A broadband microwave integrated circuit test system and method

Abstract

The application discloses a kind of wideband microwave integrated circuit test system and method, belong to microwave integrated circuit test technical field;The application is based on the double-path coherent signal of signal generation and test analysis integration module and the cooperative measurement and control of the wideband microwave integrated circuit to be tested, the source standing wave characteristic of wideband microwave integrated circuit is tested, through the main control unit to digital signal processing control unit, test adaptation and routing connection circuit, signal generation unit, signal analysis unit and the wideband microwave integrated circuit to be tested are integrally cooperated and controlled, can complete the one-time connection of batch wideband microwave integrated circuit to be tested and the source standing wave characteristic automatic test evaluation based on continuous scanning mode, solve the problems of "corresponding test composition and the cost, time, test instrument and other resource consumption and low efficiency caused by complex operation etc." in the prior art.

Description

Technical Field

[0001] This invention relates to the field of microwave integrated circuit testing technology, and in particular to a wideband microwave integrated circuit testing system. Background Technology

[0002] The statements in this section merely refer to the background art related to this invention and do not necessarily constitute prior art.

[0003] With the rapid development of microwave integrated circuits and their technologies, the types, quantities, and scale of microwave integrated circuit manufacturing and applications are all showing a rapid growth trend. Therefore, the testing workload during mass production is also increasing, posing a significant challenge to the performance evaluation of source standing wave characteristics for broadband microwave integrated circuits with microwave signal generation and output functions. Using traditional methods, three approaches are typically employed when testing key characteristics such as source standing wave characteristics of broadband microwave integrated circuits with microwave signal generation and output functions:

[0004] (1) Vector Network Analyzer Test Method. This method involves using a vector network analyzer, after single-port calibration, to directly connect to the source output port of the broadband microwave integrated circuit under test for standing wave (SWR) testing.

[0005] (2) Load-pulse test method based on impedance modulator. An impedance modulator is connected between the broadband microwave integrated circuit under test and the microwave power meter. As an impedance transformation device, the impedance modulator can provide a wide range of termination impedance states for the output terminal of the broadband microwave integrated circuit under test. By testing the signal output power under different termination impedance states with the microwave power meter, the maximum power of the output signal of the broadband microwave integrated circuit under test and its corresponding termination impedance state can be found. According to microwave transmission line theory, at this time, the source impedance of the broadband microwave integrated circuit under test and the equivalent load impedance composed of the impedance modulator and the microwave power meter reach a conjugate matching state. Therefore, by testing the equivalent load impedance, the source impedance of the broadband microwave integrated circuit under test can be obtained, and then the source standing wave characteristics can be obtained through the calculation relationship between impedance and reflection coefficient.

[0006] (3) Standard instrument testing method. The test environment is set up using standard test instruments such as spectrum analyzer and signal source (used as reference source) and directional coupler (directivity > 15dB), 6dB attenuator, etc. The spectrum analyzer, the broadband microwave integrated circuit under test and the signal source share a common time base reference. Then, manual operations such as repeated assembly, disassembly and instrument status setting are performed according to the test procedure.

[0007] The three traditional methods mentioned above cannot effectively meet the actual application needs of mass production lines and the relevant technical requirements for continuous improvement of the comprehensive manufacturing capabilities of microwave integrated circuits, in terms of testing costs, testing time, consumption of corresponding testing instrument resources, and testing evaluation results.

[0008] The method (1) does not actually obtain the "source standing wave" but rather the standing wave ratio result obtained by treating the broadband microwave integrated circuit under test as a load relative to the vector network analyzer. In addition, the broadband microwave integrated circuit under test is usually not powered on and is in normal working condition when tested in this state. Therefore, the method cannot obtain a true and effective source standing wave characteristic test evaluation result.

[0009] Method (2) requires not only configuring an impedance tuner and having it traverse all states to find the maximum value of the microwave power meter reading (i.e., the source end and the equivalent load end composed of the impedance tuner and the microwave power meter achieve conjugate matching), but also the discrete test mode requires performing the same test independently for each frequency point, which is quite cumbersome and time-consuming. At the same time, the non-ideal standing wave characteristics of the power probe will greatly limit the test evaluation effect of the source standing wave characteristics of the wideband microwave integrated circuit under test. The source standing wave characteristics that are better than the power probe standing wave characteristics will not be able to be accurately and effectively tested and evaluated.

[0010] Method (3) is the main testing method currently used in actual R&D and non-mass production applications. However, it requires a lot of standard testing instruments, the operation process is relatively complicated and time-consuming, and manual assembly, disassembly and isolation of instruments are required according to testing needs. As a result, the efficiency and results of discrete testing with non-continuous scanning cannot effectively meet the actual application needs of mass production lines. Summary of the Invention

[0011] To address the shortcomings of existing technologies, this invention provides a wideband microwave integrated circuit testing system and method that can directly and quickly test and obtain the true and effective source standing wave characteristics of the wideband microwave integrated circuit under operating conditions.

[0012] In a first aspect, the present invention provides a wideband microwave integrated circuit testing system;

[0013] A wideband microwave integrated circuit testing system includes a clock and local oscillator signal generation unit, a signal generation unit, an adapter and routing connection circuit, a signal analysis unit, a digital signal processing control unit, and a main control unit.

[0014] The clock and local oscillator signal generation unit is used to provide a time base reference signal and a local oscillator signal. The signal generation unit acquires the reference signal and the local oscillator signal, and generates a coherent reference signal that can be scanned synchronously and continuously based on the time base reference signal and the local oscillator signal. The main control unit is used to acquire test requirements and generate test and control commands based on the test requirements. The digital signal processing control unit generates control signals based on the test and control commands. The broadband microwave integrated circuit under test acquires the time base reference signal and generates a test output signal based on the time base reference signal and the control signal.

[0015] The adaptation and routing connection circuit acquires the coherent reference signal and the test output signal, performs beat frequency processing, and generates the signal to be tested; the signal analysis unit tests the signal to be tested based on the time base reference signal and the local oscillator signal, and obtains the source standing wave characteristics of the broadband microwave integrated circuit to be tested.

[0016] The digital signal processing control unit digitizes the source standing wave characteristics and transmits them to the main control unit. The main control unit compares the source standing wave characteristics with a preset source standing wave pass threshold to determine the test result of the broadband microwave integrated circuit to be tested.

[0017] Furthermore, the adaptation and routing connection circuit includes an adaptation interface circuit, a switch matrix circuit, and a coherent beat frequency processing circuit. Multiple broadband microwave integrated circuits under test are electrically connected to the adaptation interface circuit, the adaptation interface circuit is electrically connected to the switch matrix circuit, the signal generation unit is electrically connected to the switch matrix circuit, and the switch matrix circuit is electrically connected to the coherent beat frequency processing circuit. This allows the test output signal and coherent reference signal generated by the broadband microwave integrated circuits under test to be transmitted to the coherent beat frequency processing circuit via the switch matrix circuit. The coherent beat frequency processing circuit performs beat frequency analysis on the test output signal and coherent reference signal to obtain the signal under test. The coherent beat frequency processing circuit is also electrically connected to the signal analysis unit to transmit the signal under test to the signal analysis unit.

[0018] Furthermore, the digital signal processing control unit controls the operating status of the adapter and routing connection circuit, the broadband microwave integrated circuit under test, the signal generation unit, and the signal analysis unit according to the control signal.

[0019] Furthermore, the digital signal processing control unit is communicatively connected to the main control unit via a standard high-speed bus.

[0020] Furthermore, the signal generation unit and the signal analysis unit operate synchronously and in parallel.

[0021] Furthermore, a difference is set between the frequency of the coherent reference signal and the frequency of the test output signal generated by the broadband microwave integrated circuit under test, wherein the difference is determined according to the test requirements.

[0022] Furthermore, the main control unit is an embedded computer module equipped with measurement and control software, the clock and local oscillator signal generation unit is a clock and local oscillator signal generation module, the signal generation unit is a coherent reference signal generation module, and the signal analysis unit is a spectrum analysis module.

[0023] Secondly, the present invention provides a method for testing wideband microwave integrated circuits;

[0024] A method for testing broadband microwave integrated circuits includes the following steps:

[0025] S1. Start the clock and local oscillator signal generation unit, generate the time base reference signal and local oscillator signal and send them to the signal generation unit and signal analysis unit;

[0026] S2. The signal generation unit acquires the reference signal and the local oscillator signal, and generates a coherent reference signal that can be scanned synchronously and continuously based on the time base reference signal and the local oscillator signal, and sends it to the adapter and routing connection circuit; the broadband microwave integrated circuit under test acquires the time base reference signal, and generates a test output signal based on the time base reference signal; the adapter and routing connection circuit processes the test output signal based on the coherent reference signal to generate the signal under test; the signal analysis unit tests the signal under test based on the standing wave characteristics based on the time base reference signal and the local oscillator signal, acquires the source standing wave characteristics of the broadband microwave integrated circuit under test, and sends it to the digital signal processing control unit;

[0027] S3. The digital signal processing control unit digitizes the source standing wave characteristics and transmits them to the main control unit. The main control unit compares the source standing wave characteristics with the preset source standing wave pass threshold to determine the test result of the broadband microwave integrated circuit to be tested.

[0028] Furthermore, prior to S1, it also includes:

[0029] The main control unit acquires the test requirements input by the operator and controls the working mode of the digital signal processing control unit, the adapter and routing connection circuit and the broadband microwave integrated circuit under test according to the test requirements;

[0030] The digital signal processing control unit controls the operating status of the broadband microwave integrated circuit under test, the signal generation unit, and the signal analysis unit based on the operating mode.

[0031] Furthermore, the adapter and routing connection circuit performs beat frequency processing on the test output signal to obtain the signal to be tested.

[0032] Compared with the prior art, the beneficial effects of the present invention are:

[0033] 1. The technical solution provided by this invention, when conducting rapid testing and evaluation of the source standing wave characteristics of broadband microwave integrated circuits for mass production applications, does not require a large amount of standard instrument resources. The corresponding integrated signal generation and test analysis module can not only be used for source standing wave characteristic testing, but also has platform-based testing technology capabilities for testing and evaluating other parameters of the broadband microwave integrated circuit under test. Through high integration based on standard high-speed bus technology, it can achieve good support for large-scale multi-parameter parallel testing, significantly improving testing and resource application efficiency. In addition, it does not require a large amount of testing time. Only a one-time connection is needed to achieve automatic testing of batches of broadband microwave integrated circuits under test in continuous scanning mode under centralized and unified control, without manual intervention, significantly improving testing efficiency. Only a one-time connection between the circuit provided by this invention and the broadband microwave integrated circuit under test is needed to directly and quickly test and obtain the true and effective source standing wave characteristics of the broadband microwave integrated circuit under test under operating conditions, rather than the alternative or limited test evaluation results obtained by traditional methods. This effectively solves the bottleneck problems of cost, time, test instrument resource consumption, and poor test evaluation effect due to the complexity of corresponding test components and operations, as well as the limitations of non-continuous discrete modes. The method provided by this invention is simple, easy to use, economical, fast, and has high efficiency in testing and resource application, and is highly versatile.

[0034] 2. The technical solution provided by this invention can not only realize rapid testing and evaluation of the source standing wave characteristics of broadband microwave integrated circuits, but also provide a generalized platform architecture on this basis. It integrates the rapid testing and evaluation function of multiple parameters, including the source standing wave characteristics of broadband microwave integrated circuits, into the comprehensive capability of microwave integrated circuit manufacturing. This enables integrated measurement and control applications that meet the application needs and technical requirements of low-cost, high-efficiency mass production of microwave integrated circuits, and satisfies the actual technical requirements of the testing engineering field for the actual mass production application needs of microwave integrated circuits. Attached Figure Description

[0035] The accompanying drawings, which form part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.

[0036] Figure 1 This is a schematic diagram of the system architecture of a broadband microwave integrated circuit testing system provided in an embodiment of the present invention. Detailed Implementation

[0037] It should be noted that the following detailed descriptions are exemplary and intended to provide further illustration of the invention. Unless otherwise specified, all technical and scientific terms used in this invention have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains.

[0038] Where there is no conflict, the embodiments and features in the embodiments of the present invention can be combined with each other.

[0039] Example 1

[0040] In production line testing applications of broadband microwave integrated circuits with microwave signal generation and output functions, particularly for key characteristics such as source standing wave characteristics (VSWR), traditional methods often present several challenges. First, configuring impedance tuners and finding the conjugate matching state through impedance tuning is cumbersome and time-consuming, and the non-ideal port VSWR of power probes severely limits the effectiveness of VSWR testing. Second, using numerous standard test instruments and involving complex and time-consuming manual assembly, disassembly, and isolated instrument settings based on testing needs, results in discrete, non-continuous scanning testing of the VSWR of the broadband microwave integrated circuits under test. This approach is significantly incompatible with the application requirements of mass production testing and is only suitable for scenarios where testing efficiency and resources are not critical. Furthermore, it fails to effectively meet the practical application needs of mass production lines and the technical requirements for continuously improving the overall manufacturing capabilities of microwave integrated circuits in terms of testing cost, testing time, resource consumption of corresponding instruments, and the limitations of discrete testing methods. Therefore, this invention provides a broadband microwave integrated circuit testing system.

[0041] Next, combined Figure 1 This embodiment discloses a broadband microwave integrated circuit testing system. The system includes a clock and local oscillator signal generation unit, a signal generation unit, an adapter and routing connection circuit, a signal analysis unit, a digital signal processing control unit, and a main control unit. The signal analysis unit, signal generation unit, clock and local oscillator signal generation unit, and digital signal processing control unit form an integrated module for signal generation and test analysis. The main control unit communicates with the digital signal processing control unit via a standard high-speed bus. The clock and local oscillator signal generation unit communicates with the signal generation unit, the signal analysis unit, and the broadband microwave integrated circuit under test. The broadband integrated circuit under test is connected to the adapter and routing connection circuit. The signal generation unit is connected to the adapter and routing connection circuit, and the adapter and routing connection circuit is connected to the signal analysis unit.

[0042] The main control unit acquires the test requirements, generates test and control commands based on the test requirements, and sends them to the digital signal processing control unit. The digital signal processing control unit generates corresponding control signals based on the test requirements and sends them to the broadband microwave integrated circuit under test, the adapter and routing connection circuit, the signal generation unit, and the signal analysis unit, respectively, to control the working status of the broadband microwave integrated circuit under test, the signal generation unit, and the signal analysis unit.

[0043] In other words, the main control unit controls multiple broadband microwave integrated circuits under test to generate the required test output signals through the digital signal processing and control unit, and controls the internal switching state of the adapter and routing connection circuit to build channels for transmitting coherent reference signals, test output signals and test signals for multiple broadband microwave integrated circuits under test, so as to transmit the test signals to the signal analysis unit for testing.

[0044] The digital signal processing and control unit controls multiple broadband microwave integrated circuits under test to generate the required test output signals. The control signal generation unit provides corresponding coherent reference signals for multiple broadband microwave integrated circuits under test. The control signal analysis unit tests the test signals of multiple broadband microwave integrated circuits under test and further obtains their corresponding source standing wave characteristics.

[0045] The clock and local oscillator signal generation unit provides a time base reference signal and a local oscillator signal. The signal generation unit acquires the reference signal and the local oscillator signal and generates a coherent reference signal that can be scanned synchronously and continuously based on the time base reference signal and the local oscillator signal. The broadband microwave integrated circuit under test acquires the time base reference signal and generates a test output signal based on the time base reference signal. The adapter and routing connection circuit acquires the coherent reference signal and the test output signal and processes the test output signal based on the coherent reference signal to generate the signal under test. The signal analysis unit tests the signal under test based on the standing wave characteristics according to the time base reference signal and the local oscillator signal to acquire the source standing wave characteristics of the broadband microwave integrated circuit under test. The digital signal processing control unit digitizes the source standing wave characteristics and transmits them to the main control unit. The main control unit compares the source standing wave characteristics with a preset source standing wave pass threshold to determine the test result of the broadband microwave integrated circuit under test.

[0046] The adapter and routing connection circuit includes an adapter interface circuit, a switch matrix circuit, and a coherent beat frequency processing circuit. Multiple broadband microwave integrated circuits under test are electrically connected to the adapter interface circuit, the adapter interface circuit is electrically connected to the switch matrix circuit, the signal generation unit is electrically connected to the switch matrix circuit, and the switch matrix circuit is electrically connected to the coherent beat frequency processing circuit. This allows the test output signal and coherent reference signal generated by the broadband microwave integrated circuits under test to be transmitted to the coherent beat frequency processing circuit via the switch matrix circuit. The coherent beat frequency processing circuit performs beat frequency analysis on the test output signal and coherent reference signal to obtain the signal under test. The coherent beat frequency processing circuit is also electrically connected to the signal analysis unit to transmit the signal under test to the signal analysis unit.

[0047] Specifically, the adapter interface circuit achieves electrical interconnection with multiple broadband microwave integrated circuits under test (BUCs) to transmit the test output signals of the BUCs to the switch matrix circuit, while simultaneously transmitting control signals sent by the digital signal processing control unit (DSP) to the BUCs. The adapter interface circuit and the switch matrix circuit are electrically interconnected. The switch matrix circuit receives switch control signals and, based on these signals, performs internal switch control, establishing a routing channel for the test output signals of the BUCs, thus transmitting the test output signals to... The coherent beat frequency processing circuit and the signal generation unit are electrically interconnected. The switch matrix circuit receives switch control signals and, based on these signals, performs internal switch control to construct multiple routing channels for coherent reference signals, enabling their transmission to the coherent beat frequency processing circuit. The switch matrix circuit and the coherent beat frequency processing circuit are electrically interconnected, and the coherent beat frequency processing circuit is also electrically interconnected with the signal analysis unit. This allows the test output signals of the corresponding number of channels to beat with the coherent reference signals to obtain the signal under test, which is then transmitted to the signal analysis unit. The frequency of the signal under test is the frequency difference between the coherent reference signal and the test output signal. The signal analysis unit measures the peak and trough values ​​of the amplitude of the signal under test to obtain the standing wave ratio (VSWR) characteristic (the ratio of the maximum amplitude to the minimum amplitude).

[0048] In this embodiment, the main control unit is an embedded computer module equipped with measurement and control software; the clock and local oscillator signal generation unit is a clock and local oscillator signal generation module; the signal generation unit is a coherent reference signal generation module; the signal analysis unit is a spectrum analysis module; and the digital signal processing control unit is a processing circuit based on FPGA+DSP in the prior art. The coherent beat frequency processing circuit consists of a switch, an attenuator, and a coupler connected in sequence. It controls the time-division and / or simultaneous switching of the signal channels of the test output signal and the coherent reference signal through internal switches, and performs signal attenuation, coupling, and multi-carrier signal transmission processing. The test output signal from the broadband microwave integrated circuit under test and the coherent reference signal from the signal generation unit are obtained through beat frequency in a dual-channel coherent beat frequency manner, so that the signal under test can be transmitted to the signal analysis unit for testing. The coherent beat frequency processing circuit adopts a common circuit in the prior art, and this embodiment does not improve it. Its specific connection relationship and operation mode will not be described here.

[0049] Furthermore, the signal generation unit and the signal analysis unit operate synchronously and in parallel. A difference is set between the frequency of the coherent reference signal and the test output signal generated by the broadband microwave integrated circuit under test. Specifically, the difference is determined according to the test requirements.

[0050] Example 2

[0051] This embodiment discloses a broadband microwave integrated circuit testing method based on the broadband microwave integrated circuit testing system described in Embodiment 1. The broadband microwave integrated circuit testing method includes the following steps:

[0052] S1. The main control unit acquires the test requirements input by the operator and controls the working mode of the digital signal processing control unit, the adapter and routing connection circuit, and the broadband microwave integrated circuit under test according to the test requirements; the digital signal processing control unit controls the working status of the broadband microwave integrated circuit under test, the signal generation unit, and the signal analysis unit based on the working mode.

[0053] S2, start the clock and local oscillator signal generation unit, generate the time base reference signal and local oscillator signal and send them to the signal generation unit and signal analysis unit.

[0054] S3. The signal generation unit acquires the reference signal and the local oscillator signal, and generates a coherent reference signal that can be scanned synchronously and continuously based on the time base reference signal and the local oscillator signal, and sends it to the adapter and routing connection circuit; the broadband microwave integrated circuit under test acquires the time base reference signal, and generates a test output signal based on the time base reference signal; the adapter and routing connection circuit processes the test output signal based on the coherent reference signal to generate the signal under test; the signal analysis unit tests the signal under test based on the standing wave characteristics based on the time base reference signal and the local oscillator signal, acquires the source standing wave characteristics of the broadband microwave integrated circuit under test, and sends it to the digital signal processing control unit.

[0055] The adapter and routing connection circuit performs beat frequency processing on the test output signal, including attenuation, coupling, time-division and / or simultaneous switching control processing, to obtain the signal to be tested.

[0056] S4. The digital signal processing control unit digitizes the source standing wave characteristics and transmits them to the main control unit. The main control unit compares the source standing wave characteristics with the preset source standing wave pass threshold to determine the test result of the broadband microwave integrated circuit to be tested.

[0057] For example, the specific process is as follows:

[0058] (1) The main control unit obtains the test requirements input by the operator, generates test and control instructions according to the test requirements and sends them to the digital signal processing control unit. The digital signal processing control unit generates corresponding control signals according to the test requirements and sends them to the broadband microwave integrated circuit under test, the adapter and routing connection circuit, the signal generation unit and the signal analysis unit respectively, so as to control the working status of the broadband microwave integrated circuit under test, the signal generation unit and the signal analysis unit.

[0059] In other words, the main control unit controls multiple broadband microwave integrated circuits under test to generate the required test output signals through the digital signal processing and control unit, and controls the internal switching state of the adapter and routing connection circuit to build channels for transmitting coherent reference signals, test output signals and test signals for multiple broadband microwave integrated circuits under test, so as to transmit the test signals to the signal analysis unit for testing.

[0060] The digital signal processing and control unit controls multiple broadband microwave integrated circuits under test to generate the required test output signals. The control signal generation unit provides corresponding coherent reference signals for multiple broadband microwave integrated circuits under test. The control signal analysis unit tests the test signals of multiple broadband microwave integrated circuits under test and further obtains their corresponding source standing wave characteristics.

[0061] (2) Start the clock and local oscillator signal generation unit, generate the time base reference signal and local oscillator signal and send them to the signal generation unit and the signal analysis unit.

[0062] (3) The signal generation unit acquires the reference signal and the local oscillator signal, and generates a coherent reference signal that can be scanned synchronously and continuously based on the time base reference signal and the local oscillator signal, and sends it to the adapter and routing connection circuit; the broadband microwave integrated circuit under test acquires the time base reference signal, and generates a test output signal based on the time base reference signal and the measurement and control command; the adapter and routing connection circuit performs beat frequency processing on the coherent reference signal and the test output signal to generate the signal under test; the signal analysis unit tests the signal under test based on the standing wave characteristics based on the time base reference signal and the local oscillator signal, acquires the source standing wave characteristics of the broadband microwave integrated circuit under test, and sends it to the digital signal processing control unit.

[0063] The adapter and routing connection circuit includes an adapter interface circuit, a switch matrix circuit, and a coherent beat frequency processing circuit. Multiple broadband microwave integrated circuits under test are electrically connected to the adapter interface circuit, the adapter interface circuit is electrically connected to the switch matrix circuit, the signal generation unit is electrically connected to the switch matrix circuit, and the switch matrix circuit is electrically connected to the coherent beat frequency processing circuit. This allows the test output signal and coherent reference signal generated by the broadband microwave integrated circuits under test to be transmitted to the coherent beat frequency processing circuit via the switch matrix circuit. The coherent beat frequency processing circuit performs beat frequency analysis on the test output signal and coherent reference signal to obtain the signal under test. The coherent beat frequency processing circuit is also electrically connected to the signal analysis unit to transmit the signal under test to the signal analysis unit.

[0064] Specifically, the adapter interface circuit achieves electrical interconnection with multiple broadband microwave integrated circuits under test (BUCs) to transmit the test output signals of the BUCs to the switch matrix circuit, and simultaneously transmits the control signals sent by the digital signal processing control unit to the BUCs. The adapter interface circuit and the switch matrix circuit are electrically interconnected; the switch matrix circuit receives switch control signals and, based on these signals, performs internal switch control to construct a routing channel for the test output signals of the BUCs, transmitting them to the coherent beat frequency processing circuit. The switch matrix circuit and the signal generation unit are electrically interconnected. The interconnection process involves a switch matrix circuit receiving switch control signals and implementing internal switch control based on these signals. This internal control constructs routing channels for multiple coherent reference signals, which are then transmitted to the coherent beat frequency processing circuit. The switch matrix circuit and the coherent beat frequency processing circuit are electrically interconnected, as are the coherent beat frequency processing circuit and the signal analysis unit. This allows the test output signals of the corresponding number of channels to beat with the coherent reference signals to obtain the signal under test, which is then transmitted to the signal analysis unit. The signal analysis unit measures the peak and trough values ​​of the amplitude of the signal under test to obtain the standing wave ratio (VSWR) characteristic (the ratio of the maximum amplitude to the minimum amplitude).

[0065] (4) The digital signal processing control unit digitizes the source standing wave characteristics and transmits them to the main control unit. The main control unit compares the source standing wave characteristics with the preset source standing wave qualification threshold to determine the test result of the broadband microwave integrated circuit to be tested.

[0066] The descriptions of each embodiment in the above embodiments have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0067] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A broadband microwave integrated circuit testing system, characterized in that, It includes a clock and local oscillator signal generation unit, a signal generation unit, an adapter and routing connection circuit, a signal analysis unit, a digital signal processing and control unit, and a main control unit; The clock and local oscillator signal generation unit is used to provide a time base reference signal and a local oscillator signal. The signal generation unit acquires the reference signal and the local oscillator signal, and generates a coherent reference signal that can be scanned synchronously and continuously based on the time base reference signal and the local oscillator signal. The broadband microwave integrated circuit under test acquires the time base reference signal and generates a test output signal based on the time base reference signal. The adaptation and routing connection circuit acquires the coherent reference signal and the test output signal, processes the test output signal according to the coherent reference signal, and generates the test signal. The signal analysis unit tests the signal under test based on the time base reference signal and the local oscillator signal, and obtains the source standing wave characteristics of the broadband microwave integrated circuit under test based on the standing wave characteristics. The adaptation and routing connection circuit includes an adaptation interface circuit, a switch matrix circuit, and a coherent beat frequency processing circuit. Multiple broadband microwave integrated circuits under test are electrically connected to the adaptation interface circuit. The adaptation interface circuit is electrically connected to the switch matrix circuit. The signal generation unit is electrically connected to the switch matrix circuit. The switch matrix circuit is electrically connected to the coherent beat frequency processing circuit, so that the test output signal and coherent reference signal generated by the broadband microwave integrated circuits under test are transmitted to the coherent beat frequency processing circuit via the switch matrix circuit. The coherent beat frequency processing circuit performs beat frequency analysis on the test output signal and coherent reference signal to obtain the signal under test. The coherent beat frequency processing circuit is electrically connected to the signal analysis unit to transmit the signal under test to the signal analysis unit. The digital signal processing control unit digitizes the source standing wave characteristics and transmits them to the main control unit. The main control unit compares the source standing wave characteristics with a preset source standing wave pass threshold to determine the test result of the broadband microwave integrated circuit to be tested.

2. The broadband microwave integrated circuit testing system as described in claim 1, characterized in that, The digital signal processing control unit controls the working status of the adapter and routing connection circuit, the broadband microwave integrated circuit under test, the signal generation unit, and the signal analysis unit according to the control signal.

3. The broadband microwave integrated circuit testing system as described in claim 1, characterized in that, The digital signal processing control unit is connected to the main control unit via a standard high-speed bus.

4. The broadband microwave integrated circuit testing system as described in claim 1, characterized in that, The signal generation unit and the signal analysis unit operate synchronously and in parallel.

5. The broadband microwave integrated circuit testing system as described in claim 1, characterized in that, A difference is set between the frequency of the coherent reference signal and the frequency of the test output signal generated by the broadband microwave integrated circuit under test, wherein the difference is determined according to the test requirements.

6. The broadband microwave integrated circuit testing system as described in claim 1, characterized in that, The main control unit is an embedded computer module equipped with measurement and control software; the clock and local oscillator signal generation unit is a clock and local oscillator signal generation module; the signal generation unit is a coherent reference signal generator signal generation module; and the signal analysis unit is a spectrum analysis module.

7. A broadband microwave integrated circuit testing method, implemented using the broadband microwave integrated circuit testing system according to any one of claims 1-6, characterized in that, Includes the following steps: S1. Start the clock and local oscillator signal generation unit, generate the time base reference signal and local oscillator signal and send them to the signal generation unit and signal analysis unit; S2. The signal generation unit acquires the reference signal and the local oscillator signal, and generates a coherent reference signal that can be scanned synchronously and continuously based on the time base reference signal and the local oscillator signal, and sends it to the adapter and routing connection circuit; the broadband microwave integrated circuit under test acquires the time base reference signal, and generates a test output signal based on the time base reference signal; the adapter and routing connection circuit processes the test output signal based on the coherent reference signal to generate the signal under test; the signal analysis unit tests the signal under test based on the standing wave characteristics based on the time base reference signal and the local oscillator signal, acquires the source standing wave characteristics of the broadband microwave integrated circuit under test, and sends it to the digital signal processing control unit; S3. The digital signal processing control unit digitizes the source standing wave characteristics and transmits them to the main control unit. The main control unit compares the source standing wave characteristics with the preset source standing wave pass threshold to determine the test result of the broadband microwave integrated circuit to be tested.

8. The broadband microwave integrated circuit testing method as described in claim 7, characterized in that, Before S1, it also includes: The main control unit acquires the test requirements input by the operator and controls the working mode of the digital signal processing control unit, the adapter and routing connection circuit and the broadband microwave integrated circuit under test according to the test requirements; The digital signal processing control unit controls the operating status of the broadband microwave integrated circuit under test, the signal generation unit, and the signal analysis unit based on the operating mode.

9. The broadband microwave integrated circuit testing method as described in claim 7, characterized in that, The adapter and routing connection circuit performs beat frequency processing on the test output signal to obtain the signal to be tested.

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