芯片测试方法和装置

By obtaining the default and target test voltage values ​​of the chips during DDR4 chip aging tests, calculating the number of adjustment steps, and enabling the chips one by one in PDA mode, the problem of inconsistent chip test conditions was solved, and the accuracy of test results was improved.

CN116978437BActive Publication Date: 2026-07-17CHANGXIN MEMORY TECH INC
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHANGXIN MEMORY TECH INC
Filing Date
2022-04-24
Publication Date
2026-07-17

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Abstract

本公开实施例提供一种芯片测试方法和装置，获取DIB上m行n列的各DUT的测试电压的默认值，确定各DUT按照预设的电压调整步长，从默认值调整到目标值需要的调整步数，各DUT的测试电压的目标值相同，为各DUT配置使能参数，该使能参数包括DUT的调整步数和DQ0的状态；使能各DUT的PDA模式并设定MRS命令，MRS命令中包括DUT的电压调整信息，遍历各列DUT，根据使能参数将共享同一个CS的一列DUT的MRS命令逐一使能。该方法，根据各DUT的测试电压的默认值和目标值，为各DUT分别设置不同的电压调整信息，该电压调整信息包括在MRS命令下，在PDA模式，将各DUT逐一使能，从而能够保证DIB上的各DUT的测试条件一致。
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