Device and method for checking the state of a weld

Abstract

An apparatus for inspecting soldering condition according to an embodiment of the present invention can inspect the soldering condition between a terminal block and a lead soldered to the terminal block, the terminal block protruding from a plurality of electrodes in which spacers are stacked. The apparatus for inspecting soldering condition may include: a pair of terminal block probes that contact the terminal block and are spaced apart from each other in the width direction of the terminal block; and a pair of lead probes that contact the lead and are spaced apart from each other in the width direction of the lead.

Description

Technical Field

[0001] Cross-references to related applications

[0002] This application claims priority to Korean Patent Application No. 10-2021-0075923, filed on June 11, 2021, and Korean Patent Application No. 10-2022-0044832, filed on April 11, 2022, the entire contents of which are incorporated herein by reference.

[0003] The present invention relates to an apparatus and method for inspecting the soldering condition between a terminal block and a lead soldered to the terminal block, the terminal block protruding from a plurality of electrodes in which spacers are stacked. Background Technology

[0004] Generally, secondary batteries refer to rechargeable and dischargeable batteries, distinct from non-rechargeable primary batteries, and are widely used in electronic devices such as mobile phones, laptops, portable cameras, or electric vehicles. In particular, lithium-ion secondary batteries have greater capacity and higher energy density per unit weight than nickel-cadmium or nickel-metal hydride batteries, thus their utilization rate is rapidly increasing.

[0005] Lithium-ion batteries can also be classified according to the composition of the electrode components in the positive / separator / negative electrode structure. Representative examples may include: jelly roll type electrode components in the following structures: long, tabular positive and negative electrodes are wound together with a separator inserted between them; stacked electrode components, in which multiple positive and negative electrodes cut into units of predetermined size are stacked sequentially with separators inserted between them; and stacked / folded electrode components in structures where dual or full cells are wound together, in which positive and negative electrodes in predetermined units are stacked with separators inserted between them; etc.

[0006] Recently, pouch cells with stacked or stacked / folded electrode assemblies embedded in a pouch cell housing made of aluminum laminates have attracted attention due to their low manufacturing cost, light weight, and ease of shape modification, and their use is gradually increasing.

[0007] In such lithium secondary batteries, lithium-based oxides and carbon materials are mainly used as positive and negative electrode active materials, respectively. The lithium secondary battery includes an electrode assembly and an external material. The electrode assembly contains multiple electrodes coated with electrode active materials, and separators are inserted between the electrodes. The external material, together with the electrolyte, seals and houses the electrode assembly.

[0008] Figure 1 This is a perspective view of a typical electrode assembly.

[0009] The electrode assembly 10 is provided with a plurality of terminals 20 extending from a plurality of electrodes, and each of the plurality of terminals 20 is respectively soldered to a lead 30. Here, the plurality of terminals 20 may include a plurality of positive terminal terminals extending from a plurality of positive electrodes, and a plurality of negative terminal terminals extending from a plurality of negative electrodes. The lead 30 connected to the plurality of positive terminal terminals may be a positive lead, and the lead 30 connected to the plurality of negative terminal terminals may be a negative lead. Figure 1 An electrode assembly 10 is shown with the positive and negative terminals protruding in opposite directions. However, the electrode assembly 10 is not limited to this and may also have a structure in which the positive and negative terminals protrude in the same direction.

[0010] When the connector 20 and the lead 30 are soldered, welding defects can occur if the soldering is performed weakly between connectors 20 or between connector 20 and lead 30. Therefore, a process is needed to check for welding defects caused by weak soldering.

[0011] According to relevant technology, the method of measuring tensile strength by pulling the welded part in opposite directions around the weld is used as a method for inspecting weak weld defects in the weld. However, such a method has the following limitations: during the measurement of tensile strength, the connecting piece 20 and the lead wire 30 are damaged, which greatly increases the possibility of errors and makes thorough inspection impossible.

[0012] Therefore, there is a need to develop inspection devices that can perform thorough inspections and have excellent detection capabilities to check whether welded parts are weakly welded. Summary of the Invention

[0013] Technical issues

[0014] One object of the present invention to solve the aforementioned problem is to provide an apparatus and method for inspecting the soldering condition, which can accurately and precisely determine the soldering condition between the connector and the lead and can perform a thorough inspection.

[0015] Technical solution

[0016] The apparatus for inspecting the soldering condition according to an embodiment of the present invention can inspect the soldering condition between a terminal block and a lead soldered to the terminal block, the terminal block protruding from a plurality of electrodes in which spacers are stacked.

[0017] An apparatus for inspecting soldering condition may include: a pair of tab probes that contact tabs and are spaced apart from each other in the width direction of the tabs; and a pair of lead probes that contact leads and are spaced apart from each other in the width direction of the leads.

[0018] The apparatus for inspecting the weld condition may further include a control unit that determines weak welds based on a first resistance value between a pair of tab probes, a second resistance value between one tab probe and one lead probe, and a third resistance value between another tab probe and another lead probe.

[0019] The control unit can determine a weak weld when at least one of the first resistance value, the second resistance value, and the third resistance value exceeds a preset critical resistance value.

[0020] The apparatus for inspecting the weld condition may further include a control unit that determines a weak weld based on a first resistance value between a pair of tab probes, a second resistance value between a tab probe and a lead probe, a third resistance value between another tab probe and another lead probe, and a fourth resistance value between the pair of lead probes.

[0021] The connector probes and lead probes can be configured to face each other with connectors and leads placed between them.

[0022] A pair of terminal probes can contact two sides of the terminal in the width direction, and the pair of lead probes can contact two sides of the lead in the width direction.

[0023] Each of the tab probes and lead probes may include a pair of probe members, one of which applies current and the other detects voltage. Each of the probe members may have an end provided with: a tip that contacts the tab or lead and has a pointed shape; or an opposing surface facing the tab or lead, and a plurality of protrusions extending from the opposing surface to contact the tab or lead.

[0024] One of the connector probe and the lead probe may include a pair of probe members, each having an end with a pointed tip, and the other of the connector probe and the lead probe may include a pair of probe members, each having an end with an opposing surface and a plurality of protrusions.

[0025] Each of the tab probe and the lead probe may further include a spring that applies an elastic force to cause the probe member to protrude.

[0026] The method for inspecting solder joint condition according to an embodiment of the present invention can inspect the solder joint condition between a terminal block and a lead soldered to the terminal block, the terminal block protruding from a plurality of electrodes between which spacers are stacked. The method for inspecting solder joint condition may include: contacting a pair of lead probes with a lead and contacting a pair of terminal block probes with a terminal block; measuring a first resistance value between the pair of terminal block probes, a second resistance value between one terminal block probe and one lead probe, and a third resistance value between the other terminal block probe and the other lead probe; and determining a weak solder joint based on the first resistance value, the second resistance value, and the third resistance value.

[0027] In the above determination, a weak weld can be determined when at least one of the first resistance value, the second resistance value, and the third resistance value exceeds a preset critical resistance value.

[0028] In the resistance measurement, a fourth resistance value can be further measured between a pair of lead probes, and in the above determination step, the fourth resistance value can be further considered to determine the weak solder joint.

[0029] When the probes are brought into contact, the pair of lead probes can contact the two sides of the lead in the width direction, and the pair of tab probes can contact the two sides of the tab in the width direction.

[0030] When the probes are brought into contact, the lead probe and the tab probe can be configured to face each other with their tabs and leads in place.

[0031] Each of the prong probe and the lead probe may include a pair of probe members, one of which applies current and the other detects voltage. One of the prong probe and the lead probe may include a pair of probe members, each having an end with a pointed tip, and the other of the prong probe and the lead probe may include a pair of probe members, each having an end with an opposing surface facing the prong or lead and a plurality of protrusions projecting from the opposing surface.

[0032] When the probe makes contact, multiple protrusions can contact one of the terminals and leads, and then the tip can contact the other of the terminals and leads.

[0033] The areas where the leads and tabs face each other may include: a central region located at the center in the width direction and having solder beads formed therein; side regions located at each of the two ends in the width direction and having solder beads formed therein; and a contact area located between the central region and the side regions and not having solder beads formed therein. When probes are brought into contact, the lead probe and the tab probe may come into contact with the contact area.

[0034] Beneficial effects

[0035] According to a preferred embodiment of the present invention, the resistance measurement method is used to inspect the welding condition, and thus has the following advantages: it eliminates the need to perform destructive tests such as those involving tension, and allows for thorough inspection.

[0036] Furthermore, determining weak solder joints based on multiple resistance values ​​measured by a pair of tab probes and a pair of lead probes has the following advantages: compared with methods based on a single resistance value between a pair of probes according to related technologies, more accurate and precise measurements can be performed. Attached Figure Description

[0037] Figure 1 This is a perspective view of a typical electrode assembly.

[0038] Figure 2 This is a schematic diagram of an apparatus for inspecting the welding condition according to an embodiment of the present invention.

[0039] Figure 3 This is a schematic diagram illustrating the operation of an apparatus for inspecting the welding condition according to an embodiment of the present invention.

[0040] Figure 4 This is a flowchart of a method for inspecting the welding condition according to an embodiment of the present invention.

[0041] Figure 5 This is a schematic diagram of an apparatus for inspecting the welding condition according to another embodiment of the present invention.

[0042] Figure 6 This is an exploded view of a connector probe according to another embodiment of the present invention.

[0043] Figure 7 This is an exploded view of a lead probe according to another embodiment of the present invention. Detailed Implementation

[0044] Preferred embodiments of the invention will be described in detail below with reference to the accompanying drawings to enable those skilled in the art to readily implement the invention. However, the invention may be implemented in different forms and should not be construed as being limited to the embodiments set forth herein.

[0045] Detailed descriptions of relevant well-known techniques that are irrelevant to the description or may unnecessarily obscure the subject matter of the invention will be omitted in order to clearly describe the invention. Throughout the specification, the same reference numerals refer to the same elements.

[0046] Furthermore, the terms or words used in this specification and claims should not be construed as having a general meaning or a dictionary-based meaning, but should be interpreted as having a meaning and concept that is within the scope of this invention, based on the principle that the inventor can appropriately define the concepts of the terms in order to best describe his invention.

[0047] Figure 2 This is a schematic diagram of an apparatus for inspecting the welding condition according to an embodiment of the present invention. Figure 3 This is a schematic diagram illustrating the operation of an apparatus for inspecting the welding condition according to an embodiment of the present invention.

[0048] The apparatus for inspecting the welding status according to an embodiment of the present invention (hereinafter referred to as the "inspection apparatus") can inspect the welding status between the terminal block 20 and the lead wire 30 of the electrode assembly 10.

[0049] At least a portion of the areas 50 where the connector 20 and the lead 30 face each other can be welded to each other, and the type of weld is not limited. For example, the connector 20 and the lead 30 can be welded using any of the following methods: ultrasonic welding, laser welding, and electromagnetic pulse welding.

[0050] The testing device may include a contact probe 110 that contacts the contact piece 20 and a lead probe 120 that contacts the lead wire 30. The pair of contact probes 110 and the pair of lead probes 120 may be probes for measuring microresistance.

[0051] More specifically, the tab probe 110 may contact the region 50 on the tab 20 side, and the lead probe 120 may contact the region 50 on the lead 30 side.

[0052] The connector probes 110 can be configured as a pair spaced apart from each other in the width direction of the connector 20. The lead probes 120 can be configured as a pair spaced apart from each other in the width direction of the lead 30. More specifically, the pair of connector probes 110 can contact two sides of the connector 20 in the width direction, and the pair of lead probes 120 can contact two sides of the lead 30 in the width direction.

[0053] The tab probes 110 and 120 may be arranged to face each other, with the tab 20 and 30 disposed between them. More specifically, one tab probe 110 of the pair of tab probes 110 may face one 120 of the pair of 120 120. Similarly, the other tab probe 110 of the pair of tab probes 110 may face the other 120 of the pair of 120 120.

[0054] Therefore, resistance can be measured with the lugs 20 and leads 30 bound between the lug probes 110 and the lead probes 120.

[0055] A control unit (not shown) included in the inspection device can measure the resistance between two probes of the pair of tab probes 110 and the pair of lead probes 120. The control unit may include at least one processor.

[0056] Each of probes 110 and 120 may include each of voltage probe members 112a and 122a and each of current probe members 112b and 122b, and the control unit may use a four-wire resistance measurement method. Compared to a two-wire resistance measurement method, the four-wire resistance measurement method is almost unaffected by contact resistance, and therefore can accurately measure micro-resistances. Both two-wire and four-wire resistance measurement methods are well-known techniques, and therefore detailed descriptions thereof will be omitted.

[0057] More specifically, the control unit can measure a first resistance value between the pair of connector probes 110, a second resistance value between one connector probe 110 and one lead probe 120, and a third resistance value between another connector probe 110 and another lead probe 120. Furthermore, the control unit can determine weak solder joints between the connector 20 and the lead 30 based on the first to third resistance values. The control unit can also determine weak solder joints between multiple connectors 20 based on the first resistance value.

[0058] However, embodiments of the present invention are not limited thereto, and the control unit can further measure a fourth resistance value between the pair of lead probes 120. The control unit can determine a weak solder joint between the tab 20 and the lead 30 based on the first to fourth resistance values.

[0059] The detailed structure of each of the connector probe 110 and lead probe 120 will be described below.

[0060] Each of the connector probe 110 and the lead probe 120 may include each of the bodies 111 and 121, and a pair of probe members 112 and 122 protruding from each of the bodies 111 and 121.

[0061] Each of the bodies 111 and 121 may have a hollow cylindrical shape extending in a direction perpendicular to the surface of the connector 20 or lead 30. However, the shapes of the bodies 111 and 121 are not limited thereto.

[0062] Each of bodies 111 and 121 can be configured to be movable to approach or move away from the terminal block 20 or lead 30. For example, a lifting mechanism can be connected to each of bodies 111 and 121. Thus, each of probes 110 and 120 can selectively contact the terminal block 20 or lead 30.

[0063] Therefore, each of the probe components 112 and 122 can protrude from each of the bodies 111 and 121 toward the terminal block 20 or the lead 30.

[0064] Springs 117 and 127, which press probe components 112 and 122 respectively in the protruding direction (see...) Figure 6 The springs 117 and 127 can be provided in each of the bodies 111 and 121. Thus, as the springs 117 and 127 are compressed, the probe members 112 and 122 can contact the terminal block 20 or the lead 30 to prevent the terminal block 20 or the lead 30 from being damaged or deformed.

[0065] although Figure 2 and Figure 3 Not shown, but each of bodies 111 and 121 may be provided with shields 116 and 126 (see [reference]). Figure 6 and Figure 7 In each of the components, the shielding minimizes the exposure of probe components 112 and 122. Therefore, noise can be minimized when probe components 112 and 122 measure resistance.

[0066] In each of the pair of probe members 112 and 122 protruding from the bodies 111 and 121, one probe member may be each of the voltage probe members 112a and 122a for detecting voltage, while the other probe member may be each of the current probe members 112b and 122b for applying current.

[0067] Therefore, the control unit can determine the first resistance value from the value of the current flowing through the current probe member 112a of the pair of connector probes 110 and the voltage value measured between the voltage probe member 112b of the pair of connector probes 110.

[0068] The control unit can determine the second resistance value from the value of the current flowing through the current probe member 112a of a terminal probe 110 and the current probe member 122a of a lead probe 120, and the voltage value measured between the voltage probe member 112b of a terminal probe 110 and the voltage probe member 122b of a lead probe 120.

[0069] The control unit can determine the third resistance value from the value of the current flowing through the current probe member 122a of another terminal probe 110 and the current probe member 122a of another lead probe 120, as well as the voltage value measured between the voltage probe member 112b of another terminal probe 110 and the voltage probe member 122b of another lead probe 120.

[0070] Therefore, the control unit can determine a weak solder joint based on the first to the third resistance values. For example, the control unit can determine a weak solder joint when at least one of the first, second, and third resistance values ​​exceeds a preset critical resistance value.

[0071] Furthermore, the control unit can determine the fourth resistance value from the value of the current flowing through the current probe member 122a of the pair of lead probes 120 and the voltage value measured between the voltage probe members 122b of the pair of lead probes 120.

[0072] In this scenario, the control unit can determine a weak solder joint based on the first to fourth resistance values. For example, the control unit can determine a weak solder joint when at least one of the first, second, third, and fourth resistance values ​​exceeds a preset critical resistance value.

[0073] The connector probe 110 and lead probe 120 may not come into contact with the solder ball b formed by soldering.

[0074] More specifically, the area 50 where the connector 20 and the lead 30 face each other may include: a central area 51 disposed at the center in the width direction; a side area 53 disposed at each of the two ends in the width direction; and a contact area 52 disposed between the central area 51 and the side area 53 and in contact with the connector probe 110 and the lead probe 120.

[0075] Multiple solder beads b formed by welding can be grouped together in the central region 51. Solder beads b can also be formed in the side region 53. However, solder beads b may not be formed in the contact region 52. That is, the connector probe 110 and lead probe 120 may not be in contact with solder beads b.

[0076] The connector probe 110 and lead probe 120 can contact the contact area 52 to reduce the contact resistance caused by the solder ball b, thus enabling more accurate resistance measurement.

[0077] Furthermore, the side region 53 prevents each of the two edges of region 50 from separating or detaching. However, the side region 53 can be minimized for accurate measurement of the solder joint condition. Therefore, the length of the center region 51 can be greater than the length of the side region 53 relative to the width direction of the connector 20 or lead 30.

[0078] Figure 4 This is a flowchart of a method for inspecting the welding condition according to an embodiment of the present invention.

[0079] The method for inspecting the soldering condition according to an embodiment of the present invention (hereinafter referred to as the "inspection method") can be a method for inspecting the soldering condition between the connector 20 and the lead 30. That is, the inspection method can be a method for controlling the inspection device as described above.

[0080] The inspection method may include probe contact operation (S10), resistance measurement operation (S20), and judgment operation (S30).

[0081] In the probe contact operation (S10), a pair of lead probes 120 can contact the lead 30, and a pair of terminal probes 110 can contact the terminal 20.

[0082] In this case, as described above, the lead probe 120 and the connector probe 110 can contact the contact area 52. The lead probe 120 and the connector probe 110 can contact the contact area 52 simultaneously, or they can contact the contact area 52 sequentially at predetermined time intervals.

[0083] In the resistance measurement operation (S20), a first resistance value between the pair of lead probes 110, a second resistance value between one lead probe 110 and one lead probe 120, and a third resistance value between the other lead probe 110 and the other lead probe 120 can be measured. In the resistance measurement operation (S20), a fourth resistance value between the pair of lead probes 120 can be further measured. The above description applies here.

[0084] In the determination operation (S30), a weak solder joint between the terminal piece 20 and the lead wire 30 can be determined based on the first resistance value to the third resistance value.

[0085] For example, the control unit can determine a weak weld when at least one of the first to third resistance values ​​exceeds a preset critical resistance value. Here, the critical resistance values ​​corresponding to the first to third resistance values ​​can be different from each other.

[0086] When a fourth resistance value is further measured in the resistance measurement operation (S20), a weak contact between the connector 20 and the lead 30 can be determined by considering not only the first to third resistance values ​​but also the fourth resistance value, thereby performing a determination operation (S30). For example, the control unit can determine a weak solder joint when at least one of the first to fourth resistance values ​​exceeds a preset critical resistance value. Here, the critical resistance values ​​corresponding to the first to fourth resistance values ​​may be different from each other.

[0087] The critical resistance value can be preset by statistically processing the resistance data obtained from a sample group. More specifically, the resistance data obtained from a group with a large number of samples follows a normal distribution curve. In a normal distribution curve, objects with large deviations can be statistically presumed to be defective. Therefore, in the resistance data of a sample group represented by a normal distribution curve, most of the group has values ​​close to the average, and objects with deviations greater than the average can be presumed to be defective. Therefore, the value obtained by adding n times the standard deviation to the average (where n is a natural number) can be set as the critical resistance value. For example, the critical resistance value can be obtained by adding 6 times the standard deviation to the average. In a normal distribution curve, the probability of an object with a deviation of 6 times the average is 0.0000001%. Therefore, even if a defect is presumed to be caused by weak soldering, a resistance value greater than the critical resistance value can have sufficiently high reliability.

[0088] In the determination operation (S30), the weak weld is determined based on multiple resistance values. Therefore, compared with the method based on a single resistance value between a pair of probes according to relevant technology, a more accurate and precise measurement can be achieved.

[0089] Figure 5 This is a schematic diagram of an apparatus for inspecting the welding condition according to another embodiment of the present invention.

[0090] Figure 6 This is an exploded view of a connector probe according to another embodiment of the present invention. Figure 7 This is an exploded view of a lead probe according to another embodiment of the present invention.

[0091] Except for each of probe components 112 and 122, this embodiment is identical to the embodiment described above. Therefore, the common elements are applicable, and the following description will focus on the differences.

[0092] Each of the probe members 112 and 122 according to this embodiment may have an end portion provided with a tip 113 that contacts the connector 20 or lead 30, or may have an end portion provided with a counter surface 123 facing the connector 20 or lead 30 and a plurality of protrusions 124 protruding from the counter surface 123 to contact the connector 20 or lead 30.

[0093] More specifically, one of the tab probe 110 and the lead probe 120 may include a probe member having an end with a tip 113, and the other of the tab probe 110 and the lead probe 120 may include a probe member having an opposing surface 123 and a plurality of protrusions 124.

[0094] Relatedly, in the probe contact operation (S10) of the inspection method using the inspection apparatus according to this embodiment (see...) Figure 4 In the process, multiple protrusions 124 can contact one of the terminals 20 and the lead 30, and then contact the other of the terminals 20 and the lead 30.

[0095] In other words, the contact operation of the tip 113 can be performed while the opposing surface 123 and the plurality of protrusions 124 support the terminal piece 20 and the lead 30 over a large area. Therefore, concerns about deformation of the terminal piece 20 or the lead 30 caused by the contact operation of the tip 113 can be minimized.

[0096] Although the connector 20 and lead 30, which are facing each other with connector probe 110 and lead probe 120 sandwiched between them, are not properly aligned with each other, the deformation of connector 20 and lead 30 can be minimized by the contact operation of connector probe 110 and lead probe 120.

[0097] In the following text, such as Figures 5 to 7 The illustration will describe an example in which each probe member 112 of the connector probe 110 has an end provided with a tip 113 and each probe member 122 of the lead probe 120 has an end provided with an opposing surface 123 and a protrusion 124. The opposite case will also be readily understood by those skilled in the art.

[0098] The pair of probe members 112 provided in each of the connector probes 110 may each have an end with a tip 113 that contacts the connector 20. The tip 113 may protrude outward from the body 111, and more specifically from the shield 116.

[0099] The tip 113 can be formed to have a cross-sectional area that narrows towards the end. That is, the tip 113 can have a pointed shape. Therefore, when an oxide layer is provided on the surface of the terminal block 20, the tip 113 can penetrate the oxide layer, thereby solving the problem that the resistance value may not be accurately measured due to the oxide layer.

[0100] The pair of probe members 122 provided in each lead probe 120 may each have an end provided with an opposing surface 123 facing the lead 30 and a plurality of protrusions 124 protruding from the opposing surface 123 to contact the lead 30.

[0101] The opposing surface 123 may be plate-shaped, extending radially outward from the probe member. The opposing surface 123 may be disposed on the exterior of the body 121, more specifically, on the exterior of the shield 126.

[0102] Each of the protrusions 124 can be formed to have a cross-sectional area that narrows towards its end. That is, each of the protrusions 124 can have a pointed shape. Therefore, when an oxide layer is provided on the surface of the lead 30, the protrusions 124 can penetrate the oxide layer, thereby resolving concerns that the oxide layer may prevent accurate measurement of the resistance value.

[0103] Although exemplary embodiments of the invention have been described for illustrative purposes, various changes and modifications can be made to the invention by those skilled in the art without departing from the essential characteristics of this disclosure.

[0104] Therefore, the embodiments described above are intended to be illustrative and do not limit the scope of the invention. The scope of the invention is not limited by the embodiments.

[0105] The scope of protection of this invention should be interpreted based on the appended claims, and all technical concepts included within the scope equivalent to the claims are included in this invention.

[0106] [Explanation of reference numerals in the attached figures]

[0107] 20: Connector

[0108] 30: Lead wire

[0109] 51: Central Area

[0110] 52: Contact Area

[0111] 53: Side area

[0112] 110: Connector probe

[0113] 111: (Body of the connector probe)

[0114] 112: (of a connector probe) probe component

[0115] 113: Tip

[0116] 116: (Shielding of the connector probe)

[0117] 117: (Spring of the connector probe)

[0118] 120: Lead probe

[0119] 121: (The body of the lead probe)

[0120] 122: (of a lead probe) probe component

[0121] 123: Opposite surfaces

[0122] 124: protrusion

[0123] 126: (Shielding of lead probes)

[0124] 127: (The spring of the lead probe)

Claims

1. An apparatus for inspecting the soldering condition between terminals, the terminals protruding from a plurality of electrodes, spacers stacked between the plurality of electrodes, and leads soldered to the terminals, the apparatus for inspecting the soldering condition between terminals comprising: A pair of contact probes, the pair of contact probes contacting the contact and spaced apart from each other in the width direction of the contact; A pair of lead probes, the pair of lead probes contacting the lead and spaced apart from each other in the width direction of the lead; as well as A control unit configured to determine a weak solder joint based on a first resistance value between the pair of contact probes, a second resistance value between one contact probe and one lead probe, and a third resistance value between another contact probe and another lead probe. The control unit determines that the weld is weak when at least one of the first resistance value, the second resistance value, and the third resistance value exceeds a preset critical resistance value. The pair of contact probes contact the two sides of the contact piece in the width direction, and The pair of lead probes contact the two sides of the lead in the width direction.

2. The apparatus for checking the state of welding between tabs according to claim 1, wherein, The control unit is configured to determine weak soldering based on a first resistance value between the pair of contact probes, a second resistance value between one contact probe and one lead probe, a third resistance value between another contact probe and another lead probe, and a fourth resistance value between the pair of lead probes.

3. The apparatus for inspecting the welding state between the tabs according to claim 1, wherein, The connector probe and the lead probe are positioned facing each other, and the connector and the lead are disposed between the connector probe and the lead probe.

4. The apparatus for checking the state of welding between tabs according to claim 1, wherein, Each of the terminal probe and the lead probe includes a pair of probe members, one of which applies a current and the other of which detects a voltage. Each of the probe components has an end portion, and the end portion is provided with: The tip, which contacts the terminal block or the lead and has a pointed shape; or The opposing surface of the terminal block or the lead wire, and a plurality of protrusions that protrude from the opposing surface and contact the terminal block or the lead wire.

5. The apparatus for inspecting the state of welding between tabs according to claim 4, wherein, One of the terminal probe and the lead probe includes a pair of probe members, each having an end with the tip provided. The other of the tab probe and the lead probe includes the pair of probe members, each having an end provided with the opposing surface and the plurality of protrusions.

6. The apparatus for inspecting the welding state between the tabs according to claim 4, wherein, Each of the tab probe and the lead probe further includes a spring configured to apply an elastic force to cause the probe member to protrude.

7. A method for inspecting the soldering condition between terminals, the terminals protruding from a plurality of electrodes, spacers stacked between the plurality of electrodes, and leads soldered to the terminals, the method comprising: Make a pair of lead probes contact the lead and make a pair of terminal probes contact the terminal; Measure the first resistance value between the pair of contact probes, the second resistance value between one contact probe and one lead probe, and the third resistance value between the other contact probe and the other lead probe; as well as Weak welds are determined based on the first resistance value, the second resistance value, and the third resistance value. Specifically, in the determination, a weak weld is determined when at least one of the first resistance value, the second resistance value, and the third resistance value exceeds a preset critical resistance value. Specifically, during probe contact, the pair of lead probes contact the two sides of the lead in the width direction, and The pair of connector probes contact the two sides of the connector in the width direction.

8. The method for inspecting the state of welding between the tabs according to claim 7, wherein, In the resistance measurement, a fourth resistance value is further measured between the pair of lead probes, and In the determination, the fourth resistance value is further considered to determine the weak weld.

9. The method for inspecting the state of welding between the tabs according to claim 7, wherein, In making the probes contact, the lead probe and the tab probe are positioned facing each other, and the tab and the lead are disposed between the lead probe and the tab probe.

10. The method for inspecting the state of welding between tabs according to claim 7, wherein, Each of the terminal probe and the lead probe includes a pair of probe members, one of which applies a current and the other of which detects a voltage. Wherein, one of the connector probe and the lead probe includes a pair of probe members, each having an end with a pointed tip, and The other of the connector probe and the lead probe includes the pair of probe members, each of the pair of probe members having an end provided with an opposing surface facing the connector or the lead and a plurality of protrusions protruding from the opposing surface.

11. The method for inspecting the state of welding between tabs according to claim 10, wherein, During the contact of the probe, the plurality of protrusions contact one of the tab and the lead, and then the tip contacts the other of the tab and the lead.

12. The method for checking the state of welding between tabs according to claim 7, wherein, The areas where the lead wire and the terminal block face each other include: A central region, wherein the central region is located at the center in the width direction and wherein solder beads are formed in the central region; Side regions, the side regions being disposed at each of the two ends in the width direction and having solder beads formed in the side regions; and A contact area is provided between the central area and the side area, and no solder beads are formed in the contact area. In the process of making the probes contact, the lead probe and the terminal probe make contact with the contact area.

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