Strain detection circuit, method, robot, and computer-readable storage medium

Abstract

The embodiment of the application provides a kind of strain detection circuit, method, robot and computer readable storage medium, belong to robot technical field.The circuit includes power module, strain sensing module and detection module, strain sensing module includes elastomer and the Wheatstone bridge consisting of multiple strain gauges, each strain gauge is bonded on elastomer;Power module is connected with the input end of Wheatstone bridge, for providing excitation voltage to strain sensing module;Detection module is connected with the detection end of Wheatstone bridge, for when the force applied to elastomer causes each strain gauge to produce strain, obtains sampling voltage from detection end, determines the size of force according to sampling voltage.Using strain gauge type force sensor combined with Wheatstone bridge structure, can improve force detection effect, improve control performance.

Description

Technical Field

[0001] This application relates to the field of robotics, and more particularly to a strain detection circuit, method, robot, and computer-readable storage medium. Background Technology

[0002] In existing technologies, pressure and tension need to be detected at the load-bearing ends of robot joints to enhance the robot's perception and interaction performance, enabling more accurate measurement and reflection of external conditions, and improving the robot's operational and safety performance. The detection of force at the robot's knee position is particularly important, as the ability to achieve elastic control during the robot's walking, jumping, and landing processes is crucial. However, existing technologies suffer from relatively poor performance in detecting joint tension and pressure in robots. Summary of the Invention

[0003] To address the aforementioned technical problems, embodiments of this application provide a strain detection circuit, method, robot, and computer-readable storage medium.

[0004] In a first aspect, embodiments of this application provide a strain detection circuit, the circuit comprising:

[0005] The power module, strain sensing module and detection module are provided. The strain sensing module includes an elastomer and a Wheatstone bridge composed of multiple strain gauges, with each strain gauge bonded to the elastomer.

[0006] The power module is connected to the input terminal of the Wheatstone bridge and is used to provide excitation voltage to the strain sensing module.

[0007] The detection module is connected to the detection end of the Wheatstone bridge and is used to obtain a sampling voltage from the detection end when the force applied to the elastic body causes strain in each of the strain gauges, and to determine the magnitude of the force based on the sampling voltage.

[0008] In one embodiment, the detection circuit includes a conditioning submodule and a microcontroller. The input terminal of the conditioning submodule is connected to the output terminal of the Wheatstone bridge. The conditioning submodule is used to amplify the sampled voltage to obtain an amplified voltage.

[0009] The microcontroller is connected to the output of the conditioning submodule and is used to determine the magnitude of the force based on the amplified voltage.

[0010] In one embodiment, the detection circuit further includes:

[0011] The compensation submodule, connected to the compensation terminal of the conditioning submodule, is used to provide compensation voltage to the Wheatstone bridge through the compensation terminal of the conditioning submodule.

[0012] In one embodiment, the Wheatstone bridge comprises a first strain gauge, a second strain gauge, a third strain gauge, and a fourth strain gauge.

[0013] The first end of the first strain gauge and the first end of the second strain gauge are connected at the first node;

[0014] The second end of the first strain gauge is connected to the first end of the third strain gauge at the second node;

[0015] The second end of the second strain gauge is connected to the first end of the fourth strain gauge at the third node;

[0016] The second end of the third strain gauge is grounded to the second end of the fourth strain gauge;

[0017] Wherein, the first node is the input terminal of the Wheatstone bridge, and the second and third nodes are the detection terminals of the Wheatstone bridge.

[0018] In one embodiment, the power module includes: a first power supply, a second power supply, a first amplifier, a first resistor, a second resistor, a third resistor, and a transistor;

[0019] The positive input terminal of the first amplifier is connected to the positive terminal of the second power supply, the negative input terminal of the first amplifier is connected to the first terminal of the second resistor and the first terminal of the third resistor, and the output terminal of the first amplifier is connected to the second terminal of the third resistor and the base of the transistor.

[0020] The collector of the transistor is connected to the positive terminal of the first power supply through the first resistor;

[0021] The negative terminal of the first power supply, the negative terminal of the second power supply, and the second terminal of the second resistor R6 are respectively grounded;

[0022] The emitter of the transistor is connected to the first node.

[0023] In one embodiment, the conditioning submodule includes a second amplifier, a third amplifier, a fourth amplifier, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, and a tenth resistor;

[0024] The positive input terminal of the second amplifier is connected to the second node, and the positive input terminal of the second amplifier is connected to the first terminal of the fourth resistor and the first terminal of the tenth resistor, respectively; the output terminal of the second amplifier is connected to the second terminal of the fourth resistor and the first terminal of the sixth resistor, respectively.

[0025] The positive input terminal of the third amplifier is connected to the third node, the negative input terminal of the third amplifier is connected to the second terminal of the tenth resistor and the first terminal of the fifth resistor, and the output terminal of the third amplifier is connected to the second terminal of the fifth resistor and the first terminal of the eighth resistor.

[0026] The positive input terminal of the fourth amplifier is connected to the second terminal of the sixth resistor and the first terminal of the seventh resistor, respectively; the negative input terminal of the fourth amplifier is connected to the second terminal of the eighth resistor and the first terminal of the ninth resistor, respectively; and the output terminal of the fourth amplifier is connected to the second terminal of the ninth resistor and the microcontroller, respectively.

[0027] The second end of the seventh resistor is the compensation end of the conditioning submodule.

[0028] In one embodiment, the compensation submodule includes: a fifth amplifier, a third power supply, an eleventh resistor, a twelfth resistor, a thirteenth resistor, and a capacitor;

[0029] The positive input terminal of the fifth amplifier is connected to the first terminal of the eleventh resistor, the first terminal of the twelfth resistor, the first terminal of the capacitor, and the first terminal of the thirteenth resistor, respectively.

[0030] The negative input terminal and output terminal of the fifth amplifier are respectively connected to the second terminal of the seventh resistor;

[0031] The second terminal of the twelfth resistor, the second terminal of the capacitor, and the negative terminal of the third power supply are respectively grounded;

[0032] The second end of the eleventh resistor is used to input a preset voltage, and the first end of the thirteenth resistor and the positive terminal of the power supply are respectively connected to the digital-to-analog converter interface of the microcontroller.

[0033] Secondly, embodiments of this application provide a strain detection method applied to the strain detection circuit provided in the first aspect, the method comprising:

[0034] The power supply module provides excitation voltage to the strain sensing module;

[0035] When a force applied to the elastic body causes strain in each strain gauge, the detection module acquires a sampling voltage from the detection terminal and determines the magnitude of the force based on the sampling voltage. Thirdly, embodiments of this application provide a robot including the strain detection circuit provided in the first aspect.

[0036] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program that, when run on a processor, executes the strain detection method provided in the first aspect.

[0037] The strain detection circuit, method, robot, and computer-readable storage medium provided in this application include a power supply module, a strain sensing module, and a detection module. The strain sensing module includes an elastic body and a Wheatstone bridge composed of multiple strain gauges, each strain gauge being bonded to the elastic body. The power supply module is connected to the input terminal of the Wheatstone bridge and provides an excitation voltage to the strain sensing module. The detection module is connected to the detection terminal of the Wheatstone bridge and, when a force applied to the elastic body causes strain in each strain gauge, obtains a sampling voltage from the detection terminal and determines the magnitude of the force based on the sampling voltage. Using a strain gauge force sensor combined with a Wheatstone bridge structure can improve the force detection effect and control performance. Attached Figure Description

[0038] To more clearly illustrate the technical solutions of this application, the accompanying drawings used in the embodiments will be briefly described below. It should be understood that the following drawings only show some embodiments of this application and should not be considered as a limitation on the scope of protection of this application. In the various drawings, similar components are numbered similarly.

[0039] Figure 1 A schematic diagram of the strain detection circuit provided in an embodiment of this application is shown;

[0040] Figure 2 This paper illustrates a schematic diagram showing the positional relationship between the elastomer and the strain gauge provided in an embodiment of this application.

[0041] Figure 3 Another structural schematic diagram of the strain detection circuit provided in an embodiment of this application is shown;

[0042] Figure 4 Another structural schematic diagram of the strain detection circuit provided in an embodiment of this application is shown;

[0043] Figure 5 Another structural schematic diagram of the strain detection circuit provided in an embodiment of this application is shown;

[0044] Figure 6 Another structural schematic diagram of the strain detection circuit provided in an embodiment of this application is shown;

[0045] Figure 7 A schematic flowchart of the strain detection method provided in an embodiment of this application is shown.

[0046] Icons: 100-Strain detection circuit, 101-Power supply module, 102-Strain sensing module, 103-Detection module, 200-Elastomer, 1031-Conditioning submodule, 1032-Compensation submodule, 1033-Microcontroller. Detailed Implementation

[0047] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.

[0048] The components of the embodiments of this application described and illustrated in the accompanying drawings can be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of this application provided in the drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0049] In the following, the terms “comprising,” “having,” and their cognates, which may be used in various embodiments of this application, are intended only to indicate a particular feature, number, step, operation, element, component, or combination thereof, and should not be construed as excluding, firstly, the presence of one or more other features, numbers, steps, operations, elements, components, or combinations thereof, or adding the possibility of one or more features, numbers, steps, operations, elements, components, or combinations thereof.

[0050] Furthermore, the terms "first," "second," and "third" are used only to distinguish descriptions and should not be interpreted as indicating or implying relative importance.

[0051] Unless otherwise specified, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of this application pertain. Terms (such as those defined in commonly used dictionaries) shall be interpreted as having the same meaning as in their contextual meaning in the relevant technical field and shall not be construed as having an idealized or overly formal meaning, unless clearly defined in the various embodiments of this application.

[0052] In existing technologies, tension and compression sensors are applied to the end effectors of robot joints. The load-bearing ends of robot joints need to detect pressure and tension to enhance the robot's perception and interaction performance, enabling more accurate measurement and reflection of external conditions, thus improving robot maneuverability and safety. The accuracy of tension detection affects the robot's performance in perceiving and interacting with its environment, especially the detection of force at the knee position. The ability to achieve elastic control during the robot's walking, jumping, and landing is crucial. Firstly, when high force output is required, it's necessary to know whether the force meets control requirements; secondly, the impact force upon landing is significant, and failure to detect and flexibly control it in time can cause joint damage.

[0053] Example 1

[0054] This application provides a strain detection circuit.

[0055] See Figure 1 The strain detection circuit includes 100: a power supply module 101, a strain sensing module 102, and a detection module 103. In this embodiment, the strain sensing module 102 includes an elastic body ( Figure 1 (not shown in the image) and composed of multiple strain gauges ( Figure 1 A Wheatstone bridge (not shown) is formed, and each of the strain gauges is bonded to the elastomer.

[0056] The power supply module 101 is connected to the input terminal of the Wheatstone bridge and is used to provide excitation voltage to the strain sensing module 102. The detection module 103 is connected to the detection terminal of the Wheatstone bridge and is used to obtain a sampling voltage from the detection terminal when the force applied to the elastic body causes strain in each strain gauge, and determine the magnitude of the force based on the sampling voltage.

[0057] It should be noted that multiple strain gauges can be used, up to four strain gauges. See [link / reference] Figure 2 The first strain gauge R1, the second strain gauge R2, the third strain gauge R3 and the fourth strain gauge R4 are respectively attached to the elastomer 200.

[0058] In this design, the elastic body 200 serves as the force sensor / bearing body for the strain gauge, and the measured force is applied to it. The elastic body 200 deforms, generating strain on its surface. The function of the elastic body 200 is to convert the applied force into strain as linearly and repeatably as possible. The actual measuring component is the strain gauge, with the measuring grid wire attached to the substrate. The strain gauge is then bonded to appropriate points on the elastic body. Four strain gauges are used: the first strain gauge R1 and the third strain gauge R3 are positioned opposite each other on both sides of the elastic body 200, while the second strain gauge R2 and the fourth strain gauge R4 are positioned on both sides of the elastic body 200. Under the applied force as shown in the figure, the first strain gauge R1 and the third strain gauge R3 are stretched, while the second strain gauge R2 and the fourth strain gauge R4 are compressed. The four strain gauges can form a Wheatstone bridge.

[0059] It should be further explained that the power module provides excitation voltage to the Wheatstone bridge for relevant measurements. When the first strain gauge R1 and the third strain gauge R3 are stretched, and the second strain gauge R2 and the fourth strain gauge R4 experience different resistances—that is, when the resistance of the strain gauges changes due to strain—an output voltage is generated. The output signal depends on the resistance change of the strain gauges and directly reflects the magnitude of the applied force.

[0060] See Figure 3The Wheatstone bridge 1021 includes a first strain gauge R1, a second strain gauge R2, a third strain gauge R3, and a fourth strain gauge R4. The first end of the first strain gauge R1 and the first end of the second strain gauge R2 are connected to a first node; the second end of the first strain gauge R1 and the first end of the third strain gauge R3 are connected to a second node; the second end of the second strain gauge R2 and the first end of the fourth strain gauge R4 are connected to a third node; the second end of the third strain gauge R3 and the second end of the fourth strain gauge R4 are grounded; wherein, the first node is the input terminal of the Wheatstone bridge 1021, and the second and third nodes are the detection terminals of the Wheatstone bridge 1021.

[0061] Assuming the excitation voltage received by the first node is denoted by Vcc, the node voltage of the second node is Vp, and the node voltage of the third node is Vn, then Figure 3 The Wheatstone bridge shown satisfies the following formulas 1 and 2:

[0062] Formula 1:

[0063] Formula 2:

[0064] Based on Formulas 1 and 2, it can be deduced that the voltage Vo at the detection terminal of the Wheatstone bridge satisfies the following Formula 3.

[0065] Formula 3:

[0066] Under initial conditions, R1=R2=R3=R4=R, and under stress, the following formula 4 is satisfied;

[0067] Formula 4:

[0068] Since the strain resistance ΔR of the strain gauge is much smaller than R, after removing the term containing R from Equation 4, the above equation can be simplified to the following Equation 5:

[0069] Formula 5:

[0070] In this embodiment, the magnitude of the corresponding force can be determined by detecting the voltage at the detection terminal of the Wheatstone bridge.

[0071] It should be noted that due to the consistency of the strain gauge manufacturing process, it is impossible to guarantee that the strain gauge characteristics are completely consistent. However, the Wheatstone bridge circuit can achieve precise output through a compensation submodule, compensating for linearity errors. Furthermore, increases or decreases in ambient temperature cause changes in the strain gauge characteristics, and the bridge circuit can compensate for zero-point variations, achieving high-precision output. Therefore, even with temperature changes, there will be no significant strain generation. Temperature will cause the strain signals (i.e., resistance) of the first, second, third, and fourth strain gauges to change in the same direction and degree. Because two positive strains and two negative strains are included in the equation for the first, second, third, and fourth strain gauges, temperature will not generate an output signal.

[0072] In addition, strain gauges require temperature-dependent sensitivity compensation. When temperature changes, the E-modulus of the strain gauge material decreases, leading to strain. Furthermore, the sensitivity of the strain gauge is temperature-dependent. At high temperatures, the change in resistance of the strain gauge will generate a larger voltage drop, which will reduce the output signal of the Wheatstone bridge. Under load, the linearity error of the strain gauge will also change. This can be addressed by optimizing the elastomer material and structure, and by selecting precise measurement points.

[0073] See Figure 4 The detection module 103 includes a conditioning submodule 1031 and a microcontroller 1033. The input terminal of the conditioning submodule 1031 is connected to the Wheatstone bridge. Figure 3 The conditioning submodule 1031 (not shown) is connected to the output terminal of the sampled voltage to obtain an amplified voltage.

[0074] The microcontroller 1032 is connected to the output terminal of the conditioning submodule 1031 and is used to determine the magnitude of the force based on the amplified voltage.

[0075] In this way, the conditioning submodule can amplify the weak voltage signal output from the Wheatstone bridge, and the amplified voltage is sent to the microcontroller (MCU) for voltage signal measurement via an analog-to-digital converter (VADC). The VADC can also perform voltage signal measurement and conversion via an analog-to-digital converter (ADC).

[0076] Please see again Figure 4 The detection module 103 further includes a compensation submodule 1032, connected to the compensation terminal of the conditioning submodule 1031, for transmitting signals to the Wheatstone bridge via the compensation terminal of the conditioning submodule 1031. Figure 3 (Not shown) provides compensation voltage.

[0077] In this embodiment, the compensation submodule is used to measure the VADC voltage in the initial state after the strain detection circuit is powered on and before the strain detection module is subjected to force. When the output voltage of the Wheatstone bridge is 0, the VADC voltage should be the same as the voltage VREF at the second terminal of the seventh resistor R11. If the initial VADC voltage is not the same as the voltage VREF at the second terminal of the seventh resistor R11, a compensation voltage can be output through the digital-to-analog converter interface (DAC) of the MCU to make the VADC voltage the same as the voltage VREF at the second terminal of the seventh resistor R11. The compensation voltage can compensate for the imbalance of the Wheatstone bridge and improve the measurement accuracy of the force sensor.

[0078] In this embodiment, an excitation voltage can be provided to the Wheatstone bridge via a voltage module. For example, the smaller voltage can be amplified by connecting a power supply that provides a smaller voltage to the amplifier, and then the amplified voltage can be used as the excitation voltage.

[0079] Please see Figure 5 The power module 101 includes: a first power supply V1, a second power supply V2, a first amplifier U1, a first resistor R5, a second resistor R6, a third resistor R7, and a transistor Q1. The positive input terminal of the first amplifier U1 is connected to the positive terminal of the second power supply V2. The negative input terminal of the first amplifier U1 is connected to the first terminal of the second resistor R6 and the first terminal of the third resistor R7. The output terminal of the first amplifier U1 is connected to the second terminal of the third resistor R7 and the base of the transistor Q1. The collector of the transistor Q1 is connected to the positive terminal of the first power supply V1 through the first resistor R5. The negative terminals of the first power supply V1, the second power supply V2, and the second terminal of the second resistor R6 are grounded. The emitter of the transistor Q1 is connected to the first junction.

[0080] Thus, after Figure 5 The power supply module 101 shown can amplify both voltage and current. Using the first operational amplifier U1, it can amplify the 3.0V voltage to 10.7V. Then, the output current is amplified by transistor Q1 and input to the input of the Wheatstone bridge, enabling the Wheatstone bridge input to receive the excitation voltage VCC_10V0. By amplifying both the voltage and current of the power supply, the problem of insufficient driving capability of the Wheatstone bridge circuit is solved.

[0081] See Figure 6The conditioning submodule 1031 includes a second amplifier U3, a third amplifier U4, a fourth amplifier U5, a fourth resistor R8, a fifth resistor R9, a sixth resistor R10, a seventh resistor R11, an eighth resistor R12, a ninth resistor R13, and a tenth resistor R14. The positive input terminal of the second amplifier U3 is connected to the second node, and the positive input terminal of the second amplifier U3 is connected to the first terminal of the fourth resistor R8 and the first terminal of the tenth resistor R14, respectively. The output terminal of the second amplifier U3 is connected to the second terminal of the fourth resistor R8 and the first terminal of the sixth resistor R10, respectively.

[0082] The positive input terminal of the third amplifier U4 is connected to the third node, the negative input terminal of the third amplifier U4 is connected to the second terminal of the tenth resistor R14 and the first terminal of the fifth resistor R9, and the output terminal of the third amplifier U4 is connected to the second terminal of the fifth resistor R9 and the first terminal of the eighth resistor R12.

[0083] The positive input terminal of the fourth amplifier U5 is connected to the second terminal of the sixth resistor R10 and the first terminal of the seventh resistor R11, respectively; the negative input terminal of the fourth amplifier U5 is connected to the second terminal of the eighth resistor R12 and the first terminal of the ninth resistor R13, respectively; and the output terminal of the fourth amplifier U5 is connected to the second terminal of the ninth resistor R13 and the microcontroller, respectively. The second terminal of the seventh resistor R11 is the compensation terminal of the conditioning submodule.

[0084] In this embodiment, the conditioning submodule amplifies the weak signal output from the Wheatstone bridge. The amplification factor of the conditioning submodule is Gain = 49.4kJ / Rg, where Rg is the resistance value of the tenth resistor R14. The amplified voltage is sent to the microcontroller via a VADC for voltage signal measurement. The VADC can also perform signal measurement and conversion via an ADC analog-to-digital converter chip. The conditioning submodule amplifies the weak signal from the Wheatstone bridge, achieving high-precision and high-linearity detection, and improving the accuracy of force detection.

[0085] The amplified voltage can be calculated using the following formula 6:

[0086] Formula 6: Vadc = (Vp - Vn) × Ggain, where Vadc represents the amplified voltage.

[0087] The magnification can be calculated using the following formula 7:

[0088] Formula 7: Gain = 1 + (2 × R⁸ / Rg)

[0089] Where Gain is the amplification factor, Rg is the resistance value of the tenth resistor R14, and R8 is the fourth resistor R8.

[0090] Please see again Figure 6 The compensation submodule 1032 includes: a fifth amplifier U6, a third power supply, an eleventh resistor R16, a twelfth resistor R17, a thirteenth resistor R18, and a capacitor C1. The positive input terminal of the fifth amplifier U6 is connected to the first terminals of the eleventh resistor R16, the twelfth resistor R17, the capacitor C1, and the thirteenth resistor R18, respectively. The negative input terminal and output terminal of the fifth amplifier U6 are connected to the second terminal of the seventh resistor R11, respectively. The second terminals of the twelfth resistor R17, the capacitor C1, and the negative terminal of the third power supply are grounded. The second terminal of the eleventh resistor R16 is used to input a preset voltage, and the first terminal of the thirteenth resistor R18 and the positive terminal of the power supply are connected to the digital-to-analog converter interface of the microcontroller.

[0091] As an example, when the output voltage of the balanced Wheatstone bridge is 0, VADC should be VREF, for example, 1.5V. If the initial state is not 1.5V, a compensation voltage can be output through the MCU's DAC to bring the VADC output voltage back to 1.5V. This compensation voltage can compensate for the imbalance of the Wheatstone bridge, improving the measurement accuracy of the force sensor. The eleventh resistor R16 and the twelfth resistor R17 can be adjusted according to the actual circuit or sensor characteristics. The amplification factor Rg can also be adjusted according to the actual sensor characteristics to obtain a wider detectable voltage range and increase the circuit's measurement resolution. The compensation submodule circuit solves the measurement deviation problem caused by the imbalance of the Wheatstone bridge circuit, improving the accuracy of force detection.

[0092] It should be noted that, Figure 6 The values ​​of each component can be set as needed. In one embodiment, the following settings can be used: the first power supply V1 is 3V, the second power supply V2 is 12Vdc, and the resistance values ​​of the first strain gauge R1, the second strain gauge R2, the third strain gauge R3, and the fourth strain gauge R4 are all 700Ω. The resistance value of the first resistor R5 is 100Ω, the resistance value of the second resistor R6 is 39KΩ, and the resistance value of the third resistor R7 is 100KΩ. The resistance value of the fourth resistor R8 is 50KΩ, the resistance value of the fifth resistor R9 is 50KΩ, the resistance value of the sixth resistor R10 is 150KΩ, the resistance value of the seventh resistor R11 is 150KΩ, the resistance value of the eighth resistor R12 is 150KΩ, the resistance value of the ninth resistor R13 is 150KΩ, and the resistance value of the tenth resistor R14 is 10KΩ. The eleventh resistor R16 has a resistance of 10KΩ, the twelfth resistor R17 has a resistance of 10KΩ, the thirteenth resistor R18 has a resistance of 10KΩ, and the capacitor C1 is 100nΩ.

[0093] This embodiment provides a strain detection circuit, method, robot, and computer-readable storage medium. The circuit includes a power supply module, a strain sensing module, and a detection module. The strain sensing module includes an elastic body and a Wheatstone bridge composed of multiple strain gauges, each strain gauge being bonded to the elastic body. The power supply module is connected to the input terminal of the Wheatstone bridge and provides an excitation voltage to the strain sensing module. The detection module is connected to the detection terminal of the Wheatstone bridge and, when a force applied to the elastic body causes strain in each strain gauge, obtains a sampling voltage from the detection terminal and determines the magnitude of the force based on the sampling voltage. Using a strain gauge force sensor combined with a Wheatstone bridge structure can improve the force detection effect and control performance.

[0094] Example 2

[0095] Furthermore, this application provides a strain detection method applied to the strain detection circuit provided in Embodiment 1.

[0096] Step S701: The power supply module provides an excitation voltage to the strain sensing module.

[0097] Step S702: When the force applied to the elastic body causes strain in each strain gauge, the detection module obtains the sampling voltage from the detection end and determines the magnitude of the force based on the sampling voltage.

[0098] In one embodiment, the strain detection method further includes:

[0099] The conditioning submodule amplifies the sampled voltage to obtain an amplified voltage;

[0100] The microcontroller determines the magnitude of the force based on the amplified voltage.

[0101] In one embodiment, the strain detection method further includes:

[0102] The compensation submodule provides compensation voltage to the Wheatstone bridge through the compensation terminal of the conditioning submodule.

[0103] The strain detection method provided in this embodiment can achieve the function of the strain detection device provided in Embodiment 1. To avoid repetition, it will not be described again here.

[0104] The strain detection method provided in this embodiment uses a strain gauge force sensor combined with a Wheatstone bridge structure, which can improve the force detection effect and control performance.

[0105] Example 3

[0106] Furthermore, this application provides a robot that includes the strain detection circuit provided in embodiment 1.

[0107] The robot provided in this embodiment can realize the corresponding functions of the strain detection circuit provided in Embodiment 1. The strain detection circuit can be installed at the load end of the robot joint or at other locations. To avoid repetition, it will not be described again here.

[0108] The robot provided in this embodiment uses strain gauge force sensors combined with a Wheatstone bridge structure, which improves force detection, control performance, and the robot's perception and interaction capabilities. It can more accurately measure and reflect external conditions, thus enhancing the robot's operational and safety performance. During the robot's walking, jumping, and landing processes, elastic control is implemented. When the impact force is large upon landing, it is detected promptly and flexibly controlled to prevent joint damage.

[0109] Example 4

[0110] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the strain detection method provided in Embodiment 2.

[0111] In this embodiment, the computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc.

[0112] The computer-readable storage medium provided in this embodiment can implement the strain detection method provided in Embodiment 1. To avoid repetition, it will not be described again here.

[0113] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or terminal. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or terminal that includes that element.

[0114] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0115] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

Claims

1. A strain detection circuit, characterized by, include: The power supply module, strain sensing module, and detection module are provided. The strain sensing module includes an elastomer and a Wheatstone bridge composed of multiple strain gauges. Each strain gauge is bonded to the elastomer. The Wheatstone bridge is composed of four strain gauges. The first and third strain gauges are disposed opposite to each other on both sides of the elastomer, and the second and fourth strain gauges are disposed on both sides of the elastomer. The power module is connected to the input terminal of the Wheatstone bridge and is used to provide excitation voltage to the strain sensing module. The detection module is connected to the detection end of the Wheatstone bridge and is used to obtain a sampling voltage from the detection end when the force applied to the elastic body causes strain in each of the strain gauges, and to determine the magnitude of the force based on the sampling voltage. The power supply module includes: a first power supply, a second power supply, a first amplifier, a first resistor, a second resistor, a third resistor, and a transistor; the positive input terminal of the first amplifier is connected to the positive terminal of the second power supply, the negative input terminal of the first amplifier is connected to the first terminal of the second resistor and the first terminal of the third resistor, and the output terminal of the first amplifier is connected to the second terminal of the third resistor and the base of the transistor; the collector of the transistor is connected to the positive terminal of the first power supply through the first resistor; the negative terminals of the first power supply, the second power supply, and the second terminal of the second resistor are grounded; and the emitter of the transistor is connected to the input terminal of the Wheatstone bridge.

2. The strain detection circuit of claim 1, wherein, The detection circuit includes a conditioning submodule and a microcontroller. The input terminal of the conditioning submodule is connected to the output terminal of the Wheatstone bridge. The conditioning submodule is used to amplify the sampled voltage to obtain an amplified voltage. The microcontroller is connected to the output of the conditioning submodule and is used to determine the magnitude of the force based on the amplified voltage.

3. The strain detection circuit of claim 2, wherein, The detection circuit further includes: The compensation submodule, connected to the compensation terminal of the conditioning submodule, is used to provide compensation voltage to the Wheatstone bridge through the compensation terminal of the conditioning submodule.

4. The strain detection circuit of claim 3, wherein, The Wheatstone bridge is composed of a first strain gauge, a second strain gauge, a third strain gauge, and a fourth strain gauge. The first end of the first strain gauge and the first end of the second strain gauge are connected at the first node; The second end of the first strain gauge is connected to the first end of the third strain gauge at the second node; The second end of the second strain gauge is connected to the first end of the fourth strain gauge at the third node; The second end of the third strain gauge is grounded to the second end of the fourth strain gauge; Wherein, the first node is the input terminal of the Wheatstone bridge, and the second and third nodes are the detection terminals of the Wheatstone bridge.

5. The strain detection circuit of claim 4, wherein, The conditioning submodule includes a second amplifier, a third amplifier, a fourth amplifier, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, a ninth resistor, and a tenth resistor; The positive input terminal of the second amplifier is connected to the second node, and the positive input terminal of the second amplifier is connected to the first terminal of the fourth resistor and the first terminal of the tenth resistor, respectively; the output terminal of the second amplifier is connected to the second terminal of the fourth resistor and the first terminal of the sixth resistor, respectively. The positive input terminal of the third amplifier is connected to the third node, the negative input terminal of the third amplifier is connected to the second terminal of the tenth resistor and the first terminal of the fifth resistor, and the output terminal of the third amplifier is connected to the second terminal of the fifth resistor and the first terminal of the eighth resistor. The positive input terminal of the fourth amplifier is connected to the second terminal of the sixth resistor and the first terminal of the seventh resistor, respectively; the negative input terminal of the fourth amplifier is connected to the second terminal of the eighth resistor and the first terminal of the ninth resistor, respectively; and the output terminal of the fourth amplifier is connected to the second terminal of the ninth resistor and the microcontroller, respectively. The second end of the seventh resistor is the compensation end of the conditioning submodule.

6. The strain detection circuit of claim 5, wherein, The compensation submodule includes: a fifth amplifier, a third power supply, an eleventh resistor, a twelfth resistor, a thirteenth resistor, and a capacitor; The positive input terminal of the fifth amplifier is connected to the first terminal of the eleventh resistor, the first terminal of the twelfth resistor, the first terminal of the capacitor, and the first terminal of the thirteenth resistor, respectively. The negative input terminal and output terminal of the fifth amplifier are respectively connected to the second terminal of the seventh resistor; The second terminal of the twelfth resistor, the second terminal of the capacitor, and the negative terminal of the third power supply are respectively grounded; The second end of the eleventh resistor is used to input a preset voltage, and the first end of the thirteenth resistor and the positive terminal of the power supply are respectively connected to the digital-to-analog converter interface of the microcontroller.

7. A strain detection method characterized by, The method, applied to the strain detection circuit according to any one of claims 1-6, comprises: The power supply module provides excitation voltage to the strain sensing module; When the force applied to the elastic body causes strain in each of the strain gauges, the detection module obtains the sampling voltage from the detection end and determines the magnitude of the force based on the sampling voltage.

8. A robot, characterized in that The strain detection circuit includes any one of claims 1-6.

9. A computer-readable storage medium, characterized in that, It stores a computer program that, when run on a processor, executes the strain detection method of claim 7.

Images