Method and device for detecting an OLED circuit

Abstract

The application provides an OLED circuit detection method and a detection device. The detection method comprises the following steps: after receiving a circuit detection request for an OLED panel to be detected, simultaneously inputting a first voltage to each pixel block on the OLED panel, and inputting a second voltage to each pixel block in a preset order. The voltage direction corresponding to the first voltage is opposite to the voltage direction corresponding to the second voltage. The first voltage and the second voltage with opposite directions are inputted to each pixel block in sequence to drive the pixel block to work. After the first voltage is simultaneously inputted to all the pixel blocks, the second voltage is inputted to each pixel block in a predetermined order to reduce the total starting time of all the pixel blocks. The OLED panel does not need to be aged, time is saved, the operation steps are simplified, and whether the corresponding pixel block has defects can be determined more easily through the starting current and the working current, the detection accuracy is improved, and the monitoring efficiency is improved.

Description

Technical Field

[0001] This invention relates to the field of OLED circuit testing technology, and more specifically to a testing method and device for OLED circuits. Background Technology

[0002] Currently, in OLED panel manufacturing processes, many OLED circuit defects are identified by setting an aging program that repeatedly illuminates the panel to reveal the defects. However, aging a single sheet of glass directly doesn't allow the aging process to reach every pixel. Typically, the large panel needs to be cut to the product dimensions, and then the driver IC and FPC are bonded together to create an OLED display module for further aging. Both the large panel aging and module aging processes involve several hours of continuous illumination. Defects are then visually inspected by quality control personnel or inspected using AOI (Automated Optical Inspection) equipment. This method relies heavily on the judgment of the quality control personnel and the recognition capabilities of the AOI equipment, making accuracy difficult to guarantee. Some modules with minor defects are difficult to detect, and the process is very time-consuming. If a circuit defect is discovered during the module aging process, the entire OLED module must be scrapped, and the driver IC and FPC on the module become unusable. Conventional OLED circuit inspection methods and devices are inefficient, inaccurate, and wasteful of materials. Summary of the Invention

[0003] Therefore, the technical problem to be solved by the present invention is to overcome the shortcomings of conventional OLED circuit detection methods and devices in the prior art, such as low screening efficiency, poor accuracy, and waste of materials, thereby providing an OLED circuit detection method and detection device.

[0004] According to a first aspect of the present invention, a method for detecting an OLED circuit is provided, comprising:

[0005] The system receives a circuit testing request for the OLED panel under test; simultaneously inputs a first voltage to each pixel block on the OLED panel, and sequentially inputs a second voltage to each pixel block according to a preset order, wherein the voltage direction corresponding to the first voltage is opposite to the voltage direction corresponding to the second voltage; determines the start-up current corresponding to each pixel block when it goes from startup to on state, and determines the driving current corresponding to the pixel block after it reaches the working state; and identifies abnormal pixel blocks in each pixel block on the OLED panel based on the start-up current and driving current corresponding to each pixel block.

[0006] Optionally, the step of simultaneously inputting a first voltage to each pixel block on the OLED panel, and sequentially inputting a second voltage to each pixel block according to a preset order, includes:

[0007] A positive voltage is simultaneously applied to each of the pixel blocks, and a negative voltage is sequentially applied to each of the pixel blocks;

[0008] Alternatively, a negative voltage may be simultaneously applied to each of the pixel blocks, and a positive voltage may be sequentially applied to each of the pixel blocks.

[0009] Optionally, determining the start-up current corresponding to each pixel block when it transitions from the startup to the on-state, and determining the drive current corresponding to the pixel block after it reaches the working state, includes:

[0010] Based on the pixel block's activation parameters, determine the activation current when the current pixel block reaches the activation state;

[0011] Based on the working parameters of the pixel block, determine the operating current when the current pixel block reaches the working state.

[0012] Optionally, determining abnormal pixel blocks in each pixel block on the OLED panel based on the start-up current and drive current corresponding to each pixel block includes:

[0013] According to the first preset rule, determine the first differential current value among all the start-up currents;

[0014] According to the second preset rule, determine the second differential current value among all operating currents;

[0015] The pixel blocks corresponding to the first differential current value and the second differential current value are marked as abnormal pixel blocks, respectively.

[0016] Optionally, determining the first differential current value among all start-up currents according to a first preset rule includes:

[0017] A first normal distribution curve is established based on the start-up current of all the pixel blocks;

[0018] The start-up current that does not conform to the first normal distribution curve is marked as the first differential current value.

[0019] Optionally, determining the second differential current value among all operating currents according to the second preset rule includes:

[0020] A second normal distribution curve is established based on the driving current of all the pixel blocks;

[0021] The drive current that does not conform to the second normal distribution curve is marked as the second differential current value.

[0022] According to a second aspect of the present invention, a detection device for an OLED circuit is provided, characterized in that it comprises:

[0023] The receiving module is adapted to receive circuit testing requests for the OLED panel under test.

[0024] The power supply module is adapted to simultaneously input a first voltage to each pixel block on the OLED panel, and to sequentially input a second voltage to each pixel block according to a preset order, wherein the voltage direction corresponding to the first voltage is opposite to the voltage direction corresponding to the second voltage;

[0025] The detection module is adapted to determine the start-up current corresponding to each pixel block when it goes from the start-up state to the on-state, and to determine the driving current corresponding to the pixel block after it reaches the working state.

[0026] The calculation module is adapted to determine the abnormal pixel block in each pixel block on the OLED panel based on the start-up current and drive current corresponding to each pixel block.

[0027] Optionally, the OLED panel is provided with positive electrodes and negative electrodes corresponding to all the pixel blocks respectively, and the power supply module is a conductive adhesive strip and a probe. The conductive end of the conductive adhesive strip is connected to all the positive electrodes, and the probe is selectively connected to the negative electrode.

[0028] Alternatively, the conductive end of the conductive adhesive strip is connected to all of the negative electrodes, and the probe can be selectively connected to the positive electrode;

[0029] In this embodiment, one of the conductive adhesive strip and the probe is adapted to provide a positive voltage, and the other is adapted to provide a negative voltage.

[0030] Optionally, the detection module is a current detector, which is adapted to detect the current value of the pixel block and upload it to the calculation module.

[0031] Optionally, the detection device further includes a display unit, which is adapted to display first indication information when the defective pixel is present, and otherwise display second indication information.

[0032] This specification provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the detection method of the OLED circuit described above.

[0033] This specification provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the detection method of the OLED circuit described above.

[0034] The present invention has the following advantages:

[0035] The OLED circuit detection method provided by the present invention, after receiving a circuit detection request for an OLED panel to be tested, simultaneously inputs a first voltage to each pixel block on the OLED panel, and sequentially inputs a second voltage to each pixel block in a preset order. The voltage direction corresponding to the first voltage is opposite to that corresponding to the second voltage. Sequentially inputting the first voltage and the second voltage in opposite directions to each pixel block can drive the pixel block to work. Furthermore, after simultaneously inputting the first voltage to all pixel blocks, sequentially inputting the second voltage to each pixel block in a predetermined order can reduce the total startup time of all pixel blocks.

[0036] Then, the on-state current corresponding to each pixel block when it goes from startup to on state is determined, and the driving current corresponding to the pixel block after it reaches the working state is determined. Based on the on-state current and driving current corresponding to each pixel block, abnormal pixel blocks are identified in each pixel block on the OLED panel.

[0037] Compared with existing technologies, the detection method provided by this invention eliminates the need for aging of OLED panels, saving time and simplifying operation steps. Furthermore, by using the start-up current and operating current, it is easier to determine whether there are defects in the corresponding pixel blocks, thus improving detection accuracy and monitoring efficiency. Attached Figure Description

[0038] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0039] Figure 1 This is a flowchart of the detection method for the OLED circuit in an embodiment of the present invention;

[0040] Figure 2 This is a schematic diagram of the structure of the detection device for the OLED circuit in an embodiment of the present invention;

[0041] Figure 3 This is applied in the embodiments of the present invention. Figure 1 A schematic diagram of the structure of an electronic device. Detailed Implementation

[0042] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0043] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0044] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0045] Furthermore, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0046] The data processing method provided in this application can be executed by a client. The client can be hardware with embedded programs integrated on a terminal, application software installed on the terminal, or utility software embedded in the terminal's operating system; this application does not limit this. The terminal can be any terminal device, including a host computer, mobile phone, or computer.

[0047] refer to Figure 1 In one embodiment of the present invention, a method for detecting an OLED circuit is provided, comprising:

[0048] Step S100: Receive a circuit testing request for the OLED panel to be tested.

[0049] Specifically, taking the host computer as an example, it can be connected to other electrical devices for communication. The host computer is suitable for sending control commands and receiving data signals, and can analyze the data signals according to calculation rules. The OLED panel has multiple pixel blocks arranged in a matrix. These pixel blocks can be arranged in an n*n or n*m matrix on the OLED substrate, such as a 100*100 pixel matrix. The position of each pixel can be marked according to the specifications of the OLED panel. For example, the position of a pixel block on the OLED panel can be defined as coordinates (x, y), and the pixel points can be marked as (1,1), (1,2), (1,3), etc. Each pixel block has two electrodes, one positive and one negative, which drive the pixel block to work. As the voltage value gradually increases, the pixel block will sequentially enter an on-state and a working state. For example, the brightness of the pixel block in the on-state is 0.1-1 nit, and the brightness of the pixel block in the working state is 1000-1500 nits.

[0050] Step S200: Simultaneously input a first voltage to each pixel block on the OLED panel, and sequentially input a second voltage to each pixel block according to a preset order, wherein the voltage direction corresponding to the first voltage is opposite to the voltage direction corresponding to the second voltage.

[0051] Specifically, the first voltage and the second voltage can be positive and negative, respectively. For example, the first voltage can be positive and the second voltage negative, or vice versa. Each pixel block has two electrodes, and applying a positive voltage to one electrode and a negative voltage to the other will drive the pixel block to emit light. The terms "first" and "second" are used only to distinguish the direction of the voltage and do not limit other characteristics of the voltage. The preset order can be determined by the position of the electrodes on the OLED panel. For example, multiple first electrodes and multiple second electrodes can be set on both sides of the OLED panel. Applying a positive voltage to the first electrode and a negative voltage to the second electrode of the same pixel block will drive the pixel block to work.

[0052] Based on this, a first voltage is simultaneously applied to all pixels on the OLED panel, putting all pixels into a standby state. Then, a second voltage is applied to the corresponding pixels in a preset order. After the pixels start working, their current is monitored and recorded. After the current pixel is detected, the next pixel can be detected in the preset order until all pixels have been detected. Since the first voltage is applied to all pixels during the detection preparation process, it is only necessary to apply the second voltage to the corresponding pixels sequentially according to the preset order, eliminating the need to set the first voltage application order for each pixel, thus saving operation time.

[0053] In one embodiment of the present invention, a positive voltage is simultaneously applied to each of the OLED pixels, and a negative voltage is sequentially applied to each of the OLED pixels.

[0054] Using the previous example, applying a positive voltage to each OLED pixel block simultaneously and then applying a negative voltage to each OLED pixel block sequentially can save operation time. Since the positive and negative voltages are applied to a single pixel block sequentially, the current value of each pixel block can be accurately recorded sequentially.

[0055] In another embodiment of the present invention, a negative voltage is simultaneously applied to each of the OLED pixels, and a positive voltage is sequentially applied to each of the OLED pixels.

[0056] Similarly, by simultaneously applying a negative voltage to each OLED pixel block and sequentially applying a positive voltage to each OLED pixel block, operation time can be saved. Since the positive and negative voltages are applied to each individual pixel block sequentially, the current value of each pixel block can be accurately recorded sequentially.

[0057] Step S300: Determine the start-up current corresponding to each pixel block when it goes from the start-up state to the on-state, and determine the driving current corresponding to the pixel block after it reaches the working state.

[0058] Specifically, the current corresponding to the on-state refers to the current value of the pixel block when its brightness reaches the on-state threshold. For example, when the brightness of the pixel block reaches the brightness range of 0.1-1 nit, it can be determined that the pixel block has reached the on-state. The current value of the pixel block during the first preset time period is recorded. The first preset time period can be set according to actual needs. The driving current corresponding to the working state refers to the current value of the pixel block when its brightness reaches the working threshold. For example, when the brightness of the pixel block reaches the brightness range of 1000-1500 nit, it can be determined that the pixel block has reached the working state. The current value of the pixel block during the second preset time period is recorded. The on-state threshold and the length of the second preset time period can be set according to actual conditions. This manual does not impose specific limitations on them.

[0059] Based on this, by applying a first voltage to each pixel block and then sequentially applying a second voltage, the start-up current and drive current of each pixel block can be determined sequentially, which facilitates subsequent calculations and the selection of differential current values.

[0060] Following the previous example, after applying the second voltage to the pixel block, the brightness of the current pixel block can be detected, and when the pixel block reaches the on-state and working state, the on-state current and working current of the current pixel block can be determined respectively, so as to facilitate the subsequent screening of abnormal pixel blocks by using all on-state currents and working currents respectively.

[0061] In one embodiment of the present invention, the start-up current when the current pixel block reaches the start-up state is determined according to the start-up parameters of the pixel block, and the operating current when the current pixel block reaches the operating state is determined according to the operating parameters of the pixel block.

[0062] Specifically, the pixel's activation parameter refers to the parameter corresponding to the brightness of the pixel when it is in the activated state. For example, the pixel's activation parameter can be 0.1-1 nit. The pixel's operating parameter refers to the parameter corresponding to the brightness of the pixel when it is in the operating state. For example, the pixel's operating parameter can be 1000-1500 nit.

[0063] Based on this, after applying positive and negative voltages to the pixel block, the brightness of the pixel block will gradually move from the on state to the working state, and the on-state current and working current of the pixel block will be recorded when the brightness of the pixel block reaches the on-state parameter and the working state parameter, respectively.

[0064] For example, when the brightness of a pixel reaches the range of 0.1-1 nit, the current value of the pixel is recorded and marked as the start-up current. As the brightness of the pixel continues to increase, when the brightness reaches 1000-1500 nit, the current value of the pixel is recorded and marked as the operating current. The start-up current and operating current of all pixels are recorded sequentially using the same method.

[0065] Step S400: Based on the start-up current and drive current corresponding to each pixel block, identify abnormal pixel blocks in each pixel block on the OLED panel.

[0066] Specifically, each pixel block has a corresponding start-up current and drive current. Among the start-up current and drive current of all pixel blocks, the difference current value is found. The difference current value refers to the current value that is different from the start-up current or drive current of other pixel blocks. The pixel block corresponding to the difference current value is marked as an abnormal pixel block.

[0067] Following the previous example, before starting in step S100, each pixel block can be marked, and the start-up current and drive current corresponding to each pixel block are determined through steps S200 and S300. In step S400, the pixel block corresponding to the difference current value is found. At this time, the location of abnormal pixel blocks can be accurately found through the specific marking of each pixel block. For example, if the start-up current of a pixel block marked as (n, m) or (n, n) is different from the drive current of other pixel blocks, then pixel block (n, m) or pixel block (n, n) can be identified as a pixel block. Then, in the same way, the pixel blocks with abnormal drive current are found and marked. Finally, the corresponding markings of any pixel block with abnormal start-up current and drive current are listed to obtain the location of all abnormal pixel blocks.

[0068] It should be noted that a pixel block will not be marked as an abnormal pixel block only if both its turn-on current and drive current meet the requirements. If either the turn-on current or the drive current of a pixel block is abnormal, it will be marked as an abnormal pixel block.

[0069] Therefore, by measuring the on-state current and drive current, it is possible to accurately determine whether a pixel block is abnormal. If either the on-state current or the drive current of a pixel block does not meet the requirements, it will be marked as an abnormal pixel block, facilitating subsequent repair. Compared to the multiple steps involved in random sampling inspection of OLED panels in existing technologies, the detection method of this invention can improve detection efficiency and accurately locate the position of abnormal pixel blocks, facilitating targeted repair of these abnormal pixels.

[0070] Step S401: Determine the first differential current value among all the start-up currents according to the first preset rule.

[0071] Specifically, the first preset rule refers to, after determining the on-state current of all pixel blocks, integrating the on-state current data of all pixel blocks, analyzing all on-state current data, establishing a first normal distribution curve, and establishing a corresponding confidence interval in the normal distribution curve. On-state currents located within the confidence interval are considered compliant on-state currents, while on-state currents outside the confidence interval are considered abnormal current values. The normal distribution is a probability distribution that is very important in mathematics, physics, and engineering, facilitating a direct and accurate determination of which on-state currents do not meet the standards.

[0072] For example, the vertical axis of the normal distribution curve is the start-up current, and the horizontal axis is the brightness parameter range. After calculation, the confidence range of the start-up current is determined. If the start-up current is within the confidence range, it is judged as the first normal current value. If the start-up current is outside the confidence range, it is judged that the start-up current does not conform to the first normal distribution curve, and the start-up current is marked as the first abnormal current.

[0073] Step S402: Determine the second differential current value among all operating currents according to the second preset rule.

[0074] Similarly, the second preset rule refers to integrating the driving current data of all pixel blocks after determining the driving current of all pixel blocks, and performing data analysis on all driving current data to establish a second normal distribution curve. A corresponding second confidence interval is established in the second normal distribution curve. The driving current located in the second confidence interval is the driving current that meets the requirements, and the driving current outside the second confidence interval is the second abnormal current value.

[0075] For example, the vertical axis of the second normal distribution curve is the driving current, and the horizontal axis is the brightness parameter range. After calculation, the confidence range of the driving current is determined. If the driving current is within the confidence range, the driving current is judged to be the second normal current value. If the driving current is outside the confidence range, the driving current is judged to not conform to the second normal distribution curve, and the driving current is marked as the second abnormal current.

[0076] It should be noted that the calculation order of steps S401 and S402 can be interchanged without affecting the final judgment result.

[0077] Step S403: Mark the pixel blocks corresponding to the first differential current value and the second differential current value as abnormal pixel blocks respectively.

[0078] Specifically, abnormal pixel blocks refer to defective pixel blocks, that is, pixel blocks that cannot be turned on or function normally. This is determined based on the turn-on current and drive current. Abnormal pixel blocks may exist where both the turn-on current and drive current fail to meet requirements, or where only one of the turn-on current or drive current fails to meet requirements; both of these are defined as abnormal pixel blocks.

[0079] For example, all pixel blocks corresponding to the first differential current value are marked as abnormal pixel blocks, and all pixel blocks corresponding to the second differential current value are marked as abnormal pixel blocks.

[0080] It should be noted that the marking is still targeted according to the specific situation of the abnormal pixel block. For example, if the start-up current of the abnormal pixel block is abnormal, the information of abnormal start-up current will be added when marking. If the drive current of the abnormal pixel block is abnormal, the information of abnormal drive current will be added when marking.

[0081] In summary, the detection method of the present invention determines whether there are defects in the pixel block to be detected based on the turn-on current and drive current of the pixel block, thereby improving detection efficiency and accuracy.

[0082] The above describes one or more embodiments of the method implemented in this specification. Based on the same idea, this specification also provides corresponding business execution apparatus, such as... Figure 2 As shown, the present invention provides a detection device for an OLED circuit, comprising:

[0083] The receiving module 201 is adapted to receive a circuit testing request for the OLED panel to be tested.

[0084] Specifically, the receiving module can be the client mentioned above. The client can be a hardware device with embedded programs integrated on the terminal, an application software installed on the terminal, or a utility software embedded in the terminal's operating system, etc. This application embodiment does not limit this. The terminal can be any terminal device, including host computers, mobile phones, computers, etc.

[0085] The power supply module 202 is adapted to simultaneously input a first voltage to each pixel block on the OLED panel, and to sequentially input a second voltage to each pixel block according to a preset order, wherein the voltage direction corresponding to the first voltage is opposite to the voltage direction corresponding to the second voltage.

[0086] Specifically, the testing device includes a testing stage with a testing area for carrying the OLED panel and a power supply module movably disposed on the testing area. The power supply module may include conductive adhesive strips and probes. The pixel block has a first electrode and a second electrode. When a positive voltage and a negative voltage are simultaneously applied to the first electrode and the second electrode, the pixel block starts to work.

[0087] In use, the OLED panel can be placed in the detection area. The conductive end of the conductive strip is then electrically connected to the first electrode of all pixel blocks on the OLED panel. The conductive strip has the characteristics of vertical conductivity and lateral insulation, and can be used to provide a first voltage to each pixel block. Subsequently, a second voltage can be applied to each pixel block in a preset order using probes, so that each pixel block starts working in the preset order, facilitating subsequent monitoring and recording.

[0088] The detection module 203 is adapted to determine the start-up current corresponding to each pixel block when it goes from the start-up state to the on-state, and to determine the driving current corresponding to the pixel block after it reaches the working state.

[0089] Specifically, when the second voltage is sequentially applied to each pixel block, the current of each pixel block can be detected and recorded by the detection module. When a pixel block reaches the on-state, the on-state current of the pixel block is recorded, and when the pixel block reaches the working state, the driving current of the pixel block is recorded. The on-state current and driving current of each pixel block are recorded sequentially according to a preset order.

[0090] The calculation module 204 is adapted to determine the abnormal pixel block in each pixel block on the OLED panel based on the start-up current and drive current corresponding to each pixel block.

[0091] Specifically, the calculation module can be a host computer. The start-up current and drive current data of each pixel block recorded by the detection module will be uploaded to the host computer. The host computer will calculate and mark abnormal pixel blocks using the detection method described above.

[0092] The detection device provided by this invention uses the detection method mentioned above to detect OLED panels. By simultaneously applying a first voltage to all pixel blocks and then applying a second voltage to each pixel block in a preset order, the operation time is reduced. Abnormal pixel blocks are identified using the start-up current and drive current respectively, improving detection accuracy.

[0093] In one embodiment of the present invention, the OLED panel is provided with positive electrodes and negative electrodes corresponding to all the OLED pixels respectively, the power supply module is a conductive adhesive strip and a probe, the conductive end of the conductive adhesive strip is connected to all the positive electrodes, and the probe is selectively connected to the negative electrode.

[0094] Specifically, each pixel block has two electrodes, one of which can be defined as the positive electrode and the other as the negative electrode. The positive electrodes of all pixel blocks are distributed on one side of the OLED panel, and the negative electrodes of all pixel blocks are distributed on the other side of the OLED panel. Conductive adhesive strips can be connected to the positive electrodes of all pixel blocks, and then the negative electrodes of each pixel block are energized sequentially through probes according to a preset order, thereby driving the pixel blocks to emit light.

[0095] In another embodiment of the invention, the conductive end of the conductive adhesive strip is connected to all the negative electrodes, and the probe is selectively connected to the positive electrode. Similarly, the conductive adhesive strip can also be connected to the negative electrodes of all pixel blocks, and the probe can be connected to the positive electrodes of each pixel block in a predetermined order to drive each pixel block to emit light.

[0096] One of the conductive adhesive strip and the probe described above is adapted to provide a positive voltage, and the other is adapted to provide a negative voltage. The direction of the voltage provided by the conductive adhesive strip and the probe can be determined according to their respective positive and negative electrodes.

[0097] In one embodiment of the present invention, the detection module is a current detector, which is adapted to detect the current value of the pixel block and upload it to the calculation module.

[0098] Specifically, the current detector can communicate with a host computer to monitor the current flowing through the pixel block and upload the data to the host computer during detection. The current detector can detect the start-up current and drive current of the pixel block in a preset sequence.

[0099] Optionally, the power supply module 202 is specifically configured to simultaneously apply a positive voltage to each pixel block and sequentially apply a negative voltage to each pixel block; or, simultaneously apply a negative voltage to each pixel block and sequentially apply a positive voltage to each pixel block.

[0100] Optionally, the detection module 203 is specifically used to: determine the start-up current when the current pixel block reaches the start-up state based on the start-up parameters of the pixel block; and determine the operating current when the current pixel block reaches the operating state based on the operating parameters of the pixel block.

[0101] Optionally, the detection module 204 is specifically used to: determine a first differential current value among all start-up currents according to a first preset rule; determine a second differential current value among all operating currents according to a second preset rule; and mark the pixel blocks corresponding to the first differential current value and the second differential current value as abnormal pixel blocks, respectively.

[0102] Optionally, the detection module 204 is specifically used to: establish a first normal distribution curve based on the turn-on current of all the pixel blocks; and mark the turn-on current that does not conform to the first normal distribution curve as a first difference current value.

[0103] Optionally, the detection module 204 is specifically used to establish a second normal distribution curve based on the driving current of all pixel blocks; and to mark the driving current that does not conform to the second normal distribution curve as a second differential current value.

[0104] In one embodiment of the present invention, the detection device further includes a display unit, which is adapted to display first indication information when the defective pixel is present, and otherwise display second indication information.

[0105] Specifically, the display unit can be an indicator light, which is connected to the host computer. The first indicator information refers to normal information, and the second indicator information refers to abnormal information. When the host computer determines that the pixel block is normal after calculation, the indicator light displays normal information. When the host computer determines that the pixel block is abnormal after calculation, the indicator light displays abnormal information.

[0106] For example, a normal indicator light is green, while an abnormal indicator light is red. When the OLED panel test result is normal, the indicator light is green; when abnormal pixel blocks are detected in the OLED panel, the indicator light is red. This helps staff understand the status of the OLED panel and perform subsequent processing.

[0107] This specification also provides a computer-readable storage medium storing a computer program that can be used to execute the above-described... Figure 1 A detection method for OLED circuits is provided.

[0108] This instruction manual also provides Figure 3 One of the corresponding Figure 1 A schematic diagram of the structure of an electronic device. (e.g.) Figure 3 At the hardware level, the electronic device includes a processor, internal bus, network interface, memory, and non-volatile memory, and may also include other hardware required for the business operations. The processor reads the corresponding computer program from the non-volatile memory into memory and then runs it to achieve the above-mentioned functions. Figure 1 The detection method for the OLED circuit described above. Of course, in addition to software implementation, this specification does not exclude other implementation methods, such as logic devices or a combination of hardware and software, etc. That is to say, the execution subject of the following processing flow is not limited to each logic unit, but can also be hardware or logic devices.

[0109] Improvements in a technology can be clearly distinguished as either hardware improvements (e.g., improvements to the circuit structure of diodes, transistors, switches, etc.) or software improvements (improvements to the methodology). However, with technological advancements, many improvements to the methodology can now be considered direct improvements to the hardware circuit structure. Designers almost always obtain the corresponding hardware circuit structure by programming the improved methodology into the hardware circuit. Therefore, it cannot be said that an improvement in methodology cannot be implemented using hardware physical modules. For example, a Programmable Logic Device (PLD) (such as a Field Programmable Gate Array (FPGA)) is such an integrated circuit whose logic function is determined by the user programming the device. Designers can program and "integrate" a digital system onto a PLD themselves, without needing chip manufacturers to design and manufacture dedicated integrated circuit chips. Furthermore, nowadays, instead of manually manufacturing integrated circuit chips, this programming is mostly implemented using "logic compiler" software. Similar to the software compiler used in program development, the original code before compilation must be written in a specific programming language, called a Hardware Description Language (HDL). There are many HDLs, such as ABEL (Advanced Boolean Expression Language), AHDL (Altera Hardware Description Language), Confluence, CUPL (Cornell University Programming Language), HDCal, JHDL (Java Hardware Description Language), Lava, Lola, MyHDL, PALASM, and RHDL (Ruby Hardware Description Language). Currently, VHDL (Very-High-Speed ​​Integrated Circuit Hardware Description Language) and Verilog are the most commonly used. Those skilled in the art should understand that by simply performing some logic programming on the method flow using one of these hardware description languages ​​and programming it into an integrated circuit, the hardware circuit implementing the logical method flow can be easily obtained.

[0110] The controller can be implemented in any suitable manner. For example, it can take the form of a microprocessor or processor and a computer-readable medium storing computer-readable program code (e.g., software or firmware) executable by the (micro)processor, logic gates, switches, application-specific integrated circuits (ASICs), programmable logic controllers, and embedded microcontrollers. Examples of controllers include, but are not limited to, the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20, and Silicon Labs C8051F320. A memory controller can also be implemented as part of the control logic of the memory. Those skilled in the art will also recognize that, in addition to implementing the controller in purely computer-readable program code form, the same functionality can be achieved by logically programming the method steps to make the controller take the form of logic gates, switches, application-specific integrated circuits, programmable logic controllers, and embedded microcontrollers. Therefore, such a controller can be considered a hardware component, and the means included therein for implementing various functions can also be considered as structures within the hardware component. Alternatively, the means for implementing various functions can be considered as both software modules implementing the method and structures within the hardware component.

[0111] The systems, devices, modules, or units described in the above embodiments can be implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a computer. Specifically, a computer can be, for example, a personal computer, laptop computer, cellular phone, camera phone, smartphone, personal digital assistant, media player, navigation device, email device, game console, tablet computer, wearable device, or any combination of these devices.

[0112] For ease of description, the above devices are described in terms of function, divided into various units. Of course, in implementing this specification, the functions of each unit can be implemented in one or more software and / or hardware components.

[0113] Those skilled in the art will understand that embodiments of this specification can be provided as methods, systems, or computer program products. Therefore, this specification may take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this specification may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0114] This specification is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this specification. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create a machine for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0115] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0116] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0117] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0118] Memory may include non-persistent storage in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0119] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0120] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0121] Those skilled in the art will understand that the embodiments of this specification can be provided as methods, systems, or computer program products. Therefore, this specification may take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this specification may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0122] This specification can be described in the general context of computer-executable instructions that are executed by a computer, such as program modules. Generally, program modules include routines, programs, objects, components, data structures, etc., that perform a specific task or implement a specific abstract data type. This specification can also be practiced in distributed computing environments, where tasks are performed by remote processing devices connected via a communication network. In distributed computing environments, program modules can reside in local and remote computer storage media, including storage devices.

[0123] The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to interchangeably. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions in the method embodiments.

[0124] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all possible implementations here. However, obvious variations or modifications derived therefrom are still within the scope of protection of this invention.

Claims

1. A method for detecting OLED circuits, characterized in that, include: Receive circuit testing requests for the OLED panel to be tested; A first voltage is simultaneously input to each pixel block on the OLED panel, and a second voltage is sequentially input to each pixel block according to a preset order, wherein the voltage direction corresponding to the first voltage is opposite to the voltage direction corresponding to the second voltage; Determine the start-up current corresponding to each pixel block when it goes from the start-up state to the on-state, and determine the driving current corresponding to the pixel block after it reaches the working state; Based on the start-up current and driving current corresponding to each pixel block, abnormal pixel blocks are identified in each pixel block on the OLED panel. Specifically, according to a first preset rule, a first differential current value is determined among all start-up currents. The first preset rule refers to establishing a first normal distribution curve based on the start-up currents of all pixel blocks, and marking start-up currents that do not conform to the first normal distribution curve as first differential current values. According to a second preset rule, a second differential current value is determined among all operating currents. The second preset rule refers to establishing a second normal distribution curve based on the driving currents of all pixel blocks, and marking driving currents that do not conform to the second normal distribution curve as second differential current values. Pixel blocks corresponding to the first differential current value and the second differential current value are respectively marked as abnormal pixel blocks.

2. The detection method according to claim 1, characterized in that, The step of simultaneously inputting a first voltage to each pixel block on the OLED panel, and sequentially inputting a second voltage to each pixel block according to a preset order, includes: A positive voltage is simultaneously applied to each of the pixel blocks, and a negative voltage is sequentially applied to each of the pixel blocks; Alternatively, a negative voltage may be simultaneously applied to each of the pixel blocks, and a positive voltage may be sequentially applied to each of the pixel blocks.

3. The detection method according to claim 1, characterized in that, Determining the start-up current corresponding to each pixel block when it transitions from the startup state to the on-state, and determining the drive current corresponding to the pixel block after it reaches the working state, includes: Based on the pixel block's activation parameters, determine the activation current when the current pixel block reaches the activation state; Based on the working parameters of the pixel block, determine the operating current when the current pixel block reaches the working state.

4. A detection device for an OLED circuit, characterized in that, include: The receiving module is adapted to receive circuit testing requests for the OLED panel under test. The power supply module is adapted to simultaneously input a first voltage to each pixel block on the OLED panel, and to sequentially input a second voltage to each pixel block according to a preset order, wherein the voltage direction corresponding to the first voltage is opposite to the voltage direction corresponding to the second voltage; The detection module is adapted to determine the start-up current corresponding to each pixel block when it goes from the start-up state to the on-state, and to determine the driving current corresponding to the pixel block after it reaches the working state. The calculation module is adapted to identify abnormal pixel blocks in each pixel block on the OLED panel based on the start-up current and driving current corresponding to each pixel block; wherein, according to a first preset rule, a first differential current value is determined among all start-up currents, the first preset rule referring to establishing a first normal distribution curve based on the start-up currents of all pixel blocks, and marking start-up currents that do not conform to the first normal distribution curve as first differential current values; according to a second preset rule, a second differential current value is determined among all operating currents, the second preset rule referring to establishing a second normal distribution curve based on the driving currents of all pixel blocks, and marking driving currents that do not conform to the second normal distribution curve as second differential current values; and pixel blocks corresponding to the first differential current value and the second differential current value are marked as abnormal pixel blocks respectively.

5. The detection device according to claim 4, characterized in that, The OLED panel is provided with positive and negative electrodes corresponding to all the pixel blocks respectively. The power supply module consists of a conductive adhesive strip and a probe. The conductive end of the conductive adhesive strip is connected to all the positive electrodes, and the probe can be selectively connected to the negative electrode. Alternatively, the conductive end of the conductive adhesive strip is connected to all of the negative electrodes, and the probe can be selectively connected to the positive electrode; In this embodiment, one of the conductive adhesive strip and the probe is adapted to provide a positive voltage, and the other is adapted to provide a negative voltage.

6. The detection device according to claim 4, characterized in that, The detection module is a current detector, which is adapted to detect the current value of the pixel block and upload it to the calculation module.

7. The detection device according to claim 4, characterized in that, The detection device further includes a display unit, which is adapted to display first indication information when defective pixels are present, and otherwise display second indication information.

8. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, implements the method described in any one of claims 1 to 3.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the method described in any one of claims 1 to 3.

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