A low-overhead four-point flip flop self-restoring latch based on cross-interlocking
CN117200753BActive Publication Date: 2026-08-28HEFEI UNIV OF TECH
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Patent Information
- Application Number
- CN202311119821.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-09-01
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2043-09-01
AI Technical Summary
Technical Problem
而现有的加固锁存器大多只能容忍单点翻转和双点翻转，但是随着集成电路的快速发展，由电荷共享所引起的三点翻转和四点翻转已然成为一个严重的问题，因此设计先进的容忍四点翻转的锁存器尤为重要
Benefits of technology
[0030]与已有技术相比，本发明有益效果体现在：
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Smart Images
Figure CN117200753B_ABST
Abstract
The application discloses a low-overhead four-point flip self-recovery latch based on cross interlocking, which comprises a latch circuit with 16 internal nodes formed by 4 cross interlocking units, an input circuit formed by 4 transmission gates and 4 transmission transistors; the input ends of the 4 transmission gates and the 4 transmission transistors are connected with an input signal, and the output ends are connected with 8 internal nodes of the latch circuit; during a transparent period, each transmission gate and transmission transistor is turned on, the input signal is transmitted to the 8 internal nodes and is output through an output node Q; during a latch period, the 4 transmission gates and the 4 transmission transistors are turned off, and data is stored in the latch circuit; the application takes the advantage of cross interlocking to realize 100% four-point flip self-recovery, so that the latch can be free from the influence of four-point flip even in a severe radiation environment, and the soft error resistance of the latch is improved.
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