A method and apparatus for measuring the gate voltage of an integrated gate-commutated thyristor device.

Abstract

This invention relates to the field of power electronics and high-voltage measurement technology, and particularly to a method and apparatus for measuring the gate voltage of an integrated gate-commutated thyristor device. The invention uses a synchronous control module to control a delay control module, which in turn controls a sample-and-hold and AD sampling module. When analog switch Q1 is closed and analog switch Q2 is opened, the sample-and-hold and AD sampling modules are activated. This invention employs analog switches, a differential amplifier circuit, and an AD sampling circuit, combined with sampling trigger control and a high-speed sample-and-hold circuit, to achieve real-time and accurate measurement of the gate voltage.

Description

Technical Field

[0001] This invention relates to the field of power electronics and high voltage measurement technology, and in particular to a method and apparatus for measuring the gate voltage of an integrated gate commutated thyristor device. Background Technology

[0002] Gate-commutated thyristors (IGCTs) possess characteristics such as high blocking voltage, strong current-carrying capacity, and low on-state voltage, making them promising candidates for applications in DC power grids, locomotive traction, and metallurgical and chemical industries. As a current-controlled device, the gate-commutated thyristor's gate drive circuit is relatively complex. Typically, the gate-commutated thyristor and its drive circuit are integrated together to form an integrated gate-commutated thyristor (IGCT). Besides the thyristor chip, the integrated gate-commutated thyristor contains numerous other electronic components, which to some extent limits the reliability of this type of device. To ensure long-term safe and reliable operation, real-time monitoring of its key characteristic parameters is necessary.

[0003] In integrated gate-commutated thyristors, the gate voltage is a crucial characteristic parameter reflecting the device's state, providing direct reference value for junction temperature prediction, commutation characteristic evaluation, and even aging and failure assessment. Engineering applications demand high measurement accuracy of the gate voltage; for example, in junction temperature prediction, it typically needs to reach the millivolt or even microvolt level to be of practical value. Online measurement also requires a fast response time, at least on the microsecond level. Because integrated gate-commutated thyristors usually operate under high voltage and high current conditions, and are constantly in a high-speed switching state, they experience significant electromagnetic interference, both internally and in their surrounding environment, making accurate online measurement of the gate voltage extremely difficult.

[0004] For gate voltage measurement, the common approach is to first use a voltage divider to divide the voltage before introducing an ADC for measurement. The main drawback of this method is that, due to the low voltage at turn-on (~0.6V), direct sampling after voltage division (assuming a divider ratio of 8, then 0.075V at turn-on and 2.5V at turn-off) will not fully utilize the ADC's range, leading to significant measurement errors. Furthermore, the strong electromagnetic interference in actual operating conditions must also be considered, thus limiting this method to measurement accuracy only in the tens of millivolt range. In addition, there is currently a lack of effective methods to address the response time requirements of online measurements.

[0005] In summary, the gate voltage of an integrated gate-commutated thyristor is an important characteristic parameter reflecting the device's own state, but currently there is a lack of real-time and accurate online measurement methods. Summary of the Invention

[0006] To address the above problems, this invention provides a method and apparatus for measuring the gate voltage of an integrated gate-commutated thyristor device, aiming to solve the challenge of real-time and accurate online measurement of the gate voltage of an integrated gate-commutated thyristor.

[0007] In a first aspect, the present invention provides a gate voltage measurement device for an integrated gate-commutated thyristor device, comprising: an integrated gate-commutated thyristor, a synchronous control module, a differential amplification module, a delay control module, and a sample-and-hold and AD sampling module;

[0008] The gate G of the integrated gate commutated thyristor is connected to the first input terminal of the synchronization control module through resistor R1; the cathode K of the integrated gate commutated thyristor is connected to the second input terminal of the synchronization control module through resistor R2.

[0009] The first input terminal of the synchronization control module is connected to the first connection terminal of analog switch Q1, and the second input terminal of the synchronization control module is connected to the third connection terminal of analog switch Q2; the output terminal of the synchronization control module is v. q1 Connect the second connection terminal of analog switch Q1; output terminal v of the synchronous control module q2 Connect the second connection terminal of analog switch Q2; output terminal v of the synchronous control module tri Connect the input terminal of the delay control module; connect the third connection terminal of analog switch Q1 to the first connection terminal of analog switch Q2.

[0010] The first connection terminal of analog switch Q2 is connected to the first input terminal of the differential amplifier module; the third connection terminal of analog switch Q2 is connected to the second input terminal of the differential amplifier module.

[0011] The output of the differential amplifier module is connected to the first input of the sample-and-hold and AD sampling modules, and the output of the delay control module is connected to the second input of the sample-and-hold and AD sampling modules.

[0012] Furthermore, the first input terminal of the differential amplifier module is connected to pin 1 of the differential amplifier after passing through a capacitor C1 and a resistor R3 in parallel; the second input terminal of the differential amplifier module is connected to pin 8 of the differential amplifier after passing through a capacitor C4 and a resistor R6 in parallel.

[0013] Differential amplifier pin 1 is grounded after passing through a parallel capacitor C2 and a resistor R4, and differential amplifier pin 8 is grounded after passing through a parallel capacitor C3 and a resistor R5.

[0014] Differential amplifier pin 5 is grounded via resistor R8; resistor R7 is connected between differential amplifier pin 5 and pin 6; differential amplifier pin 6 serves as the output terminal of the differential amplifier module.

[0015] Furthermore, the first input terminal of the sample-and-hold module is connected to the sample-and-hold pin 2; the sample-and-hold ground pin is grounded;

[0016] The second input terminal of the sample-and-hold and AD sampling modules is connected to pin 7 of the sample-and-hold circuit.

[0017] Pin 8 of the sample-and-hold circuit is connected to the first input terminal of the analog-to-digital converter, and pin 7 of the sample-and-hold circuit is connected to the second input terminal of the analog-to-digital converter.

[0018] Furthermore, the input terminal of the delay control module is connected to pin 10 of the monostable multivibrator; pin 5 of the monostable multivibrator serves as the output terminal of the delay control module.

[0019] Capacitor C5 is connected between pins 6 and 7 of the monostable multivibrator; pin 7 of the monostable multivibrator is connected to the power supply VCC after being connected in series with resistor R9.

[0020] Furthermore, the first input terminal of the synchronization control module is connected to resistor R. 10 Then it is connected to comparator pin 3; the second input terminal of the synchronization control module is connected to comparator pin 1;

[0021] A resistor R is connected in parallel between comparator pin 1 and pin 3. 11 And diodes D1 and D2 connected in reverse parallel; a resistor R is connected between comparator pins 4 and 3. 12 ;

[0022] Comparator pin 4 is connected to resistor R 13 It is then connected to the power supply VCC, and comparator pin 4 is connected to resistor R. 14 The comparator pin 4 is connected to the input of the buffer driver; the output of the buffer driver is used as the output of the synchronization control module. q1 and the output terminal v of the synchronization control module tri ;

[0023] The output of the buffer driver, after passing through an NOT gate, becomes the output of the synchronization control module. q2 .

[0024] Secondly, the present invention provides a method for measuring the gate voltage of an integrated gate-commutated thyristor device, using the aforementioned integrated gate-commutated thyristor device gate voltage measuring device;

[0025] The delay control module is controlled by the synchronous control module, and the sample-and-hold and AD sampling modules are controlled by the delay control module.

[0026] When analog switch Q1 is closed and analog switch Q2 is opened, the sample-and-hold and AD sampling modules are started.

[0027] This invention has at least the following beneficial effects:

[0028] This invention employs an analog switch, a differential amplifier circuit, and an AD sampling circuit, along with sampling trigger control and a high-speed sample-and-hold circuit, to achieve real-time and accurate measurement of the gate voltage.

[0029] Other features and advantages of the invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures pointed out in the description and the drawings. Attached Figure Description

[0030] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0031] Figure 1 This is a circuit for online gate voltage measurement according to an embodiment of the present invention;

[0032] Figure 2 The timing diagrams are for the synchronization control module and the delay control module;

[0033] Figure 3 The delay control module and the differential amplifier module output v o The timing diagram;

[0034] Figure 4 This is a differential amplifier module circuit;

[0035] Figure 5 The circuit diagram for the sample-and-hold and AD sampling modules;

[0036] Figure 6 This is the circuit diagram for the delay control module;

[0037] Figure 7 This is the circuit diagram for the synchronization control module. Detailed Implementation

[0038] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0039] In the existing technology, the gate voltage of an integrated gate-commutated thyristor is an important characteristic parameter reflecting the state of the device itself, but there is currently a lack of real-time and accurate online measurement methods.

[0040] This invention addresses the challenge of accurately measuring the gate voltage of integrated gate-commutated thyristors (IGCTs) by proposing two solutions: First, with the assistance of a high-speed analog switch, the negative 20V voltage applied to the gate during the IGCT device's turn-off period is blocked, allowing only the weak signal to be measured when the device is on to enter the amplification circuit. After amplification, this signal enters the subsequent sampling circuit, thus fully utilizing the ADC chip's range and improving conversion accuracy. Second, at the moment the device is on, high-speed sample-and-hold and multiple high-speed samplings are implemented under the control of a synchronization signal, further improving the measurement accuracy of the gate voltage at a specific moment. Since the selected devices are all high-speed devices, accurate measurement can be achieved while also ensuring real-time performance to a certain extent.

[0041] In a first aspect, the present invention provides a gate voltage measurement device for an integrated gate-commutated thyristor device, comprising: an integrated gate-commutated thyristor, a synchronous control module, a differential amplification module, a delay control module, and a sample-and-hold and AD sampling module;

[0042] The gate G of the integrated gate commutated thyristor is connected to the first input terminal of the synchronization control module through resistor R1; the cathode K of the integrated gate commutated thyristor is connected to the second input terminal of the synchronization control module through resistor R2.

[0043] The first input terminal of the synchronization control module is connected to the first connection terminal of analog switch Q1, and the second input terminal of the synchronization control module is connected to the third connection terminal of analog switch Q2; the output terminal of the synchronization control module is v. q1 Connect the second connection terminal of analog switch Q1; output terminal v of the synchronous control module q2 Connect the second connection terminal of analog switch Q2; output terminal v of the synchronous control module tri Connect the input terminal of the delay control module; connect the third connection terminal of analog switch Q1 to the first connection terminal of analog switch Q2.

[0044] The first connection terminal of analog switch Q2 is connected to the first input terminal of the differential amplifier module; the third connection terminal of analog switch Q2 is connected to the second input terminal of the differential amplifier module.

[0045] The output of the differential amplifier module is connected to the first input of the sample-and-hold and AD sampling modules, and the output of the delay control module is connected to the second input of the sample-and-hold and AD sampling modules.

[0046] In this embodiment, the first input terminal of the differential amplifier module is connected to the differential amplifier pin 1 after passing through a capacitor C1 and a resistor R3 in parallel; the second input terminal of the differential amplifier module is connected to the differential amplifier pin 8 after passing through a capacitor C4 and a resistor R6 in parallel.

[0047] Differential amplifier pin 1 is grounded after passing through a parallel capacitor C2 and a resistor R4, and differential amplifier pin 8 is grounded after passing through a parallel capacitor C3 and a resistor R5.

[0048] Differential amplifier pin 5 is grounded via resistor R8; resistor R7 is connected between differential amplifier pin 5 and pin 6; differential amplifier pin 6 serves as the output terminal of the differential amplifier module.

[0049] In this embodiment, the first input terminal of the sample-and-hold and AD sampling modules is connected to the sample-and-hold pin 2; the sample-and-hold ground pin is grounded.

[0050] The second input terminal of the sample-and-hold and AD sampling modules is connected to pin 7 of the sample-and-hold circuit.

[0051] Pin 8 of the sample-and-hold circuit is connected to the first input terminal of the analog-to-digital converter, and pin 7 of the sample-and-hold circuit is connected to the second input terminal of the analog-to-digital converter.

[0052] In this embodiment, the input terminal of the delay control module is connected to pin 10 of the monostable multivibrator; pin 5 of the monostable multivibrator serves as the output terminal of the delay control module.

[0053] Capacitor C5 is connected between pins 6 and 7 of the monostable multivibrator; pin 7 of the monostable multivibrator is connected to the power supply VCC after being connected in series with resistor R9.

[0054] In this embodiment, the first input terminal of the synchronization control module is connected to resistor R. 10 Then it is connected to comparator pin 3; the second input terminal of the synchronization control module is connected to comparator pin 1;

[0055] A resistor R is connected in parallel between comparator pin 1 and pin 3. 11 And diodes D1 and D2 connected in reverse parallel; a resistor R is connected between comparator pins 4 and 3. 12 ;

[0056] Comparator pin 4 is connected to resistor R 13 It is then connected to the power supply VCC, and comparator pin 4 is connected to resistor R. 14 The comparator pin 4 is connected to the input of the buffer driver; the output of the buffer driver is used as the output of the synchronization control module. q1 and the output terminal v of the synchronization control module tri ;

[0057] The output of the buffer driver, after passing through an NOT gate, becomes the output of the synchronization control module. q2 .

[0058] In practical implementation, diodes D1 and D2 are connected in reverse parallel, meaning the anode of D1 is connected to the cathode of D2, and vice versa. At the output of the buffer driver, the signal is split into three paths. Two paths are sent to different hardware modules (Q1 and the delay control module in the diagram), and the third path, after passing through a NOT gate, serves as the output of the synchronization control module. q2 .

[0059] Secondly, the present invention provides a method for measuring the gate voltage of an integrated gate-commutated thyristor device, using the aforementioned integrated gate-commutated thyristor device gate voltage measuring device;

[0060] The delay control module is controlled by the synchronous control module, and the sample-and-hold and AD sampling modules are controlled by the delay control module.

[0061] When analog switch Q1 is closed and analog switch Q2 is opened, the sample-and-hold and AD sampling modules are started.

[0062] In practice, Figure 1 In this circuit, G and K correspond to the gate and cathode of the IGCT, respectively, and the gate voltage is the voltage between G and K. G and K are introduced into the synchronization control module through R1 and R2, respectively, and then into the differential amplifier circuit via analog switch Q1, before entering the sample-and-hold and AD sampling modules. The control signal v for the sample-and-hold and AD sampling modules... dl The input comes from the delay control module; the input of this module comes from the output v of the synchronization control module. tri When Q1 is closed and Q2 is open, it will enable energy v. tri After a delay, sampling and holding and AD sampling are started.

[0063] To enable those skilled in the art to better understand the present invention, the principles of the present invention are explained below in conjunction with the accompanying drawings:

[0064] This invention addresses the challenge of accurately measuring the gate voltage of integrated gate-commutated thyristors (IGCTs) by proposing two solutions: First, with the assistance of a high-speed analog switch, the negative 20V voltage applied to the gate during the IGCT device's turn-off period is blocked, allowing only the weak signal to be measured when the device is on to enter the amplification circuit. After amplification, this signal enters the subsequent sampling circuit, thus fully utilizing the ADC chip's range and improving conversion accuracy. Second, at the moment the device is on, high-speed sample-and-hold and multiple high-speed samplings are implemented under the control of a synchronization signal, further improving the measurement accuracy of the gate voltage at a specific moment. Since the selected devices are all high-speed devices, accurate measurement can be achieved while also ensuring real-time performance to a certain extent.

[0065] Figure 1This circuit implements online gate voltage measurement. Q1 and Q2 are analog switches, using Analog Devices (ADI) integrated chips, model ADG453. This chip integrates four analog switches, forming two pairs of normally open / normally closed switches; any pair can be selected in this circuit. The device's turn-on time is 70ns, and its turn-off time is 60ns.

[0066] Figure 1 In this circuit, G and K correspond to the gate and cathode of the IGCT, respectively, and the gate voltage is the voltage between G and K. G and K are introduced into the synchronization control module through R1 and R2, respectively, and then into the differential amplifier circuit via analog switch Q1, before entering the sample-and-hold and AD sampling modules. The control signal v for the sample-and-hold and AD sampling modules... dl The input comes from the delay control module; the input of this module comes from the output v of the synchronization control module. tri When Q1 is closed and Q2 is open, it will enable energy v. tri After a delay, sampling and holding and AD sampling are started.

[0067] The timing sequence of the synchronization control module and the delay control module is as follows: Figure 2 As shown.

[0068] Figure 2 In the middle, v GK The gate voltage; Q1, Q2 and v tri These are the output signals of the synchronization module. Q1 and Q2 are both closed when high and open when low. dl This is the output signal of the delay control module. When the IGCT is turned on, the gate voltage changes from -20V to ~0.6V (this voltage fluctuates during conduction). At this time, the synchronization module triggers Q1 to close and Q2 to open, and the gate voltage enters the differential amplifier, sample-and-hold, and AD sampling modules. The purpose of setting Q2 is to block the -20V applied to the gate when the IGCT is turned off. The purpose of adding the delay control module is twofold: first, to avoid interference during switchover; and second, to measure the gate signal at a specific moment after the IGCT is turned on. The delay module's parameters can be configured... Figure 2 Chinese v dl The delay time Δt1 and duration Δt2 are shown in the waveform diagram.

[0069] The purpose of setting the duration Δt2 is to accurately measure the gate signal at a specific moment. The following section combines the delay control module and the differential amplifier module to output v. o Timing diagram ( Figure 3 (This will be explained.)

[0070] Figure 3 v in o From the differential amplifier module, Figure 2 v in GKAfter differential amplification, the -20V signal is blocked, transforming it into a signal with an amplitude range of 0–2.4V (amplified four times from ~0.6V, assuming it reaches 80% of the AD chip's full-scale range, and the AD chip's full-scale range is 3V), i.e., v o Its voltage is 0V when the IGCT is off and ~2.4V (with fluctuations) when it is on. dl Under the control of the signal, the sample-and-hold module maintains the output v at that moment after IGCT is turned on by Δt1. o Then, the AD sampling module is started, and N samples are continuously taken within Δt2. Figure 3 (The measurement is performed 3 times). The purpose of this setting is to accurately measure gate voltage signals of only a few tenths of a volt in environments with strong electromagnetic interference. The above implementation mainly considers two measures: First, blocking the -20V on the gate when the IGCT is turned off, and amplifying the ~0.6V when the IGCT is turned on to 80% of the full scale of the AD chip, so as to make full use of the effective number of bits of the ADC chip; Second, with the cooperation of the sample-and-hold module, the gate voltage at a specific moment is sampled multiple times, and the measurement accuracy can be further improved after data filtering.

[0071] Figure 4 for Figure 1 The circuit for the differential amplifier module. A1 is an Analog Devices AD8130 high-speed differential amplifier (270MHz bandwidth). Resistors R3-R6 and capacitors C1-C4 form two symmetrical RC voltage divider networks, introducing V1 and V2 into pins 1 and 8 of the differential amplifier. Resistors R7 / R8 form the feedback resistor network. R7 is connected between pins 5 and 6 of A1, and one end of R8 is connected to pin 5, with the other end grounded. The resistance values ​​of resistors R3 / R6 / R8 are 1kΩ, R4 / R5 are 10kΩ, and R7 is 4.3kΩ. The capacitance values ​​of capacitors C1 / C4 are 100pF, and C2 / C3 are 10pF.

[0072] Figure 5 This is a circuit diagram of the sample-and-hold and AD sampling modules. In the diagram, A2 is the Analog Devices (ADI) high-speed sample-and-hold circuit AD783 (acquisition time 250ns), and A3 is the Analog Devices (ADI) 16-bit high-precision analog-to-digital converter AD7616 (using one channel, sampling frequency 1MHz).

[0073] Figure 6 This is the circuit diagram for the delay control module, with input from v. tri The output is v dl A4 is a TI monostable multivibrator 74HC123. R9 / C5 controls the delay time Δt = 0.45 × R9 × C5. With R9 set to 10kΩ and C5 to 1nF, the delay time is approximately 5 microseconds. If the AD sampling time is 1 microsecond, it can continuously sample 5 times within this time period.

[0074] Figure 7 This is the circuit diagram for the implementation of the synchronization control module. The gate voltage is through... Figure 1 R1 / R2 is connected to this circuit, and through resistor R 10 / R 11 The voltage divider formed by these components sends the signal to the input of comparator A5 via two anti-parallel diodes D1 / D2. The output of A5 is then passed through pull-up / pull-down resistors R. 13 / R 14 Send to buffer driver A6, send out v q1 and v tri These are used to control analog switch Q1 and sample-and-hold circuit respectively; simultaneously, they output v through inverter A7. q2 , controls analog switch Q2.

[0075] In the diagram, A5 is a TI TL331 comparator, A6 is an SN74LVC1G07 buffer driver, A7 is an SN74LVC1G04 NOT gate, and D1 / D2 are 1N914 resistors. 10 / R 12 / R 13 The resistance is 5kΩ, R 11 For 1kΩ, R 14 It is 7.2kΩ.

[0076] Using the method of this invention, gate voltage measurement can reach the level of hundreds of microvolts.

[0077] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A device for measuring the gate voltage of an integrated gate-commutated thyristor device, characterized in that, include: It integrates gate commutated thyristors, synchronous control module, differential amplifier module, delay control module, sample-and-hold and AD sampling modules; The gate G of the integrated gate commutated thyristor is connected to the first input terminal of the synchronization control module through resistor R1; the cathode K of the integrated gate commutated thyristor is connected to the second input terminal of the synchronization control module through resistor R2. The first input terminal of the synchronization control module is connected to the first connection terminal of analog switch Q1, and the second input terminal of the synchronization control module is connected to the third connection terminal of analog switch Q2; the output terminal of the synchronization control module is v. q1 Connect the second connection terminal of analog switch Q1; output terminal v of the synchronous control module q2 Connect the second connection terminal of analog switch Q2; output terminal v of the synchronous control module tri Connect the input terminal of the delay control module; connect the third connection terminal of analog switch Q1 to the first connection terminal of analog switch Q2. The first connection terminal of analog switch Q2 is connected to the first input terminal of the differential amplifier module; the third connection terminal of analog switch Q2 is connected to the second input terminal of the differential amplifier module. The output of the differential amplifier module is connected to the first input of the sample-and-hold and AD sampling modules, and the output of the delay control module is connected to the second input of the sample-and-hold and AD sampling modules.

2. The gate voltage measuring device for an integrated gate-commutated thyristor device according to claim 1, characterized in that, The first input terminal of the differential amplifier module is connected to pin 1 of the differential amplifier after passing through a capacitor C1 and a resistor R3 in parallel; the second input terminal of the differential amplifier module is connected to pin 8 of the differential amplifier after passing through a capacitor C4 and a resistor R6 in parallel. Differential amplifier pin 1 is grounded after passing through a parallel capacitor C2 and a resistor R4, and differential amplifier pin 8 is grounded after passing through a parallel capacitor C3 and a resistor R5. Differential amplifier pin 5 is grounded via resistor R8; resistor R7 is connected between differential amplifier pin 5 and pin 6; differential amplifier pin 6 serves as the output terminal of the differential amplifier module.

3. The gate voltage measuring device for an integrated gate-commutated thyristor device according to claim 1, characterized in that, The first input terminal of the sample-and-hold module is connected to pin 2 of the sample-and-hold circuit; the ground pin of the sample-and-hold circuit is grounded. The second input terminal of the sample-and-hold and AD sampling modules is connected to pin 7 of the sample-and-hold circuit. Pin 8 of the sample-and-hold circuit is connected to the first input terminal of the analog-to-digital converter, and pin 7 of the sample-and-hold circuit is connected to the second input terminal of the analog-to-digital converter.

4. The gate voltage measuring device for an integrated gate-commutated thyristor device according to claim 1, characterized in that, The input terminal of the delay control module is connected to pin 10 of the monostable multivibrator; pin 5 of the monostable multivibrator serves as the output terminal of the delay control module. Capacitor C5 is connected between pins 6 and 7 of the monostable multivibrator; pin 7 of the monostable multivibrator is connected to the power supply VCC after being connected in series with resistor R9.

5. The gate voltage measuring device for an integrated gate-commutated thyristor device according to claim 1, characterized in that, The first input terminal of the synchronous control module passes through resistor R. 10 Then it is connected to comparator pin 3; the second input terminal of the synchronization control module is connected to comparator pin 1; A resistor R is connected in parallel between comparator pin 1 and pin 3. 11 And diodes D1 and D2 connected in reverse parallel; a resistor R is connected between comparator pins 4 and 3. 12 ; Comparator pin 4 is connected to resistor R 13 It is then connected to the power supply VCC, and comparator pin 4 is connected to resistor R. 14 Rear grounding; Comparator pin 4 is connected to the input of the buffer driver; The outputs of the buffer driver are respectively used as the outputs of the synchronization control module. q1 and the output terminal v of the synchronization control module tri ; The output of the buffer driver, after passing through an NOT gate, becomes the output of the synchronization control module. q2 .

6. A method for measuring the gate voltage of an integrated gate-commutated thyristor device, characterized in that, The device for measuring the gate voltage of an integrated gate-commutated thyristor device as described in any one of claims 1-5; The delay control module is controlled by the synchronous control module, and the sample-and-hold and AD sampling modules are controlled by the delay control module. When analog switch Q1 is closed and analog switch Q2 is opened, the sample-and-hold and AD sampling modules are started.

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