A method for measuring a PIR dimmer

Abstract

The application discloses a PIR dimmer production and measurement method, comprising the following steps: ST1, product positioning; ST2, product wiring; ST3, product test starting; ST4, silicon controlled circuit test; ST5, first dimming circuit test; ST6, second dimming circuit test; ST7, first photosensitive resistor and PIR circuit test; ST8, second photosensitive resistor and PIR circuit test; and ST9, test ending. The PIR dimmer production and measurement method is realized based on a dimmer circuit and a double-station detector of a PIR dimmer. Compared with the prior art, the application realizes automatic test of the PIR dimmer by using a detection device, and improves product test efficiency and test result accuracy.

Description

Technical Field

[0001] This invention relates to the field of dimmer technology, and more particularly to a method for testing PIR dimmers. Background Technology

[0002] A dimmer is an electrical device that changes the luminous flux of a light source in a lighting fixture and adjusts the illuminance level. Dimmers can be classified according to their control method and application. Based on the control method, they can be divided into resistive dimmers, voltage-regulating dimmers, magnetic amplification reactance dimmers, and electronic dimmers.

[0003] LED lighting fixtures typically utilize dimmers for dimming. For example, Chinese patent CN101646288A discloses a dimming method applicable to traditional dimmers and a corresponding LED dimmer. This method uses a phase detection circuit to filter the PWM signal, determined by the conduction angle phase, through an RC circuit, converting it into a DC signal. This signal is then amplified and used to control the change in the resistance value of a constant current sampling resistor, thereby adjusting the LED current.

[0004] After the dimmer is manufactured, it needs to be tested to ensure that the internal circuitry and buttons function properly. Current dimmer testing processes typically rely on manual testing, which is inefficient and prone to inaccuracies due to human error, such as improper operation or careless observation by testers. Summary of the Invention

[0005] The purpose of this invention is to provide a method for testing PIR dimmers, which utilizes testing equipment to achieve automatic testing of PIR dimmers, thereby improving product testing efficiency and the accuracy of test results.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: a PIR dimmer production and testing method, comprising the following steps:

[0007] ST1. Product Positioning: Fix the PIR dimmer on the first detection stage of the dual-station detector. The first detection stage is equipped with a first live wire, a first neutral wire, and a first external lamp. The first external lamp supports SCR dimming. The first detection stage is also equipped with a first positioning component for positioning the PIR dimmer.

[0008] ST2, Product Wiring: Connect the first live wire input terminal of the PIR dimmer to the first live wire, connect the first neutral wire input terminal of the PIR dimmer to the first neutral wire, connect the lamp output terminal of the PIR dimmer to the second live wire input terminal of the first external lamp, and connect the second neutral wire input terminal of the first external lamp to the first neutral wire.

[0009] ST3, Product Test Start: The first testing station moves the PIR dimmer under the pressing component. The pressing component simultaneously presses the power button and negative dimming button of the PIR dimmer for a long time. The power button and negative dimming button are pressed simultaneously for 3 seconds. The power button triggers the power switch S1, and the negative dimming button triggers the negative dimming switch S3. The power switch S1 and negative dimming switch S3 are triggered simultaneously for 3 seconds, generating the first button control signal. The MCU processor of the PIR dimmer controls the PIR dimmer to enter the production test mode, and the MCU processor controls all the dimming indicator lights on the PIR dimmer to flash slowly at 1.5-second intervals. If the PIR dimmer exhibits the above phenomenon, the product test is stopped, and the first testing station moves out of the pressing component 22.

[0010] ST4, Thyristor Circuit Test: Press the power button once to generate a second button control signal. The MCU processor controls all the dimming indicator lights on the PIR dimmer to stay on and the first external lamp to light up. If the PIR dimmer does not exhibit the above phenomenon, the product test will stop.

[0011] ST5, First dimming circuit test: Press and hold the negative dimming button on the component for a period of seconds to generate a third button control signal. The PIR dimmer will change from all dimming indicator lights being constantly on to only one dimming indicator light remaining constantly on. If the PIR dimming does not exhibit the above phenomenon, stop the product test.

[0012] ST6. Second dimming circuit test: Press and hold the positive dimming button for 3 seconds. The positive dimming button is used to trigger the positive dimming switch S2 and generate the fourth button control signal. The PIR dimmer will change from having only one dimming indicator light that is constantly on to having all dimming indicator lights that are constantly on. If the PIR dimmer does not exhibit the above phenomenon, stop the product test.

[0013] ST7, First test of photoresistor and PIR circuit: Press the negative dimming button once to generate the seventh button control signal. The MCU processor turns off the photoresistor. When the heat source object moves above the PIR sensor, the PIR sensor recognizes the heat source object and generates the first recognition signal. After receiving the first recognition signal, the MCU processor controls the first external lamp to flash slowly twice and then stay on. If the first external lamp does not exhibit the above phenomenon, the product test is stopped.

[0014] ST8, Second test of photoresistor and PIR circuit: Press the negative dimming button again to generate the eighth button control signal. The MCU processor turns on the photoresistor. The heat source object moves above the PIR sensor. The PIR sensor recognizes the heat source object and generates a second recognition signal. After receiving the second recognition signal, the MCU processor controls the first external lamp to change from always on to off. If the first external lamp 214 does not exhibit the above phenomenon, the product test will stop.

[0015] ST9, Test End: Press the power button and the negative dimming button simultaneously for a long time. When the power button and the negative dimming button are pressed at the same time for 3 seconds, a fifth button control signal is generated, and the MCU processor controls the PIR dimmer to end the production test mode.

[0016] The above-mentioned PIR dimmer production and testing method is based on the dimmer circuit of the PIR dimmer and a dual-station detector. The dimmer circuit of the PIR dimmer includes an MCU processor, a power switch S1, a positive dimming switch S2, a negative dimming switch S3, a current inflow terminal ACL, a bidirectional thyristor module 15, a photoresistor, a PIR sensor, and a dimming indicator. The power switch S1 is connected to the MCU processor. The lamp output terminal is connected to the current inflow terminal ACL through a power supply output circuit. A bidirectional thyristor module is set on the power supply output circuit. The bidirectional thyristor module is connected to the MCU processor through a thyristor control circuit. The photoresistor is connected to the MCU processor through a photoresistor control circuit. The PIR sensor is connected to the MCU processor through a PIR control circuit. The MCU processor is connected to the dimming indicator through a dimming circuit.

[0017] The dual-station detector includes a first detection stage, a pressing component, a first vision camera, a second vision camera, a heat source object, and an image processor. The first detection stage is slidably connected to a slide rail and is equipped with a first live wire, a first neutral wire, and a first external lamp. The pressing component includes a first driving cylinder, a second driving cylinder, and a third driving cylinder. The first driving cylinder is positioned above the power button and is used to press the power button by moving downwards via a first piston rod. The second driving cylinder is positioned above the negative dimming button, and the third driving cylinder is positioned above the positive dimming button. The first vision camera is used to acquire images of the dimming indicator light during product testing and transmit them to the image processor. The second vision camera is used to acquire images of the first external lamp during product testing and transmit them to the image processor. The heat source object is positioned above the PIR sensor and is connected to a horizontal driving device.

[0018] As a further description of the above technical solution:

[0019] Two primary inspection stations are installed on the slide rail.

[0020] As a further description of the above technical solution:

[0021] The first positioning component includes a contour positioning block, on which the mounting plate of the PIR dimmer is fixedly mounted.

[0022] As a further description of the above technical solution:

[0023] The contour positioning block is equipped with two parallel support rods, which are hinged to the contour positioning block. The ends of the support rods are equipped with support plates, and the mounting plate is fixedly installed on the support plates.

[0024] As a further description of the above technical solution:

[0025] The contour positioning block is provided with a first storage slot corresponding to the position of the support rod.

[0026] As a further description of the above technical solution:

[0027] The contour positioning block is equipped with a second storage slot that corresponds to the position of the support plate.

[0028] As a further description of the above technical solution:

[0029] The support plate is rotatably mounted on the end of the support rod.

[0030] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are:

[0031] 1. In this invention, based on the control program pre-set in the MCU processor, the buttons on the PIR dimmer can be used to control the PIR dimmer to enter product test mode. In product test mode, the PIR dimmer can trigger the corresponding switch and generate button signals by pressing each button on it, thereby enabling the MCU processor to control various indicator lights to work and form feedback, thereby realizing product testing.

[0032] 2. In this invention, during product testing, a dual-station detector is used to replace manual inspection, eliminating inaccurate test results caused by human factors. When using a dual-station detector to test PIR dimmers, automated testing is achieved. The machine can accurately control the button position and pressing time to meet set requirements, and a vision camera monitors the feedback from the indicator lights on the PIR dimmer, avoiding inaccurate test results caused by improper manual operation.

[0033] 3. In this invention, the mounting plate of the PIR dimmer is fixedly mounted on the support plate, and the support plate is rotatably mounted on the end of the support rod. This facilitates the storage of the support rod and support plate in the first and second storage slots, and also facilitates the rotation and adjustment of the PIR dimmer. During product testing, the mounting plate of the PIR dimmer is first fixedly mounted on the support plate for initial positioning of the PIR dimmer, facilitating wiring and ensuring wiring quality. Simultaneously, the rotatable support plate makes wiring easier when the PIR dimmer is facing upwards, making it easier to connect to the first live wire and the first neutral wire. After wiring, the PIR dimmer is rotated so that the front faces upwards, and the support rod is rotated to store it on the contour positioning block, ensuring that the installation position of the PIR dimmer is fixed each time, and ensuring that the pressing component can accurately press the button. Attached Figure Description

[0034] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a block diagram of the dimmer circuit of a PIR dimmer in a PIR dimmer production and testing method.

[0036] Figure 2 This is a schematic diagram of the structure of a PIR dimmer in a PIR dimmer production and testing method. Figure 1 .

[0037] Figure 3 This is a schematic diagram of the structure of a PIR dimmer in a PIR dimmer production and testing method. Figure 2 .

[0038] Figure 4 This is a schematic diagram of the structure of a dual-station detector in a PIR dimmer production testing method.

[0039] Figure 5 This is a wiring diagram of a PIR dimmer in a PIR dimmer production and testing method.

[0040] Figure 6 This is a schematic diagram of the structure of the first positioning component in a PIR dimmer production and testing method.

[0041] Figure 7 This diagram illustrates the state changes of a support rod in a PIR dimmer production testing method. Figure 1 .

[0042] Figure 8 This diagram illustrates the state changes of a support rod in a PIR dimmer production testing method. Figure 2.

[0043] Figure 9 This diagram illustrates the state changes of a support rod in a PIR dimmer production testing method. Figure 3 .

[0044] Legend:

[0045] 1. PIR dimmer; 11. Lamp output terminal; 12. Power button; 13. Negative dimming button; 14. Dimming indicator light; 15. Bidirectional SCR module; 16. Positive dimming button; 17. PIR sensor; 18. Mounting plate; 2. Dual-station detector; 21. First detection stage; 211. First live wire; 212. First neutral wire; 214. First external lamp; 22. Pressing assembly; 221. First drive cylinder; 222. Second drive cylinder; 23. First vision camera; 24. Second vision camera; 25. Slide rail; 26. Heat source object; 3. First positioning component; 31. Contouring positioning block; 311. First storage slot; 312. Second storage slot; 32. Support rod; 321. Support plate. Detailed Implementation

[0046] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0047] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0048] Please see Figure 1-9 This invention provides a technical solution: a method for testing PIR dimmers, comprising the following steps:

[0049] ST1, Product Positioning: Fix the PIR dimmer 1 on the first detection stage 21 of the dual-station detector 2. The first detection stage 21 is provided with a first live wire 211, a first neutral wire 212 and a first external lamp 214. The first external lamp 214 supports SCR dimming. The first detection stage 21 is also provided with a first positioning component 3 for positioning the PIR dimmer 1.

[0050] ST2, Product Wiring: The first live wire input terminal of PIR dimmer 1 is connected to the first live wire 211, the first neutral wire input terminal of PIR dimmer 1 is connected to the first neutral wire 212, the lamp output terminal 11 of PIR dimmer 1 is connected to the second live wire input terminal of the first external lamp 214, and the second neutral wire input terminal of the first external lamp 214 is connected to the first neutral wire 212.

[0051] ST3, Product Test Start: The first test station 21 moves the PIR dimmer 1 under the pressing component 22. The pressing component 22 simultaneously presses the power button 12 and the negative dimming button 13 of the PIR dimmer 1 for a long time. The power button 12 and the negative dimming button 13 are pressed simultaneously for 3 seconds. The power button 12 is used to trigger the power switch S1, and the negative dimming button 13 is used to trigger the negative dimming switch S3. The power switch S1 and the negative dimming switch S3 are triggered simultaneously for 3 seconds, generating the first button control signal. The MCU processor of the PIR dimmer 1 controls the PIR dimmer 1 to enter the production test mode, and the MCU processor controls all the dimming indicator lights 14 on the PIR dimmer 1 to flash slowly at an interval of 1.5 seconds. If the PIR dimmer 1 does not exhibit the above phenomenon, the product test stops, and the first test station 21 moves out from under the pressing component 22.

[0052] ST4, Thyristor Circuit Test: Press the power button 12 once to generate a second button control signal. The MCU processor controls all the dimming indicator lights 14 on the PIR dimmer 1 to stay on and the first external lamp 214 to light up. If the PIR dimmer 1 does not exhibit the above phenomenon, the product test will stop.

[0053] ST5, First dimming circuit test: Press component 22 and press and hold the negative dimming button 13 for 3 seconds to generate the third button control signal. On PIR dimmer 1, all dimming indicator lights 14 will change from being constantly lit to only one dimming indicator light 14 remaining constantly lit. If PIR dimmer 1 does not exhibit the above phenomenon, the product test will be stopped.

[0054] ST6. Second dimming circuit test: Press component 22 and press and hold the positive dimming button 16 for 3 seconds. The positive dimming button 16 is used to trigger the positive dimming switch S2 and generate the fourth button control signal. The PIR dimmer 1 changes from only one dimming indicator light 14 remaining constantly lit to all dimming indicator lights 14 remaining constantly lit. If the PIR dimmer 1 does not exhibit the above phenomenon, the product test is stopped.

[0055] ST7, First test of photoresistor and PIR circuit: Press component 22 once to press the negative dimming button 13 to generate the seventh button control signal. The MCU processor turns off the photoresistor. The heat source object 26 moves above the PIR sensor 17. The PIR sensor 17 identifies the heat source object 26 and generates the first identification signal. After receiving the first identification signal, the MCU processor controls the first external lamp 214 to flash slowly twice and then stay on. If the first external lamp 214 does not exhibit the above phenomenon, the product test is stopped.

[0056] ST8, Second test of photoresistor and PIR circuit: Press component 22 again to press the negative dimming button 13 to generate the eighth button control signal. The MCU processor turns on the photoresistor. The heat source object 26 moves above the PIR sensor 17. The PIR sensor 17 identifies the heat source object 26 and generates a second identification signal. After receiving the second identification signal, the MCU processor controls the first external lamp 214 to change from always on to off. If the first external lamp 214 does not exhibit the above phenomenon, the product test is stopped.

[0057] ST8, Test End: Press component 22 simultaneously presses the power button 12 and the negative dimming button 13 for a long time. The power button 12 and the negative dimming button 13 are pressed simultaneously for 3 seconds, generating the fifth button control signal. The MCU processor controls the PIR dimmer 1 to end the production test mode.

[0058] The above-mentioned PIR dimmer production and testing method is based on the dimmer circuit of PIR dimmer 1 and the dual-station detector 2. The dimmer circuit of PIR dimmer 1 includes an MCU processor, a power switch S1, a positive dimming switch S2, a negative dimming switch S3, a current inflow terminal ACL, a bidirectional thyristor module 15, a photoresistor, a PIR sensor 17, and a dimming indicator light 14. The power switch S1 is connected to the MCU processor. The lamp output terminal 11 is connected to the current inflow terminal ACL through the power supply output circuit. The bidirectional thyristor module 15 is set on the power supply output circuit. The bidirectional thyristor module 15 is connected to the MCU processor through the thyristor control circuit. The photoresistor is connected to the MCU processor through the photoresistor control circuit. The PIR sensor 17 is connected to the MCU processor through the PIR control circuit. The MCU processor is connected to the dimming indicator light 14 through the dimming circuit.

[0059] The dual-station detector 2 includes a first detection stage 21, a pressing component 22, a first vision camera 23, a second vision camera 24, a heat source object 26, and an image processor. The heat source object 26 is positioned above the PIR sensor 17 and is connected to a horizontal drive device. The first detection stage 21 is slidably connected to a slide rail 25 and is equipped with a first live wire 211, a first neutral wire 212, and a first external lamp 214. The pressing component 22 includes a first drive cylinder 221, a second drive cylinder 222, and a third drive cylinder. The first drive cylinder 221 is positioned above the power button 12 and presses the power button 12 by moving its first piston rod downwards. The second drive cylinder 222 is positioned above the negative dimming button 13, and the third drive cylinder is positioned above the positive dimming button 16. The working principle of the three-drive cylinder is the same as that of the first drive cylinder 221. The first vision camera 23 is used to acquire images of the dimming indicator light 14 during product testing and transmit them to the image processor. The first vision camera 23 acquires images of the dimming indicator light 14 in each product testing step. Specifically, for example, during step ST3, the first vision camera 23 acquires an image of the dimming indicator light 14 every 0.5 seconds and transmits it to the image processor. The image processor compares the multiple images continuously acquired by the first vision camera 23 during step ST3 with the model images stored in the database to determine whether they meet the requirements. The judgment result (compliant or non-compliant) is transmitted to the controller of the dual-station detector 2. The controller of the dual-station detector 2 controls whether the product test continues to be executed based on the judgment result. The second vision camera 24 is used to acquire images of the first external light fixture 214 during product testing and transmit them to the image processor. The working principle of the second vision camera 24 is the same as that of the first vision camera 23. For example, in step ST4, the second vision camera 24 acquires an image of the first external light fixture 214 every 0.5 seconds and transmits it to the image processor for comparison.

[0060] The horizontal drive device is used to move the heat source object 26 horizontally, so that the heat source object 26 moves above the PIR sensor 17 when the production test process reaches step ST7 and step ST8, and moves away from the PIR sensor 17 in other steps.

[0061] Based on the control program pre-set in the MCU processor, the buttons on the PIR dimmer 1 can be used to control the PIR dimmer 1 to enter product test mode. In product test mode, the PIR dimmer 1 can trigger the corresponding switch and generate button signals by pressing the buttons on it, thereby enabling the MCU processor to control the operation of various indicator lights and generate feedback, thus realizing product testing.

[0062] During product testing, a dual-station detector 2 is used to replace manual inspection, eliminating inaccurate test results caused by human factors and effectively improving testing efficiency. Using the dual-station detector 2 to test the PIR dimmer 1 automates the testing process. The machine accurately controls the button press position and duration to meet set requirements, and a vision camera monitors the feedback from the indicator lights on the PIR dimmer, avoiding inaccurate test results caused by improper manual operation (such as when the tester cannot accurately press the button or ensure the correct press duration after prolonged testing, or cannot accurately observe the indicator light feedback).

[0063] Two first inspection stages 21 are provided on the slide rail 25. The first inspection stage 21 can move in or out of the pressing component 22 along the slide rail, thereby realizing the start or end of the product test of the PIR dimmer 1, forming a dual-station design and improving the inspection efficiency.

[0064] The first positioning component 3 includes a contour positioning block 31, on which the mounting plate 18 of the PIR dimmer 1 is placed. Two parallel support rods 32 are provided on the contour positioning block 31, hinged to it. Support plates 321 are provided at the ends of the support rods 32, and the mounting plate 18 is fixedly mounted on the support plate 321. When the mounting plate 18 is positioned, the screw rod passes through a through hole in the mounting plate 18 and is fixed to the support plate 321, thus accurately positioning the PIR dimmer 1 on the contour positioning block 31 and ensuring the accurate pressing positions of the first drive cylinder 221, the second drive cylinder 222, and the third drive cylinder, thereby guaranteeing test quality.

[0065] The contour positioning block 31 has a first storage slot 311 corresponding to the position of the support rod 32. The contour positioning block 31 also has a second storage slot 312 corresponding to the position of the support plate 321. When the PIR dimmer 1 is placed on the contour positioning block 31 for testing, the support rod 32 is stored in the first storage slot 311 and the support plate 321 is stored in the second storage slot 312, so that the PIR dimmer 1 can be placed stably and the test quality can be guaranteed.

[0066] The support plate 321 is rotatably mounted on the end of the support rod 32. This facilitates the storage of the support rod 32 and support plate 321 within the first storage slot 311 and the second storage slot 312, and also facilitates the rotation and adjustment of the PIR dimmer 1. During product testing, the mounting plate 18 of the PIR dimmer 1 is first fixedly mounted on the support plate 321 for initial positioning of the PIR dimmer 1, facilitating wiring and ensuring wiring quality. The rotatable support plate 321 also makes wiring easier when the PIR dimmer 1 is facing upwards, connecting it to the first live wire 211 and the first neutral wire 212. After wiring, the PIR dimmer 1 is rotated so that the front faces upwards, and the support rod 32 is rotated to be stored on the contour positioning block 31, ensuring that the installation position of the PIR dimmer 1 is fixed each time, and ensuring that the pressing component 22 can accurately press the button.

[0067] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A method for testing PIR dimmers, characterized in that, Includes the following steps: ST1, Product Positioning: Fix the PIR dimmer (1) on the first detection stage (21) of the dual-station detector (2). The first detection stage (21) is provided with a first live wire (211), a first neutral wire (212) and a first external lamp (214). The first external lamp (214) supports SCR dimming. The first detection stage (21) is also provided with a first positioning component (3) for positioning the PIR dimmer (1). ST2, Product Wiring: The first live wire input terminal of the PIR dimmer (1) is connected to the first live wire (211), the first neutral wire input terminal of the PIR dimmer (1) is connected to the first neutral wire (212), the lamp output terminal (11) of the PIR dimmer (1) is connected to the second live wire input terminal of the first external lamp (214), and the second neutral wire input terminal of the first external lamp (214) is connected to the first neutral wire (212); ST3, Product Test Start: The first test station (21) moves the PIR dimmer (1) under the pressing component (22). The pressing component (22) simultaneously presses the power button (12) and the negative dimming button (13) of the PIR dimmer (1) for a long time. The power button (12) and the negative dimming button (13) are pressed simultaneously for 3 seconds. The power button (12) is used to trigger the power switch S1, and the negative dimming button (13) is used to trigger the negative dimming switch S3. The power switch S1 and the negative dimming switch S3 are triggered simultaneously for 3 seconds, generating the first button control signal. The MCU processor of the PIR dimmer (1) controls the PIR dimmer (1) to enter the production test mode, and the MCU processor controls all the dimming indicator lights (14) on the PIR dimmer (1) to flash slowly at an interval of 1.5 seconds. If the PIR dimmer (1) does not exhibit the above phenomenon, the product test is stopped, and the first test station (21) moves out of the pressing component (22). ST4, Test of the thyristor circuit: Press the power button (12) once by the pressing component (22) to generate a second button control signal. The MCU processor controls all the dimming indicator lights (14) on the PIR dimmer (1) to be constantly lit and the first external lamp (214) to be lit. If the PIR dimmer (1) does not exhibit the above phenomenon, the product test will be stopped. ST5, First dimming circuit test: Press the negative dimming button (13) for 3 seconds using the pressing component (22) to generate a third button control signal. All dimming indicator lights (14) on the PIR dimmer (1) will switch to only one dimming indicator light (14) remaining on. If the above phenomenon does not occur on the PIR dimmer (1), the product test will be stopped. ST6, Second dimming circuit test: Press component (22) for 3 seconds to press and hold the positive dimming button (16). The positive dimming button (16) is used to trigger the positive dimming switch S2 to generate the fourth button control signal. The PIR dimmer (1) changes from only one dimming indicator (14) remaining constantly lit to all dimming indicator (14) remaining constantly lit. If the PIR dimmer (1) does not exhibit the above phenomenon, the product test is stopped. ST7, First test of photoresistor and PIR circuit: Press the negative dimming button (13) once by pressing the component (22) to generate the seventh button control signal. The MCU processor turns off the photoresistor. The heat source object (26) moves above the PIR sensor (17). The PIR sensor (17) identifies the heat source object (26) and generates the first identification signal. After receiving the first identification signal, the MCU processor controls the first external lamp (214) to flash slowly twice and then stay on. If the first external lamp (214) does not exhibit the above phenomenon, the product test is stopped. ST8, Second test of photoresistor and PIR circuit: Press component (22) again to press the negative dimming button (13) to generate the eighth button control signal. The MCU processor turns on the photoresistor. The heat source object (26) moves above the PIR sensor (17). The PIR sensor (17) identifies the heat source object (26) and generates a second identification signal. After receiving the second identification signal, the MCU processor controls the first external lamp (214) to change from always on to off. If the first external lamp (214) does not exhibit the above phenomenon, the product test is stopped. ST9, Test End: The pressing component (22) simultaneously presses the power button (12) and the negative dimming button (13) for a long time. The power button (12) and the negative dimming button (13) are pressed simultaneously for 3 seconds, generating a fifth button control signal. The MCU processor controls the PIR dimmer (1) to end the production test mode. The above-mentioned PIR dimmer production test method is based on the dimmer circuit of the PIR dimmer (1) and the dual-station detector (2). The dimmer circuit of the PIR dimmer (1) includes an MCU processor, a power switch S1, a positive dimming switch S2, a negative dimming switch S3, a current inflow terminal ACL, a bidirectional thyristor module (15), a photoresistor, a PIR sensor (17), and a dimming indicator (14). The power switch S1 is connected to the MCU processor. The lamp output terminal (11) is connected to the current inflow terminal ACL through a power supply output circuit. A bidirectional thyristor module (15) is provided on the power supply output circuit. The bidirectional thyristor module (15) is connected to the MCU processor through a thyristor control circuit. The photoresistor is connected to the MCU processor through a photoresistor control circuit. The PIR sensor (17) is connected to the MCU processor through a PIR control circuit. The MCU processor is connected to the dimming indicator (14) through a dimming circuit. The dual-station detector (2) includes a first detection platform (21), a pressing assembly (22), a first visual camera (23), a second visual camera (24), a heat source object (26), and an image processor. The first detection platform (21) is slidably connected to a slide rail (25). The first detection platform (21) is provided with a first live wire (211), a first neutral wire (212), and a first external lamp (214). The pressing assembly (22) includes a first driving cylinder (221), a second driving cylinder (222), and a third driving cylinder. The first driving cylinder (221) is positioned above the power button (12). The first driving cylinder (221) is used to... The first piston rod moves downward and presses the power button (12). The second drive cylinder (222) is positioned correspondingly to the negative dimming button (13). The third drive cylinder is positioned correspondingly above the positive dimming button (16). The first vision camera (23) is used to acquire the image at the dimming indicator (14) during product testing and transmit it to the image processor. The second vision camera (24) is used to acquire the image at the first external lamp (214) during product testing and transmit it to the image processor. The heat source object (26) is positioned correspondingly above the PIR sensor (17). The heat source object (26) is connected to the horizontal drive device.

2. The method for testing a PIR dimmer according to claim 1, characterized in that, Two first detection stations (21) are provided on the slide rail (25).

3. The method for testing a PIR dimmer according to claim 1, characterized in that, The first positioning element (3) includes a contour positioning block (31), and the mounting plate (18) of the PIR dimmer (1) is fixedly mounted on the contour positioning block (31).

4. The method for testing a PIR dimmer according to claim 3, characterized in that, The contour positioning block (31) is provided with two parallel support rods (32), the support rods (32) are hinged to the contour positioning block (31), the end of the support rods (32) is provided with a support plate (321), and the mounting plate (18) is fixedly installed on the support plate (321).

5. The method for testing a PIR dimmer according to claim 4, characterized in that, The contour positioning block (31) is provided with a first storage groove (311) whose position corresponds to the support rod (32).

6. The method for testing a PIR dimmer according to claim 5, characterized in that, The contour positioning block (31) is provided with a second storage groove (312) whose position corresponds to that of the support plate (321).

7. A method for testing a PIR dimmer according to claim 6, characterized in that, The support plate (321) is rotatably mounted on the end of the support rod (32).

Images