一种基于成像图像线性投影的光学合成孔径平移误差检测方法
By combining linear projection of the imaging image and principal component analysis with self-scanning of the reference aperture, high-precision detection and correction of sub-aperture translation error in the optical synthetic aperture system is achieved, solving the imaging resolution problem caused by translation error, simplifying the system structure and improving the detection range and accuracy.
CN117054054BActive Publication Date: 2026-07-17INST OF OPTICS & ELECTRONICS CHINESE ACAD OF SCI
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- INST OF OPTICS & ELECTRONICS CHINESE ACAD OF SCI
- Filing Date
- 2023-08-17
- Publication Date
- 2026-07-17
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Figure CN117054054B_ABST
Abstract
本发明公开了一种基于成像图像线性投影的光学合成孔径平移误差检测方法，可用于合成孔径成像系统中平移误差的校正。本方法首先通过对合成孔径系统的成像图像沿各孔径方向投影，之后对投影信息进行主成分分析获得各子孔径所对应的评价指标，最后通过参考孔径自扫描获取剩余子孔径所对应的平移误差。本方法通过对成像图像处理以及参考孔径的一次扫描，即可获取各个子孔径所对应的平移误差，在没有额外光学元件调制下，就可实现大范围高精度的误差检测，且不受孔径数目的限制，具有光路紧凑、操作简单、移植性好等优点。
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