A wide-temperature imaging method, device, apparatus and storage medium

Abstract

The application relates to a wide-temperature imaging method, device, equipment and storage medium. The wide-temperature imaging method comprises the following steps: selecting a first-grade integration time corresponding to a temperature interval in which an environment temperature is located according to the environment temperature in which an infrared detection system currently flies; selecting a second-grade integration time corresponding to an image gray value under the first-grade integration time according to the real-time acquired image gray value, and setting the integration time of the infrared detection system as the second-grade integration time; calling a non-uniformity correction coefficient corresponding to the second-grade integration time, and correcting the image by using the non-uniformity correction coefficient. The application can select a suitable integration time according to the environment in which the infrared detection system is located, improve a range index, and adjust the non-uniformity correction coefficient corresponding to the integration time after the adjustment, so that the infrared detection system can acquire the highest-quality image with the best integration time in different dynamic environment ranges.

Description

Technical Field

[0001] This application relates to the field of wide-temperature imaging under complex thermal environments, specifically to a wide-temperature imaging method, apparatus, device, and storage medium. Background Technology

[0002] Currently, infrared imaging is based on differences in thermal radiation. The environment in which the detection equipment is located and the external infrared radiation it receives directly affect the imaging effect of the infrared imaging equipment.

[0003] When a high-speed infrared detection system flies at high speed within the atmosphere, a complex flow field is formed between the optical components of the detection system and the incoming flow, causing aerodynamic heating, thermal radiation, and interference with infrared image transmission to the infrared imaging system. This results in a rapid increase in the infrared AD value of the image, which may reach saturation.

[0004] When the flight speed is greater than Mach 5, the high-speed airflow flowing through the detection system will form a bow-shaped detached shock wave in front of the object's head. The shock wave airflow heats up rapidly, and the high-temperature airflow radiates into the infrared imaging system, causing the image AD value to increase, and even saturation and other problems.

[0005] In practical applications, infrared detection systems may encounter numerous high-temperature interference radiation sources in the scene, which can cause a sharp increase in the dynamic range of the image and result in large-area saturation, thus affecting the normal display of targets in the scene.

[0006] When using infrared thermal imagers, the range of ambient and scene radiation temperatures is generally narrow. In such applications, a single integration time is usually sufficient to ensure normal imaging of the scene.

[0007] In high-speed infrared detection system applications, the potential radiation range of the scene is significantly larger than in normal applications, often several times greater. To ensure unsaturated high-temperature radiation, existing technologies have focused on reducing the integration time. However, simply reducing the integration time directly would negatively impact the imaging performance of low-temperature radiation targets in the scene and the effective range of the equipment.

[0008] Therefore, it is necessary to design a new wide-temperature imaging method for high-speed infrared detection systems to overcome the above problems. Summary of the Invention

[0009] This application provides a wide-temperature imaging method, apparatus, device, and storage medium, which can solve the problem in related technologies that simply and directly reducing the integration time will affect the imaging effect of low-temperature radiation targets in the scene and the effective range index of the device.

[0010] In a first aspect, embodiments of this application provide a wide-temperature imaging method for a high-speed infrared detection system, the wide-temperature imaging method comprising the following steps:

[0011] Based on the ambient temperature where the infrared detection system is currently flying, select the first integration time corresponding to the temperature range of the ambient temperature.

[0012] Based on the real-time acquired image grayscale value, select the second integration time corresponding to the image grayscale value under the first integration time, and set the integration time of the infrared detection system to the second integration time.

[0013] The non-uniformity correction coefficient corresponding to the second integration time is invoked, and the image is corrected using the non-uniformity correction coefficient.

[0014] In conjunction with the first aspect, in one embodiment, the wide-temperature imaging method further includes: in the initial stage of operation of the infrared detection system, selecting a first integration time corresponding to the temperature range of the ambient temperature as the initial integration time of the infrared detection system, based on the ambient temperature of the infrared detection system.

[0015] In conjunction with the first aspect, in one embodiment, the statistical method for the image grayscale value includes: calculating the average grayscale value of the entire image; or partitioning the image, calculating the average value of each partition, and then weighting the average value according to the importance of each partition to obtain the current image grayscale value.

[0016] In conjunction with the first aspect, in one embodiment, before selecting the first integration time corresponding to the temperature range of the ambient temperature where the infrared detection system is currently flying, the method further includes:

[0017] The ambient temperature is segmented based on the maximum and minimum values ​​of the ambient temperature where the infrared detection system is located, forming multiple continuous temperature ranges.

[0018] Based on the temperature value information of each temperature range, a corresponding first-level integration time is set for each temperature range.

[0019] In conjunction with the first aspect, in one embodiment, before selecting the first integration time corresponding to the temperature range of the ambient temperature where the infrared detection system is currently flying, the method further includes:

[0020] The infrared detection system window radiation range is simulated based on each temperature range in which the infrared detection system is located;

[0021] Based on the window radiation range and the scene radiation range, the first-level integration time corresponding to each temperature range is subdivided into multiple second-level integration times.

[0022] In conjunction with the first aspect, in one implementation, the scene radiation includes aerodynamic thermal radiation, high-temperature interference radiation, and ground scene radiation.

[0023] In conjunction with the first aspect, in one embodiment, the step of calling the non-uniformity correction coefficient corresponding to the second integration time and using the non-uniformity correction coefficient to correct the image includes: if there is no non-uniformity correction coefficient corresponding to the second integration time, then the non-uniformity correction coefficient corresponding to the second integration time is obtained by fitting the non-uniformity correction coefficient of the adjacent second integration time.

[0024] Secondly, embodiments of this application provide a wide-temperature imaging device, comprising: an adjustment module, configured to select a first integration time corresponding to the ambient temperature range of the current flight of the infrared detection system; and to select a second integration time corresponding to the image grayscale value under the first integration time based on the real-time acquired image grayscale value, and set the integration time of the infrared detection system to the second integration time; and a correction module, configured to call a non-uniformity correction coefficient corresponding to the second integration time, and use the non-uniformity correction coefficient to correct the image.

[0025] Thirdly, embodiments of this application provide a wide-temperature imaging device, which includes a processor, a memory, and a wide-temperature imaging program stored in the memory and executable by the processor, wherein when the wide-temperature imaging program is executed by the processor, it implements the steps of the wide-temperature imaging method described above.

[0026] Fourthly, embodiments of this application provide a computer-readable storage medium storing a wide-temperature imaging program, wherein when the wide-temperature imaging program is executed by a processor, it implements the steps of the wide-temperature imaging method described above.

[0027] The beneficial effects of the technical solutions provided in this application include at least the following:

[0028] By setting multiple first-level integration times and multiple second-level integration times subdivided under the first-level integration time, the corresponding first-level integration time can be roughly selected based on the ambient temperature. Then, the subdivided second-level integration time can be selected based on the grayscale values ​​of the real-time acquired image. This allows for the selection of an appropriate integration time according to the environment in which the infrared detection system is located, thereby improving the effective range. Furthermore, the non-uniformity correction coefficient is also adjusted after the integration time is adjusted, ensuring that the infrared detection system acquires the highest quality image with the optimal integration time in different dynamic environmental ranges. This achieves wide dynamic range imaging over a wide temperature range and solves the problem in related technologies where simply and directly reducing the integration time affects the imaging effect of low-temperature radiation targets in the scene and the effective range of the equipment. Attached Figure Description

[0029] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0030] Figure 1 This is a schematic flowchart of an embodiment of the wide-temperature imaging method of this application;

[0031] Figure 2 This is a schematic diagram of the functional modules of an embodiment of the wide-temperature imaging device of this application. Detailed Implementation

[0032] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0033] The terms "comprising" and "having," and any variations thereof, in the specification, claims, and accompanying drawings of this application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to such process, method, product, or apparatus. The terms "first," "second," and "third," etc., are used to distinguish different objects, etc., and do not indicate a sequence, nor do they limit "first," "second," and "third" to different types.

[0034] In the description of the embodiments of this application, terms such as "exemplary," "for example," or "for instance" are used to indicate examples, illustrations, or explanations. Any embodiment or design described as "exemplary," "for example," or "for instance" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of terms such as "exemplary," "for example," or "for instance" is intended to present the relevant concepts in a concrete manner.

[0035] In the description of the embodiments of this application, unless otherwise stated, " / " means "or". For example, A / B can mean A or B. The "and / or" in the text is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist simultaneously, and B exists alone. In addition, in the description of the embodiments of this application, "multiple" means two or more.

[0036] In some processes described in the embodiments of this application, multiple operations or steps are included in a specific order. However, it should be understood that these operations or steps may not be executed in the order they appear in the embodiments of this application, or they may be executed in parallel. The sequence number of the operation is only used to distinguish different operations, and the sequence number itself does not represent any execution order. In addition, these processes may include more or fewer operations, and these operations or steps may be executed sequentially or in parallel, and these operations or steps may be combined.

[0037] Simply reducing the integration time in related technologies can negatively impact the imaging performance of low-temperature radiation targets and the device's effective range. Therefore, to ensure that the infrared detection system can perform normal imaging across a wide temperature range throughout its application and can acquire targets quickly and promptly, thereby improving the target recognition distance, it is necessary to consider the normal imaging problem of the ultra-high dynamic range of such high-speed infrared detection systems. This requires ensuring both the system's effective range and display performance in low-temperature radiation scenarios, while also ensuring normal imaging under high-temperature radiation desaturation in aerodynamic thermal environments.

[0038] First, some of the technical terms used in this application will be explained to help those skilled in the art understand this application.

[0039] AD value: Grayscale value.

[0040] In addition, infrared radiation factors that need to be considered in the practical application of infrared imaging in high-speed infrared detection systems include:

[0041] 1) Due to the long range of the high-speed infrared detection system, the ambient temperature may vary greatly during a single flight, such as the span between cold and hot regions.

[0042] 2) The infrared window temperature increases rapidly due to high-speed flight, and the infrared optical system directly receives solid radiation from the high-temperature window and gas radiation from the external high-temperature airflow.

[0043] 3) During the imaging process of the infrared detection system, high-temperature interference sources in the scene may occur. These can lead to an increase in the infrared dynamic range of the image, i.e., an increase in the image grayscale value or even saturation.

[0044] Classification of infrared radiation sources:

[0045] 1) The ambient temperature radiation of the infrared detector system;

[0046] 2) High-temperature window of infrared detection system, aerodynamic thermal radiation, etc.;

[0047] 3) Detect high-temperature interference radiation in the scene;

[0048] 4) Ground scene detected by the infrared detection system during flight (including target radiation). All objects above -273°C radiate infrared waves; the higher the temperature, the more radiation.

[0049] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0050] In a first aspect, embodiments of this application provide a wide-temperature imaging method for a high-speed infrared detection system.

[0051] In one embodiment, reference is made to Figure 1 , Figure 1 This is a flowchart illustrating the first embodiment of the wide-temperature imaging method for the high-speed infrared detection system of this application. Figure 1 As shown, the wide-temperature imaging method of the high-speed infrared detection system includes:

[0052] S1: Based on the ambient temperature where the infrared detection system is currently flying, select the first integration time corresponding to the temperature range of the ambient temperature. That is, this embodiment sets multiple temperature ranges, and each temperature range has a corresponding first integration time. Each first integration time is a specific value, meaning multiple temperature ranges will have multiple first integration times. The values ​​of the first integration times corresponding to different temperature ranges may be the same or different, but generally they are different. If the ambient temperature where the infrared detection system is currently flying is detected to be within a certain temperature range, then the first integration time corresponding to that temperature range is selected.

[0053] S2: Based on the real-time acquired image grayscale values, select a second integration time corresponding to the image grayscale values ​​under the first integration time, and set the integration time of the infrared detection system to the second integration time. It should be understood that multiple second integration times can be set under each first integration time, or only one second integration time can be set. The second integration time under each first integration time is obtained by further subdividing the values ​​near the first integration time. In other words, in this embodiment, the integration time is divided twice. First, the approximate integration time is found to be near the first integration time based on the ambient temperature. Then, a more subdivided integration time, i.e., the second integration time, is found based on the first integration time, making the integration time more refined and accurate.

[0054] S3: Call the non-uniformity correction coefficient corresponding to the second-level integration time, and use the non-uniformity correction coefficient to correct the image.

[0055] In this embodiment, by setting multiple first-level integration times and multiple second-level integration times subdivided around the first-level integration time, the first-level integration time can be roughly selected based on the ambient temperature. Then, the second-level integration time subdivided around the first-level integration time can be selected based on the real-time acquired image grayscale values. This finer division of the integration time results in a more accurate integration time, rather than a rough selection of the first-level integration time. This allows for the selection of a suitable and accurate integration time based on the environment in which the infrared detection system operates. A suitable integration time leads to better image quality and improved operational range. Simultaneously, the non-uniformity correction coefficient is also adjusted after the integration time is adjusted, ensuring that the infrared detection system acquires the highest quality images with the optimal integration time in different dynamic environmental ranges. This achieves wide dynamic range imaging over a wide temperature range and solves the problem in related technologies where simply and directly reducing the integration time affects the imaging effect of low-temperature radiation targets in the scene and the operational range of the device.

[0056] Furthermore, during flight, in the face of potential interference from lasers, high temperatures, etc., which could cause image saturation, the infrared detection system will adaptively calculate and select an appropriate integration time based on the trend of the image's AD value to avoid image saturation during flight.

[0057] Furthermore, in one embodiment, the wide-temperature imaging method further includes: in the initial stage of operation of the infrared detection system, selecting the first integration time corresponding to the temperature range of the ambient temperature as the initial integration time of the infrared detection system, based on the ambient temperature of the infrared detection system.

[0058] In practical applications, since the ambient temperature of the infrared detection system is known, the corresponding temperature range can be selected based on the ambient temperature when the infrared detection system is powered on (such as selecting the range T0℃~T1℃, or a more detailed division).

[0059] In the initial stage of operation, the window temperature of the infrared detection system has not yet risen significantly. To ensure the effective range, the optimal integration time for the current temperature range is selected by default based on the ambient temperature (that is, the highest integration time; the longer the integration time, the better the effective range performance).

[0060] In this embodiment, the optimal integration time can be selected based on the ambient temperature of the infrared detection system. This allows for the selection of a suitable initial integration time for the infrared detection system, thus solving the technical problem of poor initial integration time in related technologies.

[0061] In actual flight, based on the current flight phase and real-time image grayscale statistics (including changes in window temperature and scene radiation temperature), the most suitable integration time is selected according to the relationship between integration time and grayscale value changes. The integration time and image grayscale value have a basically linear relationship; the longer the integration time, the larger the grayscale value. The output grayscale value range of the infrared image is 0-65535. Grayscale values ​​in the middle range (approximately 20000-40000) of 0-65535 provide better imaging results.

[0062] Furthermore, in one embodiment, the statistical method for image grayscale values ​​includes: calculating the average grayscale value of the entire image and using the average grayscale value as the comprehensive evaluation value of the current grayscale value; or performing partitioning processing on the image, calculating the average value of each partition, and then weighting according to the importance of each partition to obtain the current image grayscale value, which is used as the comprehensive evaluation value of the current grayscale value.

[0063] The formula for calculating the average gray level of the entire image using a weighted method is as follows:

[0064]

[0065] In the formula: Mean_ImgGray is the sum of the gray values ​​of the entire image; weight i is the weight of the partitioned image; Mean_subImg is the mean of the partitioned image; M is the total number of partitions; i = 0, ..., M.

[0066] In this embodiment, the image grayscale value is used as a criterion for determining whether the current integration time is appropriate. If the grayscale value is too high, it indicates that the integration time is too long and needs to be reduced. The current image grayscale value is obtained by calculating the average grayscale value of the entire image, rather than taking the grayscale value of a certain area in the image. The average value can better reflect the overall saturation effect of the entire image. Furthermore, weight values ​​are assigned according to the importance of different areas of the image, which solves the technical problem in related technologies that cannot effectively detect the saturation effect of the image.

[0067] Furthermore, in one embodiment, before selecting the first integration time corresponding to the temperature range of the current flight environment of the infrared detection system (i.e., before S1), the method further includes:

[0068] Step a: Based on the maximum and minimum ambient temperatures of the infrared detection system, the ambient temperature is segmented to form multiple continuous temperature ranges.

[0069] Step b: Based on the temperature value information of each temperature range, set the corresponding first-level integration time for each temperature range.

[0070] The ambient temperature of the infrared detection system is denoted as Tb, based on the possible distribution range of the ambient temperature (the minimum ambient temperature is Tb). min The maximum value is Tb max Configure the segmentation, with the number of segments based on the temperature range Tb. range =Tb max -Tb min (That is, the temperature range is obtained by subtracting the minimum value from the maximum value) and adjust it to ensure that the temperature span of each segment is not too large (if the temperature span of each segment is too large, it will result in poor image non-uniformity). The temperature segment formed after segmentation is also the temperature range.

[0071] The segmentation method of ambient temperature Tb and the corresponding integration time t b As shown in the formula below, the temperature range is T. b 0, T b 1. T b 2... Depending on the actual needs, more gears can be added, but this will increase the complexity of equipment operation.

[0072]

[0073] Among them, T b 0 represents the first temperature range, which is between T0 and T1. T0 is also the minimum ambient temperature Tb. min ;T b 1 indicates the second temperature range, which is between T1 and T2; T b2 represents the third temperature range, between T2 and T3; and so on, until the maximum ambient temperature Tb is reached. max .

[0074] Then, based on the specific temperature values ​​for each temperature range, set the corresponding first-level integration time: t b 0, t b 1. t b 2……,

[0075]

[0076] Among them, the first temperature range T b The first integration time for 0 is t. b 0; corresponds to the second temperature range T b The first integration time for step 1 is t. b 1; corresponding to the third temperature range T b The first integration time for step 2 is t. b 2; Divide the first integration time for each temperature range.

[0077] When the infrared detection system is running, it acquires ambient temperature information from the internal temperature sensor and sets the first integration time according to the above environmental segmentation method.

[0078] In this embodiment, by dividing the wide temperature range, a suitable integration time can be found for each small temperature interval. This allows the infrared detection system to adjust to a suitable integration time according to different temperature intervals, even if the temperature changes significantly during flight. This solves the technical problem in related technologies that it cannot perform normal imaging within a wide temperature range.

[0079] Furthermore, in one embodiment, before selecting the first integration time corresponding to the temperature range of the current flight environment of the infrared detection system (i.e., before S1), the method further includes:

[0080] Step c: Simulate the window radiation range of the infrared detection system according to each temperature range in which the infrared detection system is located.

[0081] Step d: Based on the window radiation range and the scene radiation range, subdivide the first integration time corresponding to each temperature range to form multiple second integration times.

[0082] After determining the first integration time corresponding to the environment, due to heat source factors such as equipment window temperature, aerodynamic thermal radiation, high-temperature interference radiation, and ground scene radiation, it is necessary to further refine the radiation temperature based on the above radiation information. Combining the flight phase and the window temperature and scene radiation (including aerodynamic thermal variations, ground scene, target radiation, high-temperature interference sources, etc.) during flight, the total radiation is included in the grayscale value information acquired by the infrared detection system. The integration time is then comprehensively determined based on the image grayscale values ​​acquired by the infrared detection system. Specifically, the appropriate first and second integration times can be set through extensive thermal simulations using system modeling and analysis of historical application environment data.

[0083] Window temperature and aerodynamic thermal radiation are important sources of radiation and reference information. Based on the actual application conditions of the infrared detection system, the temperature range of the infrared detection system window can be simulated (thus obtaining the window radiation range, since temperature and radiation are directly related). Based on the window radiation range and the possible range of scene radiation, the total radiation range T is obtained. t-range =Tt max -Tt min (That is, the radiation range is obtained by subtracting the minimum radiation value from the maximum radiation value), and the corresponding integration time is divided to obtain Table 1 below, the integration level division table.

[0084] The segmentation method of scene temperature Tt and the corresponding integration time t t As shown in the following formula, the scene temperature level T t 0, T t 1. T t 2... and the corresponding integration time t t 0, t t 1. t t 2……

[0085]

[0086] Table 1. Points System Tier Classification

[0087]

[0088] The second-order integration time corresponding to each temperature range in the table above is different. For example, the three second-order integration times (t) corresponding to the first temperature range Tb0 are different. b 0_t t 0, t b 0_t t 1. t b 0_t t 2) is the first-level integration time t b The values ​​near 0 are further subdivided; the three second-level integration times (t) corresponding to the second temperature range Tb1 are obtained.b 1_t t 0, t b 1_t t 1. t b 1_t t 2) is the first-level integration time t b The values ​​near 1 are further subdivided. The letters representing integration time in the table are merely examples and do not represent the first integration time t. b Second integration time (t) at 0 b 0_t t 0, t b 0_t t 1. t b 0_t t 2) The first-level integration time t b The second integration time (t) under 1 b 1_t t 0, t b 1_t t 1. t b 1_t t 2) The values ​​are equal.

[0089] In this embodiment, the first integration time can be further subdivided through simulation to obtain a second integration time near the first integration time. The obtained second integration time takes into account the radiation effect on the infrared detection system during the imaging process, which can ensure that the high-temperature radiation is not saturated and normal imaging is achieved under aerodynamic thermal environment. This solves the problem in related technologies where the image dynamic range increases sharply and large-area saturation occurs, which affects the normal display of targets in the scene.

[0090] Furthermore, in one embodiment, the scene radiation includes aerodynamic thermal radiation, high-temperature interference radiation, ground scene radiation, and target radiation. This embodiment summarizes the radiation sources used in practical applications of high-speed infrared detection systems, including the internal ambient temperature of the equipment, high-temperature windows, aerodynamic heat, and high-temperature interference sources in the scene. It considers the influence of all radiation experienced by the infrared detection system during imaging, ensuring that high-temperature radiation remains unsaturated and normal imaging is achieved under aerodynamic thermal conditions. This solves the problem in related technologies where a rapid increase in the image dynamic range leads to large-area saturation, affecting the normal display of targets in the scene.

[0091] Furthermore, in one embodiment, the step of calling the non-uniformity correction coefficient corresponding to the second integration time and using the non-uniformity correction coefficient to correct the image includes: if there is no non-uniformity correction coefficient corresponding to the second integration time, then the non-uniformity correction coefficient corresponding to the second integration time is obtained by fitting the non-uniformity correction coefficient of the adjacent second integration time.

[0092] When the integration time of an infrared detection system changes, the non-uniformity correction data of the image (the bias coefficient and gain coefficient usually need to change) is shown in the following formula:

[0093] Y ij =a ij ×(X ij -b ij ),

[0094] In the formula: Y represents the corrected image, X represents the original input data, a is the gain correction coefficient, b is the bias correction coefficient, and i and j are the pixels along the x-axis and y-axis, respectively. The original data output by the infrared detection system must undergo non-uniformity correction to achieve good image quality. Different integration times result in different non-uniformity correction parameters; therefore, adjusting the integration time requires corresponding adjustments to the non-uniformity correction data. The appropriateness of the non-uniformity correction coefficients determines the non-uniformity effect of the corrected image.

[0095] In this method, when the integration time changes, the corresponding non-uniformity correction coefficient for the integration time needs to be called synchronously. In this embodiment, the non-uniformity correction coefficient can be pre-stored in the infrared detection system. When there are many integration time settings, it is impossible to store all the non-uniformity correction coefficients. Alternatively, the non-uniformity correction coefficients of adjacent integration time settings can be used for fitting, so that the image effect after the integration time adjustment is kept in the best state, thus solving the problem that the non-uniformity correction coefficients cannot be fully stored in related technologies.

[0096] The integration time adjustment is completed within a single frame, while the non-uniformity correction data is switched synchronously. This ensures smooth output images and avoids image quality degradation caused by mismatches between integration time and non-uniformity correction data.

[0097] This method uses system modeling to conduct extensive thermal simulations and analyze data collected from actual application environments. It summarizes the infrared radiation characteristics of the high-speed infrared detection system at different time periods during flight, including the infrared radiation temperature range and radiation change rate. Based on the radiation change characteristics at different stages, combined with scene grayscale value analysis methods and non-uniformity evaluation, a comprehensive integration time adjustment scheme is proposed to ensure that the equipment acquires the highest quality image effect with the optimal integration time in different dynamic ranges, thereby achieving wide dynamic range imaging over a wide temperature range.

[0098] The wide-temperature imaging method provided in this application can meet the wide dynamic range imaging requirements of high-speed infrared detection systems, improve the device's effective range, and ensure normal image imaging quality. It can adaptively adjust the integral time to synchronously adjust non-uniformity correction data, ensuring continuous and stable image imaging. Furthermore, it can be calibrated offline, meeting real-time requirements. The method is simple to implement on an embedded platform, satisfying real-time requirements. Through offline learning and online adaptive integral time non-uniformity correction technology, it solves the non-uniformity problem in the wide temperature range of high-speed infrared detection systems, improves the target effective range, and facilitates timely and rapid target detection by the system.

[0099] Secondly, embodiments of this application also provide a wide-temperature imaging device.

[0100] In one embodiment, reference is made to Figure 2 , Figure 2 This is a schematic diagram of the functional modules of an embodiment of the wide-temperature imaging device of this application. Figure 2 As shown, the wide-temperature imaging device includes: an adjustment module, which is used to select a first integration time corresponding to the ambient temperature range of the current flight of the infrared detection system; and to select a second integration time corresponding to the image grayscale value under the first integration time based on the real-time acquired image grayscale value, and set the integration time of the infrared detection system to the second integration time; and a correction module, which is used to call the non-uniformity correction coefficient corresponding to the second integration time, and to correct the image using the non-uniformity correction coefficient.

[0101] Furthermore, in one embodiment, the adjustment module is also used to select the first integration time corresponding to the temperature range of the ambient temperature as the initial integration time of the infrared detection system at the initial stage of operation of the infrared detection system.

[0102] Furthermore, in one embodiment, the adjustment module is also used to calculate the average grayscale value of the entire image; or to partition the image, calculate the average value of each partition, and then weight the partitions according to their importance to obtain the current image grayscale value.

[0103] Furthermore, in one embodiment, the correction module is further configured to, if there is no non-uniformity correction coefficient corresponding to the second integration time, obtain the non-uniformity correction coefficient corresponding to the second integration time by fitting it with the non-uniformity correction coefficient of the adjacent second integration time.

[0104] The functions of each module in the wide-temperature imaging device correspond to the steps in the wide-temperature imaging method embodiment, and their functions and implementation processes will not be described in detail here.

[0105] Thirdly, embodiments of this application provide a wide-temperature imaging device, which can be an infrared detection device or other device with data processing capabilities.

[0106] In this embodiment, the wide-temperature imaging device may include a processor, a memory, a communication interface, and a communication bus.

[0107] The communication bus can be of any type and is used to interconnect the processor, memory, and communication interface.

[0108] Communication interfaces include input / output (I / O) interfaces, physical interfaces, and logical interfaces used for interconnecting devices within the wide-temperature imaging device, as well as interfaces used for interconnecting the wide-temperature imaging device with other devices (such as other computing devices or user equipment). Physical interfaces can be Ethernet interfaces, fiber optic interfaces, ATM interfaces, etc.; user equipment can be displays, keyboards, etc.

[0109] Memory can be various types of storage media, such as random access memory (RAM), read-only memory (ROM), non-volatile RAM (NVRAM), flash memory, optical storage, hard disk, programmable ROM (PROM), erasable PROM (EPROM), electrically erasable PROM (EEPROM), etc.

[0110] The processor can be a general-purpose processor, which can call a wide-temperature imaging program stored in memory and execute the wide-temperature imaging method provided in the embodiments of this application. For example, the general-purpose processor can be a central processing unit (CPU). The method executed when the wide-temperature imaging program is called can be referred to in the various embodiments of the wide-temperature imaging method of this application, and will not be repeated here.

[0111] Those skilled in the art will understand that the hardware structure shown in Figure m does not constitute a limitation of this application and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0112] Fourthly, embodiments of this application also provide a readable storage medium.

[0113] This application has a readable storage medium storing a wide-temperature imaging program, wherein when the wide-temperature imaging program is executed by a processor, it implements the steps of the wide-temperature imaging method as described above.

[0114] The method implemented when the wide-temperature imaging program is executed can be referred to in various embodiments of the wide-temperature imaging method of this application, and will not be repeated here.

[0115] It should be noted that the sequence numbers of the embodiments in this application are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0116] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes several instructions to cause a terminal device to execute the methods described in the various embodiments of this application.

[0117] The above are merely preferred embodiments of this application and do not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A wide-temperature imaging method for a high-speed infrared detection system, characterized in that, The wide-temperature imaging method includes the following steps: Based on the ambient temperature of the current flight of the infrared detection system, the first integration time corresponding to the temperature range of the ambient temperature is selected; there are multiple temperature ranges, and a first integration time is set for each temperature range, and at least one second integration time is set under each first integration time. The second integration time under each first integration time is obtained by further subdividing the first integration time. Based on the real-time acquired image grayscale value, select the second integration time corresponding to the image grayscale value under the first integration time, and set the integration time of the infrared detection system to the second integration time. The non-uniformity correction coefficient corresponding to the second integration time is invoked, and the image is corrected using the non-uniformity correction coefficient.

2. The wide-temperature imaging method of the high-speed infrared detection system as described in claim 1, characterized in that, The wide-temperature imaging method further includes: In the initial stage of operation of the infrared detection system, the first integration time corresponding to the ambient temperature range is selected as the initial integration time of the infrared detection system based on the ambient temperature.

3. The wide-temperature imaging method of the high-speed infrared detection system as described in claim 1, characterized in that, The statistical method for image grayscale values ​​includes: Calculate the average grayscale value of the entire image; or divide the image into partitions, calculate the average value of each partition, and then weight them according to the importance of each partition to obtain the current image grayscale value.

4. The wide-temperature imaging method of the high-speed infrared detection system as described in claim 1, characterized in that, Before selecting the first integration time corresponding to the temperature range of the current flight environment based on the infrared detection system, the method further includes: The ambient temperature is segmented based on the maximum and minimum values ​​of the ambient temperature where the infrared detection system is located, forming multiple continuous temperature ranges. Based on the temperature value information of each temperature range, a corresponding first-level integration time is set for each temperature range.

5. The wide-temperature imaging method of the high-speed infrared detection system as described in claim 4, characterized in that, Before selecting the first integration time corresponding to the temperature range of the current flight environment based on the infrared detection system, the method further includes: The infrared detection system window radiation range is simulated based on each temperature range in which the infrared detection system is located; Based on the window radiation range and the scene radiation range, the first-level integration time corresponding to each temperature range is subdivided into multiple second-level integration times.

6. The wide-temperature imaging method of the high-speed infrared detection system as described in claim 5, characterized in that, The radiation from the scene includes aerodynamic thermal radiation, high-temperature interference radiation, and ground scene radiation.

7. The wide-temperature imaging method of the high-speed infrared detection system as described in claim 1, characterized in that, The step of calling the non-uniformity correction coefficient corresponding to the second integration time and correcting the image using the non-uniformity correction coefficient includes: If there is no non-uniformity correction coefficient corresponding to the second integration time, then the non-uniformity correction coefficient corresponding to the second integration time is obtained by fitting the non-uniformity correction coefficient of the adjacent second integration time.

8. A wide-temperature imaging device, characterized in that, The wide-temperature imaging device includes: The adjustment module is used to select a first integration time corresponding to the ambient temperature range where the infrared detection system is currently flying, based on the ambient temperature; and to select a second integration time corresponding to the image grayscale value under the first integration time based on the real-time acquired image grayscale value, and set the integration time of the infrared detection system to the second integration time. Multiple temperature ranges are set, each with a corresponding first integration time, and each first integration time has at least one second integration time. The second integration time under each first integration time is obtained by further subdividing the first integration time. The correction module is used to call the non-uniformity correction coefficient corresponding to the second-level integration time and use the non-uniformity correction coefficient to correct the image.

9. A wide-temperature imaging device, characterized in that, The wide-temperature imaging device includes a processor, a memory, and a wide-temperature imaging program stored in the memory and executable by the processor, wherein when the wide-temperature imaging program is executed by the processor, it implements the steps of the wide-temperature imaging method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a wide-temperature imaging program, wherein when the wide-temperature imaging program is executed by a processor, it implements the steps of the wide-temperature imaging method as described in any one of claims 1 to 7.

Images