硬件测试方法、装置、电子设备和计算机可读存储介质
By defining the test items for hardware devices, calling test cases, and modifying the values of static global variables, the problems of cumbersome steps and low efficiency caused by manual operation in hardware testing are solved, and the effect of automated testing is achieved.
CN116872251BActive Publication Date: 2026-07-17SHANGHAI JIEKA ROBOT TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI JIEKA ROBOT TECH CO LTD
- Filing Date
- 2023-06-27
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
In existing technologies, hardware testing requires manual operation, which results in cumbersome steps and low efficiency.
Method used
By defining the test items for the hardware devices, calling the test cases, modifying the values of static global variables in the memory space, and obtaining the test results based on the target test data and the expected result data, automated testing is achieved.
Benefits of technology
It automates hardware testing, improves testing efficiency, and reduces tedious manual operations.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN116872251B_ABST
Abstract
本发明公开了一种硬件测试方法、装置、电子设备和计算机可读存储介质其中，该方法包括：确定与硬件设备对应的测试项目；调用在测试项目下的测试用例，其中，测试用例包括静态全局变量名，目标静态全局变量值，以及预期测试结果数据；执行测试用例，依据静态全局变量名，确定存储有初始静态全局变量值的内存空间；修改内存空间中的初始静态全局变量值至目标静态全局变量值，确定硬件设备的目标测试数据；依据目标测试数据与预期测试结果数据，得到测试项目的测试结果。本发明解决了相关技术中对硬件设备进行测试时，需要手工操作，导致的步骤繁琐，效率低的技术问题。
Need to check novelty before this filing date? Find Prior Art