Time-of-flight mass spectrometer assembly with secondary flange

Abstract

A time-of-flight mass spectrometer assembly includes a flange having a vacuum chamber-facing surface and an environment-facing surface. The flange defines an opening extending between the vacuum chamber-facing surface and the environment-facing surface. A plurality of stacked components are supported by the vacuum chamber-facing surface of the flange. A secondary flange is removably secured within the opening of the flange. The secondary flange includes a vacuum chamber-facing surface and an environment-facing surface. Supported spectrometer components are supported by the vacuum chamber-facing surface of the secondary flange such that removal of the secondary flange from the flange serves to remove the supported components from the plurality of stacked components supported by the vacuum chamber-facing surface of the flange.

Description

[0001] Cross-references to related applications

[0002] This application claims the benefit and priority of U.S. Provisional Patent Application Serial No. 63 / 187,054, entitled “TIME-OF-FLIGHT MASS SPECTROMETER DETECTOR”, filed May 11, 2021, the entire contents of which are incorporated herein by reference. Technical Field

[0003] The aforementioned disclosure relates to an improved time-of-flight (TOF) mass spectrometer, and more specifically, to a more compact TOF mass spectrometer having at least one spectrometer component that can be easily removed and replaced using a secondary flange. Background Technology

[0004] Time-of-flight mass spectrometry (TOF-MS) is a mass spectrometry method that uses the time of flight of ions to determine their mass-to-charge ratio. TOF-MS uses a TOF mass spectrometer, which includes a detector, an ion source, and other components. The components of a TOF mass spectrometer are arranged along a main structure, with the detector surrounded by the other components. While the main structure provides fixed mounting points for the TOF mass spectrometer components, it results in a very long TOF mass spectrometer. Furthermore, components that may need to be removed and replaced, such as the detector, without disassembling most of the TOF mass spectrometer, are difficult to access. This disassembly takes time, resulting in significant downtime and increasing the chance of damage to other components during disassembly and reassembly.

[0005] These are some of the drawbacks of the current TOF mass spectrometers in use. Summary of the Invention

[0006] The disclosed TOF mass spectrometer assembly includes multiple components assembled on a main flange, which is coupled to a vacuum chamber. The main flange also defines an opening that receives a secondary flange, which supports at least one of the components of the TOF mass spectrometer. In this way, only the at least one supported component can be removed from the vacuum chamber without separating the main flange from the vacuum chamber and removing the entire TOF mass spectrometer assembly. This makes the removal and replacement of the at least one supported component easier and faster, resulting in less downtime for the TOF mass spectrometer assembly. It also allows the rest of the TOF mass spectrometer to remain protected within the vacuum chamber from contamination (e.g., dust) and accidental damage. Furthermore, the secondary flange allows for precise placement of the supported component relative to other components of the TOF mass spectrometer assembly remaining inside the vacuum chamber.

[0007] An embodiment for mounting a time-of-flight mass spectrometer assembly into a vacuum chamber includes a flange configured to be secured to an opening in the vacuum chamber. The flange includes a surface facing the vacuum chamber and a surface facing the environment. The flange also defines a cutout portion extending between the surface facing the vacuum chamber and the surface facing the environment. Multiple components are assembled to and supported by the surface facing the vacuum chamber of the flange and configured to be positioned within the vacuum chamber. A secondary flange is configured to be removably secured to the flange to close the cutout portion of the flange. The secondary flange includes a surface facing the vacuum chamber and a surface facing the environment. Supported components are coupled to the surface facing the vacuum chamber of the secondary flange. Therefore, removal of the secondary flange from the flange serves to remove the supported components from the vacuum chamber while maintaining the flange secured to the opening in the vacuum chamber.

[0008] In one embodiment, the supported component is a detector. In one embodiment, when the secondary flange is removably secured to the flange, the vacuum chamber-facing surface of the flange extends along a plane above the vacuum chamber-facing surface of the secondary flange to close a cut-out portion of the flange. In one embodiment, the secondary flange is secured to the flange using a plurality of fasteners positioned around the periphery of the secondary flange. In one embodiment, at least one of the plurality of components includes an ion source. In one embodiment, a seal is positioned between the flange and the secondary flange. In another embodiment, the seal is made of metal. In another embodiment, the secondary flange defines one or more through-connectors for connecting the supported component to a controller.

[0009] Another embodiment of the time-of-flight mass spectrometer includes a flange having a surface facing a vacuum chamber and a surface facing the environment. The flange defines an opening extending between the surface facing the vacuum chamber and the surface facing the environment. A plurality of stacked components are supported by the surface of the flange facing the vacuum chamber. A secondary flange is removably secured within the opening of the flange and includes both a surface facing the vacuum chamber and a surface facing the environment. The supported components are configured to be supported by the surface of the secondary flange facing the vacuum chamber, such that removal of the secondary flange from the flange is used to remove the supported components from the plurality of stacked components supported by the surface of the flange facing the vacuum chamber.

[0010] An embodiment of a method for manufacturing a time-of-flight mass spectrometer is provided. The method includes structuring a flange to include a surface facing a vacuum chamber and a surface facing an environment; defining an opening extending between the surface facing the vacuum chamber and the surface facing the environment; and supporting a plurality of stacked components on the surface of the flange facing the vacuum chamber. The method also includes structuring a secondary flange to include a surface facing the vacuum chamber and a surface facing the environment; and removably securing it to the flange to close the opening of the flange. The supported components are structured to be supported by the surface of the secondary flange facing the vacuum chamber, such that removal of the secondary flange from the flange is used to remove the supported components from the plurality of stacked components supported by the surface of the flange facing the vacuum chamber.

[0011] An embodiment of a flange for a time-of-flight mass spectrometer assembly includes a body configured to be coupled to a vacuum chamber. The body includes a surface facing the vacuum chamber and a surface facing the environment. An opening defined in the body extends between the surface facing the vacuum chamber and the surface facing the environment, defining an inner lip. A plurality of openings are positioned around the periphery of the body, each opening sized to receive fasteners to coupled the body to the vacuum chamber. A secondary flange is sized to be at least partially fitted within an opening in the body of the flange, and a seal is positioned between the secondary flange and the body of the flange. Attached Figure Description

[0012] The invention, which has been briefly summarized above, can be described in more detail with reference to the embodiments, some of which are illustrated in the accompanying drawings. However, it should be noted that the drawings illustrate only typical embodiments of the invention and should therefore not be considered as limiting its scope, as the invention can allow for other equivalent embodiments. Therefore, for a further understanding of the nature and purpose of the invention, reference can be made to the following detailed description, taken in conjunction with the accompanying drawings, wherein:

[0013] Figure 1 The illustration shows a perspective side view of an embodiment of components of a time-of-flight mass spectrometer assembly stacked on a flange;

[0014] Figure 2 The diagram illustrates a top view of the flange; and

[0015] Figure 3 schematically illustrated Figure 2 The embodiment is a cross-sectional view taken along line AA.

[0016] The accompanying diagrams are for illustrative purposes and are not necessarily drawn to scale. Detailed Implementation

[0017] The following discussion relates to various embodiments of a time-of-flight mass spectrometer assembly with a secondary flange. It will be understood that the versions described herein are examples embodying certain inventive concepts as detailed herein. Other variations and modifications will be apparent to those skilled in the art. Furthermore, certain terms are used throughout the discussion to provide a suitable frame of reference with respect to the accompanying drawings. These terms, such as “upstream,” “downstream,” “upper,” “lower,” “forward,” “backward,” “inner,” “outer,” “front,” “rear,” “top,” “bottom,” “inner,” “outer,” “first,” “second,” etc., are not intended to limit these concepts unless specifically indicated otherwise. The terms “approximately” or “about,” as used herein, may refer to a range of 80%–125% of the claimed or disclosed value. Regarding the accompanying drawings, they are intended to depict the prominent features of the time-of-flight mass spectrometer assembly with a secondary flange and are not provided specifically to scale.

[0018] refer to Figure 1 An embodiment of the TOF mass spectrometer assembly 100 is shown assembled on a flange 110 having a flange body 111. Specifically, multiple spectral components 120, 140, 150 are assembled on the vacuum chamber-facing surface 112 of the body 111 of the flange 110. The multiple spectral components 120, 140, 150 of the TOF mass spectrometer assembly 100 are stacked on the vacuum chamber-facing surface 112 of the flange 110, making the entire TOF mass spectrometer assembly 100 more compact and allowing it to be fully inserted into and removed from the vacuum chamber 50 as a single unit (see [link to documentation]). Figure 3 ).like Figure 1 As shown, one or more of the plurality of spectrometer components 120, 140, 150 can be interconnected and then connected to one or more supports 180, which in turn are connected to the body 111 of the flange 110. In the illustrated example, components 150 and 120 are connected to component 140, which in turn is attached to the flange 110 via the support 180. In this way, a structurally stable and compact TOF mass spectrometer assembly 100 can be constructed. Spectrometer components 120, 130, 140, 150 are generally known in the art and will not be described in detail individually, nor will the overall operation of the disclosed TOF mass spectrometer assembly 100 be discussed in detail. In one embodiment, the plurality of spectrometer components may include an ion source 120, transfer optics, a grid, an accelerating electrode and a drift tube (each included as part of 140), and an ion mirror 150.

[0019] One or more connectors 160 are configured to connect a plurality of spectrometer components 120, 140, 150 to a through connector 170 in the body 111 of the flange 110. The through connector 170 extends between the vacuum chamber-facing surface 112 and the environment-facing surface 114 of the flange 110, such that one or more of the connectors 160 can be coupled to an external component 400 (see [link]). Figure 3 External component 400 may include a power supply, controller, or any other source or means for controlling corresponding components 120, 140, 150 of the TOF mass spectrometer assembly 100 via through-connector 170 (see [link to documentation]). Figure 2 and Figure 3 ).

[0020] Figure 2 The surface 112 of the body 111 of the flange 110 facing the vacuum chamber is shown. The flange 110 is coupled to the vacuum chamber 50 using a plurality of fasteners 119 positioned around the periphery of the body 111 of the flange 110. A plurality of through-connectors 170 are shown positioned inside or radially inward from the plurality of fasteners 119. Figure 2 As can be seen, the through-connector 170 can have different sizes depending on the type of connector. Another type of through-connector 172 is shown, which can be coupled to a controller and / or data collection device (not shown).

[0021] Go to Figure 3 The body 111 of flange 110 defines a cutout portion 117 or opening extending between a surface 112 facing the vacuum chamber and a surface 114 facing the environment. The cutout portion 117 is radially inwardly positioned from a plurality of fasteners 119 and configured to receive a secondary flange 200. Figure 2 The secondary flange 200 shown is polygonal in shape; however, this may not be the case in other embodiments of the secondary flange 200. Return to Reference Figure 3 The secondary flange 200 has a surface 212 facing the vacuum chamber and a surface 214 facing the environment. A lip 216 is defined around the periphery of the secondary flange 200 and is coupled to the flange 110 by a plurality of secondary flange fasteners 219, which are positioned through the lip 216 of the secondary flange 200.

[0022] Transfer to Figure 3The surface 212 of the secondary flange 200 facing the vacuum chamber is configured to support a component 130 of the TOF mass spectrometer assembly 100. In one embodiment, the supported component 130 is an ion detector; however, in other embodiments, the supported component may be another component of the TOF mass spectrometer assembly 100. The supported component 130 may be directly coupled to the secondary flange 200 using one or more connectors 220. The flange 110, the secondary flange 200, and the supported component 130 are configured such that the mounting of the secondary flange 200 positions the supported component 130 in proper proximity to the remainder of the plurality of spectrometer components for proper operation of the TOF mass spectrometer assembly 100. A seal 300 is positioned between the inner surface 118 of the flange 110 and the lip surface 218 of the secondary flange 200 (and around the plurality of secondary flange fasteners 219). The seal 300 can be any suitable material that forms an airtight seal between the inner surface 118 of the flange 110 and the lip surface 218 of the secondary flange 200 while being resistant to the harsh conditions and chemicals present in the vacuum chamber 50. In one embodiment, the seal 300 is made of metal, and more particularly of copper.

[0023] The secondary flange 200 allows the supported component 130 to be removed from the vacuum chamber 50, thus enabling its fixation or replacement without removing the flange 110 from the vacuum chamber 50. Once the supported component 130 is fixed or replaced, a new seal 300 is applied to the lip surface 218 (or the inner surface 118 of the flange 110), and the secondary flange 200 is reinstalled into the cutout portion 117 and secured to the flange 110 by a plurality of secondary flange fasteners 219. In this way, only the supported component 130 is removed from the vacuum chamber 50, without the need to detach the flange 110 from the vacuum chamber 50 and remove the entire TOF mass spectrometer assembly 100. This makes the removal and replacement of the supported component 130 easier and faster, resulting in less downtime for the TOF mass spectrometer assembly 100. It also allows the rest of the TOF mass spectrometer assembly 100 to remain protected within the chamber from contamination (e.g., dust) and accidental damage.

[0024] like Figure 3As shown, the vacuum chamber-facing surface 212 of the secondary flange 200 extends along plane P, and the vacuum chamber-facing surface 112 of the flange 110 extends along plane Q. As shown, plane P does not extend along plane Q, but in other embodiments, the vacuum chamber-facing surfaces 212 of the secondary flange 200 and 112 of the flange 110 extend along the same plane. In this way, supported components 130 of various sizes can be accommodated. In one embodiment, the secondary flange 200 may be manufactured to include the supported component 130, its connector 222 (if desired), and a corresponding feedthrough 221. In this embodiment, replacing the supported component 130 only requires removing the secondary flange 200 to which the supported component 130 is attached, and then replacing it with a different secondary flange 200 coupled to a different supported component. In each embodiment, a new seal 300 is installed before the secondary flange 200 is mounted onto the flange 110. Possibly, in some embodiments, the seal 300 is pre-installed on the lip surface 218 of the secondary flange 200 to further increase the ease and speed at which the supported component 130 can be removed from and replaced back into the TOF mass spectrometer 100 assembly.

[0025] In other embodiments, additional flanges may be included to enable the removal of other specific components of the TOF mass spectrometer assembly 100 and / or specific areas close to the TOF mass spectrometer assembly 100.

[0026] This invention includes combinations of aspects described herein. References to “embodiment”, etc., refer to features present in at least one aspect of the invention. Individual references to “embodiment” or “specific aspect”, etc., do not necessarily refer to the same one or more aspects; however, these aspects are not mutually exclusive unless so indicated or obvious to those skilled in the art. Unless otherwise expressly stated, the word “or” as used in this disclosure has a non-exclusive meaning.

[0027] The invention has been described in detail with particular reference to certain preferred aspects thereof, but it should be understood that variations, combinations and modifications may be made within the spirit and scope of the invention.

Claims

1. A time-of-flight mass spectrometer assembly for mounting in a vacuum chamber, the time-of-flight mass spectrometer assembly comprising: A flange configured to be fixed to an opening in the vacuum chamber, the flange including a body including a surface facing the vacuum chamber and a surface facing the environment, wherein the body further defines a cutout portion extending between the surface facing the vacuum chamber and the surface facing the environment; Multiple stacked spectrometer components, the multiple stacked spectrometer components being supported by the surface of the flange facing the vacuum chamber and configured to be positioned inside the vacuum chamber; Secondary flange, the secondary flange being configured to be removably secured within the cutout portion to close the cutout portion, wherein the secondary flange includes a surface facing the vacuum chamber and a surface facing the environment; as well as The supported component is configured to connect to the surface of the secondary flange facing the vacuum chamber. The removal of the secondary flange from the flange is used to remove the supported component from the vacuum chamber while keeping the flange fixed to the opening of the vacuum chamber.

2. The time-of-flight mass spectrometer assembly of claim 1, wherein the supported component is a detector.

3. The time-of-flight mass spectrometer assembly according to claim 1, wherein the supported component is an ion source.

4. The time-of-flight mass spectrometer assembly of claim 1, wherein the vacuum chamber-facing surface of the secondary flange extends along a first plane, and the vacuum chamber-facing surface of the secondary flange extends along a second plane, wherein the first plane is different from the second plane when the secondary flange is attached to the body of the flange.

5. The time-of-flight mass spectrometer assembly according to claim 1, wherein, The secondary flange is secured to the main flange using a plurality of fasteners positioned around the periphery of the secondary flange.

6. The time-of-flight mass spectrometer assembly of claim 1, wherein at least one of the plurality of stacked spectrometer components includes an ion source.

7. The time-of-flight mass spectrometer assembly according to claim 1, further comprising an airtight seal positioned between the flange and the secondary flange.

8. The time-of-flight mass spectrometer assembly of claim 7, wherein the hermetically sealed element is made of metal.

9. The time-of-flight mass spectrometer assembly of claim 1, wherein the secondary flange defines one or more through connectors to connect the supported component to the controller.

10. A time-of-flight mass spectrometer assembly, comprising: A flange, the flange including a vacuum chamber-facing surface configured to be positioned inside a vacuum chamber and an environment-facing surface configured to be positioned outside the vacuum chamber, wherein the flange defines an opening extending between the vacuum chamber-facing surface and the environment-facing surface; Multiple stacked components, the multiple stacked components being supported by the surface of the flange facing the vacuum chamber; Secondary flange, which removably secures the flange and is configured to block the opening, wherein the secondary flange includes a surface facing the vacuum chamber and a surface facing the environment; as well as The supported component is configured to be supported by the surface of the secondary flange facing the vacuum chamber. The removal of the secondary flange from the flange is used to remove the supported component from the vacuum chamber while keeping the flange fixed to the vacuum chamber.

11. The time-of-flight mass spectrometer assembly of claim 10, wherein the supported component is a detector.

12. The time-of-flight mass spectrometer assembly of claim 10, wherein the supported component is an ion source.

13. The time-of-flight mass spectrometer assembly of claim 10, wherein the vacuum chamber-facing surface of the secondary flange extends along a first plane, and the vacuum chamber-facing surface of the secondary flange extends along a second plane, wherein the first plane is different from the second plane when the secondary flange is removably secured within the opening of the secondary flange.

14. The time-of-flight mass spectrometer assembly according to claim 10, wherein, The secondary flange is secured to the main flange using a plurality of fasteners positioned around the periphery of the secondary flange.

15. The time-of-flight mass spectrometer assembly of claim 10, wherein at least one of the plurality of stacked components includes an ion source.

16. The time-of-flight mass spectrometer assembly of claim 10, further comprising a seal positioned between the flange and the secondary flange.

17. The time-of-flight mass spectrometer assembly of claim 16, wherein the seal is made of metal.

18. The time-of-flight mass spectrometer assembly of claim 10, wherein the secondary flange defines one or more through connectors configured to connect the supported component to an external component.

19. A method for manufacturing a time-of-flight mass spectrometer assembly, the method comprising: The flange structure is as follows: This includes a surface configured to be positioned inside the vacuum chamber and facing the vacuum chamber, and a surface configured to be positioned outside the vacuum chamber and facing the environment. A defined opening extends between the surface facing the vacuum chamber and the surface facing the environment. Multiple stacked components are supported on the surface of the flange facing the vacuum chamber; The secondary flange is structured as follows: This includes surfaces facing the vacuum chamber and surfaces facing the environment, and It can be removably fixed to the flange to block the opening; and The supported components are structured as follows: The secondary flange's surface facing the vacuum chamber is supported for proper access to the plurality of stacked components, and Remove from the vacuum chamber while keeping the flange fixed to the vacuum chamber.

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