Test system and automatic test method for detecting output signals of a Tcon module

Abstract

The application provides a test system and an automatic test method for detecting a Tcon module output signal. The test system comprises a Tcon-DC processing module, an ADC processing module, a USB-to-serial signal processing module and a main control test system connected in sequence. The application has the beneficial effects that the application meets the needs of LCD television board card production automation testing, has high test efficiency, low cost, no signal missing detection and achieves very good technical effects.

Description

Technical Field

[0001] This invention relates to the field of testing technology, and in particular to a testing system and automatic testing method for detecting the output signal of a Tcon module. Background Technology

[0002] The Tcon module is a timing control circuit on an LCD display, used to control the Data Source signal addressing drive and Gate scan timing control. To reduce LCD display costs, some LCD screens omit the Tcon module circuitry, transferring some of it to an LCD TV or commercial display signal processing board (hereinafter referred to as the TV board). The Tcon module output signals include mini-LVDS, Gamma voltage, data phase-locked loop pulse, scan clock signal, scan enable, shift latch pulse, etc. Testing these signals presents numerous challenges for production.

[0003] Currently, the main testing method is to connect to an LCD display for testing, which is inefficient and costly. Some methods involve adding a Mini-LVDS to HDMI signal processor for partial functional testing, but this may result in missed tests for other signals (such as Gamma voltage, timing pulses, etc.). Summary of the Invention

[0004] This invention provides a test system for detecting the output signal of a Tcon module, comprising a Tcon-DC processing module, an ADC processing module, a USB-to-serial signal processing module, and a main control test system connected in sequence.

[0005] The Tcon-DC processing module is used to receive the Tcon module signal output by the TV board under test, convert the Tcon module signal into multiple sets of DC voltage signals, and input the multiple sets of DC voltage signals to the ADC processing module.

[0006] The ADC processing module converts multiple sets of DC voltage signals into digital signals in USB bus format, and inputs the USB bus format digital signals to the USB to serial port signal processing module.

[0007] The USB to serial signal processing module converts the digital signal in USB bus format into a serial signal in RS232 format (TXD / RXD) and inputs the serial signal to the main control test system.

[0008] The main control test system decodes the serial port signal to obtain the test data information carried by the serial port signal, and compares the test data information carried by the serial port signal with the standard data preset in the main control test system to obtain the test result.

[0009] As a further improvement of the present invention, the Tcon-DC processing module performs detection of the Tcon module signal and adds DC voltage pre-bias processing to form multiple sets of DC voltage signals.

[0010] As a further improvement of the present invention, the ADC processing module acquires, quantizes, and digitally processes multiple sets of DC voltage signals to form digital signals in USB bus format.

[0011] As a further improvement of the present invention, the ADC processing module is an STM32 single-chip processor.

[0012] As a further improvement of the present invention, the USB to serial port signal processing module converts the digital signal in USB bus format into RS232 format TXD / RXD serial port signal through multiple USB integrators and multiple CH340 chips.

[0013] As a further improvement of the present invention, in the main control test system, the test data information carried by the serial port signal passes if it is within the standard data range, and NG if it is outside the standard data range.

[0014] This invention also discloses an automatic testing method, comprising the following steps:

[0015] Step 1: The program starts, sets the corresponding parameters and initializes them according to the test Tcon module type;

[0016] Step 2, Signal Acquisition and Conversion: The Tcon-DC processing module receives the Tcon module signal output from the TV board under test, converts the Tcon module signal into multiple sets of DC voltage signals, and inputs these multiple sets of DC voltage signals to the ADC processing module. The ADC processing module converts the multiple sets of DC voltage signals into digital signals in USB bus format, and inputs these USB bus format digital signals to the USB-to-serial signal processing module. The USB-to-serial signal processing module converts the USB bus format digital signals into RS232 format TXD / RXD serial port signals, and inputs these serial port signals to the main control test system.

[0017] Step 3: The main control test system decodes the serial port signal to obtain the test data information carried by the serial port signal. It compares the test data information carried by the serial port signal with the standard data preset in the main control test system to determine whether the test data information carried by the serial port signal is within the standard data range. If it is, then PASS is displayed and the process ends; otherwise, the comparison and judgment steps are executed.

[0018] Comparison and judgment steps: Check if the number of comparisons between the test data information carried by the serial port signal and the standard data preset in the main control test system is less than the set value. If yes, then return to step 2; otherwise, display NG and end.

[0019] As a further improvement of the present invention, in the comparison and judgment step, the value is set to 3.

[0020] The beneficial effects of this invention are: it meets the need for automated testing in LCD TV board production, has high testing efficiency and low cost, and eliminates signal omissions, thus achieving very good technical results. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the present invention;

[0022] Figure 2 This is a flowchart of the present invention. Detailed Implementation

[0023] This invention discloses a testing system for detecting the output signal of the Tcon module on an LCD TV board, which is used to meet the needs of automated testing in LCD TV board production.

[0024] like Figure 1 As shown, the test system of the present invention includes a Tcon-DC processing module, an ADC processing module, a USB to serial port signal processing module, and a main control test system connected in sequence.

[0025] The Tcon-DC processing module is used to receive the Tcon module signal (including mini-LVDS signal, Gamma voltage, data phase-locked pulse, scan clock signal, scan enable, shift latch pulse, etc.) output by the TV board under test, convert the Tcon module signal into multiple sets of DC voltage signals, and input the multiple sets of DC voltage signals to the ADC processing module.

[0026] The ADC processing module converts multiple sets of DC voltage signals into digital signals in USB bus format, and inputs the USB bus format digital signals to the USB to serial port signal processing module.

[0027] The USB-to-serial signal processing module converts the digital signal in USB bus format into a serial port signal in RS232 format (TXD / RXD) and inputs the serial port signal to the main control test system.

[0028] The main control test system decodes the serial port signal to obtain the test data information carried by the serial port signal, and compares the test data information carried by the serial port signal with the standard data preset in the main control test system (the standard data is initialized and imported before the test) to obtain the test result.

[0029] In a preferred embodiment of the present invention: the Tcon-DC processing module performs detection of the Tcon module signal and adds DC voltage pre-bias processing to form multiple sets of DC voltage signals. The ADC processing module is an STM32 single-chip processor. The ADC processing module acquires, quantizes, and digitally processes the multiple sets of DC voltage signals to form digital signals in USB bus format. Each STM32 single-chip processor can acquire 16 voltage signals. The present invention uses 7 STM32 single-chip processors for voltage data acquisition, and can acquire up to 112 data channels. The USB to serial port signal processing module converts the USB bus format digital signals into RS232 format TXD / RXD serial port signals through multiple USB integrators and multiple CH340 chips. In the main control test system, test data information carried by the serial port signal passes within the standard data range, and test data information carried by the serial port signal is NG (not accepted).

[0030] This invention provides an automated testing method (software) for the production and debugging of TV boards by processing and transforming all signals output by the Tcon module through signal conversion and software detection. For example... Figure 2 As shown, the present invention also discloses an automatic testing method, comprising the following steps:

[0031] Step 1: The program starts, sets the corresponding parameters and initializes them according to the test Tcon module type;

[0032] Step 2, Signal Acquisition and Conversion: The Tcon-DC processing module receives the Tcon module signal output from the TV board under test, converts the Tcon module signal into multiple sets of DC voltage signals, and inputs these multiple sets of DC voltage signals to the ADC processing module. The ADC processing module converts the multiple sets of DC voltage signals into digital signals in USB bus format, and inputs these USB bus format digital signals to the USB-to-serial signal processing module. The USB-to-serial signal processing module converts the USB bus format digital signals into RS232 format TXD / RXD serial port signals, and inputs these serial port signals to the main control test system.

[0033] Step 3: The main control test system decodes the serial port signal to obtain the test data information carried by the serial port signal. It compares the test data information carried by the serial port signal with the standard data preset in the main control test system to determine whether the test data information carried by the serial port signal is within the standard data range. If it is, then PASS is displayed and the process ends; otherwise, the comparison and judgment steps are executed.

[0034] Comparison and judgment steps: Check if the number of comparisons between the test data information carried by the serial port signal and the standard data preset in the main control test system is less than the set value. If yes, then return to step 2; otherwise, display NG and end.

[0035] In a preferred embodiment of the present invention, the value is set to 3 in the comparison and judgment step.

[0036] In summary, this invention meets the need for automated testing in LCD TV board production, offering high testing efficiency, low cost, and eliminating signal omissions, thus achieving excellent technical results.

[0037] The above description, in conjunction with specific preferred embodiments, provides a further detailed explanation of the present invention. It should not be construed that the specific implementation of the present invention is limited to these descriptions. For those skilled in the art, various simple deductions or substitutions can be made without departing from the concept of the present invention, and all such modifications and substitutions should be considered within the scope of protection of the present invention.

Claims

1. A test system for detecting the output signal of a Tcon module, characterized in that: It includes a Tcon-DC processing module, an ADC processing module, a USB-to-serial signal processing module, and a main control test system connected in sequence. The Tcon-DC processing module is used to receive the Tcon module signal output by the TV board under test, convert the Tcon module signal into multiple sets of DC voltage signals, and input the multiple sets of DC voltage signals to the ADC processing module. The ADC processing module converts multiple sets of DC voltage signals into digital signals in USB bus format, and inputs the USB bus format digital signals to the USB to serial port signal processing module. The USB to serial signal processing module converts the digital signal in USB bus format into a serial signal in RS232 format (TXD / RXD) and inputs the serial signal to the main control test system. The main control test system decodes the serial port signal to obtain the test data information carried by the serial port signal, and compares the test data information carried by the serial port signal with the standard data preset in the main control test system to obtain the test result. The Tcon-DC processing module performs detection of the Tcon module signal and adds DC voltage pre-bias processing to form multiple sets of DC voltage signals.

2. The testing system according to claim 1, characterized in that: The ADC processing module acquires, quantizes, and digitally processes multiple sets of DC voltage signals to form digital signals in USB bus format.

3. The testing system according to claim 1, characterized in that: The ADC processing module is an STM32 single-chip processor.

4. The testing system according to claim 1, characterized in that: The USB-to-serial signal processing module converts digital signals in USB bus format into RS232 format TXD / RXD serial signals through multiple USB integrators and multiple CH340 chips.

5. The testing system according to claim 1, characterized in that: In the main control test system, test data information carried by serial port signals that is within the standard data range will pass, while test data information carried by serial port signals that is outside the standard data range will be NG.

6. An automatic testing method, characterized in that, Includes the following steps: Step 1: The program starts, sets the corresponding parameters and initializes them according to the test Tcon module type; Step 2, Signal Acquisition and Conversion Steps: The Tcon-DC processing module receives the Tcon module signal output from the TV board under test, converts the Tcon module signal into multiple sets of DC voltage signals, and inputs the multiple sets of DC voltage signals into the ADC processing module; the ADC processing module converts the multiple sets of DC voltage signals into digital signals in USB bus format, and inputs the digital signals in USB bus format into the USB to serial port signal processing module. The USB to serial signal processing module converts the digital signal in USB bus format into a serial signal in RS232 format (TXD / RXD), and inputs the serial signal to the main control test system. Step 3: The main control test system decodes the serial port signal to obtain the test data information carried by the serial port signal. It compares the test data information carried by the serial port signal with the standard data preset in the main control test system to determine whether the test data information carried by the serial port signal is within the standard data range. If it is, then PASS is displayed and the process ends; otherwise, the comparison and judgment steps are executed. Comparison and judgment steps: Check if the number of comparisons between the test data information carried by the serial port signal and the standard data preset in the main control test system is less than the set value. If yes, then return to step 2; otherwise, display NG and end.

7. The automatic testing method according to claim 6, characterized in that: In the comparison and judgment step, the value is set to 3.

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