A method for phase adjustment and image quality evaluation of a spliced ​​hollow pyramid array

Abstract

This invention discloses a common phase adjustment method for a spliced ​​hollow pyramid array. The method involves: configuring a common phase adjustment device; calibrating the data from each channel of a ranging interferometer; configuring the spliced ​​hollow pyramid array under test; zeroing the ADM data values; zeroing the data from each channel of the ranging interferometer; fixing the common phase adjustment device; measuring and recording the count values ​​of each data channel; and completing the common phase adjustment. This method can accurately locate and adjust the pose of each sub-mirror of the spliced ​​hollow pyramid array, and the adjustment status can be monitored in real time through the common phase adjustment device, thus effectively solving the common phase adjustment problem of spliced ​​hollow pyramid arrays. Simultaneously, based on the common phase adjustment method, an image quality evaluation method is proposed. This method involves measuring the surface shape data of each sub-mirror; integrating the surface shape data and the count values ​​of each data channel; obtaining the splicing surface data through coordinate exchange and fusion; acquiring multiple parameters of the splicing surface; and in step S4, importing the data obtained in step S3 into data splicing software to evaluate the image quality of the spliced ​​hollow pyramid array.

Description

Technical Field

[0001] This invention relates to the field of optical detection technology, specifically to a method for adjusting the phase of a spliced ​​hollow pyramid array and a method for evaluating image quality. Background Technology

[0002] Optical cooperative targets generally refer to cooperative targets used in conjunction with optical instruments for tasks such as laser ranging, tracking, and zeroing. Optical cooperative targets provide feedback signals to optical instruments to increase the energy of the laser pulse echo, extend the measuring range, and improve ranging accuracy. An ideal optical cooperative target possesses spatial directional reflection characteristics; that is, light incident from any direction returns in a direction parallel to the incident light after reflection by the optical cooperative target. Therefore, the parallelism requirement for the reflected light from the optical cooperative target is no greater than 30 arcseconds, and optical co-phase must be achieved. Conventional optical cooperative targets are single small-aperture directional reflectors. As the ranging and tracking distances increase, the aperture of the cooperative target needs to increase accordingly. However, there are significant difficulties in terms of materials, processing, testing, transportation, and manufacturing costs for single large-aperture directional reflectors. Therefore, spliced ​​hollow pyramid arrays have emerged. These arrays are formed by splicing multiple small-aperture hollow pyramids in a specific array configuration to create a large-aperture spliced ​​hollow pyramid array. However, there is currently a lack of effective adjustment methods to achieve co-phase adjustment between the sub-mirrors of the spliced ​​hollow pyramid array. Summary of the Invention

[0003] The purpose of this invention is to provide a co-phase adjustment method for a spliced ​​hollow pyramid array, which can effectively solve the technical problem of co-phase adjustment of a spliced ​​hollow pyramid array. At the same time, it proposes a method for evaluating the image quality of a spliced ​​hollow pyramid array after co-phase adjustment, thereby realizing the image quality evaluation of the spliced ​​hollow pyramid array.

[0004] This invention is achieved through the following technical solution:

[0005] A method for phase adjustment of a spliced ​​hollow pyramid array includes the following steps:

[0006] Step 1: Configure the co-phase adjustment device;

[0007] Step 2: Calibrate all data streams of the ranging interferometer;

[0008] Step 3: Configure the spliced ​​hollow pyramid array under test;

[0009] Step 4: Clear ADM data values;

[0010] Step 5: Zero all data channels of the ranging interferometer;

[0011] Step Six: Fix the co-phase adjustment device;

[0012] Step 7: Measure and record the count values ​​of each data channel;

[0013] Step 8: Complete the cophase adjustment;

[0014] The co-phase adjustment device includes a multi-path ADM ranging interferometer, a standard plane mirror, and a two-dimensional adjustment stage. To solve the aforementioned technical problems and achieve the corresponding technical effects, this invention can accurately locate and adjust the pose of each sub-mirror in a spliced ​​hollow pyramid array, and the co-phase adjustment device can monitor the adjustment status in real time, thereby effectively solving the co-phase adjustment problem of spliced ​​hollow pyramid arrays.

[0015] Further technical solutions:

[0016] In step one, the multi-path ADM ranging interferometer is first set up above the two-dimensional adjustment stage, and then the standard plane mirror is placed on the two-dimensional adjustment stage, so that all the multiple optical paths of the multi-path ADM ranging interferometer can illuminate the standard plane mirror.

[0017] Furthermore: In step two, after the common phase adjustment device is configured, the multi-path ADM ranging interferometer is turned on, and the standard plane mirror is adjusted so that the data values ​​of each optical path of the multi-path ADM ranging interferometer are consistent and the data deviation is no greater than 0.1μm.

[0018] Furthermore: In step three, after each data path is calibrated, the standard plane mirror in the cophase adjustment device is replaced with the tested spliced ​​hollow pyramid array, so that each laser path can be aligned with the center of each sub-mirror in the tested spliced ​​hollow pyramid array.

[0019] Furthermore: In step four, when the tested spliced ​​hollow pyramid array is configured and the ADM data value is cleared, the ADM reading value of the central sub-mirror of the tested spliced ​​hollow pyramid array is used as the reference data, and the ADM data values ​​of each channel are cleared.

[0020] Furthermore, in step five, the specific method for zeroing each data path is as follows: adjust the translation, tilt, and pitch of each sub-mirror in the X, Y, and Z directions so that the data values ​​of each path of the multi-path ADM ranging interferometer are zero and the data deviation is no greater than 0.1 μm.

[0021] Furthermore: In step seven, after the co-phase adjustment device is calibrated and fixed, the measurement work is carried out after 24 hours. During the measurement, it is confirmed that the deviation of each data of the multi-path ADM ranging interferometer is not greater than 0.1μm, and the count value of each data is measured. The count value of each data is recorded by numbering Ln, where n is the number of each data.

[0022] The image quality evaluation method based on the aforementioned co-phase adjustment method includes the following steps:

[0023] Step S1: Measure the shape data of each sub-mirror;

[0024] Step S2: Integrate the surface data and the count values ​​of each data path;

[0025] Step S3: Coordinate exchange and fusion to obtain the data of the stitched surface;

[0026] Step S4: Obtain multiple parameters of the splicing surface;

[0027] In step S4, the data of the splicing surface obtained in step S3 is imported into the data splicing software, and the calculated parameters include the overall surface shape, backlight parallelism, and energy concentration after splicing.

[0028] Furthermore: In step S1, the surface shape data of each sub-mirror is measured using a multi-path ADM ranging interferometer. The surface shape data of each sub-mirror is recorded by numbering [Xn, Yn, Zn], where n is the number of each sub-mirror and the number of each path of data.

[0029] Furthermore: In step S2, the surface shape data of each sub-mirror and the data count values ​​of each sub-mirror are integrated to obtain [Xn, Yn, Zn+Ln], and then the integrated data is fused by coordinate exchange to become the data of the splicing surface.

[0030] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0031] 1. The present invention provides a co-phase adjustment method for a spliced ​​hollow pyramid array, which can accurately locate and adjust the pose of each sub-mirror of the spliced ​​hollow pyramid array, and can monitor the adjustment status in real time through a co-phase adjustment device, thereby effectively solving the problem of co-phase adjustment of the spliced ​​hollow pyramid array.

[0032] 2. The present invention provides a method for evaluating the image quality of a spliced ​​hollow pyramid array. After completing the phase adjustment of the spliced ​​hollow pyramid array based on the phase adjustment method, the image quality of the spliced ​​hollow pyramid array can be effectively evaluated. Attached Figure Description

[0033] To more clearly illustrate the technical solutions of the exemplary embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly described below. It should be understood that the following drawings only show some embodiments of the present invention and should not be considered as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort. In the drawings:

[0034] Figure 1 Flowchart of the phase adjustment method for spliced ​​hollow pyramid array;

[0035] Figure 2 Flowchart of image quality evaluation method for spliced ​​hollow pyramid array;

[0036] Figure 3 This is a schematic diagram of the cophase adjustment device.

[0037] The attached diagram shows the markings and corresponding component names:

[0038] 1-Multi-path ADM ranging interferometer, 2-Standard plane mirror, 3-Two-dimensional adjustment stage. Detailed Implementation

[0039] To make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments and accompanying drawings. The illustrative embodiments and descriptions of the present invention are only used to explain the present invention and are not intended to limit the present invention.

[0040] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the invention. However, it will be apparent to those skilled in the art that these specific details are not necessary to practice the invention. In other embodiments, well-known structures, circuits, materials, or methods have not been specifically described in order to avoid obscuring the invention.

[0041] Throughout this specification, references to "an embodiment," "an example," or "an example" mean that a particular feature, structure, or characteristic described in connection with that embodiment or example is included in at least one embodiment of the invention. Therefore, the phrases "an embodiment," "an example," "an example," or "an example" appearing in various places throughout the specification do not necessarily refer to the same embodiment or example. Furthermore, specific features, structures, or characteristics can be combined in one or more embodiments or examples in any suitable combination and / or sub-combination. Moreover, those skilled in the art will understand that the illustrations provided herein are for illustrative purposes and are not necessarily drawn to scale. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0042] In the description of this invention, the terms "front", "rear", "left", "right", "up", "down", "vertical", "horizontal", "high", "low", "inner", and "outer" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting the scope of protection of this invention.

[0043] Example 1

[0044] like Figure 1 , Figure 3 As shown, the present invention provides a method for adjusting the phase of a spliced ​​hollow pyramid array, comprising the following steps:

[0045] Step 1: Configure the co-phase adjustment device;

[0046] Step 2: Calibrate all data streams of the ranging interferometer;

[0047] Step 3: Configure the spliced ​​hollow pyramid array under test;

[0048] Step 4: Clear ADM data values;

[0049] Step 5: Zero all data channels of the ranging interferometer;

[0050] Step Six: Fix the co-phase adjustment device;

[0051] Step 7: Measure and record the count values ​​of each data channel;

[0052] Step 8: Complete the cophase adjustment;

[0053] The co-phase adjustment device includes a multi-path ADM ranging interferometer 1, a standard plane mirror 2, and a two-dimensional adjustment stage 3. In this embodiment, the above steps can accurately locate and adjust the pose of each sub-mirror of the spliced ​​hollow pyramid array under test, and the adjustment status can be monitored in real time through the co-phase adjustment device, thereby effectively solving the technical problem of co-phase adjustment of the spliced ​​hollow pyramid array.

[0054] In step one, the multi-path ADM ranging interferometer 1 is first mounted above the two-dimensional adjustment stage 3. Then, the standard plane mirror 2 is placed on the two-dimensional adjustment stage 3, ensuring that all optical paths of the multi-path ADM ranging interferometer 1 illuminate the standard plane mirror 2. Specifically, the multi-path ADM ranging interferometer 1 is first fixed to the bracket, and then the two-dimensional adjustment stage 3 is placed along the optical paths of the multi-path ADM ranging interferometer 1, ensuring that each optical path of the multi-path ADM ranging interferometer 1 effectively illuminates the standard plane mirror 2 on the two-dimensional adjustment stage 3, thus completing the basic installation and fixing of the common phase adjustment device. Then, in step two, after the common phase adjustment device is configured, the multi-path ADM ranging interferometer 1 is turned on, and the standard plane mirror 2 is adjusted to ensure that the data values ​​of each optical path of the multi-path ADM ranging interferometer 1 are consistent, and the data deviation is no greater than 0.1 μm. The adjustment of the standard plane mirror 2 is achieved by adjusting the two-dimensional adjustment stage 3. When the data values ​​of each optical path of the multi-optical-path ADM ranging interferometer 1 are consistent, it indicates that the common phase adjustment device has been configured and calibrated and can be used for subsequent measurement work.

[0055] In step three, after the data is calibrated, the standard plane mirror 2 in the cophase adjustment device is replaced with the tested spliced ​​hollow pyramid array, ensuring that each laser beam is aligned with the center of each sub-mirror in the spliced ​​hollow pyramid array. In this embodiment, the multi-path ADM ranging interferometer 1 preferably includes seven laser beam paths. After the tested spliced ​​hollow pyramid array is positioned on the two-dimensional adjustment stage 3, the beam paths of each laser are adjusted to ensure that each beam path illuminates the center of a sub-mirror.

[0056] In step four, after the tested spliced ​​hollow pyramid array is configured, the device needs to be calibrated. Specifically, when zeroing the ADM data values, the ADM reading of the central sub-mirror of the tested spliced ​​hollow pyramid array is used as the reference data, and the ADM data values ​​of each path are zeroed. In step five, the specific method for zeroing the data of each path is as follows: adjust the translation, tilt, and pitch of each sub-mirror in the X, Y, and Z directions so that the data values ​​of each path of the multi-path ADM ranging interferometer 1 are zero, and the data deviation is no greater than 0.1 μm.

[0057] In step seven, after the common phase adjustment device is calibrated and fixed, the measurement work is carried out after 24 hours. During the measurement, it is confirmed that the deviation of each data of the multi-path ADM ranging interferometer 1 is not greater than 0.1μm, and the count value of each data is measured. The count value of each data is numbered and recorded using Ln, where n is the number of each data.

[0058] Example 2

[0059] like Figure 2 As shown, this embodiment provides an image quality evaluation method for a stitched hollow pyramid array based on Embodiment 1, including the following steps:

[0060] Step S1: Measure the shape data of each sub-mirror;

[0061] Step S2: Integrate the surface data and the count values ​​of each data path;

[0062] Step S3: Coordinate exchange and fusion to obtain the data of the stitched surface;

[0063] Step S4: Obtain multiple parameters of the splicing surface;

[0064] In step S4, the data of the splicing surface obtained in step S3 is imported into the data splicing software, and the calculated parameters include the overall surface shape, backlight parallelism, and energy concentration after splicing.

[0065] Specifically: In step S1, the multi-path ADM ranging interferometer 1 is used to measure the surface shape data of each sub-mirror. The surface shape data of each sub-mirror is recorded by numbering [Xn, Yn, Zn], where n is the number of each sub-mirror corresponding to the number of each path of data. In step S2, the surface shape data of each sub-mirror and the count values ​​of each path of data of each sub-mirror are integrated to obtain [Xn, Yn, Zn+Ln]. Then, the integrated data is fused by coordinate exchange to form the data of the stitching surface.

[0066] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for adjusting the phase of a spliced ​​hollow pyramid array, characterized in that, Includes the following steps: Step 1: Configure the co-phase adjustment device: First, set up the multi-path ADM ranging interferometer (1) above the two-dimensional adjustment stage (3), and then place the standard plane mirror (2) on the two-dimensional adjustment stage (3), and all the multiple optical paths of the multi-path ADM ranging interferometer (1) can illuminate the standard plane mirror (2). Step 2: Calibration of data from each path of the ranging interferometer: After the common phase adjustment device is configured, turn on the multi-path ADM ranging interferometer (1) and adjust the standard plane mirror (2) so that the data values ​​of each path of the multi-path ADM ranging interferometer (1) are consistent and the data deviation is not greater than 0.1μm; Step 3: Configure the spliced ​​hollow pyramid array under test: Replace the standard plane mirror (2) in the phase adjustment device with the spliced ​​hollow pyramid array under test, and make each laser beam be aligned with the center of each sub-mirror in the spliced ​​hollow pyramid array under test. Step 4: Zeroing ADM data values: Using the ADM reading of the central sub-mirror of the spliced ​​hollow pyramid array under test as the reference data, the ADM data values ​​of each channel are zeroed. Step 5: Zeroing the data of each path of the ranging interferometer: Adjust the translation, tilt and pitch of each sub-mirror in the X direction, Y direction and Z direction so that the data values ​​of each path of the multi-path ADM ranging interferometer (1) are zero and the data deviation is no greater than 0.1μm; Step Six: Fix the cophase adjustment device; Step 7: Measure and record the data count values ​​of each channel: After the common phase adjustment device is calibrated and fixed, wait 24 hours before performing the measurement work. During the measurement, confirm that the deviation of each channel data of the multi-channel ADM ranging interferometer (1) is not greater than 0.1μm, and measure the data count values ​​of each channel. The data count values ​​of each channel are represented by L. n Record the data by number, where n is the number of each data path; Step 8: Complete the cophase adjustment; The co-phase adjustment device includes a multi-path ADM ranging interferometer (1), a standard plane mirror (2), and a two-dimensional adjustment stage (3).

2. A method for evaluating the image quality of a spliced ​​hollow pyramid array based on the co-phase adjustment method described in claim 1, characterized in that, Includes the following steps: Step S1: Use a multi-path ADM ranging interferometer (1) to measure the surface shape data of each sub-mirror. The surface shape data of each sub-mirror is recorded by numbering [Xn, Yn, Zn], where n is the number of each sub-mirror and the number of each path data. Step S2: Integrate the surface shape data of each sub-mirror and the data count values ​​of each sub-mirror to obtain [Xn, Yn, Zn+Ln]; Step S3: Coordinate exchange and fusion to obtain the data of the stitched surface; Step S4: Obtain multiple parameters of the splicing surface; In step S4, the data of the splicing surface obtained in step S3 is imported into the data splicing software. The calculated parameters include the overall surface shape after splicing, the parallelism of the backlight, and the energy concentration.

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