Sandwiched nested spectral imaging acquisition apparatus and method

Abstract

The application discloses a kind of sandwich nested spectral imaging acquisition device and method;Including control system, displacement system, and spectral acquisition system carried on displacement system, the movement operation of control system control displacement system and the acquisition operation of spectral acquisition system;Displacement system carries spectral acquisition system and realizes XY axis degree of freedom movement on the same plane;Spectral acquisition system sequentially scans S1-S9 total nine regions, and when scanning, first the spectral signal of a region is collected, then the positioning light-emitting array of corresponding region is started again to take photograph, after control system receives the spectral signal and positioning signal from spectral acquisition system, according to positioning signal, the spectral signal of S1-S9 total nine regions is reconnected to become a complete sample spectrum, according to this spectrum, subsequent near-infrared spectrum analysis is carried out to the sample to be measured.

Description

Technical Field

[0001] This invention relates to the field of near-infrared spectroscopy, and more particularly to a sandwich-nested spectral imaging acquisition device and method. Background Technology

[0002] In the current social environment, consumers' focus on food quality has gradually become a key focus for the development and transformation of the food industry.

[0003] To further ensure food quality and safety, it is necessary to develop and promote more efficient and convenient food testing technologies and methods.

[0004] Non-destructive testing (NDT) technology not only ensures food quality but also improves testing efficiency. Specifically, NDT technology can effectively reduce the production and sales costs of food manufacturers, improve product quality, reduce the probability of food safety problems, and enable food manufacturers to achieve healthy and sustainable development.

[0005] Near-infrared spectroscopy, as a non-destructive testing technique, does not damage the sample during testing, is very simple to operate, has good stability, is highly efficient during use, does not pollute the environment, and has low cost.

[0006] However, current mainstream near-infrared spectroscopy acquisition devices are often large, expensive, and involve cumbersome acquisition methods, often requiring sample fixation before acquiring the spectrum of the region of interest. For example, in some current applications, such as near-infrared spectral imaging scanning of food in the compartments of a refrigerator, traditional acquisition devices cannot quickly and accurately obtain sample information, especially for heterogeneous food samples. This is a major challenge faced by near-infrared spectroscopy detection equipment in lightweight detection. Summary of the Invention

[0007] The purpose of this invention is to overcome the shortcomings and deficiencies of the prior art and provide a sandwich-nested spectral imaging acquisition device and method. In scenarios where there is a requirement for lightweight spectral imaging detection devices, this invention can significantly reduce the size of the spectral imaging acquisition device and minimize the loss of spectral imaging information, thereby reducing space and economic costs.

[0008] Specifically, this invention reduces the size of the acquisition device by collecting spectral information from samples in segmented areas. This allows for rapid spectral acquisition in confined spaces such as refrigerators, making it more convenient to use and reducing the cost of technology application. This also allows near-infrared spectroscopy technology to be applied to a wider range of scenarios. During the scanning process of the spectral imaging sensor, this invention can collect comprehensive and complete near-infrared spectra of the sample, thereby enabling real-time monitoring of food sample quality.

[0009] This invention is achieved through the following technical solution:

[0010] A sandwich-nested spectral imaging acquisition device includes a control system, a displacement system, and a spectral acquisition system 4 mounted on the displacement system. The control system controls the movement of the displacement system and the acquisition operation of the spectral acquisition system 4. The displacement system and the spectral acquisition system 4 can move freely along the X and Y axes on the same plane.

[0011] The displacement system includes two parallel linear guide rail mechanisms 1 and a lead screw mechanism 2; an electrically controlled slider mechanism 3 is provided on the linear guide rail mechanism 1; both ends of the lead screw mechanism 2 are mounted on the electrically controlled slider mechanism 3; and an electrically controlled moving slide 5 for mounting the spectral acquisition system 4 is provided on the lead screw mechanism 2.

[0012] At the bottom of the displacement system, there is a light-emitting array area composed of multiple light-emitting resistors 6; the light-emitting array area is controlled by the control system.

[0013] The control system controls the movement of the displacement system, so that the spectral acquisition system 4 moves above the light-emitting array area along a set path and acquires the spectral signal of the light-emitting array area.

[0014] Above the displacement system, a transparent detection platform 7 is installed for placing the sample to be tested.

[0015] The spectral acquisition system 4 includes a first near-infrared light source 4-1, a second near-infrared light source 4-2, a third near-infrared light source 4-3, a fourth near-infrared light source 4-4, and a spectral imaging sensor 4-5; the first near-infrared light source 4-1, the second near-infrared light source 4-2, the third near-infrared light source 4-3, and the fourth near-infrared light source 4-4 are arranged in a square layout and distributed around the spectral imaging sensor 4-5.

[0016] The light-emitting array region consists of nine equal regions, namely S1 to S9; twelve light-emitting resistors, namely L1 to L12, are evenly distributed at the midpoints of the straight lines of adjacent boundaries of each region.

[0017] The spectral acquisition system 4 scans nine regions, S1 to S9, sequentially. During scanning, the spectral signal of each region is acquired first, and then the positioning light-emitting array of the corresponding region is activated to take another picture. After receiving the spectral signal and positioning signal from the spectral acquisition system 4, the control system reassembles the spectral signals of the nine regions, S1 to S9, into a complete sample spectrum based on the positioning signal. The sample to be tested is then subjected to subsequent near-infrared spectral analysis based on this spectrum.

[0018] The light-emitting array area consists of nine equal square areas, with a light-emitting resistor 6 placed at the midpoint of the straight line at the boundary of each area.

[0019] A sandwich-nested spectral imaging acquisition method: First, the sample to be tested is placed on a transparent detection platform 7. The control system controls the spectral acquisition system 4 to perform near-infrared spectral scanning to the center position of the S1 region. After the scanning is completed, the light-emitting resistors 6L1 and L3 around the S1 region are activated and reflected on the transparent detection platform 7 to form positioning points. After taking another picture, the light-emitting resistors 6 in the nine regions are turned off and the image data is transmitted back to the control system, thereby completing the scanning of the S1 region.

[0020] The control system controls the spectral acquisition system 4 to perform near-infrared spectral scanning at the center of region S2. After the scanning is completed, the light-emitting resistors 6L1, L2 and L4 around region S2 are activated. After taking another picture, the light-emitting resistors 6 in the nine regions are turned off, and the image data is transmitted back to the control system, thus completing the scanning of region S2.

[0021] Repeat the above scanning steps until all nine regions S1-S9 have been scanned. Then, crop the obtained image according to the position of the light-emitting resistor 6, and then stitch them together according to the correspondence of the light-emitting array regions to obtain a complete total area scan image for subsequent analysis.

[0022] Compared with the prior art, the present invention has the following advantages and effects:

[0023] The sandwich-nested spectral imaging acquisition process of this invention allows it to be assembled and used with equipment such as refrigerators, reducing the size of the near-infrared spectral acquisition device. When acquiring the near-infrared spectrum of a sample, it can obtain a large area of ​​sample spectrum using a small space. The luminescent resistor (LED) positioning makes the acquired near-infrared spectrum more accurate and comprehensive, enabling precise scanning of a large area. Attached Figure Description

[0024] Figure 1 This is a top view of the sandwich-nested spectral imaging acquisition device of the present invention.

[0025] Figure 2 for Figure 1 Side view diagram.

[0026] Figure 3 This is a schematic diagram of the scanning path.

[0027] Figure 4 This is one of the schematic diagrams showing the distribution of the light-emitting resistors L1-L12 and the nine regions S1-S9.

[0028] Figure 5 This is the second schematic diagram showing the distribution of the light-emitting resistors L1-L12 and the nine regions S1-S9. Detailed Implementation

[0029] The present invention will now be described in further detail with reference to specific embodiments.

[0030] Example

[0031] like Figure 1-5 As shown. This invention discloses a sandwich-nested spectral imaging acquisition device, including a control system, a displacement system, and a spectral acquisition system 4 mounted on the displacement system. The control system controls the movement of the displacement system and the acquisition operation of the spectral acquisition system 4. The displacement system and the spectral acquisition system 4 can move freely along the XY axes on the same plane.

[0032] The displacement system includes two parallel linear guide rail mechanisms 1 and a lead screw mechanism 2; an electrically controlled slider mechanism 3 is provided on the linear guide rail mechanism 1; both ends of the lead screw mechanism 2 are mounted on the electrically controlled slider mechanism 3; and an electrically controlled moving slide 5 for mounting the spectral acquisition system 4 is provided on the lead screw mechanism 2.

[0033] At the bottom of the displacement system, there is a light-emitting array area composed of multiple light-emitting resistors 6; the light-emitting array area is controlled by the control system.

[0034] The control system controls the movement of the displacement system, so that the spectral acquisition system 4 moves above the light-emitting array area along a set path and acquires the spectral signal of the light-emitting array area.

[0035] Above the displacement system, a transparent detection platform 7 is installed for placing the sample to be tested.

[0036] The spectral acquisition system 4 includes a first near-infrared light source 4-1, a second near-infrared light source 4-2, a third near-infrared light source 4-3, a fourth near-infrared light source 4-4, and a spectral imaging sensor 4-5; the first near-infrared light source 4-1, the second near-infrared light source 4-2, the third near-infrared light source 4-3, and the fourth near-infrared light source 4-4 are arranged in a square layout and distributed around the spectral imaging sensor 4-5.

[0037] The light-emitting array region consists of nine equal regions, namely S1 to S9; twelve light-emitting resistors 6, namely L1 to L12, are evenly distributed on the midpoints of the adjacent boundary lines of each region. During operation, the spectral imaging sensor 4-5 typically moves to, for example, the first region S1. After performing a near-infrared spectral scan on the sample to be tested above region S1, the light-emitting resistors 6 on the edge of region S1 will light up. The light is reflected on the transparent detection platform 7 to form a positioning point, which is then captured by the spectral imaging sensor.

[0038] In general, the spectral acquisition system 4 scans nine regions from S1 to S9 in sequence. During scanning, it first acquires the spectral signal of one region and then activates the positioning light-emitting array of the corresponding region to take another picture. After receiving the spectral signal and positioning signal from the spectral acquisition system 4, the control system reassembles the spectral signals of the nine regions from S1 to S9 into a complete sample spectrum based on the positioning signal. The sample to be tested is then subjected to subsequent near-infrared spectral analysis based on this spectrum.

[0039] The light-emitting array area consists of nine equal square areas, with a light-emitting resistor 6 placed at the midpoint of the straight line at the boundary of each area.

[0040] The sandwich-nested spectral imaging acquisition method of the present invention can be implemented through the following steps:

[0041] First, place the sample to be tested on the transparent detection platform 7. The control system controls the spectral acquisition system 4 to perform near-infrared spectral scanning at the center of the S1 region. After the scanning is completed, activate the light-emitting resistors 6L1 and L3 around the S1 region and reflect them on the transparent detection platform 7 to form positioning points. After taking another picture, turn off the light-emitting resistors 6 in the nine regions and transmit the image data back to the control system, thereby completing the scanning of the S1 region.

[0042] The control system controls the spectral acquisition system 4 to perform near-infrared spectral scanning at the center of region S2. After the scanning is completed, the light-emitting resistors 6L1, L2 and L4 around region S2 are activated. After taking another picture, the light-emitting resistors 6 in the nine regions are turned off, and the image data is transmitted back to the control system, thus completing the scanning of region S2.

[0043] Repeat the above scanning steps until all nine regions S1-S9 have been scanned. Then, crop the obtained image according to the position of the light-emitting resistor 6, and then stitch them together according to the correspondence of the light-emitting array regions to obtain a complete total area scan image for subsequent analysis.

[0044] In this embodiment, there are nine regions, S1-S9, which are divided into nine square regions of 20×20cm. The specific number of divisions can be determined according to the actual application.

[0045] In this embodiment, the transparent detection platform 7 is made of transparent plexiglass. The specific material and size can be determined according to the actual application.

[0046] As described above, the present invention can be implemented well.

[0047] The implementation of the present invention is not limited to the above embodiments. Any changes, modifications, substitutions, combinations, or simplifications made without departing from the spirit and principle of the present invention shall be considered equivalent substitutions and shall be included within the protection scope of the present invention.

Claims

1. A sandwich-nested spectral imaging acquisition device, comprising a control system, a displacement system, and a spectral acquisition system (4) mounted on the displacement system, wherein the control system controls the movement of the displacement system and the acquisition operation of the spectral acquisition system (4); the displacement system, carrying the spectral acquisition system (4), achieves XY-axis freedom of movement on the same plane; characterized in that: The displacement system includes two parallel linear guide rail mechanisms (1) and a lead screw mechanism (2); an electrically controlled slider mechanism (3) is provided on the linear guide rail mechanism (1); both ends of the lead screw mechanism (2) are mounted on the electrically controlled slider mechanism (3); an electrically controlled moving slide (5) for mounting the spectral acquisition system (4) is provided on the lead screw mechanism (2). At the bottom of the displacement system, there is a light-emitting array area composed of multiple light-emitting resistors (6); the light-emitting array area is controlled by the control system. The control system controls the movement of the displacement system, so that the spectral acquisition system (4) moves above the luminescent array area along a set path and acquires the spectral signal of the luminescent array area; Above the displacement system, a transparent detection platform (7) is installed for placing the sample to be tested. The spectral acquisition system (4) includes a first near-infrared light source (4-1), a second near-infrared light source (4-2), a third near-infrared light source (4-3), a fourth near-infrared light source (4-4), and a spectral imaging sensor (4-5); the first near-infrared light source (4-1), the second near-infrared light source (4-2), the third near-infrared light source (4-3), and the fourth near-infrared light source (4-4) are arranged in a square layout and distributed around the spectral imaging sensor (4-5); The light-emitting array region consists of nine equal regions, namely S1 to S9; twelve light-emitting resistors (6), namely L1 to L12, are evenly distributed at the midpoint of the adjacent boundary lines of each region. The spectral acquisition system (4) scans nine regions from S1 to S9 in sequence. During the scan, the spectral signal of the region is acquired first, and then the positioning light-emitting array of the corresponding region is activated to take pictures again. After the control system receives the spectral signal and positioning signal from the spectral acquisition system (4), it reassembles the spectral signals of the nine regions from S1 to S9 into a complete sample spectrum according to the positioning signal. The sample to be tested is then subjected to subsequent near-infrared spectral analysis based on this spectrum.

2. The sandwich-nested spectral imaging acquisition device according to claim 1, characterized in that: The light-emitting array area consists of nine equal square areas, with a light-emitting resistor (6) placed at the midpoint of the straight line at the intersection of each area.

3. A sandwich-nested spectral imaging acquisition method, characterized in that... The sandwich-nested spectral imaging acquisition method described in claim 2 is used to achieve this, and the implementation steps are as follows: First, place the sample to be tested on the transparent detection platform (7). The control system controls the spectral acquisition system (4) to perform near-infrared spectral scanning at the center of the S1 region. After the scanning is completed, start the light-emitting resistors (6) L1 and L3 around the S1 region and reflect them on the transparent detection platform (7) to form positioning points. After taking pictures again, turn off the light-emitting resistors (6) of the nine regions and transmit the image data back to the control system to complete the scanning of the S1 region. The spectral acquisition system (4) is controlled by the control system to perform near-infrared spectral scanning at the center of the S2 region. After the scanning is completed, the light-emitting resistors (6) L1, L2 and L4 around the S2 region are activated. After taking another picture, the light-emitting resistors (6) of the nine regions are turned off and the image data is transmitted back to the control system, thereby completing the scanning of the S2 region. Repeat the above scanning steps until all nine regions S1-S9 have been scanned. Then, crop the obtained image according to the position of the light-emitting resistor (6) and stitch it together according to the correspondence of the light-emitting array regions to obtain a complete total area scan image for subsequent analysis.

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