A digital microscope for continuous observation of multiple samples

Abstract

The application discloses a kind of multiple sample continuous observation digital microscopes, including conveyor belt, the middle part of the conveyor belt is fixed with support on both sides, vertical fixed shaft is respectively arranged in two of the support, two the fixed shaft is connected together by movable plate, the middle part of the movable plate is fixed with electron microscope, and multiple arc lamps are distributed in the circumference of the movable plate below the electron microscope periphery, and each arc lamp is jointly enclosed into intermittent annular shape;Two guide plates are symmetrically arranged in the conveyor belt below the movable plate, and each guide plate is transversely slidably connected in support by multiple slide bars.Compared with prior art, the application improves the observation efficiency and imaging quality by optimizing the automation positioning, viewing angle adjustment and uniformity of illumination.

Description

Technical Field

[0001] This invention relates to the field of digital microscopy technology, specifically a digital microscope for continuous observation of multiple samples. Background Technology

[0002] Digital microscopy is an important tool for observing minute objects, combining the imaging capabilities of optical microscopy with the advantages of digital image processing technology. However, existing digital microscopes have some shortcomings in continuous observation of multiple samples: When observing samples of different sizes, it is often necessary to repeatedly adjust the microscope's position and height to accommodate the varying sample sizes. This adjustment process is time-consuming and laborious, reducing observation efficiency and increasing operational complexity and the possibility of errors. Furthermore, in digital microscopy, the uniformity of illumination is crucial for obtaining high-quality images. However, existing techniques often fail to achieve uniform illumination across samples of different sizes; the light source may not cover the entire sample surface, leading to localized overexposure or underexposure and degrading image quality.

[0003] Therefore, it is necessary to provide a digital microscope for continuous observation of multiple samples to solve the problems mentioned in the background art. Summary of the Invention

[0004] To achieve the above objectives, the present invention provides the following technical solution: a digital microscope for continuous observation of multiple samples, comprising a conveyor belt, with a bracket fixed on each side of the middle of the conveyor belt, and vertical fixed shafts respectively provided in the brackets. The two fixed shafts are connected together by a movable plate. An electron microscope is fixed in the middle of the movable plate, and multiple arc-shaped lights are distributed around the lower circumference of the movable plate around the electron microscope, with each arc-shaped light forming an intermittent ring.

[0005] Two guide plates are symmetrically arranged in the conveyor belt below the movable plate. Each guide plate is connected to the bracket in a horizontally sliding manner through multiple sliding rods.

[0006] Furthermore, as a preferred embodiment, the guide plate is a horizontal section directly below the movable plate, and the guide plate is a forward-expanding inclined section in front of the movable plate.

[0007] Furthermore, as a preferred embodiment, each of the guide plates is hinged to the movable plate via a side connecting rod, and when the distance between the two guide plates increases, the side connecting rod pushes the movable plate upward.

[0008] Furthermore, as a preferred embodiment, a spring is provided around the fixed shaft between the movable plate and the bracket, the spring providing an elastic force to bring the movable plate closer to the bracket.

[0009] Furthermore, as a preferred embodiment, the movable plate has multiple vertically extending grooves distributed around its circumference, and sliders are slidably provided in the grooves, with the bottom of each slider being fixedly connected to each arc-shaped lamp in a corresponding manner.

[0010] Furthermore, as a preferred embodiment, the tops of the two fixed shafts are fixedly connected by a fixed plate, the electron microscope is movably inserted through the fixed plate, and multiple push rods are hinged around the bottom of the fixed plate. The other end of each push rod is hinged to each slider in a corresponding manner. When the movable plate moves up and the distance between the movable plate and the fixed plate decreases, the push rod pushes each slider to slide outward synchronously.

[0011] Compared with the prior art, the beneficial effects of the present invention are:

[0012] Continuous observation: Multiple samples can be observed continuously under an electron microscope without stopping or readjusting the sample position. This greatly improves observation efficiency and saves time and manpower. Furthermore, by adjusting the guide plate and slide bar, the sample can be accurately positioned on the conveyor belt to the observation position of the electron microscope. This eliminates positioning errors in manual operation and ensures that the sample is always in the optimal observation area.

[0013] Viewpoint Adjustment: The vertical movement of the movable plate and the connection between the fixed plate and the electron microscope allow the viewing angle of the electron microscope to be automatically adjusted according to the size of the sample. This ensures that the entire sample is completely covered. Due to continuous observation and viewing angle adjustment, the electron microscope can perform complete sampling of the sample at the highest resolution, which plays an important role in applications requiring high-precision observation and analysis.

[0014] Uniform illumination: By adjusting the slider and the arc lamp, the diameter of the ring light source can be adjusted to ensure that the light source can evenly illuminate the sample, which helps to improve image quality and reduce the impact of uneven illumination.

[0015] Overall, this invention improves observation efficiency and imaging quality through automated positioning, viewing angle adjustment, and optimization of illumination uniformity, providing convenience for scientific research and industrial applications. Its application potential is broad, and it can play an important role in various fields requiring continuous observation and high-resolution sampling. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of a digital microscope for continuous observation of multiple samples.

[0017] Figure 2 This is a schematic diagram of the conveyor belt's top view structure.

[0018] Figure 3 This is a schematic diagram of the movable plate structure;

[0019] Figure 4 This is a structural diagram of the front of the movable panel;

[0020] Figure 5 This is a schematic diagram of the structure at the bottom of the movable panel;

[0021] In the diagram: 1. Conveyor belt; 2. Support; 3. Fixed shaft; 31. Spring; 4. Movable plate; 41. Slide groove; 5. Electron microscope; 6. Arc lamp; 7. Fixed plate; 8. Guide plate; 81. Inclined section; 82. Horizontal section; 9. Slide rod; 10. Side connecting rod; 11. Push rod; 12. Slider. Detailed Implementation

[0022] Please see Figure 1 In this embodiment of the invention, a digital microscope for continuous observation of multiple samples includes a conveyor belt 1. A support 2 is fixed on each side of the middle of the conveyor belt 1. Each of the two supports 2 is provided with a vertical fixed shaft 3. The two fixed shafts 3 are connected together by a movable plate 4. An electron microscope 5 is fixed in the middle of the movable plate 4. Multiple arc-shaped lights 6 are distributed around the lower circumference of the movable plate 4 around the electron microscope 5. Each arc-shaped light 6 together forms an intermittent ring.

[0023] Two guide plates 8 are symmetrically arranged in the conveyor belt 1 below the movable plate 4. Each guide plate 8 is connected to the bracket 2 in a horizontally sliding manner through multiple sliding rods 9.

[0024] Please see Figure 2 In this embodiment, the guide plate 8 has a horizontal section 82 directly below the movable plate 4, and an inclined section 81 that expands forward in front of the movable plate 4. When the sample moves from the front of the conveyor belt 1 towards the electron microscope 5, it pushes the guide plate 8 along both sides of the inclined section 81. When the sample reaches the horizontal section 82, the distance between the horizontal sections 82 of the two guide plates 8 is equal to the diameter of the sample, and the sample is centered on the conveyor belt 1.

[0025] Please see Figures 3-5 In this embodiment, each of the guide plates 8 is hinged to the movable plate 4 via a side connecting rod 10. When the distance between the two guide plates 8 increases, the side connecting rod 10 pushes the movable plate 4 upward. That is, when the diameter of the sample is larger, the distance between the guide plates 8 increases after the sample enters the space between the two guide plates 8, pushing the movable plate 4 upward and moving the electron microscope 5 away from the sample. This ensures that the viewing angle of the electron microscope 5 can cover the entire sample, ensuring that the electron microscope 5 performs complete sampling at the highest resolution.

[0026] In this embodiment, a spring 31 is sleeved on the fixed shaft 3 between the movable plate 4 and the support 2. The spring 31 provides an elastic force to bring the movable plate 4 closer to the support 2. That is, before the sample enters between the two guide plates 8, the horizontal sections 82 of the two guide plates 8 remain together, and the movable plate 4 is located at the lowest end.

[0027] In this embodiment, the movable plate 4 has multiple vertically extending grooves 41 distributed around its circumference. Sliding sliders 12 are slidably mounted within each groove 41, and the bottom of each slider 12 is fixedly connected to each of the arc-shaped lights 6. The diameter of the ring formed by the arc-shaped lights 6 can be adjusted by changing the position of the sliders 12.

[0028] In this embodiment, the tops of the two fixed shafts 3 are fixedly connected by a fixed plate 7. The electron microscope 5 movably passes through the fixed plate 7. Multiple push rods 11 are hinged to the bottom circumference of the fixed plate 7. The other end of each push rod 11 is hinged to each slider 12. When the movable plate 4 moves upward, the distance between the movable plate 4 and the fixed plate 7 decreases, and the push rods 11 push each slider 12 to slide outward synchronously. That is, when the diameter of the sample is larger, the distance between the guide plates 8 increases after it enters the space between the two guide plates 8, pushing the movable plate 4 upward. Each slider 12 slides outward synchronously, making the diameter of the ring formed by the arc lamp 6 larger. This ensures that the light source of the arc lamp 6 can cover the entire edge of the sample, ensuring that the light source of the arc lamp 6 can hit the front of the sample, making the illumination uniform and improving the imaging quality.

[0029] In practice, conveyor belt 1 is activated, allowing multiple samples to sequentially move along guide plates 8 to the observation position of electron microscope 5. As the sample enters the space between guide plates 8, the spacing between the guide plates increases, pushing the movable plate 4 upward. This is done to ensure that the viewing angle of electron microscope 5 can precisely cover the entire sample for sampling at the highest resolution. As the movable plate 4 moves upward, the distance between the movable plate 4 and the fixed plate 7 decreases, and push rod 11 pushes each slider 12 to slide outward synchronously. As the slider 12 slides, the diameter of the ring formed by the arc lamp 6 increases, ensuring that the light source of the arc lamp 6 can illuminate the front of the sample, resulting in uniform illumination and improved image quality. The image of the sample is monitored by observing the display screen of electron microscope 5 or by connecting to a computer, and necessary adjustments and analyses are made. After the sample passes through electron microscope 5, it continues to move to the next observation position on conveyor belt 1, and the observation operation is repeated.

[0030] The above description is merely a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A digital microscope for continuous observation of multiple samples, comprising a conveyor belt (1), characterized in that, The conveyor belt (1) has a bracket (2) fixed on each side of the middle section. Each of the two brackets (2) has a vertical fixed shaft (3). The two fixed shafts (3) are connected together by a movable plate (4). An electron microscope (5) is fixed in the middle of the movable plate (4). Multiple arc-shaped lights (6) are distributed around the movable plate (4) around the electron microscope (5). Each arc-shaped light (6) forms an intermittent ring. Two guide plates (8) are symmetrically arranged in the conveyor belt (1) below the movable plate (4). Each guide plate (8) is connected to the bracket (2) in a horizontally sliding manner through multiple slide rods (9). The guide plate (8) is a horizontal section (82) directly below the movable plate (4), and the guide plate (8) is an inclined section (81) that expands forward in front of the movable plate (4); Each of the guide plates (8) is hinged to the movable plate (4) by a side connecting rod (10), and when the distance between the two guide plates (8) increases, the side connecting rod (10) pushes the movable plate (4) upward.

2. The digital microscope for continuous observation of multiple samples according to claim 1, characterized in that, A spring (31) is fitted around the fixed shaft (3) between the movable plate (4) and the bracket (2), and the spring (31) provides an elastic force to bring the movable plate (4) closer to the bracket (2).

3. The digital microscope for continuous observation of multiple samples according to claim 1, characterized in that, The movable plate (4) has multiple vertically connected sliding grooves (41) distributed around its circumference. Sliding blocks (12) are slidably provided in the sliding grooves (41), and the bottom of each sliding block (12) is fixedly connected to each arc lamp (6) in a corresponding manner.

4. The digital microscope for continuous observation of multiple samples according to claim 3, characterized in that, The tops of the two fixed shafts (3) are fixedly connected by a fixed plate (7). The electron microscope (5) can be movably inserted through the fixed plate (7). Multiple push rods (11) are hinged around the bottom of the fixed plate (7). The other end of each push rod (11) is hinged to each slider (12) in a corresponding manner. When the movable plate (4) moves upward and the distance between the movable plate (4) and the fixed plate (7) becomes smaller, the push rod (11) pushes each slider (12) to slide outward synchronously.

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