Signal connection method, signal connection device and testing system

Abstract

A signal connection method, a signal connection device (201), and a test system (200) are disclosed. The method may include: configuring a first mapping relationship through the signal connection device (201) (S301), the first mapping relationship including a signal connection relationship between a module under test (203) and a hardware-in-the-loop (HIL) device (202); determining a third mapping relationship based on the first mapping relationship (S302), the third mapping relationship including a signal mapping relationship between a first processor (2042) and the HIL device (202); and determining the connection relationship for HIL testing based on the third mapping relationship (S303). This method enables signal connection configuration in HIL testing, improving the efficiency of development and verification.

Description

Technical Field

[0001] This invention relates to the field of testing equipment technology, and in particular to a signal connection method, a signal connection device, and a testing system. Background Technology

[0002] The basic principle of hardware-in-the-loop (HIL) testing is to simulate the sensor and communication signals required by one or more controllers using an HIL device, while simultaneously acquiring the control signals emitted by one or more controllers. The one or more controllers and the simulation model running in the HIL device form a closed loop, thereby achieving hardware-in-the-loop testing of one or more controllers. Today, HIL testing has become a crucial part of the electronic control unit (ECU) development process, shortening development time and reducing costs.

[0003] In HIL testing, port configuration and wiring harness fabrication are required based on the ECU's hardwired ports and the I / O board port types of the HIL testing system. This enables the ECU under test to connect to the HIL equipment, completing the test platform setup for subsequent testing. However, since whole-vehicle HIL testing involves more ECUs and a greater number of signals, the test platform setup process consumes a significant amount of time. To address this issue, related technologies mainly focus on reducing the workload of wiring harness customization, such as jumper adapters and custom wiring harnesses. However, jumper adapters and custom wiring harnesses require manual connection, which presents challenges in achieving automated configuration. Summary of the Invention

[0004] This application provides a signal connection method, signal connection device, and testing system, which can realize full-link signal connection configuration in HIL testing and improve the efficiency of development and verification.

[0005] In a first aspect, embodiments of this application provide a signal connection method, which may include: configuring a first mapping relationship through a signal connection device, the first mapping relationship including a signal connection relationship between a module under test and a hardware-in-the-loop (HIL) device; determining a third mapping relationship based on the first mapping relationship, the third mapping relationship including a signal mapping relationship between a first processor and the HIL device; wherein the first processor is used to run a simulation model, the simulation model being a model for simulating the function of the module under test; and determining the connection relationship for HIL testing based on the third mapping relationship.

[0006] As can be seen, the first aspect enables the automatic derivation of the link signal between the module under test and the first processor in HIL testing, eliminating the need for manual connection and derivation of signals. This can shorten the preparation time for HIL testing and improve the efficiency of development and verification.

[0007] In one possible implementation of the first aspect, before determining the third mapping relationship between the first processor and the HIL device based on the first mapping relationship, the method further includes: obtaining a second mapping relationship, wherein the second mapping relationship includes a signal mapping relationship between the first processor and the module under test.

[0008] The above method can directly obtain the signal mapping relationship between the first processor and the module under test. Since the first processor runs a simulation model, the signal mapping relationship between the simulation model and the module under test can also be obtained. There is no need to manually write signal connections, which can reduce the workload of global signal connection and improve signal configuration efficiency.

[0009] In one possible implementation of the first aspect, determining the third mapping relationship based on the first mapping relationship includes: determining the third mapping relationship between the first processor and the HIL device based on the second mapping relationship and the first mapping relationship.

[0010] It can be seen that the mapping of I / O resources between the first processor running the simulation model and the HIL device can be determined based on the second mapping relationship and the first mapping relationship. This eliminates the need for manual association, reduces operational errors, and improves configuration efficiency.

[0011] In one possible implementation of the first aspect, configuring a first mapping relationship via a signal connection device includes: setting a networking mode among multiple modules under test via the signal connection device; setting a first link between one or more modules under test and a HIL device via the signal connection device; and determining a first mapping relationship based on the set networking mode and the first link, so as to realize configuring the first mapping relationship via the signal connection device.

[0012] It can be seen that by setting the networking mode between different modules under test through the signal connection device, resource pooling of the modules under test can be achieved. Furthermore, by controlling the signal link between the modules under test and the HIL device through the signal connection device, resource pooling of the HIL device can be achieved.

[0013] In one possible implementation of the first aspect, the signal connection device includes multiple ports. Setting a networking mode among multiple modules under test (DUTs) via the signal connection device includes: setting multiple port identifiers corresponding to the multiple ports, for example, a first port identifier corresponding to a first port of the signal connection device, a second port identifier corresponding to a second port of the signal connection device, a third port identifier corresponding to a third port of the signal connection device, and so on. Different port identifiers can be the same or different. The networking mode among the multiple DUTs is set based on the port identifiers.

[0014] As can be seen, the networking mode between different modules under test can be set through the signal connection device, so that there is no need to manually connect to define the network topology, reducing errors caused by manual operation and improving configuration efficiency.

[0015] In one possible implementation of the first aspect, multiple modules under test are connected to a signal connection device via multiple ports, and a networking mode between the multiple modules under test is set based on port identifiers, including: setting a second link between a first module under test and a second module under test based on port identifiers, wherein the multiple modules under test include a first module under test and a second module under test, and the port identifier is an identifier corresponding to a port of the signal connection device; and setting a networking mode between the multiple modules under test based on the second link.

[0016] As can be seen, port-based configuration can limit message broadcasting within the connection range, completing the exchange between ports. The networking between the modules under test is not sensitive to port configuration, therefore it will not affect network message transmission.

[0017] In one possible implementation of the first aspect, setting a second link between a first module under test (DUT) and a second DUT based on port identifiers includes: determining signal transmission between the first DUT and the second DUT when the first port identifier and the second port identifier are the same, thereby setting a second link between the first DUT and the second DUT through the port identifiers; wherein, the first port identifier is the identifier corresponding to a first port of the signal connection device, and the first port is the port connected to the first DUT; the second port identifier is the identifier corresponding to a second port of the signal connection device, and the second port is the port connected to the second DUT. It can be seen that port-based configuration (setting port identifiers to be the same) can limit message broadcasting within the connection range and complete the exchange between ports. The networking between DUTs is not sensitive to port configuration, therefore it will not affect network message transmission.

[0018] In one possible implementation of the first aspect, a port connection relationship is determined, the port connection relationship including a first port identifier and a second port identifier, the first port identifier being an identifier corresponding to a first port of the signal connection device, the first port being a port connected to the first module under test; the second port identifier being an identifier corresponding to a second port of the signal connection device, the second port being a port connected to the second module under test; and a second link is set between the first module under test and the second module under test based on the port connection relationship.

[0019] It can be seen that port-based configuration and established forwarding relationships can limit message broadcasting within the connection range, completing the exchange between ports. The networking between the modules under test is not sensitive to port configuration, therefore it will not affect network message transmission.

[0020] In one possible implementation of the first aspect, the port of the signal connection device includes an Ethernet port or a CAN port.

[0021] In one possible implementation of the first aspect, the above method can be applied to model testing and / or bench testing, wherein the bench testing includes physical components corresponding to the simulation model, and the physical components are connected to signal connection devices.

[0022] As can be seen, the signal links in HIL simulation testing and bench testing can be configured through the embodiments of this application without manual configuration, enabling hybrid simulation. This allows for comparison of model simulation results with physical component simulation results, improving testing and verification efficiency.

[0023] In one possible implementation of the first aspect, after controlling the connection of the end-to-end signals in the HIL simulation test according to the third mapping relationship, the method further includes: constructing a test instance based on a test request from the user equipment. The test instance is used to provide the user equipment with the resources of the target module under test corresponding to the test request.

[0024] As can be seen, the embodiments of this application can provide the resources required for the test instance to the user equipment according to the needs of the user equipment, thereby meeting the testing needs of different scales and improving the utilization rate of HIL test resources.

[0025] In one possible implementation of the first aspect, constructing a test instance based on a test request from a user equipment includes: allocating a corresponding target module under test and I / O port to the user equipment based on the test request, wherein the I / O port is a port on the HIL device; and constructing a test instance based on the target module under test and the I / O port.

[0026] As can be seen, after the test is initiated, this embodiment of the application can allocate HIL test resources from the I / O resource pool and the module under test resource pool as needed according to the test request, thereby meeting the HIL test needs of different scales and improving the utilization rate of HIL test resources. Based on the allocated I / O port mapping relationship and HIL configuration requirements, the mapping between model signals and I / O ports is automatically derived to complete the full-link signal connection to build test instances.

[0027] In one possible implementation of the first aspect, constructing a test instance based on the resources and I / O ports of the target module under test includes: determining a fourth mapping relationship based on the resources of the target module under test, the fourth mapping relationship including the signal connection relationship between the target module under test and the first processor; determining a fifth mapping relationship based on the I / O ports, the fifth mapping relationship including the signal connection relationship between the target module under test and the HIL device; determining a sixth mapping relationship between the first processor and the HIL device based on the fourth mapping relationship and the fifth mapping relationship; and constructing a test instance based on the sixth mapping relationship.

[0028] As can be seen, the embodiments of this application can automatically derive the mapping between model signals and HIL device I / O resources, which can reduce the time spent on software and hardware configuration, reduce the idle time of HIL device resources, and reduce the cost of use.

[0029] Secondly, embodiments of this application provide a signal connection device for controlling the signal connection between the module under test (DUT) and the HIL (Hardware Instruction Level) device. The device includes a first configuration unit and a second configuration unit.

[0030] The first configuration unit is used to set the networking mode between multiple modules under test;

[0031] The second configuration unit is used to set up the first link between one or more modules under test and the HIL device.

[0032] In one possible implementation of the second aspect, the first configuration unit includes multiple ports, and the first configuration unit is specifically used for: setting multiple port identifiers corresponding to the multiple ports; and setting the networking mode between the multiple modules under test based on the port identifiers.

[0033] In one possible implementation of the second aspect, multiple modules under test are respectively connected to a first configuration unit via ports. The first configuration unit is specifically used for: setting a second link between the first module under test and the second module under test based on port identifiers, wherein the multiple modules under test include the first module under test and the second module under test, and the port identifier is the identifier corresponding to the port of the signal connection device; and setting a networking mode between the multiple modules under test based on the second link.

[0034] In one possible implementation of the second aspect, the first configuration unit is specifically configured to: determine the signal transmission between the first module under test and the second module under test when the first port identifier is the same as the second port identifier, so as to realize the setting of a second link between the first module under test and the second module under test through the port identifier; wherein, the first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test; the second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

[0035] In one possible implementation of the second aspect, the first configuration unit is specifically configured to: determine a port connection relationship, the port connection relationship including a first port identifier and a second port identifier, the first port identifier being an identifier corresponding to a first port of the signal connection device, the first port being a port connected to the first module under test; the second port identifier being an identifier corresponding to a second port of the signal connection device, the second port being a port connected to the second module under test; and setting a second link between the first module under test and the second module under test based on the port connection relationship.

[0036] In one possible implementation of the second aspect, the port includes an Ethernet port or a CAN port for a control local area network.

[0037] Thirdly, embodiments of this application provide a test system, which may include the signal connection device in any implementation of the second aspect above; a hardware-in-the-loop (HIL) test device connected to the signal connection device; and a module under test connected to the signal connection device.

[0038] In one possible implementation of the third aspect, the test system further includes a first processor for running a simulation model, the simulation model being a model that simulates the function of the module under test; the test system also includes a signal mapping relationship between the first processor and the module under test.

[0039] In one possible implementation of the third aspect, the test system operates on at least one of the following devices: a public cloud device, a private cloud device, or a local device.

[0040] Fourthly, embodiments of this application provide a signal connection device, which can include a control unit for configuring a first mapping relationship through the signal connection device, the first mapping relationship including a signal connection relationship between the module under test and the hardware-in-the-loop (HIL) device; a processing unit for determining a third mapping relationship based on the first mapping relationship, the third mapping relationship including a signal mapping relationship between a first processor and the HIL device, wherein the first processor is used to run a simulation model, the simulation model being a model for simulating the function of the module under test; and a connection unit for determining the connection relationship for HIL testing based on the third mapping relationship.

[0041] In one possible implementation of the fourth aspect, the device further includes: an acquisition unit for acquiring a second mapping relationship, wherein the second mapping relationship includes a signal mapping relationship between the first processor and the module under test.

[0042] In one possible implementation of the fourth aspect, the processing unit is specifically configured to determine the third mapping relationship based on the second mapping relationship and the first mapping relationship.

[0043] In one possible implementation of the fourth aspect, the control unit is specifically configured to: set a networking mode among multiple modules under test via a signal connection device; set a first link between one or more modules under test and the HIL device via a signal connection device; and determine a first mapping relationship based on the set networking mode and the first link, so as to configure the first mapping relationship via the signal connection device.

[0044] In one possible implementation of the fourth aspect, the device includes multiple ports and a control unit specifically configured to: set multiple port identifiers corresponding to the multiple ports via a signal connection device; and set a networking mode between the multiple modules under test based on the port identifiers. For example, a first port identifier corresponding to the first port of the signal connection device, a second port identifier corresponding to the second port of the signal connection device, a third port identifier corresponding to the third port of the signal connection device, and so on. Different port identifiers can be the same or different.

[0045] In one possible implementation of the fourth aspect, multiple modules under test are connected to the device through multiple ports. The control unit is specifically used to: set a second link between the first module under test and the second module under test based on port identifiers, wherein the multiple modules under test include the first module under test and the second module under test, and the port identifier is the identifier corresponding to the port of the signal connection device; and set a networking mode between the multiple modules under test based on the second link.

[0046] In one possible implementation of the fourth aspect, the control unit is specifically configured to: determine the signal transmission between the first module under test and the second module under test when the first port identifier and the second port identifier are the same, so as to realize the setting of a second link between the first module under test and the second module under test through the port identifier; wherein, the first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test; the second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

[0047] In one possible implementation of the fourth aspect, the control unit is specifically configured to: determine a port connection relationship, the port connection relationship including a first port identifier and a second port identifier, the first port identifier being an identifier corresponding to a first port of the signal connection device, the first port being a port connected to the first module under test; the second port identifier being an identifier corresponding to a second port of the signal connection device, the second port being a port connected to the second module under test; and setting a second link between the first module under test and the second module under test based on the port connection relationship.

[0048] In one possible implementation of the fourth aspect, the port includes an Ethernet port or a CAN port for a control local area network.

[0049] In one possible implementation of the fourth aspect, the device is used for model testing and bench testing, the bench testing including signal connection devices for the physical components corresponding to the simulation model.

[0050] In one possible implementation of the fourth aspect, the connection unit is configured to construct a test instance based on a test request from a user device, the test instance being used by the user device to access the resources of the target module under test corresponding to the test request.

[0051] In one possible implementation of the fourth aspect, the processing unit is configured to allocate a corresponding target module under test and I / O port to the user equipment according to the test request, wherein the I / O port is a port in the HIL device; the connection unit is configured to construct a test instance according to the target module under test and the I / O port.

[0052] Fifthly, embodiments of this application provide a computer-readable storage medium storing instructions that, when executed on at least one processor, implement the method described in any of the first aspects above.

[0053] Sixthly, this application provides a computer program product including computer instructions that, when executed on at least one processor, implement the method described in any of the first aspects. The computer program product can be a software installation package, which can be downloaded and executed on a computing device when the aforementioned method is required.

[0054] The beneficial effects of the technical methods provided in the second to sixth aspects of this application can be referred to the beneficial effects of the technical solution in the first aspect, and will not be repeated here. Attached Figure Description

[0055] Figure 1 This is a schematic diagram of a central computing architecture provided in an embodiment of this application;

[0056] Figure 2A This is a schematic diagram of a testing system provided in an embodiment of this application;

[0057] Figure 2B This is a schematic diagram of a physical component software assembly package provided in an embodiment of this application;

[0058] Figure 3A This is a schematic diagram of signal connections in a HIL simulation test provided in an embodiment of this application;

[0059] Figure 3B This is a schematic flowchart of a signal connection method provided in an embodiment of this application;

[0060] Figure 4 This is a schematic diagram of a signal connection device provided in an embodiment of this application;

[0061] Figure 5A This is a schematic diagram of a networking mode between modules under test provided in an embodiment of this application;

[0062] Figure 5B This is a schematic diagram of another networking mode between modules under test provided in an embodiment of this application;

[0063] Figure 6 This is a schematic diagram of a hybrid simulation test provided in an embodiment of this application;

[0064] Figure 7 This is a schematic diagram illustrating a simulation test implemented based on cloud computing services, as provided in an embodiment of this application.

[0065] Figure 8 This is a schematic diagram of resource allocation provided in an embodiment of this application;

[0066] Figure 9 This is a schematic diagram of the structure of a signal connection device provided in an embodiment of this application;

[0067] Figure 10 This is a schematic diagram of the structure of a computing device provided in an embodiment of this application. Detailed Implementation

[0068] The embodiments of the present invention will now be described with reference to the accompanying drawings.

[0069] In the development of electronic control equipment in industries such as automobiles and aerospace, hardware-in-the-loop (HIL) testing has become a crucial part of the electronic control unit (ECU) development process. This shortens development time, reduces verification costs, and ensures the software quality of the ECU.

[0070] For example, please refer to the following: (Using automobiles as an example) Figure 1 , Figure 1 This is a schematic diagram of a Central Computing Architecture (CCA) 100 provided in an embodiment of this application. It should be noted that the vehicles mentioned in this embodiment include, but are not limited to, intelligent vehicles, new energy vehicles, or traditional vehicles. Intelligent vehicles may include autonomous driving vehicles, driverless cars, etc. New energy vehicles include pure electric vehicles, enhanced electric vehicles, hybrid electric vehicles, fuel cell electric vehicles, hydrogen engine vehicles, and other new energy vehicles. Traditional vehicles include gasoline vehicles, diesel vehicles, etc., and this embodiment does not limit the types of vehicles.

[0071] The central computing architecture 100 may include distributed gateways (such as one or more I / O gateways) and a data center (xData Center), xDC (such as intelligent cockpit CDC, vehicle control VDC, and intelligent driving MDC). The intelligent cockpit CDC is used for intelligent cockpit control; the vehicle control VDC is used for vehicle power control; and the intelligent driving MDC is used for intelligent driving control.

[0072] A distributed gateway can provide device access, connecting to the xDC (automotive control center) on one side, vehicle components on the other, and also to the telematics box (T-box). Therefore, the distributed gateway can be a core component in the vehicle's central computing architecture and a data exchange hub for the entire vehicle network. The distributed gateway and xDC can run the integrated controller logic. The T-box is primarily used for communication with external vehicle systems, backend systems, and mobile applications.

[0073] Vehicle components include actuators that perform specific functions. These actuators may be, for example, actuators or sensors in the vehicle. Vehicle components may also include ECUs (Electronic Control Units). Furthermore, vehicle components may include one or more of the following: vehicle components with partial or complete electronic control functions, and vehicle components without electronic control functions.

[0074] Among them, vehicle components that enable autonomous driving include monocular cameras, binocular cameras, millimeter-wave radar, lidar, and ultrasonic radar.

[0075] Vehicle components that enable a smart cockpit include head-up displays, instrument displays, radios, navigation systems, and cameras.

[0076] Vehicle components that enable overall vehicle control include components in the body domain and components in the chassis domain. Components in the body domain include window and door controllers, power mirrors, air conditioning, and central locking systems. Components in the chassis domain include components in the braking system, steering system, and acceleration system, such as the accelerator pedal.

[0077] An ECU (Electronic Control Unit) is located inside an automotive component and consists of one or more large-scale integrated circuits, including a processor, memory, input / output (I / O) interfaces, analog-to-digital converters (A / D), and shaping and driving functions. It possesses electronic control capabilities and can perform a wide variety of functions. For example, it can control automotive components based on control information, or it can process data to be transmitted within automotive components.

[0078] It should be noted that the aforementioned electronic control functions mainly include logic control functions and data processing functions. Logic control functions include controlling vehicle components to perform certain operations based on acquired control information; for example, controlling the operation of windshield wipers; or controlling the open / closed state of door locks. Data processing functions include processing data from vehicle components; for example, processing rainfall information collected by the wiper's sensor to determine the wiper's operating state, including its operating frequency or on / off status; or processing fingerprint information collected by the door lock's sensor to determine the door's open / closed status.

[0079] It should be noted that, unless otherwise specified, the ECU in the embodiments of this application refers to an electronic control element located within a vehicle component, which differs from the engine control unit (ECU) in the prior art. The engine control unit is located outside multiple vehicle components within the engine system and is used to control these components; it can be considered an independent centralized controller. However, the electronic control unit (ECU) in the embodiments of this application refers to an electronic control unit located inside a vehicle component, for example, it could be an electronic control unit located within multiple vehicle components within the engine system.

[0080] It should be noted that the aforementioned communication connection can be understood as a wireless or wired connection for information transmission. This application embodiment does not limit this. A wireless connection can be understood as the xDC communicating with other units in the vehicle without needing a bus, for example, using Bluetooth or Wi-Fi communication. A wired connection can be understood as the DC communicating with other units in the vehicle via a bus or Ethernet connection, for example, using a Controller Area Network (CAN) bus, a Local Interconnect Network (LIN) bus, a peripheral component interconnect express (PCI-e) standard, or Ethernet communication technology.

[0081] In HIL testing, interface configuration and wiring harness fabrication are required based on the ECU's hardwired interfaces and the I / O board interface types of the HIL testing system. This ensures the ECU under test can connect to the HIL equipment, completing the test platform setup for subsequent testing. Figure 1 As can be seen, vehicles involve a large number of ECUs, so whole-vehicle HIL testing involves even more ECUs and signals, resulting in a significant time commitment during test platform setup. To address this issue, related technologies utilize signal conversion devices such as break-out boxes (BOBs, or signal adapters) connected in series between the I / O boards and the ECUs to achieve the connection between the hardware-in-the-loop test system and the ECUs.

[0082] The signal conversion device provided in related technologies includes a first connector and a second connector. The first connector connects to the hardware-in-the-loop test system, and the second connector connects to the ECU. Some technical solutions involve custom wiring harnesses, where the first and second connectors, as well as the connection mapping between them, are specifically configured according to the interface characteristics of the ECU being tested and the interface features of the hardware-in-the-loop test signals to meet the connection requirements between the ECU and the hardware-in-the-loop test system. However, custom wiring harnesses require time and cost, and manual replacement is still necessary. Other technical solutions use jumper adapter boards, where the first and second connectors are connected via a switch. When a custom interface configuration is needed, the user closes or opens the switch as required and then manually connects the pins of the connectors at both ends using a hardwire. However, jumper adapter boards also require manual connection and cannot be automated.

[0083] As HIL testing shifts from single-ECU to vehicle-level HIL testing, the number of signals required to connect to the HIL testing system increases nearly a hundredfold. Manual interventions in related technologies may introduce operational errors, while customization may increase time and costs, impacting development and verification efficiency.

[0084] To address the aforementioned technical problems, this application first provides a system. Please refer to... Figure 2A , Figure 2A This is a schematic diagram of a testing system 200 provided in an embodiment of this application. For example... Figure 2A As shown, the hardware component of the test system 200 may include a signal connection device 201, a hardware-in-the-loop (HIL) test device 202, and a module under test (DUT) 203. The HIL test device 202 and the DUT 203 are respectively connected to the signal connection device 201, and can exchange information through the signal connection device 201.

[0085] HIL device 202 includes a first processor capable of running simulation models, I / O boards suitable for HIL testing, and a power supply module.

[0086] When there are multiple modules under test 203, the signal connection device 201 is used to set the networking mode between multiple modules under test, and to control the selective conduction of low-speed I / O between one or more modules under test and HIL device.

[0087] The module under test 203 includes at least one I / O gateway and one or more components.

[0088] Depending on the number of modules under test (DUT) 203, the hardware of the test system 200 can take on different product forms. For example, the hardware of the test system 200 can be a multi-rack configuration, meaning the HIL device 202, signal connection device 201, and DUT 203 are each independent devices. Alternatively, the hardware of the test system 200 can be a highly integrated single-rack configuration, meaning the HIL device 202, signal connection device 201, and DUT 203 are integrated into the same device. Or, the hardware of the test system 200 can be a partially integrated multi-rack configuration; for example, the HIL device 202 and signal connection device 201 are integrated into one device, while the DUT 203 is an independent device.

[0089] like Figure 2A As shown, the software portion of the test system 200 may include a physical component software assembly package 204, simulation model management 205, signal connection management 206, I / O gateway configuration 207, and service orchestration 208. Among these,

[0090] Please see Figure 2B , Figure 2B This is a schematic diagram of a physical component software assembly package 204 provided in an embodiment of this application. Figure 2B It can be seen that the physical component software assembly package 204 includes a simulation model 2041, a module under test 203, and a second mapping relationship 2043.

[0091] The first processor 2042 is used to run the simulation model 2041 and process information. The simulation model 2041 specifically includes one or more of the following: a road environment model, an ECU model, a mechanical model, and an electrical model, as well as the conversion between physical quantities and interactive signals. It can simulate the working characteristics of real parts and their sensors and actuators. Taking a car as an example, the simulation model 2041 can include a vehicle dynamics model and a controlled object model. The vehicle dynamics model is used to simulate vehicle operation scenarios, and the controlled object model includes at least an engine model, a power coupling mechanism model, a motor model, and a battery model, respectively used to simulate the engine, power coupling mechanism, motor, and battery.

[0092] The module under test 203 may include actual components and their sensors, actuators, application product models, names, port settings, and signal conversion I / O resources, etc. It is understood that the module under test 203 can be an application program used to implement functional logic. It should be noted that the number of modules under test 203 can be one or more; this embodiment does not impose any limitation.

[0093] The second mapping relationship 2043 includes the signal mapping relationship between the first processor 2042 and the module under test 203. Specifically, the second mapping relationship 2043 can be the signal mapping relationship between the simulation model 2041 in the first processor 2042 and the module under test 203, such as the mapping between ports on the module under test 203 and ports on the simulation model 2041. It is understood that because the simulation model is a virtual model designed based on the physical component, the ports on the simulation model correspond to the ports on the physical component. Therefore, the second mapping relationship 2043 can also be the signal mapping relationship between the physical component and the module under test 203.

[0094] from Figure 2A As can be seen, the simulation model management 205 is used to manage the simulation model 2041 in the physical component software assembly package 204. Among them, the simulation model 2041 is a model deployed on the hardware-in-the-loop test equipment 202 to test the functionality of the module under test 203.

[0095] Signal connection management 206 is used to control the signal connection between signal connection device 201 and hardware-in-the-loop test equipment 202 and module under test 203.

[0096] I / O gateway configuration 207 is used to configure the I / O interface of the underlying software (such as the software corresponding to the module under test 203), that is, to calibrate the physical meaning and engineering unit of the I / O port data, and to set the conversion relationship between analog signals and actual physical values.

[0097] Service orchestration 208 is used to orchestrate the service components corresponding to the module under test 203 according to actual needs to obtain new services that meet its own actual needs. The module under test 203 can be deployed on service orchestration 208.

[0098] It should be noted that, Figure 2A The test system shown can run in the cloud (such as a public or private cloud) or on a local device. Furthermore, the high-performance computer running the simulation model in the test system can run in the cloud, while other parts (such as signal connection devices, modules under test, etc.) can run locally.

[0099] As can be understood, the basic principle of HIL testing is to simulate the sensing and communication signals required by one or more controllers using HIL equipment, while simultaneously acquiring the control signals emitted by one or more controllers. These controllers and the simulation model running within the HIL equipment form a closed loop. Please see [link / reference]. Figure 3A , Figure 3A This is a schematic diagram of signal connections in a HIL simulation test provided in an embodiment of this application.

[0100] In related technologies, supplier A typically provides a simulation model 2041, supplier B provides the module under test (DUT) 203, and the integrator writes the signal connection documentation between the simulation model 2041 and the DUT 203. Therefore, in HIL testing of related technologies, manual documentation is required to obtain the second mapping relationship between the simulation model 2041 and the DUT 203. In the embodiments of this application, Figure 2A or Figure 2B The physical component software assembly package 204 shown contains the mapping relationship between the simulation model 2041 in the first processor 2042 and the module under test 203. Therefore, the electronic device can obtain the second mapping relationship through the physical component software assembly package 204.

[0101] In related technologies, the connection between the HIL device 202 and the module under test 203 requires a custom wiring harness or patch panel adapter. In this embodiment, the electronic device can configure a first mapping relationship between the HIL device 202 and the module under test 203 via the signal connection device 201. Furthermore, the electronic device can set the networking mode among multiple modules under test 203 via the first configuration unit 2011, and then the electronic device can control the signal link between one or more modules under test 203 and the HIL device 202 via the second configuration unit 2012.

[0102] In related technologies, the I / O mapping relationship between the simulation model 2041 and the HIL device 202 needs to be manually associated. In this embodiment, the electronic device can determine a third mapping relationship between the simulation model 2041 in the first processor 2042 and the HIL device 202 based on the second mapping relationship and the first mapping relationship. Finally, the electronic device can form a closed loop between the module under test 203 and the simulation model 2041 running in the first processor 2042.

[0103] Please see Figure 3B , Figure 3B This is a flowchart illustrating a signal connection method provided in an embodiment of this application. This method can be applied to... Figure 2A The system shown, through Figure 3B The method shown can achieve Figure 3A The signal connections are shown. Figure 3B The signal connection method shown includes, but is not limited to, the following steps:

[0104] Step S301: Configure the first mapping relationship through the signal connection device.

[0105] Specifically, in HIL testing, port configuration of the module under test (DUT) and the HIL device is a necessary step. Generally, a signal connection device is connected in series between the DUT and the HIL device. The electronic device can configure the signal mapping between the DUT and the HIL device through this connection device, i.e., the first mapping relationship. Furthermore, the HIL device may include a device with I / O boards installed. Therefore, the first mapping relationship can be the signal mapping between the DUT and the I / O boards of the HIL device.

[0106] In one possible implementation, one or more modules under test (DUTs) can be connected to a signal connection device. When multiple DUTs are connected to the signal connection device, the electronic device can configure the networking mode between the multiple DUTs through the signal connection device. For example, DUTs A, B, C, and D are each connected to the signal connection device. The electronic device can configure the communication links between DUTs A and B, B and C, C and D, and D and C through the signal connection device. Therefore, DUTs A, B, C, and D can form a ring network.

[0107] Furthermore, the signal connection device includes multiple ports, which may include Ethernet ports or CAN (Content Management Area Network) ports. Electronic devices can configure multiple port identifiers corresponding to each port through the signal connection device, thereby enabling the electronic devices to configure the networking mode between multiple modules under test (DUTs) based on the port identifiers. Further still, multiple DUTs are connected to the signal connection device through multiple ports respectively. For example, DUT A is connected to the signal connection device through the first port, DUT B through the second port, DUT C through the third port, and DUT D through the fourth port.

[0108] Furthermore, when configuring the networking mode between multiple modules under test (DUTs), the electronic device can obtain configuration information about the networking mode. For example, the configuration information might include the need to establish a communication link between DUT A and DUT B, between DUT B and DUT C, and between DUT C and DUT A. Therefore, after obtaining the configuration information about the networking mode, the electronic device can configure the networking mode between multiple DUTs based on this information. That is, the electronic device can set a second link between the first and second DUTs based on port identifiers, and then set the networking mode between the multiple DUTs based on the second link. Here, the first and second DUTs belong to the aforementioned multiple DUTs, the port identifier is the identifier corresponding to the port of the signal connection device, and the first and second DUTs are the modules for which communication links need to be established according to the configuration information.

[0109] In one possible implementation, after obtaining configuration information about the network mode, the electronic device can set the identifier of the second port based on the first port identifier. The first port identifier and the second port identifier are set to be the same. The first port identifier corresponds to the identifier of the first port of the signal connection device, and the first port is the port where the first module under test (DUT) connects to the information connection device; the second port identifier corresponds to the identifier of the second port of the signal connection device, and the second port is the port where the second DUT connects to the signal connection device. Then, when the first port identifier and the second port identifier are the same, the electronic device can forward a first Ethernet message to the second DUT through the second port according to the identifier of the first port, thereby establishing a second link between the first DUT and the second DUT through the port identifier. That is, after receiving the first Ethernet message from the first DUT through the first port, the electronic device adds the identifier of the first port to the first Ethernet message. Furthermore, the electronic device can transmit the first Ethernet message to the second port, which has the same identifier as the first port, according to the identifier of the first port. Because the second port is the port where the second DUT connects to the signal connection device, the first Ethernet message from the first DUT can be transmitted to the second DUT. When the first Ethernet packet is forwarded from the first module under test to the second module under test, the second link between the first and second modules under test can be determined. Therefore, the electronic device can set up the second link between the first and second modules under test based on the port identifier.

[0110] In one possible implementation, after obtaining configuration information about the network mode, the electronic device can configure port connection relationships through a signal connection device. These port connection relationships represent the connections between various ports and include port identifiers. For example, port connection relationships might include connections between a first port identifier and a second port identifier, or connections between a third port identifier and a fourth port identifier. When the electronic device receives an Ethernet packet from the first module under test (DUT) through the first port, it can add the first port identifier to the Ethernet packet from the DUT. Here, the first port identifier is the identifier corresponding to the first port of the signal connection device. When the port forwarding relationship is a connection between the first port identifier and the second port identifier, the electronic device can forward a second Ethernet packet with the added first port identifier to the second port where the second port identifier resides, based on the port connection relationship. Because the second port is the port on the signal connection device where the second DUT connects, the electronic device can forward Ethernet packets to the second DUT through the second port. When the first Ethernet packet is forwarded from the first DUT to the second DUT, the second link between the first DUT and the second DUT can be determined. Therefore, the electronic device sets up the second link between the first DUT and the second DUT based on the port identifier.

[0111] Finally, the electronic device can set up a networking mode between multiple modules under test (DUTs) based on the second link, thereby enabling network configuration of different DUTs and achieving resource pooling of the DUTs. For example, for DUTs A, B, and C, the second link can include the communication link between DUTs A and B, the communication link between DUTs B and C, and the communication link between DUTs C and A. Therefore, the electronic device can set up a networking mode between DUTs A, B, and C based on the second link, such as a ring network. It is understandable that in the development of functions in automobiles, aerospace, and other fields, multiple modules need to cooperate to verify a new function. Therefore, the electronic device can set up a networking mode between multiple DUTs through signal connection devices to verify a specific function.

[0112] For example, the electronic device receives configuration information regarding the network topology, indicating a ring network between module A, module B, and module C under test. The electronic device can forward a first Ethernet packet from module A to a second port (the port on the signal connection device connected to module A) based on the port identifier of the first port. Thus, the first packet can be forwarded to module B. Therefore, the electronic device can establish a second link between module A and module B based on the port identifier of the first port. Similarly, the electronic device can forward a second packet from module B to a third port (the port on the signal connection device connected to module B) based on the second port identifier. Thus, the second packet can be forwarded to module C. Therefore, the electronic device can establish a second link between module B and module C based on the port identifier of the second port. Likewise, the electronic device can establish a second link between module C and module A. Therefore, electronic devices can be configured in a ring network mode between module A, module B, and module C based on the second link.

[0113] After an electronic device sets up a network mode for multiple modules under test (DUTs) via a signal connection device, one or more DUTs can output control signals. The electronic device can then transmit these control signals to the HIL device via the signal connection device. Furthermore, the electronic device can also control the signal link between one or more DUTs and the HIL device via the signal connection device, thereby establishing a first link between the DUTs and the HIL device. Based on the established network mode and the first link, the electronic device can obtain a first mapping relationship, that is, the mapping relationship between the ports of the DUTs in the network mode and the I / O ports of the HIL device. For example, if the modules under test (DUT) A, B, and C are connected in a ring network, and the electronic device sets up a first link between DUT A and the HIL device through a signal connection device, then the first mapping relationship determined by the electronic device based on the set ring network mode and the first link between DUT A and the HIL device can include: port mapping between DUT A and DUT B, port mapping between DUT B and DUT C, port mapping between DUT C and DUT A, and port mapping between the I / O ports of DUT A and the HIL device.

[0114] It is understandable that the port resources (such as I / O resources) of HIL devices are limited, and electronic devices can flexibly configure these resources through signal connection devices. For example, for a module under test (DUT) that requires functional testing, the electronic device can establish a signal link between the DUT and the HIL device through a signal connection device; for a DUT that does not require functional testing, the electronic device can close the signal link between the DUT and the HIL device through a signal connection device.

[0115] Step S302: Determine the third mapping relationship based on the first mapping relationship.

[0116] Specifically, the first processor runs a simulation model, which is a virtual model that simulates the functionality of the module under test (DUT). The ports of the DUT are real electrical ports and cannot be directly connected to the virtual model in the first processor. The HIL device, however, can provide I / O boards, allowing the first processor to obtain real electrical ports for the simulation model to connect to the DUT. Therefore, the first mapping relationship can be a mapping between the ports of the DUT and the ports of the HIL device's I / O boards. Based on this first mapping relationship, the electronic device can determine the signal mapping relationship between the simulation model in the first processor and the I / O board ports of the HIL device.

[0117] In one possible implementation, the electronic device can also acquire a second mapping relationship, which includes the signal mapping relationship between the first processor and the module under test (DUT). The electronic device then configures the first mapping relationship according to the signal connection device. Finally, the electronic device can deduce the signal mapping relationship between the first processor and the DUT based on the signal mapping relationship between the first processor and the DUT, and the signal mapping relationship between the DUT and the HIL device.

[0118] Furthermore, the electronic device can obtain the physical component software assembly package, which contains a simulation model, a module under test (DUT), and a second mapping relationship. Therefore, the electronic device can obtain the signal mapping relationship between the simulation model in the first processor and the DUT from the physical component software assembly package. Based on the mapping relationship between the simulation model in the first processor and the DUT, and the signal mapping relationship between the DUT and the HIL device, the electronic device can derive the mapping table of I / O resources between the first processor and the HIL device, i.e., the third mapping relationship.

[0119] Step S303: Control the connection relationship of HIL test according to the third mapping relationship.

[0120] Specifically, after obtaining the third mapping relationship, the electronic device can connect the signals of the simulation module running in the first processor with the module under test (DUT) according to the first, second, and third mapping relationships. This allows communication between the simulation model and the DUT, achieving full-link signal connection in HIL testing. Therefore, the HIL device can issue commands to the DUT, and the DUT can generate control signals based on these commands. The HIL device can receive the control signals sent by the DUT and control the simulation model to perform corresponding actions based on these signals.

[0121] It should be noted that the electronic devices mentioned in the embodiments of this application can be devices with data processing capabilities and data transmission and reception capabilities.

[0122] Please see Figure 4 , Figure 4 This is a schematic diagram of a signal connection device 201 provided in an embodiment of this application. The signal connection device 201 is used for control... Figure 3B The signal connection method shown illustrates the signal connection between the model under test (DUT) and the HIL device. From... Figure 4 As can be seen, the signal connection device 201 may include a first configuration unit 401 and a second configuration unit 402. The module under test (DUT) can be plugged into the first configuration unit 401 of the signal connection device 201 through the first Ethernet port provided by the PHY chip, and the HIL device can be plugged into the first configuration unit 401 of the signal connection device 201 through the second Ethernet port provided by the switch. The DUT can also be plugged into the second configuration unit 402 of the signal connection device 201 through a first low-speed communication port, and the HIL device can also be plugged into the second configuration unit 402 of the signal connection device 201 through a second low-speed communication port. It should be noted that the low-speed communication port is a port with a lower transmission rate than the Ethernet port. The Ethernet can be automotive Ethernet or standard Ethernet; the connection to the DUT is automotive Ethernet, and the connection to the HIL device is standard Ethernet. Low-speed communication includes, but is not limited to, Controller Area Network (CAN), Local Interconnect Network (LIN), digital signals (DI / DO), analog signals (AD / DA), and transmission pulse width modulation (PWM) signals, etc.

[0123] The signal connection device 201 can connect two types of signals: low-speed I / O signals transmitted through low-speed communication ports, such as analog signals, logic signals, low-speed transmission signals, and signals sensitive to electrical characteristics; and high-speed signals transmitted through vehicle Ethernet. Multiple modules under test (DUTs) are plugged into the first configuration unit 401. The first configuration unit 401 can set the networking mode between the multiple DUTs, i.e., vehicle Ethernet networking, to achieve resource pooling of the DUTs. The second configuration unit 402 can control the conduction of signal links (such as low-speed signal links) between the DUTs and the HIL device in the networking mode to achieve I / O resource pooling of the HIL device.

[0124] from Figure 4 As can be seen, the first configuration unit 401 may include a switch, one or more Port Physical Layer (PHY) chips, and one or more Micro Control Units (MCUs). The one or more PHY chips can be integrated with the switch on the same chip. The module under test (DUT) can be plugged into the automotive Ethernet PHY chip via its automotive Ethernet port. The automotive Ethernet PHY chip converts automotive Ethernet packets from the DUT into standard general Ethernet packets, which are then transmitted to the switch, specifically a Virtual Local Area Network (VLAN) switch. The first configuration unit 401 can use the switch to configure the networking mode between multiple DUTs using VLANs. Specifically, the automotive Ethernet ports of the DUTs that need to be connected are connected to the Ethernet ports of the VLAN switch via the PHY chips. The Ethernet ports of the VLAN switch connected to the automotive Ethernet ports are configured with the same port identifier (e.g., VLAN ID) or a forwarding relationship is established, restricting Ethernet packet broadcasting within the connection range, thereby enabling virtual circuit switching between Ethernet ports. It is understandable that the networking protocols required for networking between modules under test, such as the Rapid Spanning Tree Protocol (RSTP), are not sensitive to VLAN configuration and therefore will not affect the transmission of networking messages.

[0125] For example, the first configuration unit can set port identifiers for multiple Ethernet ports on the VLAN switch, and configure the networking mode between multiple modules under test based on the port identifiers. Further, the first configuration unit can set a second link between the first module under test and the second module under test based on the port identifiers, and then configure the networking mode between the multiple modules under test based on the second link. That is, the electronic device can transmit Ethernet packets from the first module under test to the second module under test based on the first port identifier, thereby setting the second link between the first module under test and the second module under test. The first port identifier is the identifier corresponding to the first port of the first module under test, which is the port connecting the first module under test to the first configuration unit, i.e., the port connected to the VLAN switch. The first configuration unit can obtain the networking mode between the modules under test based on at least one transmission path formed between them.

[0126] Please see Figure 5A , Figure 5A This is a schematic diagram illustrating a networking mode between modules under test provided in an embodiment of this application. For example... Figure 5A As shown in (a), modules A, B, C, D, and F are connected to the switch ports via PHY chips. Therefore, there is a fixed connection between modules A, B, C, D, and F and the switch. The first configuration unit 401 can receive configuration information about the network topology. For example, the configuration information could state that the network topology between modules A, B, C, and D is a ring network, and that the connection between modules D and F is point-to-point.

[0127] When both Module A and Module B are connected to a switch, for the connection between them, the first configuration unit can set a second port identifier (i.e., the identifier of the first port on which Module A is connected to the switch) based on the first port identifier (i.e., the identifier of the first port on which Module B is connected to the switch), setting the second port identifier to be the same as the first port identifier. When Module A sends a first Ethernet packet without a VLAN tag, and the packet enters the switch port, the first configuration unit 401 adds the first port identifier to the first Ethernet packet from Module A according to the VLAN configuration of the first port. Thus, the first configuration unit 401 can broadcast the first Ethernet packet with the added first port identifier to the second port based on the first port identifier. After receiving the Ethernet packet with the added first port identifier, the second port can remove the first port identifier according to the VLAN configuration of the port, and then send the first Ethernet packet without the VLAN tag to Module B through the second port. In this way, the first configuration unit 401 can obtain the second link between module A and module B under test. Similarly, the same applies to the connection between module B and module C under test, the connection between module C and module D under test, the connection between module D and module A under test, and the connection between module D and module F under test. The first configuration unit 401 can obtain the transmission path between the above-mentioned modules under test through the VLAN configuration of the switch.

[0128] In one possible implementation, for the connection between module A under test (DUT) and module B under test (DUT), the first configuration unit 401 can configure the Ethernet packet forwarding relationship between the Ethernet ports of the switch. For example, the Ethernet packets received by the first port (i.e., the first port on the switch where DUT A is connected) are forwarded to the second port (i.e., the second port on the switch where DUT B is connected). Thus, when DUT A sends a second Ethernet packet without a VLAN tag, and this packet enters the switch port, the first configuration unit 401 adds the identifier of the first port to the Ethernet packet from DUT A according to the VLAN configuration of the first port. In this way, the first configuration unit 401 can broadcast the second Ethernet packet with the added first port identifier to the second port according to the Ethernet packet forwarding relationship configured on the switch. After receiving the second Ethernet packet with the added first port identifier, the first configuration unit 401 can remove the first port identifier according to the VLAN configuration of the port and send the Ethernet packet without the VLAN tag to DUT B through the second port. In this way, the first configuration unit 401 can obtain the second link between module A and module B under test. For the connections between module B and module C, between module C and module D, between module D and module A, and between module D and module F, the first configuration unit 401 can obtain the transmission paths between the aforementioned modules under test through the VLAN configuration of the switch.

[0129] Therefore, based on the transmission path between the modules under test, the first configuration unit 401 can obtain the following: Figure 5A The networking mode shown in (b) is as follows.

[0130] Furthermore, the first configuration unit 401 can change the VLAN configuration to achieve different networking modes among the modules under test. For example, when the first configuration unit 401 sets the networking mode among modules under test A, B, C, D, and E according to the received configuration information, as follows: Figure 5A After (b) is shown, the first configuration unit 401 receives configuration information again, and the first configuration unit 401 can change the configuration of the switch to realize a new networking mode.

[0131] Please see Figure 5B , Figure 5B This is a schematic diagram of another networking mode between modules under test provided in an embodiment of this application. For example... Figure 5B As shown in (a), the configuration information received by the first configuration unit 401 includes: the network between module A, module D and module F under test is a ring network, the network between module B and module C under test is a point-to-point connection, and the network between module D and module C under test is a point-to-point connection.

[0132] The first configuration unit 401 can delete the previously set second port identifier (i.e., the second port on the switch where module B under test is connected), and then reset the third port identifier (i.e., the identifier of the first port on the switch where module A under test is connected) based on the first port identifier (i.e., the identifier of the third port on the switch where module F under test is connected), setting the third port identifier to be the same as the first port identifier. Thus, when module A under test sends an Ethernet packet without a VLAN tag, and the packet enters the switch port, the first configuration unit 401 adds the first port identifier to the Ethernet packet from module A under test according to the VLAN configuration of the first port. The first configuration unit 401 can then broadcast the Ethernet packet with the added first port identifier to the third port based on the first port identifier. Upon receiving the Ethernet packet with the added first port identifier, the third port can remove the first port identifier according to the port's VLAN configuration and send the Ethernet packet without a VLAN tag to module F under test through the third port. In this way, the first configuration unit 401 can establish the link between module A under test and module F under test.

[0133] In one possible implementation, the first configuration unit 401 can reconfigure the Ethernet packet forwarding relationship between the Ethernet ports of the switch. For example, the Ethernet packets received by the first port (i.e., the first port on the switch where module A under test is connected) are forwarded to the third port (i.e., the third port on the switch where module F under test is connected). Thus, when module A under test sends an Ethernet packet without a VLAN tag, and the packet enters the switch port, the first configuration unit 401 adds the first port identifier to the Ethernet packet from module A under test according to the VLAN configuration of the first port. Then, the first configuration unit 401 can broadcast the Ethernet packet with the added first port identifier to the third port according to the Ethernet packet forwarding relationship configured on the switch. After receiving the Ethernet packet with the added first port identifier, the first configuration unit 401 can remove the first port identifier according to the VLAN configuration of the port and send the Ethernet packet without a VLAN tag to module F under test through the third port. In this way, the first configuration unit 401 can obtain the link between module A under test and module F under test.

[0134] Therefore, the first configuration unit 401 can change the VLAN configuration to achieve the following: Figure 5A The networking mode shown in (b) is changed to: Figure 5B The networking mode shown in (b) is as follows.

[0135] After the first configuration unit 401 sets the networking mode between the modules under test (DUTs), the second configuration unit 402 can set the first link between one or more DUTs and the HIL device. It is understood that the DUTs need to output low-speed I / O signals to the HIL device via the signal connection device 201, and the HIL device outputs low-speed I / O signals to the first processor. The simulation model running in the first processor simulates the operating state based on the low-speed I / O signals, which are electrical signals generated by the DUTs. Because relays have little impact on electrical properties and a high power limit, they are suitable for switching between low-speed I / O and power output lines. Therefore, from... Figure 4 As can be seen, the second configuration unit includes one or more control switches, which may specifically be relays, and one or more microcontroller units (MCUs). The one or more control switches are located on the signal link between the first low-speed port of the module under test (DUT) plugged into the second configuration unit 402 and the second low-speed port of the HIL device plugged into the second configuration unit 402. The second configuration unit 402 can control the conduction of the signal link between one or more DUTs and the HIL device via relays, thereby setting the first link between one or more DUTs and the HIL device. For example, if it is required for DUT A to output a low-speed I / O signal to the HIL device, the electronic device can turn on the control switch on the signal link between DUT A and the HIL device, making the signal link conduct.

[0136] It should be noted that the number of relays can be determined based on the utilization rate of the HIL device's I / O and computing resources. If the resource utilization rate of the HIL device is relatively low, it is suitable to configure a higher number of relays to improve the resource utilization rate. The second configuration unit 402 can selectively control the conduction of relays through the microcontroller unit (MCU), that is, different relays will conduct different signal links. Therefore, only when the relays are turned on can the module under test (DUT) connect to the HIL device through the signal connection device 201 and obtain the I / O resources provided by the HIL device. Thus, the second configuration unit 402 can allocate the I / O resources on the HIL device to different DUT modes according to actual needs, thereby realizing the pooling of the HIL device's I / O resources.

[0137] Please see Figure 6 , Figure 6 This is a schematic diagram of a HIL test provided in an embodiment of this application. Figure 3B The method shown can be applied to model testing and bench testing. In model testing, the module under test (DUT) forms a closed-loop link with the simulation model in the first processor; in bench testing, the DUT forms a closed-loop link with the physical component. That is, the electronic device, according to... Figure 4The signal connection method shown achieves a full-link signal connection between the battery management system in the module under test 203 and the battery model running in the first processor 2042 during model testing via the signal connection device 201. After this connection, the electronic device can also switch the model testing to bench testing via the signal connection device 201. Bench testing includes physical components of the simulated model's object form. For example, the physical components could include a physical motor corresponding to the object form of the motor model.

[0138] Furthermore, the electronic device can use the signal connection device 201 to close the signal link between part of the simulation model and part of the model under test running in the first processor 2042 during model testing. For example, the electronic device can use the signal connection device 201 to close the signal connection between the motor model and the motor controller. Even further, the electronic device can use a relay in the signal connection device 201 to close the signal connection between the motor model and the motor controller. This relay is located on the signal link between the motor model and the motor controller; when the relay is closed, the signal link between the motor model and the motor controller is also closed.

[0139] One or more physical components can be plugged into the signal connection device 201, or one or more physical components can be plugged into the signal connection device 201 via a HIL device. Therefore, after the electronic device shuts down the signal link between the portion of the simulation model 2041 running in the first processor and the portion of the model under test during model testing, it can be based on... Figure 3B The signal connection method shown demonstrates the signal link between a portion of the physical components and a portion of the device under test (DUT) tested using the signal connection device 201 on a test bench. It can be understood that the physical components that enable the signal link are the physical components of the simulation model 2041 that disable the signal link. Figure 6 It can be seen that the electronic device can establish a signal connection between the physical motor and the motor controller through the signal connection device 201. Furthermore, the electronic device can establish a signal connection between the physical motor and the motor controller through a relay in the signal connection device 201. This relay is located on the signal link between the physical motor and the motor controller; when the relay is activated, the signal link between the physical motor and the motor controller is also established.

[0140] Understandably, once the physical component and simulation model 2041 are both connected to the signal connection device 201, the electronic device can switch between HIL testing and bench testing through the signal connection device 201, thereby achieving hybrid simulation and comparing simulation results between HIL testing and bench testing.

[0141] Please see Figure 7 , Figure 7This is a schematic diagram illustrating HIL testing based on cloud computing services, as provided in an embodiment of this application. The cloud computing service 700 includes a first processor 2042 deployed on a cloud server, an HIL device 202, a signal connection device 201, and one or more modules under test (DUTs) 203. The cloud computing service 700 may also include an electronic device 704 for HIL resource scheduling and management. The simulation model can be deployed in the first processor 2042. One or more DUTs 203 are connected to the I / O boards in the HIL device 202 via the signal connection device 201. Therefore, the first processor 2042 running the simulation model can perform simulation modeling and signal processing on the DUTs 203. A real-time operating system is mounted on the first processor 2042 to ensure the real-time performance of the simulation.

[0142] When one or more user devices located locally ( Figure 7 The diagram only illustrates three instances. For example, when user devices 7051, 7052, and 7053 have HIL testing requirements, they can each send their respective test requests to electronic device 704 located in the cloud computing service 700. It can be understood that the user devices can display multiple components of the module under test, each component corresponding to resources of the module under test on the cloud computing service 700. The user devices can display a user interface, commonly a graphical user interface (GUI), which refers to a user interface related to computer operation displayed graphically. This can be an icon, window, control, or other component element displayed on the user device's screen. Controls can include visual component elements such as icons, buttons, menus, tabs, text boxes, dialog boxes, status bars, and navigation bars. Users can visually arrange these components through the user device to obtain target components (or test instances) that meet their needs, and then send test requests containing the target module under test components to electronic device 704 located in the cloud computing service 700. After receiving a test request from the user equipment, electronic device 704 can construct a test instance based on the request. The test instance allows the user equipment to utilize the resources of the target module under test corresponding to the test request. It can be understood that the resources of the module under test can be functional resources deployed on cloud computing services, such as the functions that components, sensors, actuators, or a specific application can perform; or resources used to verify the functionality of the module under test, such as simulation models, I / O ports of HIL devices, etc.

[0143] Furthermore, after receiving a test request from the user equipment, the electronic device 704 can determine the target module under test (DUT) and I / O ports based on the test request. The I / O ports are ports on the HIL device, enabling communication between the target DUT and the first processor. The electronic device 704 can assign corresponding target DUTs to the user equipment based on the test request, such as specifying which DUTs correspond to the test request, the network topology between the DUTs, and which one or more DUTs communicate with the first processor.

[0144] Then, electronic device 704 can determine the number of I / O ports required by the target component based on the target module under test (DUT). For example, it can determine which one or more DUT modules in the target component need to communicate with the first processor. Electronic device 704 allocates I / O ports on the I / O board to the target component through HIL board resource management. Therefore, electronic device 704 can construct test instances based on the resources and I / O ports of the target DUT. The DUT corresponding to the target component can interact with the simulation model running in the first processor to fulfill the user device's test requests.

[0145] Please see Figure 8 , Figure 8 This is a schematic diagram illustrating a resource allocation method provided in an embodiment of this application. Figure 8As can be seen, the first user equipment 7051 can provide a component of a module under test (DUT) containing 300 ports. Based on the DUT component provided by the first user equipment 7051, the user can program a test request for DUT instance 1, containing 150 ports. After the electronic device 704 determines the number of ports to be 150 based on the component of the target DUT (i.e., DUT instance 1) included in the test request from the first user equipment 7051, the electronic device 704 can allocate 150 ports on the signal connection device 201 to the first user equipment 7051. The second user equipment 7052 can provide a component of a DUT containing 150 ports. Based on the DUT component provided by the second user equipment 7052, the user can program a test request for DUT instance 2, containing 50 ports. After determining the number of ports to be 50 based on the components of the target module under test (i.e., module under test instance 2) included in the test request received from the second user equipment 7052, electronic device 704 can allocate 50 ports on signal connection device 201 to the second user equipment 7052. Third user equipment 7053 can provide components of the module under test containing 225 ports. The user can then arrange test requests for module under test instance 3 containing 100 ports based on the components of the module under test provided by third user equipment 7053. After determining the number of ports to be 100 based on the components of the target module under test (i.e., module under test instance 3) included in the test request received from the third user equipment 7053, electronic device 704 can allocate 100 ports on signal connection device 201 to the third user equipment 7053. The HIL board resource management system stores the I / O resource mapping relationship between I / O boards and signal connection devices 201. Therefore, for module under test instance 1, electronic device 704 can obtain 150 I / O ports on the I / O board that can communicate with the HIL device from the HIL board resource management system. For module under test instance 2, electronic device 704 can obtain 50 I / O ports on the I / O board that can communicate with the HIL device from the HIL board resource management system. For module under test instance 3, electronic device 704 can obtain 100 I / O ports on the I / O board that can communicate with the HIL device from the HIL board resource management system.

[0146] Therefore, the electronic device 704 can allocate the resources required for HIL test instances from the I / O resource pool and the module under test resource pool according to the needs of the user equipment, thereby meeting the different HIL test requirements and improving the utilization rate of HIL test resources.

[0147] Furthermore, the cloud computing service 700 stores the signal mapping relationship between the module under test 203 and its corresponding simulation model running in the first processor. Therefore, the electronic device 704 can determine the fourth mapping relationship between the target module under test and the target simulation model running in the first processor based on the resources of the target module under test. The target simulation model is the model running in the first processor 2042 corresponding to the target module under test.

[0148] Furthermore, after determining the target module under test (DUT) based on the target components in the test request, the electronic device 704 can set the networking mode between the target DUTs through the signal connection device 201. Then, it can control the signal link between the target DUTs and the HIL device 202 in the networking mode through the signal connection device 201. Based on the set networking mode and the established signal link, the signal connection relationship between the target DUTs and the HIL device is obtained. It is understandable that, because the port of the target DUT on the signal connection device 201 is determined, the electronic device 704 can obtain the I / O resource mapping relationship between the signal connection device 201 and the I / O boards in the HIL device 202 from the HIL board resource management, thereby determining the I / O port through which the target DUTs communicate with the I / O boards in the HIL device 202. Therefore, the electronic device 704 can determine the signal mapping relationship (i.e., the fifth mapping relationship) between the target DUTs and the I / O boards in the HIL device 202 based on this I / O port.

[0149] Finally, electronic device 704 can determine the sixth mapping relationship between the first processor and the I / O board of the HIL device based on the fourth and fifth mapping relationships. Therefore, electronic device 704 can construct the connection relationship in the test instance based on the sixth mapping relationship, and the target simulation model running in the first processor and the target module under test can communicate with each other, realizing the connection of the entire link signal in the HIL test. Electronic device 704 can send the HIL simulation test results to the user equipment.

[0150] from Figure 8 As can be seen, the test model instance 1 is a test instance arranged by the user through the first user equipment 7051. The whole vehicle model instance 1, which can perform functional testing on the test module instance 1, runs in the first processor. Based on the cloud computing service 700, the test of the test model instance 1 can be completed, the test results can be obtained, and the test results can be sent to the first user equipment 7051.

[0151] The test model instance 2 is a test instance arranged by the user through the second user equipment 7052. The whole vehicle model instance 2, which can perform functional testing on the test module instance 2, runs in the first processor. Based on the cloud computing service 700, the test of the test model instance 2 can be completed, the test results can be obtained, and the test results can be sent to the second user equipment 7052.

[0152] The test model instance 3 is a test instance arranged by the user through the third user equipment 7053. The whole vehicle model instance 3, which can perform functional testing on the test module instance 3, runs in the first processor. Based on the cloud computing service 700, the test of the test model instance 3 can be completed, the test results can be obtained, and the test results can be sent to the third user equipment 7053.

[0153] It should be noted that, Figure 8 The 300 ports of the signal connection device shown are for illustrative purposes only. This application does not impose any limitations on the number of ports in the signal connection device; the number of ports can be determined based on actual circumstances. The first user equipment 7051, the second user equipment 7052, and the third user equipment 7053 can be devices deployed in different geographical locations.

[0154] Please see Figure 9 , Figure 9 This is a schematic diagram of a signal connection device 900 provided in an embodiment of this application. The signal connection device can be an electronic device or a component within an electronic device, such as a chip, software module, or integrated electronic control unit. The signal connection device 900 is used to implement the aforementioned signal connection method, for example... Figure 3B The signal connection method in the illustrated embodiment. The signal connection device 900 includes a control unit 901, a processing unit 902, and a connection unit 903.

[0155] Control unit 901 is used to configure a first mapping relationship through a signal connection device. The first mapping relationship includes the signal connection relationship between the module under test and the hardware-in-the-loop (HIL) device. The HIL device is used to run a simulation model to test the function of the module under test.

[0156] Processing unit 902 is configured to determine a third mapping relationship based on a first mapping relationship, wherein the third mapping relationship includes a signal mapping relationship between the first processor and the HIL device;

[0157] Connection unit 903 is used to control the connection relationship of HIL test according to the third mapping relationship.

[0158] In one possible implementation, the signal connection device 900 belongs to a test system, such as... Figure 2A The system shown.

[0159] In one possible implementation, the signal connection device 900 further includes an acquisition unit 904 for acquiring a second mapping relationship, wherein the second mapping relationship includes a signal mapping relationship between the first processor and the module under test.

[0160] In one possible implementation, the processing unit 902 is specifically used to determine a third mapping relationship between the first processor and the HIL device based on the second mapping relationship and the first mapping relationship.

[0161] In one possible implementation, the control unit 901 is specifically used for:

[0162] The networking mode between multiple modules under test is set by using a signal connection device;

[0163] Establish the first link between one or more core-based modules under test and HIL devices through a signal connection device;

[0164] The first mapping relationship is determined based on the set networking mode and the first link, so as to configure the first mapping relationship through the signal connection device.

[0165] In one possible implementation, the signal connection device 900 includes multiple ports, and the control unit 901 is specifically used for:

[0166] Multiple port identifiers are set for multiple ports through a signal connection device;

[0167] The networking mode between multiple modules under test is set based on port identifiers.

[0168] In one possible implementation, the control unit 901 is specifically used for:

[0169] A second link is set between the first module under test and the second module under test based on the port identifier, wherein the module under test includes the first module under test and the second module under test, and the port identifier is the identifier corresponding to the port of the signal connection device;

[0170] Based on the second link, the networking mode between multiple modules under test is set.

[0171] In one possible implementation, the control unit 901 is specifically used for:

[0172] When the first port identifier and the second port identifier are the same, the signal transmission between the first module under test and the second module under test is determined, so as to realize the second link between the first module under test and the second module under test through the port identifier; wherein, the first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test; the second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

[0173] In one possible implementation, the control unit 901 is specifically used for:

[0174] The port connection relationship is determined, which includes a first port identifier and a second port identifier. The first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test. The second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

[0175] Based on the port connection relationship, a second link is set between the first module under test and the second module under test.

[0176] In one possible implementation, the port includes an Ethernet port or a CAN (Control Area Network) port.

[0177] In one possible implementation, the signal connection device is used for model testing and bench testing, wherein the bench testing includes the signal connection device for the physical components corresponding to the simulation model.

[0178] In one possible implementation, the connection unit 903 is used to construct a test instance based on a test request from a user device. The test instance is used by the user device to access the resources of the target module under test corresponding to the test request.

[0179] In one possible implementation, the processing unit 902 is used to allocate a corresponding target module under test and I / O port to the user equipment according to the test request, wherein the I / O port is a port in the HIL device;

[0180] The connection unit 903 is used to build test instances based on the target module under test and I / O ports.

[0181] It should be understood that related descriptions can also be found in [the relevant documentation / reference]. Figure 3B The descriptions in the illustrated embodiments will not be repeated here.

[0182] Please see Figure 10 , Figure 10This is a schematic diagram of the structure of a computing device 100 provided in an embodiment of this application. The computing device 100 can be one or more independent devices (such as servers, user devices, etc.) or components within an independent device (such as chips, software modules, or hardware modules). The computing device 100 may include at least one processor 1001. Optionally, it may also include at least one memory 1003. Further optionally, the computing device 100 may also include a communication interface 1002. Even more optionally, it may also include a bus 1004, wherein the processor 1001, the communication interface 1002, and the memory 1003 are connected through the bus 1004.

[0183] The processor 1001 is a module that performs arithmetic and / or logical operations. Specifically, it can be one or a combination of processing modules such as a central processing unit (CPU), a graphics processing unit (GPU), a microprocessor unit (MPU), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), a complex programmable logic device (CPLD), a coprocessor (to assist the central processing unit in completing corresponding processing and applications), and a microcontroller unit (MCU).

[0184] The communication interface 1002 can be used to provide information input or output to at least one processor. And / or, the communication interface 1002 can be used to receive data transmitted externally and / or transmit data externally, and can be a wired link interface including an Ethernet cable, or a wireless link interface (Wi-Fi, Bluetooth, general wireless transmission, vehicular short-range communication technology, and other short-range wireless communication technologies, etc.). Optionally, the communication interface 1002 may also include a transmitter (such as a radio frequency transmitter, antenna, etc.) or a receiver coupled to the interface.

[0185] The memory 1003 provides storage space, in which data such as the operating system and computer programs can be stored. The memory 1003 can be one or a combination of several of the following: random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), or compact disc read-only memory (CD-ROM).

[0186] At least one processor 1001 in the computing device 100 is used to execute the aforementioned signal connection method, for example Figure 3B The version management method described in the illustrated embodiment.

[0187] In one possible implementation, at least one processor 1001 in the computing device 100 is configured to execute computer-calling instructions to perform the following operations:

[0188] The first mapping relationship is configured through a signal connection device. The first mapping relationship includes the signal connection relationship between the module under test and the hardware-in-the-loop (HIL) device.

[0189] The third mapping relationship is determined based on the first mapping relationship. The third mapping relationship includes the third mapping relationship between the first processor and the HIL device. The first processor is used to run the simulation model, which is a model for simulating the function of the module under test.

[0190] The connection relationships for HIL testing are determined based on the third mapping relationship.

[0191] In yet another possible implementation, the processor 1001 is further configured to:

[0192] The second mapping relationship is obtained through the communication interface 1002, wherein the second mapping relationship includes the signal mapping relationship between the first processor and the module under test.

[0193] In yet another possible implementation, the processor 1001 is further configured to:

[0194] The third mapping relationship is determined based on the second mapping relationship and the first mapping relationship.

[0195] In yet another possible implementation, the processor 1001 is further configured to:

[0196] The networking mode between multiple modules under test is set by using a signal connection device;

[0197] Configure a first link between one or more modules under test and HIL devices using a signal connection device;

[0198] The first mapping relationship is obtained based on the set networking mode and the first link, so as to realize the configuration of the first mapping relationship through the signal connection device.

[0199] In yet another possible implementation, the processor 1001 is further configured to:

[0200] Multiple port identifiers are set for multiple ports through a signal connection device;

[0201] The networking mode between multiple modules under test is set based on port identifiers.

[0202] In yet another possible implementation, the processor 1001 is further configured to:

[0203] A second link is set between the first module under test and the second module under test based on the port identifier through the communication interface 1002, wherein the plurality of modules under test include the first module under test and the second module under test, and the port identifier is the identifier corresponding to the port of the signal connection device;

[0204] Based on the second link, the networking mode between multiple modules under test is set.

[0205] In yet another possible implementation, the processor 1001 is further configured to:

[0206] When the first port identifier and the second port identifier are the same, the signal transmission between the first module under test and the second module under test is determined, so as to realize the second link between the first module under test and the second module under test through the port identifier; wherein, the first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test; the second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

[0207] In yet another possible implementation, the processor 1001 is further configured to:

[0208] The port connection relationship is determined, which includes a first port identifier and a second port identifier. The first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test. The second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

[0209] Based on the port connection relationship, a second link is set between the first module under test and the second module under test.

[0210] In another possible implementation, the aforementioned port includes an Ethernet port or a CAN port for the local area network.

[0211] In another possible implementation, the computing device can be used for model testing and bench testing, the bench testing including the physical components corresponding to the simulation model.

[0212] In another possible implementation, the processor 1001 is further configured to: construct a test instance based on a test request from a user device, the test instance being used by the user device to access the resources of the target module under test corresponding to the test request.

[0213] In another possible implementation, the processor 1001 is further configured to: allocate a corresponding target module under test and I / O port to the user according to the test request; and construct a test instance according to the target module under test and I / O port.

[0214] It should be understood that related descriptions can also be found in [the relevant documentation / reference]. Figure 3B The descriptions in the illustrated embodiments will not be repeated here.

[0215] This application also provides a computer-readable storage medium storing instructions that, when executed on at least one processor, implement the aforementioned version management method, for example... Figure 3B The signal connection method is shown.

[0216] This application also provides a computer program product including computer instructions that, when executed by a computing device, implement the aforementioned version management method, for example... Figure 3B The signal connection method is shown.

[0217] In this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design described as "exemplary" or "for example" in this application should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of terms such as "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0218] In this application, "at least one" in the embodiments refers to one or more items, and "more than one" refers to two or more items. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or multiple items. For example, at least one of a, b, or c can represent: a, b, c, (a and b), (a and c), (b and c), or (a and b and c), where a, b, and c can be single or multiple. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, and B alone, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship.

[0219] Furthermore, unless otherwise stated, the use of ordinal numbers such as "first" and "second" in the embodiments of this application is for distinguishing multiple objects and is not for limiting the order, sequence, priority, or importance of multiple objects. For example, "first user equipment" and "second user equipment" are only for ease of description and do not indicate differences in the structure, importance, etc. of the first user equipment and the second user equipment. In some embodiments, the first user equipment and the second user equipment may also be the same device.

[0220] In the above embodiments, the term "when..." can be interpreted, depending on the context, as meaning "if...", "after...", "in response to determining...", or "in response to detecting...". The above descriptions are merely optional embodiments of this application and are not intended to limit this application. Any modifications, equivalent substitutions, improvements, etc., made within the concept and principles of this application should be included within the protection scope of this application.

[0221] Those skilled in the art will understand that all or part of the steps of the above embodiments can be implemented by hardware or by a program instructing related hardware. The program can be stored in a computer-readable storage medium, such as a read-only memory, a disk, or an optical disk.

Claims

1. A signal connection method, characterized in that, The method includes: A first mapping relationship is configured through a signal connection device, the first mapping relationship including the signal mapping relationship between the module under test and the hardware-in-the-loop (HIL) device; A third mapping relationship is determined based on the first mapping relationship, the third mapping relationship including the signal mapping relationship between the first processor and the HIL device; wherein, the first processor is used to run a simulation model, the simulation model being a model for simulating the function of the module under test; The connection relationship for HIL testing is determined based on the third mapping relationship.

2. The method according to claim 1, characterized in that, Before determining the third mapping relationship based on the first mapping relationship, the method further includes: Obtain a second mapping relationship, wherein the second mapping relationship includes the signal mapping relationship between the first processor and the module under test.

3. The method according to claim 1 or 2, characterized in that, Determining the third mapping relationship based on the first mapping relationship includes: The third mapping relationship is determined based on the second mapping relationship and the first mapping relationship.

4. The method according to claim 1 or 2, characterized in that, The configuration of the first mapping relationship via the signal connection device includes: The signal connection device is used to set the networking mode between multiple modules under test; A first link is established between one or more of the modules under test and the HIL device through the signal connection device; The first mapping relationship is determined based on the configured networking mode and the first link, so as to configure the first mapping relationship through the signal connection device.

5. The method according to claim 4, characterized in that, The signal connection device includes multiple ports, and the step of setting the networking mode between multiple modules under test through the signal connection device includes: The signal connection device is used to set multiple port identifiers corresponding to the multiple ports; The networking mode between multiple modules under test is set based on the port identifier.

6. The method according to claim 5, characterized in that, The plurality of modules under test are respectively connected to the signal connection device through the plurality of ports, and the setting of the networking mode among the plurality of modules under test based on the port identifier includes: A second link is established between the first module under test and the second module under test based on a port identifier, wherein the plurality of modules under test include the first module under test and the second module under test, and the port identifier is the identifier corresponding to the port of the signal connection device; Based on the second link, the networking mode between multiple modules under test is set.

7. The method according to claim 6, characterized in that, The step of setting a second link between the first module under test and the second module under test based on the port identifier includes: When the first port identifier and the second port identifier are the same, the signal transmission between the first module under test and the second module under test is determined, so as to realize the second link between the first module under test and the second module under test through the port identifier; wherein, the first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test; the second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

8. The method according to claim 6, characterized in that, The step of setting a second link between the first module under test and the second module under test based on the port identifier includes: The port connection relationship is determined, which includes a first port identifier and a second port identifier. The first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test. The second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test. Based on the port connection relationship, a second link is set between the first module under test and the second module under test.

9. The method according to claim 5, characterized in that, The ports of the signal connection device include Ethernet ports or CAN ports for local area networks.

10. The method according to claim 1 or 2, characterized in that, The method is applied to model testing and / or bench testing, wherein the bench testing includes physical components corresponding to the simulation model, and the physical components are connected to the signal connection device.

11. The method according to claim 1 or 2, characterized in that, After determining the connection relationships in the HIL test based on the third mapping relationship, the process further includes: Build test instances based on test requests from user devices.

12. The method according to claim 11, characterized in that, The step of constructing a test instance based on a test request from a user device includes: According to the test request, the user equipment is assigned a target module to be tested and an I / O port, wherein the I / O port is a port on the HIL device; The test instance is constructed based on the target module under test and the I / O port.

13. A signal connection device, characterized in that, The signal connection device is used to configure the connection between the module under test (DUT) and the HIL device. The device includes a first configuration unit and a second configuration unit. The first configuration unit is used to set the networking mode among the multiple modules under test; The second configuration unit is used to set up a first link between one or more of the modules under test and the HIL device.

14. The apparatus according to claim 13, characterized in that, The first configuration unit includes multiple ports, and the first configuration unit is specifically used for: Set multiple port identifiers corresponding to the multiple ports; The networking mode between multiple modules under test is set based on the port identifier.

15. The apparatus according to claim 14, characterized in that, The plurality of modules under test are respectively connected to the first configuration unit through the plurality of ports. The first configuration unit is specifically used for: A second link is set between the first module under test and the second module under test based on the port identifier, wherein the plurality of modules under test include the first module under test and the second module under test, and the port identifier is the identifier corresponding to the port of the signal connection device; Based on the second link, the networking mode between multiple modules under test is set.

16. The apparatus according to claim 15, characterized in that, The first configuration unit is specifically used for: When the first port identifier is the same as the second port identifier, the signal transmission between the first module under test and the second module under test is determined, so as to realize the second link between the first module under test and the second module under test through the port identifier; wherein, the first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test; the second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

17. The apparatus according to claim 15, characterized in that, The first configuration unit is specifically used for: Determine the port connection relationship, which includes a first port identifier and a second port identifier. The first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test. The second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test; Based on the port connection relationship, a second link is set between the first module under test and the second module under test.

18. A testing system, characterized in that, The system includes: The signal connection device as described in any one of claims 13 to 17; The hardware-in-the-loop (HIL) test equipment is connected to the signal connection device; The module under test is connected to the signal connection device.

19. The system according to claim 18, characterized in that, The testing system further includes a first processor, which is used to run a simulation model, which is a model for simulating the function of the module under test; The test system also includes the signal mapping relationship between the first processor and the module under test.

20. The system according to claim 18 or 19, characterized in that, The testing system operates on at least one of the following devices: a public cloud device, a private cloud device, or a local device.

21. A signal connection device, characterized in that, The device includes: A control unit is configured to configure a first mapping relationship via a signal connection device, the first mapping relationship including the signal connection relationship between the module under test and the hardware-in-the-loop (HIL) device; A processing unit is configured to determine a third mapping relationship based on the first mapping relationship, the third mapping relationship including a signal mapping relationship between the first processor and the HIL device, wherein the first processor is configured to run a simulation model, the simulation model being a model for simulating the function of the module under test; A connection unit is used to determine the connection relationship for HIL testing based on the third mapping relationship.

22. The apparatus according to claim 21, characterized in that, The device also includes: An acquisition unit is used to acquire a second mapping relationship, wherein the second mapping relationship includes a signal mapping relationship between the first processor and the module under test.

23. The apparatus according to claim 21 or 22, characterized in that, The processing unit is specifically used to determine the third mapping relationship based on the second mapping relationship and the first mapping relationship.

24. The apparatus according to claim 21 or 22, characterized in that, The control unit is specifically used for: The signal connection device is used to set the networking mode between multiple modules under test; A first link is established between one or more of the modules under test and the HIL device through the signal connection device; The first mapping relationship is determined based on the configured networking mode and the first link, so as to configure the first mapping relationship through the signal connection device.

25. The apparatus according to claim 24, characterized in that, The device includes multiple ports, and the control unit is specifically used for: The signal connection device is used to set multiple port identifiers corresponding to the multiple ports; The networking mode between multiple modules under test is set based on the port identifier.

26. The apparatus according to claim 25, characterized in that, The plurality of modules under test are respectively connected to the device through the plurality of ports, and the control unit is specifically used for: A second link is set between the first module under test and the second module under test based on the port identifier, wherein the plurality of modules under test include the first module under test and the second module under test, and the port identifier is the identifier corresponding to the port of the signal connection device; Based on the second link, the networking mode between multiple modules under test is set.

27. The apparatus according to claim 26, characterized in that, The control unit is specifically used for: When the first port identifier and the second port identifier are the same, the signal transmission between the first module under test and the second module under test is determined, so as to realize the second link between the first module under test and the second module under test through the port identifier; wherein, the first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test; the second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test.

28. The apparatus according to claim 26, characterized in that, The control unit is specifically used for: Determine the port connection relationship, which includes a first port identifier and a second port identifier. The first port identifier is the identifier corresponding to the first port of the signal connection device, and the first port is the port connected to the first module under test. The second port identifier is the identifier corresponding to the second port of the signal connection device, and the second port is the port connected to the second module under test; Based on the port connection relationship, a second link is set between the first module under test and the second module under test.

29. The apparatus according to claim 25, characterized in that, The port includes an Ethernet port or a CAN port for a local area network.

30. The apparatus according to claim 21 or 22, characterized in that, The equipment is used for model testing and / or bench testing, and the bench testing includes signal connection devices for the physical components corresponding to the simulation model.

31. The apparatus according to claim 21 or 22, characterized in that, The connection unit is used to construct test instances based on test requests from user devices.

32. The apparatus according to claim 31, characterized in that, The processing unit is configured to allocate a corresponding target module under test and I / O port to the user equipment according to the test request, wherein the I / O port is a port in the HIL device; The connection unit is used to construct a test instance based on the target module under test and the I / O port.

33. A computing device, characterized in that, The computing device includes a second processor and a memory; The memory stores computer programs; When the second processor executes the computer program, the computing device performs the method of any one of claims 1 to 12.

34. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores instructions that, when executed on at least one processor, implement the method as described in any one of claims 1 to 12.

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