An electronic product automatic test system and test method

Abstract

The application discloses an electronic product automatic test system and a test method, and relates to the technical field of electronic product testing. The system comprises a laboratory management system, an environmental box, an automatic test table and a test sequence generation module. The test sequence generation module is connected with the laboratory management system and the automatic test table respectively, and is used for automatically generating a test sequence from a test outline and sending the test sequence to the automatic test table. The automatic test table is connected with the environmental box and the laboratory management system respectively, and is used for controlling the environmental box while executing the test sequence, collecting temperature and humidity data of the environmental box to generate an environmental test curve, and finally automatically generating a test report. The application can realize automatic testing, automatic generation of a test report and high automation.

Description

Technical Field

[0001] This invention relates to the field of automated testing technology for electronic products, specifically to an automated testing system and method for electronic products. Background Technology

[0002] The test programs of existing automated test benches for electronic products need to be written manually, requiring testers to have a deep understanding of the hardware system and software architecture of the test bench, and requiring a lot of time to write and debug the programs; during environmental testing of electronic products, the environmental chamber needs to be manually controlled, and the test bench and the environmental chamber cannot achieve linkage control and data interaction; the format of the reports automatically generated by the test bench does not meet the requirements. Summary of the Invention

[0003] The technical problem to be solved by this invention is: in view of the problems existing in the prior art, this invention provides an automated testing system and testing method for electronic products that achieves automated testing, automated generation of test reports and has a high degree of automation.

[0004] To solve the above-mentioned technical problems, the technical solution proposed by this invention is as follows:

[0005] An automated testing system for electronic products includes a laboratory management system, an environmental chamber, an automated testing bench, and a test sequence generation module. The test sequence generation module is connected to both the laboratory management system and the automated testing bench, and is used to automatically generate test sequences from the test outline and send them to the automated testing bench. The automated testing bench is connected to both the environmental chamber and the laboratory management system, and is used to control the environmental chamber while executing the test sequences, collect temperature and humidity data of the environmental chamber to generate environmental test curves, and finally automatically generate a test report.

[0006] Preferably, the automated test bench communicates with the environmental chamber using the Modbus TCP / IP protocol. The automated test bench inputs the temperature and humidity setpoints and process time into the environmental chamber to complete the control of the environmental chamber, and records and uploads the temperature and humidity data of the environmental chamber in real time by calling the internal monitoring thread of the environmental chamber.

[0007] This invention also discloses a testing method based on the automated testing system for electronic products described above, comprising the following steps:

[0008] S1. The test sequence generation module automatically generates test sequences from the test outline;

[0009] S2. The automated test bench executes the test sequence and obtains a test report; while the automated test bench executes the test sequence, the environmental chamber is controlled and the temperature and humidity data of the environmental chamber are collected.

[0010] S3. Automatically generate test reports based on test reports, temperature and humidity data, and sample information.

[0011] Preferably, in step S1, the test outline is prepared in Excel format. The test outline includes one or more of the following: test items, test methods, test steps, test process description, signals to be applied, sample end signal points, signal parameters, signals to be measured, sample end signal points, signal parameters, and test criteria. The test items, test methods, test steps, and test process description in the test outline are inserted into the corresponding positions in the data report as supplementary explanations of the test process and test data. The signals to be applied and the signals to be measured in the test outline refer to the input signals to the test sample and the output signals of the test sample, respectively. The sample end signal points are used to generate the test wiring table, and the signal points will be matched with the signal channels of the test bench.

[0012] Preferably, in step S1, the process of automatically generating the test sequence is as follows:

[0013] S11. Test outline download: Obtain the storage location of the test outline from the laboratory management system and retrieve the test outline for local saving;

[0014] S12. Test Outline Analysis: Convert the information in each row of the Excel spreadsheet in the test outline file into a cluster, and convert the test outline into a cluster array.

[0015] S13, Generation of the test wiring diagram;

[0016] S14. Generation of the test outline.

[0017] Preferably, in step S12, the test outline is an Excel spreadsheet file, where each row of the Excel spreadsheet represents a test step. The information in each row is converted into a cluster, and the test outline is converted into a cluster array. The cluster array consists of test name, signal pin, applied signal description, measured signal description, and criterion information.

[0018] The key to parsing the test outline document is to extract all the necessary information according to the fixed format of the outline; each test step is divided into two parts: applied signal and measured signal, and each signal type has a strictly defined format and parsing method.

[0019] Each row in the table containing "signal to be applied, signal point at the sample end, signal parameters, signal to be measured, signal point at the sample end, signal parameters, and test criteria" is converted into a cluster, and the test outline is finally converted into a cluster array.

[0020] Preferably, in step S13, the specific process for generating the test wiring table is as follows:

[0021] The test wiring diagram includes the following: test steps, signals to be applied, sample end signal points, instruments and channels used, signals to be measured, sample end signal points, and instruments and channels used. The selection of instruments and channels is achieved by calling the configuration file "Instrument Channel List". The Instrument Channel List lists all instrument channels. All instrument channels are set to 0, indicating that all instrument channels are available. When an instrument channel is used, the used instrument channel is set to 1. The available instrument channels are confirmed by querying the values ​​of each instrument channel in the configuration file.

[0022] The signal connection table is a table file generated to facilitate testers in connecting samples to the test bench. It describes the connection pins required for all signals in each test step. The connection from the test bench to the adapter is automatically assigned by the program, while the connection from the adapter to the sample is already included in the test outline.

[0023] Automatic allocation of instrument channels is achieved by pre-associating different applied or measured signals with the corresponding instruments. A two-level list of all available channels on the test bench is established. During the process of allocating test steps for the test outline, channels that have been allocated and cannot be reused are recorded. When the number of channels required by a test step reaches the upper limit of an instrument's external channels, a channel allocation failure is indicated in the generated signal connection table.

[0024] Preferably, the specific process of step S14 is as follows:

[0025] S141, wherein the test sequence is generated by a sequence template according to the outline. The template pre-sets global variables used for flow control, dedicated threads that provide hardware reference handles for each step, and dedicated threads used for recording environment box data; these are located in the “Setup” and “Cleanup” sections of the sequence to distinguish them from the test steps in “Main”.

[0026] Generate a sequence based on the sequence file template, enable the automatic reference of TS.IEngine, configure the parameter values ​​of the LoadTypePaletteFilesEX method of IEngine, configure the GetSequenceFileEx method in IEngine, and assign the path of the sequence template to GetSequenceFileEx.

[0027] S142. Decompose the clusters generated by the test outline parsing into applied signal type + applied signal parameters, applied signal instrument channel + external channel, measurement signal type + measurement signal parameters, measurement signal instrument channel + external channel, and step criteria;

[0028] S143. Writing the shell function.

[0029] Each step in the test outline is a complete test unit, following a uniform pattern of "apply signal -> measure signal". Some steps do not apply or measure signals, and the corresponding signal descriptions can be considered "empty". The layer at which the test steps interface with the test sequence uses an encapsulation called a step shell, whose inputs and outputs include all the parameters and settings required for applying or measuring signals. By inputting different parameters, this function inserted into the test sequence can flexibly execute the functions of all steps in the outline.

[0030] S144: Step Basic Info is transferred to `creatstep_creatandinsert.vi` to generate a new step; Step Criterion - `NumericlimitTest` is transferred to `CreateStep_ConfigLimits.vi` to set the step criteria; Step Shell.vi path is transferred to `CreateStep_LinkAndReload.vi`; InputParameterInfo is transferred to `CreateStep_SetInputParas.vi` to configure input parameters; some steps require SequenceContext for execution, so `ThisContext` is added at the step generation point; StepTypes are transferred to `CreateStep_SetOutputPara(Single).vi`; All references are closed.

[0031] Preferably, in step S143, in order to adapt to the data types supported by the ActiveX operation functions of Teststand, the test configuration is transmitted by flattening the parameters into JSON strings and passing them into the step shell, and then parsing and restoring the parameters according to the signal type. The maximum parameter capacity of the step shell is the same as the single-step parameter limit of the test outline, but since the "parameter -> JSON string -> parameter" transmission form is adopted, there is no upper limit to the actual parameter transmission capacity.

[0032] Preferably, in step S3, after the test bench completes the test sequence, the test data is saved in the Teststand database. At this time, a blank template of the specified format of the test original record and report is called, and the sample information and test information obtained from the laboratory management system are filled into the template. The test process description and test criterion information are extracted according to the test outline, and then the test data is filled into the corresponding position in the template to realize the automatic generation of the specified original record and report.

[0033] Compared with the prior art, the advantages of the present invention are as follows:

[0034] This invention develops a test outline parsing program based on existing automated testing benches for electronic products, enabling the automatic generation of test outlines into test sequences. Simultaneously, it upgrades the environmental chamber to enable remote control, allowing the testing bench to control the environmental chamber in real time and transmit real-time temperature and humidity data from the environmental chamber to the testing bench, thus automatically generating environmental temperature and humidity curves. Finally, it automatically generates original test records and test reports in a specified format based on templates and test data.

[0035] The testing system and method of this invention have the function of data interaction with a laboratory management system (LIMS). The LIMS system stores test-related data, including sample information, test item information, test outline, test original records and reports, etc., providing basic entry data for the testing system. The testing system can automatically generate test programs (sequences) according to the test outline and can automatically complete test tasks. The testing system can realize linkage control with the environmental chamber. The testing system can control the temperature and humidity of the environmental chamber in real time. The environmental chamber can upload the measured temperature and humidity data to the test bench and can strictly power on the sample on time according to the environmental test profile and complete the performance test. The testing system can automatically generate test original records and reports in a specified format based on the sample information and test information obtained from the LIMS system, the test process description and test criteria in the test outline, and the test data. Attached Figure Description

[0036] Figure 1 This is a block diagram of the testing system of the present invention in an embodiment. Detailed Implementation

[0037] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0038] like Figure 1 As shown, this embodiment of the invention provides an automated testing system for electronic products, including a laboratory management system, an environmental chamber, an automated testing platform, and a test sequence generation module. The test sequence generation module is connected to both the laboratory management system and the automated testing platform, and is used to automatically generate test sequences from the test outline and send them to the automated testing platform. The automated testing platform is connected to both the environmental chamber and the laboratory management system, and is used to control the environmental chamber while executing the test sequence, and to collect temperature and humidity data of the environmental chamber to generate environmental test curves, and finally automatically generate a test report. Both the testing platform and the environmental chamber are connected to the laboratory management system (LIMS) and can interact with each other. The testing platform reads sample information and test information from the LIMS and uploads the original records and test reports to the LIMS.

[0039] In one specific embodiment, the automated test bench communicates with the environmental chamber using the Modbus TCP / IP protocol. The automated test bench inputs the temperature and humidity setpoints and process time into the environmental chamber to complete the control of the environmental chamber, and records and uploads the temperature and humidity data of the environmental chamber in real time by calling the internal monitoring thread of the environmental chamber.

[0040] This invention develops a test outline parsing program based on existing automated testing benches for electronic products, enabling the automatic generation of test outlines into test sequences. Simultaneously, it upgrades the environmental chamber to enable remote control, allowing the testing bench to control the environmental chamber in real time and transmit real-time temperature and humidity data from the environmental chamber to the testing bench, thus automatically generating environmental temperature and humidity curves. Finally, it automatically generates original test records and test reports in a specified format based on templates and test data.

[0041] like Figure 1 As shown, this embodiment of the invention also discloses a testing method based on the above-described automated testing system for electronic products, including the following steps:

[0042] S1. The test sequence generation module automatically generates test sequences from the test outline.

[0043] S2. The automated test bench executes the test sequence and obtains the test report; while the automated test bench executes the test sequence, the environmental chamber is controlled and the temperature and humidity data of the environmental chamber are collected.

[0044] S3. Automatically generate test reports based on test reports, temperature and humidity data, and sample information.

[0045] The test outline is written in Excel format and includes one or more of the following: test items, test methods, test steps, test process description, signals to be applied, signal points at the sample end (applied signals), signal parameters (applied signals), signals to be measured (measured signals), signal points at the sample end (applied signals), signal parameters (measured signals), and test criteria.

[0046] The test items, test methods, test steps, and test process descriptions in the test outline can be inserted into the corresponding positions in the data report as supplementary explanations of the test process and test data;

[0047] The signals to be applied and the signals to be measured in the outline refer to the signals input to the test sample and the signals output by the test sample, respectively. They are selected using a drop-down list, which lists all the input signal types of the test sample. After the signal type is selected, the parameter name of the signal is automatically filled in, and you only need to enter the value in the parameter value column.

[0048] The signal points at the sample end can be used to generate a test wiring diagram, and the signal points will be matched with the signal channels of the test bench.

[0049] Once the experimental outline is edited, it should be uploaded to the laboratory management system (Lims system).

[0050] In one specific embodiment, the specific process of generating the test sequence in step S1 is as follows:

[0051] Step 1: Download the outline

[0052] The system obtains the storage location of the outline file from the Lims system interface, then accesses the FTP server to retrieve the outline file and save it locally. Through the Lims database interface, the path to the test outline file belonging to the project can be obtained from the application number; subsequently, the system logs into the FTP server using its username and password, retrieves the file, and saves it locally.

[0053] Step Two: Outline Analysis

[0054] The outline file is an Excel spreadsheet. The process involves opening the spreadsheet, extracting cell data, reconstructing the data, and creating a cluster array. Each row in the spreadsheet represents a test step. The information in each row is converted into a cluster, resulting in a cluster array for the test outline. This array consists of information such as the test name, signal pins, applied signal description, measured signal description, and criteria. The key to parsing the test outline file is extracting all necessary information according to its fixed format. Each test step can be divided into applied and measured signals. The types of applied / measured signals are enumerable, and each signal type has a strictly defined format and parsing method. This constraint ensures the accurate transmission of test instructions.

[0055] Convert each row in the table, including "signal to be applied, sample end signal point (applied signal), signal parameter (applied signal), signal to be measured (measured signal), sample end signal point (applied signal), signal parameter (measured signal), and test criterion," into a cluster, and convert the test outline into a cluster array.

[0056] Step 3: Generating the test wiring diagram

[0057] The test wiring diagram includes the following: test steps, signals to be applied, signal points at the sample end (applied signals), instruments and channels used (applied signals), signals to be measured (measured signals), signal points at the sample end (measured signals), and instruments and channels used (measured signals).

[0058] The selection of instruments and channels is achieved by calling the configuration file "Instrument Channel List". The Instrument Channel List lists all instrument channels. All instrument channels are set to 0, indicating that all instrument channels are available. When an instrument channel is used, the instrument channel to be used is set to 1. The program confirms the available instrument channels by querying the values ​​of each instrument channel in the configuration file.

[0059] The signal connection table is a table file generated to facilitate testers in connecting samples to the test bench. It describes the required connection pins for all signals (excluding network signals) in each test step. The connection from the test bench to the adapter is automatically assigned by the program, while the connection from the adapter to the sample is already specified in the test outline. The generated signal connection table is named using the time string at the time of generation to avoid confusion.

[0060] Automatic channel allocation is achieved by pre-associating different applied / measured signals with corresponding instruments. For example, speed signal testing requires multiple square wave pulse signals before parameter acquisition. Therefore, when allocating channels, the FPGA output channel used to generate the square wave pulses and the IT6302 power supply used to pull up the voltage need to be considered. The program has a built-in list of all available channels on the test bench in a two-level structure. During the process of allocating test steps for the test outline, channels that have been allocated but cannot be reused are recorded. When the number of channels required by a test step reaches the upper limit of an instrument's external channels, the program will record this situation and indicate in the generated signal connection table that the channel allocation failed, and the test cannot be executed correctly.

[0061] Step 4: Generate test sequences

[0062] 1) The test sequence is generated by a sequence template according to the outline. The template pre-sets global variables used for flow control, dedicated threads that provide hardware reference handles for each step, and dedicated threads used for recording environment box data. These are located in the "Setup" and "Cleanup" sections of the sequence to distinguish them from the test steps in "Main".

[0063] Generate a sequence based on the sequence file template, enable the auto-reference of TS.IEngine, configure the parameter values ​​of the LoadTypePaletteFilesEX method in IEngine, configure the GetSequenceFileEx method in IEngine, and assign the path of the sequence template to GetSequenceFileEx.

[0064] 2) The clusters generated by the outline parsing are split into applied signal type + applied signal parameters, applied signal instrument channel + external channel, measurement signal type + measurement signal parameters, measurement signal instrument channel + external channel, and step criteria. Since TESTSTAND has few input parameters, the content in the outline parsing clusters is converted into JSON strings for transmission.

[0065] 3) Writing the shell function.

[0066] Each step in the test outline is a complete test unit, following a uniform pattern of "apply signal -> measure signal". Steps without applied or measured signals can be considered as having "empty" signal descriptions. The program for automatically generating sequences has high requirements for the encapsulation and consistency of instrument drivers and test function functions. Therefore, at the level where test steps and test sequences intersect, a wrapper called a "step shell" is used. Its inputs and outputs include all parameters and settings required for applying / measuring signals. By inputting different parameters, this function, inserted into the test sequence, can flexibly execute the functions of all steps in the outline.

[0067] To accommodate the data types supported by Teststand's ActiveX operation functions, the test configuration is transmitted by flattening the parameters into JSON strings and passing them into the step shell, and then parsing and restoring the parameters according to the signal type.

[0068] The maximum parameter capacity of the step shell is the same as the single-step parameter limit of the test outline, but because it adopts the "parameter -> JSON string -> parameter" passing format, the actual parameter passing capability can be said to have no upper limit.

[0069] 4) The Step Basic Info is transferred to `creatstep_creatandinsert.vi` to generate a new step. The step criteria - `NumericlimitTest` - is transferred to `CreateStep_ConfigLimits.vi` to set the step criteria. The path to the step shell.vi is transferred to `CreateStep_LinkAndReload.vi`. InputParameterInfo is transferred to `CreateStep_SetInputParas.vi` to configure input parameters. Some steps require a SequenceContext; `ThisContext` is added at the step generation point. Steptypes are transferred to `CreateStep_SetOutputPara(Single).vi`. All references are closed.

[0070] In one specific embodiment, the automatic testing process in step S2 is as follows: the automatically generated test sequence is loaded into the Teststand, the instruments and equipment on the test stand are invoked, and environmental chamber control and sample testing are completed simultaneously. The test stand communicates with the environmental chamber using the Modbus TCP / IP protocol. By inputting temperature and humidity setpoints and process time, the environmental chamber can be controlled. Simultaneously, the environmental chamber temperature and humidity data are recorded and uploaded in real time by invoking the environmental chamber monitoring thread.

[0071] In one specific embodiment, in step S3, after the test bench completes the test sequence, the test data is saved in the Teststand database. At this time, a blank template of the specified format test original record and report is called, and the sample information and test information obtained from the LIMS system are filled into the template. The test process description and test criteria are extracted according to the test outline, and then the test data is filled into the corresponding position in the template to realize the automatic generation of the specified original record and report.

[0072] The testing system and method of this invention have the function of data interaction with a laboratory management system (LIMS). The LIMS system stores test-related data, including sample information, test item information, test outline, test original records and reports, etc., providing basic entry data for the testing system. The testing system can automatically generate test programs (sequences) according to the test outline and can automatically complete test tasks. The testing system can realize linkage control with the environmental chamber. The testing system can control the temperature and humidity of the environmental chamber in real time. The environmental chamber can upload the measured temperature and humidity data to the test bench and can strictly power on the sample on time according to the environmental test profile and complete the performance test. The testing system can automatically generate test original records and reports in a specified format based on the sample information and test information obtained from the LIMS system, the test process description and test criteria in the test outline, and the test data.

[0073] The above are merely preferred embodiments of the present invention. The scope of protection of the present invention is not limited to the above embodiments. All technical solutions falling within the scope of the present invention's concept are within the scope of protection of the present invention. It should be noted that for those skilled in the art, any improvements and modifications made without departing from the principles of the present invention should be considered within the scope of protection of the present invention.

Claims

1. A testing method based on an automated testing system for electronic products, characterized in that, The automated testing system for electronic products includes a laboratory management system, an environmental chamber, an automated testing bench, and a test sequence generation module. The test sequence generation module is connected to both the laboratory management system and the automated testing bench, and is used to automatically generate test sequences from the test outline and send them to the automated testing bench. The automated testing bench is connected to both the environmental chamber and the laboratory management system, and is used to control the environmental chamber while executing the test sequences, and to collect temperature and humidity data from the environmental chamber to generate environmental test curves. Finally, it automatically generates a test report. The testing method includes the following steps: S1. The test sequence generation module automatically generates test sequences from the test outline; S2. The automated test bench executes the test sequence and generates a test report; While the automated test bench executes the test sequence, the environmental chamber is controlled and its temperature and humidity data are collected. S3. Automatically generate test reports based on test reports, temperature and humidity data, and sample information; In step S1, the test outline is prepared in Excel format. The test outline includes one or more of the following: test items, test methods, test steps, test process description, signals to be applied, sample end signal points, signal parameters, signals to be measured, sample end signal points, signal parameters, and test criteria. The test items, test methods, test steps, and test process descriptions in the test outline are inserted into the corresponding positions in the data report as supplementary explanations of the test process and test data. The signals to be applied and the signals to be measured in the test outline refer to the input signals to the test sample and the output signals of the test sample, respectively. The sample end signal points are used to generate the test wiring table, and the signal points will be matched with the signal channels of the test bench. In step S1, the process of automatically generating the test sequence is as follows: S11. Test outline download: Obtain the storage location of the test outline from the laboratory management system and retrieve the test outline for local saving; S12. Test Outline Analysis: Convert the information in each row of the Excel spreadsheet in the test outline file into a cluster, and convert the test outline into a cluster array. S13. Generation of the test wiring table; The test wiring table is generated based on the cluster array; The test wiring table includes the following contents: test steps, signals to be applied, signal points at the sample end, instruments and channels used, signals to be measured, signal points at the sample end, instruments and channels used; S14. Generation of the test outline; generating the test outline based on the cluster array; the test outline is used to generate the test sequence; In step S12, the test outline is an Excel spreadsheet file. Each row of the Excel spreadsheet represents a test step. The information in each row is converted into a cluster, and the test outline is converted into a cluster array. The cluster array consists of test name, signal pin, applied signal description, measured signal description, and criterion information. The key to parsing the test outline document is to extract all the necessary information according to the fixed format of the outline; each test step is divided into two parts: applied signal and measured signal, and each signal type has a strictly defined format and parsing method. Each row in the table containing "signal to be applied, signal point at the sample end, signal parameters, signal to be measured, signal point at the sample end, signal parameters, and test criteria" is converted into a cluster, and the test outline is ultimately converted into a cluster array.

2. The test method according to claim 1, characterized in that, In step S13, the specific process of generating the test wiring table is as follows: The selection of instruments and channels is achieved by calling the configuration file "Instrument Channel List". The Instrument Channel List lists all instrument channels. All instrument channels are assigned a value of 0, indicating that all instrument channels are available. When an instrument channel is used, the instrument channel to be used is assigned a value of 1. The available instrument channels are confirmed by querying the values ​​of each instrument channel in the configuration file. The signal connection table is a table file generated to facilitate testers in connecting samples to the test bench. It describes the connection pins required for all signals in each test step. The connection from the test bench to the adapter is automatically assigned by the program, while the connection from the adapter to the sample is already included in the test outline. Automatic allocation of instrument channels is achieved by pre-associating different applied or measured signals with the corresponding instruments. A two-level list of all available channels on the test bench is established. During the process of allocating test steps for the test outline, channels that have been allocated and cannot be reused are recorded. When the number of channels required by a test step reaches the upper limit of an instrument's external channels, a channel allocation failure is indicated in the generated signal connection table.

3. The test method according to claim 2, characterized in that, The specific process of step S14 is as follows: S141, wherein the test sequence is generated by a sequence template according to the outline. The template pre-sets global variables used for flow control, dedicated threads that provide hardware reference handles for each step, and dedicated threads used for recording environment box data; these are located in the "Setup" and "Cleanup" parts of the sequence to distinguish them from the test steps in "Main". Generate a sequence based on the sequence file template, enable the automatic reference of TS.IEngine, configure the parameter values ​​of the LoadTypePaletteFilesEX method of IEngine, configure the GetSequenceFileEx method in IEngine, and assign the path of the sequence template to GetSequenceFileEx. S142. Decompose the clusters generated by the test outline parsing into applied signal type + applied signal parameters, applied signal instrument channel + external channel, measurement signal type + measurement signal parameters, measurement signal instrument channel + external channel, and step criteria; S143, Writing the shell function; Each step in the test outline is a complete test unit, following a uniform pattern of "apply signal -> measure signal". If a step does not apply a signal or measure a signal, the corresponding signal description is considered "empty". The layer at which the test steps interface with the test sequence uses an encapsulation called a step shell. Its inputs and outputs include all the parameters and settings required for applying or measuring signals. By inputting different parameters, this function inserted into the test sequence can flexibly execute the functions of all steps in the outline. S144: Step Basic Info is transferred to `creatstep_creatandinsert.vi` to generate a new step; Step Criterion - `NumericlimitTest` is transferred to `CreateStep_ConfigLimits.vi` to set the step criteria; Step Shell.vi path is transferred to `CreateStep_LinkAndReload.vi`; InputParameterInfo is transferred to `CreateStep_SetInputParas.vi` to configure input parameters; some steps require SequenceContext for execution, so `ThisContext` is added at the step generation point; StepTypes are transferred to `CreateStep_SetOutputPara(Single).vi`; All references are closed.

4. The test method according to claim 3, characterized in that, In step S143, in order to adapt to the data types supported by the ActiveX operation functions of Teststand, the parameters are flattened into JSON strings and passed into the step shell, and then the parameters are parsed and restored according to the signal type to transmit the test configuration; the maximum parameter capacity of the step shell is the same as the upper limit of the single-step parameters of the test outline.

5. The test method according to any one of claims 1 to 4, characterized in that, In step S3, after the test bench completes the test sequence, the test data is saved in the Teststand database. At this time, a blank template of the specified format test original record and report is called, and the sample information and test information obtained from the laboratory management system are filled into the template. The test process description and test criterion information are extracted according to the test outline, and then the test data is filled into the corresponding position in the template to realize the automatic generation of the specified original record and report.

6. The test method according to any one of claims 1 to 4, characterized in that, The automated test bench communicates with the environmental chamber using the Modbus TCP / IP protocol. The automated test bench inputs the temperature and humidity setpoints and process time into the environmental chamber to complete the control of the environmental chamber, and records and uploads the temperature and humidity data of the environmental chamber in real time by calling the internal monitoring thread of the environmental chamber.

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