Test device and test method, test machine

Abstract

The present disclosure provides a device and a method for testing solid state disks. The device comprises a test board comprising a test port, a first positioning part arranged on the test board, and an adapter box comprising a box body for detachably mounting a plurality of solid state disks to be tested, and a second positioning part arranged on the box body and adapted to cooperate with the first positioning part to form a communication connection between the plurality of solid state disks to be tested and the test port.

Description

Technical Field

[0001] This disclosure relates to the field of testing apparatus, and more specifically, to testing apparatus and testing methods, and testing machines. Background Technology

[0002] With the rapid development of the Internet, people's demand for data storage is constantly increasing. SSD (Solid State Drives) is a carrier for storing data information. Due to its characteristics such as fast storage speed and low power consumption, it is widely used in many fields such as automotive, industrial control, video surveillance, and network monitoring. Summary of the Invention

[0003] Embodiments of this disclosure provide a testing apparatus, comprising: a test board including a test port; a first positioning part disposed on the test board; and an adapter box including: a housing for detachably mounting a plurality of solid-state drives under test; and a second positioning part disposed on the housing, adapted to cooperate with the first positioning part to enable the plurality of solid-state drives under test to form a communication connection with the test port.

[0004] In one embodiment, the first positioning part includes a groove; and the second positioning part includes a slide rail for slidingly connecting with the groove.

[0005] In one embodiment, the slide rail includes at least two positioning fulcrums that are slidably connected to the slide groove and are arranged along the sliding direction of the slide rail.

[0006] In one embodiment, a locking assembly is further included, the locking assembly comprising: a pressure rod rotatably connected to the first positioning part; and a stop block disposed on the pressure rod to rotate with the pressure rod, wherein at least a portion of the stop block can be engaged with the side of a positioning fulcrum facing away from the test plate.

[0007] In one embodiment, the stop includes a limiting groove extending within the rotation plane of the pressure rod, the pressure rod being in a locked state or a clearance state relative to the first positioning part; wherein, when the pressure rod is in the locked state, the first end of the limiting groove engages with the positioning fulcrum to enable the plurality of solid-state drives under test to form a communication connection with the test port; and the distance between the second end of the limiting groove and the rotation center of the pressure rod is greater than the distance between the first end and the rotation center, wherein, when the pressure rod is in the clearance state, the second end of the limiting groove pushes against the positioning fulcrum to disconnect the plurality of solid-state drives under test from the test port.

[0008] In one embodiment, the stop block is fixedly connected to the pressure rod.

[0009] In one embodiment, the stop block is slidably connected to the first positioning part and also slidably connected to the pressure rod.

[0010] In one embodiment, the adapter box further includes: a plurality of test adapter boards, detachably mounted to the box body and used to mount the solid-state drive under test, wherein the test adapter board includes: a circuit board; a first port adapted to form a communication connection with the solid-state drive under test; and a second port, which is communicatively connected to the first port through the circuit board and adapted to form a communication connection with the test port.

[0011] In one embodiment, the test adapter board further includes a snap-fit ​​and at least one fixing position disposed in a direction away from the first port, the snap-fit ​​being adapted to be detachably fixed to one of the at least one fixing positions; the distance between the fixing position and the first port is adapted to different specifications and models of the solid-state drive under test.

[0012] In one embodiment, the first port is an M.2 slot, the second port is a U.2 gold finger, and the test port is a U.2 slot.

[0013] In one embodiment, the adapter box further includes a foolproof structure comprising a first component located on the box body and a second component located on the test adapter plate, the first component and the second component being matched to allow the box body to be installed onto the test adapter plate in a preset orientation.

[0014] In one embodiment, the adapter box is configured as a hollow structure.

[0015] In one embodiment, the system further includes a processor connected to the test port, the processor being configured to control the scanning process of the plurality of solid-state drives under test.

[0016] A second aspect of this disclosure provides a test apparatus comprising: a processor for communicatively connecting to the test port in the aforementioned test device; and a memory communicatively connected to the processor and storing computer-executable instructions, wherein the computer-executable instructions, when executed by the processor, scan a plurality of solid-state drives under test through the test port.

[0017] In one embodiment, the computer-executable instructions are further executed by the processor to perform the step of storing the data of the plurality of solid-state drives under test obtained by the scan into a data group.

[0018] In one implementation, the computer-executable instructions are further executed by the processor to perform the step of determining whether the solid-state drive is qualified based on the data set.

[0019] Thirdly, embodiments of this disclosure provide a testing method. This testing method includes: mounting a plurality of solid-state drives (SSDs) under test using the aforementioned apparatus; and scanning the plurality of SSDs under test.

[0020] In one embodiment, the method further includes storing the data of the plurality of solid-state drives under test as a data group.

[0021] In one embodiment, the method further includes: determining whether the solid-state drive is qualified based on the data set.

[0022] The apparatus for testing solid-state drives (SSDs) provided in this disclosure allows for the simultaneous insertion of multiple SSDs, minimizing the waiting time on the testing equipment. Using this apparatus for SSD testing is time-saving, labor-saving, and highly accurate, reducing labor costs and avoiding wear and tear on the SSD's gold fingers caused by repeated manual insertion and removal. Furthermore, the apparatus is highly compatible and suitable for various SSD models and specifications. Attached Figure Description

[0023] Other features, objects, and advantages of this disclosure will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0024] Figure 1 This is a schematic exploded view of a test apparatus according to an embodiment of the present disclosure;

[0025] Figure 2 This is a schematic structural diagram of a test board according to an embodiment of the present disclosure;

[0026] Figure 3 This is a schematic structural diagram of a testing apparatus according to an embodiment of the present disclosure;

[0027] Figure 4 yes Figure 3 Enlarged view of point A in the middle;

[0028] Figure 5 This is a schematic structural diagram of a box body according to an embodiment of the present disclosure;

[0029] Figure 6 This is a side view of a test apparatus according to an embodiment of the present disclosure;

[0030] Figure 7 This is a schematic diagram of a testing apparatus according to an embodiment of the present disclosure;

[0031] Figure 8 This is a schematic structural diagram of a test adapter board according to an embodiment of the present disclosure;

[0032] Figure 9 This is a schematic cross-sectional view of an adapter box according to an embodiment of the present disclosure;

[0033] Figure 10 This is a schematic cross-sectional view of the housing according to an embodiment of the present disclosure;

[0034] Figure 11 This is a connection block diagram of the test apparatus and the solid-state drive under test according to an embodiment of the present disclosure;

[0035] Figure 12 This is a schematic structural block diagram illustrating the connection between the testing machine and the testing apparatus according to embodiments of this disclosure; and

[0036] Figure 13 This is a flowchart of a method for testing a solid-state drive according to an embodiment of the present disclosure. Detailed Implementation

[0037] To better understand this disclosure, various aspects of this disclosure will be described in more detail with reference to the accompanying drawings. It should be understood that these detailed descriptions are merely illustrative of exemplary embodiments of this disclosure and are not intended to limit the scope of this disclosure in any way. Throughout the specification, the same reference numerals refer to the same elements. The expression "and / or" includes any and all combinations of one or more of the associated listed items.

[0038] It should be noted that in this specification, the terms "first," "second," "third," etc., are used only to distinguish one feature from another and do not imply any limitation on the features. Therefore, without departing from the teachings of this disclosure, the first positioning part discussed below may also be referred to as the second positioning part, and the first port may also be referred to as the second port, and vice versa.

[0039] In the accompanying drawings, the thickness, dimensions, and shapes of the components have been slightly adjusted for ease of illustration. The drawings are for illustrative purposes only and are not drawn to scale. For example, the height of the adapter box and the length of the pressure bar are not to scale in actual production. As used herein, the terms “approximately,” “about,” and similar terms are used as expressions of approximation, not as expressions of degree, and are intended to illustrate inherent deviations in measured or calculated values ​​that will be recognized by one of ordinary skill in the art.

[0040] It should also be understood that the terms "comprising," "including," "having," "containing," and / or "comprising," when used in this specification, indicate the presence of the stated features, elements, and / or components, but do not exclude the presence or addition of one or more other features, elements, components, and / or combinations thereof. Furthermore, when a statement such as "at least one of..." appears after a list of listed features, it modifies the entire list of features, not individual elements in the list. Additionally, when describing embodiments of this disclosure, the word "may" is used to mean "one or more embodiments of this disclosure." And the term "exemplary" is intended to refer to an example or illustration.

[0041] Unless otherwise specified, all terms used herein (including engineering and technical terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure pertains. It should also be understood that, unless expressly stated in this disclosure, terms as defined in common dictionaries shall be interpreted as having the meaning consistent with their meaning in the context of the relevant art, and not as having an idealized or overly formalized meaning.

[0042] It should be noted that, unless otherwise specified, the embodiments and features described in this disclosure can be combined with each other. Furthermore, unless explicitly limited or contradicted by the context, the specific steps included in the methods described in this disclosure are not limited to the order in which they are described, but can be performed in any order or in parallel. This disclosure will now be described in detail with reference to the accompanying drawings and embodiments.

[0043] The test bench includes multiple test interfaces. Before testing, SSDs are inserted into these interfaces. Testing begins only after all SSDs are connected to all test interfaces. During the various functional tests, the SSDs require multiple insertions and removals, as well as power-on / off operations. Furthermore, after the tests are completed, the SSDs are removed one by one. Due to the excessive time spent on insertions and removals, the test bench spends most of its time in standby mode, resulting in long idle waiting times. This leads to low utilization and low testing efficiency. Additionally, testing different interface SSDs requires corresponding test boards, indicating low test system compatibility. Moreover, manual insertion and removal are not highly accurate, and repeated manual insertions and removals can easily cause wear and tear on the SSD's gold fingers.

[0044] Figure 1 This is a schematic exploded view of an apparatus for testing a solid-state drive according to an embodiment of the present disclosure.

[0045] refer to Figure 1 The device 1 provided in this embodiment includes: a test plate 10, a first positioning part 20, and an adapter box 30.

[0046] Test board 10 may include, for example, a printed circuit board (PCB), which in turn includes a substrate and conductive lines (not fully shown) disposed within the substrate. Test board 10 may be assembled with a testing machine for testing and data processing of the solid-state drive under test. Test board 10 may include a test port 100, through which test board 10 is communicatively connected to the solid-state drive under test. In an exemplary embodiment, test port 100 may be a U.2 slot.

[0047] refer to Figure 2The test board 10 can be equipped with, for example, thirty-two test ports 100, each of which can be used to connect a solid-state drive 11 under test. These test ports 100 can be arranged in a row, and the test ports 100 are oriented in the same direction. Sufficient space is left between adjacent test ports 100. The test board 10 can be used in different ways, such as with the test ports 100 facing upwards or with the test ports 100 facing horizontally.

[0048] return Figure 1 The first positioning part 20 can be connected to the test board 10, for example, the first positioning part 20 can be detachably connected to the test board 10. The main function of the first positioning part 20 is to accurately assemble and position the adapter box 30 and the test board 10. Specifically, the first positioning part 20 serves as a positioning reference for the adapter box 30 and can be used to define the installation direction of the adapter box 30. The first positioning part 20 can be in a defined position relative to the test port 100.

[0049] The adapter box 30 includes a housing 301 and a second positioning part 302. The housing 301 is used to detachably mount multiple solid-state drives (SSDs) under test. Specifically, the housing 301 may include multiple mounting positions, such as thirty-two mounting positions. These thirty-two mounting positions are arranged in the same way as the test ports 100, and each mounting position can be used to mount one SSD under test. For a single device, multiple adapter boxes 30 can be provided for one test board 10.

[0050] The second positioning part 302 may be disposed on the housing 301 and have a defined position relative to the installation position. The first positioning part 20 may include a baffle 21 and a support plate 22. The baffle 21 is used to define the position of the adapter box 30 relative to the test plate 10 in the horizontal direction, that is, to define the relative position of the installation position and the test port 100 in the horizontal direction. Exemplarily, the support plate 22 may define the position of the adapter box 30 relative to the test plate 10 in the vertical direction.

[0051] refer to Figures 3 to 5 In some embodiments, the first positioning part 20 includes a groove 401, and the second positioning part 302 includes a slide rail 402. In other embodiments, the first positioning part includes a slide rail, and the second positioning part includes a groove. The first positioning part 20 and the second positioning part 302 may also cooperate in other ways such that the housing 301 matches the test plate 10 in a predetermined installation direction, and each installation position of the housing 301 is aligned with a test port 100. Exemplarily, the device 1 may include at least one of a tray 22 and a slide rail 402.

[0052] When a solid-state drive under test (SSD) is installed in the housing 301, the multiple SSDs are synchronously installed into the multiple test ports along the installation direction as the housing 301 moves. The second positioning part 302 and the first positioning part 20 cooperate with each other to establish a one-to-one communication connection between the multiple SSDs and the multiple test ports 100.

[0053] Exemplarily, the device 1 may also include a fan 51 and a housing 52. The fan 51 is disposed on the side of the test port 100 for cooling the solid-state drive under test. The housing 52 covers the test board 10 for protecting the test board 10.

[0054] Exemplarily, device 1 also includes a processor (not shown). The processor is communicatively connected to test board 10 for testing the solid-state drive under test.

[0055] When an operator uses the device 1 provided in this disclosure to perform tests, they can first install, for example, thirty-two solid-state drives (SSDs) to be tested into the housing 301. Then, using the cooperation of the first positioning part 20 and the second positioning part 302, the thirty-two SSDs to be tested are synchronously and one-to-one inserted into the thirty-two test ports 100. Exemplarily, device 1 can scan all the SSDs to be tested and obtain a set of relevant data at once. While device 1 is testing the thirty-two installed SSDs, the operator can install the SSDs to be tested into the housing of another adapter box.

[0056] After device 1 tests the 32 installed solid-state drives (SSDs), the operator can remove the adapter box 30 installed on the test board 10, and the 32 tested SSDs will be removed simultaneously. Then, the operator can install another adapter box onto the test board 10, and the remaining 32 SSDs to be tested will be simultaneously inserted into the 32 test ports one by one.

[0057] The data in Table 1 is based on machine measurements from an exemplary implementation, which has four rows of test ports, with thirty-two ports in each row.

[0058] Table 1: Productivity Comparison

[0059]

[0060] Table 1 shows the working time and productivity of the single-chip mode and the batch mode provided in this disclosure. Specifically, the test station can be a functional tester (FT).

[0061] "Pure test time" refers to the time it takes for the test program to run. As shown in Table 1, the pure test time for a normal program to test multiple solid-state drives, such as thirty-two solid-state drives, is 5 minutes.

[0062] "Online insertion / removal time" refers to the time spent waiting for the test program to run before it can proceed with the insertion / removal operation. As shown in Table 1, in single-chip mode, removing 32 SSDs from each row and then inserting 32 new SSDs takes up to 10 minutes. In the batch mode of this disclosure, 32 SSDs can be inserted / removed at once using an adapter box, with an online insertion / removal time of 1 minute.

[0063] "Single-layer Cycle Time" represents the time consumed for each batch of SSDs when a row of test ports on the test bench tests batches of SSDs. For example, the time elapsed from the start of testing 32 SSDs to the complete completion of testing before the next batch can be tested is equal to the pure testing time plus the online plug-in / plug-out time, as shown in Table 1. In single-chip mode, the single-layer Cycle Time is 15 minutes. In batch mode, the single-layer Cycle Time is 6 minutes.

[0064] The "System Cycle Time" refers to the time elapsed from the start and end of testing 128 SSDs on the four rows of test ports of this exemplary machine, until it is ready to start testing the next group of 128 SSDs. As shown in Table 1, in single-chip mode, the time taken to insert and remove a row of SSDs that has completed testing is also 10 minutes. Since the pure testing time is shorter than the online insertion / removal time, in the four-row cycle, the previous row has already been tested during the insertion / removal process, so the system cycle time is 40 minutes. In batch mode, during the system cycle operation, after inserting and removing three rows of SSDs, it is necessary to wait for the test program to complete, and the system cycle time is 8 minutes.

[0065] "Output per hour" refers to the number of solid-state drives (SSDs) that the testing machine can produce per hour when it is operating continuously. As shown in Table 1, in single-chip mode, 128 chips are tested every 40 minutes, so the testing machine produces 192 tested SSDs per hour. In the batch mode disclosed in this paper, 128 chips can be tested every 8 minutes, so the testing machine produces 960 tested SSDs per hour.

[0066] Specifically, when using the testing apparatus of this disclosure, more than four adapter boxes 30 can be prepared and personnel can be allocated. When testing the solid-state drive installed on the test board 10, the solid-state drive to be tested is simultaneously installed into the extra adapter boxes 30 to ensure that the machine operates in a cyclical manner.

[0067] As can be seen from the comparison in Table 1, simultaneous plugging and unplugging of multiple solid-state drives (SSDs) and the use of multiple adapter boxes allow for parallel insertion and removal of each adapter box, reducing the waiting time of device 1 and minimizing online plugging and unplugging time. The time spent purely on program testing constitutes a larger proportion of the overall time. During batch testing, the device's cycle time and the average time spent on each SSD are significantly reduced, resulting in a substantial increase in the number of SSDs tested per hour.

[0068] Due to the limited area of ​​the test board, the distance between multiple test ports is relatively short, and the bonding force between the test ports and the solid-state drives is relatively large, for example, up to 20N. Forcefully inserting or removing a single solid-state drive can easily cause a collision, potentially leading to damage.

[0069] The apparatus for testing solid-state drives (SSDs) disclosed herein, compared to manually removing a single SSD, allows for easier securing of the external structures of multiple SSDs using an adapter box, ensuring stable relative positions between them. When inserting or removing SSDs from the test board, the adapter box prevents collisions between the SSDs. The first and second positioning parts further restrict the connection between the adapter box and the test board, allowing the operator to stably manipulate the adapter box and indirectly control the insertion and removal of the SSDs' gold fingers relative to the test ports on the test board. Furthermore, because the adapter box restricts the external structures of the SSDs, removing them from the adapter box is easier than manually removing a single SSD.

[0070] Furthermore, the device for testing solid-state drives (SSDs) provided in this disclosure can stably insert the SSD under test into the test board, avoiding the need for repeated plugging and unplugging due to misalignment. This reduces wear on the test ports and, to some extent, wear on the gold fingers of the SSD, and also lowers the probability of debris remaining in the test ports. Consequently, the lifespan of the test ports on the test board is extended.

[0071] In an exemplary embodiment, the apparatus for testing solid-state drives provided in this disclosure can communicate with a host computer. The host computer can be used to run a manufacturing execution system (MES).

[0072] For example, the processor may perform the following steps: Communicate with the Manufacturing Execution System (MES) via an MES interface; Store data from multiple solid-state drives (SSDs) into a data group and process that data group.

[0073] refer to Figures 4 to 6 In an exemplary embodiment, the first positioning part 20 may include a groove 401, and the second positioning part 302 may include a slide rail 402. The slide rail 402 may be slidably connected to the groove 401.

[0074] For example, the two baffles 21 of the first positioning part 20 are disposed on both sides of the adapter box 30, and at least one slide rail 402 is disposed on the second positioning part 302. The slide rail 402 and the slide groove 401 are matched in position, and the slide rail 402 moves on the slide groove 401 in the direction of installation and disassembly of the adapter box 30.

[0075] refer to Figure 5 Specifically, the slide rail 402 includes positioning fulcrums 4021 to 4023. When the device 1 includes a tray 22, it may include at least one positioning fulcrum 4021 / 4022 / 4023. For example, the third positioning fulcrum 4023 may be combined with the locking component 50 to lock the slide rail 402 and the slide groove 401 in the installation direction to prevent the adapter box 30 from falling off the test adapter plate 303, thereby ensuring that the solid-state drive under test always maintains a good and stable connection with the test port 100 during the test. When the device 1 does not include a tray, it may include at least two positioning fulcrums 4021 / 4022 / 4023 as the slide rail 402 and for positioning.

[0076] refer to Figure 6 and Figure 4 Specifically, the device 1 provided in this embodiment includes a locking component 50, which includes a pressure rod 501 and a stop block 502. The pressure rod 501 is rotatably connected to the first positioning part 20 to switch between a locked state and a clearance state. For example, Figure 6 A schematic structure is shown when the pressure bar 501 is in the avoidance state. A stop block 502 is disposed on the pressure bar 501 to rotate with the pressure bar 501, wherein at least a portion of the stop block 502 can be engaged with the side of a positioning fulcrum 4021 / 4022 / 4023 facing away from the test plate 10.

[0077] The stop 502 includes a limiting groove 5021 extending within the rotation plane of the pressure rod 501, wherein the pressure rod 501 is positioned as follows: Figure 7 In the locked state, the upper end of the limiting groove 5021 (i.e., the first end mentioned above) engages with the third positioning fulcrum 4023 to allow the solid-state drive under test to be inserted into the test port 100 to a preset position to ensure a communication connection is established. For example, the distance between the lower end of the limiting groove 5021 (i.e., the second end mentioned above) and the rotation center of the pressure rod 501 is greater than the distance between the upper end and the rotation center. When the pressure rod 501 is in the avoidance state, the lower end of the limiting groove 5021 can push against the third positioning fulcrum 4023 to allow the solid-state drive under test to be pulled out of the test port 100 to disconnect the communication connection between the two.

[0078] refer to Figure 7When the lever 501 moves from top to bottom, that is, from the avoidance state to the locked state, the first lever arm of the operator pressing the lever 501 is L1, and the second lever arm of the reaction force exerted by the third positioning fulcrum 4023 on the stop block 502 is L2. By setting the first lever arm L1, the second lever arm L2, and the groove shape of the limiting groove 5021, the component of the reaction force in the installation direction can be controlled, thereby ensuring that each solid-state drive under test is plugged into the test port 100 with less pressure. Compared with unplugging a single solid-state drive, which requires greater force from the operator's fingers and thus poses a potential risk of pain or injury, the pressure applied by the operator when pressing the lever 501 using the device disclosed in this invention is smaller, especially since the contact area is larger, resulting in less pressure on the fingers, thereby protecting the operator's fingers to a certain extent.

[0079] In an exemplary embodiment, the stop 502 is fixedly connected to the pressure rod 501. In other embodiments, the stop is slidably connected to the first positioning part and also slidably connected to the pressure rod.

[0080] refer to Figure 8 In an exemplary embodiment, the adapter box 30 further includes a plurality of test adapter boards 303, each test adapter board 303 being mounted to a mounting location on the box body 301. The test adapter board 303 may include a circuit board 3001, a first port 3002, and a second port 3003. The second port 3003 is communicatively connected to the first port 3002 via the circuit board 3001.

[0081] In actual operation, the solid-state drive under test (SSD) is first placed on the test adapter board 303, establishing a communication connection between the first port 3002 and the SSD. Then, the SSD is assembled into the adapter box 30 using the test adapter board 303. The second ports 3003 of multiple test adapter boards 303 are simultaneously plugged into the test port 100 of the test board 10, thus achieving a communication connection. This enables multiple SSDs under test to communicate with the test board 10.

[0082] The test adapter board 303 also includes a latch 3004 and at least one fixing position 3005. Exemplarily, the latch 3004 is adapted to be detachably fixed to at least one fixing position 3005. Specifically, multiple fixing positions 3005 are provided on the circuit board 3001 in the direction opposite to the first port 3002. The distance between the fixing position 3005 and the first port 3002 is adapted to the size of the solid-state drive under test (SSD) of different adapter sizes. For example, the SSD may include an M.2 interface, meaning the SSD's gold fingers are M.2. M.2 interface SSDs may include, for example, five specifications: 2230, 2242, 2260, 2280, and 22120. The lengths of these five specifications are 30mm, 42mm, 60mm, 80mm, and 110mm, respectively. The distance between the five fixing positions 3005 and the first port 3002 can be set according to the lengths of these five specifications. While five different solid-state drive lengths are described herein by way of example, those skilled in the art should understand that these descriptions are exemplary and not restrictive.

[0083] In an exemplary embodiment, the gold fingers on the solid-state drive can be an M.2 interface, and the first port 3002 is an M.2 slot. The M.2 interface of the solid-state drive under test is inserted into the M.2 slot of the test adapter board 303, and the other end of the solid-state drive under test is fixed with a clip 3004. Specifically, the clip 3004 is set on a suitable fixing position 3005 according to the length of the solid-state drive under test.

[0084] The fixing position 3005 includes two notches in a direction perpendicular to the insertion / removal direction of the solid-state drive (SSD). The latch 3004 includes two opposing claws, which, when engaged with the notches, position the latch 3004 at the fixing position 3005. The positioning end 3004-1 of the latch 3004 is used to hold the tail of the SSD under test, ensuring that the gold fingers of the SSD under test are stably inserted into the first port 3002.

[0085] In an exemplary embodiment, the second port 3003 can be a U.2 gold finger, and correspondingly, the test port 100 can be a U.2 slot, that is, to realize the communication connection between the second port 3003 and the test port 100.

[0086] refer to Figure 8 and Figure 9 In an exemplary embodiment, the adapter box 30 further includes a foolproof structure 304, which includes a first component 305 located on the box body 301 and a second component 306 located on the test adapter plate 303. Figure 9 and Figure 10 As shown, the first component 305 can be exemplarily a groove, and the second component 306 can be exemplarily a protrusion.

[0087] The first component 305 and the second component 306 are matched to install the housing onto the test adapter board in a preset direction. The first component 305 and the second component 306 ensure that the test adapter board 303 is placed into the adapter box 30 in the preset correct posture, thereby ensuring that the gold fingers of the multiple solid-state drives under test are arranged in a preset manner, that is, the same as the arrangement of the multiple test ports 100.

[0088] For example, the housing 301 includes multiple slots, the cross-sectional boundaries of which are approximately rectangular. Without a foolproof design, the test adapter board might be inserted into the slots in reverse, resulting in the SSD under test being inserted incorrectly into the test port. For example, the first component 305 can be a protrusion or groove structure located on one side of the opening of each slot, and the second component 306 can be a groove or protrusion structure on the test adapter board 303 corresponding to the first component 305. When the test adapter board 303 is placed in the slot in the correct position, the first component 305 and the second component 306 engage precisely. When the test adapter board 303 is placed in the slot in the wrong position, the first component 305 and the second component 306 become misaligned, preventing the test adapter board 303 from being inserted into the slot and hindering the operator from proceeding to the next step. The foolproof design allows the operator to accurately insert the test adapter board 303 with the SSD under test into the adapter housing 30 without needing to pay attention, preventing careless or impatient operators from hastily inserting the SSD under test incorrectly.

[0089] refer to Figure 9 And further reference Figure 5 The adapter box 30 also includes a locking lever 31. Exemplarily, the locking lever 31 is laterally disposed outside the slot and is movable relative to the box body 301. Figure 9 The image shows the locking lever 31 in the open position, at which point the test adapter plate 303 can be inserted into the slot. After the test adapter plate 303 is installed in the slot, the locking lever 31 moves as follows: Figure 5 The locking state shown can lock the tail of the test adapter plate 303, preventing the test adapter plate 303 from falling out of the housing 301.

[0090] In existing solid-state drive (SSD) testing technologies, SSDs need to be manually inserted into the ports of the testing equipment one by one. The stress of inserting or removing an SSD is usually about 20N.

[0091] The apparatus for testing solid-state drives (SSDs) provided in this disclosure reduces the weight of the adapter box by using a hollow structure. For example, by making the adapter box hollow while ensuring its mechanical strength, the weight of the adapter box can be kept below 3 kg. This allows the total weight of the adapter box, which can simultaneously hold thirty-two SSDs, to be kept below 4 kg. Furthermore, when all thirty-two SSDs are simultaneously inserted into the testing machine using the locking component 50, the leverage principle satisfied by the locking component 50 allows the stress to be controlled within 20 N. The above is merely an illustrative example; in actual use, the number of SSDs that can be installed is not limited to thirty-two, and more test ports can be designed as needed.

[0092] Figure 11 This is a connection block diagram of the test apparatus and the solid-state drive under test according to an embodiment of this disclosure. Figure 11 As shown, the testing apparatus 1 according to this embodiment may further include a test adapter board 303, a test board 10, a first processor 61, and a first memory 62. The solid-state drive under test 11 is communicatively connected to the test adapter board 303, thereby enabling the solid-state drive under test 11 to communicate with the first processor 61 through the test adapter board 303 and the test board 10. The first processor 61 controls the scanning processing of the solid-state drive under test 11 and can store the obtained data in the first memory 62.

[0093] like Figure 12 The diagram shows a test bench 7 provided according to an embodiment of the present disclosure. The test bench 7 may include a second processor 71, a second memory 72, a test interface 73, an output interface 74, and interfaces for connecting the various components, including high-speed interfaces and low-speed interfaces. The various components can be interconnected using different buses and can be mounted on a common motherboard or installed in other ways as needed.

[0094] The test machine 7 can communicate with the test board 10 of the test device 1 through the test interface 73, thereby realizing the communication connection between the second processor 71 and the solid-state drive 11 under test.

[0095] The second memory 72 may be a non-transitory computer-readable storage medium. The second memory 72 stores computer-readable instructions executable by at least one second processor 71 to cause the at least one second processor 71 to perform the test methods provided in this disclosure. The second memory 72 can also be used to store data acquired or generated by the second processor 71. The test equipment 7 can be communicatively connected to an external system via an output interface 74, enabling the test equipment 7 to transmit data, such as test results.

[0096] Figure 13 An embodiment of the present disclosure provides a test method. The test method 1000 includes the following steps.

[0097] Step S101: Install multiple solid-state drives using the aforementioned device.

[0098] Step S102: Scan multiple solid-state drives.

[0099] This method is time-efficient and has high detection efficiency per unit time.

[0100] In one embodiment, the testing method further includes storing the data of multiple solid-state drives (SSDs) into a data set. For SSDs produced in batches, multiple data sets can be obtained by executing the testing method multiple times. Exemplarily, the testing method can process the data sets. Specifically, the data sets can be uploaded to a Manufacturing Execution System (MES) to track the product lifecycle; test results can also be obtained from the data sets, such as determining whether various indicators of the SSDs are qualified, and distinguishing unqualified SSDs.

[0101] The above description is merely a preferred embodiment of this disclosure and an explanation of the technical principles employed. Those skilled in the art should understand that the scope of protection involved in this disclosure is not limited to technical solutions formed by specific combinations of the above-described technical features, but should also cover other technical solutions formed by arbitrary combinations of the above-described technical features or their equivalents without departing from the described technical concept. For example, technical solutions formed by substituting the above-described features with (but not limited to) technical features with similar functions in this disclosure.

Claims

1. A testing device, characterized in that, include: Test board, including test ports; A first positioning part is disposed on the test plate; as well as Adapter box, including: The enclosure is designed for the removable mounting of multiple solid-state drives (SSDs) under test. A second positioning part is disposed in the housing and is adapted to cooperate with the first positioning part to enable the plurality of solid-state drives under test to form a communication connection with the test port; and The locking component includes a pressure rod, which is rotatably connected to the first positioning part. When the pressure rod is in a locked state, the plurality of solid-state drives under test (SSDs) form a communication connection with the test port. When the pressure rod is in a clearance state, the plurality of SSDs under test disconnect from the test port.

2. The testing apparatus according to claim 1, wherein, The first positioning part includes a slide groove; and The second positioning part includes a slide rail for sliding connection with the slide groove.

3. The testing apparatus according to claim 2, wherein, The slide rail includes at least two positioning fulcrums that are slidably connected to the slide groove and are arranged along the sliding direction of the slide rail.

4. The testing apparatus according to claim 3, wherein, The locking component also includes: A stop block is disposed on the pressure rod to rotate with the pressure rod, wherein at least a portion of the stop block can be engaged with the side of the positioning fulcrum opposite to the test plate.

5. The testing apparatus according to claim 4, wherein, The stop includes a limiting groove extending within the rotation plane of the pressure rod. The pressure rod is in a locked state or a clearance state relative to the first positioning part; When the pressure rod is in the locked state, the first end of the limiting groove engages with the positioning fulcrum to enable the plurality of solid-state drives under test to form a communication connection with the test port; and The distance between the second end of the limiting groove and the rotation center of the pressure rod is greater than the distance between the first end and the rotation center. When the pressure rod is in the avoidance state, the second end of the limiting groove pushes against the positioning fulcrum to disconnect the multiple solid-state drives under test from the test port.

6. The testing apparatus according to claim 4, wherein, The stop block is fixedly connected to the pressure rod.

7. The testing apparatus according to claim 4, wherein, The stop block is slidably connected to the first positioning part and also slidably connected to the pressure rod.

8. The testing apparatus according to claim 1, wherein, The adapter box further includes: multiple test adapter boards, which are detachably installed to the box body and used to install the solid-state drive under test, wherein... The test adapter board includes: Circuit board; A first port is adapted to form a communication connection with the solid-state drive under test; and The second port is connected to the first port via the circuit board and is adapted to form a communication connection with the test port.

9. The testing apparatus according to claim 8, wherein, The test adapter plate further includes a snap fastener and at least one fixing position disposed in a direction away from the first port, the snap fastener being adapted to be detachably fixed to one of the at least one fixing positions; The distance between the fixed position and the first port is adapted to different specifications and models of the solid-state drive under test.

10. The testing apparatus according to claim 8, wherein, The first port is an M.2 slot, the second port is a U.2 gold finger, and the test port is a U.2 slot.

11. The testing apparatus according to claim 8, wherein, The adapter box also includes a foolproof structure, which includes a first component located on the box body and a second component located on the test adapter plate. The first component and the second component are matched to enable the box body to be installed onto the test adapter plate in a preset direction.

12. The testing apparatus according to claim 1, wherein, The adapter box is designed with a hollow structure.

13. The testing apparatus according to claim 1, wherein, It also includes a processor that is communicatively connected to the test port, the processor being configured to control the scanning process of the plurality of solid-state drives under test.

14. A testing machine, characterized in that, include: A processor for communicatively connecting to the test port in the test apparatus of claim 1; as well as The memory is communicatively connected to the processor and stores computer-executable instructions. When the processor executes the computer-executable instructions, it scans multiple solid-state drives under test through the test port.

15. The testing machine according to claim 14, wherein, The computer-executable instructions are further executed by the processor to store the data of the plurality of solid-state drives under test obtained through the scan into a data group.

16. The testing machine according to claim 15, wherein, The computer-executable instructions are further executed by the processor to determine whether the solid-state drive is qualified based on the data set.

17. A testing method, characterized in that, include: Install multiple solid-state drives under test using the apparatus as described in any one of claims 1 to 13; as well as Scan the multiple solid-state drives to be tested.

18. The test method according to claim 17, wherein, Also includes: The data of the multiple solid-state drives under test are stored as a data group.

19. The test method according to claim 18, wherein, Also includes: The validity of the solid-state drive is determined based on the data set.

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