A testing device, method and production line

Abstract

The application discloses a kind of testing device, method and production line, testing device is used for the lead detection in product inside, including rack;Visual mechanism is used to determine the position information of lead;Test mechanism includes driving component and spring needle module, driving component drives spring needle module activity;Spring needle module includes the spring needle assembly of movable arrangement, the ranging assembly for determining the back-off distance of spring needle assembly along first direction, the locking assembly for defining spring needle assembly, the first reset piece and the second reset piece acting on spring needle assembly.It is realized to test by spring needle module and lead contact, determine lead condition by visual mechanism, and by the aid of driving component, ranging assembly, combined with first reset piece and second reset piece, so as to well cope with the problem of product shell camber and lead test end dispersion, realize test as far as possible to reduce the effect of damage on product and appearance.

Description

Technical Field

[0001] This invention relates to the field of cantilever needle testing device technology, and particularly to a testing device, method and production line. Background Technology

[0002] In the non-standard testing industry, the testing of product wires is carried out by using conductive copper blocks, silicone needles and probes individually or in combination, depending on factors such as the length, number and arrangement of the wires.

[0003] When the wires of the test product are located inside the product, the outer shell of the product is thick and has a certain curvature, and the wires are small, tightly arranged, and the test ends are scattered, and the lengths of the wires between products are not consistent, the existing testing methods such as copper blocks, probes and silicone needles cannot well meet the testing requirements. Summary of the Invention

[0004] The purpose of this invention is to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes a testing device that can effectively solve the problems of product casing curvature and scattered wire test ends, thereby providing better testing capabilities.

[0005] The present invention also proposes a testing method using the above-described testing apparatus.

[0006] The present invention also proposes a production line including the above-described testing apparatus.

[0007] According to a first aspect of the present invention, a testing apparatus is used for detecting internal wires in a product, comprising:

[0008] frame;

[0009] A vision mechanism, mounted on the frame, is used to determine the position information of the wire;

[0010] A testing mechanism, mounted on the frame, includes a driving component and a spring pin module. The driving component drives the spring pin module to move along a first direction or a second direction.

[0011] The spring pin module includes a ranging component, a locking component, a first reset component, a second reset component, and a spring pin assembly. The spring pin assembly is movably disposed. The locking component is used to limit the spring pin assembly to a preset position in the first direction. The first reset component acts on the spring pin assembly to make the spring pin assembly have a tendency to extend and reset along the first direction. The second reset component acts on the spring pin assembly to make the spring pin assembly have a tendency to extend along the second direction.

[0012] The locking component performs a locking or unlocking action on the spring pin assembly based on the position information determined by the vision mechanism. When the locking component unlocks the spring pin assembly, the ranging component is used to determine the distance the spring pin assembly retracts along the first direction.

[0013] The testing apparatus according to a first aspect of the present invention has at least the following beneficial effects: the testing function is realized by contacting the wires inside the product through the spring pin module. For the testing of small wires inside thin-walled products, the wire condition is determined by a vision mechanism. At the same time, with the assistance of the driving component and the ranging component, combined with the first reset component and the second reset component, the problems of product shell curvature and wire test end scattering can be well addressed, thereby minimizing damage to the product and appearance during testing.

[0014] According to a first aspect of the present invention, the testing apparatus includes a ranging component comprising a laser rangefinder and a distance sensing block, the distance sensing block moving synchronously with the spring pin assembly, and the laser rangefinder being adapted to calculate the relative distance change between itself and the distance sensing block to determine the current position of the spring pin assembly.

[0015] According to the first aspect of the present invention, the test apparatus includes a plurality of spring needles and a fixing block. The spring needles are S-shaped and elastic, and each spring needle is arranged in an orderly manner on the fixing block.

[0016] According to a first aspect of the present invention, the testing apparatus includes a locking assembly comprising a limiting pin and a driving member, the driving member being used to drive the limiting pin to have a first state of locking the spring pin assembly and a second state of being relatively separated from the spring pin assembly.

[0017] According to a first aspect of the present invention, the test apparatus includes a spring needle module comprising a first slide rail and a second slide rail, the second slide rail being slidably disposed on the first slide rail, and the spring needle assembly being slidably disposed on the second slide rail, so that the spring needle assembly can move along the first direction or the second direction.

[0018] According to a first aspect of the present invention, the testing apparatus includes a driving component comprising a first driving component and a second driving component, the first driving component and the second driving component being configured to cooperate, the first driving component being used to drive the spring needle module to move along the first direction, and the second driving component being used to drive the spring needle module to move along the second direction.

[0019] The testing apparatus according to a first aspect embodiment of the present invention further includes:

[0020] A carrier mechanism is mounted on the frame and is used to fix the product.

[0021] The testing mechanism also includes a silicone needle testing module and a probe testing module, which are mounted on the frame. The silicone needle testing module, the probe testing module, and the spring needle module operate according to the information from the vision mechanism.

[0022] According to a first aspect of the present invention, the testing apparatus includes an upper vision module and a lower vision module. The upper vision module is used to confirm the position information of the wires inside the product and feed it back to the silicone needle test module, the probe test module and the spring needle module. The lower vision module is used to cooperate with the spring needle module to determine the relative positional relationship between the spring needle module and the product.

[0023] According to a second aspect embodiment of the present invention, the testing method using the testing apparatus described in the first aspect embodiment of the present invention includes the following steps:

[0024] Product information is captured using a vision system to determine the internal wiring configuration of the product;

[0025] Let A be the length of the conductor from its beginning to its end, and C be the distance from the beginning of the conductor to a specific location.

[0026] When C > A, the locking component locks the spring pin assembly, preventing the spring pin assembly from moving in the first direction. Based on the product information captured by the vision mechanism, the driving component drives the spring pin module to test the wire.

[0027] When C≤A, the locking component releases the spring pin assembly, making the spring pin assembly suitable for movement along the first direction. Based on the product information captured by the vision mechanism, the driving component drives the spring pin module to move to a position close to the product. The execution steps include:

[0028] The spring pin module gradually approaches the edge of the product's outer shell from the inside out along the first direction until it makes contact. Contact causes the spring pin module to retract and triggers the ranging component to record the distance change. The driving component drives the spring pin module to extend and reset along the first direction and retract a specific distance according to the distance change. Then, it drives the spring pin module to move along the second direction and test the wire.

[0029] A production line according to a third aspect of the present invention includes: a testing apparatus as described in a first aspect of the present invention.

[0030] It is easy to understand that the testing method in the second aspect embodiment of the present invention and the production line in the third aspect embodiment of the present invention both have the same technical effects as the testing device in the first aspect embodiment, and therefore will not be described again.

[0031] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0032] The present invention will be further described below with reference to the accompanying drawings and embodiments;

[0033] Figure 1 This is a schematic diagram of the structure of an embodiment of the present invention;

[0034] Figure 2 This is a schematic diagram showing the relative positional relationship between the wires and the product in an embodiment of the present invention;

[0035] Figure 3 This is a schematic diagram of the connection between the driving component and the spring pin module in an embodiment of the present invention;

[0036] Figure 4 This is an exploded view of the spring pin module in an embodiment of the present invention.

[0037] Figure label:

[0038] Frame 100, carrier mechanism 110, upper vision module 120, lower vision module 130, silicone needle test module 140, probe test module 150;

[0039] Spring pin module 200, laser rangefinder 211, distance sensor block 212, limit pin 221, drive component 222, first reset component 230, second reset component 240, spring pin 251, fixing block 252, first slide rail 260, second slide rail 270;

[0040] Drive component 300, first drive assembly 310, second drive assembly 320;

[0041] Product 400, wire 410. Detailed Implementation

[0042] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0043] In the description of this application, it should be understood that the orientation descriptions, such as up, down, front, back, left, right, etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0044] In the description of this application, "several" means one or more, "more than" means at least two, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is for the purpose of distinguishing technical features only and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.

[0045] In the description of this application, unless otherwise expressly defined, terms such as "setup," "installation," and "connection" should be interpreted broadly. Those skilled in the art can reasonably determine the specific meaning of the above terms in this application after considering the specific content of the technical solution.

[0046] Reference Figures 1 to 4 The testing apparatus of the first aspect of this application is applied to the testing of fine wires 410 inside a thin-walled product 400. The testing apparatus is used for the detection of wires 410 inside the product 400 and includes a frame 100, a vision mechanism and a testing mechanism.

[0047] The vision mechanism is mounted on the frame 100 and is used to determine the position information of the wire 410. The testing mechanism is also mounted on the frame 100 and includes a driving component 300 and a spring pin module 200. The driving component 300 is used to drive the spring pin module 200 to move along a first direction or a second direction. The spring pin module 200 includes a ranging component, a locking component, a first reset component 230, a second reset component 240, and a spring pin assembly. The spring pin assembly is movably mounted. The locking component is used to limit the spring pin assembly to a preset position in the first direction. The first reset component 230 acts on the spring pin assembly to make the spring pin assembly tend to extend and reset along the first direction. The second reset component 240 acts on the spring pin assembly to make the spring pin assembly tend to extend along the second direction. The locking component performs a locking or unlocking action on the spring pin assembly based on the position information determined by the vision mechanism. When the locking component unlocks the spring pin assembly, the ranging component is used to determine the distance the spring pin assembly retracts along the first direction.

[0048] It should be noted that the vision mechanism can perform visual positioning of the wire 410 of the product 400, determine the position of the product 400 housing and the wire 410 respectively, and control the drive component 300 and the spring pin module 200 based on the position of the two. The drive component 300 is used to drive the spring pin module 200 to move to adjust the relative position relationship between the spring pin module 200 and the wire 410 and to perform a continuity test. The locking component is controlled according to the different positions of the product 400 housing and the wire 410 to correspond to different test steps. Specifically, when the internal wire 410 of product 400 is far from the edge of the product 400 shell, the locking component locks the spring pin assembly. The spring pin assembly can perform the corresponding test normally without fine adjustment. When the internal wire 410 of product 400 is close to the edge of the product 400 shell, the locking component releases the spring pin assembly. The spring pin assembly, together with the first reset component 230 and the ranging component, achieves fine adjustment and precise positioning, thus effectively addressing the issues of the curvature of the product 400 shell and the scattered test ends of the wire 410, before conducting a continuity test. Specifically, let A be the length from the beginning to the end of the wire 410, and C be the distance from the beginning of the wire 410 to a specific position, where the specific position is a suitable position of the wire 410 at a certain distance from the edge of the product 400 shell. If C > A, it means that the wire 410 is far from the edge of the product 400 shell; if C ≤ A, it means that the wire 410 is close to the edge of the product 400 shell. The driving method of the spring pin assembly is switched according to the distance, thus performing different test modes.

[0049] Reference Figures 1 to 4 The testing apparatus of the first aspect of this application achieves its testing function by having the spring pin module 200 contact the wire 410 inside the product 400. For testing the fine wire 410 inside the thin-walled product 400, a vision mechanism determines the condition of the wire 410. Simultaneously, with the assistance of the driving component 300 and the ranging component, combined with the first reset member 230 and the second reset member 240, the apparatus effectively addresses the issues of the product 400's outer casing curvature and the scattered test ends of the wire 410, minimizing damage to the product 400 and its appearance during testing. Specifically, the first reset member 230 and the second reset member 240 not only enable the spring pin assembly to have a reset function but also prevent damage to the wire 410 during testing. The first reset member 230 and the second reset member 240 can be springs.

[0050] In some embodiments of this application, the ranging component includes a laser rangefinder 211 and a distance sensing block 212. The distance sensing block 212 moves synchronously with the spring pin assembly. The laser rangefinder 211 is adapted to calculate the relative distance change between itself and the distance sensing block 212 to determine the current position of the spring pin assembly. It is understood that the spring pin module 200 slowly displaces along the X-axis under the drive of the driving component 300 until the spring pin assembly touches the outer shell of the product 400 and is subjected to an opposite external force in the X-axis direction. The spring pin assembly then displaces along the X-axis, increasing the distance between the distance sensing block 212 and the laser rangefinder 211. The sensor recognizes the distance change and records the current position, thereby avoiding the edge of the product 400 outer shell and performing further movement. Specifically, the laser rangefinder 211 is a laser rangefinder.

[0051] In some embodiments of this application, the spring pin assembly includes multiple spring pins 251 and a fixing block 252. The spring pins 251 have an S-shaped structure and are elastic, and each spring pin 251 is arranged in an orderly manner on the fixing block 252. It can be understood that the S-shaped structure of the spring pins 251 gives them a certain degree of elasticity, and they will return to their original structural shape after being decompressed. By utilizing this characteristic, multiple spring pins 251 are arranged in an orderly manner in the fixing copper block, and the spring pin assembly can effectively solve the problems of the curvature of the product 400 shell and the scattered test terminals of the wires 410.

[0052] In some embodiments of this application, the locking assembly includes a limiting pin 221 and a driving member 222. The driving member 222 drives the limiting pin 221 to have a first state of locking the spring pin assembly and a second state of being separated from the spring pin assembly. It is understood that the limiting pin 221 switches states under the drive of the driving member 222. When the limiting pin 221 extends, it prevents the spring pin assembly from moving in the X-axis direction, thereby achieving the switching of the test mode. Specifically, the driving member 222 can be a cylinder.

[0053] In some embodiments of this application, the spring needle module 200 includes a first slide rail 260 and a second slide rail 270. The second slide rail 270 is slidably disposed on the first slide rail 260, and the spring needle assembly is slidably disposed on the second slide rail 270, so that the spring needle assembly can move along a first direction or a second direction. Further, the driving component 300 includes a first driving component 310 and a second driving component 320, which are configured to cooperate. The first driving component 310 drives the spring needle module 200 to move along the first direction, and the second driving component 320 drives the spring needle module 200 to move along the second direction.

[0054] It is understood that the first slide rail 260 extends along a first direction, and the second slide rail 270 extends along a second direction. The driving component 300 can drive the spring pin assembly to move arbitrarily within the plane defined by the first slide rail 260 and the second slide rail 270. More specifically, the first direction is the X-axis direction, and the second direction is the Z-axis direction, facilitating the setting of the activity path and optimizing the control of the spring pin assembly's movement. It should be noted that the first driving component 310 and the second driving component 320 can be configured as commonly used lead screw and nut components, or cylinder slide rail and table components. Preferably, the first driving component 310 and the second driving component 320 are electrically powered linear modules, which can improve the accuracy of driving the spring pin assembly.

[0055] In some embodiments of this application, the testing apparatus further includes a carrier mechanism 110, which is mounted on a frame 100 and used to fix the product 400. The testing apparatus also includes a silicone needle testing module 140 and a probe testing module 150, both mounted on the frame 100. The silicone needle testing module 140, probe testing module 150, and spring needle module 200 operate according to information from a vision mechanism. It is understood that during testing, the product 400 is placed in the carrier mechanism 110 for fixation. After testing, each testing module returns to its position, the carrier mechanism 110 retracts, and the product 400 is removed. To enrich the testing functions of the apparatus, while the spring needle module 200 is testing, at least one of the probe testing module 150 or the silicone needle testing module 140 simultaneously performs corresponding tests on the corresponding test parts of the product 400, thereby improving production cycle time.

[0056] In some embodiments of this application, the vision mechanism includes an upper vision module 120 and a lower vision module 130. The upper vision module 120 is used to confirm the position information of the wire 410 inside the product 400 and feed it back to the silicone needle test module 140, the probe test module 150 and the spring needle module 200. The lower vision module 130 is used to cooperate with the spring needle module 200 to set and determine the relative positional relationship between the spring needle module 200 and the product 400. Understandably, the lower vision module 130 assists the testing of the spring pin module 200 to determine the specific position of the spring pin module 200, thereby improving control accuracy and minimizing damage to the product 400 and its appearance. The upper vision module 120 can determine the position information of the wire 410 inside the product 400 and upload this information to the control terminal. Based on this information, the control terminal further controls the silicone needle test module 140, the probe test module 150, and the spring pin module 200 to perform corresponding tests on the corresponding test parts of the product 400.

[0057] Reference Figures 1 to 4The test method of the second aspect of this application can be a method of using the test apparatus of the first aspect of this application. The test method includes the following steps:

[0058] Information about product 400 is captured by a vision device to determine the condition of the wires 410 inside product 400;

[0059] Let A be the length of the conductor 410 from one end to the other, and let C be the distance from the beginning of the conductor 410 to a specific location.

[0060] When C > A, the locking component locks the spring pin assembly, preventing the spring pin assembly from moving in the first direction. Based on the product 400 information captured by the vision mechanism, the driving component 300 drives the spring pin module 200 to test the wire 410.

[0061] When C≤A, the locking component releases the spring pin assembly, allowing the spring pin assembly to move along the first direction. Based on the product 400 information captured by the vision mechanism, the driving component 300 drives the spring pin module 200 to move to a position close to the product 400. The execution steps include:

[0062] The spring needle module 200 gradually approaches the edge of the outer shell of the product 400 from the inside out along the first direction until it makes contact. The contact causes the spring needle module 200 to retract and triggers the ranging component to record the distance change. The driving component 300 drives the spring needle module 200 to extend and reset along the first direction and retract a specific distance according to the distance change. Then, it drives the spring needle module 200 to move along the second direction and test the wire 410.

[0063] It should be noted that the specific positioning and testing workflow includes:

[0064] Product 400 is placed in carrier mechanism 110. After scanning the barcode on product 400, the start button is pressed. The lower vision module 130 confirms the position of spring pin module 200. Then, carrier mechanism 110 enters the test position. The upper vision module 120 captures an image to confirm the condition of the internal wire 410 of product 400. If the internal wire 410 of product 400 is far from the edge of the outer shell of product 400, i.e., C>A, test according to scheme one: the driving component 222 of spring pin module 200 is activated, and the limiting pin 221 extends accordingly, causing the spring pin assembly to... Unable to move along the X-axis direction of the first slide rail 260, the spring needle module 200 is sent to the test end of the wire 410 of the product 400 for testing through the first drive component 310 and the second drive component 320, based on the product 400 information captured by the upper vision module 120. At the same time, the probe test module 150 and the silicone needle test module 140 perform corresponding tests on the corresponding test parts of the product 400. After the test is completed, each test module returns to its position, the carrier mechanism 110 of the product 400 is withdrawn, and the product 400 is taken out.

[0065] If the upper vision module 120 captures an image confirming that the internal wire 410 of product 400 is close to the edge of the outer shell of product 400 (i.e., C≤A), then test using scheme two: the driving component 222 of the spring pin module 200 will not move, and the limiting pin 221 will not extend. After the spring pin module 200 is sent to a position at a certain distance from the edge of the outer shell of product 400 by the first driving component 310 and the second driving component 320, the first driving component 310 gradually moves the spring pin module 200 closer to the edge of the outer shell of product 400. When the sensor of the laser rangefinder detects a change in distance, the first driving component 310 stops moving, the sensor records the current position, and moves back 0.05mm. The second driving component 320 moves downward to make the spring pin module 200 perform a needle puncture test. At the same time, the probe test module 150 and the silicone needle test module 140 perform corresponding tests on the corresponding test parts of product 400. After the test is completed, each test module returns to its position, the carrier mechanism 110 of product 400 exits, and product 400 is removed.

[0066] Understandably, during testing, the second reset component 240 and the second slide rail 270 allow the spring pin 251 to move in the Z-axis direction after contacting the test end of the lead wire 410 of the product 400. The second reset component 240 prevents damage to the product 400 during the downward movement of the spring pin module 200. After the test is completed, the first drive component 310 and the second drive component 320 return to their positions in an orderly manner, and the first reset component 230 and the second reset component 240 return the spring pin 251 module to its initial position.

[0067] Reference Figures 1 to 4 The production line of the third aspect of this application can be a production line for testing the wires 410 of product 400. The production line includes the testing device of the first aspect of this application, which can be applied to the testing of the fine wires 410 inside the thin-walled product 400. It can effectively solve the problems of the curvature of the product 400 shell and the scattered test ends of the wires 410 encountered during testing, minimize damage to the product 400 and its appearance, and ensure the testing quality and efficiency of the production line.

[0068] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0069] The embodiments of this application have been described in detail above with reference to the accompanying drawings. However, this application is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of this application.

Claims

1. A testing device for detecting internal wires in a product, characterized in that, include: frame; A vision mechanism, mounted on the frame, is used to determine the position information of the wire; A testing mechanism, mounted on the frame, includes a driving component and a spring pin module. The driving component drives the spring pin module to move along a first direction or a second direction. The spring pin module includes a ranging component, a locking component, a first reset component, a second reset component, and a spring pin assembly. The spring pin assembly is movably disposed. The locking component is used to limit the spring pin assembly to a preset position in the first direction. The first reset component acts on the spring pin assembly to make the spring pin assembly have a tendency to extend and reset along the first direction. The second reset component acts on the spring pin assembly to make the spring pin assembly have a tendency to extend along the second direction. The locking component performs a locking or unlocking action on the spring pin assembly based on the position information determined by the vision mechanism. When the locking component unlocks the spring pin assembly, the spring pin module gradually approaches the edge of the product's outer shell from the inside to the outside along the first direction until it makes contact. The contact causes the spring pin module to retract and triggers the ranging component to record the distance change. The driving component drives the spring pin module to extend and reset along the first direction and retract a specific distance according to the distance change.

2. The testing apparatus according to claim 1, characterized in that: The ranging component includes a laser rangefinder and a distance sensor block. The distance sensor block moves synchronously with the spring pin assembly. The laser rangefinder is adapted to calculate the relative distance change between itself and the distance sensor block to determine the current position of the spring pin assembly.

3. The testing apparatus according to claim 1 or 2, characterized in that: The spring pin assembly includes multiple spring pins and a fixing block. The spring pins have an S-shaped structure and are elastic. The spring pins are arranged in an orderly manner on the fixing block.

4. The testing apparatus according to claim 1, characterized in that: The locking assembly includes a limiting pin and a driving member. The driving member is used to drive the limiting pin so that the limiting pin has a first state of locking the spring pin assembly and a second state of being relatively separated from the spring pin assembly.

5. The testing apparatus according to claim 1, characterized in that: The spring pin module includes a first slide rail and a second slide rail. The second slide rail is slidably disposed on the first slide rail, and the spring pin assembly is slidably disposed on the second slide rail, so that the spring pin assembly can move along the first direction or the second direction.

6. The testing apparatus according to claim 1 or 5, characterized in that: The driving component includes a first driving component and a second driving component, which are configured to cooperate with each other. The first driving component is used to drive the spring needle module to move along the first direction, and the second driving component is used to drive the spring needle module to move along the second direction.

7. The testing apparatus according to claim 1, characterized in that: The testing apparatus also includes: A carrier mechanism is mounted on the frame and is used to fix the product. The testing mechanism also includes a silicone needle testing module and a probe testing module, which are mounted on the frame. The silicone needle testing module, the probe testing module, and the spring needle module operate according to the information from the vision mechanism.

8. The testing apparatus according to claim 7, characterized in that: The vision mechanism includes an upper vision module and a lower vision module. The upper vision module is used to confirm the position information of the wires inside the product and feed it back to the silicone needle test module, the probe test module and the spring needle module. The lower vision module is used to cooperate with the spring needle module to set and determine the relative positional relationship between the spring needle module and the product.

9. A testing method, characterized in that, Using the testing apparatus as described in any one of claims 1 to 8, the steps include: Product information is captured using a vision system to determine the internal wiring configuration of the product; Let A be the length of the conductor from its beginning to its end, and C be the distance from the beginning of the conductor to a specific location. When C > A, the locking component locks the spring pin assembly, preventing the spring pin assembly from moving in the first direction. Based on the product information captured by the vision mechanism, the driving component drives the spring pin module to test the wire. When C≤A, the locking component releases the spring pin assembly, making the spring pin assembly suitable for movement along the first direction. Based on the product information captured by the vision mechanism, the driving component drives the spring pin module to move to a position close to the product. Then, the spring pin module gradually approaches the edge of the product's outer shell from the inside to the outside along the first direction until it makes contact. Contact causes the spring pin module to retract and triggers the ranging component to record the distance change. Based on the distance change, the driving component drives the spring pin module to extend and reset along the first direction and retract a specific distance. Subsequently, it drives the spring pin module to move along the second direction and test the wire.

10. A production line, characterized in that, include: The testing apparatus as described in any one of claims 1 to 8.

Images