显示装置及其源极驱动电路、芯片
By designing a switching switch and an optimized source drive circuit with an inverter, efficient multi-channel testing was achieved, solving the testing time and cost problems caused by the increase in the number of channels, and ensuring circuit reliability in medium-voltage applications.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHIPONE TECHNOLOGY (ZHUHAI) CO LTD
- Filing Date
- 2023-06-19
- Publication Date
- 2026-07-17
AI Technical Summary
As display panel resolution increases, the number of source drive circuit channels also increases, leading to higher chip testing time and costs. Existing technologies struggle to perform multi-channel testing efficiently.
Design a source drive circuit that enables a single probe to measure multiple channels at once by switching the output multiplexer and the test multiplexer. Use switching switches and inverters to optimize the voltage control of the channels and avoid voltage crossover issues for components.
This technology enables multiple channels to be tested simultaneously using a single probe during chip testing, saving testing time and costs, and preventing circuit damage under medium-voltage conditions, thereby improving testing efficiency and reliability.
Smart Images
Figure CN116704921B_ABST