Automatic test system, method for time-of-flight module

Abstract

The application provides an automatic test system and method for a time-of-flight module, which comprises a main control test device, a guide rail, a time-of-flight module, a reflector plate module and a light source module; the main control test device is electrically connected with the guide rail, the time-of-flight module, the reflector plate module and the light source module respectively; the main control test device is used for switching reflector plates with different reflectivities through a reflector plate switching device, adjusting the illuminance of the light source through a controller for controlling the illuminance of the light source, controlling the time-of-flight module to move on the guide rail to adjust the distance between the time-of-flight module and the reflector plate, and starting the time-of-flight module to collect histogram data. The time-of-flight module can be tested automatically and more accurately by using the application.

Description

Technical Field

[0001] This application relates to the field of optics, and in particular to an automatic testing system and method for time-of-flight modules. Background Technology

[0002] The principle of a direct time-of-flight (dToF) module is that after emitting a laser pulse, the dToF module receives the laser reflected back from the object. By recording the number of photons received, it calculates the time difference between receiving and sending the laser, thereby calculating the distance between the dToF module and the object.

[0003] Before using a time-of-flight module, its performance needs to be tested. Existing performance testing methods typically involve manually adjusting environmental and distance factors and then manually recording the module's performance under different conditions. This manual approach is not only labor-intensive but also prone to errors, leading to inaccurate performance testing. Summary of the Invention

[0004] This application provides an automatic testing system and method for time-of-flight modules, which can automatically and more accurately test time-of-flight modules.

[0005] On one hand, embodiments of this application provide an automatic testing system for a time-of-flight module, the system including: a main control testing device, a guide rail, a time-of-flight module, a reflector module, and a light source module;

[0006] The main control test equipment is electrically connected to the guide rail, time-of-flight module, reflector module, and light source module respectively;

[0007] A reflector module, comprising multiple reflectors with different reflectivities and a reflector switching device;

[0008] The time-of-flight module is fixed to the vehicle on the guide rail;

[0009] The light source module includes a light source that emits light and a controller that controls the illuminance of the light source;

[0010] The main control test equipment is used to switch reflectors with different reflectivities through a reflector switching device, to adjust the illuminance of the light source through a controller that controls the illuminance of the light source, to control the movement of the time-of-flight module on the guide rail to adjust the distance between the time-of-flight module and the reflector, and to start the time-of-flight module and collect histogram data.

[0011] The aforementioned system connects the main control testing equipment to the guide rail, time-of-flight module, reflector module, and light source module, respectively. This allows the main control testing equipment to control different testing environments, such as reflectors with different reflectivities, different illuminance levels, and the distance between the time-of-flight module and the reflector. This enables automatic and more accurate testing of the time-of-flight module.

[0012] In one possible implementation, the reflector module and the time-of-flight module are arranged in parallel relative to each other.

[0013] In one possible implementation, multiple reflectors with different reflectivities are located on the same plane and can rotate within the same plane.

[0014] In one possible implementation, the reflector switching device is a rotary motor.

[0015] In one possible implementation, the spacing between multiple reflectors and the size of the reflector area are set according to the field of view (fov) of the time-of-flight module.

[0016] In one possible implementation, the time-of-flight module includes a transmitting module and a receiving module, and the pixel morphology of the receiving module includes single-point, multi-point, and area array.

[0017] In one possible implementation, the main control test equipment includes a computer, a mobile phone, and other intelligent control devices.

[0018] Secondly, embodiments of this application provide an automatic testing method for a time-of-flight module. This method is applied to the main control testing equipment in any system of the first aspect, and includes:

[0019] Step 1: Based on the test environment settings, control the reflector to switch to the specified reflectivity and control the light source to adjust to the specified illuminance;

[0020] Step 2: Control the flight time module to move to the designated position on the guide rail;

[0021] Step 3: Start the time-of-flight module and collect histogram data. The histogram data is used to characterize the distance detection from the time-of-flight module to the reflector.

[0022] Step 4: Change the value at the specified position and jump to Step 2 until all specified positions in this test environment have collected the corresponding histogram data.

[0023] Step 5: Change the specified reflectance and illuminance values, then jump to Step 1 until the corresponding histogram data are collected in all test environments.

[0024] The above method uses the main control test equipment to change the test environment according to the test environment settings, so as to collect histogram data under different test environments, thereby realizing the test of the flight time module performance.

[0025] In one possible implementation, reflectance values ​​include 18%, 66%, 78%, and 88%; illuminance values ​​include 30kLux, 40kLux, 50kLux, 60kLux, and 100kLux.

[0026] In one possible implementation, the specified position refers to the distance between the time-of-flight module and the reflector; the value of the specified position includes discrete values ​​at fixed intervals within the range of 0-15m.

[0027] In one possible implementation, the interval is a fixed integer ranging from 1mm to 1000mm.

[0028] In one possible implementation, step five further includes: storing all the collected histogram data and associating the test environment, the specified location, and the histogram data to form complete test data. Attached Figure Description

[0029] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0030] Figure 1 This is a schematic diagram of a time-of-flight module used for ranging, provided in an embodiment of this application.

[0031] Figure 2 This is a schematic diagram of the architecture of an automatic testing system for a time-of-flight module provided in an embodiment of this application;

[0032] Figure 3 This is a flowchart illustrating an automatic testing method for a time-of-flight module provided in an embodiment of this application. Detailed Implementation

[0033] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0034] To better understand the embodiments of this application, some technical terms involved in the embodiments of this application will be introduced below:

[0035] The Direct Time-Of-Flight Mod (dToF) is mainly used for distance testing, such as measuring the distance from the dToF module to an object. The dToF mainly consists of a Vertical Cavity Surface Emitting Laser (VCSEL), a Single Photon Avalanche Diode (SPAD), and a Time-to-Digital Converter (TDC).

[0036] The following is combined with Figure 1 To further explain the ranging principle of this dToF module: the VCSEL in the dToF module emits laser pulses, while the SPAD in the dToF module receives the laser pulses reflected back from the object. The TDC in the dToF module records the time difference between the photon received by the SPAD and the laser emitted by the VCSEL. Figure 1 As shown, the TDC starts timing from the moment the VCSEL in the dToF module emits light, and after 1 picosecond, the number of photons received by the SPAD is counted. The result is calculated based on the speed of light. Figure 1 The distance between the dToF module and the object is calculated using the following formula: d = c * t / 2, where d is the distance between the dToF module and the object, c is the speed of light, and t is time.

[0037] Please see Figure 2 , Figure 2 This is a system architecture diagram of an automatic testing system for a time-of-flight module provided in an embodiment of this application. The automatic testing system for a time-of-flight module provided in this embodiment can, as follows: Figure 2 The system architecture is shown below. Figure 2 As shown, Figure 2 The device marked 201 is the Time-of-Flight Module 201. Figure 2 The device marked 202 is guide rail 202. Figure 2 The device marked 203 is the light source module 203. Figure 2 The device marked 204 is the reflector module 204. Figure 2 The device marked 205 is the main control test device 205. For example... Figure 2 As shown, the main control test equipment 205 is electrically connected to the guide rail 202, the time-of-flight module 201, the light source module 203, and the reflector module 204, respectively.

[0038] Optionally, the main control test equipment 205 can be connected to the guide rail 202, the time-of-flight module 201, the light source module 203, and the reflector module 204 in other ways, such as via Bluetooth or wireless connection.

[0039] In one possible embodiment, the reflector module and the time-of-flight module are arranged in parallel relative to each other. Specifically, this parallel arrangement can be understood as follows: laser pulses emitted from the time-of-flight module are perpendicular to the time-of-flight module, and when the laser pulses are reflected by the reflector in the reflector module, the laser pulses are also perpendicular to the reflector module.

[0040] For example, such as Figure 1 As shown, the time-of-flight module 201 and one of the reflectors in the reflector module 204 are on the same horizontal plane. When the VCSEL in the time-of-flight module 201 emits a laser pulse, the laser pulse is parallel to the guide rail, perpendicular to the time-of-flight module 201, and perpendicular to one of the reflectors in the reflector module 204.

[0041] Optionally, when the first reflector in the reflector module is used to reflect photons, the center position of the first reflector is at the same height as the ground as the time-of-flight module is at the same height as the ground.

[0042] In one possible embodiment, multiple reflectors with different reflectivities are located on the same plane and can rotate within that plane. Each reflector module contains multiple reflectors with different reflectivities at the same angle to the ground. For example, a reflector module may include four reflectors with different reflectivities, all of which are perpendicular to the ground. After rotating these four reflectors, any one of them will still remain perpendicular to the ground.

[0043] In one possible embodiment, the reflector switching device is a rotary motor. This rotary motor is used to rotate reflectors with different reflectivities within the same plane.

[0044] In one possible embodiment, the spacing between the multiple reflectors and the size of the reflector area are set according to the field of view (fov) of the time-of-flight module. fov, also known as the field of view in optical engineering, determines the field of view of the time-of-flight module; a larger fov results in a larger field of view. The area of ​​the reflector is larger than the fov. The spacing between the multiple reflectors needs to ensure that only one reflector can reflect photons to the time-of-flight module. That is, when one reflector switches to a preset position, other reflectors cannot receive photons (laser pulses), or when one reflector switches to a preset position, photons reflected by other reflectors cannot be received by the SPAD in the time-of-flight module.

[0045] In one possible embodiment, the time-of-flight module includes a transmitting module and a receiving module, wherein the pixel configuration of the receiving module includes single-point, multi-point, and area array. The transmitting module of the time-of-flight module may be a VCSEL that emits laser pulses as described above, and the receiving module of the time-of-flight module may be a SPAD that receives photons as described above.

[0046] In one possible embodiment, the main control test equipment includes a computer, a mobile phone, and other intelligent control devices. This main control test equipment may also include smartphones, tablets, laptops, desktop computers, intelligent voice interaction devices, smart home appliances, in-vehicle terminals, etc., but is not limited thereto. This application does not impose any limitations on this.

[0047] The above provides a brief overview of the automated testing system provided in the embodiments of this application. The following will combine [the system description with further details]. Figure 3 The automatic testing method for the time-of-flight module provided in the embodiments of this application will be described in detail.

[0048] Please see Figure 3 , Figure 3 This is a flowchart illustrating an automatic testing method for a time-of-flight module provided in an embodiment of this application. The method is used in the main control testing equipment of the aforementioned automatic testing system and includes steps one through five. Wherein:

[0049] Step 1: The main control test equipment controls the reflector to switch to the specified reflectivity and controls the light source to adjust to the specified illuminance according to the test environment settings.

[0050] The main control testing equipment adjusts the current testing environment to match the set testing environment based on the environmental testing settings. Specifically, changing the reflectivity can be achieved by sending a reflectivity adjustment command to the reflector module, instructing the reflector switching device within the reflector module to switch between reflectors with different reflectivities, thereby changing the reflectivity in the testing environment. Similarly, changing the illuminance can be achieved by sending an illuminance adjustment command to the light source module, instructing the controller within the light source module to adjust the illuminance of the emitting light source, thereby changing the illuminance in the testing environment.

[0051] Optionally, the light source in the test environment mainly comes from the light source emitted by the light source module. The test is carried out in a darkroom. By adjusting the light source in the light source module, the test environment controlled by the main control test equipment can be made more accurate.

[0052] Step 2: The main control test equipment controls the flight time module to move to the designated position on the guide rail.

[0053] The time-of-flight module on the guide rail is movable, while the reflector module is fixed. Therefore, controlling the time-of-flight module to move to a designated position on the guide rail is equivalent to controlling the distance between the time-of-flight module and the reflector in the reflector module.

[0054] In one possible embodiment, the designated position refers to the distance between the time-of-flight module and the reflector; the value of the designated position includes discrete values ​​at fixed intervals within the range of 0-15 meters. For example, the values ​​of the designated position are: 0 meters, 5 meters, 10 meters, and 15 meters.

[0055] In one possible embodiment, the interval is a fixed integer ranging from 1mm to 1000mm.

[0056] Optionally, the main control test equipment controls the time-of-flight module to move to a designated position on the guide rail, including: the main control test equipment acquiring a set of designated positions, which includes multiple preset designated positions; the set of designated positions being arranged in sequence; determining the target designated position from the set of designated positions in sequence; and the main control test equipment controlling the time-of-flight module to move to the target designated position on the guide rail.

[0057] For example, the set of designated positions consists of 10 preset designated positions: 10 cm, 11 cm, 12 cm, ..., 20 cm. The 10 cm position is the first in the set, the 11 cm position is the second, and so on. When the main control test equipment first controls the time-of-flight module to move on the guide rail, it moves the time-of-flight module to a position 10 cm away from the reflector module. When the main control test equipment controls the time-of-flight module to move on the guide rail for the second time, it moves the time-of-flight module to a position 11 cm away from the reflector module, and so on, until the last time, when the main control test equipment moves the time-of-flight module to a position 20 cm away from the reflector module.

[0058] Step 3: The main control test equipment starts the time-of-flight module and collects histogram data. The histogram data is used to characterize the distance detection from the time-of-flight module to the reflector.

[0059] The histogram data is used to characterize the distance detection from the time-of-flight module to the reflector. The horizontal axis of the histogram data can be time, with the time unit being picoseconds, specifically the time recorded by the time-of-flight module's TDC. The vertical axis of the histogram data can be the number of photons, specifically the number of photons received by the SPAD in the time-of-flight module at different time points. This histogram data can be automatically sent from the time-of-flight module to the main control test equipment, or it can be sent by the time-of-flight module after the main control test equipment sends an acquisition command to the time-of-flight module; this application does not impose any restrictions on this.

[0060] In one possible embodiment, the main control test device starts the time-of-flight module, specifically by sending a start command to the time-of-flight module. This start command is used to instruct the time-of-flight module to start, and to instruct the VCSEL in the time-of-flight module to emit photons to the reflector in the reflector module, to instruct the TDC in the time-of-flight module to record the time, and to instruct the SPAD in the flight data module to count the number of photons received.

[0061] Step 4: The main control test device changes the value at the specified location and jumps to Step 2 until, under this test environment, the corresponding histogram data is collected at all specified locations.

[0062] The main control test equipment can either change the value at a specified position based on a preset auto-increment logic, or determine the value at a specified position sequentially from a preset set of specified positions. The method of determining the value at a specified position from the preset set of specified positions can be found in the description of step two above, and will not be repeated here. The following is a further explanation of changing the value at a specified position using preset auto-increment logic: When the main control test equipment moves the time-of-flight module for the first time, it moves the time-of-flight module to the initial indicated position on the guide rail, and then increases the value at the initial specified position by a preset step size. When the value at the specified position increases to a preset threshold, the value at the specified position is no longer changed.

[0063] For example, the initial indicated position is 5 cm, and the preset step size for each increase is 5 cm. When the main control test equipment moves the time-of-flight module for the first time, it moves the time-of-flight module on the guide rail to a position 5 cm away from the reflector module. After collecting the histogram data, the main control test equipment changes the value of the specified position to: 5 cm + 5 cm = 10 cm. The main control test equipment moves the time-of-flight module to a position 10 cm away from the reflector module. When the value of the specified position increases to 20 cm, it reaches the preset threshold, and then the value of the specified position is no longer changed.

[0064] Optionally, the increment step can be different each time. For example, the first increment step is 5 cm, the second increment step is 10 cm, and the third increment step is 20 cm. That is, if the initial indicated position is 5 cm, after the first increment it is 10 cm (5 cm + 5 cm), after the second increment it is 20 cm (10 cm + 10 cm), and after the third increment it is 40 cm (20 cm + 20 cm).

[0065] Step 5: Change the specified reflectance and illuminance values ​​of the main control test equipment, and jump to Step 1 until the corresponding histogram data are collected in all test environments.

[0066] In step five, changing the values ​​of the specified reflectance and the specified illuminance is to change the test environment settings. Based on the test environment settings changed in step five, you then jump back to step one to adjust the test environment to the test environment changed in step five.

[0067] For example, during the first test, the main control test equipment controls the reflector to switch to a specified reflectivity (18%) and controls the light source to adjust to a specified illuminance (30kLux). Then, the histogram data corresponding to the first test is collected in the test environment of the first test. During the second test, the main control test equipment controls the specified reflectivity to be adjusted from 19% to 66%, the specified illuminance to be adjusted from 30kLux to 40kLux, the reflector to switch to the specified reflectivity (66%) and controls the light source to adjust to the specified illuminance (40kLux). Then, the histogram data corresponding to the second test is collected in the test environment of the second test.

[0068] Optionally, when the main control test equipment changes the value of the specified reflectance and the value of the specified illuminance, it can change both the specified reflectance and the specified illuminance simultaneously, or it can change only one of the specified reflectance and the specified illuminance while keeping the other unchanged. For example, only the value of the specified reflectance can be changed without changing the value of the specified illuminance, or only the value of the specified illuminance can be changed without changing the value of the specified reflectance.

[0069] For example, during the first test, the main control test equipment controls the reflector to switch to a specified reflectivity (18%) and controls the light source to adjust to a specified illuminance (30kLux). Then, the histogram data corresponding to the first test is collected in the test environment of the first test. During the second test, the main control test equipment controls the specified reflectivity to be adjusted from 19% to 66%, the specified illuminance changes, the reflector switches to the specified reflectivity (66%), and the specified illuminance remains at 30kLux. Then, the histogram data corresponding to the second test is collected in the test environment of the second test.

[0070] In one possible embodiment, the reflectance values ​​include 18%, 66%, 78%, and 88%; the illuminance values ​​include 30kLux, 40kLux, 50kLux, 60kLux, and 100kLux.

[0071] In one possible embodiment, the method further includes storing all the collected histogram data and associating the test environment, specified location, and histogram data to form complete test data.

[0072] Associating all histogram data with the test environment, specified location, and histogram data is to clarify in which test environment any given histogram data was collected. This histogram data can be stored in the main control test device, or it can be sent by the main control test device to the memory for storage.

[0073] This application also provides a computer-readable storage medium storing a computer program, the computer program including program instructions, which are implemented when executed by a processor. Figure 3 The automatic testing methods for the time-of-flight module provided in each step are detailed in the implementation methods provided in the above steps, and will not be repeated here.

[0074] The aforementioned computer-readable storage medium can be an internal storage unit of the main control test device provided in any of the foregoing embodiments, such as a hard disk or memory of an electronic device. The computer-readable storage medium can also be an external storage device of the electronic device, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the electronic device. Furthermore, the computer-readable storage medium can include both internal and external storage units of the electronic device. The computer-readable storage medium is used to store the computer program and other programs and data required by the electronic device. The computer-readable storage medium can also be used to temporarily store data that has been output or will be output.

[0075] The terms "first," "second," "third," "fourth," etc., in the claims, description, and drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0076] In the specific implementation of this application, data related to user information is involved. When the above embodiments of this application are applied to specific products or technologies, user permission or consent is required, and the collection, use and processing of related data must comply with the relevant laws, regulations and standards of the relevant countries and regions.

[0077] The term "embodiment" as used herein means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The presentation of this phrase in various locations throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments. The term "and / or" as used in this specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations. Those skilled in the art will recognize that the units and algorithm steps of the various examples described in connection with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0078] The methods and related apparatuses provided in this application are described with reference to the method flowcharts and / or structural diagrams provided in this application. Specifically, each block of the method flowchart and / or structural diagram, as well as combinations of blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing device to create a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing device, generate instructions for implementing the process. Figure 1 A schematic diagram of one or more processes and / or structures. Figure 1 The computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to operate in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 A schematic diagram of one or more processes and / or structures. Figure 1The functions specified in one or more boxes. These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable apparatus for implementing the process. Figure 1 A process or multiple processes and / or structures illustrate the steps of the functions specified in one or more boxes.

Claims

1. An automatic testing system for a time-of-flight module, characterized in that, The system includes: a main control test device, a guide rail, a time-of-flight module, a fixed-position reflector module, and a light source module; The main control test equipment is electrically connected to the guide rail, the time-of-flight module, the reflector module, and the light source module, respectively. The reflector module includes multiple reflectors with different reflectivities and a reflector switching device. The reflector switching device is a rotary motor that rotates the reflectors with different reflectivities in the same plane. The spacing between the multiple reflectors and the area of ​​the reflectors are set according to the field of view of the time-of-flight module. The area of ​​the reflector is larger than the field of view, and the spacing between the multiple reflectors is such that only one reflector is used to reflect photons to the time-of-flight module. The time-of-flight module is fixed to the carrier on the guide rail; The light source module includes a light source that emits light and a controller that controls the illuminance of the light source; The main control testing equipment is used to switch reflectors with different reflectivities via the reflector switching device, and also to adjust the illuminance of the light source via the controller for controlling the illuminance of the light source. It is also used to control the time-of-flight module to move sequentially on the guide rail from a target designated position determined from a set of designated positions, thereby adjusting the distance between the time-of-flight module and the reflector. The set of designated positions includes a plurality of preset designated positions arranged in sequence. Furthermore, it is used to start the time-of-flight module and collect histogram data; and to associate and store the histogram data with the reflectivity, the illuminance of the light source, and the designated positions.

2. The automatic testing system according to claim 1, characterized in that, The reflector module and the time-of-flight module are arranged in parallel relative to each other.

3. The automatic testing system according to claim 1, characterized in that, The multiple reflectors with different reflectivities are located on the same plane and can rotate within the same plane.

4. The automatic testing system according to claim 1, characterized in that, The time-of-flight module includes a transmitting module and a receiving module, and the pixel morphology of the receiving module includes single-point, multi-point, and area array.

5. The automatic testing system according to claim 1, characterized in that, The main control testing equipment includes computers, mobile phones, and other intelligent control devices.

6. An automatic testing method for a time-of-flight module, characterized in that, The method is applied to the main control test equipment in any one of claims 1 to 5, and the method includes: Step 1: Based on the test environment settings, control the reflectors to switch to a specified reflectivity and adjust the light source to a specified illuminance using the reflector switching device in the reflector module. The reflector module is fixed in position, and the reflector switching device is a rotary motor that allows reflectors with different reflectivities to rotate in the same plane. The spacing between the multiple reflectors and the area of ​​the reflectors are set according to the field of view of the time-of-flight module. The area of ​​the reflector is larger than the field of view, and the spacing between the multiple reflectors ensures that only one reflector is used to reflect photons to the time-of-flight module. Step 2: Controlling the time-of-flight module to move to a designated position on the guide rail includes: acquiring a set of designated positions, the set of designated positions including a plurality of preset designated positions arranged in sequence; determining a target designated position from the set of designated positions in sequence; and controlling the time-of-flight module to move to the target designated position on the guide rail. Step 3: Activate the time-of-flight module and collect histogram data. The histogram data is used to characterize the distance detection from the time-of-flight module to the reflector. Step 4: Change the value at the specified position and jump to Step 2 until all specified positions in this test environment have collected the corresponding histogram data. Step 5: Change the values ​​of the specified reflectance and the specified illuminance, then jump to Step 1 until the corresponding histogram data are collected in all test environments; Step 6: Store all the collected histogram data, and associate the test environment, the specified location, and the histogram data to form complete test data.

7. The automatic testing method according to claim 6, characterized in that, include: The reflectance values ​​include: 18%, 66%, 78%, and 88%; the illuminance values ​​include: 30kLux, 40kLux, 50kLux, 60kLux, and 100kLux.

8. The automatic testing method according to claim 6, characterized in that, The designated position refers to the distance between the time-of-flight module and the reflector; the value of the designated position includes discrete values ​​at fixed intervals within the range of 0-15m.

9. The automatic testing method according to claim 8, characterized in that, The fixed interval is an integer ranging from 1mm to 1000mm.

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