Non-contact infrared single-pixel measurement methods, systems, electronic devices and media
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-08-03
- Publication Date
- 2026-08-14
AI Technical Summary
第二类为红外成像测温法,主要仪器为红外热成像仪,以透镜将被测物体红外辐射在焦平面进行成像,通过红外传感器阵列测量目标每个局部的红外辐射,同样转化为电信号再计算求得红外辐射温度,该方法可以测量任意形状的目标温度,并且可以克服第一种方法的缺陷,但是对于异形物体温度需要提取多个采样点求平均值,若采样点数量较多或目标形状不规则、温度不均匀时,需要额外编程求解平均温度,不方便
[0031]本发明基于斯蒂芬-波尔兹曼定律,根据第一时刻的温度值集合和第二时刻的温度值集合确定背景占视场的比例值以及被测目标占视场的比例值,并根据背景占所述视场的比例值、被测目标占所述视场的比例值以及任意时刻温度值集合得到被测目标温度,可直接测量形状不规则和温度不均匀的物体,不需要额外编程,更加方便。
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Figure CN116989900B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of non-contact temperature measurement technology, and in particular to a non-contact infrared single-pixel measurement method, system, electronic device, and medium. Background Technology
[0002] Currently, there are two main types of non-contact temperature measurement methods. The first type is single-pixel infrared thermometry, which primarily uses an infrared thermometer. A Fresnel lens or aperture focuses the infrared radiation from the target object, and an infrared sensor receives the radiation and converts it into an electrical signal. The corresponding infrared radiation temperature is then calculated using the blackbody or graybody radiation equation. This method typically measures a circular or elliptical area. When using an aperture to focus the infrared radiation, the distance from the target object cannot be too far. If a Fresnel lens is used, the target object must fill the entire measurement field of view. The second type is infrared imaging thermometry, which primarily uses an infrared thermal imager. A lens images the infrared radiation from the object onto the focal plane, and an infrared sensor array measures the infrared radiation from each local area of the target. This is also converted into an electrical signal, and the infrared radiation temperature is calculated. This method can measure the temperature of targets of arbitrary shapes and overcomes the shortcomings of the first method. However, for irregularly shaped objects, multiple sampling points need to be extracted and averaged. If the number of sampling points is large, or if the target shape is irregular or the temperature is uneven, additional programming is required to calculate the average temperature, which is inconvenient. Summary of the Invention
[0003] The purpose of this invention is to provide a non-contact infrared single-pixel measurement method, system, electronic device, and medium that can directly measure objects with irregular shapes and uneven temperatures without additional programming, making it more convenient.
[0004] To achieve the above objectives, the present invention provides the following solution:
[0005] A non-contact infrared single-pixel measurement method, comprising:
[0006] Keeping the temperature of the target object constant, the background temperature is changed, and a set of temperature values at the first moment and a set of temperature values at the second moment are obtained; the set of temperature values includes the field temperature and the background temperature.
[0007] The proportion of the background to the field of view and the proportion of the target to the field of view are determined based on the temperature value set at the first time and the temperature value set at the second time.
[0008] Obtain a set of temperature values at any given time, and obtain the temperature of the target being measured based on the proportion of the background to the field of view, the proportion of the target being measured to the field of view, and the set of temperature values at any given time.
[0009] Optionally, the proportion of the background to the field of view and the proportion of the target to the field of view are determined based on the temperature value set at the first time and the temperature value set at the second time, specifically including:
[0010] The proportion of the background to the field of view is determined based on the temperature value set at the first time and the temperature value set at the second time.
[0011] The proportion of the target object in the field of view is obtained from the proportion of the background in the field of view.
[0012] Optionally, the proportion of the background to the field of view is determined based on the temperature value set at the first time and the temperature value set at the second time, specifically including:
[0013] According to formula k Pb =(T2) 4 -T1 4 ) / (t2 4 -t1 4 Calculate the proportion of the background to the field of view, where k Pb t2 represents the proportion of the field of view to the background, T2 represents the field of view temperature at the second moment, T1 represents the field of view temperature at the first moment, t2 represents the background temperature at the second moment, and t1 represents the background temperature at the first moment.
[0014] Optionally, the temperature of the target is obtained based on the proportion of the background to the field of view, the proportion of the target to the field of view, and the set of temperature values at any given time. Specifically, this includes:
[0015] According to formula t t =[(T 4 -k Pb ·t 4 ) / k Pt ] 1 / 4 Calculate the temperature of the target object, where t t Indicates the temperature of the target being measured, k Pb The value represents the proportion of the field of view occupied by the background, T represents the field of view temperature at any time, t represents the background temperature at any time, and k represents the background temperature at any time. Pt This indicates the proportion of the field of view occupied by the measured target.
[0016] A non-contact infrared single-pixel measurement system, comprising:
[0017] The acquisition module is used to keep the temperature of the target under test constant, change the background temperature, and acquire a set of temperature values at a first moment and a set of temperature values at a second moment; the set of temperature values includes the field temperature and the background temperature.
[0018] The proportion calculation module is used to determine the proportion of the background to the field of view and the proportion of the target to the field of view based on the temperature value set at the first time and the temperature value set at the second time.
[0019] The target temperature calculation module is used to obtain a set of temperature values at any time, and to obtain the target temperature based on the proportion of the background to the field of view, the proportion of the target to the field of view, and the set of temperature values at any time.
[0020] Optionally, the ratio calculation module specifically includes:
[0021] The background-occupying-field-of-view ratio calculation unit is used to determine the background-occupying-field-of-view ratio based on the temperature value set at the first moment and the temperature value set at the second moment.
[0022] The target-to-viewpoint ratio calculation unit is used to obtain the target-to-viewpoint ratio in the field of view based on the background ratio in the field of view.
[0023] Optionally, the background-to-field ratio calculation unit specifically includes:
[0024] The sub-unit for calculating the proportion of the background to the field of view is used to calculate the proportion of the background to the field of view according to formula k. Pb =(T2) 4 -T1 4 ) / (t2 4 -t1 4 Calculate the proportion of the background to the field of view, where k Pb t2 represents the proportion of the field of view to the background, T2 represents the field of view temperature at the second moment, T1 represents the field of view temperature at the first moment, t2 represents the background temperature at the second moment, and t1 represents the background temperature at the first moment.
[0025] Optionally, the target temperature calculation module specifically includes:
[0026] The target temperature calculation unit is used to calculate the temperature of the measured target according to the formula t. t =[(T 4 -k Pb ·t 4 ) / k Pt ] 1 / 4 Calculate the temperature of the target object, where t t Indicates the temperature of the target being measured, k Pb The value represents the proportion of the field of view occupied by the background, T represents the field of view temperature at any time, t represents the background temperature at any time, and k represents the background temperature at any time. Pt This indicates the proportion of the field of view occupied by the measured target.
[0027] An electronic device, comprising:
[0028] A memory and a processor, the memory for storing a computer program, the processor for running the computer program to cause the electronic device to perform the non-contact infrared single-pixel measurement method as described above.
[0029] A computer-readable storage medium storing a computer program that, when executed by a processor, implements the non-contact infrared single-pixel measurement method as described above.
[0030] According to specific embodiments provided by the present invention, the present invention discloses the following technical effects:
[0031] This invention is based on the Stefan-Boltzmann law. It determines the proportion of the background and the target in the field of view based on the temperature value set at the first and second moments. The temperature of the target is obtained based on the proportion of the background in the field of view, the proportion of the target in the field of view, and the temperature value set at any moment. It can directly measure objects with irregular shapes and uneven temperatures without additional programming, making it more convenient. Attached Figure Description
[0032] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0033] Figure 1 A flowchart of a non-contact infrared single-pixel measurement method provided in an embodiment of the present invention. Detailed Implementation
[0034] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0035] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0036] like Figure 1As shown, this embodiment of the invention provides a non-contact infrared single-pixel measurement method, specifically involving non-contact infrared single-pixel measurement of irregularly shaped targets. It can utilize a single-pixel infrared temperature measurement device to perform non-contact temperature measurement on targets of arbitrary shape and temperature distribution, particularly measuring the average temperature of irregularly shaped objects and targets with uneven temperature distribution. The method specifically includes:
[0037] S101: Keep the temperature of the target object constant, change the background temperature, and obtain the temperature value set at the first moment and the temperature value set at the second moment; the temperature value set includes the field temperature and the background temperature.
[0038] S102: Determine the proportion of the background to the field of view and the proportion of the target to the field of view based on the temperature value set at the first time and the temperature value set at the second time.
[0039] S103: Obtain the set of temperature values at any time, and obtain the temperature of the target being measured based on the proportion of the background to the field of view, the proportion of the target being measured to the field of view, and the set of temperature values at any time.
[0040] In practical applications, the proportion of the background to the field of view and the proportion of the target to the field of view are determined based on the temperature value set at the first time and the temperature value set at the second time. Specifically, this includes:
[0041] The proportion of the background to the field of view is determined based on the temperature value set at the first time and the temperature value set at the second time.
[0042] The proportion of the target object in the field of view is obtained from the proportion of the background in the field of view.
[0043] In practical applications, according to the Stefan-Boltzmann law: P = ET' 4 It is known that the infrared radiation energy P is directly proportional to the emissivity E of the target's surface material and directly proportional to the fourth power of the absolute temperature T'. Infrared thermometers are based on this formula. By measuring the temperature of a standard blackbody to calibrate the relationship between the electrical signal and the target temperature, the infrared radiation temperature of the target is calculated from the infrared sensor's electrical signal, yielding P = kET'. 4 , where k represents the corrected conversion coefficient.
[0044] When an infrared thermometer uses a Fresnel lens to focus infrared radiation, the infrared radiation from all objects within the field of view is received by the sensor and converted into an electrical signal. Therefore, if the infrared thermometer is moved away from the target and the measurement field of view covers the target (irregular shape), the infrared radiation energy P received by the infrared radiation sensor of the infrared thermometer will include two parts: the infrared radiation Pt from the target and the background infrared radiation Pb. When the temperature of the target remains constant while the background temperature changes, the difference in infrared radiation corresponding to the temperature change within the field of view is: ΔP = kET² 4 -kET1 4 .
[0045] Within the measured field of view, only the background infrared radiation changes due to temperature variations. Let k be the proportion of the background area within the measured field of view. Pb The change in radiation is: ΔP = Pb2 - Pb1 = k Pb ·kEt2 4 -k Pb ·kEt1 4 .
[0046] Therefore, the proportion of the background to the field of view is determined based on the temperature value set at the first time and the temperature value set at the second time, specifically including:
[0047] According to formula k Pb =(T2) 4 -T1 4 ) / (t2 4 -t1 4 Calculate the proportion of the background to the field of view, where k Pb t2 represents the proportion of the field of view to the background, T2 represents the field of view temperature at the second moment, T1 represents the field of view temperature at the first moment, t2 represents the background temperature at the second moment, and t1 represents the background temperature at the first moment.
[0048] In practical applications, according to formula k Pt =1-k Pb =1-(T2) 4 -T1 4 ) / (t2 4 -t1 4 Calculate the proportion k of the measured target in the field of view. Pt .
[0049] In practical applications, the average infrared radiation of a target can be approximated by its average temperature. The temperature of the target can then be calculated as follows: For any background temperature t and the infrared thermometer display temperature (field of view temperature) T, the infrared radiation of the target is: Pt = k Pt ·kEt t 4 Pt = P - Pb = kET4 -k Pb ·kEt 4 Therefore, the temperature of the target is obtained based on the proportion of the background to the field of view, the proportion of the target to the field of view, and the set of temperature values at any given time, specifically including:
[0050] According to formula t t =[(T 4 -k Pb ·t 4 ) / k Pt ] 1 / 4 Calculate the temperature of the target object, where t t Indicates the temperature of the target being measured, k Pb The value represents the proportion of the field of view occupied by the background, T represents the field of view temperature at any time, t represents the background temperature at any time, and k represents the background temperature at any time. Pt This indicates the proportion of the field of view occupied by the measured target.
[0051] In accordance with the above-described method embodiments, the present invention provides a non-contact infrared single-pixel measurement system, comprising:
[0052] The acquisition module is used to keep the temperature of the target under test constant, change the background temperature, and acquire a set of temperature values at a first moment and a set of temperature values at a second moment; the set of temperature values includes the field temperature and the background temperature.
[0053] The proportion calculation module is used to determine the proportion of the background to the field of view and the proportion of the target to the field of view based on the temperature value set at the first time and the temperature value set at the second time.
[0054] The target temperature calculation module is used to obtain a set of temperature values at any time, and to obtain the target temperature based on the proportion of the background to the field of view, the proportion of the target to the field of view, and the set of temperature values at any time.
[0055] As an optional implementation, the ratio calculation module specifically includes:
[0056] The background-occupying-field-of-view ratio calculation unit is used to determine the background-occupying-field-of-view ratio based on the temperature value set at the first moment and the temperature value set at the second moment.
[0057] The target-to-viewpoint ratio calculation unit is used to obtain the target-to-viewpoint ratio in the field of view based on the background ratio in the field of view.
[0058] As an optional implementation, the background-to-field ratio calculation unit specifically includes:
[0059] The sub-unit for calculating the proportion of the background to the field of view is used to calculate the proportion of the background to the field of view according to formula k. Pb =(T2) 4 -T1 4 ) / (t2 4 -t1 4 Calculate the proportion of the background to the field of view, where k Pb t2 represents the proportion of the field of view to the background, T2 represents the field of view temperature at the second moment, T1 represents the field of view temperature at the first moment, t2 represents the background temperature at the second moment, and t1 represents the background temperature at the first moment.
[0060] As an optional implementation, the target temperature calculation module specifically includes:
[0061] The target temperature calculation unit is used to calculate the temperature of the measured target according to the formula t. t =[(T 4 -k Pb ·t 4 ) / k Pt ] 1 / 4 Calculate the temperature of the target object, where t t Indicates the temperature of the target being measured, k Pb The value represents the proportion of the field of view occupied by the background, T represents the field of view temperature at any time, t represents the background temperature at any time, and k represents the background temperature at any time. Pt This indicates the proportion of the field of view occupied by the measured target.
[0062] This invention provides an electronic device, comprising:
[0063] A memory and a processor, the memory being used to store a computer program, the processor running the computer program to cause the electronic device to perform the non-contact infrared single-pixel measurement method according to the above embodiments.
[0064] This invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the non-contact infrared single-pixel measurement method as described in the above embodiments.
[0065] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the systems disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple; relevant parts can be referred to the method section.
[0066] This document uses specific examples to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of the present invention. Furthermore, those skilled in the art will recognize that, based on the ideas of the present invention, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of the present invention.
Claims
1. A non-contact infrared single-pixel measurement method, characterized in that, include: Keeping the temperature of the target object constant, changing the background temperature, and obtaining the temperature value set at the first moment and the temperature value set at the second moment; The set of temperature values includes the field temperature and the background temperature; The proportions of the background and the target within the field of view are determined based on the temperature value sets at the first and second time points; specifically, according to formula k... Pb =(T2 4 -T1 4 ) / (t2 4 -t1 4 Calculate the proportion of the background to the field of view, where k Pb t2 represents the proportion of the field of view to the background, T2 represents the field of view temperature at the second moment, T1 represents the field of view temperature at the first moment, t2 represents the background temperature at the second moment, and t1 represents the background temperature at the first moment. Obtain a set of temperature values at any given time. Based on the proportion of the background to the field of view, the proportion of the target to the field of view, and the set of temperature values at any given time, obtain the temperature of the target. Specifically, according to formula t... t =[(T 4 -k Pb ·t 4 ) / k Pt ] 1 / 4 Calculate the temperature of the target object, where t t Indicates the temperature of the target being measured, k. Pb The value represents the proportion of the field of view occupied by the background, T represents the field of view temperature at any time, t represents the background temperature at any time, and k represents the background temperature at any time. Pt This indicates the proportion of the field of view occupied by the measured target.
2. The non-contact infrared single-pixel measurement method according to claim 1, characterized in that, The proportions of the background and the target in the field of view are determined based on the temperature value set at the first time and the temperature value set at the second time, respectively. Specifically, this includes: The proportion of the background to the field of view is determined based on the temperature value set at the first time and the temperature value set at the second time. The proportion of the target object in the field of view is obtained from the proportion of the background in the field of view.
3. A non-contact infrared single-pixel measurement system, characterized in that, include: The acquisition module is used to keep the temperature of the target object constant, change the background temperature, and acquire the temperature value set at the first moment and the temperature value set at the second moment. The set of temperature values includes the field temperature and the background temperature; The proportion calculation module is used to determine the proportion of the background to the field of view and the proportion of the target to the field of view based on the temperature value set at the first time and the temperature value set at the second time; specifically, according to formula k Pb =(T2 4 -T1 4 ) / (t2 4 -t1 4 Calculate the proportion of the background to the field of view, where k Pb t2 represents the proportion of the field of view to the background, T2 represents the field of view temperature at the second moment, T1 represents the field of view temperature at the first moment, t2 represents the background temperature at the second moment, and t1 represents the background temperature at the first moment. The target temperature calculation module is used to obtain a set of temperature values at any given time. It calculates the target temperature based on the proportion of the background to the field of view, the proportion of the target to the field of view, and the set of temperature values at any given time. Specifically, it uses the formula t... t =[(T 4 -k Pb ·t 4 ) / k Pt ] 1 / 4 Calculate the temperature of the target object, where t t Indicates the temperature of the target being measured, k. Pb The value represents the proportion of the field of view occupied by the background, T represents the field of view temperature at any time, t represents the background temperature at any time, and k represents the background temperature at any time. Pt This indicates the proportion of the field of view occupied by the measured target.
4. The non-contact infrared single-pixel measurement system according to claim 3, characterized in that, The ratio calculation module specifically includes: The background-occupying-field-of-view ratio calculation unit is used to determine the background-occupying-field-of-view ratio based on the temperature value set at the first moment and the temperature value set at the second moment. The target-to-viewpoint ratio calculation unit is used to obtain the target-to-viewpoint ratio in the field of view based on the background ratio in the field of view.
5. An electronic device, characterized in that, include: A memory and a processor, the memory being used to store a computer program, the processor running the computer program to cause the electronic device to perform the non-contact infrared single-pixel measurement method according to any one of claims 1 to 2.
6. A computer-readable storage medium, characterized in that, It stores a computer program that, when executed by a processor, implements the non-contact infrared single-pixel measurement method as described in any one of claims 1 to 2.
Citation Information
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