Electronic device automated measurement system and method and computer readable storage medium

Abstract

The application discloses an electronic device automatic measurement system, which comprises a measurement module, a control module and a data analysis module, wherein the measurement module comprises a digital bridge device and a shielding device electrically connected with the digital bridge device; the digital bridge device is electrically connected with the control module and the data analysis module respectively; and the control module and the data analysis module are connected through serial communication. The electronic device automatic measurement system has high automation degree and test precision, strong anti-interference capability, low production labor cost and fast and efficient production. The application further discloses a measurement method using the electronic device automatic measurement system and a computer readable storage medium which can realize the method.

Description

Technical Field

[0001] This invention relates to the field of electronic device measurement technology, and more specifically to automated measurement systems and methods for electronic devices and computer-readable storage media. Background Technology

[0002] Existing electronic device characteristic testing requires manual testing by personnel at multiple workstations. Each test requires manual triggering, and the test results must be manually judged by the personnel based on the instrument test results. When different personnel test at different workstations, human error can be introduced into the readings, leading to errors in the test results. Moreover, when there are many characteristics to be measured for electronic devices, the testing is time-consuming and labor-intensive, which cannot meet the competitive demands of rapid and efficient production. Furthermore, when electronic devices need to be tested at high frequencies, the testing equipment is susceptible to interference, resulting in errors in the test results.

[0003] Therefore, there is an urgent need for an automated measurement system for electronic devices that is highly automated and accurate in testing, has strong anti-interference capabilities, reduces production labor costs, and enables rapid and efficient production. Summary of the Invention

[0004] One of the objectives of this invention is to provide an automated measurement system for electronic devices that features high automation and testing accuracy, strong anti-interference capabilities, reduced production labor costs, and the ability to achieve rapid and efficient production.

[0005] The second objective of this invention is to provide an automated measurement method for electronic devices that features high automation and testing accuracy, strong anti-interference capability, reduced production labor costs, and the ability to achieve rapid and efficient production.

[0006] The third objective of this invention is to provide a computer-readable storage medium that stores a computer program for executing an automated measurement method for electronic devices that achieves high automation and testing accuracy, strong anti-interference capability, reduced production labor costs, and enables rapid and efficient production.

[0007] To achieve the above objectives, the present invention provides an automated measurement system for electronic devices, including a measurement module, a control module, and a data analysis module. The measurement module includes a digital bridge device and a shielding device electrically connected to the digital bridge device. The digital bridge device is electrically connected to both the control module and the data analysis module. The control module and the data analysis module are connected via serial communication.

[0008] Compared with existing technologies, the electronic device automated measurement system of the present invention has a high degree of automation and testing accuracy, strong anti-interference ability, reduced production labor costs, and can achieve rapid and efficient production.

[0009] Preferably, in the electronic device automated measurement system of the present invention, the shielding device includes an outer shell that encloses and forms the shielding device, a plurality of interfaces, and a plurality of probes electrically connected to the interfaces.

[0010] Preferably, in the electronic device automated measurement system of the present invention, the input terminal of the digital bridge device is electrically connected to the interface of the shielding device.

[0011] Preferably, in the electronic device automated measurement system of the present invention, the housing includes a connecting plate and a fixing plate with a plurality of fixing holes, and the probe is fixed to the fixing plate through the fixing holes.

[0012] Preferably, the digital bridge device in the automated measurement system for electronic devices of the present invention is model number Tonghui TH2826A.

[0013] Preferably, in the automated measurement system for electronic devices of the present invention, the control module includes a programmable logic controller.

[0014] Preferably, the data analysis module of the electronic device automated measurement system of the present invention includes a computer device.

[0015] The present invention also provides an automated measurement method for electronic devices, comprising the above-mentioned automated measurement system for electronic devices and the following steps:

[0016] S1. The control module sends a test capacitance control command to the measurement module, the measurement module performs capacitance testing, the control module receives confirmation information from the measurement module that the capacitance test is complete, the control module sends a data read command to read the capacitance test data and transmits it to the data analysis module via serial communication;

[0017] S2. The control module switches to send test impedance control commands, the measurement module performs a series of impedance value tests at the test frequency points, the control module receives the confirmation information from the measurement module that the impedance test is completed, the control module sends a data reading command to read the impedance value test data of a series of test frequency points and transmits it to the data analysis module via serial communication.

[0018] S3. Based on the impedance test data of a series of test frequencies received in the data analysis module, the actual resonant frequency of the electronic device under test is obtained;

[0019] S4. The data analysis module compares the actual resonant frequency obtained with the preset minimum frequency. If it is higher than the preset minimum frequency, the electronic device under test is determined to be good; if it is lower than the preset minimum frequency, the electronic device under test is determined to be defective.

[0020] Compared with existing technologies, the automated measurement method for electronic devices of the present invention has a high degree of automation and testing accuracy, strong anti-interference ability, reduced production labor costs, and can achieve rapid and efficient production.

[0021] The present invention also provides a computer-readable storage medium storing a computer program that can be executed by a processor to implement the above-described automated measurement method for electronic devices.

[0022] Compared with existing technologies, the computer-readable storage medium of the present invention stores a computer program that can be executed by a processor to achieve a measurement method with high automation and testing accuracy, strong anti-interference ability, reduced production labor costs, and rapid and efficient production. Attached Figure Description

[0023] Figure 1 This is a schematic diagram of the structure of the automated measurement system for electronic devices of the present invention.

[0024] Figure 2 This is a schematic diagram of the internal structure of the shielding device of the present invention.

[0025] Figure 3 This is a schematic diagram of the structure of the fixing plate of the shielding device of the present invention. Detailed Implementation

[0026] To illustrate the technical content and structural features of the present invention in detail, the following description is provided in conjunction with the embodiments and accompanying drawings.

[0027] Combination Figure 1 and Figure 2 As shown, the electronic device automated measurement system 100 of the present invention includes a measurement module 1, a control module 2, and a data analysis module 3. The measurement module 1 includes a digital bridge device 11 and a shielding device 12 electrically connected to the digital bridge device 11. The digital bridge device 11 is electrically connected to the control module 2 and the data analysis module 3 respectively. The control module 2 and the data analysis module 3 are connected via serial communication. The control module 2 is a programmable logic controller, and the data analysis module 3 is a computer device. Specifically, the model of the digital bridge device 11 is Tonghui TH2826A.

[0028] Combination Figure 2 and Figure 3As shown, the shielding device 12 of the present invention includes an outer shell 122 that encloses and forms the shielding device 12, a plurality of interfaces 121, and a plurality of probes 123 electrically connected to the interfaces 121. Specifically, the input terminal of the digital bridge device 11 is electrically connected to the interface 121 of the shielding device 12. Specifically, the outer shell 122 includes a connecting plate 1221 and a fixing plate 1222 with a plurality of fixing holes 1222a. The probes 123 are fixed to the fixing plate 1222 through the fixing holes 1222a. In this embodiment, taking the electronic device under test 4 as an example of a transformer, when the probes 123 are pressed down on the electronic device under test 4, the test is triggered to start.

[0029] Compared with the prior art, the electronic device automated measurement system 100 of the present invention has a high degree of automation and testing accuracy, strong anti-interference ability, reduces production labor costs, and can achieve rapid and efficient production.

[0030] Combination Figure 1 and Figure 2 As shown, the automated measurement method for electronic devices of the present invention includes the above-described automated measurement system 100 for electronic devices and the following steps:

[0031] S1. Control module 2 sends a test capacitance control command to measurement module 1. Measurement module 1 performs capacitance test. Control module 2 receives confirmation information from measurement module 1 that the capacitance test is complete. Control module 2 sends a data read command to read the capacitance test data and transmits it to data analysis module 3 via serial communication.

[0032] S2. Control module 2 switches to send test impedance control command, measurement module 1 performs a series of impedance value tests at the frequency points to be tested, control module 2 receives the confirmation information from measurement module 1 that the impedance test is completed, control module 2 sends a data reading command to read the impedance value test data of a series of frequency points to be tested and transmits it to data analysis module 3 via serial communication.

[0033] S3. Based on the impedance test data of a series of test frequencies received in the data analysis module 3, the actual resonant frequency of the electronic device under test 4 is obtained;

[0034] S4. The data analysis module 3 compares the actual resonant frequency obtained from the processing with its preset minimum frequency. If it is higher than the preset minimum frequency, the electronic device under test 4 is determined to be a good product. If it is lower than the preset minimum frequency, the electronic device under test 4 is determined to be a defective product.

[0035] Compared with existing technologies, the automated measurement method for electronic devices of the present invention has a high degree of automation and testing accuracy, strong anti-interference ability, reduced production labor costs, and can achieve rapid and efficient production.

[0036] The computer-readable storage medium of the present invention stores a computer program that can be executed by a processor to implement the above-described automated measurement method for electronic devices.

[0037] The above-disclosed examples are merely preferred embodiments of the present invention and should not be construed as limiting the scope of the present invention. Therefore, any equivalent variations made in accordance with the claims of the present invention are within the scope of the present invention.

Claims

1. An automated measurement method for electronic devices, characterized in that: An automated measurement system for electronic devices includes a measurement module, a control module, and a data analysis module. The measurement module includes a digital bridge device and a shielding device electrically connected to the digital bridge device. The digital bridge device is electrically connected to both the control module and the data analysis module. The control module and the data analysis module are connected via serial communication. The measurement method... Includes the following steps: S1. The control module sends a test capacitance control command to the measurement module, the measurement module performs a capacitance test, the control module receives a confirmation message from the measurement module indicating that the capacitance test is complete, and the control module sends a data reading command to read the capacitance test data and transmits it to the data analysis module via serial communication. S2. The control module switches to send test impedance control commands, the measurement module performs a series of impedance value tests at the test frequency points, the control module receives confirmation information from the measurement module that the impedance test is completed, and the control module sends a data reading command to read a series of impedance value test data at the test frequency points and transmits them to the data analysis module via serial communication. S3. Based on the impedance test data of a series of test frequencies received in the data analysis module, the actual resonant frequency of the electronic device under test is obtained; S4. The data analysis module compares the actual resonant frequency obtained from the data with its preset minimum frequency. If the frequency is higher than the preset minimum frequency, the electronic device under test is determined to be good; if the frequency is lower than the preset minimum frequency, the electronic device under test is determined to be defective.

2. The automated measurement method for electronic devices as described in claim 1, characterized in that, The shielding device includes an outer shell that encloses the shielding device, a plurality of interfaces, and a plurality of probes electrically connected to the interfaces.

3. The automated measurement method for electronic devices as described in claim 2, characterized in that, The input terminal of the digital bridge device is electrically connected to the interface of the shielding device.

4. The automated measurement method for electronic devices as described in claim 2, characterized in that, The outer casing includes a connecting plate and a fixing plate with a plurality of fixing holes, and the probe is fixed to the fixing plate through the fixing holes.

5. The automated measurement method for electronic devices as described in claim 1, characterized in that, The model of the digital bridge device is Tonghui TH2826A.

6. The automated measurement method for electronic devices as described in claim 1, characterized in that, The control module includes a programmable logic controller.

7. The automated measurement method for electronic devices as described in claim 1, characterized in that, The data analysis module includes a computer device.

8. A computer-readable storage medium, characterized in that, The device contains a computer program that can be executed by a processor to implement the automated measurement method for electronic devices as described in claim 1.

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