Display panel, aging test method thereof, timing controller and display device
By utilizing the potential difference between high and low level gate voltages and data voltage during aging tests of display panels, the problem of DGS defects in display products being undetectable has been solved, achieving rapid interception and quality assurance.
CN116978299BActive Publication Date: 2026-07-24BOE TECHNOLOGY GROUP CO LTD +1
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BOE TECHNOLOGY GROUP CO LTD
- Filing Date
- 2023-05-17
- Publication Date
- 2026-07-24
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Figure CN116978299B_ABST
Abstract
The present disclosure provides a display panel, an aging test method thereof, a timing controller and a display device. The aging test method comprises: sending, by a lighting machine, an aging test signal to a timing controller of a display panel, so that the timing controller outputs a high-level gate voltage and a low-level data voltage in a first time period and outputs a low-level gate voltage and a high-level data voltage in a second time period based on the aging test signal. The aging test method can trigger and intercept the short circuit defect of the data line scan line of the display product in advance.
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