A multifunctional card control and abnormality interception method and system in a Demura process

Abstract

The present application relates to a kind of Demura process multifunctional card control and exception interception method and system, comprising the following steps: step S1: based on the R, G, B resolution of the display panel to be detected and SPR mapping relationship, generate positioning feature map and its gray scale chart, corresponding feature map is collected using industrial camera, the feature map includes multiple equidistant distribution ellipse area;Step S2: based on the feature map, extract first feature information, second feature information, third feature information, fourth feature information and fifth feature information;Step S3: based on above-mentioned feature information, obtain distortion correction coefficient, definition coefficient and gamma response coefficient and other evaluation indexes;Step S4: based on the evaluation index, according to the production specification of display panel, it is controlled and is intercepted with exception.Because the present application solves the problem that the process of Demura station slows down and the yield is low due to optical environment or screen itself display bad exceeds standard, provides a kind of efficient, accurate solution for display panel manufacturing process.

Description

Technical Field

[0001] This invention relates to the field of display panel technology, and in particular to a multi-functional card control and anomaly interception method and system in the Demura process. Background Technology

[0002] Display panels are key components widely used in electronic devices, such as liquid crystal displays (LCDs), organic light-emitting diode displays (OLEDs), and MicroLEDs. These display panels display images or video content by controlling the brightness and color of elliptical regions. However, during the manufacturing process of display panels, due to differences in production processes and materials, uneven display issues often occur, such as uneven brightness and color.

[0003] Uneven brightness refers to inconsistent brightness across different areas of a display panel. This can be caused by factors such as non-uniformity of the light source, distortion of optical components, and differences in electrical properties within elliptical regions. Uneven brightness leads to suboptimal display quality and negatively impacts user experience, especially in demanding display applications such as medical imaging and aerospace. Uneven colorimetry refers to significant color deviations across different areas of a display panel. This can be caused by factors such as inconsistent spectral responses across different elliptical regions of the display panel, differences in the quality of color filters, and non-linear characteristics of the display circuitry. Uneven colorimetry not only affects color reproduction but can also lead to color distortion and the appearance of color blocks.

[0004] To address the issue of uneven display, Demura technology is widely used in display panel manufacturing. Demura (also known as correction or calibration) is an image processing technique that acquires a grayscale sequence of images in a specific pattern and uses image processing algorithms to calibrate and compensate for each elliptical region, thereby eliminating uneven display and improving the quality of the display panel. During the Demura process, optical conditions or excessive display defects in the screen itself can easily affect the cycle time and yield of the Demura station. Summary of the Invention

[0005] Therefore, the technical problem to be solved by the present invention is to overcome the problems of abnormal interception such as distortion, sharpness, color and gamma of the display panel in the Demura process, and to provide a multi-functional card control and abnormal interception method in the Demura process.

[0006] To address the aforementioned technical problems, this invention provides a multi-functional card control and anomaly interception method in the Demura process, comprising the following steps:

[0007] Step S1: Based on the R, G, B resolution and SPR mapping relationship of the display panel to be tested, generate a positioning feature map and its grayscale map, and use an industrial camera to collect the corresponding feature map. The feature map contains multiple elliptical regions distributed at equal intervals.

[0008] Step S2: Record the feature map as the first feature information, process the feature map to obtain the coordinate information and relative brightness data of all pixels in the feature map; record the coordinate information of the elliptical regions in the camera coordinate system and the screen coordinate system as the second feature information; record the information of each elliptical region in the feature map as the third feature information; convert the relative brightness data into absolute brightness data and its current color coordinates, and record the calibrated color coordinate information as the fourth feature information; record the grayscale information of the grayscale map and the absolute brightness data as the fifth feature information.

[0009] Step S3: Obtain the distortion correction coefficient based on the second feature information; obtain the sharpness coefficient based on the third feature information; obtain the gamma response coefficient based on the fifth feature information;

[0010] Step S4: Based on at least one of the distortion correction coefficient, the sharpness coefficient, the fourth feature information, and the gamma response coefficient, control and intercept abnormalities of the display panel according to its production specifications.

[0011] In one embodiment of the present invention, the specific method for obtaining the coordinate information and relative brightness data of all pixels in the feature map is as follows:

[0012] Step S21: Binarize the feature map to obtain the ROI region and its elliptical region;

[0013] Step S22: Based on the edge information of the binarized image, perform bilinear interpolation to obtain the coordinate information and relative brightness data of all elliptical regions.

[0014] In one embodiment of the present invention, the method for obtaining the distortion correction coefficient is as follows:

[0015] Taking the image center in camera coordinates as the origin, the change in the coordinates of the elliptical region along its length direction, i.e., the change in distance from the origin, is considered radial distortion. The coordinates of the elliptical region after radial distortion are as follows:

[0016]

[0017] In the formula, (x distorted ,y distorted ) represents the normalized coordinates of the pixel after radial distortion, r represents the distance from the pixel to the origin of the coordinate system, and k1, k2, and k3 are the radial distortion coefficients;

[0018] The change in pixel coordinates along the tangent direction, i.e., the change in the horizontal angle, is considered tangential distortion. The coordinates of the elliptical region after tangential distortion are as follows:

[0019]

[0020] In the formula, (x distorted ,y distorted ) are the normalized coordinates of the pixel after tangential distortion, r represents the distance of the pixel from the origin of the coordinate system, and p1 and p2 are the tangential distortion coefficients;

[0021] Combining the formulas for radial and tangential distortion above, the distortion correction formula is obtained as follows:

[0022]

[0023] Using multiple elliptical coordinate information, curve fitting is performed on formula (3) to obtain radial distortion coefficients k1, k2 and k3 and tangential distortion coefficients p1 and p2.

[0024] In one embodiment of the present invention, the specific method for controlling based on the distortion coefficient is as follows: the Demura process is controlled based on the set radial and tangential distortion coefficient control thresholds.

[0025] In one embodiment of the present invention, the method for obtaining the sharpness coefficient is as follows: Each elliptical region is evaluated using a gray-level variance product function, that is, the two gray-level differences in each pixel neighborhood are multiplied together and then accumulated pixel by pixel. The formula for the gray-level variance product function is as follows:

[0026] D(f)=Σy∑x|f(x,y)-f(x+1,y)|×|f(x,y)-f(x,y+1)|(4)

[0027] In the formula, (x,y) represents the row and column coordinates of the elliptical region, f(x,y) is the gray value of the elliptical region at (x,y), and D(f) represents the focus state value of the elliptical region, i.e., the sharpness coefficient.

[0028] In one embodiment of the present invention, the specific method for controlling based on the sharpness coefficient is as follows: the sharpness coefficient of each elliptical region is calculated using formula (4) and normalized, the average gray value of each elliptical region is obtained and normalized again, and the normalized gray value is used as the threshold to control the Demura process.

[0029] In one embodiment of the present invention, the specific method for card control based on the fourth feature information is as follows:

[0030] Based on the relative brightness data, the color space of the feature map is converted from RGB space to XYZ space, and the coordinate information is as follows:

[0031]

[0032] The feature map is transformed from XYZ space to xyz space to obtain the x and y coordinates of each elliptical region under the relative brightness data, as follows:

[0033]

[0034] Based on the color coordinate information (x0, y0) of the center region of the screen, the relative color coordinate information of the i-th elliptical region is converted into absolute color coordinate information using the following formula:

[0035]

[0036] Where i is the elliptical region number in the feature map, (x i ,y i () represents the relative color coordinates of the i-th elliptical region after transformation, mean(•) is the mean function, (xabs) i yabs i () represents the absolute color coordinates of the i-th elliptical region after transformation;

[0037] The absolute color coordinate information of different elliptical regions is obtained using formula (7), the absolute color coordinate information is normalized, and control and interception are performed according to the set color coordinate threshold.

[0038] In one embodiment of the present invention, the formula for calculating the gamma response coefficient is as follows:

[0039]

[0040] Where lum represents absolute brightness data, lum max This represents the maximum brightness data, and gray represents the grayscale data. max This represents the maximum grayscale data.

[0041] In one embodiment of the present invention, the specific method for controlling the gamma response coefficient is as follows: the gamma response coefficient can be obtained by polynomial fitting, and the gamma response coefficient of the current product is controlled according to the product requirements.

[0042] Based on the same inventive concept, this invention also provides a multi-functional card control and anomaly interception system in the Demura process, comprising the following modules:

[0043] The feature map acquisition module is used to generate a positioning feature map and its grayscale map based on the R, G, B resolution and SPR mapping relationship of the display panel to be detected, and to acquire the corresponding feature map using an industrial camera. The feature map contains multiple elliptical regions that are equally spaced.

[0044] The feature information acquisition module is used to process the feature map, acquire the coordinate information and relative brightness data of all pixels in the feature map, record the feature map as the first feature information, record the coordinate information of the elliptical regions in the camera coordinate system and the screen coordinate system as the second feature information, record the information of each elliptical region in the feature map as the third feature information, convert the relative brightness data into absolute brightness data and its current color coordinates, and record the calibrated color coordinate information as the fourth feature information; and record the information of the grayscale image and the absolute brightness data as the fifth feature information.

[0045] The index calculation module is used to obtain the distortion correction coefficient based on the second feature information; to obtain the sharpness coefficient based on the third feature information; and to obtain the gamma response coefficient based on the fifth feature information.

[0046] The product detection module is used to control and intercept abnormalities of the display panel based on at least one of the distortion correction coefficient, the sharpness coefficient, the fourth feature information and the gamma response coefficient, according to the production requirements of the display panel.

[0047] The technical solution of the present invention has the following advantages compared with the prior art:

[0048] 1. It does not require hardware modification and has the advantage of low cost.

[0049] 2. It can effectively detect and intercept abnormal states such as distortion, focus, chroma, and gamma in the Demura process, thereby enhancing the Demura process's ability to intercept abnormalities.

[0050] 3. Improved image quality during display panel inspection and measurement, and increased the yield of Demura equipment systems. Attached Figure Description

[0051] To make the content of this invention easier to understand, the invention will be further described in detail below with reference to specific embodiments and accompanying drawings, wherein...

[0052] Figure 1 This is a flowchart illustrating the implementation of a multi-functional card control and anomaly interception method in a Demura process according to an embodiment of the present invention.

[0053] Figure 2 These are feature maps captured by an industrial camera in embodiments of the present invention;

[0054] Figure 3 This is an embodiment of the present invention. Figure 2 Image of the elliptical region;

[0055] Figure 4 These are elliptical region images at different resolutions in embodiments of the present invention;

[0056] Figure 5 This is the gamma response curve in an embodiment of the present invention. Detailed Implementation

[0057] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, so that those skilled in the art can better understand and implement the present invention. However, the embodiments described are not intended to limit the present invention.

[0058] Reference Figure 1 As shown, a multi-functional card control and anomaly interception method in the Demura process of the present invention includes the following steps:

[0059] Step S1: Based on the R, G, B resolution and SPR mapping relationship of the display panel to be detected, generate a positioning feature map and its grayscale map, and use an industrial camera to collect the corresponding feature map. The feature map contains multiple elliptical regions distributed at equal intervals.

[0060] Step S2: Record the feature map as the first feature information, process the feature map to obtain the coordinate information and relative brightness data of all pixels in the feature map; record the coordinate information of the elliptical regions in the camera coordinate system and the screen coordinate system as the second feature information; record the information of each elliptical region in the feature map as the third feature information; convert the relative brightness data into absolute brightness data and its current color coordinates, and record the calibrated color coordinate information as the fourth feature information; record the grayscale information of the grayscale map and the absolute brightness data as the fifth feature information.

[0061] Step S3: Obtain the distortion correction coefficient based on the second feature information; obtain the sharpness coefficient based on the third feature information; obtain the gamma response coefficient based on the fifth feature information;

[0062] Step S4: Based on at least one of the distortion correction coefficient, the sharpness coefficient, the fourth feature information, and the gamma response coefficient, control and intercept abnormalities according to the production requirements of the display panel.

[0063] Taking the G1647FP104 model as an example, based on the IC algorithm module requirements and its screen information such as R, G, B logic resolution, SPR mapping relationship, etc., corresponding feature maps are generated. Industrial cameras such as Vieworks 151M are used to acquire these feature maps. Figure 2As shown, the feature map contains a specific number of elliptical regions, such as N×M (N is the number of rows and M is the number of columns), distributed at equal intervals. The brightness of the elliptical regions increases sequentially from left to right. Each elliptical region is as follows: Figure 3 As shown.

[0064] The feature map is processed to obtain the coordinate information and relative brightness data of all pixels in the feature map. The specific method for obtaining the coordinate information and relative brightness data of all pixels in the feature map is as follows:

[0065] Step S21: Binarize the feature map to obtain the ROI region and its elliptical region;

[0066] Step S22: Based on the edge information of the binarized image, perform bilinear interpolation to obtain the coordinate information and relative brightness data of all pixels.

[0067] The coordinate information of the elliptical region in the original camera image is recorded as the elliptical region coordinate information in the camera coordinate system, and the coordinate information of the elliptical region in the positioning feature image is recorded as the elliptical region coordinate information in the screen coordinate system. The elliptical region coordinate information in the camera coordinate system and the screen coordinate system is recorded as the second feature information, and the distortion correction coefficient is calculated from the second feature information.

[0068] The method for calculating the distortion correction coefficient is as follows:

[0069] Taking the image center in camera coordinates as the origin, the change in pixel coordinates along the length direction, i.e., the change in distance from the origin, is considered radial distortion. The coordinates of the pixel after radial distortion are as follows:

[0070]

[0071] In the formula, (x distorted ,y distorted ) represents the normalized coordinates of the pixel after radial distortion, r represents the distance from the pixel to the origin of the coordinate system, and k1, k2, and k3 are the radial distortion coefficients;

[0072] The change in pixel coordinates along the tangent direction, i.e., the change in the horizontal angle, is considered tangential distortion. The coordinates of the pixel after tangential distortion are as follows:

[0073]

[0074] In the formula, (x distorted ,y distorted ) are the normalized coordinates of the pixel after tangential distortion, r represents the distance of the pixel from the origin of the coordinate system, and p1 and p2 are the tangential distortion coefficients;

[0075] Combining the formulas for radial and tangential distortion above, the distortion correction formula is obtained as follows:

[0076]

[0077] Using multiple elliptical coordinate information, curve fitting is performed on formula (3) to obtain radial distortion coefficients k1, k2 and k3 and tangential distortion coefficients p1 and p2.

[0078] The specific method for controlling distortion based on the aforementioned distortion coefficients is as follows: the Demura process is controlled based on set control thresholds for radial and tangential distortion coefficients. Specifically, standard control thresholds for radial and tangential distortion coefficients can be obtained in the laboratory under different optical environments such as different lenses. A reasonable range exceeding the standard control thresholds is considered an abnormal distortion state.

[0079] In this embodiment, the method for obtaining the sharpness coefficient is as follows: the sharpness of each elliptical region under the optical system is calculated using the gray-level variance product function, that is, the two gray-level differences in each pixel neighborhood are multiplied and then accumulated pixel by pixel. The formula for the gray-level variance product function is as follows: (4)

[0081] D(f)=Σy∑x|f(x,y)-f(x+1,y)|×|f(x,y)-f(x,y+1)|

[0082] In the formula, (x,y) represents the row and column coordinates of the elliptical region, f(x,y) is the gray value of the elliptical region at (x,y), and D(f) represents the focus state value of the elliptical region, i.e., the sharpness coefficient.

[0083] In this embodiment, the specific method for controlling the card based on the resolution coefficient is as follows: using the formula

[0084] (4) Calculate the sharpness coefficient of each elliptical region and normalize it. Calculate the average grayscale value of each elliptical region and normalize it again. Use the normalized grayscale value as a threshold to control the Demura process. Figure 4 These are elliptical regions at different resolutions.

[0085] In this embodiment, the specific method for card control based on the fourth feature information is as follows:

[0086] Based on the relative brightness data, the color space of the feature map is converted from RGB space to XYZ space, and the coordinate information is as follows:

[0087]

[0088] The feature map is transformed from XYZ space to xyz space to obtain the x and y coordinates of each elliptical region under the relative brightness data, as follows:

[0089]

[0090] Based on the color coordinate information (x0, y0) of the center region of the screen, the relative color coordinate information of the i-th elliptical region is converted into absolute color coordinate information using the following formula:

[0091]

[0092] Where i is the elliptical region number in the feature map, (x i ,y i () represents the relative color coordinates of the i-th elliptical region after transformation, mean(·) is the mean function, (xabs) i yabs i () represents the absolute color coordinates of the i-th elliptical region after transformation;

[0093] The absolute color coordinate information of different elliptical regions is obtained using formula (7), and the absolute color coordinate information is normalized. Control and interception are then performed based on the set color coordinate threshold. For example, in a test of a display screen, with the upper left corner of the image as the origin, N×M (N is the row, M is the column) elliptical regions are numbered, and the color coordinate data of six elliptical regions are shown in the table below:

[0094] 1 (0.30077，0.30077) (0.30143，0.30143) (0.30134，0.3013145) 10 (0.30064，0.30064) (0.30157，0.30157) (0.30127，0.30127) 20 (0.30124，0.30124) (0.30013，0.30013) (0.28979，0.29979)

[0095] The current color coordinates of the center of the screen are (0.3008, 0.309). From the data in the table above, we can see that the number is...

[0096] The elliptical region of (20, 20) exhibits color deviation exceeding specifications.

[0097] In this embodiment, the formula for calculating the gamma response coefficient is as follows:

[0098]

[0099] Where lum represents absolute brightness data, lum max This represents the maximum brightness data, and gray represents the grayscale data. max This represents the maximum grayscale data.

[0100] In this embodiment, the specific method for controlling the gamma response coefficient is as follows: the gamma response coefficient can be obtained through polynomial fitting, and the gamma response coefficient of the current product is controlled according to the product specifications. For example, when testing a display screen, the brightness data obtained is shown in the table below:

[0101]

[0102] To address this, control measures are implemented based on the aforementioned gamma fitting values. Abnormal gamma states exceeding the specified range are intercepted. The fitting curve is shown below. Figure 5 As shown.

[0103] Example 2

[0104] Based on the same inventive concept as Embodiment 1, the present invention also provides a multi-functional card control and anomaly interception system in the Demura process, comprising the following modules:

[0105] The feature map acquisition module is used to generate a positioning feature map and its grayscale map based on the R, G, B resolution and SPR mapping relationship of the display panel to be detected, and to acquire the corresponding feature map using an industrial camera. The feature map contains multiple elliptical regions that are equally spaced.

[0106] The feature information acquisition module is used to process the feature map, acquire the screen elliptical region coordinates and relative brightness data, record the feature map as the first feature information, record the elliptical region coordinate information in the camera coordinate system and the screen coordinate system as the second feature information, record the information of each elliptical region in the feature map as the third feature information, convert the relative brightness data into absolute brightness data and its current color coordinates, and record the calibrated color coordinate information as the fourth feature information; and record the grayscale image information and the absolute brightness data as the fifth feature information.

[0107] The index calculation module is used to obtain the distortion correction coefficient based on the second feature information; to obtain the sharpness coefficient based on the third feature information; and to obtain the gamma response coefficient based on the fifth feature information.

[0108] The product detection module is used to control and intercept abnormalities of the display panel based on at least one of the distortion correction coefficient, the sharpness coefficient, the fourth feature information and the gamma response coefficient, according to the production specifications of the display panel.

[0109] The multi-functional evaluation and control method and system for the Demura process described in this invention aims to solve the problem of the Demura process being affected by excessive optical environment or screen display defects, thus affecting the progress and yield of the Demura station and providing an efficient and accurate solution for the display panel manufacturing process.

[0110] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all possible implementations here. However, obvious variations or modifications derived therefrom are still within the scope of protection of this invention.

Claims

1. A multi-functional card control and anomaly interception method in a Demura process, characterized in that, Includes the following steps: Step S1: Based on the R, G, B resolution and SPR mapping relationship of the display panel to be tested, generate a positioning feature map and its grayscale map, and use an industrial camera to collect the corresponding feature map. The feature map contains multiple elliptical regions distributed at equal intervals. Step S2: Record the feature map as the first feature information, process the feature map to obtain the coordinate information and relative brightness data of all pixels in the feature map; record the coordinate information of the elliptical region in the camera coordinate system and the screen coordinate system as the second feature information; Each elliptical region of the feature map is recorded as the third feature information; The relative brightness data is converted into absolute brightness data and its current color coordinates, and the calibrated color coordinate information is recorded as the fourth feature information; the grayscale information of the grayscale image and the absolute brightness data are recorded as the fifth feature information; Step S3: Obtain the distortion correction coefficient based on the second feature information; obtain the sharpness coefficient based on the third feature information; The gamma response coefficient is obtained based on the fifth feature information; Step S4: Based on at least one of the distortion correction coefficient, the sharpness coefficient, the fourth feature information, and the gamma response coefficient, control and intercept abnormalities according to the production requirements of the display panel; The method for obtaining the distortion correction coefficient is as follows: Taking the image center in camera coordinates as the origin, the change in pixel coordinates along the length direction, i.e., the change in distance from the origin, is considered radial distortion. The coordinates of the pixel after radial distortion are as follows: （1） In the formula, (x distorted , y distorted ) represents the normalized coordinates of the pixel after radial distortion, r represents the distance from the pixel to the origin of the coordinate system, and k1, k2, and k3 are the radial distortion coefficients; The change in pixel coordinates along the tangent direction, i.e., the change in the horizontal angle, is considered tangential distortion. The coordinates of the elliptical region after tangential distortion are as follows: （2） In the formula, (x distorted , y distorted ) are the normalized coordinates of the pixel after tangential distortion, r represents the distance of the pixel from the origin of the coordinate system, and p1 and p2 are the tangential distortion coefficients; Combining the formulas for radial and tangential distortion above, the distortion correction formula is obtained as follows: （3） Using multiple elliptical coordinate information, curve fitting is performed on formula (3) to obtain radial distortion coefficients k1, k2 and k3 and tangential distortion coefficients p1 and p2.

2. The multi-functional card control and anomaly interception method in the Demura process according to claim 1, characterized in that: The specific method for obtaining the coordinate information and relative brightness data of all pixels in the feature map is as follows: Step S21: Binarize the feature map to obtain the ROI region and its elliptical region; Step S22: Based on the edge information of the binarized image, perform bilinear interpolation to obtain the coordinate information and relative brightness data of all elliptical regions.

3. The multi-functional card control and anomaly interception method in the Demura process according to claim 1, characterized in that: The specific method for controlling based on the distortion coefficients is as follows: the Demura process is controlled based on the set control thresholds for radial and tangential distortion coefficients.

4. The multi-functional card control and anomaly interception method in the Demura process according to claim 1, characterized in that: The method for obtaining the sharpness coefficient is as follows: Each elliptical region is evaluated using a gray-level variance product function, that is, the two gray-level differences in each pixel neighborhood are multiplied together and then accumulated pixel by pixel. The formula for the gray-level variance product function is as follows: （4） In the formula, Represents the row and column coordinates of the elliptical region. In order to be in The grayscale value of the elliptical region at that location. This represents the focus status value of the elliptical region, i.e., the sharpness coefficient.

5. The multi-functional card control and anomaly interception method in the Demura process according to claim 4, characterized in that: The specific method for controlling based on the resolution coefficient is as follows: calculate the resolution coefficient of each elliptical region using formula (4), perform normalization processing, obtain the average gray value of each elliptical region and perform normalization processing again, and use the normalized gray value as the threshold to control the Demura process.

6. The multi-functional card control and anomaly interception method in the Demura process according to claim 1, characterized in that: The specific method for card control based on the fourth feature information is as follows: Based on the relative brightness data, the color space of the feature map is converted from RGB space to XYZ space, and the coordinate information is as follows: （5） The feature map is transformed from XYZ space to xyz space to obtain the x and y coordinates of each elliptical region under the relative brightness data, as follows: （6） Based on the color coordinate information of the center area of ​​the screen The relative color coordinates of the i-th elliptical region are converted into absolute color coordinates using the following formula: （7） Where i is the number of the elliptical region in the feature map. This represents the relative color coordinate information of the i-th elliptical region after transformation. It is a mean function. This represents the absolute color coordinates of the i-th elliptical region after transformation. The absolute color coordinate information of different elliptical regions is obtained by using formula (7), the absolute color coordinate information is normalized, and control and interception are performed according to the set color coordinate threshold.

7. The multi-functional card control and anomaly interception method in the Demura process according to claim 1, characterized in that: The formula for calculating the gamma response coefficient is as follows: （8） in, This represents absolute brightness data. This represents the maximum brightness data. Represents grayscale data. This represents the maximum grayscale data.

8. The multi-functional card control and anomaly interception method in the Demura process according to claim 7, characterized in that: The specific method for controlling the gamma response coefficient is as follows: the gamma response coefficient can be obtained through polynomial fitting, and the gamma response coefficient of the current product is controlled according to the product specifications.

9. A multi-functional card control and anomaly interception system in a Demura process, characterized in that, Includes the following modules: The feature map acquisition module is used to generate a positioning feature map and its grayscale map based on the R, G, B resolution and SPR mapping relationship of the display panel to be detected, and to acquire the corresponding feature map using an industrial camera. The feature map contains multiple elliptical regions that are equally spaced. The feature information acquisition module is used to process the feature map, acquire the screen elliptical region coordinates and relative brightness data, record the feature map as the first feature information, record the elliptical region coordinate information in the camera coordinate system and the screen coordinate system as the second feature information, record the information of each elliptical region in the feature map as the third feature information, convert the relative brightness data into absolute brightness data and its current color coordinates, and record the calibrated color coordinate information as the fourth feature information; and record the grayscale image information and the absolute brightness data as the fifth feature information. The index calculation module is used to obtain the distortion correction coefficient based on the second feature information and to obtain the sharpness coefficient based on the third feature information. The gamma response coefficient is obtained based on the fifth feature information; The product detection module is used to control and intercept abnormalities of the display panel based on at least one of the distortion correction coefficient, the sharpness coefficient, the fourth feature information, and the gamma response coefficient, according to the production requirements of the display panel. When obtaining the distortion correction coefficient, the following should be included: Taking the image center in camera coordinates as the origin, the change in pixel coordinates along the length direction, i.e., the change in distance from the origin, is considered radial distortion. The coordinates of the pixel after radial distortion are as follows: （1） In the formula, (x distorted , y distorted ) represents the normalized coordinates of the pixel after radial distortion, r represents the distance from the pixel to the origin of the coordinate system, and k1, k2, and k3 are the radial distortion coefficients; The change in pixel coordinates along the tangent direction, i.e., the change in the horizontal angle, is considered tangential distortion. The coordinates of the elliptical region after tangential distortion are as follows: （2） In the formula, (x distorted , y distorted ) are the normalized coordinates of the pixel after tangential distortion, r represents the distance of the pixel from the origin of the coordinate system, and p1 and p2 are the tangential distortion coefficients; Combining the formulas for radial and tangential distortion above, the distortion correction formula is obtained as follows: （3） Using multiple elliptical coordinate information, curve fitting is performed on formula (3) to obtain radial distortion coefficients k1, k2 and k3 and tangential distortion coefficients p1 and p2.

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