A microphone testing method, device, electronic device and storage medium

Abstract

Embodiments of the present application provide a microphone testing method, a microphone testing device, an electronic device and a storage medium. The microphone testing method comprises: obtaining a test audio signal obtained by a to-be-tested microphone module collecting a test sound source, and a reference audio signal obtained by a reference microphone module collecting a reference sound source; wherein the test sound source and the reference sound source have the same frequency parameter; processing the test audio signal and the reference audio signal to obtain air tightness parameters of each to-be-tested microphone and frequency response parameters of microphone channels of each to-be-tested microphone; and generating a test result of the to-be-tested microphone module based on the air tightness parameters and the frequency response parameters.

Description

Technical Field

[0001] This application relates to the field of electronic technology, and in particular to a microphone testing method, a microphone testing device, an electronic device, and a storage medium. Background Technology

[0002] Before a microphone module leaves the factory or is used, its performance generally needs to be tested. This testing involves not only evaluating the performance of individual microphones but also considering the airtightness of the entire microphone module due to its structure and assembly process. One common technique involves placing an external device, such as an artificial mouth, at the center of the microphone module. As the artificial mouth outputs audio data, the audio data collected by each microphone is analyzed to achieve the test. However, this method is complex and inefficient. Summary of the Invention

[0003] This application aims to provide a microphone testing method, a microphone testing device, an electronic device, and a storage medium.

[0004] The technical solution of this application embodiment is implemented as follows:

[0005] In a first aspect, embodiments of this application provide a microphone testing method, the method comprising:

[0006] Acquire the test audio signal obtained by the microphone module under test from the test audio source, and the reference audio signal obtained by the reference microphone module from the reference audio source; wherein the frequency parameters of the test audio source and the reference audio source are the same;

[0007] The test audio signal and the reference audio signal are processed to obtain the airtightness parameters of each microphone under test and the frequency response parameters of the microphone channel of each microphone under test;

[0008] Based on the airtightness parameter and the frequency response parameter, the test results of the microphone module under test are generated.

[0009] Secondly, embodiments of this application provide a microphone testing device, the device comprising:

[0010] The acquisition module is used to acquire the test audio signal obtained by the microphone module under test from the test sound source, and the reference audio signal obtained by the reference microphone module from the reference sound source; wherein the frequency parameters of the test sound source and the reference sound source are the same;

[0011] The processing module is used to process the test audio signal and the reference audio signal to obtain the airtightness parameters of each microphone under test and the frequency response parameters of the microphone channel of each microphone under test.

[0012] The generation module is used to generate test results for the microphone module under test based on the airtightness parameters and the frequency response parameters.

[0013] Thirdly, embodiments of this application provide an electronic device, which includes: a processor, a memory, and a communication bus;

[0014] The communication bus is used to realize the communication connection between the processor and the memory;

[0015] The processor is used to execute the microphone test program stored in the memory to implement the microphone test method described above.

[0016] Fourthly, embodiments of this application provide a storage medium storing one or more programs, which can be executed by one or more processors to implement the microphone testing method described above.

[0017] This application provides a microphone testing method, a microphone testing device, an electronic device, and a storage medium. The method involves acquiring a test audio signal obtained from a test audio source by a microphone module under test, and a reference audio signal obtained from a reference audio source by a reference microphone module. The test audio source and the reference audio source have the same frequency parameters. The test audio signal and the reference audio signal are processed to obtain the airtightness parameters and frequency response parameters of each microphone channel under test. Based on the airtightness parameters and frequency response parameters, the test results of the microphone module under test are generated. In other words, by processing the acquired test audio signal of the microphone module under test and the reference audio signal of the reference microphone module, the airtightness parameters and frequency response parameters of the microphone under test are obtained, thereby obtaining the test results of the microphone module under test. This eliminates the need for an external sound module to test the microphone module under test, reducing the use of hardware devices, and the method offers high testing efficiency during factory testing. Attached Figure Description

[0018] Figure 1 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0019] Figure 2 This is a schematic diagram of the stacked structure of the projection device provided in the embodiments of this application;

[0020] Figure 3 A schematic diagram illustrating the connection relationship between the microphone module under test, the audio processor, and the main chip provided in an embodiment of this application;

[0021] Figure 4A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0022] Figure 5 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0023] Figure 6 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0024] Figure 7 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0025] Figure 8 A waveform diagram illustrating the sound intensity of the audio signal when the microphone hole of the microphone under test is sealed and not sealed, as provided in an embodiment of this application.

[0026] Figure 9 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0027] Figure 10 A schematic diagram of the first frequency response curves of all reference microphones included in the artificial mouth test reference microphone module using electronic device peripherals provided in the embodiments of this application;

[0028] Figure 11 A schematic diagram of the second test frequency response curves of all reference microphones included in the reference microphone module for testing using the sound module built into the electronic device, provided in an embodiment of this application;

[0029] Figure 12 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0030] Figure 13 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0031] Figure 14 A schematic flowchart of an optional microphone testing method provided in an embodiment of this application;

[0032] Figure 15 An optional structural schematic diagram of the microphone testing device provided in the embodiments of this application;

[0033] Figure 16 This is an optional structural schematic diagram of an electronic device provided in an embodiment of this application. Detailed Implementation

[0034] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0035] The terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0036] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0037] See Figure 1 , Figure 1 This is a schematic diagram of an implementation flow of the microphone testing method provided in this application embodiment. The microphone testing method can be applied to electronic devices and includes the following steps:

[0038] Step 101: Obtain the test audio signal obtained by the microphone module under test from the test sound source, and the reference audio signal obtained by the reference microphone module from the reference sound source.

[0039] The test sound source and the reference sound source have the same frequency parameters.

[0040] In this embodiment, the test sound source can be obtained by integrating single-frequency sine signals of different frequencies within a certain frequency band into the same audio source. Alternatively, the test sound source can be obtained by integrating at least two different signals, such as single-frequency sine signals, single-frequency sine signal sequences, or sweep signals of different frequencies within a certain frequency band, into the same sound source. For example, the certain frequency band can be a frequency range from 100 Hz to 15 kHz.

[0041] In this embodiment of the application, the reference sound source can be obtained by integrating single-frequency sine signals of different frequencies within a certain frequency band into the same audio source. Alternatively, the reference sound source can be obtained by integrating at least two different signals, such as single-frequency sine signals, single-frequency sine signal sequences, or sweep signals of different frequencies within a certain frequency band, into the same sound source. Here, the frequency parameters of the reference sound source are the same as the frequency parameters of the test sound source, that is, the reference sound source and the test sound source are the same.

[0042] In this embodiment, the test audio signal is the audio signal obtained by each microphone under test in the microphone module under test collecting the test sound source at a sampling frequency. For example, the sampling frequency can be 16kHz.

[0043] In this embodiment, the reference audio signal is the audio signal obtained by each reference microphone in the reference microphone module sampling the test sound source at a sampling frequency. For example, the sampling frequency can be 16kHz.

[0044] In this embodiment, the microphone module is composed of a certain number of acoustic sensors, such as microphones, arranged according to a certain rule, used to sample and process the spatial characteristics of the sound field. Here, the microphone module under test and the reference microphone module have the same structure, that is, the positional distribution of the microphone module under test in the electronic device is consistent with the positional distribution of the reference microphone module in the same type of electronic device, and the performance of the reference microphone module meets the performance conditions. It should be noted that the microphone module under test and the reference microphone module belong to different electronic devices, and the reference microphone module is calibrated as a device with qualified test results.

[0045] In practical applications, electronic devices can include those equipped with microphone modules, such as projection devices, mobile phones, tablets, laptops, personal digital assistants (PDAs), cameras, wearable devices, and fixed terminal devices such as desktop computers.

[0046] In this embodiment of the application, the electronic device acquires the test audio signal obtained by each microphone under test in the microphone module under test from the test sound source, and the reference audio signal obtained by each reference microphone in the reference microphone module from the reference sound source.

[0047] In other embodiments of this application, step 101, acquiring the test audio signal obtained by the microphone module under test from the test sound source and the reference audio signal obtained by the reference microphone module from the reference sound source, can also be achieved through the following steps:

[0048] Step 1: During the output of the test sound source by the first sound module, the test audio signal is collected through the microphone module under test.

[0049] The first sound module and the microphone module under test are configured on the same electronic device. The first sound module and the microphone module under test are symmetrically arranged along the coordinate axis in a two-dimensional space constructed with the center point of the electronic device as the origin of the coordinate system.

[0050] In this embodiment, the first sound module is a pre-configured sound module in the electronic device, and the microphone module under test is a pre-configured microphone module in the electronic device. Therefore, the first sound module and the microphone module under test are configured on the same electronic device, and are symmetrically arranged along the coordinate axes in a two-dimensional space constructed with the center point of the electronic device as the origin. Here, the first sound module and the microphone module under test can be symmetrically arranged along the horizontal axis or along the vertical axis in the two-dimensional space. Here, the first sound module can be a speaker. This ensures that the microphone module under test can collect audio signals.

[0051] In this embodiment of the application, during the process of the first sound module outputting the test sound source, the test audio signal is collected by the microphone module under test. It can be understood that since the first sound module and the microphone module under test are configured in the same electronic device, that is, the electronic device is already configured with a sound module, the test sound source can be output by the first sound module built into the electronic device, and there is no need to use the external sound module to output the test sound source.

[0052] In a feasible application scenario, taking an electronic device as a projection device as an example, the following explanation is provided. Figure 2 As shown, Figure 2 The diagram shows a stacked structure of the projection device. The projection device includes, but is not limited to, the microphone module under test, the first sound-emitting module, and a small fan. The microphone module under test includes microphones 211, 212, 213, and 214. A two-dimensional space is constructed with the center point of the electronic device as the origin. Microphones 211 and 212 form angles of 50 degrees with the vertical axis of the two-dimensional space, while microphones 213 and 214 form angles of 55 degrees with the vertical axis. Therefore, microphones 211 and 212 are symmetrical about the vertical axis, and microphones 213 and 214 are symmetrical about the vertical axis; that is, the microphone module under test is symmetrically arranged about the vertical axis of the two-dimensional space. The first sound module includes a left speaker 221, a right speaker 222 and a woofer 223. The left speaker 221 and the right speaker 222 are symmetrical about the vertical axis in two-dimensional space, and the woofer 223 itself is symmetrical about the vertical axis in two-dimensional space. Therefore, the first sound module is symmetrically set about the vertical axis in two-dimensional space.

[0053] Here, refer to Figure 2 and Figure 3 As shown, Figure 3 This diagram illustrates the connection between the microphone module under test (DUT), the audio processor, and the main chip. The audio processor can be an advanced digital signal processor (ADSP), or any other signal processor. The main chip can be a system-on-a-chip (SoC), or any other chip; this application does not impose specific limitations on this. Here, the audio processor and the microphone under test acquire audio signals by receiving clock signals (clock, clk) from the main chip. It should be noted that since the first sound module and the microphone module under test are symmetrically arranged along the coordinate axes in a two-dimensional space constructed with the center point of the electronic device as the origin, during the acquisition process, the audio signals data1 and data3 of the microphone under test 211 and 213 are acquired when the clock signal reaches its rising edge; and the audio signals data2 and data4 of the microphone under test 212 and 214 are acquired when the clock signal reaches its falling edge. This ensures that the clock frequency is at least 10 times higher than the sampling frequency, thereby ensuring that there is no phase difference in the test audio signals of the four microphones. It should be noted that, from Figure 2 As can be seen from Figure 3, when the first sound-producing device in the electronic device outputs an audio signal, there is a distance difference between the first sound-producing device and each microphone under test. However, the distance difference is basically the same for the electronic device, and the sound intensity of the audio signal of each microphone under test can be compensated based on the distance difference.

[0054] Step 2: During the process of the second sound module outputting the reference sound source, the reference audio signal is acquired through the reference microphone module.

[0055] The second sound module and the microphone module under test are not configured on the same electronic device.

[0056] In this embodiment, the second sound module can be understood as a sound module of an electronic device peripheral. The peripheral sound module is a dedicated artificial mouth for audio testing, and the artificial mouth is calibrated with a reference microphone before use. During the experiment, before using the peripheral second sound module (such as the artificial mouth) to output the reference sound source, the position of the second sound module needs to be adjusted to ensure that the sound pressure measured at each reference microphone is the same. The implementation process is as follows: During the output of the sound source for calibrating the audio frequency by the second sound module, the position of the second sound module is adjusted to obtain the sound pressure measured at each microphone in the reference microphone module. When the sound pressure measured at each microphone in the reference microphone module is the preset sound pressure, the current position of the second sound module is determined as the final position, and no further adjustment is made. Here, the sound source for calibrating the audio frequency can be a single-frequency sine wave signal of a specific frequency. Here, the single-frequency sine wave signal can be a 1kHz, 0dB sine wave signal. The preset sound pressure can be 63dB, or it can be other sound pressure levels; this application does not impose specific limitations on this.

[0057] Step 102: Process the test audio signal and the reference audio signal to obtain the airtightness parameters of each microphone under test and the frequency response parameters of each microphone channel.

[0058] In this embodiment, the airtightness parameter is used to verify the difference in the isolation effect of each microphone under test on the internal cavity noise in the microphone module under test. Here, a larger airtightness parameter indicates better sealing of the microphone module under test; conversely, a smaller airtightness parameter indicates poorer sealing of the microphone module under test. The frequency response parameter is used to reflect the deviation of the frequency response characteristics between the channels of each microphone under test.

[0059] Step 103: Based on the airtightness parameters and frequency response parameters, generate the test results of the microphone module under test.

[0060] In this embodiment, after the electronic device acquires the test audio signal obtained by the microphone module under test from the test sound source and the reference audio signal obtained by the reference microphone module from the reference sound source, it processes the test audio signal and the reference audio signal to obtain the airtightness parameters of each microphone under test and the frequency response parameters of the microphone channel of each microphone under test. Then, based on the airtightness parameters and frequency response parameters of each microphone under test, the electronic device generates test results for the microphone module under test.

[0061] This application provides a microphone testing method by acquiring test audio signals obtained from a test sound source by a microphone module under test, and reference audio signals obtained from a reference sound source by a reference microphone module; wherein the frequency parameters of the test sound source and the reference sound source are the same; the test audio signals and the reference audio signals are processed to obtain the airtightness parameters and frequency response parameters of the microphone channels of each microphone under test; based on the airtightness parameters and frequency response parameters, the test results of the microphone module under test are generated; that is, by processing the acquired test audio signals of the microphone module under test and the reference audio signals of the reference microphone module, the airtightness parameters and frequency response parameters of the microphone under test are obtained, thereby obtaining the test results of the microphone module under test; thus, there is no need to use an external sound module to test the microphone module under test, reducing the use of hardware equipment, and the method has high testing efficiency in the factory testing process.

[0062] See Figure 4 , Figure 4 This is a schematic diagram of an implementation flow of the microphone testing method provided in this application embodiment. The microphone testing method is applied to electronic devices and includes the following steps:

[0063] Step 401: Obtain the test audio signal obtained by the microphone module under test from the test sound source, and the reference audio signal obtained by the reference microphone module from the reference sound source.

[0064] The test sound source and the reference sound source have the same frequency parameters.

[0065] Step 402: Process the test audio signal and the reference audio signal to obtain the airtightness parameters of each microphone under test.

[0066] In the embodiments of this application, reference is made to Figure 5 As shown, step 402 processes the test audio signal and the reference audio signal to obtain the airtightness parameters of each microphone under test, which can be achieved through the following steps:

[0067] Step 4021: Process the reference audio signal to obtain the first calibrated sound pressure value of the reference audio signal of a reference microphone in the reference microphone module when the first sound hole is sealed, and the second calibrated sound pressure value of the reference audio signal of the reference microphone when the first sound hole is not sealed.

[0068] In this embodiment, the reference microphone is any microphone in the reference microphone module.

[0069] In this embodiment of the application, the first calibrated sound pressure value is the sound intensity of the reference audio signal measured by a sound pressure meter when the first sound hole of the reference microphone is sealed; the second calibrated sound pressure value is the sound intensity of the reference audio signal measured by a sound pressure meter when the first sound hole of the reference microphone is not sealed.

[0070] Here, the first calibrated sound pressure level can be obtained through a single measurement, or it can be obtained by averaging multiple measurements; this application does not impose specific limitations on this. Similarly, the second calibrated sound pressure level can be obtained through a single measurement, or it can be obtained by averaging multiple measurements; this application does not impose specific limitations on this.

[0071] Step 4022: Process the test audio signal to obtain the first test sound pressure value of the test audio signal of the microphone j under test when the second sound hole is sealed, and the second test sound pressure value of the test audio signal of the microphone j under test when the second sound hole is not sealed.

[0072] Where j is a positive integer greater than or equal to 1 and less than or equal to J, and J is the total number of microphones under test included in the microphone module under test.

[0073] In this embodiment, the first test sound pressure value is the sound intensity of the test audio signal measured by a sound pressure meter when the second microphone hole is sealed; the second test sound pressure value is the sound intensity of the test audio signal measured by a sound pressure meter when the second microphone hole is not sealed. It should be noted that there are multiple first and second test sound pressure values.

[0074] Step 4023: Based on the first calibration sound pressure value, the second calibration sound pressure value, the first test sound pressure value, and the second test sound pressure value, determine the airtightness parameters of the microphone j to be tested.

[0075] In this embodiment, the electronic device processes the reference audio signal to obtain a first calibrated sound pressure level (SPL) value of the reference audio signal from a reference microphone in the reference microphone module when the first sound-receiving hole is sealed, and a second calibrated SPL value of the reference audio signal from the reference microphone when the first sound-receiving hole is not sealed. Further, the electronic device processes the test audio signal to obtain a first test SPL value of the test audio signal from the microphone under test (J) in the microphone under test module when the second sound-receiving hole is sealed, and a second test SPL value of the test audio signal from the microphone under test (J) when the second sound-receiving hole is not sealed. Finally, the electronic device determines the airtightness parameters of the microphone under test (J) based on the first calibrated SPL value, the second calibrated SPL value, the first test SPL value, and the second test SPL value.

[0076] In the embodiments of this application, reference is made to Figure 6 As shown, step 4023, based on the first calibration sound pressure value, the second calibration sound pressure value, the first test sound pressure value, and the second test sound pressure value, determines the airtightness parameters of the microphone j under test. This can be achieved through the following steps:

[0077] Step A1: Subtract the first test sound pressure value from the second test sound pressure value to obtain the reference airtightness parameters of the microphone j under test.

[0078] In this embodiment of the application, the first test sound pressure value and the second test sound pressure value each have multiple values. Therefore, the first test sound pressure value is subtracted from the second test sound pressure value to obtain multiple reference airtightness parameters of the microphone j to be tested.

[0079] Step A2: Subtract the first calibration sound pressure value from the second calibration sound pressure value to obtain the calibration airtightness parameters of the microphone under test.

[0080] Step A3: Divide the calibrated airtightness parameter by the reference airtightness parameter and use the quotient as the difference parameter.

[0081] In this embodiment, the difference parameter is used to represent the difference between the calibrated airtightness parameter and the reference airtightness parameter. It should be noted that the smaller the difference parameter, the more accurate the calculated airtightness parameter. Here, to minimize the difference parameter, since there are multiple reference airtightness parameters, the largest reference airtightness parameter is selected, and the quotient obtained by dividing the calibrated airtightness parameter by the largest reference airtightness parameter is used as the difference parameter, thus ensuring that the difference parameter is minimized.

[0082] Step A4: Based on the first calibrated sound pressure value, the second calibrated sound pressure value, the second test sound pressure value, and the difference parameter, obtain the airtightness parameters of the microphone j under test.

[0083] In the embodiments of this application, reference is made to Figure 7 As shown, step A4, based on the first calibrated sound pressure value, the second calibrated sound pressure value, the second test sound pressure value, and the difference parameter, obtains the airtightness parameters of the microphone j under test, which can be achieved through the following steps.

[0084] Step B1: Subtract the second calibrated sound pressure value from the second test sound pressure value to obtain the first difference.

[0085] Step B2: Subtract the first calibrated sound pressure value from the second test sound pressure value to obtain the second difference value.

[0086] Step B3: Obtain the third difference obtained by subtracting the first difference from the second difference, and determine the ratio of the third difference to the difference parameter as the airtightness parameter of the microphone j under test.

[0087] In one feasible application scenario, the electronic device first processes the reference audio signal to obtain the first calibrated sound pressure value μ of the reference audio signal from a reference microphone in the reference microphone module when the first sound-receiving hole is sealed. 标 And the second calibrated sound pressure value τ of the reference audio signal when the first microphone aperture is not sealed. 标 The test audio signal is processed to obtain the first test sound pressure value μ of the test audio signal of the microphone j under test in the microphone module under test when the second sound hole is sealed. 测 And the second test sound pressure value τ of the audio signal tested by the microphone under test j when the second sound hole is not sealed. 测 Secondly, the electronic device uses a second test sound pressure value τ. 测 Subtract the first test sound pressure value μ 测 The reference airtightness parameter θ of the microphone j under test is obtained. 测 .

[0088] Then, the electronic device uses the second calibrated sound pressure value τ 标 Subtract the first calibration sound pressure value μ 标 The calibration airtightness parameter θ of the microphone under test is obtained. 标 The airtightness parameter θ will be calibrated. 标 The quotient θ divided by the reference airtightness parameter 测 , as the difference parameter 1α. Here, the second calibration sound pressure value τ is... 标 First calibration sound pressure value μ 标 Reference airtightness parameter θ 测 And the difference parameter, which can be expressed by the formula τ 标 -μ 标 =θ 测 (1+α).

[0089] Furthermore, the electronic device uses a second test sound pressure value τ 测 Subtract the second calibration sound pressure value τ 标 The first difference ε is obtained, and the second test sound pressure value τ is used. 测 Subtract the first calibration sound pressure value μ 标 Obtain the second difference The first difference ε can be expressed by the formula, τ 测 -τ 标 =ε; second difference It can be expressed as a formula, Finally, the electronic device obtains the second difference. The third difference, obtained by subtracting the first difference ε, is the ratio of the third difference to the difference parameter. This ratio is the airtightness parameter of the microphone j under test. The airtightness parameter can be expressed by the formula: Thus, based on the airtightness parameters of each microphone under test, the test results of the microphone module under test are determined. (Refer to...) Figure 8 As shown, Figure 8 The diagram shows waveforms illustrating the sound intensity of the audio signal when the microphone's aperture is sealed and unsealed. Figure 8 Figure A shows a waveform diagram illustrating the change in sound intensity of the test audio signal over time when the microphone's aperture is not sealed. Figure 8 B in the diagram shows a waveform diagram of the sound intensity of the test audio signal changing over time when the microphone's aperture is sealed.

[0090] Step 403: Process the test audio signal and the reference audio signal to obtain the frequency response parameters of the microphone channel of each microphone under test.

[0091] In the embodiments of this application, reference is made to Figure 9 As shown, step 403 processes the test audio signal and the reference audio signal to obtain the frequency response parameters of each microphone channel under test. This can be achieved through the following steps:

[0092] Step 4031: Based on the reference audio signal obtained from the reference microphone j included in the reference microphone module i, generate the calibration frequency response curve of the reference microphone j included in the reference microphone module i.

[0093] Where i is a positive integer greater than or equal to 1 and less than or equal to I, I is the total number of reference microphone modules, j is a positive integer greater than or equal to 1 and less than or equal to J, and J is the total number of reference microphones included in the reference microphone module.

[0094] In this embodiment of the application, the number of reference microphones included in the reference microphone module is the same as the number of microphones under test included in the microphone module under test, and the reference microphones at the first position of the reference electronic device correspond one-to-one with the microphones under test at the first position of the electronic device.

[0095] In this embodiment, the frequency response curve is a curve showing the change of signal gain with frequency, used to describe the difference in processing capability between signals of different frequencies.

[0096] Step 4032: Based on the test audio signal obtained from the microphone j included in the microphone module under test, generate the first test frequency response curve and the second test frequency response curve of the microphone j under test.

[0097] In this embodiment, the test frequency response curve is the actual frequency response curve of the microphone under test (DUT) j generated based on the test audio signal. The first test frequency response curve is the frequency response curve of the microphone under test (DUT) j obtained when the DUT module is determined to be a qualified device by sampling test of the microphone under test (DUT) j in the DUT module; the second test frequency response curve is the actual frequency response curve obtained when the DUT module includes the microphone under test (DUT) in the factory test. Here, the test steps of sampling test and factory test are the same.

[0098] In this embodiment, the first test frequency same curve is used to adjust the calibration frequency response curve so that the adjusted calibration frequency response curve is suitable for determining the inter-channel frequency response characteristics of the microphone j under test.

[0099] It is important to emphasize that during the experiment, after determining the final position of the second sound-producing module by acquiring the sound pressure measured at each microphone in the reference microphone module, the reference microphone module picks up the sound while using an external device such as an artificial mouth to output a calibrated audio frequency, such as 1kHz. This process yields the first audio signal from each reference microphone, which is then processed to obtain the first frequency response curve. Figure 10 As shown, Figure 10 This diagram illustrates the first frequency response curves of all reference microphones included in the reference microphone module, tested using an external artificial mouth. Additionally, the electronic device outputs a calibrated audio frequency, such as 1kHz, from a sound source configured in the same electronic device as the reference microphone module. The second audio signals from each reference microphone are then processed to obtain the second frequency response curves. Figure 11 As shown, Figure 11 This diagram illustrates the second test frequency response curves of all reference microphones included in the reference microphone module, tested using the built-in sound module of an electronic device. From... Figure 10 and Figure 11 As can be seen from the results, the frequency response curves of all reference microphones in the reference microphone module tested by using the artificial mouth of the external device are basically consistent with the frequency response curves of all reference microphones in the reference microphone module tested by using the sound module built into the electronic device. The only difference is in the value assignment. Therefore, the electronic device recalibrates the first frequency response curve based on the second frequency response curve to obtain the calibration value suitable for the frequency response curve of the above reference microphone.

[0100] Step 4033: Based on the calibration frequency response curve, the first test frequency response curve, and the second test frequency response curve, determine the frequency response parameters of the microphone j under test.

[0101] In the embodiments of this application, reference is made to Figure 12 As shown, step 4033, based on the calibration frequency response curve, the first test frequency response curve, and the second test frequency response curve, determines the frequency response parameters of the microphone j under test, which can be achieved through the following steps:

[0102] Step C1: Subtract the frequency response of the first test frequency response curve at the corresponding frequency point from the frequency response of the calibration frequency response curve at each frequency point to obtain the fourth difference value. Then, perform data fitting on multiple fourth differences to obtain the difference curve between the reference microphone j included in the reference microphone module i and the microphone module j under test.

[0103] Step C2: Based on all the difference curves, calculate the first mean of all the fourth differences corresponding to each frequency point, and perform data fitting on multiple first means to obtain the first mean curve.

[0104] Step C3: Calculate the absolute value of the first relative error between the frequency response of each calibrated frequency response curve at each frequency point and the frequency response of the first test frequency response curve at the corresponding frequency point, and perform data fitting on multiple absolute values ​​of the first relative error to obtain the first relative error curve between the calibrated value and the test value of each calibrated frequency response curve and the first test frequency response curve.

[0105] Step C4: Based on the difference curve, the first mean curve, the first relative error curve, and the second test frequency response curve, determine the frequency response parameters of the microphone j under test.

[0106] In one feasible scenario, firstly, the electronic device generates the calibration frequency response curve of the reference microphone j included in the reference microphone module i based on the reference audio signal obtained from the reference microphone j included in the reference microphone module i. Based on the test audio signal obtained from the microphone j included in the microphone module under test, a first test frequency response curve for microphone j under test is generated. Second test frequency response curve F 测 (f). Secondly, the electronic device uses a calibrated frequency response curve. The frequency response at each frequency point minus the first test frequency response curve The fourth difference value is obtained from the frequency response at the corresponding frequency point, and multiple fourth differences are fitted to obtain the difference curve Δ between the reference microphone j included in the reference microphone module i and the microphone module j under test. i (f), where the difference curve can be expressed by the formula: Then, the electronic device calculates based on all the difference curves Δ i(f) Calculate the first mean of all fourth differences corresponding to each frequency point, and perform data fitting on multiple first means to obtain the first mean curve Δ(f); for example, the electronic device acquires all Δ values ​​at each frequency point. i Calculate the mean, for example, at the frequency of 125Hz, the result is obtained from Δ1(125) to Δ 100 (125) 100 values, take the average of these 100 values, and then fit them to the average values ​​of other frequency points to obtain the first mean curve Δ(f).

[0107] Furthermore, the electronic device calculates the response curve for each calibrated frequency. Frequency response at each frequency point, relative to the response curve at the first test frequency. The absolute value of the first relative error between the frequency responses at corresponding frequency points is obtained, and data fitting is performed on multiple absolute values ​​of the first relative error to obtain the first relative error curve between the calibration value and the test value of each calibration frequency response curve and the first test frequency response curve. Here, the first relative error curve can be expressed by the formula: Finally, the electronic device is based on the difference curve Δ i (f), First mean curve Δ(f), First relative error curve Second test frequency response curve F 测 (f) Determine the frequency response parameters of the microphone j to be tested.

[0108] In the embodiments of this application, reference is made to Figure 13 As shown, step C4, based on the difference curve, the first mean curve, the first relative error curve, and the second test frequency response curve, determines the frequency response parameters of the microphone j under test, which can be achieved through the following steps:

[0109] Step D1: Calculate the sixth difference of each difference curve at each frequency point, the absolute value of the second relative error between the mean of the first mean curve at the corresponding frequency point, and perform data fitting on the absolute values ​​of multiple second relative errors to obtain the second relative error curve between each difference curve and the first mean curve.

[0110] Step D2: Obtain the absolute value of the largest relative error in each second relative error curve as the candidate calibration value, and select the maximum value from multiple candidate calibration values ​​as the target calibration value.

[0111] Step D3: Based on all the first relative error curves, calculate the second mean of the absolute values ​​of all the first relative errors corresponding to each frequency point, and perform data fitting on multiple second means to obtain the second mean curve.

[0112] Step D4: Multiply the second mean of the second mean curve at each frequency point by the frequency response of the second test frequency response curve at the corresponding frequency point, and use the product as the target test frequency response curve obtained from the actual test.

[0113] Step D5: Based on the target calibration value, the first mean curve, and the target test frequency response curve, determine the frequency response parameters of the microphone j under test.

[0114] Here, firstly, the electronic device calculates each difference curve Δ i (f) The sixth difference at each frequency point is the absolute value of the second relative error between the first mean curve Δ(f) and the mean at the corresponding frequency point. Data fitting is performed on multiple absolute values ​​of the second relative error to obtain the second relative error curve δ between each difference curve and the first mean curve Δ(f). i (f).

[0115] Secondly, the electronic device acquires each second relative error curve δ i The absolute value of the largest relative error in (f) is taken as the candidate calibration value, that is, the maximum value of δ1(f): Max(δ1(f)), which can be denoted as: δ i max = Max(δ) i (f)). Next, the electronic device selects the maximum value from multiple candidate calibration values ​​as the target calibration value δ(f), which can be expressed as δ(f) = Max(δ). i This ensures that the target calibration value δ(f) is a straight line on the frequency spectrum, meaning that the target calibration value δ(f) can be understood as a constant.

[0116] Then, the electronic device, based on all the first relative error curves Obtain the second mean of the absolute values ​​of all first relative errors corresponding to each frequency point, and perform data fitting on multiple second means to obtain the second mean curve.

[0117] Furthermore, the electronic device will display the second mean curve. The second mean value at each frequency point and the response curve F of the second test frequency 测 (f) The product of the frequency responses at the corresponding frequency points is used as the target test frequency response curve Δ obtained from the actual test. 测 (f) The target test frequency response curve can be expressed by the formula: Finally, the electronic device is based on the target calibration value δ(f), the first mean curve Δ(f), and the target test frequency response curve Δ. 测 (f) Determine the frequency response parameters of the microphone j to be tested.

[0118] In the embodiments of this application, reference is made to Figure 14As shown, step D5, based on the target calibration value, the first mean curve, and the target test frequency response curve, determines the frequency response parameters of the microphone j under test, which can be achieved through the following steps:

[0119] Step E1: Calculate the frequency response value of the target test frequency response curve at each frequency point, the absolute value of the third relative error between the first mean curve at the corresponding frequency point and the first mean curve, and perform data fitting on the absolute values ​​of multiple third relative errors to obtain the third relative error curve between each difference curve and the mean curve.

[0120] Step E2: Obtain the frequency response value of the third relative error curve at each frequency point, the absolute value of the fourth relative error between the target calibration value and the third relative error, and use the absolute values ​​of multiple fourth relative errors as the frequency response parameters of the microphone j under test.

[0121] Here, the electronic device calculates the target test frequency response curve Δ 测 (f) The absolute value of the third relative error between the frequency response value at each frequency point and the first mean curve Δ(f) at the corresponding frequency point, and data fitting is performed on multiple absolute values ​​of the third relative error to obtain the third relative error curve δ between each difference curve and the mean curve. 测 (f) The third relative error curve can be expressed by the formula: Then, the electronic device acquires the frequency response value of the third relative error curve δ(f) at each frequency point, the absolute value of the fourth relative error between the target calibration value δ(f), and uses the absolute values ​​of multiple fourth relative errors as the frequency response parameters of the microphone j under test.

[0122] Step 404: If the airtightness parameters of all microphones under test are within the airtightness parameter threshold range, generate the first test result of the microphone module under test; and if the frequency response parameters of all microphones under test are within the frequency response parameter threshold range, generate the second test result of the microphone module under test.

[0123] The first test result includes the airtightness of the microphone module under test meeting the airtightness requirements; the second test result includes the frequency response of the microphone channels of the microphone module under test being consistent. The test results include the first test result and the second test result.

[0124] In this embodiment, the airtightness parameter threshold range is determined based on a large number of experiments, and the airtightness parameter threshold range can be 15dB-20dB. The frequency response parameter threshold range is also determined based on a large number of experiments.

[0125] In this embodiment, the electronic device determines that the airtightness parameters of all microphones under test are within the airtightness parameter threshold range, and generates a first test result that the airtightness of the microphone module under test meets the airtightness condition; the electronic device determines that the frequency response parameters of all microphones under test are within the frequency response parameter threshold range, and generates a second test result that the frequency response of the microphone channels of the microphone module under test is consistent.

[0126] As can be seen from the above, the microphone testing method described in this application embodiment eliminates the need for an external sound module to test the microphone module under test, reducing the use of hardware equipment, and the method has high testing efficiency during factory testing.

[0127] It should be noted that the descriptions of the same steps and contents as in other embodiments in this embodiment can be found in the descriptions in other embodiments, and will not be repeated here.

[0128] This application provides a microphone testing device, which can be used to implement... Figure 1 , Figures 4 to 7 , Figure 9 , Figures 12 to 14 A microphone testing method is provided in the corresponding embodiment, referring to... Figure 15 As shown, the microphone testing device 15 includes:

[0129] The acquisition module 1501 is used to acquire the test audio signal obtained by the microphone module under test from the test sound source, and the reference audio signal obtained by the reference microphone module from the reference sound source; wherein, the frequency parameters of the test sound source and the reference sound source are the same;

[0130] The processing module 1502 is used to process the test audio signal and the reference audio signal to obtain the airtightness parameters of each microphone under test and the frequency response parameters of the microphone channel of each microphone under test.

[0131] The generation module 1503 is used to generate test results for the microphone module under test based on airtightness parameters and frequency response parameters.

[0132] In other embodiments of this application, the acquisition module 1501 is further configured to acquire test audio signals through the microphone module under test during the process of the first sound module outputting a test sound source; wherein the first sound module and the microphone module under test are configured on the same electronic device, and the first sound module and the microphone module under test are symmetrically arranged along the coordinate axis in a two-dimensional space constructed with the center point of the electronic device as the origin of the coordinate system; and to acquire reference audio signals through the reference microphone module during the process of the second sound module outputting a reference sound source; wherein the second sound module and the microphone module under test are not configured on the same electronic device.

[0133] In other embodiments of this application, the acquisition module 1501 is further configured to process the reference audio signal to acquire a first calibrated sound pressure value of the reference audio signal of a reference microphone in the reference microphone module when the first sound receiving hole is sealed, and a second calibrated sound pressure value of the reference audio signal of the reference microphone when the first sound receiving hole is not sealed; process the test audio signal to acquire a first test sound pressure value of the test audio signal of the microphone j under test in the microphone module under test when the second sound receiving hole is sealed, and a second test sound pressure value of the test audio signal of the microphone j under test when the second sound receiving hole is not sealed; wherein, j is a positive integer greater than 1 and less than or equal to J, and J is the total number of microphones under test included in the microphone module under test; the processing module 1502 is further configured to determine the airtightness parameter of the microphone j under test based on the first calibrated sound pressure value, the second calibrated sound pressure value, the first test sound pressure value, and the second test sound pressure value.

[0134] In other embodiments of this application, the processing module 1502 is further configured to: subtract the first test sound pressure value from the second test sound pressure value to obtain a reference airtightness parameter of the microphone j under test; subtract the first calibration sound pressure value from the second calibration sound pressure value to obtain a calibration airtightness parameter of the microphone j under test; divide the calibration airtightness parameter by the reference airtightness parameter as a difference parameter; and obtain the airtightness parameter of the microphone j under test based on the first calibration sound pressure value, the second calibration sound pressure value, the second test sound pressure value, and the difference parameter.

[0135] In other embodiments of this application, the processing module 1502 is further configured to obtain a first difference by subtracting the second calibration sound pressure value from the second test sound pressure value; obtain a second difference by subtracting the first calibration sound pressure value from the second test sound pressure value; obtain a third difference obtained by subtracting the first difference from the second difference; and determine the ratio of the third difference to the difference parameter as the airtightness parameter of the microphone j to be tested.

[0136] In other embodiments of this application, the processing module 1502 is further configured to generate a calibration frequency response curve of the reference microphone j included in the reference microphone module i based on the reference audio signal obtained from the reference microphone j included in the reference microphone module i, wherein i is a positive integer greater than 1 and less than or equal to 1, 1 is the total number of reference microphone modules, j is a positive integer greater than 1 and less than or equal to J, and J is the total number of reference microphones included in the reference microphone module; generate a first test frequency response curve and a second test frequency response curve of the microphone j under test based on the test audio signal obtained from the microphone j under test included in the microphone module under test; and determine the frequency response parameters of the microphone j under test based on the calibration frequency response curve, the first test frequency response curve, and the second test frequency response curve.

[0137] In other embodiments of this application, the processing module 1502 is further configured to: subtract the frequency response of the first test frequency response curve at the corresponding frequency point from the frequency response of the calibration frequency response curve at each frequency point to obtain a fourth difference value; perform data fitting on multiple fourth differences to obtain a difference curve between the reference microphone j included in the reference microphone module i and the microphone module j under test; calculate the first mean value of all fourth differences corresponding to each frequency point based on all difference curves, and perform data fitting on multiple first means to obtain a first mean curve; calculate the absolute value of the first relative error between the frequency response of each calibration frequency response curve at each frequency point and the frequency response of the first test frequency response curve at the corresponding frequency point, and perform data fitting on multiple absolute values ​​of the first relative errors to obtain a first relative error curve between the calibration value and the test value of each calibration frequency response curve and the first test frequency response curve; and determine the frequency response parameters of the microphone j under test based on the difference curve, the first mean curve, the first relative error curve, and the second test frequency response curve.

[0138] In other embodiments of this application, the processing module 1502 is further configured to calculate the absolute value of the second relative error between the sixth difference of each difference curve at each frequency point and the mean of the first mean curve at the corresponding frequency point, and to perform data fitting on the absolute values ​​of multiple second relative errors to obtain the second relative error curve between each difference curve and the first mean curve; to obtain the absolute value of the largest relative error in each second relative error curve as a candidate calibration value, and to select the maximum value from multiple candidate calibration values ​​as the target calibration value; to calculate the second mean of the absolute values ​​of all first relative errors corresponding to each frequency point according to all first relative error curves, and to perform data fitting on multiple second mean values ​​to obtain the second mean curve; to multiply the second mean of the second mean curve at each frequency point by the frequency response of the second test frequency response curve at the corresponding frequency point as the target test frequency response curve obtained by actual testing; and to determine the frequency response parameters of the microphone j under test based on the target calibration value, the first mean curve, and the target test frequency response curve.

[0139] In other embodiments of this application, the processing module 1502 is further configured to calculate the absolute value of the third relative error between the frequency response value of the target test frequency response curve at each frequency point and the first mean value of the first mean curve at the corresponding frequency point, and to perform data fitting on the absolute values ​​of multiple third relative errors to obtain the third relative error curve between each difference curve and the mean curve; to obtain the absolute value of the fourth relative error between the frequency response value of the third relative error curve at each frequency point and the target calibration value, and to use the absolute values ​​of multiple fourth relative errors as the frequency response parameters of the microphone j under test.

[0140] In other embodiments of this application, the generation module 1503 is further configured to generate a first test result for the microphone module under test if the airtightness parameters of all microphones under test are within the airtightness parameter threshold range; wherein the first test result includes that the airtightness of the microphone module under test meets the airtightness condition; and to generate a second test result for the microphone module under test if the frequency response parameters of all microphones under test are within the frequency response parameter threshold range; wherein the second test result includes that the frequency response of the microphone channels of the microphone module under test is consistent, and the test result includes the first test result and the second test result.

[0141] This application provides an electronic device that can be used to implement... Figure 1 , Figures 4 to 7 , Figure 9 , Figures 12 to 14 A microphone testing method is provided in the corresponding embodiment, referring to... Figure 16 As shown, the electronic device 16 ( Figure 16 Electronic devices 16 and Figure 15 The microphone testing device 15 (corresponding to the one in the text) includes: a processor 1601, a memory 1602, and a communication bus 1603, wherein:

[0142] Communication bus 1603 is used to realize the communication connection between processor 1601 and memory 1602;

[0143] The processor 1601 is used to execute the microphone test program stored in the memory 1602 to perform the following steps:

[0144] Acquire the test audio signal obtained by the microphone module under test from the test audio source, and the reference audio signal obtained by the reference microphone module from the reference audio source; wherein the frequency parameters of the test audio source and the reference audio source are the same;

[0145] The test audio signal and the reference audio signal are processed to obtain the airtightness parameters of each microphone under test and the frequency response parameters of each microphone channel.

[0146] Test results for the microphone module under test are generated based on airtightness and frequency response parameters.

[0147] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0148] During the output of the test sound source by the first sound module, the test audio signal is acquired through the microphone module under test; wherein, the first sound module and the microphone module under test are configured on the same electronic device, and the first sound module and the microphone module under test are symmetrically arranged along the coordinate axis in a two-dimensional space constructed with the center point of the electronic device as the origin; during the output of the reference sound source by the second sound module, the reference audio signal is acquired through the reference microphone module; wherein, the second sound module and the microphone module under test are not configured on the same electronic device.

[0149] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0150] The reference audio signal is processed to obtain a first calibrated sound pressure level (SPL) value of the reference audio signal of a reference microphone in the reference microphone module when the first sound hole is sealed, and a second calibrated SPL value of the reference audio signal of the reference microphone when the first sound hole is not sealed; the test audio signal is processed to obtain a first test SPL value of the test audio signal of the microphone under test j in the microphone module under test when the second sound hole is sealed, and a second test SPL value of the test audio signal of the microphone under test j when the second sound hole is not sealed; wherein, j is a positive integer greater than 1 and less than or equal to J, and J is the total number of microphones under test included in the microphone module under test; based on the first calibrated SPL value, the second calibrated SPL value, the first test SPL value, and the second test SPL value, the airtightness parameter of the microphone under test j is determined.

[0151] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0152] The reference airtightness parameter of the microphone j under test is obtained by subtracting the first test sound pressure value from the second test sound pressure value; the calibration airtightness parameter of the microphone j under test is obtained by subtracting the first calibration sound pressure value from the second calibration sound pressure value; the quotient of the calibration airtightness parameter and the reference airtightness parameter is used as the difference parameter; based on the first calibration sound pressure value, the second calibration sound pressure value, the second test sound pressure value and the difference parameter, the airtightness parameter of the microphone j under test is obtained.

[0153] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0154] The first difference is obtained by subtracting the second calibration sound pressure value from the second test sound pressure value; the second difference is obtained by subtracting the first calibration sound pressure value from the second test sound pressure value; the third difference is obtained by subtracting the first difference from the second difference, and the ratio of the third difference to the difference parameter is determined as the airtightness parameter of the microphone j under test.

[0155] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0156] Based on the reference audio signal obtained from the reference microphone j included in the reference microphone module i, a calibration frequency response curve of the reference microphone j included in the reference microphone module i is generated, where i is a positive integer greater than 1 and less than or equal to 1, 1 is the total number of reference microphone modules, j is a positive integer greater than 1 and less than or equal to J, and J is the total number of reference microphones included in the reference microphone module; based on the test audio signal obtained from the microphone j under test included in the microphone module under test, a first test frequency response curve and a second test frequency response curve of the microphone j under test are generated; based on the calibration frequency response curve, the first test frequency response curve and the second test frequency response curve, the frequency response parameters of the microphone j under test are determined.

[0157] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0158] The frequency response of the calibration frequency response curve at each frequency point is subtracted from the frequency response of the first test frequency response curve at the corresponding frequency point to obtain a fourth difference value. Multiple fourth differences are then fitted to obtain a difference curve between the reference microphone j included in the reference microphone module i and the microphone module j under test. Based on all difference curves, the first mean value of all fourth differences corresponding to each frequency point is calculated, and multiple first means values ​​are fitted to obtain a first mean curve. The absolute value of the first relative error between the frequency response of each calibration frequency response curve at each frequency point and the frequency response of the first test frequency response curve at the corresponding frequency point is calculated, and multiple absolute values ​​of the first relative error are fitted to obtain a first relative error curve between the calibration value and the test value of each calibration frequency response curve and the first test frequency response curve. Based on the difference curve, the first mean curve, the first relative error curve, and the second test frequency response curve, the frequency response parameters of the microphone j under test are determined.

[0159] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0160] Calculate the sixth difference of each difference curve at each frequency point, and the absolute value of the second relative error between the mean of the first mean curve at the corresponding frequency point. Perform data fitting on multiple absolute values ​​of the second relative errors to obtain the second relative error curve between each difference curve and the first mean curve. Obtain the absolute value of the largest relative error in each second relative error curve as a candidate calibration value, and select the maximum value from multiple candidate calibration values ​​as the target calibration value. Based on all first relative error curves, calculate the second mean of the absolute values ​​of all first relative errors corresponding to each frequency point, and perform data fitting on multiple second means to obtain the second mean curve. Multiply the second mean of the second mean curve at each frequency point by the frequency response of the second test frequency response curve at the corresponding frequency point, and use this as the target test frequency response curve obtained from the actual test. Based on the target calibration value, the first mean curve, and the target test frequency response curve, determine the frequency response parameters of the microphone j under test.

[0161] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0162] Calculate the frequency response value of the target test frequency response curve at each frequency point, and the absolute value of the third relative error between the first mean curve at the corresponding frequency point and the first mean curve. Then, perform data fitting on the absolute values ​​of multiple third relative errors to obtain the third relative error curve between each difference curve and the mean curve. Obtain the absolute value of the fourth relative error between the frequency response value of the third relative error curve at each frequency point and the target calibration value, and use the absolute values ​​of multiple fourth relative errors as the frequency response parameters of the microphone j under test.

[0163] In other embodiments of this application, processor 1601 is used to execute a microphone test program stored in memory 1602 to perform the following steps:

[0164] If the airtightness parameters of all microphones under test are within the airtightness parameter threshold range, a first test result for the microphone module under test is generated; wherein, the first test result includes that the airtightness of the microphone module under test meets the airtightness condition; if the frequency response parameters of all microphones under test are within the frequency response parameter threshold range, a second test result for the microphone module under test is generated; wherein, the second test result includes that the frequency response of the microphone channels of the microphone module under test is consistent, and the test result includes the first test result and the second test result.

[0165] Embodiments of this application provide a computer storage medium storing one or more programs, which can be executed by one or more processors to achieve... Figure 1 , Figures 4 to 7 , Figure 9 , Figures 12 to 14 A microphone testing method is provided in the corresponding embodiment.

[0166] Embodiments of this application provide a storage medium that acquires test audio signals obtained by a microphone module under test from a test audio source, and reference audio signals obtained by a reference microphone module from a reference audio source; wherein the test audio source and the reference audio source have the same frequency parameters; the test audio signals and the reference audio signals are processed to obtain the airtightness parameters and frequency response parameters of each microphone under test channel; based on the airtightness parameters and frequency response parameters, the test results of the microphone module under test are generated; that is, by processing the acquired test audio signals of the microphone module under test and the reference audio signals of the reference microphone module, the airtightness parameters and frequency response parameters of the microphone under test are obtained, thereby obtaining the test results of the microphone module under test; thus, there is no need to use an external sound module to test the microphone module under test, reducing the use of hardware devices, and the method has high testing efficiency in the factory testing process.

[0167] It should be noted that the descriptions of the storage medium and device embodiments above are similar to the descriptions of the method embodiments above, and have similar beneficial effects to the same method embodiments. For technical details not disclosed in the storage medium and device embodiments of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0168] The aforementioned computer storage media / memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), magnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM), etc.; or it can be various terminals that include one or any combination of the above-mentioned memories, such as mobile phones, computers, tablet devices, personal digital assistants, etc.

[0169] It should be understood that the terms "an embodiment," "an embodiment," "an embodiment of this application," "the foregoing embodiment," "some embodiments," or "some implementations" mentioned throughout the specification mean that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of this application. Therefore, the phrases "an embodiment," "an embodiment," "an embodiment of this application," "the foregoing embodiment," "some embodiments," or "some implementations" appearing throughout the specification do not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of this application, the sequence numbers of the above processes do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application. The sequence numbers of the above embodiments of this application are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0170] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components can be combined, or integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection between devices or units can be electrical, mechanical, or other forms.

[0171] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units. They may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0172] In addition, each functional unit in the various embodiments of this application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in hardware or in the form of hardware plus software functional units.

[0173] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, read-only memory (ROM), magnetic disks, or optical disks.

[0174] Alternatively, if the integrated units described above are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of this application, or the parts that contribute to related technologies, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0175] It is worth noting that the accompanying drawings in this application are only for illustrating the schematic positions of various devices on the terminal device and do not represent their actual positions in the terminal device. The actual positions of each device or area may be changed or shifted according to the actual situation (e.g., the structure of the terminal device). Furthermore, the proportions of different parts in the terminal device in the drawings do not represent the actual proportions.

[0176] The above description is merely an embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A microphone testing method, characterized in that, The method includes: The test audio signal obtained by the microphone module under test from a test sound source and the reference audio signal obtained by the reference microphone module from a reference sound source are acquired. The test sound source and the reference sound source have the same frequency parameters. The test sound source is output by a first sound-producing module configured on the electronic device where the microphone module under test is located. The reference sound source is output by a second sound-producing module external to the device and calibrated by the reference microphone module. The first sound-producing module and the microphone module under test are symmetrically arranged along coordinate axes in a two-dimensional space with the center point of the electronic device as the origin. The second sound-producing module and the microphone module under test are not configured on the same electronic device. The test audio signal and the reference audio signal are processed to obtain the airtightness parameters of each microphone under test and the frequency response parameters of the microphone channel of each microphone under test; Based on the airtightness parameter and the frequency response parameter, the test results of the microphone module under test are generated; The airtightness parameters of each microphone under test are obtained as follows: The reference audio signal is processed to obtain a first calibrated sound pressure value of the reference audio signal when the first sound hole of a reference microphone in the reference microphone module is sealed, and a second calibrated sound pressure value of the reference audio signal when the first sound hole of the reference microphone is not sealed. The test audio signal is processed to obtain the first test sound pressure value of the test audio signal of the microphone j under test in the microphone module under test when the second sound hole is sealed, and the second test sound pressure value of the test audio signal of the microphone j under test when the second sound hole is not sealed; wherein, j is a positive integer greater than or equal to 1 and less than or equal to J, and J is the total number of microphones under test included in the microphone module under test; Based on the first calibrated sound pressure value, the second calibrated sound pressure value, the first test sound pressure value, and the second test sound pressure value, a difference parameter, a first difference value, and a second difference value are obtained. The difference parameter is used to characterize the ratio between the sound pressure change of the reference microphone and the microphone under test j in the sealed-unsealed state of the microphone aperture. The first difference value is used to characterize the deviation between the sound pressure of the microphone under test j in the unsealed state of the second microphone aperture and the sound pressure of the reference microphone in the unsealed state of the first microphone aperture. The second difference value is used to characterize the deviation between the sound pressure of the microphone under test j in the unsealed state of the second microphone aperture and the sound pressure of the reference microphone in the sealed state of the first microphone aperture. The first difference, the second difference, and the difference parameter are processed to obtain the airtightness parameter.

2. The method according to claim 1, characterized in that, Acquire the test audio signal obtained by the microphone module under test from the test sound source, and the reference audio signal obtained by the reference microphone module from the reference sound source, including: During the process of the first sound module outputting the test sound source, the test audio signal is acquired through the microphone module under test; During the process of the second sound module outputting the reference sound source, the reference audio signal is acquired through the reference microphone module.

3. The method according to claim 1 or 2, characterized in that, Based on the first calibrated sound pressure value, the second calibrated sound pressure value, the first tested sound pressure value, and the second tested sound pressure value, the difference parameter, the first difference, and the second difference are obtained, including: Subtracting the first test sound pressure value from the second test sound pressure value yields the reference airtightness parameter of the microphone j under test. Subtracting the first calibration sound pressure value from the second calibration sound pressure value yields the calibration airtightness parameters of the microphone under test. The difference parameter is obtained by dividing the calibrated airtightness parameter by the reference airtightness parameter. The first difference is obtained by subtracting the second calibrated sound pressure value from the second test sound pressure value. The second difference is obtained by subtracting the first calibrated sound pressure value from the second test sound pressure value.

4. The method according to claim 1 or 2, characterized in that, The step of performing calculations on the first difference, the second difference, and the difference parameter to obtain the airtightness parameter includes: Obtain the third difference by subtracting the first difference from the second difference; The ratio of the third difference to the difference parameter is determined as the airtightness parameter of the microphone j under test.

5. The method according to claim 1 or 2, characterized in that, The process of processing the test audio signal and the reference audio signal to obtain the frequency response parameters of the microphone channels of each microphone under test includes: Based on the reference audio signal obtained from the reference microphone j included in the reference microphone module i, a calibration frequency response curve of the reference microphone j included in the reference microphone module i is generated, where i is a positive integer greater than or equal to 1 and less than or equal to 1, 1 is the total number of the reference microphone modules, j is a positive integer greater than or equal to 1 and less than or equal to J, and J is the total number of the reference microphones included in the reference microphone module. Based on the test audio signal obtained from the microphone j included in the microphone module under test, a first test frequency response curve and a second test frequency response curve of the microphone j under test are generated. Based on the calibration frequency response curve, the first test frequency response curve, and the second test frequency response curve, the frequency response parameters of the microphone under test j are determined.

6. The method according to claim 5, characterized in that, The step of determining the frequency response parameters of the microphone j under test based on the calibrated frequency response curve, the first test frequency response curve, and the second test frequency response curve includes: The frequency response of the first test frequency response curve at the corresponding frequency point is subtracted from the frequency response of the calibration frequency response curve at each frequency point to obtain the fourth difference value. Data fitting is performed on multiple fourth differences to obtain the difference curve between the reference microphone j included in the reference microphone module i and the microphone module j under test. Based on all the difference curves, calculate the first mean of all the fourth differences corresponding to each frequency point, and perform data fitting on multiple first means to obtain the first mean curve; Calculate the frequency response of each calibrated frequency response curve at each frequency point, and the absolute value of the first relative error between the frequency response of the first test frequency response curve at the corresponding frequency point. Then, perform data fitting on multiple absolute values ​​of the first relative error to obtain the first relative error curve between the calibration value and the test value of each calibrated frequency response curve and the first test frequency response curve. Based on the difference curve, the first mean curve, the first relative error curve, and the second test frequency response curve, the frequency response parameters of the microphone under test j are determined.

7. The method according to claim 6, characterized in that, The step of determining the frequency response parameters of the microphone j under test based on the difference curve, the first mean curve, the first relative error curve, and the second test frequency response curve includes: Calculate the sixth difference of each difference curve at each frequency point, the absolute value of the second relative error between the first mean curve and the mean at the corresponding frequency point, and perform data fitting on multiple absolute values ​​of the second relative error to obtain the second relative error curve between each difference curve and the first mean curve; Obtain the absolute value of the largest relative error in each second relative error curve as the candidate calibration value, and select the maximum value from multiple candidate calibration values ​​as the target calibration value; Based on all the first relative error curves, calculate the second mean of the absolute values ​​of all the first relative errors corresponding to each frequency point, and perform data fitting on multiple second means to obtain the second mean curve; The product of the second mean curve at each frequency point and the frequency response of the second test frequency response curve at the corresponding frequency point is used as the target test frequency response curve obtained from the actual test. Based on the target calibration value, the first mean curve, and the target test frequency response curve, the frequency response parameters of the microphone under test j are determined.

8. The method according to claim 7, characterized in that, The step of determining the frequency response parameters of the microphone under test j based on the target calibration value, the first mean curve, and the target test frequency response curve includes: Calculate the frequency response value of the target test frequency response curve at each frequency point, the absolute value of the third relative error between the first mean curve at the corresponding frequency point and the first mean curve, and perform data fitting on the absolute values ​​of multiple third relative errors to obtain the third relative error curve between each difference curve and the mean curve. Obtain the frequency response value of the third relative error curve at each frequency point, the absolute value of the fourth relative error relative to the target calibration value, and use the absolute values ​​of the multiple fourth relative errors as the frequency response parameters of the microphone j under test.

9. The method according to claim 1 or 2, characterized in that, The process of generating test results for the microphone module under test based on the airtightness parameter and the frequency response parameter includes: If the airtightness parameters of all the microphones under test are within the airtightness parameter threshold range, a first test result of the microphone module under test is generated; wherein, the first test result includes that the airtightness of the microphone module under test meets the airtightness condition; If the frequency response parameters of all microphones under test are within the frequency response parameter threshold range, a second test result for the microphone module under test is generated; wherein, the second test result includes the consistency of the frequency response of the microphone channels of the microphone module under test, and the test result includes the first test result and the second test result.

10. A microphone testing device, characterized in that, The device includes: The acquisition module is used to acquire the test audio signal obtained by the microphone module under test from the test sound source, and the reference audio signal obtained by the reference microphone module from the reference sound source; wherein, the test sound source and the reference sound source have the same frequency parameters, the test sound source is output by a first sound-producing module configured on the electronic device where the microphone module under test is located, and the reference sound source is output by a second sound-producing module external to the reference microphone module and calibrated by the reference microphone module; the first sound-producing module and the microphone module under test are symmetrically arranged along the coordinate axis in a two-dimensional space with the center point of the electronic device as the origin, and the second sound-producing module and the microphone module under test are not configured on the same electronic device; The processing module is used to process the test audio signal and the reference audio signal to obtain the airtightness parameters of each microphone under test and the frequency response parameters of the microphone channel of each microphone under test. The generation module is used to generate test results for the microphone module under test based on the airtightness parameter and the frequency response parameter. The processing module is further configured to process the reference audio signal to obtain a first calibrated sound pressure value of the reference audio signal when the first sound hole of a reference microphone in the reference microphone module is sealed, and a second calibrated sound pressure value of the reference audio signal when the first sound hole of the reference microphone is not sealed. The test audio signal is processed to obtain the first test sound pressure value of the test audio signal of the microphone j under test in the microphone module under test when the second sound hole is sealed, and the second test sound pressure value of the test audio signal of the microphone j under test when the second sound hole is not sealed; wherein, j is a positive integer greater than or equal to 1 and less than or equal to J, and J is the total number of microphones under test included in the microphone module under test; Based on the first calibrated sound pressure value, the second calibrated sound pressure value, the first test sound pressure value, and the second test sound pressure value, a difference parameter, a first difference value, and a second difference value are obtained. The difference parameter is used to characterize the ratio between the sound pressure change of the reference microphone and the microphone under test j in the sealed-unsealed state of the microphone aperture. The first difference value is used to characterize the deviation between the sound pressure of the microphone under test j in the unsealed state of the second microphone aperture and the sound pressure of the reference microphone in the unsealed state of the first microphone aperture. The second difference value is used to characterize the deviation between the sound pressure of the microphone under test j in the unsealed state of the second microphone aperture and the sound pressure of the reference microphone in the sealed state of the first microphone aperture. The first difference, the second difference, and the difference parameter are calculated and combined to obtain the airtightness parameter.

11. An electronic device, characterized in that, The electronic device includes: a processor, a memory, and a communication bus; The communication bus is used to realize the communication connection between the processor and the memory; The processor is used to execute a microphone test program stored in the memory to implement the microphone test method as described in any one of claims 1 to 9.

12. A storage medium, characterized in that, The storage medium stores one or more programs, which can be executed by one or more processors to implement the microphone testing method as described in any one of claims 1 to 9.

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