An environmental simulation device for chip detection

Abstract

The application discloses an environment simulation device for chip detection, which comprises a base and a simulation box arranged on the base, wherein the simulation box is internally provided with a vortex space, the outer ring end of the vortex space is provided with an outlet, the vortex space is internally provided with partitions, a plurality of detection zones are formed between adjacent partitions, the detection zones are internally provided with environment simulation pieces, the partitions are provided with first doors capable of automatic resetting, the inner ring end of the vortex space is fixedly connected with elastic components, the end of the elastic components is fixedly connected with a bearing piece, the bearing piece is connected with a traction rope on the side away from the elastic components, and the bearing piece can pass through the first door under the traction of the traction rope and can also pass through the first door under the traction of the elastic components. The bearing piece and the chip to be detected can be moved from one detection zone to another detection zone for continuous detection, and therefore the detection efficiency is improved.

Description

Technical Field

[0001] This invention belongs to the field of chip testing technology, and in particular relates to an environmental simulation device for chip testing. Background Technology

[0002] Environmental simulation equipment is used to simulate the real-world or extreme environments in which a product will be used. This simulated environment allows for testing of the product, revealing its ability to maintain functional reliability under expected usage, transportation, or storage conditions. Furthermore, the testing and analysis can be used to study the extent and mechanism of environmental factors' influence.

[0003] When testing chips in multiple environmental scenarios, it is usually necessary to test the chip in one scenario, then remove it and place it in another scenario for testing. If there are too many environmental scenarios to test, this becomes too cumbersome and affects testing efficiency. Summary of the Invention

[0004] To address the problems of existing technologies, this invention provides an environmental simulation device for chip testing. This device features the advantage of using a traction rope to move the carrier and the chip under test from one testing area to another for continued testing. This solves the problem in existing technologies where, when testing chips in multiple environmental scenarios, it is typically necessary to complete the testing in one scenario and then remove the chip and place it in another scenario for further testing. This becomes overly cumbersome and reduces testing efficiency when there are many environmental scenarios to test.

[0005] This invention is implemented as follows: an environmental simulation device for chip testing includes a base and a simulation box disposed on the base. The simulation box has a vortex-shaped space inside, and an outlet is opened at the outer end of the vortex-shaped space. The vortex-shaped space has partitions inside, and several detection zones are formed between adjacent partitions. An environmental simulation component is placed in each detection zone. The partitions have a first door that can automatically reset. An elastic component is fixedly connected to the inner end of the vortex-shaped space, and a carrier component is fixedly connected to the end of the elastic component. A traction rope is connected to the carrier component on the side away from the elastic component. The carrier component can pass through the first door under the traction of the traction rope and also under the traction of the elastic component.

[0006] With this setup, different environments can be simulated in each testing zone. The chip to be tested is connected to the carrier and placed inside a certain testing zone for testing. When the test is passed, the carrier and the chip to be tested can be moved to another testing zone by a traction rope to continue testing. This avoids the problem of having to test in one environment, take the chip out and put it into another environment for testing again, or even repeat the above operation multiple times, thus improving testing efficiency.

[0007] As a preferred embodiment of the present invention, the environmental simulation component includes at least one of an electromagnetic generator, a humidity controller, and a temperature controller.

[0008] This setting allows for the simulation of different environments in each detection zone, ensuring the chip experiences distinct conditions within each zone. It's worth noting that some detection zones may not require environmental simulation; for example, they can serve as buffers between two adjacent zones to prevent environmental interference.

[0009] In a preferred embodiment of the present invention, the base is provided with a motor, the output end of the motor is fixedly connected to a winch, the traction rope is wound on the winch, and the motor and the carrier are signal connected.

[0010] During testing, the carrier itself is the testing device. The chip and the carrier are electrically connected, thereby testing the chip, such as current detection.

[0011] If the chip finishes testing within a certain range and passes the test, the motor receives a pass signal from the carrier (either side-by-side or inside the traction rope), and then the carrier and chip are pulled to the next range by the winch. If the chip fails within a certain range, the motor receives the failure signal from the carrier and then pulls the carrier and chip directly out of the simulation box via the winch.

[0012] Preferably, the upper side of the first door is rotatably connected to the partition. This configuration allows the first door to automatically reset under its own weight.

[0013] As a preferred embodiment of the present invention, the elastic component includes a first coil spring; The inner end of the vortex-shaped space has a receiving cavity, and a positioning post is rotatably connected to the middle of the receiving cavity. The first coil spring is wound around the positioning post, and the inner end of the first coil spring is fixedly connected to the positioning post. The outer end of the first coil spring is connected to the bearing member.

[0014] With this configuration, the carrier can be pulled into the inner circle of the vortex space by the traction of the elastic component. The strip-shaped elastic telescopic component has a certain length when returning to its original shape, making it difficult to pull the carrier and chip to a position near the inner end of the vortex space. However, since the first coil spring is wound around the positioning post, the carrier and chip can be pulled to the aforementioned position when returning to their original shape. Furthermore, the shape of the first coil spring is more compatible with the vortex space.

[0015] Furthermore, the end of the first coil spring can also be connected to a strip-shaped elastic telescopic member and a load-bearing member.

[0016] As a preferred embodiment of the present invention, the lower end of the positioning post extends out of the receiving cavity, and the lower end of the positioning post is connected to a lever or a second coil spring.

[0017] For example, the first coil spring can be reset by rotating the positioning pin with a lever, or the first coil spring can be reset by rotating the positioning pin with a second coil spring. Of course, it is also possible to drive the positioning pin to rotate by a motor.

[0018] As a preferred embodiment of the present invention, the simulation box includes an upper box and a lower box, and the vortex space includes a first sub-vortex space and a second sub-vortex space. The first sub-vortex space is located in the upper box, and the second sub-vortex space is located in the lower box. The upper box is connected to the lower box by a snap-fit ​​connection, and the first sub-vortex space and the second sub-vortex space are at least partially aligned.

[0019] With this configuration, when the upper housing is moved upward, the upper housing and the lower housing separate, thereby facilitating the maintenance and replacement of equipment in the first and second sub-vortex spaces.

[0020] As a preferred embodiment of the present invention, a frame is fixedly connected to the base, and a lifting drive component is fixedly connected to the frame. The lower end of the lifting drive component is fixedly connected to the upper side of the upper housing.

[0021] For example, the lifting drive can be set as an electric push rod. With this setting, the lifting drive can drive the upper box to move upward, thereby separating the upper box and the lower box.

[0022] As a preferred embodiment of the present invention, a plurality of second doors are provided on the upper side of the upper housing, and the second doors correspond to the detection area.

[0023] This setting also allows the chip to be tested to enter the corresponding testing area through the second gate.

[0024] Preferably, the rack can be equipped with a slide and a robotic arm, so that the robotic arm can automatically remove the chip from one detection area, move it through the slide, and place it into another detection area.

[0025] As a preferred embodiment of the present invention, the environmental simulation component is located in the upper housing; The detection area includes an upper detection area and a lower detection area; The partition is located in the upper box, the upper side of the first door is rotatably connected to the partition, and the first door is located in the lower box; Two first doors are provided on the lower side of each partition. A first magnet is fixedly connected to the surface of each of the two first doors on the side facing away from each other. A second magnet and a third magnet are fixedly connected to the left and right sides of each partition. The second magnet and the third magnet are both electromagnets. The second magnet and the first magnet attract each other, and the third magnet and the first magnet repel each other.

[0026] With this setup, when the upper and lower housings are joined together, the second magnet is de-energized, while the third magnet is energized. Because the third magnet and the first magnet repel each other, pushing the first door to reset will result in it being stuck and difficult to reset by its own gravity. When the upper housing moves upward, the second magnet is energized, and the third magnet is de-energized. At this time, the first door is attracted and adheres to the lower end of the upper detection area. Furthermore, each upper detection area has two first doors adhering to its lower side, thus forming a new detection area. This new area has a smaller volume, allowing for faster adjustment and change of parameters such as temperature and humidity.

[0027] In practice, a flexible layer is provided at the edge of the door to achieve a sealing effect.

[0028] Compared with the prior art, the beneficial effects of the present invention are as follows: 1. In this invention, different environments can be simulated in each detection zone. The chip to be tested is connected to the carrier and placed inside a certain detection zone for testing. When the test is qualified, the carrier and the chip to be tested can be moved to another detection zone by the traction rope to continue testing. This avoids the problem of having to test in one environmental scenario, take out the chip and put it into another environmental scenario for testing again, or even repeat the above operation multiple times, thus improving the testing efficiency. 2. In this invention, different environments can be simulated in each detection zone, so that the chip experiences different environments in each detection zone. It should be noted that some detection zones may not be simulated, for example, they can be used as buffers between two adjacent detection zones to prevent mutual interference between the environments of the detection zones. 3. In this invention, a motor is provided, and a winch is fixedly connected to the output end of the motor. The traction rope is wound on the winch, and the motor and the carrier are signal connected. During testing, the carrier itself is a testing device, and the chip is electrically connected to the carrier to test the chip, for example, by current detection. If the chip completes the test within a certain range and passes, the motor receives a pass signal from the carrier and then pulls the carrier and the chip to the next range via the winch. If the chip fails within a certain range, the motor receives a fail signal from the carrier and then pulls the carrier and the chip directly out of the simulation box via the winch. 4. In this invention, the carrier can be pulled to the inner circle of the vortex space by the traction of the elastic component; the strip-shaped elastic telescopic component, such as a spring or elastic rubber rope, has a certain length when it returns to its original shape, so it is difficult to pull the carrier and the chip to the position near the inner end of the vortex space. However, since the first coil spring is wound around the positioning post, the carrier and the chip can be pulled to the above position when it returns to its original shape; and the shape of the first coil spring is more suitable to the vortex space. 5. In this invention, when the upper housing is moved upward, the upper housing and the lower housing separate, thereby facilitating the maintenance and replacement of equipment in the first sub-vortex space and the second sub-vortex space. Attached Figure Description

[0029] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below.

[0030] Figure 1 This is a first-view three-dimensional structural diagram of the environmental simulation device for chip testing provided in an embodiment of the present invention; Figure 2 This is a second-view perspective three-dimensional structural diagram of the environmental simulation device for chip testing provided in an embodiment of the present invention; Figure 3 This is a third-view perspective three-dimensional structural diagram of the environmental simulation device for chip testing provided in an embodiment of the present invention; Figure 4 This is a schematic diagram of the main view structure of the environmental simulation device for chip testing provided in an embodiment of the present invention; Figure 5 This is provided by the embodiments of the present invention. Figure 4 A cross-sectional three-dimensional structural diagram of section AA; Figure 6 This is provided by the embodiments of the present invention. Figure 4 A cross-sectional three-dimensional structural diagram of the middle BB section; Figure 7 This is a schematic diagram of the partition and the first door provided in one embodiment of the present invention; Figure 8 This invention provides Figure 7 A magnified structural diagram of section C; Figure 9 This is a schematic diagram of a structure in which a second magnet and a third magnet are arranged side by side, according to an embodiment of the present invention.

[0031] In the diagram: 1. Base; 2. Simulation box; 3. Vortex space; 4. Exit; 5. Partition; 6. First door; 7. Elastic component; 8. Bearing component; 9. Traction rope; 10. Detection area; 11. Motor; 12. Winch; 14. Receiving cavity; 15. Positioning column; 201. Upper box; 202. Lower box; 301. First sub-vortex space; 302. Second sub-vortex space; 16. Frame; 17. Lifting drive component; 18. Second door; 101. Upper detection area; 102. Lower detection area; 19. First magnet; 20. Second magnet; 21. Third magnet. Implementation

[0032] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0033] Please see Figures 1-3 A preferred embodiment of the present invention provides an environmental simulation device for chip testing, comprising a base 1, a simulation box 2 fixedly mounted on the base 1, a vortex space 3 inside the simulation box 2 having a vortex spiral structure, and an outlet 4 at the outer end of the vortex space 3; a partition 5 inside the vortex space 3, forming a plurality of detection zones 10 between adjacent partitions 5, and an environmental simulation component within each detection zone 10; a first door 6 that can automatically reset is provided on the partition 5; an elastic component 7 is fixedly connected to the inner end of the vortex space 3, and a carrier 8 is fixedly connected to the end of the elastic component 7; a traction rope 9 is connected to the side of the carrier 8 away from the elastic component 7; the carrier 8 can pass through the first door 6 under the traction of the traction rope 9 and also under the traction of the elastic component 7, that is, the carrier 8 can pass through the first door 6 from two directions under the action of the traction rope 9 or the elastic component 7 to enter different detection zones 10.

[0034] With this setup, several detection zones 10 are formed between adjacent partitions 5. Each detection zone 10 contains an environmental simulation component, and each detection zone 10 can simulate a different environment. The chip to be tested is placed on the carrier 8 and placed inside a certain detection zone 10 for testing. When the test is qualified, the carrier 8 and the chip to be tested can be moved to another detection zone 10 by the traction rope 9 to continue testing. This avoids the problem of having to test in one environmental scenario, take the chip out and put it into another environmental scenario for testing again, or even repeat the above operation multiple times, thus improving the testing efficiency.

[0035] It should be noted that both the partition 5 and the box are made of electromagnetic shielding material, or at least have electromagnetic shielding material attached to their surfaces.

[0036] Furthermore, the environmental simulation component includes at least one of an electromagnetic generator, a humidity controller, and a temperature controller. For example, all three components (electromagnetic generator, humidity controller, and temperature controller) can be provided, or only one component (electromagnetic generator, humidity controller, or temperature controller) can be provided, or only one component (electromagnetic generator and humidity controller) can be provided without a temperature controller, thereby creating different detection environments.

[0037] This setting allows for the simulation of different environments in each detection zone 10, enabling the chip to experience different environments in each detection zone 10. It should be noted that some detection zones 10 may not require environmental simulation; for example, they can serve as buffers between two adjacent detection zones 10 to prevent environmental interference between them.

[0038] Furthermore, the base 1 is equipped with a motor 11, and the output end of the motor 11 is fixedly connected to a winch 12. The traction rope 9 is wound around the winch 12, and the motor 11 and the carrier 8 are signal connected. During testing, the carrier 8 itself is a testing device. The chip is electrically connected to the carrier 8, thereby enabling testing of the chip, such as current detection.

[0039] If the chip completes the test within a certain range and passes, the motor 11 receives a pass signal from the carrier 8 (e.g., via a wire, which may be parallel to or inside the traction rope 9), and then the winch 12 pulls the carrier 8 and the chip to another range; if the chip fails within a certain range, the motor 11 receives a fail signal from the carrier 8, and then the winch 12 directly pulls the carrier 8 and the chip out of the simulation box 2.

[0040] Furthermore, the upper side of the first door 6 is rotatably connected to the partition 5. This configuration allows the first door 6 to automatically reset and close under its own weight, ensuring that adjacent detection areas 10 have independent and distinct simulation environments after the support member 8 passes through. The lower side of the first door 6 can fit against the lower side of the vortex space 3 to guarantee effective isolation. The first door 6 and the partition 5 can be connected by a pin or by an elastic element (e.g., a spring or torsion spring). The elastic element promotes the reset of the first door 6, giving it a tendency to reset, thereby increasing the reset capability of the first door 6.

[0041] For further details, please refer to Figure 2 The elastic component 7 includes a first coil spring; The inner end of the vortex space 3 has a receiving cavity 14, and a positioning post 15 is rotatably connected to the middle of the receiving cavity 14. The first coil spring is wound around the positioning post 15, and the inner end of the first coil spring is fixedly connected to the positioning post 15. The outer end of the first coil spring is connected to the bearing member 8.

[0042] With this configuration, the carrier 8 can be pulled into the inner circle of the vortex space 3 by the traction of the elastic component 7. Strip-shaped elastic telescopic components, such as springs or elastic rubber ropes, have a certain length when returning to their original shape, making it difficult to pull the carrier 8 and the chip to a position near the inner end of the vortex space 3. However, since the first coil spring is wound around the positioning post 15, the carrier 8 and the chip can be pulled to the aforementioned position when returning to their original shape. Furthermore, the shape of the first coil spring is more compatible with the vortex space 3.

[0043] Furthermore, the end of the first coil spring can also be connected to the bearing member 8 via a strip-shaped elastic telescopic member, such as a spring or elastic rubber rope.

[0044] Furthermore, the lower end of the positioning post 15 extends out of the receiving cavity 14, and a lever or a second coil spring is connected to the lower end of the positioning post 15. For example, the positioning post 15 can be rotated by the lever to assist the first coil spring in resetting, or the first coil spring can be resetting by the second coil spring. Of course, it is also possible that the positioning post 15 is driven to rotate by a motor.

[0045] Please see Figures 3-6The simulation box 2 includes an upper box 201 and a lower box 202. The vortex space 3 includes a first sub-vortex space 301 and a second sub-vortex space 302. The first sub-vortex space 301 is located in the upper box 201, and the second sub-vortex space 302 is located in the lower box 202. The upper box 201 is connected to the lower box 202 by a snap-fit ​​connection, ensuring that the first sub-vortex space 301 and the second sub-vortex space 302 are at least partially aligned. With this configuration, when the upper box 201 is moved upwards, the upper box 201 and the lower box 202 separate, facilitating the maintenance and replacement of equipment within the first sub-vortex space 301 and the second sub-vortex space 302.

[0046] Please see Figure 3 A frame 16 is fixedly connected to the base 1, and a lifting drive component 17 is fixedly connected to the frame 16. The lower end of the lifting drive component 17 is fixedly connected to the upper side of the upper housing 201. For example, the lifting drive component 17 is configured as an electric push rod. With this configuration, the lifting drive component 17 can drive the upper housing 201 to move upward, thereby separating the upper housing 201 and the lower housing 202.

[0047] Please see Figure 1 The upper housing 201 has several second doors 18 on its upper side, and the second doors 18 correspond to the detection areas 10. With this setting, the chip to be tested can also directly enter the corresponding detection area 10 through the second door 18, and at this time, it does not need to pass through other detection areas 10. Of course, the chip can also be directly taken out from the corresponding detection area 10 through the second door 18.

[0048] Preferably, a slide and a robotic arm can be provided on the rack 16, so that the robotic arm can automatically take the chip out from one detection area 10, move it through the slide, and put it into another detection area 10.

[0049] Please see Figures 5-9 The environmental simulation component is located in the upper housing 201; The detection area 10 includes an upper detection area 101 and a lower detection area 102; The partition 5 is located in the upper box 201, the upper side of the first door 6 is rotatably connected to the partition 5, and the first door 6 is located in the lower box 202; Two first doors 6 are provided on the lower side of each partition 5. A first magnet 19 is fixedly connected to the surface of each of the two first doors 6 on the side away from each other. A second magnet 20 and a third magnet 21 are fixedly connected to the left and right sides of each partition 5. The second magnet 20 and the third magnet 21 are both electromagnets. The second magnet 20 and the first magnet 19 attract each other, while the third magnet 21 and the first magnet 19 repel each other.

[0050] With this setup, when the upper housing 201 and lower housing 202 are joined together, the second magnet 20 is de-energized, while the third magnet 21 is energized. Since the third magnet 21 and the first magnet 19 repel each other, the first door 6 can be pushed back to its original position (sometimes the first door 6 may be stuck and difficult to reset by its own gravity), ensuring that the first door 6 is in the reset state and maintaining the preset simulated environment of the detection area 10. When the upper housing 201 moves upward, the second magnet 20 is energized, and the third magnet 21 is de-energized. At this time, the first door 6 is attracted and adheres to the lower end of the upper detection area 101, and each upper detection area 101 has two first doors 6 adhering to its lower side, thus forming a new detection area 10. This new detection area 10 has a smaller volume, allowing for faster adjustment and change of parameters such as temperature and humidity.

[0051] In practice, the edges of the doors are provided with a flexible layer (such as a rubber layer) to achieve a sealing effect. For example, if the edges of the first door 6 are provided with a flexible layer, the edges of the second door 18 can also be provided with a flexible layer.

[0052] The following is a more specific working principle of the present invention: In this invention, a simulation box 2 is fixedly connected to the base 1. The simulation box 2 has a vortex-shaped space 3 inside, and an outlet 4 is opened at the outer end of the vortex-shaped space 3. The vortex-shaped space 3 has a partition 5 inside, and the partition 5 has a first door 6 that can automatically reset. An elastic component 7 is fixedly connected to the inner end of the vortex-shaped space 3. A bearing component 8 is fixedly connected to the end of the elastic component 7. A traction rope 9 is connected to the side of the bearing component 8 away from the elastic component 7. The bearing component can pass through the first door 6 under the traction of the traction rope 9, and the bearing component 8 can pass through the first door 6 under the traction of the elastic component 7. A plurality of detection zones 10 are formed between adjacent partitions 5, and environmental simulation components are contained in the detection zones 10. Several detection zones 10 are formed by the partition 5. Each detection zone 10 can simulate a different environment. The chip to be tested is connected to the carrier 8 and placed inside a certain detection zone 10 for testing. When the test is qualified, the carrier 8 and the chip to be tested can be moved to another detection zone 10 by the traction rope 9 or the elastic component 7 to continue testing. This ensures the continuity of testing and avoids the problem of having to test in one environment, take out the chip and put it into another environment for testing again, or even repeat the above operation multiple times. Therefore, the testing efficiency is improved.

[0053] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. An environmental simulation device for chip testing, comprising a base (1) and a simulation chamber (2) disposed on the base (1), characterized in that: The simulation box (2) has a vortex space (3) inside, and an outlet (4) is opened at the outer end of the vortex space (3). The vortex space (3) has a partition (5) inside, and a plurality of detection zones (10) are formed between adjacent partitions (5), and the detection zones (10) contain environmental simulation components; The partition (5) has a first door (6) that can automatically reset; An elastic component (7) is fixedly connected to the inner end of the vortex space (3), and a bearing component (8) is fixedly connected to the end of the elastic component (7). A traction rope (9) is connected to the side of the bearing component (8) away from the elastic component (7). The bearing component (8) can pass through the first door (6) under the traction of the traction rope (9), and can also pass through the first door (6) under the traction of the elastic component (7). The base (1) is equipped with a motor (11), and the output end of the motor (11) is fixedly connected to a winch (12). The traction rope (9) is wound onto the winch (12). The motor (11) and the carrier (8) are connected by a signal. During testing, the carrier (8) is the testing equipment, and the chip is electrically connected to the carrier (8) to test the chip. If the chip finishes testing in a certain range and is qualified, the motor (11) receives the qualified signal from the carrier (8) and pulls the carrier (8) and the chip to another range through the winch (12). If the chip is unqualified in a certain range, the motor (11) receives the unqualified signal from the carrier (8) and pulls the carrier (8) and the chip directly out of the simulation box (2) through the winch (12).

2. The environmental simulation device for chip testing as described in claim 1, characterized in that: The environmental simulation component includes at least one of an electromagnetic generator, a humidity controller, and a temperature controller.

3. The environmental simulation device for chip testing as described in claim 1, characterized in that: The upper side of the first door (6) is rotatably connected to the partition (5).

4. The environmental simulation device for chip testing as described in claim 1, characterized in that: The elastic component (7) includes a first coil spring; The inner end of the vortex space (3) has a receiving cavity (14), and a positioning post (15) is rotatably connected to the middle of the receiving cavity (14). The first coil spring is wound around the positioning post (15), and the inner end of the first coil spring is fixedly connected to the positioning post (15). The outer end of the first coil spring is connected to the carrier (8).

5. The environmental simulation device for chip testing as described in claim 4, characterized in that: The lower end of the positioning post (15) extends out of the receiving cavity (14), and the lower end of the positioning post (15) is connected to a lever or a second coil spring.

6. The environmental simulation device for chip testing as described in claim 1, characterized in that: The simulation box (2) includes an upper box (201) and a lower box (202). The vortex space (3) includes a first sub-vortex space (301) and a second sub-vortex space (302). The first sub-vortex space (301) is located in the upper box (201), and the second sub-vortex space (302) is located in the lower box (202). The upper box (201) is connected to the lower box (202) by a snap-fit ​​connection, and the first sub-vortex space (301) and the second sub-vortex space (302) are at least partially aligned.

7. The environmental simulation device for chip testing as described in claim 6, characterized in that: A frame (16) is fixedly connected to the base (1), and a lifting drive (17) is fixedly connected to the frame (16). The lower end of the lifting drive (17) is fixedly connected to the upper side of the upper box (201).

8. The environmental simulation device for chip testing as described in claim 6, characterized in that: The upper box (201) has several second doors (18) on its upper side, and the second doors (18) correspond to the detection area (10).

9. The environmental simulation device for chip testing as described in claim 1, characterized in that: The edge of the first door (6) is provided with a flexible layer.

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