Methods, electronic devices, computer-readable media for implementing a directional pattern test
By calculating the required angle range and testing speed for pattern testing, the pattern testing process was optimized, solving the problems of long testing time and large data volume in existing technologies, and realizing a more efficient testing method.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ZTE CORP
- Filing Date
- 2022-04-18
- Publication Date
- 2026-08-04
AI Technical Summary
Existing radiation pattern testing methods suffer from problems such as long testing time, large data volume, and low efficiency, especially when multiple beams and frequency bands need to be tested.
By calculating the first angle range corresponding to the first indicator to be analyzed by beam pointing, the second angle range required for pattern testing is determined, and the test speed is determined according to the single measurement time. A control signal is generated to control the rotation of the turntable to perform efficient pattern testing.
It shortened the testing time, reduced the amount of data collected, improved testing efficiency, and optimized the testing process.
Smart Images
Figure CN116953373B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of OTA (Over The Air) testing technology, and particularly to methods, electronic devices, and computer-readable media for implementing pattern testing. Background Technology
[0002] In related technologies, various specifications of an Active Antenna Unit (AAU) are generally calculated by testing its active radiation pattern. The active radiation pattern includes horizontal, vertical, and cross-polarization patterns. AAU specifications include horizontal 3dB lobe angle, vertical 3dB lobe angle, co-polarization ratio, cross-polarization ratio, axial cross-polarization ratio, tilt range, upper first sidelobe suppression, and upper sidelobe suppression at various tilt angles. Since the beams to be tested include multiple service beams and multiple broadcast beams, and the tests need to cover the high, mid, and low frequency bands supported by the AAU, the number of radiation patterns to be tested is very large (e.g., the total number can exceed 100). Each directional fork includes a horizontal, vertical, and cross-polarization pattern.
[0003] The existing directional pattern testing methods suffer from problems such as long testing time, large amount of data collected, and low testing efficiency. Summary of the Invention
[0004] This application provides a method, electronic device, and computer-readable medium for performing pattern testing.
[0005] In a first aspect, embodiments of this application provide a method for implementing radiation pattern testing, comprising: calculating a second angle range required for radiation pattern testing based on a first angle range corresponding to a first indicator to be analyzed based on beam direction; determining a test speed corresponding to the second angle range based on a single measurement time; generating a first control signal, wherein the first control signal is used to control a first axis of a turntable to rotate to a specified angle, and to control a second axis of the turntable to rotate within the second angle range at a test speed corresponding to the second angle range, so as to perform the test.
[0006] Secondly, embodiments of this application provide an electronic device, including: at least one processor; and a memory storing at least one program, which, when executed by the at least one processor, implements any of the above-described methods for implementing pattern testing.
[0007] Thirdly, embodiments of this application provide a computer-readable medium storing a computer program, which, when executed by a processor, implements any of the above-described methods for implementing pattern testing.
[0008] The method for implementing radiation pattern testing provided in this application obtains the second angle range required for radiation pattern testing based on the first angle range corresponding to the first indicator to be analyzed by the beam direction, instead of performing a 360-degree scan. This shortens the testing time, reduces the amount of data collected, and improves testing efficiency. Attached Figure Description
[0009] Figure 1 A flowchart illustrating a method for implementing a radiation pattern test according to one embodiment of this application;
[0010] Figure 2 A flowchart illustrating a method for implementing a radiation pattern test, provided as Example 1 of an embodiment of this application;
[0011] Figure 3 A schematic diagram of the test speed provided for Example 1 of the embodiments of this application;
[0012] Figure 4 A flowchart of a method for implementing a radiation pattern test, provided as Example 2 of an embodiment of this application;
[0013] Figure 5 A schematic diagram of the test speed provided for Example 2 of the embodiments of this application;
[0014] Figure 6 A flowchart illustrating a method for implementing a radiation pattern test, provided as Example 3 of this application embodiment;
[0015] Figure 7 A schematic diagram of the test speed provided for Example 3 of the embodiments of this application;
[0016] Figure 8 This is a block diagram of an apparatus for implementing a radiation pattern test, provided in another embodiment of this application. Detailed Implementation
[0017] To enable those skilled in the art to better understand the technical solutions of this application, the method, electronic equipment, and computer-readable medium for implementing pattern testing provided in this application will be described in detail below with reference to the accompanying drawings.
[0018] Exemplary embodiments will be described more fully below with reference to the accompanying drawings; however, these exemplary embodiments may be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this application will be thorough and complete, and will enable those skilled in the art to fully understand the scope of this application.
[0019] Where there is no conflict, the various embodiments of this application and the features thereof may be combined with each other.
[0020] As used herein, the term “and / or” includes any and all combinations of at least one related enumerated entry.
[0021] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application. As used herein, the singular forms “a” and “the” are also intended to include the plural forms unless the context clearly indicates otherwise. It will also be understood that when the terms “comprising” and / or “made of” are used in this specification, the presence of the stated feature, integral, step, operation, element, and / or component is specified, but the presence or addition of at least one other feature, integral, step, operation, element, component, and / or group thereof is not excluded.
[0022] Unless otherwise specified, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art. It will also be understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the relevant art and this application, and will not be interpreted as having an idealized or overly formal meaning, unless expressly so defined herein.
[0023] Figure 1 This is a flowchart illustrating a method for implementing a direction pattern test according to one embodiment of this application.
[0024] Firstly, referring to Figure 1 One embodiment of this application provides a method for implementing radiation pattern testing. This method can be applied to horizontal radiation pattern testing, vertical radiation pattern testing, and cross-polarization radiation pattern testing.
[0025] The testing environment for this method can be near field, compact field, far field, etc.
[0026] The radiation pattern mentioned in this method can refer to an active radiation pattern or a passive radiation pattern.
[0027] The method includes:
[0028] Step 100: Calculate the second angle range required for the radiation pattern test based on the first angle range corresponding to the first indicator to be analyzed based on the beam direction.
[0029] In some exemplary embodiments, the first indicator may be one or more.
[0030] In some exemplary embodiments, the first index includes at least one of the following indices: horizontal 3dB lobe angle, axial cross-polarization ratio, tilt range, upper first sidelobe suppression, upper sidelobe suppression, etc.
[0031] In some exemplary embodiments, the first angle range corresponding to the first indicator refers to the angle range required to test the first indicator.
[0032] In some exemplary embodiments, the first angle ranges corresponding to different first indicators may be the same or different.
[0033] In some exemplary embodiments, calculating the second angle range required for pattern testing based on the first angle range corresponding to the first index to be analyzed according to the beam direction includes: determining the second angle range as the angle range between the minimum value of the lower limit of the first angle range and the difference of the first offset value to the maximum value of the upper limit of the first angle range and the sum of the second offset value.
[0034] For example, suppose there are n primary indicators that need to be analyzed for beam pointing, and the corresponding first angle ranges for these n primary indicators are (l H1 h H1 ), (l H2 h H2 ), ..., (l Hn h Hn Therefore, the lower limit H2 of the second angle range can be obtained as: H2 = min(l) H1 ,l H2 ,...,l Hn )-l Hoffset The upper limit H3 of the second angle range is: H3 = max(h H1 ,h H2 ,...,h Hn )+h Hoffset Among them, l Hoffset h is the first offset value. Hoffset This is the second offset value.
[0035] In some exemplary embodiments, the purpose of setting the first offset value and the second offset value is to ensure that all the data to be collected can be collected. The first offset value and the second offset value can be set according to the actual situation. For example, the first offset value and the second offset value are taken between 10 and 20 degrees.
[0036] In some exemplary embodiments, the second angle range is less than 360 degrees.
[0037] Step 101: Determine the test speed corresponding to the second angle range based on the single measurement time.
[0038] In some exemplary embodiments, the single measurement time of the spectrum analyzer is related to the frequency, bandwidth, sweep time, resolution bandwidth (RBW), and trigger of the signal under test.
[0039] In some exemplary embodiments, determining the test speed corresponding to the second angle range based on the single measurement time includes: determining a sampling time interval based on the single measurement time; determining the maximum angular velocity of the second axis based on the sampling time interval and the sampling angle step corresponding to the second angle range; and determining the test speed corresponding to the second angle range based on the maximum angular velocity of the second axis.
[0040] In some exemplary embodiments, determining the sampling time interval based on the single measurement time includes: determining that the sampling time interval is greater than A times the single measurement time, where A is greater than or equal to 1. For example, to ensure that no sampling is lost, the sampling time interval is set to be greater than the single measurement time, such as satisfying the formula SampleTime>ROUND(1.5*TT,1). Here, SampleTime is the sampling time interval, TT is the single measurement time, and ROUND(X,Y) rounds X to the nearest Y decimal place.
[0041] In some exemplary embodiments, determining the maximum angular velocity of the second axis based on the sampling time interval and the sampling angle step corresponding to the second angle range includes: determining the maximum angular velocity of the second axis as the ratio of the sampling angle step corresponding to the second angle range to the sampling time interval. Assuming the sampling angle step corresponding to the second angle range is Step, then the maximum angular velocity H of the second axis... Velocity for:
[0042] In some exemplary embodiments, determining the test speed corresponding to the second angle range based on the maximum angular velocity of the second axis includes: determining that the test speed corresponding to the second angle range is α times the maximum angular velocity of the second axis, where α is greater than 1.
[0043] In some exemplary embodiments, α is 2 or 3.
[0044] Step 102: Generate a first control signal. The first control signal is used to control the first axis of the turntable to rotate to a specified angle, and to control the second axis of the turntable to rotate within the second angle range at the test speed corresponding to the second angle range, so as to perform the test.
[0045] In some exemplary embodiments, for testing the horizontal radiation pattern, the first axis is a vertical axis, the second axis is a horizontal axis, and the specified angle is determined by the vertical direction of the current test beam, such as the direction angle being the vertical direction angle of the current test beam.
[0046] In some exemplary embodiments, for testing the vertical orientation pattern, the first axis is a horizontal axis, the second axis is a vertical axis, and the specified angle is determined by the horizontal direction of the current test beam, such as the direction angle being the horizontal direction angle of the current test beam.
[0047] In some exemplary embodiments, for testing cross-polarization patterns, the first axis is a vertical axis, the second axis is a horizontal axis, and the specified angle is determined by the vertical pointing of the current test beam, such as the pointing angle being the vertical pointing angle of the current test beam.
[0048] In some exemplary embodiments, before starting the test, the first axis of the turntable can be controlled to rotate from the current angle to a specified angle at the maximum rotational speed of the first axis given by the turntable manufacturer, and the second axis of the turntable can be controlled to rotate from the current angle to the angle corresponding to the lower limit of the second angle range at the maximum rotational speed of the second axis given by the turntable manufacturer.
[0049] In some exemplary embodiments, the method further includes: determining a fourth angle range required for pattern testing based on a second angle range and a third angle range corresponding to a second index to be analyzed for beam pointing; determining a test speed corresponding to the fourth angle range based on a single measurement time; generating a second control signal, the second control signal being used to control a first axis of the turntable to rotate to a specified angle, and to control a second axis of the turntable to rotate within the fourth angle range at the test speed corresponding to the fourth angle range, so as to perform the test.
[0050] In some exemplary embodiments, the test speed in the second angular range is less than the test speed in the fourth angular range.
[0051] In some exemplary embodiments, the sum of the second angle range and the fourth angle range is less than or equal to 360 degrees.
[0052] In some exemplary embodiments, the second metric includes at least one of the following: the ratio before and after same polarization, and the ratio before and after cross-polarization.
[0053] In some exemplary embodiments, determining the fourth angle range required for pattern testing based on the third angle range corresponding to the second index to be analyzed based on the second angle range and the beam pointing includes: determining the fourth angle range includes: the angle range between the lower limit of the third angle range and the lower limit of the second angle range, and the angle range between the upper limit of the second angle range and the upper limit of the third angle range.
[0054] In some exemplary embodiments, determining the fourth angle range required for the pattern test based on the second angle range and the third angle range corresponding to the second index includes: determining the fourth angle range includes: the angle range between the minimum value of the lower limit of the third angle range and the lower limit of the second angle range, and the angle range between the upper limit of the second angle range and the maximum value of the upper limit of the third angle range.
[0055] In some exemplary embodiments, determining the test speed corresponding to the fourth angle range based on the single measurement time includes: determining the sampling time interval based on the single measurement time; determining the maximum angular velocity of the second axis based on the sampling time interval and the sampling angle step corresponding to the second angle range; and determining the test speed corresponding to the fourth angle range based on the maximum angular velocity of the second axis.
[0056] In some exemplary embodiments, determining the sampling time interval based on the single measurement time includes: determining that the sampling time interval is greater than A times the single measurement time, where A is greater than or equal to 1. For example, to ensure that no sampling is lost, the sampling time interval is set to be greater than the single measurement time, such as satisfying the formula SampleTime>ROUND(1.5*TT,1). Here, SampleTime is the sampling time interval, TT is the single measurement time, and ROUND(X,Y) rounds X to the nearest Y decimal place.
[0057] In some exemplary embodiments, determining the maximum angular velocity of the second axis based on the sampling time interval and the sampling angle step corresponding to the second angle range includes: determining the maximum angular velocity of the second axis as the ratio of the sampling angle step corresponding to the second angle range to the sampling time interval. Assuming the sampling angle step corresponding to the second angle range is Step, then the maximum angular velocity H of the second axis... Velocity for:
[0058] In some exemplary embodiments, determining the test speed corresponding to the fourth angle range based on the maximum angular velocity of the second axis includes: determining the test speed corresponding to the fourth angle range as the maximum angular velocity of the second axis.
[0059] In some exemplary embodiments, the sampling angle step corresponding to the fourth angle range is the product of the test speed and the sampling time interval corresponding to the fourth angle range.
[0060] In some exemplary embodiments, before starting the test, the first axis of the turntable can be controlled to rotate from the current angle to a specified angle at the maximum rotational speed of the first axis given by the turntable manufacturer, and the second axis of the turntable can be controlled to rotate from the current angle to the angle corresponding to the lower limit of the third angle range at the maximum rotational speed of the second axis given by the turntable manufacturer.
[0061] To more intuitively present the method for implementing the radiation pattern test in the embodiments of this application, several examples are listed below for illustration. The examples listed are not intended to limit the scope of protection of the embodiments of this application.
[0062] Example 1
[0063] This example describes a testing method for horizontal orientation patterns, such as... Figure 2 As shown, the method includes:
[0064] Step 200: Calculate the second angle range required for the pattern test based on the first angle range corresponding to the first indicator to be analyzed for the beam pointing, and determine the fourth angle range required for the pattern test based on the second angle range and the third angle range corresponding to the second indicator to be analyzed for the beam pointing.
[0065] In this example, the first metric includes at least one of the following: horizontal 3dB lobe angle, axial cross-polarization ratio, tilt range, upper first sidelobe suppression, upper sidelobe suppression, etc.
[0066] In this example, the second metric includes the ratio before and after polarization. If the ratio before and after polarization does not need to be analyzed, then it is not necessary to determine the fourth angle range, nor is it necessary to determine the test speed corresponding to the fourth angle range, nor is it necessary to generate a second control signal.
[0067] In this example, such as Figure 3 As shown, assuming the beam direction points to n primary indicators that need to be analyzed, the first angle ranges corresponding to these n primary indicators are respectively (l H1 h H1 ), (l H2 h H2 ), ..., (l Hn h Hn Therefore, the lower limit H2 of the second angle range can be obtained as: H2 = min(l) H1 ,l H2 ,...,l Hn )-l Hoffset The upper limit H3 of the second angle range is: H3 = max(h H1 ,h H2 ,...,h Hn )+h Hoffset Among them, l Hoffset h is the first offset value. Hoffset This is the second offset value.
[0068] In this example, such as Figure 3 As shown, assuming the third angle range is (H1, H4), the fourth angle range includes: angle range (H1, H2) and angle range (H3, H4).
[0069] In this example, as Figure 3 As shown, H1 can take a value of -180 degrees, and H4 can take a value of 180 degrees.
[0070] Step 201: Determine the sampling time interval based on the single measurement time; determine the maximum angular velocity of the horizontal axis based on the sampling time interval and the sampling angle step corresponding to the second angle range; determine the test speed corresponding to the second angle range and the test speed corresponding to the fourth angle range based on the maximum angular velocity of the horizontal axis.
[0071] In this example, to ensure no sample loss occurs, the sampling time interval is set to be greater than the single measurement time, such as satisfying the formula SampleTime>ROUND(1.5*TT,1). Here, SampleTime is the sampling time interval, TT is the single measurement time, and ROUND(X,Y) rounds X to the nearest Y decimal place.
[0072] In this example, assuming the sampling angle step corresponding to the second angle range is Step, the maximum angular velocity H of the horizontal axis is... Velocity for:
[0073] In this example, such as Figure 3 As shown, the test speed S1 corresponding to the second angle range is: S1 = H Velocity ×α, where α is greater than 1.
[0074] In this example, such as Figure 3 As shown, the test speed S2 corresponding to the fourth angle range is: S2 = H Velocity .
[0075] In this example, the sampling angle step Step2 corresponding to the fourth angle range can be calculated based on the test speed S2 corresponding to the fourth angle range: Step2 = Round(S2 × SampleTime, 1).
[0076] Step 202: Generate a first control signal and a second control signal. The second control signal is used to control the vertical axis of the turntable to rotate to a specified angle and to control the horizontal axis of the turntable to rotate within a fourth angle range at the test speed corresponding to the fourth angle range for testing. The first control signal is used to control the vertical axis of the turntable to rotate to a specified angle and to control the horizontal axis of the turntable to rotate within a second angle range at the test speed corresponding to the second angle range for testing.
[0077] In this example, the time saved compared to the constant speed test (SaveTime) is:
[0078] In this example, before starting the test, the vertical axis of the turntable can be controlled to rotate from the current angle to a specified angle at the maximum rotation speed of the vertical axis given by the turntable manufacturer, and the horizontal axis of the turntable can be controlled to rotate from the current angle to H1 at the maximum rotation speed of the horizontal axis given by the turntable manufacturer.
[0079] Example 2
[0080] This example describes the testing method for the vertical orientation pattern, such as... Figure 4 As shown, the method includes:
[0081] Step 400: Calculate the second angle range required for the radiation pattern test based on the first angle range corresponding to the first indicator to be analyzed based on the beam direction.
[0082] In this example, the first metric includes at least one of the following: horizontal 3dB lobe angle, axial cross-polarization ratio, tilt range, upper first sidelobe suppression, upper sidelobe suppression, etc.
[0083] In this example, such as Figure 5 As shown, assuming the beam direction points to n primary indicators that need to be analyzed, the first angle ranges corresponding to these n primary indicators are respectively (l V1 h V1 ), (l V2 h V2 ), ..., (l Vn h Vn Therefore, the lower limit V1 of the second angle range can be obtained as: V1 = min(l V1 ,l V2 ,...,l Vn )-l Voffset The upper limit V2 of the second angle range is: V2 = max(h V1 ,h V2 ,...,h Vn )+h Voffset Among them, l Voffset h is the first offset value. Voffset This is the second offset value.
[0084] Step 401: Determine the sampling time interval based on the single measurement time; determine the maximum angular velocity of the horizontal axis based on the sampling time interval and the sampling angle step corresponding to the second angle range; determine the test speed corresponding to the second angle range based on the maximum angular velocity of the horizontal axis.
[0085] In this example, to ensure no sample loss occurs, the sampling time interval is set to be greater than the single measurement time, such as satisfying the formula SampleTime>ROUND(1.5*TT,1). Here, SampleTime is the sampling time interval, TT is the single measurement time, and ROUND(X,Y) rounds X to the nearest Y decimal place.
[0086] In this example, assuming the sampling angle step corresponding to the second angle range is Step, then the maximum angular velocity V of the vertical axis Velocityfor:
[0087] In this example, such as Figure 5 As shown, the test speed S3 corresponding to the second angle range is: S3 = V Velocity .
[0088] Step 402: Generate a first control signal. The first control signal is used to control the horizontal axis of the turntable to rotate to a specified angle, and to control the vertical axis of the turntable to rotate within a second angle range at the test speed corresponding to the second angle range, so as to perform the test.
[0089] In this example, the time saved compared to the constant speed test (SaveTime) is:
[0090] In this example, before starting the test, the horizontal axis of the turntable can be controlled to rotate from the current angle to a specified angle at the maximum rotation speed of the horizontal axis given by the turntable manufacturer, and the vertical axis of the turntable can be controlled to rotate from the current angle to V1 at the maximum rotation speed of the vertical axis given by the turntable manufacturer.
[0091] Example 3
[0092] This example describes a testing method for cross-polarization patterns, such as... Figure 6 As shown, the method includes:
[0093] Step 600: Calculate the second angle range required for the radiation pattern test based on the first angle range corresponding to the first index to be analyzed based on the beam direction.
[0094] In this example, the first metric includes at least one of the following: horizontal 3dB lobe angle, axial cross-polarization ratio, tilt range, upper first sidelobe suppression, upper sidelobe suppression, etc.
[0095] In this example, such as Figure 7 As shown, assuming the beam direction points to n primary indicators that need to be analyzed, the first angle ranges corresponding to these n primary indicators are respectively (l x1 h x1 ), (l x2 h x2 ), ..., (l xn h xn Therefore, the lower limit X1 of the second angle range can be obtained as: X1 = min(l X1 ,l X2 ,...,l Xn )-l Xoffset The upper limit of the second angle range, X2, is: X2 = max(h X1 ,h X2 ,...,h Xn )+h XoffsetAmong them, l xoffset h is the first offset value. xoffset This is the second offset value.
[0096] Step 601: Determine the sampling time interval based on the single measurement time; determine the maximum angular velocity of the horizontal axis based on the sampling time interval and the sampling angle step corresponding to the second angle range; determine the test speed corresponding to the second angle range based on the maximum angular velocity of the horizontal axis.
[0097] In this example, to ensure no sample loss occurs, the sampling time interval is set to be greater than the single measurement time, such as satisfying the formula SampleTime>ROUND(1.5*TT,1). Here, SampleTime is the sampling time interval, TT is the single measurement time, and ROUND(X,Y) rounds X to the nearest Y decimal place.
[0098] In this example, assuming the sampling angle step corresponding to the second angle range is Step, then the maximum angular velocity X of the horizontal axis Velocity for:
[0099] In this example, such as Figure 7 As shown, the test speed S4 corresponding to the second angle range is: S4 = X Velocity .
[0100] Step 602: Generate a first control signal. The first control signal is used to control the vertical axis of the turntable to rotate to a specified angle, and to control the horizontal axis of the turntable to rotate within a second angle range at the test speed corresponding to the second angle range, so as to perform the test.
[0101] In this example, the time saved compared to the constant speed test (SaveTime) is:
[0102] In this example, before starting the test, the vertical axis of the turntable can be controlled to rotate from the current angle to a specified angle at the maximum rotation speed of the vertical axis given by the turntable manufacturer, and the horizontal axis of the turntable can be controlled to rotate from the current angle to X1 at the maximum rotation speed of the horizontal axis given by the turntable manufacturer.
[0103] The method for implementing radiation pattern testing provided in this application obtains the second angle range required for radiation pattern testing based on the first angle range corresponding to the first indicator to be analyzed by the beam direction, instead of performing a 360-degree scan. This shortens the testing time, reduces the amount of data collected, and improves testing efficiency.
[0104] Secondly, another embodiment of this application provides an electronic device, including: at least one processor; and a memory storing at least one program, which, when executed by at least one processor, implements any of the above-described methods for implementing pattern testing.
[0105] Among them, the processor is a device with data processing capabilities, including but not limited to the central processing unit (CPU); the memory is a device with data storage capabilities, including but not limited to random access memory (RAM, more specifically such as SDRAM, DDR, etc.), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), and flash memory (FLASH).
[0106] In some embodiments, the processor and memory are interconnected via a bus, and thus connected to other components of the computing device.
[0107] Thirdly, another embodiment of this application provides a computer-readable medium storing a computer program, which, when executed by a processor, implements any of the above-described methods for implementing pattern testing.
[0108] Figure 8 This is a block diagram of an apparatus for implementing a radiation pattern test, provided in another embodiment of this application.
[0109] Fourthly, refer to Figure 8 Another embodiment of this application provides an apparatus for performing radiation pattern testing, comprising: a calculation module 801, configured to calculate a second angle range required for radiation pattern testing based on a first angle range corresponding to a first index to be analyzed based on the beam direction; a determination module 802, configured to determine a test speed corresponding to the second angle range based on a single measurement time; and a test module 803, configured to generate a first control signal, the first control signal being used to control a first axis of a turntable to rotate to a specified angle, and to control a second axis of the turntable to rotate within the second angle range at a test speed corresponding to the second angle range, so as to perform the test.
[0110] In some exemplary embodiments, the calculation module 801 is further configured to: determine a fourth angle range required for pattern testing based on the third angle range corresponding to the second index to be analyzed based on the second angle range and the beam pointing; the determination module 802 is further configured to: determine the test speed corresponding to the fourth angle range based on the single measurement time; the test module 803 is further configured to: generate a second control signal, the second control signal being used to control the first axis of the turntable to rotate to a specified angle, and to control the second axis of the turntable to rotate within the fourth angle range at the test speed corresponding to the fourth angle range, so as to perform the test.
[0111] In some exemplary embodiments, the test speed in the second angular range is less than the test speed in the fourth angular range.
[0112] In some exemplary embodiments, the calculation module 801 is specifically configured to determine the fourth angle range required for pattern testing based on the third angle range corresponding to the second index to be analyzed according to the second angle range and the beam direction in the following manner: determining the fourth angle range includes: the angle range between the lower limit of the third angle range and the lower limit of the second angle range, and the angle range between the upper limit of the second angle range and the upper limit of the third angle range.
[0113] In some exemplary embodiments, the determining module 802 is specifically configured to determine the test speed corresponding to the fourth angle range based on the single measurement time in the following manner: determining the sampling time interval based on the single measurement time; determining the maximum angular velocity of the second axis based on the sampling time interval and the sampling angle step corresponding to the second angle range; and determining the test speed corresponding to the fourth angle range based on the maximum angular velocity of the second axis.
[0114] In some exemplary embodiments, the determining module 802 is specifically configured to determine the sampling time interval based on the single measurement time in the following manner: determining that the sampling time interval is greater than A times the single measurement time, where A is greater than or equal to 1.
[0115] In some exemplary embodiments, the determining module 802 is specifically configured to determine the maximum angular velocity of the second axis based on the sampling angle step corresponding to the second angle range in the following manner: the maximum angular velocity of the second axis is determined to be the ratio of the sampling angle step corresponding to the second angle range to the sampling time interval.
[0116] In some exemplary embodiments, the determining module 802 is specifically configured to determine the test speed corresponding to the fourth angle range based on the maximum angular velocity of the second axis in the following manner: determining the test speed corresponding to the fourth angle range as the maximum angular velocity of the second axis.
[0117] In some exemplary embodiments, the calculation module 801 is specifically used to calculate the second angle range required for the pattern test according to the first angle range corresponding to the first index to be analyzed based on the beam direction in the following manner: the second angle range is determined to be the angle range between the minimum value of the lower limit of the first angle range and the difference of the first offset value to the maximum value of the upper limit of the first angle range and the sum of the second offset value.
[0118] In some exemplary embodiments, the determining module 802 is specifically configured to determine the test speed corresponding to the second angle range based on the single measurement time in the following manner: determining the sampling time interval based on the single measurement time; determining the maximum angular velocity of the second axis based on the sampling time interval and the sampling angle step corresponding to the second angle range; and determining the test speed corresponding to the second angle range based on the maximum angular velocity of the second axis.
[0119] In some exemplary embodiments, the determining module 802 is specifically used to determine the test speed corresponding to the second angle range based on the maximum angular velocity of the second axis in the following manner: the test speed corresponding to the second angle range is determined to be α times the maximum angular velocity of the second axis, where α is greater than 1.
[0120] The specific implementation process of the above-described apparatus for implementing pattern testing is the same as the specific implementation process of the method for implementing pattern testing in the aforementioned embodiments, and will not be repeated here.
[0121] It will be understood by those skilled in the art that all or some of the steps, systems, or apparatuses disclosed above, and their functional modules / units, can be implemented as software, firmware, hardware, or suitable combinations thereof. In hardware implementations, the division between functional modules / units mentioned above does not necessarily correspond to the division of physical components; for example, a physical component may have multiple functions, or a function or step may be performed collaboratively by several physical components. Some or all physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit (ASIC). Such software may be distributed on a computer-readable medium, which may include computer storage media (or non-transitory media) and communication media (or transient media). As is known to those skilled in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data). Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disc (DVD) or other optical disc storage, magnetic cartridges, magnetic tape, disk storage or other magnetic storage, or any other medium that can be used to store desired information and can be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media typically contain computer-readable instructions, data structures, program modules, or other data in modulated data signals such as carrier waves or other transmission mechanisms, and may include any information delivery medium.
[0122] Example embodiments have been disclosed herein, and while specific terminology has been used, it is for illustrative purposes only and should be construed as such, and is not intended to be limiting. In some instances, it will be apparent to those skilled in the art that features, characteristics, and / or elements described in connection with particular embodiments may be used alone, or in combination with features, characteristics, and / or elements described in connection with other embodiments, unless otherwise expressly indicated. Therefore, those skilled in the art will understand that various changes in form and detail may be made without departing from the scope of this application as set forth by the appended claims.
Claims
1. A method for implementing pattern testing, comprising: The second angle range required for the radiation pattern test is calculated based on the first angle range corresponding to the first indicator to be analyzed by the beam pointing. The first angle range corresponding to the first indicator refers to the angle range required for testing the first indicator. The number of the first indicators is one or more. The test speed corresponding to the second angle range is determined based on the single measurement time. A first control signal is generated, which is used to control the first axis of the turntable to rotate to a specified angle, and to control the second axis of the turntable to rotate within the second angle range at a test speed corresponding to the second angle range, so as to perform the test. The first axis is one of the vertical axis and the horizontal axis, and the second axis is the other of the vertical axis and the horizontal axis. The method also includes: The fourth angle range required for the radiation pattern test is determined based on the third angle range corresponding to the second indicator that needs to be analyzed for the beam pointing, and the second angle range corresponding to the second angle range of the second angle range. The test speed corresponding to the fourth angle range is determined based on the single measurement time. A second control signal is generated, which is used to control the first axis of the turntable to rotate to a specified angle, and to control the second axis of the turntable to rotate within the fourth angle range at the test speed corresponding to the fourth angle range, so as to perform the test; Specifically, determining the fourth angle range required for the radiation pattern test based on the third angle range corresponding to the second index to be analyzed according to the second angle range and the beam pointing includes: Determining the fourth angle range includes: the angle range between the lower limit of the third angle range and the lower limit of the second angle range, and the angle range between the upper limit of the second angle range and the upper limit of the third angle range.
2. The method for implementing pattern testing according to claim 1, wherein, The test speed in the second angle range is less than the test speed in the fourth angle range.
3. The method of enabling a pattern test of claim 1, wherein, The step of determining the test speed corresponding to the fourth angle range based on the single measurement time includes: The sampling time interval is determined based on the single measurement time. The maximum angular velocity of the second axis is determined based on the sampling time interval and the sampling angle step corresponding to the second angle range; The test speed corresponding to the fourth angle range is determined based on the maximum angular velocity of the second axis.
4. The method of implementing a directional pattern test of claim 3, wherein, The step of determining the sampling time interval based on the single measurement time includes: The sampling time interval is determined to be greater than A times the single measurement time, where A is greater than or equal to 1.
5. The method of enabling a pattern test of claim 3, wherein, The step of determining the maximum angular velocity of the second axis based on the sampling time interval and the sampling angle step corresponding to the second angle range includes: The maximum angular velocity of the second axis is determined as the ratio of the sampling angle step corresponding to the second angle range to the sampling time interval.
6. The method of enabling a pattern test of claim 3, wherein, The step of determining the test speed corresponding to the fourth angle range based on the maximum angular velocity of the second axis includes: The test speed corresponding to the fourth angle range is determined to be the maximum angular velocity of the second axis.
7. The method of enabling a pattern test of claim 1, wherein, The calculation of the second angle range required for the radiation pattern test based on the first angle range corresponding to the first index to be analyzed according to the beam direction includes: The second angle range is determined to be the angle range between the minimum value of the lower limit of the first angle range and the difference of the first offset value, the maximum value of the upper limit of the first angle range, and the sum of the second offset value.
8. The method of implementing a directional pattern test of claim 1, wherein, The step of determining the test speed corresponding to the second angle range based on the single measurement time includes: The sampling time interval is determined based on the single measurement time. The maximum angular velocity of the second axis is determined based on the sampling time interval and the sampling angle step corresponding to the second angle range; The test speed corresponding to the second angle range is determined based on the maximum angular velocity of the second axis.
9. The method of implementing a directional pattern test of claim 8, wherein, The step of determining the test speed corresponding to the second angle range based on the maximum angular velocity of the second axis includes: The test speed corresponding to the second angle range is determined to be α times the maximum angular velocity of the second axis, where α is greater than 1.
10. An electronic device, comprising: At least one processor; A memory storing at least one program that, when executed by the at least one processor, implements the method for implementing a pattern test as described in any one of claims 1-9.
11. A computer-readable medium storing a computer program that, when executed by a processor, implements the method for implementing a pattern test as described in any one of claims 1-9.