一种测试电路

By altering the motherboard's power supply path to the memory through a testing circuit and adjusting the voltage signal using a power module and a regulation module, the problem of low efficiency in memory voltage testing in existing technologies is solved, enabling rapid voltage limit testing and stability analysis.

CN117110828BActive Publication Date: 2026-07-17CHANGXIN MEMORY TECH INC
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHANGXIN MEMORY TECH INC
Filing Date
2022-05-17
Publication Date
2026-07-17

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Abstract

本公开涉及集成电路技术领域，公开一种测试电路，用于测试内存电压，内存连接于主板，且内存的电源信号引脚与主板的供电引脚不连接，测试电路包括电源模块和调节模块，电源模块用于输出至少一路供电信号；调节模块连接电源模块的输出端、反馈端和主板的供电引脚，调节模块响应于主板供电信号根据预设电压比调节供电信号以输出目标电压信号至内存的电源信号引脚。本公开提供的测试电路，将主板对于内存的供电信号作为本测试电路的控制信号，通过该测试电路改变主板对于内存的供电路径，通过电源模块和调节模块向内存输出电压可调的目标电压信号，对内存进行电压极限测试。
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