimal production conditions can be flexibly set through the manager's judgment.

[0028] Alternatively, the management system may also include an optimal value setting result acquisition unit, which acquires information on whether the optimal production conditions have been set on the production equipment. With this structure, information on whether the optimal production conditions have been set on the production equipment and, if so, the timeframe, can be obtained, allowing confirmation of any improvement before and after processing.

[0029] Alternatively, the production-related data may include information on the version of the production program used for information processing related to the operation of the production equipment. If the version of the production program currently used at the time of determination is the same as the version of the production program that serves as the premise for the optimal production conditions calculated by the optimal value calculation unit, the optimal value determination unit determines that the production conditions are the same, and the optimal production conditions can be adopted as the new production conditions in the production equipment.

[0030] Here, "production procedure for information processing related to the operation of the production equipment" refers to the procedure executed in each production device (e.g., manufacturing apparatus, inspection apparatus, etc.). Furthermore, "information for determining the version number of the production procedure" may, for example, refer to the name and version of the manufacturing procedure executed in the manufacturing apparatus, the name and version of the inspection procedure executed in the inspection apparatus, etc.

[0031] Alternatively, the production-related data may include product component information and their versions related to the product components of the product, and the information for determining the version of the production process may include the version of the product component information.

[0032] Here, "product component" refers to the various elements that constitute a product, such as electronic product components like IC chips, printed circuit boards (the so-called original substrate), solder, etc., included in a component mounting substrate. Furthermore, "product component information" refers to information related to product components. This could include component numbers, component number groups formed by grouping multiple different component numbers that meet specified conditions (e.g., components of the same shape, components for the same purpose), or data managed in units of components that meet specific conditions (e.g., installed in a specific location) (e.g., a component number database). Additionally, it may include reel IDs, product component manufacturing batches, product component types, product component shapes, and the position of product components on the substrate. Moreover, "product component information version" means the version number of the component number, the version number of a component number group formed by grouping multiple different component numbers that meet specified conditions, or the version number of information related to components that meet specific conditions.

[0033] With this structure, even if the version of the production process remains unchanged, new production conditions can be prevented from being set unintentionally if the version of the product component information differs between the optimal value calculation and the availability determination, provided that product component information is managed outside the production process.

[0034] Alternatively, the production-related data may include product component information and version information related to the product components of the product. For the version related to the product component information of a specific product component of the product, if the version currently used at the time of determination is the same as the version that is the premise for the optimal value calculation unit to calculate the optimal production conditions, the optimal value is determined by the determination unit to be the same production conditions, and the optimal production conditions can be used as the new production conditions in the production equipment.

[0035] Therefore, it is possible to determine, on a unit basis, whether the production conditions used as the premise for calculating the optimal value are the same as the currently used production conditions, based on each individual production component (or grouped production components) in the product. That is, in the case where the optimal production conditions related to a specific product component are calculated, production conditions can be set regardless of differences in production process versions and without affecting the production conditions of other product components.

[0036] Alternatively, the production equipment may have a manufacturing apparatus that manufactures the product. The production-related data acquired by the production-related data acquisition unit includes manufacturing content data, which contains information about manufacturing conditions in the manufacturing apparatus related to the manufacturing of the product. The optimal value calculation unit calculates at least the optimal manufacturing conditions as the best manufacturing conditions related to the manufacturing. The optimal value adoption determination unit determines that the optimal manufacturing conditions can be adopted as new manufacturing conditions in the manufacturing apparatus if the manufacturing conditions currently used at the time of determination are the same as the manufacturing conditions that the optimal value calculation unit uses to calculate the optimal manufacturing conditions. The optimal value setting unit performs a process of setting the optimal manufacturing conditions in the manufacturing apparatus according to the specified conditions.

[0037] Here, "manufacturing apparatus" refers to various apparatuses used to manufacture products, such as the apparatuses on a production line that includes solder printers, pick-and-place machines, reflow ovens, etc., for mounting substrates, the apparatuses for manufacturing various product components that make up the substrate, and the apparatuses for manufacturing solder. Furthermore, "manufacturing conditions" include, for example, various mounting parameters in solder printers, pick-and-place machines, reflow ovens, etc., on a component mounting substrate production line. Mounting parameters, for example, in a pick-and-place machine, include the component's adsorption coordinates, mounting coordinates, shape model, and dimensions. More specifically, it may also include the substrate's individual component number, circuit number, component number, etc. Additionally, "manufacturing content data" may include information such as various product components used in the manufacturing apparatus, various apparatus components that constitute the manufacturing apparatus, and error information detected during manufacturing. Furthermore, it may also include the name and version of the installation program executed in the manufacturing apparatus. Moreover, it may also include information on the product components used in the installation program and their versions; this product component information may also be managed outside the manufacturing process.

[0038] With such a structure, it is possible to prevent the direct application of the calculated optimal manufacturing conditions when the manufacturing conditions that serve as the premise for calculating the optimal manufacturing conditions differ from the currently used manufacturing conditions.

[0039] Alternatively, the production equipment may have an inspection device for inspecting the product, and the production-related data acquired by the production-related data acquisition unit may include inspection content data and inspection result data. The inspection content data may include the inspection conditions in the inspection, and the inspection result data may be information related to the result of the inspection. The optimal value calculation unit may at least calculate an optimal inspection benchmark as the best inspection benchmark related to the inspection. The optimal value adoption determination unit may determine that the optimal inspection benchmark can be adopted as a new inspection benchmark in the inspection device if, at least at the time of determination, the inspection conditions currently used are the same as the inspection conditions that the optimal value calculation unit uses to calculate the optimal inspection benchmark. The optimal value setting unit may perform a process of setting the optimal inspection benchmark in the inspection device according to the specified conditions.

[0040] Here, "inspection device" refers to, for example, a device that performs inspections such as solder printing inspection (SPI), automated optical inspection (AOI), and automated X-ray inspection (AXI), or it can be an inspection device that reflects information from visual inspection. Furthermore, an inspection device may be built into the manufacturing apparatus. In addition, "inspection conditions" include, in addition to the inspection items for each product and the inspection criteria for those items (e.g., a threshold for determining good or bad), the extraction of inspection coordinates, parameters of the inspected object, and whether a comparison with the inspection criteria is performed for each item. Furthermore, "inspection content data" may include the name and version of the inspection program executed in the inspection device. It may also include product component information and its version used in the inspection program, which can be managed outside the inspection program. Furthermore, "inspection result data" refers not only to the product's good or bad determination result but also includes the measured values ​​of the inspected object measured during the inspection.

[0041] With this structure, the following situation can be prevented: if the inspection conditions that serve as the premise for calculating the optimal inspection criterion are different from the inspection conditions currently being used, the calculated optimal inspection criterion can be directly adopted.

[0042] Furthermore, the production equipment includes: a manufacturing apparatus for manufacturing the product; and an inspection apparatus for inspecting the product. The production-related data acquired by the production-related data acquisition unit includes: manufacturing content data, which contains information about manufacturing conditions related to the manufacturing of the product in the manufacturing apparatus; inspection content data, which contains inspection conditions during the inspection; and inspection result data, which contains information about the results of the inspection. The optimal value calculation unit calculates at least the optimal manufacturing conditions as the best manufacturing conditions related to the manufacturing based on the manufacturing content data, the inspection content data, and the inspection result data. The optimal value adoption determination unit determines that the optimal manufacturing conditions can be adopted as new manufacturing conditions in the manufacturing apparatus if the manufacturing conditions and inspection conditions that are the premise for the optimal value calculation unit to calculate the optimal manufacturing conditions are the same as the manufacturing conditions and inspection conditions currently used at the time of determination. The optimal value setting unit performs a process of setting the optimal manufacturing conditions in the manufacturing apparatus according to the prescribed conditions.

[0043] Even when optimal manufacturing conditions are set for the manufacturing apparatus, there are situations where the inspection conditions currently used in the inspection apparatus change from those used as a basis for calculating the optimal manufacturing conditions. For example, sometimes the inspection criteria become stricter to further improve product quality, or conversely, sometimes the inspection criteria become more lenient (i.e., the tolerance for quality deviations increases) to prioritize production speed. In such cases, the optimal manufacturing conditions calculated based on how the inspection apparatus makes its judgments may no longer be optimal when the manufacturing apparatus is set. However, with the structure described above, accidental changes to the manufacturing conditions can be prevented in such situations.

[0044] Furthermore, the optimal value calculation unit calculates at least one optimal inspection benchmark as the best inspection benchmark related to the inspection based on the manufacturing content data, the inspection content data, and the inspection result data. The optimal value adoption determination unit determines that the optimal inspection benchmark can be used as the new inspection benchmark in the inspection device if the manufacturing conditions and the inspection conditions, which are the premise for the optimal value calculation unit to calculate the optimal inspection benchmark, are the same as the manufacturing conditions and the inspection conditions currently used at the time of determination. The optimal value setting unit performs the process of setting the optimal inspection benchmark in the inspection device according to the prescribed conditions.

[0045] Even when the optimal inspection standard is set at the manufacturing apparatus, there is a possibility that the manufacturing conditions currently used in the manufacturing apparatus at that time may change from the manufacturing conditions that were the premise for calculating the optimal inspection standard. For example, the manufacturing conditions may be changed to manufacture a higher-grade product. In such cases, the optimal inspection standard calculated based on the level of product manufacturing by the manufacturing apparatus may no longer be optimal when the inspection apparatus is set. Regarding this point, if there is a structure as described above, then in such cases, accidental changes to the inspection standard can be prevented.

[0046] Furthermore, the present invention can be understood as a management device for a product production equipment, wherein the management device comprises: a production-related data acquisition unit that acquires production-related data as information containing production conditions related to the production of the product; an optimal value calculation unit that calculates optimal production conditions as the best production conditions related to the production of the product based on the production-related data; an optimal value adoption determination unit that determines whether the optimal production conditions can be adopted as new production conditions in the production equipment; and an optimal value setting unit that performs a process of setting the optimal production conditions to the production equipment according to predetermined conditions, wherein the optimal value adoption determination unit determines that the optimal production conditions can be adopted as new production conditions in the production equipment if the production conditions currently adopted at the time of determination are the same as the production conditions that the optimal value calculation unit uses as a premise for calculating the optimal production conditions.

[0047] Furthermore, the present invention can be understood as a management method for production equipment of a product, wherein the management method comprises: a production-related data acquisition step, acquiring production-related data as information containing production conditions related to the production of the product; an optimal value calculation step, calculating optimal production conditions as the best production conditions related to the production of the product based on the production-related data; an optimal value adoption determination step, determining whether the optimal production conditions can be adopted as new production conditions in the production equipment; and an optimal value setting step, performing a process of setting the optimal production conditions to the production equipment according to predetermined conditions, wherein in the optimal value adoption determination step, if the production conditions currently adopted at the time of determination are the same as the production conditions that are the premise for calculating the optimal production conditions in the optimal value calculation step, it is determined that the optimal production conditions can be adopted as new production conditions in the production equipment.

[0048] Furthermore, the present invention can also be understood as a program for causing a computer to perform the above-described methods, and a computer-readable recording medium that non-temporarily records such a program. Moreover, the various structures and processes described above can be combined with each other to constitute the present invention when there is no technical contradiction.

[0049] Invention Effects

[0050] According to the present invention, a technology is provided for improving the efficiency of equipment maintenance and quality management in product manufacturing equipment. Attached Figure Description

[0051] Figure 1 This is a schematic diagram of the production equipment management system in an application example.

[0052] Figure 2 This is a flowchart illustrating the processing flow in a production equipment management system, as shown in an application example.

[0053] Figure 3 This is a schematic diagram of the production equipment management system implemented in this way.

[0054] Figure 4 This is a functional block diagram of the production equipment management system implemented in this way.

[0055] Figure 5 This is a flowchart illustrating the processing flow in a production equipment management system according to an embodiment.

[0056] Figure 6 This is a schematic structural diagram of a production equipment management system, illustrating a modified example of the implementation method. Detailed Implementation

[0057] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, unless otherwise specified, the dimensions, materials, shapes, and relative arrangements of the structural elements described in the following examples are not intended to limit the scope of the present invention.

[0058] <Application Example>

[0059] This invention can be applied, for example, as follows: Figure 1 The production equipment management system 9 is shown in the figure. The production equipment management system 9 is a system for managing chip mounters (hereinafter referred to as mounters) in a surface mount production line for printed circuit boards, and has mounters 91, mounting inspection devices 92, and management devices 93 as structural elements. Moreover, these structures are interconnected via a network such as a LAN.

[0060] The pick-and-place machine 91 is a device for picking up electronic components to be mounted on a substrate and placing the components on solder paste at the corresponding locations.

[0061] The mounting inspection device 92 is a device used to inspect the configuration status of electronic components on a substrate transported from the pick-and-place machine 91, such as... Figure 1 As shown, the system includes functional modules such as an inspection implementation unit 921, an optimal inspection standard adoption determination unit 922, and an inspection standard setting unit 923. In the inspection implementation unit 921, the arrangement of components (which may be part of the component body, electrodes, etc.) mounted on the solder paste is measured in two or three dimensions according to the prescribed inspection content. Based on the measurement results, it is determined whether various inspection items are within normal values ​​(allowable ranges). The functions of the optimal inspection standard adoption determination unit 922 and the inspection standard setting unit 923 will be described later.

[0062] Although not shown, the management device 93 is composed of a general-purpose computer system having a CPU (processor), main storage device (memory), auxiliary storage device (hard disk, etc.), input device (keyboard, mouse, controller, touch panel, etc.), and output device (monitor, printer, speaker, etc.).

[0063] like Figure 1 As shown, the management device 93 includes functional modules such as a manufacturing content data acquisition unit 931, an inspection content data acquisition unit 932, an inspection result data acquisition unit 933, an optimal inspection benchmark calculation unit 934, an optimal inspection benchmark reflection result acquisition unit 935, and a display unit 936. These functional modules can also be implemented, for example, by the CPU reading and executing programs stored in a storage device.

[0064] The manufacturing content data acquisition unit 931 acquires information related to the manufacturing content (hereinafter referred to as manufacturing content data). This manufacturing content includes information related to various electronic components, substrates, solders, and other components used in the pick-and-place machine 91; component adsorption coordinates; mounting coordinates; component shape models; dimensions; and various mounting parameters; the name and version of the installation procedure executed in the pick-and-place machine 91. Additionally, the information acquired may also include information related to the device components constituting the pick-and-place machine 91, and information on errors detected during the mounting process.

[0065] The inspection content data acquisition unit 932 acquires information related to the inspection content (hereinafter referred to as inspection content data). The inspection content includes, in addition to, the inspection items installed in the inspection device 92 and the inspection criteria for the inspection items (e.g., the threshold for judging whether it is good or bad), the name and version of the inspection program executed in the inspection device 92, such as the extraction of inspection coordinates and parameters of the inspection object.

[0066] The inspection result data acquisition unit 933 acquires the inspection result information (hereinafter referred to as inspection result data) of the installed inspection device 92. In addition, the inspection results mentioned here include not only the judgment result of whether the product is good or bad, but also information such as the measured values ​​of each component.

[0067] The optimal inspection benchmark calculation unit 934 calculates the optimal inspection benchmark based on information obtained by the manufacturing content data acquisition unit 931, the inspection content data acquisition unit 932, and the inspection result data acquisition unit 933. Specifically, for example, by performing simulated inspections, the calculation aims to reduce the number of defects missed or over-inspected compared to the current inspection benchmark. If such an inspection benchmark cannot be calculated, the current inspection benchmark becomes the optimal inspection benchmark.

[0068] The display unit 936 can be, for example, a liquid crystal display, and as described later, output (display) the information obtained by the optimal inspection benchmark reflection result acquisition unit 935.

[0069] Next, according to Figure 2 The process of setting the optimal inspection benchmark in the production equipment management system 9 is explained. First, the management device 93 is triggered by user instructions, the arrival of a predetermined time, etc., and the manufacturing content data acquisition unit 931 acquires manufacturing content data (S101), the inspection content data acquisition unit 932 acquires inspection content data (S102), and the inspection result data acquisition unit 933 acquires inspection result data (S103).

[0070] Next, the management device 93 calculates the optimal inspection criteria by the optimal inspection criteria calculation unit 934, and sends the calculated inspection criteria and information that can determine the inspection conditions (including the inspection criteria) that are prerequisites for calculating the inspection criteria to the inspection device (S104). Here, the information that can determine the inspection conditions that are prerequisites for calculating the inspection criteria can be, for example, the name of the inspection program and its version. In addition, in the case where the inspection criteria are managed outside the inspection program, the information that can determine the inspection criteria managed outside the inspection program (e.g., the version of the part number library) can also be used.

[0071] Next, the optimal inspection standard adoption determination unit 922 determines whether the calculated optimal inspection standard can be used as a new inspection standard for the installation inspection device 92 (S105). Specifically, it determines whether the inspection conditions currently used in the inspection device are the same as the inspection conditions that are the premise for calculating the inspection standard sent in step S104. For example, if the information of the inspection conditions that are the premise for calculating the optimal inspection standard can be determined as the name and version of the inspection program, it can be compared with the version of the inspection program currently used in the inspection device to determine whether they are the same. In addition, if the information of the inspection conditions that are the premise for calculating the optimal inspection standard can be determined, for example, if the version of the part number library of the inspection standard managed outside the inspection program can be determined, it can be compared with the version of the part number library referenced by the inspection program.

[0072] If it is not determined in step S105 that the optimal inspection benchmark can be used as the new inspection benchmark, a message indicating this intention is sent to the management device 93, and the process proceeds to step S107. In this case, the inspection conditions that are the premise for calculating the optimal inspection benchmark have changed. Directly using the inspection benchmark calculated in step S104 in the installation inspection device 92 will not only have no effect, but may also have the opposite effect. Therefore, no setting (change) of the inspection benchmark is performed.

[0073] On the other hand, when it is determined in step S105 that the best inspection standard can be used as the new inspection standard, the inspection device 92 is set by the inspection standard setting unit 923 to the best inspection conditions calculated in step S104 as the new inspection standard in the inspection device 92, and this intention is sent to the management device 93 (S106) to proceed to step S107.

[0074] Furthermore, the management device 93 obtains information from the optimal inspection reference reflection result acquisition unit 935 regarding whether the inspection reference calculated in step S104 has been reflected in the installation inspection device 92 (S107), displays this information on the display unit 936 (S108), and ends a series of processes.

[0075] Here, if the inspection criteria of the inspection device are changed in step S106, the following message may be displayed on the display unit 936: The inspection criteria for installing the inspection device 92 has been updated to the optimal inspection criteria. On the other hand, if it is determined in step S105 that the inspection conditions currently used in the inspection device are different from the inspection conditions that are the premise for calculating the optimal inspection criteria, an interface screen may be displayed that message and accept user instructions on whether to set the inspection criteria calculated in step S104 as the new inspection criteria for installing the inspection device 92.

[0076] As described above, the production equipment management system 9 according to this application example can calculate the optimal inspection standard among the installation inspection devices 92 configured in the production line, and automatically determine whether it is appropriate to use the optimized inspection standard as a new inspection standard for the installation inspection device 92. Then, if it is determined that it is appropriate to use it as a new inspection standard, the inspection standard is automatically set on the installation inspection device 92; if it is determined that it is inappropriate, the setting of the inspection standard is rejected (or retained). Therefore, it is possible to prevent the accidental setting of an inappropriate inspection standard on the installation inspection device 92, and to automatically optimize the inspection standard.

[0077] <Implementation Method>

[0078] The following provides a more detailed description of an example of a method for implementing the present invention.

[0079] (System Architecture)

[0080] Figure 3 This illustration schematically shows a structural example of the production equipment management system 1 in the surface mount production line of the printed circuit board according to this embodiment. Surface mount (SMT) refers to the technology of soldering electronic components onto the surface of a printed circuit board. The surface mount production line mainly consists of three processes: solder printing, component mounting, and reflow soldering (solder cladding).

[0081] like Figure 3 As shown, on a surface mount production line, as a manufacturing apparatus, a solder printing unit X1, a pick-and-place machine X2, and a reflow oven X3 are sequentially arranged from the upstream side. The solder printing unit X1 is a device that prints paste solder onto the electrode portions (called pads) of a printed circuit board using screen printing. The pick-and-place machine X2 is a device for picking up electronic components to be mounted on the substrate and placing the components onto the corresponding solder paste; it is also called a chip mounter. The reflow oven X3 is a heating device for heating and melting the solder paste, then cooling it to solder the electronic components onto the substrate. When there are many or many types of electronic components mounted on the substrate, multiple pick-and-place machines X2 may be installed on the surface mount production line. Furthermore, as described later, the solder printing unit X1, the pick-and-place machine X2, and the reflow oven X3 each have functional sections for manufacturing execution, judgment, and manufacturing condition setting. These functions will be explained later.

[0082] Solder printing inspection apparatus Y1 is used to inspect the solder paste printing status on a substrate transported from solder printing apparatus X1. In solder printing inspection apparatus Y1, the solder paste printed on the substrate is measured in two or three dimensions, and various inspection items are determined based on the measurement results to ensure they are within acceptable limits. Inspection items include, for example, the volume, area, height, positional offset, and shape of the solder. Image sensors (cameras) can be used for two-dimensional solder paste measurement, while laser displacement meters, phase-shift methods, spatial coding methods, and optical cut-off methods can be used for three-dimensional measurement.

[0083] The mounting inspection device Y2 is used to inspect the configuration status of electronic components on a substrate transported from the pick-and-place machine X2. In the mounting inspection device Y2, components (which may be the component body, electrodes, or other parts of the component) mounted on solder paste are measured in two or three dimensions. Based on the measurement results, various inspection items are determined to be within acceptable ranges. Inspection items include, for example, component positional offset, angular (rotational) offset, missing components, different components, different polarities (electrode polarities differ between the component side and the substrate side), reversed orientation (components are positioned facing the back), and component height. Similar to solder printing inspection, image sensors (cameras) can be used for two-dimensional measurement of electronic components, while laser displacement meters, phase-shift methods, spatial coding methods, and optical cut-off methods can be used for three-dimensional measurement.

[0084] The visual inspection device Y3 is used to inspect the soldering quality of substrates transported from the reflow oven X3. In the visual inspection device Y3, two-dimensional or three-dimensional measurements are performed on the solder portion after reflow soldering, and various inspection items are judged to be within normal values ​​(allowable ranges) based on the measurement results. The inspection items include those similar to those for component inspection, as well as the quality of the solder joint shape. In measuring the shape of the solder, in addition to methods such as laser displacement meters, phase shift methods, spatial coding methods, and optical cut-off methods mentioned above, a so-called color highlighting method can also be used (a method that uses R, G, and B illumination at different incident angles to illuminate the solder surface, and detects the three-dimensional shape of the solder as two-dimensional color information by capturing the reflected light of each color using a top camera).

[0085] X-ray inspection apparatus Y4 is a device for inspecting the solder joint condition of a substrate using X-ray imaging. For example, in the case of packaged components such as BGA (Ball Grid Array) and CSP (Chip Size Package), and multilayer substrates, the solder joints are hidden beneath the component or substrate, making it impossible to inspect the solder condition using visual inspection apparatus Y3 (i.e., visual image). X-ray inspection apparatus Y4 compensates for this weakness of visual inspection. Inspection items performed by X-ray inspection apparatus Y4 include, for example, component positional offset, solder height, solder volume, solder ball diameter, length of back solder pads, and solder joint quality. Furthermore, X-ray transmission images can be used as the X-ray image, but CT (Computed Tomography) images are preferred.

[0086] Furthermore, as described later, the inspection devices Y1, Y2, Y3, and Y4 each have a functional section comprising an inspection implementation section, a judgment section, and an inspection reference setting section. These functions will be explained later.

[0087] (Management device)

[0088] The manufacturing devices X1, X2, X3 and inspection devices Y1, Y2, Y3, Y4 described above are connected to the management device 10 via a network (LAN). The management device 10 is a system responsible for managing and controlling the manufacturing devices X1, X2, X3 and inspection devices Y1, Y2, Y3, Y4. Although not shown in the diagram, it consists of a general-purpose computer system with a CPU (processor), main storage device (memory), auxiliary storage device (hard disk, etc.), input device (keyboard, mouse, controller, touch panel, etc.), and display device. The functions of the management device 10, described later, are implemented by the CPU reading and executing programs stored in the auxiliary storage device.

[0089] Furthermore, the management device 10 can be composed of one computer or multiple computers. Alternatively, all or part of the functions of the management device 10 can be installed in the computer built into any of the manufacturing devices X1, X2, X3, and inspection devices Y1, Y2, Y3, Y4. Alternatively, part of the functions of the management device 10 can be implemented through a server on a network (such as a cloud server).

[0090] (Explanation of each functional department)

[0091] The production equipment management system 1 of this embodiment has the function of enabling production equipment managers to efficiently maintain and manage the quality of equipment. Figure 4A block diagram showing the functional parts of the management device 10, each manufacturing device X1, X2, X3 and each inspection device Y1, Y2, Y3 and Y4 is shown.

[0092] like Figure 4 As shown, the management device 10 has functional units including a manufacturing content data acquisition unit 101, an inspection content data acquisition unit 102, an inspection result data acquisition unit 103, an optimal manufacturing condition calculation unit 104, an optimal inspection reference calculation unit 105, an optimal value reflection result acquisition unit 106, and a display unit 107.

[0093] The manufacturing content data acquisition unit 101 acquires information related to the manufacturing content (hereinafter referred to as manufacturing content data). This manufacturing content includes information related to various electronic components, substrates, solder, and other components used in each of the solder printing apparatus X1, the pick-and-place machine X2, and the reflow oven X3; various installation (manufacturing) parameters; and the name and version of the manufacturing process executed in each manufacturing apparatus. Additionally, the information acquired may also include information related to the device components constituting each of the manufacturing apparatuses X1, X2, and X3, and information on errors detected during the manufacturing process.

[0094] The manufacturing content data acquisition unit 101 acquires information related to the inspection content (hereinafter referred to as inspection content data). In addition to the inspection items in each inspection device Y1, Y2, Y3, Y4 and the inspection criteria for the inspection items (e.g., the threshold for determining whether it is good or bad), the inspection content also includes the name and version of the inspection program executed in each inspection device Y1, Y2, Y3, Y4, such as the extraction of inspection coordinates and parameters of the inspection object.

[0095] The inspection result data acquisition unit 103 acquires the inspection result information (hereinafter referred to as inspection result data) of each inspection device Y1, Y2, Y3, and Y4. In addition, the inspection results mentioned here include not only the judgment result of whether the product is good or bad, but also information such as the measured values ​​of each component.

[0096] The optimal manufacturing condition calculation unit 104 calculates the optimal manufacturing conditions for each of the manufacturing units X1, X2, and X3 based on manufacturing content data, inspection content data, and inspection result data. Specifically, it calculates the optimized conditions for various parameters in each of the manufacturing units X1, X2, and X3 based on error information, inspection results, etc.

[0097] The optimal manufacturing conditions calculated in this way, together with information on the manufacturing conditions that are the premise for calculating the manufacturing conditions (e.g., the name of the manufacturing process and its version), are sent by a communication unit (not shown) to the manufacturing apparatus being addressed, and a decision on whether to adopt the conditions is received as described later.

[0098] Furthermore, the manufacturing conditions sent here can contain all information related to the manufacturing conditions, or they can specify only the changes (parameter items, changed parts, changed content) to the manufacturing conditions that are the premise for calculating the optimal manufacturing conditions. Alternatively, the manufacturing conditions that are the premise for calculating the optimal manufacturing conditions can also be sent at the same time.

[0099] For example, the manufacturing conditions sent to the solder printing apparatus X1 can include the mask cleaning frequency (the value of N when cleaning N substrates once), and the mask offset value (the difference between the X-coordinate, Y-coordinate, and rotation angle from the current position) as alignment parameters between the mask and the substrate. Furthermore, the manufacturing conditions sent to the pick-and-place machine X2 can include the component mounting coordinates (actual coordinates or offset values ​​relative to the current position), component dimensions, etc. Additionally, the manufacturing conditions sent to the reflow oven X3 can include the temperature distribution of each layer within the oven (the temperature to be set or the offset value relative to the current temperature), etc.

[0100] The optimal inspection benchmark calculation unit 105 calculates the optimal inspection benchmark among each inspection device Y1, Y2, Y3, and Y4 based on manufacturing content data, inspection content data, and inspection result data. Specifically, for example, by performing simulated inspections, the calculation aims to reduce the number of defective omissions or over-inspections compared to the current inspection benchmark. If such an inspection benchmark cannot be calculated, the current inspection benchmark becomes the optimal inspection benchmark.

[0101] The optimal inspection benchmark calculated in this way, together with information on the inspection conditions that determine the premise for calculating the inspection benchmark (e.g., the inspection program name and its version), is sent by a communication unit (not shown) to the inspection device being inspected, and a decision on whether to adopt the conditions is received as described later.

[0102] In addition, the content of the inspection benchmark sent here may contain all information related to the inspection benchmark, or it may only specify the changes (inspection items, changed parts, changed content) to the inspection benchmark that is the premise for calculating the optimal inspection benchmark.

[0103] Furthermore, the information sent varies depending on the relationship between the inspection procedure and the inspection criteria. For example, in an inspection procedure that has all inspection criteria valid only within a single procedure, where each inspection part (e.g., component number, circuit number, terminal number) has inspection items and inspection criteria, the content of the inspection criteria is changed for each inspection item of the inspection part for which the inspection criteria are to be changed. Alternatively, in a case where each component number has inspection items and inspection criteria, the content of the inspection criteria is changed for each component number (or terminal number if necessary) and inspection item for which the inspection criteria are to be changed. In this case, when a new inspection criterion is adopted in the inspection device, the inspection procedure itself is changed.

[0104] On the other hand, in cases where inspection criteria are managed outside of inspection procedures, such as when each part number has an inspection criterion and this criterion is used in multiple inspection procedures, the content of the inspection criterion is changed according to each part number (terminal number if necessary) and inspection item for which the inspection criterion needs to be changed. In this case, when a new inspection criterion is adopted in the inspection device, data outside the inspection procedure is changed, such as the part number library (part shape, part color, inspection item / inspection criterion, etc.), without changing the inspection procedure.

[0105] As described below, the optimal value reflection result acquisition unit 106 acquires information including whether the manufacturing conditions calculated by the optimal manufacturing conditions calculation unit 104 and / or the inspection criteria calculated by the optimal inspection criteria calculation unit 105 have been reflected in each manufacturing device and / or each inspection device. The display unit 107 outputs at least the information acquired by the optimal value reflection result acquisition unit 106.

[0106] Manufacturing implementation units 211, 311, and 411 are functional units that perform manufacturing processes in each manufacturing apparatus. For example, in manufacturing implementation unit 211 of solder printing apparatus X1, the process of printing paste solder onto pads on a printed circuit board by screen printing is performed. Similarly, in manufacturing implementation unit 311 of pick-and-place machine X2, the process of picking up electronic components to be mounted on a substrate and placing the components onto solder paste at the corresponding locations is performed. Furthermore, in manufacturing implementation unit 411 of reflow oven X3, the process of bonding electronic component solder to the substrate by heating and melting solder paste and then cooling it is performed.

[0107] The determination units 212, 312, and 412 of each manufacturing apparatus X1, X2, and X3 determine whether the optimal manufacturing conditions received by the communication unit (not shown) can be used as new manufacturing conditions in each manufacturing apparatus. Specifically, they determine whether the manufacturing conditions currently used in each manufacturing apparatus are the same as the manufacturing conditions that are the premise for calculating the optimal manufacturing conditions by the optimal manufacturing conditions calculation unit 104. For example, if it can be determined that the information of the manufacturing conditions that are the premise for calculating the optimal manufacturing conditions is the name of the manufacturing program and its version, it can be determined whether they are the same by comparing it with the version of the manufacturing program currently used in the manufacturing apparatus.

[0108] Furthermore, if it is determined that the optimal manufacturing conditions can be used as new manufacturing conditions in each manufacturing apparatus, the manufacturing condition setting units 213, 313, and 413 of each manufacturing apparatus X1, X2, and X3 respectively set the optimal manufacturing conditions as new manufacturing conditions for each manufacturing apparatus. On the other hand, if it is not determined that the optimal manufacturing conditions can be used as new manufacturing conditions, the adoption of the optimal manufacturing conditions in each manufacturing apparatus is retained (i.e., no change occurs in the manufacturing conditions of each manufacturing apparatus).

[0109] Inspection implementation units 221, 321, 421, and 431 are functional units that perform the inspections described above in each inspection device Y1, Y2, Y3, and Y4.

[0110] Furthermore, the determination units 222, 322, 422, and 432 of each inspection device Y1, Y2, Y3, and Y4 determine whether the optimal inspection standard received by the communication unit (not shown) can be used as a new inspection standard in each inspection device. Specifically, for example, it determines whether the inspection conditions currently used in the inspection device are the same as the inspection conditions that are the premise for calculating the inspection standard. If they are the same, it is determined that the optimal inspection standard can be used as a new inspection standard in each inspection device. Regarding whether they are the same, for example, if the information of the inspection conditions that are the premise for calculating the optimal inspection standard can be determined as the inspection program name and its version, it can be determined whether they are the same by comparing it with the version of the inspection program currently used in the inspection device. Furthermore, if the information of the inspection conditions that are the premise for calculating the optimal inspection standard can be determined, for example, if the version of the part number library of inspection standards managed outside the inspection program can be determined, it is sufficient to compare it with the version of the part number library referenced by the inspection program.

[0111] Furthermore, if it is determined that the optimal inspection standard can be used as the new inspection standard in each inspection device, the inspection standard setting units 223, 323, 423, and 433 of each inspection device Y1, Y2, Y3, and Y4 respectively set the inspection standard as the new inspection standard in each inspection device. On the other hand, if it is not determined that the optimal inspection standard can be used as the new inspection standard, the adoption of the optimal inspection standard in each inspection device is retained (i.e., no change is made to the inspection standard in each inspection device).

[0112] Information on whether optimal manufacturing conditions have been set as new manufacturing conditions in each of the manufacturing devices X1, X2, and X3, and whether optimal inspection standards have been set as new inspection standards in each of the inspection devices Y1, Y2, Y3, and Y4, is sent from each device to the management device 10 and obtained by the optimal value reflection result acquisition unit 106.

[0113] The information obtained by the optimal value reflection result acquisition unit 106 is displayed on the display unit 107. Specifically, for example, this meaning can also be displayed when optimal manufacturing conditions are set as new manufacturing conditions in each of the manufacturing devices X1, X2, and X3, and optimal inspection standards are set as new inspection standards in each of the inspection devices Y1, Y2, Y3, and Y4. On the other hand, when optimal manufacturing conditions and optimal inspection standards are not used, an interface screen can also be displayed, which expresses this meaning and accepts user instructions.

[0114] Furthermore, the calculation of the optimal manufacturing conditions, the determination of whether the optimal manufacturing conditions can be adopted, the setting of the optimal manufacturing conditions, the acquisition of the setting results, and the display thereof can be performed individually for each of the manufacturing devices X1, X2, and X3, or they can be performed together. Similarly, the calculation of the optimal inspection criteria, the determination of whether the optimal inspection criteria can be adopted, the setting of the optimal inspection criteria, the acquisition of the setting results, and the display thereof can be performed individually for each of the inspection devices Y1, Y2, Y3, and Y4, or they can be performed together.

[0115] (An example of a processing flow)

[0116] Here, according to Figure 5 This describes the process flow for setting the optimal manufacturing conditions for the pick-and-place machine X2 in the production equipment management system 1. First, the management device 10 is triggered by user instructions, the arrival of a predetermined time, etc., and the manufacturing content data acquisition unit 101 acquires manufacturing content data (S201), the inspection content data acquisition unit 102 acquires inspection content data (S202), and the inspection result data acquisition unit 103 acquires inspection result data (S203).

[0117] Next, the management device 10 calculates the optimal manufacturing conditions by the optimal manufacturing conditions calculation unit 104, and sends the calculated manufacturing conditions and information on the manufacturing conditions (including installation parameters, etc.) that can be determined as the premise for calculating the manufacturing conditions to the pick-and-place machine X2 (S204).

[0118] Next, the determination unit 212 determines whether the calculated optimal manufacturing conditions can be used as the new manufacturing conditions for the pick-and-place machine X2 (S205). Specifically, if the manufacturing conditions currently used in the pick-and-place machine X2 are the same as the manufacturing conditions that are the premise for the manufacturing conditions sent in the calculation step S204, it is determined that they can be used as the new manufacturing conditions.

[0119] If it is not determined in step S205 that the new manufacturing conditions can be adopted, the information indicating this intention is sent to the management device 10, and the process proceeds to step S207. In this case, the manufacturing conditions that are the premise for calculating the optimal manufacturing conditions have changed. Directly using the manufacturing conditions calculated in step S204 in the pick-and-place machine X2 will not only have no effect, but may also have the opposite effect. Therefore, the setting (change) of the inspection benchmark is not performed.

[0120] On the other hand, when it is determined in step S205 that the new manufacturing conditions can be adopted, the pick-and-place machine X2 is set by the manufacturing condition setting unit 213 to the optimal manufacturing conditions calculated in step S204 as the new manufacturing conditions in the pick-and-place machine X2, and the meaning is sent to the management device 10 (S206) to proceed to step S207.

[0121] Furthermore, the management device 10 obtains information from the optimal value reflection result acquisition unit 106 regarding whether the manufacturing conditions calculated in step S204 have been reflected in the pick-and-place machine X2 (S207), displays this information on the display unit 107 (S208), and ends a series of processes.

[0122] In this embodiment, the manufacturing content data acquisition unit 101, the inspection content data acquisition unit 102, and the inspection result data acquisition unit 103 correspond to production-related data acquisition units. Furthermore, the optimal manufacturing condition calculation unit 104 and the optimal inspection criterion calculation unit 105 correspond to optimal value calculation units. Additionally, each of the determination units 212, 312, 412, 222, 322, 422, and 432 corresponds to an optimal value adoption determination unit. Furthermore, the manufacturing condition setting units 213, 313, and 413 and the inspection criterion setting units 223, 323, 423, and 433 correspond to optimal value setting units.

[0123] According to the production equipment management system 1 with the structure described above, it is possible to calculate optimal manufacturing conditions and inspection standards for the manufacturing and inspection devices configured in the production line, and automatically set the optimized manufacturing conditions and inspection standards. Furthermore, it is possible to automatically determine whether the optimized manufacturing conditions and inspection standards are appropriate; if inappropriate, the optimized manufacturing conditions and inspection standards are rejected; and if appropriate, the manufacturing conditions and inspection standards are automatically reflected in each device. Therefore, the automatic optimization of manufacturing conditions in manufacturing devices and inspection standards in inspection devices greatly contributes to the efficiency of production equipment maintenance and quality management.

[0124] <Variation Example>

[0125] Furthermore, in the above embodiments, each manufacturing apparatus and each inspection apparatus has a determination section and a setting section, but such a structure is not necessarily required. Figure 6 This is a block diagram showing the general structure of a production equipment management system 2, a variation of Embodiment 1. Furthermore, many structures of the production equipment management system 2 in this variation are the same as those in the production equipment management system 1; therefore, identical structures (functions) are labeled with the same reference numerals, and detailed descriptions are omitted.

[0126] like Figure 6 As shown, the production equipment management system 2 differs from the production equipment management system 1 in the following aspects: the management device 11 has an optimal manufacturing condition adoption approval determination unit 114, a manufacturing condition setting unit 124, an optimal inspection standard adoption approval determination unit 115, and an inspection standard setting unit 125.

[0127] The optimal manufacturing conditions determination unit 114 obtains the optimal manufacturing conditions and information on the manufacturing conditions that are prerequisites for calculating these manufacturing conditions from the optimal manufacturing conditions calculation unit 104, and obtains information on the manufacturing conditions currently used in each manufacturing apparatus X1, X2, and X3. Then, it compares this information to determine whether the optimal manufacturing conditions calculated by the optimal manufacturing conditions calculation unit 104 can be used as new manufacturing conditions in the target manufacturing apparatus. The method for determination is the same as the method described previously, therefore, its explanation is omitted.

[0128] If the optimal manufacturing condition adoption determination unit 114 determines that the optimal manufacturing condition can be adopted as a new manufacturing condition in the target manufacturing apparatus, the manufacturing condition setting unit 124 reflects the optimal manufacturing condition to the target manufacturing apparatus. Here, the method of reflection may be, for example, sending the optimal manufacturing condition information to the manufacturing apparatus via a communication protocol (including the case of only indicating the changed part), or it may be implemented by storing the optimal manufacturing condition information in a shared folder on the communication network.

[0129] Furthermore, the optimal inspection criterion is determined by the approval / disapproval unit 115, which obtains the optimal inspection criterion and information on the inspection conditions that are prerequisites for calculating the criterion from the optimal inspection criterion calculation unit 105, and obtains information on the inspection conditions currently used in each inspection device Y1, Y2, Y3, and Y4. This information is then compared to determine whether the optimal inspection criterion calculated by the optimal inspection criterion calculation unit 105 can be used as a new inspection criterion in the object inspection device. The method for determination is the same as the previously described method, therefore, its explanation is omitted.

[0130] If the optimal inspection reference adoption determination unit 115 determines that the optimal inspection reference can be adopted as a new inspection reference in the object inspection device, the inspection reference setting unit 125 reflects the optimal inspection reference to the object inspection device. Here, the method of reflection may be, for example, sending the optimal inspection reference information to the inspection device via a communication protocol (including the case of only indicating the changed part), or it may be implemented by storing the optimal reference information in a shared folder on the communication network.

[0131] If it is a modified structure as described above, the management device 11 can completely determine whether the optimal manufacturing conditions / inspection criteria can be reflected in each device and set the optimal value.

[0132] <Other>

[0133] The above description of the embodiments is merely illustrative of the invention, and the invention is not limited to the specific embodiments described above. Various modifications can be made to the invention within the scope of its technical concept. For example, in the above embodiments, the manufacturing conditions of the manufacturing apparatus and the inspection criteria of the inspection apparatus are both objects of optimization, but it could also be a management system having only one of these functions.

[0134] Furthermore, in the examples above, it is determined whether the current production conditions are the same as the production conditions that are the premise for calculating the optimal value, based on whether the program version is the same. However, this can also be determined by other methods. For example, in cases concerning items that have changed by applying the optimal value despite a program version update, if the current conditions are the same as the conditions that are the premise for calculating the optimal value, it can also be determined that the current production conditions are the same as the production conditions that are the premise for calculating the optimal value.

[0135] In the above embodiments, when the current manufacturing conditions are the same as the manufacturing conditions on which the optimal value is calculated, the calculated optimal value can be used as the new manufacturing conditions in the manufacturing apparatus, but the determination criteria are not limited to this. For example, when determining whether the optimal manufacturing conditions can be adopted, if the manufacturing conditions and inspection conditions on which the optimal value is calculated are the same as the current manufacturing conditions and inspection conditions, it can also be determined that the calculated manufacturing conditions can be used as the new manufacturing conditions. The same applies to determining whether the optimal inspection criteria can be adopted.

[0136] Furthermore, in the above embodiments, the manufacturing apparatus and inspection apparatus in the production line for component mounting substrates were described as examples, but the present invention can also be applied to production equipment for other products.

[0137] <Postscript>

[0138] One aspect of the present invention is a management system (9; 1; 2) for a product manufacturing equipment (91; X1; X2; X3; 92; Y1; Y2; Y3; Y4), the management system (9; 1; 2) having:

[0139] Production-related data acquisition unit (931; 101; 932; 102; 933; 103) acquires production-related data as information containing production conditions related to the production of the product;

[0140] The optimal value calculation unit (934; 104; 105) calculates the optimal production conditions as the best production conditions related to the production of the product based on the production-related data.

[0141] The optimal value is determined by a decision unit (922; 212; 312; 412; 222; 322; 422; 432; 114; 115), which determines whether the optimal production conditions can be used as new production conditions in the production equipment; and

[0142] The optimal value setting unit (923; 213; 313; 413; 223; 323; 423; 433; 124; 125) performs the process of setting the optimal production conditions to the production equipment according to the specified conditions.

[0143] If the optimal value determination unit determines that the current production conditions used at the time of determination are the same as the production conditions that the optimal value calculation unit uses to calculate the optimal production conditions, then the optimal production conditions can be used as the new production conditions in the production equipment.

[0144] Furthermore, another aspect of the present invention is a management device (11) for a product manufacturing equipment (91; X1; X2; X3; 92; Y1; Y2; Y3; Y4), the management device (11) having:

[0145] The production-related data acquisition unit (101; 102; 103) acquires production-related data as information containing production conditions related to the production of the product;

[0146] The optimal value calculation unit (104; 105) calculates the optimal production conditions as the best production conditions related to the production of the product based on the production-related data.

[0147] The optimal value is determined by a decision unit (114; 115), which determines whether the optimal production conditions can be used as the new production conditions in the production equipment; and

[0148] The optimal value setting unit (124; 125) performs a process of setting the optimal production conditions to the production equipment according to specified conditions.

[0149] If the optimal value determination unit determines that the current production conditions used at the time of determination are the same as the production conditions that the optimal value calculation unit uses to calculate the optimal production conditions, then the optimal production conditions can be used as the new production conditions in the production equipment.

[0150] Furthermore, another aspect of the present invention is a method for managing production equipment for a product, the method comprising the following steps:

[0151] The production-related data acquisition step (S101; S201; S102; S202; S103; S203) acquires production-related data as information containing production conditions related to the production of the product;

[0152] The optimal value calculation step (S104; S204) calculates the optimal production conditions as the best production conditions related to the production of the product based on the production-related data.

[0153] The optimal value is determined through a decision step (S105; S205), which determines whether the optimal production conditions can be used as the new production conditions in the production equipment; and

[0154] The optimal value setting step (S106; S206) involves setting the optimal production conditions for the production equipment according to specified conditions.

[0155] In the optimal value determination step, if the production conditions currently used at the time of determination are the same as the production conditions that serve as the premise for the optimal production conditions calculated by the optimal value calculation unit, it is determined that the optimal production conditions can be used as the new production conditions in the production equipment.

[0156] Label Explanation

[0157] 1, 2, 9: Production equipment management system; 10, 11, 93: Management device; 91, X2: Pick and place machine; 92, Y2: Installation inspection device; X1: Solder printing device; X3: Reflow oven; Y1: Solder printing inspection device; Y3: Appearance inspection device; Y4: X-ray inspection device.

Claims

1. A management system for production equipment of a product, wherein, This management system has the following features: A production-related data acquisition unit acquires production-related data, which includes information about production conditions related to the production of the product. The optimal value calculation unit calculates the optimal production conditions as the best production conditions related to the production of the product, based on the production-related data. The optimal value is determined by a decision unit, which determines whether the optimal production conditions can be used as the new production conditions in the production equipment. as well as The optimal value setting unit performs a process of setting the optimal production conditions for the production equipment according to specified conditions. The production-related data includes information that determines the version of the production program used for information processing related to the operation of the production equipment. If the optimal value determination unit determines that the version of the production program currently being used at the time of determination is the same as the version of the production program that serves as the premise for the optimal value calculation unit to calculate the optimal production conditions, then the optimal production conditions can be used as the new production conditions in the production equipment.

2. A computer-readable recording medium having a computer program non-transitoryly recorded thereon, the computer program causing a computer to perform the following steps: The production-related data acquisition step involves acquiring production-related data, which includes information about production conditions related to the production of products in production equipment. The optimal value calculation step involves calculating the optimal production conditions, which are the best production conditions related to the production of the product, based on the production-related data. The optimal value is determined by a decision step, which determines whether the optimal production conditions can be used as the new production conditions in the production equipment. as well as The optimal value setting step involves, according to specified conditions, performing a process to set the optimal production conditions for the production equipment. The production-related data includes information that determines the version of the production program used for information processing related to the operation of the production equipment. In the optimal value determination step, if the version of the production program currently in use at the time of determination is the same as the version of the production program that serves as the premise for calculating the optimal production conditions in the optimal value calculation step, it is determined that the optimal production conditions can be used as the new production conditions in the production equipment.

3. The computer-readable recording medium according to claim 2, characterized in that, If the result of the determination in the optimal value determination step is acceptable, the optimal value setting step performs a process of setting the optimal production conditions on the production equipment.

4. The computer-readable recording medium according to claim 2, characterized in that, The computer program further causes the computer to perform the following steps: an output step, at least outputting the result of the determination; and an input step, accepting user input instructions. If an instruction to reflect the optimal production conditions in the production equipment is received in the input step, the process of setting the optimal production conditions in the production equipment is performed in the optimal value setting step.

5. The computer-readable recording medium according to claim 2, characterized in that, The computer program also causes the computer to perform an optimal value setting result acquisition step, in which information is obtained as to whether the optimal production conditions have been set on the production equipment.

6. The computer-readable recording medium according to claim 2, characterized in that, The production-related data includes product component information and their versions related to the product components of the product. The information determining the version number of the production process includes the version number of the product component information.

7. The computer-readable recording medium according to claim 2, characterized in that, The production equipment has manufacturing apparatus for manufacturing the product. The production-related data acquired in the production-related data acquisition step includes manufacturing content data, which contains information about the names and versions of manufacturing procedures executed in the manufacturing apparatus as manufacturing conditions related to the manufacturing of the product. In the optimal value calculation step, at least the optimal manufacturing conditions, which are the best in relation to the manufacturing process, are calculated. In the optimal value adoption determination step, if at least the version of the manufacturing program currently being used at the time of determination is the same as the version of the manufacturing program that serves as a prerequisite for calculating the optimal manufacturing conditions in the optimal value calculation step, it is determined that the optimal manufacturing conditions can be adopted as the new manufacturing conditions in the manufacturing apparatus. In the optimal value setting step, a process is performed to set the optimal manufacturing conditions on the manufacturing apparatus according to the specified conditions.

8. The computer-readable recording medium according to claim 2, characterized in that, The production equipment is equipped with an inspection device for inspecting the product. The production-related data acquired in the production-related data acquisition step includes inspection content data and inspection result data. The inspection content data includes the name and version of the inspection procedure executed in the inspection device as an inspection condition in the inspection. The inspection result data is information related to the results of the inspection. In the optimal value calculation step, at least the optimal inspection benchmark, which is the best inspection benchmark in relation to the inspection, is calculated. In the optimal value adoption determination step, if at least the version of the inspection procedure currently used at the time of determination is the same as the version of the inspection procedure that serves as a prerequisite for calculating the optimal inspection benchmark in the optimal value calculation step, it is determined that the optimal inspection benchmark can be used as the new inspection benchmark in the inspection device. In the optimal value setting step, the process of setting the optimal inspection benchmark to the inspection device is performed according to the specified conditions.

9. The computer-readable recording medium according to claim 2, characterized in that, The production equipment includes: a manufacturing apparatus for manufacturing the product; and an inspection apparatus for inspecting the product. The production-related data obtained in the production-related data acquisition step includes: manufacturing content data, which contains information about the name and version of the manufacturing process executed in the manufacturing apparatus as a manufacturing condition related to the manufacturing of the product in the manufacturing apparatus. The inspection content data includes the name and version of the inspection program executed in the inspection device as an inspection condition in the inspection; and the inspection result data is information related to the result of the inspection. In the optimal value calculation step, based on the manufacturing content data, the inspection content data, and the inspection result data, at least the optimal manufacturing conditions, which are the best manufacturing conditions related to the manufacturing, are calculated. In the optimal value adoption determination step, if the version number of the manufacturing program and the version number of the inspection program, which are prerequisites for calculating the optimal manufacturing conditions in the optimal value calculation step, are the same as the version number of the manufacturing program and the version number of the inspection program currently used at the time of determination, it is determined that the optimal manufacturing conditions can be adopted as the new manufacturing conditions in the manufacturing apparatus. In the optimal value setting step, a process is performed to set the optimal manufacturing conditions on the manufacturing apparatus according to the specified conditions.

10. The computer-readable recording medium according to claim 2, characterized in that, The production equipment includes: a manufacturing apparatus for manufacturing the product; and an inspection apparatus for inspecting the product. The production-related data obtained in the production-related data acquisition step includes: manufacturing content data, which contains information about the name and version of the manufacturing process executed in the manufacturing apparatus as a manufacturing condition related to the manufacturing of the product in the manufacturing apparatus. The inspection content data includes the name and version of the inspection program executed in the inspection device as an inspection condition in the inspection; and the inspection result data is information related to the result of the inspection. In the optimal value calculation step, based on the manufacturing content data, the inspection content data, and the inspection result data, at least an optimal inspection benchmark, which is the best inspection benchmark related to the inspection, is calculated. In the optimal value adoption determination step, if the version number of the manufacturing program and the version number of the inspection program, which are prerequisites for calculating the optimal inspection benchmark in the optimal value calculation step, are the same as the version number of the manufacturing program and the version number of the inspection program currently used at the time of determination, it is determined that the optimal inspection benchmark can be adopted as the new inspection benchmark in the inspection device. In the optimal value setting step, the process of setting the optimal inspection benchmark to the inspection device is performed according to the specified conditions.

11. A computer-readable recording medium having a computer program non-transitoryly recorded thereon, the computer program causing a computer to perform the following steps: The production-related data acquisition step involves acquiring production-related data, which includes information about production conditions related to the production of products in production equipment. The optimal value calculation step involves calculating the optimal production conditions, which are the best production conditions related to the production of the product, based on the production-related data. The optimal value is determined by a decision step, which determines whether the optimal production conditions can be used as the new production conditions in the production equipment. as well as The optimal value setting step involves, according to specified conditions, performing a process to set the optimal production conditions for the production equipment. The production-related data includes information about the product components related to the product and their version numbers. In the optimal value determination step, if the version currently used at the time of determination is the same as the version used as a premise for calculating the optimal production conditions in the optimal value calculation step, then the optimal production conditions are determined to be usable as the new production conditions in the production equipment.

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