用于ESD性能评估的TLP仿真激励模型
By using the TLP simulation excitation model, the problem of inaccurate test results for devices with different impedances was solved. By using the attenuation module to fit the impedance, a standard waveform was generated and fitted to the test waveform, thus achieving accurate evaluation of ESD performance.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HANG ZHOU NANO CORE CHIP ELECTRONIC TECH CO LTD
- Filing Date
- 2023-08-25
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies cannot accurately evaluate the ESD performance test results of devices under test with different impedances, resulting in low accuracy of test results.
The TLP simulation excitation model is adopted, including an excitation module, an attenuation module, a test module, and a probe module. The impedance of the TLP test instrument is fitted by the attenuation module to generate a standard waveform. The waveform is then fitted under test voltage and current to output the test waveform.
It achieves accurate simulation of devices under test with different impedances, and the simulation results are more accurate. It can evaluate the maximum human body model level that chip pins can withstand and the characteristics of ESD protection devices.
Smart Images
Figure CN117092464B_ABST