激光芯片外观缺陷的检测方法、系统、电子设备及介质
By setting algorithm parameters and image acquisition and processing for laser chip appearance defects through an automated detection system, the problems of low detection efficiency and low accuracy in existing technologies are solved, achieving efficient and accurate detection of laser chip appearance defects and reducing costs.
CN116818764BActive Publication Date: 2026-07-17WUHAN RAYCUS FIBER LASER TECHNOLOGY CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- WUHAN RAYCUS FIBER LASER TECHNOLOGY CO LTD
- Filing Date
- 2023-05-04
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing technologies for detecting surface defects in laser chips suffer from low efficiency, low accuracy, and high cost, failing to meet the demands for high-speed, high-precision, and high-volume testing.
Method used
By pre-setting the algorithm parameters for laser chip appearance defects, an image acquisition mechanism is used to acquire chip images, and the images are processed according to the algorithm to detect defects, thus replacing manual inspection with an automated system.
Benefits of technology
It achieves efficient and accurate detection of laser chip appearance defects, avoids human damage and missed detection, and significantly reduces production costs.
✦ Generated by Eureka AI based on patent content.
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Figure CN116818764B_ABST
Abstract
本发明实施例公开了一种激光芯片外观缺陷的检测方法、系统、电子设备及介质。该方法包括：预先设置待检测的若干个激光芯片的外观缺陷算法的参数；各所述激光芯片的芯片类型相同；通过运输模块将载有所述若干个激光芯片运输至图像采集机构处；根据所述图像采集机构对所述若干个激光芯片进行图像采集，得到每个所述激光芯片的若干张外观图像；根据参数设置后的所述外观缺陷检测算法对所述若干张外观图像进行处理，得到每个所述激光芯片外观缺陷的检测结果。本申请无需采用人工检测方式，便可以实现激光芯片的外观缺陷，其能够检测出肉眼无法识别的异常，同时还可以提高激光芯片的检测效率，避免了物料的人为损伤和漏检，极大的降低了生产成本。
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