A high-speed shutter system for synchrotron X-rays

Abstract

This invention provides a high-speed shutter system for synchrotron X-ray imaging, comprising two galvanometer deflection devices and a signal generator connected to the two galvanometer deflection devices. Each galvanometer deflection device includes a galvanometer driver, a galvanometer motor, and two parallelogram-shaped light-blocking blocks, which are symmetrically mounted on opposite sides of the axis at the end face of the galvanometer motor's shaft. The signal generator sends a trigger signal, including a square wave pulse, to each galvanometer deflection device, with the rising and falling edges of the square wave pulses from the two galvanometer deflection devices staggered in time. The galvanometer driver outputs a driving voltage with the same timing structure as the trigger signal. The galvanometer motor switches the light-blocking blocks between a light-passing state and a light-blocking state based on the rising and falling edges of the driving voltage. This high-speed shutter system achieves microsecond-level and adjustable shutter opening and closing speeds in a single shutter operation, thereby enabling exposure time control for various transient and rapid processes in X-ray ultrafast imaging.

Description

Technical Field

[0001] This invention relates to a mechanical shutter device, and more particularly to a high-speed shutter system for synchrotron X-rays and its method of use, for single shutter opening and closing of beam lines at microsecond levels and adjustable speed. Background Technology

[0002] Synchrotron radiation X-ray imaging provides an excellent X-ray source for imaging ultrafast X-ray processes due to the high throughput and high collimation of the incident X-rays. However, the high throughput of X-rays also brings significant thermal effects. Therefore, an X-ray shutter is needed on the X-ray beamline to control the light transmission time, reduce the thermal load on the sample and detector, and protect the imaging equipment from radiation damage. In conventional X-ray fast imaging techniques, the shutter speed reaches the millisecond level, which already meets the design requirements of the imaging equipment and the sample for light transmission time. However, in ultra-high-speed transient X-ray imaging, the X-ray imaging detector is required to record transient light field information on the microsecond or even picosecond timescale, thus requiring the incident X-ray beam to have a higher photon flux. This necessitates that the X-ray shutter can reduce the X-ray switching time from milliseconds to the microsecond level to further reduce the thermal load on the sample and detector. The purpose of the microsecond shutter is to achieve X-ray on / off control on the microsecond timescale, providing the imaging technology foundation for microsecond-level X-ray imaging.

[0003] Although similar shutter technologies exist in laser applications, such as electro-optic switches with switching times down to nanoseconds, saturated dye absorber switches, rotating mirror switches, and choppers, these switches are only applicable to certain specific fields. They are not only technically challenging and subject to attenuation, but their switching times cannot be freely adjusted, thus failing to meet the time control requirements of X-ray ultrafast imaging detection.

[0004] Existing X-ray millisecond shutters use high-speed switching electromagnets to drive a water-cooled copper block to insert or withdraw from the optical path to achieve the opening and closing of the millisecond shutter, which cannot achieve microsecond-level on / off response.

[0005] The patent "Method for Increasing the Fast-Opening Shutter Speed ​​of Metal Foil (CN87100881)" discloses a method for increasing the shutter speed of metal foil using an external magnetic field. Two coils are energized with pulsed high currents to generate an external magnetic field, which drives a metal foil shutter placed between the two coils. This increases the shutter opening speed from 0.12–0.21 mm / microsecond to 0.7 mm / microsecond, but the metal foil cannot block high-flux, high-energy white X-rays.

[0006] Patent CN110680354A, entitled "An X-ray shutter control system, method, control device, and application," discloses an X-ray shutter control system that utilizes a motor to drive a perforated turntable to rotate stably. X-rays are blocked by the turntable but can still be transmitted through the holes, thus forming a periodic X-ray output signal at a specified frequency. This achieves high-power, stable, frequency-adjustable, and long-exposure periodic X-ray signal output, which can be used for X-ray-excited optogenetics or X-ray-excited optical imaging. However, this patent struggles to achieve single-shot, microsecond-level shutter opening and closing.

[0007] Patent CN1438552, entitled "Microsecond Adjustable High-Speed ​​Mechanical Shutter," discloses a microsecond adjustable high-speed mechanical shutter. Compared to patent CN110680354A, its distinguishing feature is the horizontal mounting of two perforated rotating flywheels, each driven by a motor, on a wheel base. The two flywheels adjust the pulse time and period of light transmission through different speed differences. A conventional millisecond-level mechanical shutter is also placed in the subsequent optical path to control the passage of a single X-ray pulse. While this invention achieves microsecond-level single-pulse shutter opening and closing, it requires the combined use of a conventional millisecond shutter and a periodic microsecond shutter, making the device relatively complex. Summary of the Invention

[0008] The purpose of this invention is to provide a high-speed shutter system for synchrotron X-rays, so as to achieve microsecond-level and speed-adjustable single shutter opening and closing, thereby realizing exposure time control for various transient and fast processes in X-ray ultrafast imaging.

[0009] To achieve the above objectives, the present invention provides a high-speed shutter system for synchrotron X-rays, the hardware of which includes two galvanometer deflection devices and a signal generator connected to the two galvanometer deflection devices simultaneously. Each galvanometer deflection device includes a galvanometer driver, a galvanometer motor and two parallelogram light-blocking blocks, which are symmetrically installed on both sides of the axis on the end face of the rotating shaft of the galvanometer motor.

[0010] The signal generator is configured to send a trigger signal to each galvanometer deflection device. The trigger signal includes a square wave pulse, and the rising and falling edges of the square wave pulses of the two galvanometer deflection devices are staggered in time. The galvanometer driver is configured to output a driving voltage with the same timing structure as the trigger signal, so that the driving voltage has a rising edge and a falling edge. The galvanometer motor is configured to rotate its shaft by an angle corresponding to the driving voltage after receiving the driving voltage, so as to switch the light-blocking block between a light-transmitting state and a light-blocking state at the rising and falling edges of the driving voltage.

[0011] The driving voltage of the galvanometer driver reaches its maximum value when it receives the rising edge of the square wave signal of the trigger signal, and the driving voltage is 0 when it receives the falling edge of the square wave signal of the trigger signal, so that the driving voltage has both rising and falling edges.

[0012] When the driving voltage is 0V, the rotating shaft of the galvanometer motor is in its initial state, so that the light-blocking block is in the light path and is in a light-blocking state; when the driving voltage is the maximum value, the rotating shaft rotates to the maximum rotation angle, so that the light-blocking block leaves the light path and is in a light-transmitting state.

[0013] The maximum value of the driving voltage is a fixed value and corresponds to the maximum rotation angle of the galvanometer motor shaft. The maximum rotation angle of the shaft is equal to the acute angle of the light-blocking block.

[0014] The light-blocking block is in the shape of a parallelogram. When it is in the light-blocking state, one pair of parallel sides are parallel to the incident X-ray light path. When it is in the light-passing state, the other pair of parallel sides are parallel to the incident X-ray light path.

[0015] When the light-blocking block is in the light-blocking state, its designed thickness along the X-ray beam direction is determined by the photon energy of the X-ray to ensure that it can completely absorb the incident X-rays when in the light-blocking state; when the light-blocking block is in the light-transmitting state, the distance between the centroids of the two light-blocking blocks is sufficient to allow X-rays of the required spot size to pass through.

[0016] The light-blocking block is made of tungsten or tungsten carbide, and it is welded to the end face of the rotating shaft of the galvanometer motor.

[0017] The signal generator sends a first trigger signal and a second trigger signal to the first galvanometer deflection device and the second galvanometer deflection device, respectively. The square wave of the first trigger signal starts at time t1 and ends at time t2. The square wave of the second trigger signal starts at time t3 and ends at time t4. The value of t2-t3 is in the microsecond range.

[0018] It also includes an experimental physics and industrial control system, which is configured to issue control commands to a signal generator. The control commands include the square wave start time t1 and the square wave end time t2 of the first trigger signal, and the square wave start time t3 and the square wave end time t4 of the second trigger signal.

[0019] The hardware component also includes a temperature sensor, which is configured to acquire the temperature signal of the surface of each light-blocking block and send it to a safety interlock system to trigger the light gate safety interlock function of the synchrotron radiation beamline when the temperature signal exceeds a set safety value.

[0020] The experimental physics and industrial control system is also configured to receive feedback signals from the hardware, including temperature signals from the temperature sensor and drive voltages from the galvanometer driver.

[0021] The shutter system for synchrotron X-rays of the present invention has advantages in the following two aspects:

[0022] Firstly, the shutter system for synchrotron X-rays of this invention can achieve a single, microsecond-level, time-adjustable shutter response. The mechanical shutter of this invention is a single-shot X-ray gating device rather than a periodic gating shutter; therefore, it eliminates the need to superimpose other millisecond-level shutters to capture a specific segment from a periodic gating signal. Although the opening and closing response time of a single galvanometer is on the order of hundreds of microseconds, by cascading two galvanometers, a single shutter opening and closing with microsecond-level speed adjustment can be achieved, thereby enabling exposure time control for various transient and rapid processes in X-ray ultrafast imaging. The entire shutter system is simple in design and the control method is intuitive and easy to understand.

[0023] Secondly, the shutter system of the synchrotron X-ray of the present invention monitors the surface temperature of the galvanometer through a temperature sensor and achieves a safety interlock with the light gate of the synchrotron beamline. When the thermal load of the shutter system exceeds the set value, the X-ray light gate can be disconnected, further protecting the equipment and increasing the stability of the imaging system. Attached Figure Description

[0024] Figure 1 This is a schematic diagram of a shutter system for synchrotron X-rays according to an embodiment of the present invention.

[0025] Figure 2 This is a timing diagram of the driving voltage received by the first and second galvanometer electrodes of the present invention.

[0026] Figure 3 This is an overall framework diagram of the shutter system for synchrotron X-rays of the present invention. Detailed Implementation

[0027] To make the objectives, technical solutions, and advantages of the present invention clearer, the embodiments disclosed herein will be described in further detail below with reference to the accompanying drawings.

[0028] The high-speed shutter system for synchrotron X-rays of the present invention is installed in the optical path between the synchrotron X-ray generating device and the X-ray imaging detector. Specifically, the synchrotron X-ray generating device produces a highly collimated X-ray beam, downstream of which is a shutter system integrating multiple galvanometer deflection devices, and downstream of the shutter system is the X-ray imaging detector. The three devices are arranged in a straight line in the X-ray optical path, and there is no hardware connection between the devices.

[0029] The hardware component of the synchrotron X-ray shutter system of the present invention includes two galvanometer deflection devices 10 and a signal generator 20 connected to both galvanometer deflection devices 10. The principle of the hardware component is to use the two galvanometer deflection devices 10 to achieve microsecond-level light transmission control.

[0030] like Figure 1 As shown, each galvanometer deflection device 10 includes a galvanometer driver 11, a galvanometer motor 12, and two parallelogram light-blocking blocks 13.

[0031] The galvanometer driver 11 is a circuit system used in conjunction with the galvanometer motor. It is configured to output a drive voltage with the same timing structure as the trigger signal after receiving a trigger signal. The galvanometer motor 12 and the galvanometer driver 11 are connected by a cable.

[0032] The trigger signal includes at least one square wave pulse, thus having a rising edge and a falling edge. When the galvanometer driver 11 receives the rising edge of the square wave signal of the trigger signal, the generated driving voltage reaches its maximum value. The maximum value of the driving voltage is a fixed value and corresponds to the maximum rotation angle of the galvanometer motor shaft, which is equal to the acute angle of the light-blocking block 13. When the galvanometer driver 11 receives the falling edge of the square wave signal, the driving voltage is 0. Therefore, the driving voltage also includes a square wave pulse and also has a rising edge and a falling edge.

[0033] In some embodiments, the trigger signal sent to each galvanometer deflection device 10 may also include more than one square wave pulse, thereby enabling multiple exposure X-ray imaging by selecting multiple X-ray pulses.

[0034] The galvanometer motor 12 includes a rotating shaft, which is configured to rotate by an angle corresponding to the driving voltage after receiving the driving voltage.

[0035] The rotation angle of the galvanometer motor 12's shaft is directly proportional to the driving voltage. Therefore, when the driving voltage is input to the galvanometer motor 12, the galvanometer motor 12 responds to the driving voltage; different driving voltages correspond to different rotation angles of the shaft, with 0V corresponding to 0°. When the received driving voltage is 0V, the galvanometer motor 12's shaft is in its initial state, causing the light-blocking block 13 to be in the light-blocking state. When the received driving voltage is at its maximum value, the galvanometer motor 12's shaft rotates to its maximum rotation angle, causing the light-blocking block 13 to leave the light path and enter the light-passing state, allowing X-rays to pass through.

[0036] The galvanometer motor 12 was purchased, and its performance was designed by the manufacturer according to requirements. The galvanometer motor 12 is a special type of oscillating motor, but unlike rotary motors, its rotor has a restoring torque applied via mechanical springs or electronic means. The magnitude of this torque is proportional to the angle at which the rotor deviates from its equilibrium position. Therefore, the specific principle behind the deflection of the galvanometer motor's shaft 12 at the angle corresponding to the driving voltage is as follows: When the galvanometer motor 12 receives the driving voltage from the galvanometer driver, a current proportional to the driving voltage flows through the motor coil, generating an electromagnetic torque. The shaft deflects, and when the shaft deflects to an angle proportional to the driving voltage, the electromagnetic torque and the restoring torque are equal in magnitude, and the shaft stabilizes at the angle corresponding to the driving voltage. Therefore, it cannot rotate like a regular motor, but can only deflect. The deflection angle is proportional to the current, similar to a galvanometer; hence, the galvanometer is also called a galvanometer scanning galvanometer. The driving voltage output by the galvanometer driver 11 can be varied according to requirements. Therefore, the subdivision capability of the driving voltage output by the galvanometer driver 11 and the voltage resolution capability of the galvanometer motor 12 determine its angle resolution capability.

[0037] The galvanometer motor 12 typically uses a Cambridge Technology 62XXH series high-speed galvanometer with an angle resolution of 0.001 degrees and a response time of 200 microseconds at small angles.

[0038] In this embodiment, the galvanometer driver 11 is a Cambridge Technology 671 driver, and the galvanometer motor 12 is a Cambridge Technology 6220H, and the two are used together.

[0039] The galvanometer motor 12 can be fixed in the optical path, and the fixing device for the galvanometer motor 12 is arbitrary. In this embodiment, the galvanometer motor 12 is fixed on a fixed bracket, and the fixed bracket can be mounted on an electric displacement stage, so that the galvanometer deflection device 10 is moved into the X-ray path by the drive of the electric displacement stage. The galvanometer driver 11 is fixed next to the galvanometer motor 12 and is connected to the galvanometer motor 12 via a cable.

[0040] Two light-blocking blocks 13 are symmetrically installed on both sides of the shaft end face of the galvanometer motor.

[0041] Thus, the light-blocking block 13 rotates together with the galvanometer motor 12 to achieve the transmission and blocking of X-rays, that is, to realize the "on" and "off" control of X-rays by the light-blocking block 13 on the X-ray optical path.

[0042] It should be noted that in the prior art, the end face of the rotating shaft of the galvanometer motor 12 is used to install a lens. However, in the galvanometer deflection device 10 of the present invention, the galvanometer lens is not installed. Instead, a light blocking block 13 is used to replace the lens and is installed on the end face of the rotating shaft of the galvanometer motor 12.

[0043] The light-blocking block 13 is in the shape of a parallelogram. When it is in the light-blocking state, one pair of parallel sides are parallel to the incident X-ray light path. When it is in the light-passing state, the other pair of parallel sides are parallel to the incident X-ray light path.

[0044] In this embodiment, the light-blocking block 13 is a metal block, preferably a tungsten block. The light-blocking block 13 can also be made of other materials such as tungsten carbide. The light-blocking block 13 is welded to the end face of the shaft of the galvanometer motor 12.

[0045] The designed thickness of the light-blocking block 13 along the X-ray beam direction in the light-blocking state is determined by the photon energy of the X-rays to ensure that it can completely absorb the incident X-rays in the light-blocking state. In this embodiment, since the maximum X-ray energy is 30keV, the calculated thickness of a single parallelogram-shaped tungsten block (the length along the X-ray direction when blocking X-rays) can be 0.05 mm or greater than 0.05 mm (the transmittance of 30keV X-rays is less than 5%). The centroid distance between the two light-blocking blocks 13 is determined by the designed value of the incident X-ray spot height or the X-ray spot height after passing through the shutter system, so that when the two light-blocking blocks 13 are in the light-transmitting state, the centroid distance between the two light-blocking blocks 13 is sufficient to allow X-rays of the required spot size to pass through.

[0046] The centroid distance between the two light-blocking blocks 13 satisfies the following formula:

[0047] The design value of the X-ray transmission height = sinA × (the distance between the centroids of the two light-blocking blocks - the thickness of a single light-blocking block), (1)

[0048] Where A is the size of the acute angle of the light-blocking block.

[0049] When the "design value of the X-ray transmission height" calculated by formula (1) is greater than the original spot height of the synchrotron radiation X-ray actually incident into the shutter system, the size of the X-ray spot height after passing through the shutter system is the original spot height of the synchrotron radiation X-ray. When the "design value of the X-ray transmission height" calculated by formula (1) is less than the original spot height of the synchrotron radiation X-ray actually incident into the shutter system, the size of the X-ray spot height after passing through the shutter system is the transmission height value of the X-ray calculated by formula (1).

[0050] The length of the light-blocking block 13 (i.e., the width of the X-ray spot, and also the length of the light-blocking block 13 perpendicular to the X-ray beam) Figure 2The length in the direction of the paper should be greater than the original width of the synchrotron X-ray spot, that is, greater than 1.5 mm.

[0051] As described above, the two galvanometer deflection devices 10 are connected to the same signal generator 20, which is configured to output a trigger signal so that the galvanometer driver 11 outputs the corresponding driving voltage after receiving the trigger signal.

[0052] In this embodiment, the signal generator 20 is a DG series multi-functional signal generator.

[0053] Figure 2 This is a timing diagram of the trigger signal of the shutter system for synchrotron X-rays of the present invention.

[0054] like Figure 2 As shown, the rotational speed of the galvanometer motor 12 does not need to be set. Theoretically, the better the performance of the galvanometer motor, the faster the response, i.e., the faster the rotational speed. However, it is also related to the load on the rotating shaft. The fastest response speed of the galvanometer motor used in this embodiment at the required rotation angle is 200 microseconds. Therefore, the completion time of the shutter system opening and closing caused by the light-blocking block 13 and the galvanometer motor 12 is on the scale of hundreds of microseconds. A single galvanometer deflection device 10 cannot complete the selective passage of X-rays at the microsecond level. In other words, since the rotational speed of the galvanometer motor 12 of a single galvanometer deflection device 10 cannot complete the microsecond-level opening and closing action, two galvanometer deflection devices 10 are cascaded one after the other.

[0055] Therefore, this invention provides two galvanometer deflection devices 10 arranged in the optical path, one before the other. The trigger signal sent by the signal generator 20 to each galvanometer deflection device 10 includes a square wave pulse, and the square wave pulses of the two galvanometer deflection devices 10 are staggered in time. Thus, by controlling the timing of the operation of the two galvanometer deflection devices 10 separately through the signal generator 20, selective passage of X-rays at the microsecond level is achieved.

[0056] Specifically, before operation, the entire microsecond shutter system, namely the two galvanometer deflection devices 10, is in a light-blocking standby state. During operation, the galvanometer drivers 11 of the two galvanometer deflection devices 10 respond to the rising and falling edges of the square wave pulse trigger signal. When the galvanometer driver 11 receives the rising edge, it generates a driving voltage that is transmitted to the galvanometer motor 12. The galvanometer motor 12 rotates its shaft to the maximum rotation angle, putting the galvanometer deflection device 10 in a light-transmitting state. When the galvanometer driver 11 receives the falling edge of the square wave pulse, the output driving voltage is 0, and the galvanometer motor 12 rotates back to the initial angle, putting the galvanometer deflection device 10 in a light-blocking state. The square wave pulse emitted by the signal generator 20 initially puts the first galvanometer deflector 10 into a light-transmitting state and the second into a light-blocking state. Then, before the first galvanometer deflector 10, which was in the light-transmitting state, returns to the light-blocking state due to the trigger signal becoming zero, the second galvanometer deflector 10, which was originally in the light-blocking state, enters the light-transmitting state. Then, as the square wave pulse of the first galvanometer deflector 10 ends, it returns to the light-blocking state, while the second galvanometer deflector 10 has not yet returned to the light-blocking state. Finally, the second galvanometer deflector 10 returns to the light-blocking state when its square wave pulse ends.

[0057] It should be noted that the selection of the first galvanometer deflection device 10 and the second galvanometer deflection device 10 is arbitrary. In this embodiment, the first galvanometer deflection device 10 is the upstream galvanometer deflection device 10 in the optical path, but in other embodiments, the first galvanometer deflection device 10 can also be the downstream galvanometer deflection device 10 in the optical path.

[0058] like Figure 2As shown, in this embodiment, the signal generator 20 sends a first trigger signal and a second trigger signal to the first galvanometer deflection device 10 and the second galvanometer deflection device 10, respectively. The square wave of the first trigger signal starts at time t1 and ends at time t2. The start and end times of the square wave in the drive signal received by the first galvanometer motor 12 are slightly later than the start and end times of the square wave in the trigger signal (galvanometer motor 12 is at high voltage, and the light-blocking block 13 does not block X-rays; galvanometer motor is at 0 voltage, and the light-blocking block 13 blocks light). However, since the delay time is the same, the first galvanometer deflection device 10 is in the light-transmitting state for the time t2-t1. The square wave of the second trigger signal starts at time t3 and ends at time t4. The start and end times of the square wave in the drive signal received by the second galvanometer motor 12 are slightly later than the start and end times of the square wave in the trigger signal. However, since the delay time is the same, the second galvanometer deflection device 10 is in the light-transmitting state for the time t4-t3. The end time t2 of the square wave of the first trigger signal is later than the start time t3 of the square wave of the second trigger signal, and the final X-ray transmission time is t2-t3. The value of t2-t3 is in the microsecond range, thus realizing a time-adjustable microsecond-level X-ray transmission window.

[0059] The switching response time of a single galvanometer motor is on the order of hundreds of microseconds, which cannot meet the microsecond-level X-ray gating requirement. However, the microsecond-level light transmission time of the entire high-speed shutter system can be controlled by the cooperation of two galvanometer deflection devices 10 and the delay between t2 and t3.

[0060] like Figure 3 As shown, the hardware component of the high-speed shutter system for synchrotron X-rays of the present invention also includes a temperature sensor 14. The temperature sensor 14 is configured to acquire the temperature signal of the surface of each light-blocking block 13 and send it to a safety interlock system 40. In this embodiment, the temperature sensor 14 is a non-contact infrared thermometer, aligned with the light-blocking block 13 to achieve temperature measurement. This temperature signal serves as a feedback signal for temperature monitoring; additionally, it is received by the safety interlock system 40 to participate in the safety interlock function of the synchrotron beamline's light-blocking shutter. When the temperature signal exceeds a set safety value, the safety interlock function of the synchrotron beamline's light-blocking shutter is triggered, and the safety interlock system sends a light-cutting command to the light-blocking shutter of the upstream synchrotron beamline.

[0061] The safety interlock system 40 is an existing system in synchrotron X-ray devices. The input to the safety interlock consists of the status parameters of various optical elements (not the devices in this patent). When the set value is exceeded, the X-ray shutter is closed. The specific structure of the safety interlock system is existing; it only requires uploading the temperature information of the shutter system's metal block to the safety interlock system. In other words, the temperature sensor of this invention provides an input option for the existing safety interlock system of synchrotron X-ray devices.

[0062] The high-speed shutter system for synchrotron X-rays of the present invention includes, in addition to the hardware components, an Experimental Physics and Industrial Control System (EPICS) 30, which is communicatively connected to the hardware components. The EPICS 30 is configured to receive feedback signals from the hardware components and issue control commands to them. The EPICS 30 is also configured to display the feedback signals on its HMI interface.

[0063] In this embodiment, the feedback signal includes a temperature signal from the temperature sensor 14 and a driving voltage from the galvanometer driver 11. The control command includes a control command sent to the signal generator 20, which includes four parameters: the square wave start time t1 and the square wave end time t2 of the first trigger signal, and the square wave start time t3 and the square wave end time t4 of the second trigger signal, which are used to form two trigger signals.

[0064] Therefore, the entire high-speed shutter system for synchrotron X-rays adopts a standard three-layer architecture: the top layer is the application layer based on the "Experimental Physics and Industrial Control System (EPICS)"; the middle layer is the network layer, which realizes the transmission of control commands and feedback data; and the bottom layer is the equipment layer, namely the hardware part composed of devices such as the signal generator 20, the galvanometer driver 11, the galvanometer motor 12, the light blocking block 13, and the temperature sensor 14.

[0065] As described above, the hardware portion of the high-speed shutter system for synchrotron X-rays of the present invention implements the opening and closing of the shutter and uploads various feedback information such as gate control information (i.e., the drive voltage information received by the galvanometer motor 12, which is also the drive voltage output by the galvanometer driver 11) and temperature signals. The application layer implements human-machine interaction and data acquisition, issuing control commands (i.e., t1, t2, t3, t4) on the EPICS Human Machine Interface (HMI). The control commands reach the signal generator 20 through the network layer, causing the signal generator 20 to output trigger signals to the two galvanometer drivers 11, thereby achieving microsecond-level on / off control of X-rays.

[0066] The collected feedback information, such as the galvanometer rotation angle (i.e., the driving voltage output by the galvanometer driver 11) and temperature signal, is uploaded to the application layer via the network for display on the HMI interface of the experimental physics and industrial control system.

[0067] The above description is merely a preferred embodiment of the present invention and is not intended to limit the scope of the invention. Various variations can be made to the above embodiments of the present invention. All simple and equivalent changes and modifications made in accordance with the claims and description of this application fall within the protection scope of the claims of this patent. All aspects not described in detail in this invention are conventional technical content.

Claims

1. A high-speed shutter system for synchrotron X-rays, characterized in that, Its hardware includes two galvanometer deflection devices and a signal generator connected to both galvanometer deflection devices. Each galvanometer deflection device includes a galvanometer driver, a galvanometer motor, and two parallelogram light-blocking blocks. The two light-blocking blocks are symmetrically installed on both sides of the shaft center on the end face of the galvanometer motor's rotating shaft. The signal generator is configured to send a trigger signal to each galvanometer deflection device. The trigger signal includes a square wave pulse, and the rising and falling edges of the square wave pulses of the two galvanometer deflection devices are staggered in time. The galvanometer driver is configured to output a driving voltage with the same timing structure as the trigger signal, so that the driving voltage has a rising edge and a falling edge. The galvanometer motor is configured to rotate its shaft by an angle corresponding to the driving voltage after receiving the driving voltage, so as to switch the light-blocking block between a light-transmitting state and a light-blocking state at the rising and falling edges of the driving voltage. The light-blocking block is in the shape of a parallelogram. When it is in the light-blocking state, one pair of parallel sides are parallel to the incident X-ray light path. When it is in the light-passing state, the other pair of parallel sides are parallel to the incident X-ray light path. When the light-blocking block is in the light-blocking state, its designed thickness along the X-ray beam direction is determined by the photon energy of the X-ray to ensure that it can completely absorb the incident X-rays when in the light-blocking state; when the light-blocking block is in the light-transmitting state, the distance between the centroids of the two light-blocking blocks is sufficient to allow X-rays of the required spot size to pass through. The hardware component also includes a temperature sensor, which is configured to acquire the temperature signal of the surface of each light-blocking block and send it to a safety interlock system to trigger the light gate safety interlock function of the synchrotron radiation beamline when the temperature signal exceeds a set safety value. The high-speed shutter system also includes an experimental physics and industrial control system, which is configured to receive feedback signals from the hardware, including temperature signals from a temperature sensor and driving voltages from a galvanometer driver.

2. The high-speed shutter system for synchrotron X-rays according to claim 1, characterized in that, The driving voltage of the galvanometer driver reaches its maximum value when it receives the rising edge of the square wave signal of the trigger signal, and the driving voltage is 0 when it receives the falling edge of the square wave signal of the trigger signal, so that the driving voltage has both rising and falling edges.

3. The high-speed shutter system for synchrotron X-rays according to claim 2, characterized in that, When the driving voltage is 0V, the rotating shaft of the galvanometer motor is in its initial state, so that the light-blocking block is in the light path and is in a light-blocking state; when the driving voltage is the maximum value, the rotating shaft rotates to the maximum rotation angle, so that the light-blocking block leaves the light path and is in a light-transmitting state.

4. The high-speed shutter system for synchrotron X-rays according to claim 3, characterized in that, The maximum value of the driving voltage is a fixed value and corresponds to the maximum rotation angle of the galvanometer motor shaft. The maximum rotation angle of the shaft is equal to the acute angle of the light-blocking block of the parallelogram.

5. The high-speed shutter system for synchrotron X-rays according to claim 1, characterized in that, The light-blocking block is made of tungsten or tungsten carbide, and it is welded to the end face of the rotating shaft of the galvanometer motor.

6. The high-speed shutter system for synchrotron X-rays according to claim 1, characterized in that, The signal generator sends a first trigger signal and a second trigger signal to the first galvanometer deflection device and the second galvanometer deflection device, respectively. The square wave of the first trigger signal starts at time t1 and ends at time t2. The square wave of the second trigger signal starts at time t3 and ends at time t4. The value of t2-t3 is in the microsecond range.

7. The high-speed shutter system for synchrotron X-rays according to claim 6, characterized in that, The experimental physics and industrial control system is configured to issue control commands to the signal generator. The control commands include the start time t1 and end time t2 of the square wave of the first trigger signal, and the start time t3 and end time t4 of the square wave of the second trigger signal.

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