Low temperature test system and low temperature test method

Abstract

The application provides a low-temperature test system and a low-temperature test method, and relates to the technical field of low-temperature test. The low-temperature test system comprises a first box, a second box, a movable part and a refrigerator. The first box and the second box are adjacent and a sealing door is arranged between the first box and the second box. The sealing door can be opened or closed to connect or separate the first box and the second box. The refrigerator is at least partially arranged in the first box. The movable part is movably arranged in the second box. An end of the movable part is used for mounting a sample. In the case that the sealing door is opened, the end of the movable part can enter the first box. The low-temperature test system and the low-temperature test method provided by the application can always maintain the vacuum state and the low-temperature state in the first box by closing the sealing door. The refrigerator does not need to be stopped. The process of rewarming and recooling of the low-temperature test system is omitted. The test efficiency of the low-temperature test system is improved.

Description

Technical Field

[0001] This invention relates to the field of low-temperature testing technology, and in particular to a low-temperature testing system and a low-temperature testing method. Background Technology

[0002] With the development of science and technology, scientific research work such as superconductivity testing, low-temperature material testing, and low-temperature thermometer calibration cannot be separated from the low-temperature testing environment.

[0003] Low-temperature testing systems are devices used to provide low-temperature testing environments. Among them, low-temperature testing systems based on refrigeration units are widely used because they can work continuously as long as they are powered on, have a wide operating temperature range, are simple and convenient to operate, and can be operated unattended.

[0004] However, the cooling and rewarming time of the cryogenic testing system based on the refrigeration unit is too long. After the test of a sample is completed, the refrigeration unit needs to be turned off for several hours to rewarm before the sample can be disassembled or replaced. Then the refrigeration unit needs to be turned on again for several hours to cool down. When testing multiple samples, the refrigeration unit needs to be repeatedly cooled down and rewarmed, which greatly reduces the efficiency of the cryogenic test and is not conducive to the development of cryogenic testing work. Summary of the Invention

[0005] This invention provides a low-temperature testing system and a low-temperature testing method to solve the technical problem that the existing low-temperature testing systems require repeated cooling and reheating, resulting in low testing efficiency.

[0006] In a first aspect, the present invention provides a low-temperature testing system, comprising a first chamber, a second chamber, movable parts, and a refrigeration unit;

[0007] The first box and the second box are adjacent to each other and a sealed door is provided between them. The sealed door can be opened or closed to connect or separate the first box and the second box.

[0008] The refrigeration unit is at least partially disposed within the first chamber, and the movable component is movably inserted into the second chamber. The end of the movable component is used to install a sample, and when the sealed door is open, the end of the movable component can enter the first chamber.

[0009] According to a low-temperature testing system provided by the present invention, the low-temperature testing system further includes a low-temperature platform, which is installed at one end of the refrigerator and has thermal contact with the refrigerator.

[0010] According to a low-temperature testing system provided by the present invention, the low-temperature testing system further includes a heat-conducting component disposed at the end of the movable component, the heat-conducting component being used for thermal contact with the sample and the low-temperature platform.

[0011] According to a low-temperature testing system provided by the present invention, the heat-conducting component has a first heat-conducting surface, the low-temperature platform has a second heat-conducting surface, and the shapes of the first heat-conducting surface and the second heat-conducting surface are adapted to each other so that the heat-conducting component and the refrigeration platform are in close contact through the first heat-conducting surface and the second heat-conducting surface.

[0012] According to a low-temperature testing system provided by the present invention, the low-temperature testing system further includes a cold screen, the cold screen is disposed in the first chamber and connected to the refrigeration unit, and the low-temperature platform is located in the space enclosed by the cold screen.

[0013] According to a low-temperature testing system provided by the present invention, the low-temperature testing system further includes a sealing element, the second housing has an opening, the sealing element is detachably installed at the opening, and the movable element is movably inserted into the sealing element.

[0014] According to a low-temperature testing system provided by the present invention, the movable component is a hollow structure, and the interior of the movable component is used to accommodate functional elements or wires.

[0015] In a second aspect, the present invention provides a low-temperature testing method, based on the low-temperature testing system described in the first aspect, comprising:

[0016] The end of the movable part with the sample installed is placed in the first chamber for low-temperature testing, wherein the sealing door is in the open state, and the inside of the first chamber and the inside of the second chamber are in a vacuum state.

[0017] After the low-temperature test is completed, the end of the movable part is moved into the second chamber;

[0018] Close the sealed door, break the vacuum in the second chamber, and remove the movable part from inside the second chamber to disassemble or replace the sample.

[0019] According to a low-temperature testing method provided by the present invention, before placing the end of the movable part on which the sample is mounted into the first chamber, the method further includes:

[0020] Close the sealing door and evacuate the inside of the first chamber. Once the vacuum level inside the first chamber reaches the preset vacuum level, turn on the refrigeration unit to bring the temperature inside the first chamber to the preset temperature.

[0021] The sample is installed to the end of the movable part, and the end of the movable part is placed inside the second housing;

[0022] The interior of the second chamber is evacuated. Once the vacuum level inside the second chamber reaches the preset vacuum level, the sealing door is opened.

[0023] According to a low-temperature testing method provided by the present invention, the low-temperature testing system includes a sealing element, a second housing having an opening, the sealing element being detachably installed at the opening, and a movable element being movably inserted into the sealing element;

[0024] The step of installing the sample to the end of the movable part and placing the end of the movable part inside the second housing specifically includes:

[0025] Insert the movable part into the seal, install the sample onto the end of the movable part, place the end of the movable part inside the second housing through the opening, and lock the seal.

[0026] The low-temperature testing system and method provided by this invention, by setting a first chamber and a second chamber adjacent to each other with a sealed door between them, can achieve communication or separation between the first chamber and the second chamber by opening or closing the sealed door; by setting a movable part that can be movably inserted into the second chamber, the sample can be transferred to the second chamber after the test is completed, which is convenient for disassembly or replacement of the sample; by closing the sealed door, the vacuum state and low temperature state inside the first chamber can be maintained at all times, and the refrigeration unit does not need to be stopped, eliminating the long process of reheating and cooling in the low-temperature testing system, greatly improving the testing efficiency of the low-temperature testing system, and facilitating continuous and repeated low-temperature testing. Attached Figure Description

[0027] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0028] Figure 1 This is a schematic diagram of the low-temperature testing system provided by the present invention;

[0029] Figure 2 This is a schematic diagram of the low-temperature testing system provided by the present invention after the moving parts have been removed;

[0030] Figure 3 This is a schematic diagram of the low-temperature testing system provided by the present invention when the moving parts are located inside the second housing;

[0031] Figure 4 This is a schematic flowchart of the low-temperature testing method provided by the present invention;

[0032] Figure 5 This is a schematic flowchart of a low-temperature testing method provided in another embodiment of the present invention;

[0033] Figure 6 This is a flowchart of a low-temperature testing method provided in another embodiment of the present invention.

[0034] Figure label:

[0035] 1: First chamber; 11: First cavity; 12: Sealed door; 2: Second chamber; 21: Second cavity; 22: Opening; 3: Moving parts; 4: Refrigeration unit; 41: First-stage cold head; 42: Second-stage cold head; 5: Low-temperature platform; 6: Heat-conducting parts; 7: Cold shield; 8: Sealing parts; 100: Sample. Detailed Implementation

[0036] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0037] In the description of this invention, it should be understood that the terms "upper", "lower", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting this invention.

[0038] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0039] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0040] according to Figures 1 to 3 As shown, the low-temperature testing system provided by the present invention includes a first chamber 1, a second chamber 2, a moving part 3, and a refrigerator 4.

[0041] The first box 1 and the second box 2 are adjacent to each other and a sealing door 12 is provided between them. The sealing door 12 can be opened or closed to connect or separate the first box 1 and the second box 2.

[0042] The refrigeration unit 4 is at least partially disposed inside the first chamber 1, and the movable part 3 is movably inserted into the second chamber 2. The end of the movable part 3 is used to install the sample 100. When the sealing door 12 is open, the end of the movable part 3 can enter the first chamber 1.

[0043] The first housing 1 has a first cavity 11, the second housing 2 has a second cavity 21, and a sealing door 12 is disposed in the first housing 1 and the second housing 2 to realize the connection and separation of the first cavity 11 and the second cavity 21.

[0044] Preferably, the cryogenic testing system includes a first drive device and a control device connected by communication. The drive device is driven by the sealed door 12. The operator can send an open or close signal to the drive device through the control device. Upon receiving the open or close signal, the drive device accordingly drives the sealed door 12 to move, thus completing the opening or closing action of the sealed door 12, achieving automated control of the cryogenic testing system. It should be noted that any structure capable of opening or closing the sealed door is within the protection scope of this invention.

[0045] The refrigerator 4 is used to create a low-temperature environment for the sample 100. The refrigerator 4 includes a primary cold head 41 and a secondary cold head 42 connected together. The primary cold head 41 and the secondary cold head 42 are arranged along the height direction of the first housing 1, and the secondary cold head 42 is located near the interior of the first housing 1 relative to the primary cold head 41. For example Figure 1 As shown, the secondary cold head 42 is located below the primary cold head 41, and the refrigeration unit 4 is at least partially located inside the first housing 1.

[0046] The movable part 3 is inserted into the second box 2 in the form of a rod. The movable part 3 can move along its own axis, so that the sample 100 at the end of the movable part 3 can enter the first cavity 11 or the second cavity 21 to complete the transfer of the sample 100. Figure 1 This shows the state in which the sample 100 at the end of the movable part 3 is located in the first cavity 11. Figure 3 The image shows the sample 100 at the end of the movable part 3 located in the second cavity 21. Furthermore, as... Figure 2 As shown, the movable part 3 can be removed from the second cavity 21, which facilitates the installation or removal of the sample 100.

[0047] Optionally, the low-temperature testing system further includes a second drive device, which is connected to the movable part 3 via a transmission connection and is used to drive the movable part 3 to move. The second drive device is communicatively connected to the control device, and by receiving motion signals from the control device, it accordingly drives the movable part 3 to move along its own axial direction. It should be noted that any design capable of realizing the axial movement of the movable part 3 is within the protection scope of this invention.

[0048] In existing technologies, the process of conducting low-temperature testing using a cryogenic testing system based on a refrigerator includes: evacuating the low-temperature testing system; after the vacuum level of the low-temperature testing system reaches the testing requirements, turning on the refrigerator to cool it down; after the temperature of the low-temperature testing system reaches the testing requirements, conducting relevant tests on the sample; after the test is completed, turning off the refrigerator to allow for rewarming; to avoid excessive frost formation on the low-temperature testing system, after the temperature of the low-temperature testing system reaches room temperature, breaking the vacuum of the low-temperature testing system, disassembling the low-temperature testing system to replace the sample; and reassembling the low-temperature testing system to prepare for testing the next sample. During this process, both the cooling of the refrigerator and the rewarming of the low-temperature testing system take several hours, consuming a significant amount of time and hindering the rapid and continuous conduct of low-temperature testing.

[0049] The low-temperature testing system provided in this embodiment of the invention uses a first chamber 11 as the location for testing sample 100 at low temperatures. After the sample 100 is tested, it can be transferred to a second chamber 21. By closing the sealing door 12, the first chamber 11 and the second chamber 21 are separated, keeping the first chamber 11 in a vacuum and low-temperature state. Then, the vacuum in the second chamber 21 is broken, and sample 100 can be disassembled or replaced. During this process, the refrigerator 4 does not need to be repeatedly turned on and off, and the first chamber 11 does not need to be repeatedly cooled and reheated, saving a lot of time. Sample 100 can be disassembled or replaced without stopping the refrigerator 4, which is beneficial for quickly conducting the next low-temperature test and greatly improves the efficiency of low-temperature testing.

[0050] The low-temperature testing system provided by this invention, by setting a first chamber 1 and a second chamber 2 adjacent to each other and a sealed door 12 between them, can achieve communication or separation between the first chamber 1 and the second chamber 2 by opening or closing the sealed door 12. By setting a movable part 3 that can be movably inserted into the second chamber 2, the movable part 3 can be moved after the test to transfer the sample 100 to the second chamber 2, which is convenient for disassembly or replacement of the sample. By closing the sealed door 12, the vacuum state and low temperature state inside the first chamber 1 can be maintained at all times, and the refrigeration unit 4 does not need to be stopped, eliminating the long process of reheating and cooling of the low-temperature testing system, greatly improving the testing efficiency of the low-temperature testing system, and facilitating continuous and repeated low-temperature testing.

[0051] Furthermore, the low-temperature testing system also includes a low-temperature platform 5, which is installed at one end of the refrigerator 4 and has thermal contact with the refrigerator 4.

[0052] The low-temperature platform 5 is installed on the secondary cold head 42 of the refrigerator 4, and can conduct heat with the secondary cold head 42. The sample 100 can conduct heat with the low-temperature platform 5 through direct or indirect thermal contact, thereby reaching the test temperature.

[0053] Specifically, the low-temperature testing system also includes a heat-conducting component 6, which is disposed at the end of the movable component 3 and is used to make thermal contact with the sample 100 and the low-temperature platform 5.

[0054] The heat-conducting component 6 is used to transfer cold energy between the sample 100 and the cryogenic platform 5, enabling the sample 100 to quickly reach the test temperature. For example... Figure 1 As shown, sample 100 is mounted on one side of heat-conducting component 6 and has thermal contact with heat-conducting component 6.

[0055] Specifically, the heat-conducting component 6 has a first heat-conducting surface, and the low-temperature platform 5 has a second heat-conducting surface. The shapes of the first heat-conducting surface and the second heat-conducting surface are adapted to each other so that the heat-conducting component 6 and the refrigeration platform 0 are in close contact through the first heat-conducting surface and the second heat-conducting surface.

[0056] like Figure 1 or Figure 3 As shown, the heat-conducting component 6 is triangular in shape and has a first heat-conducting surface inclined relative to the horizontal plane, which helps to increase the contact area and contact force with the second heat-conducting surface and enhance the heat conduction effect. The inclination angle and shape of the second heat-conducting surface of the low-temperature platform 5 are adapted to the first heat-conducting surface. The heat-conducting component 6 and the low-temperature platform 5 can be closely attached through the first heat-conducting surface and the second heat-conducting surface to rapidly cool the sample 100.

[0057] The low-temperature testing system also includes a cold screen 7, which is set inside the first chamber 1 and connected to the refrigeration unit 4. The low-temperature platform 5 is located in the space enclosed by the cold screen 7.

[0058] Specifically, the cold shield 7 is installed on the primary cold head 41. The cold shield 7 has a cylindrical structure. The low temperature platform 5 and the secondary cold head 42 are both located in the space enclosed by the cold shield 7. The cold shield 7 is used to reduce the heat radiation loss of the secondary cold head 42 and the low temperature platform 5, and to ensure that the sample 100 quickly reaches the test temperature.

[0059] The low-temperature testing system also includes a seal 8, a second housing 2 with an opening 22, the seal 8 being detachably installed at the opening 22, and a movable part 3 being movably inserted into the seal 8.

[0060] like Figure 1As shown, the opening 22 is located away from the sealing door 12, and the movable part 3 can enter the second cavity 21 through the opening 22. The movable part 3 is perpendicularly inserted into the sealing part 8 and can move along its own axis.

[0061] Specifically, the sealing element 8 is a quick-release sealing flange, which provides an installation position for the movable part 3 and allows for quick installation and removal. By locking the sealing element 8, the second cavity 21 can be isolated from the external environment, facilitating the vacuuming of the second chamber 2; by removing the sealing element 8, the movable part 3 can be removed from the second chamber 2, facilitating the replacement or removal of the sample 100.

[0062] It is understandable that a sealing element is provided between the outer periphery of the moving part 3 and the sealing element 8 to ensure the sealing of the second cavity 21 during the movement of the moving part 3.

[0063] The low-temperature testing system provided by the present invention has a hollow structure for the movable part 3, and the interior of the movable part 3 is used to accommodate functional components or wires.

[0064] The functional element is used for data acquisition and data transmission. By housing the functional element and wires inside the movable part 3, the functional element and wires can move with the movable part 3 while performing relevant data acquisition and transmission.

[0065] The present invention also provides a low-temperature testing method, based on the low-temperature testing system described in any of the above embodiments, such as... Figure 4 As shown, the method includes:

[0066] S10: Place the end of the movable part 3 with sample 100 installed inside the first chamber 1 for low temperature testing, wherein the sealing door 12 is in the open state, and the inside of the first chamber 1 and the inside of the second chamber 2 are both in a vacuum state.

[0067] S20: After the low temperature test is completed, move the end of the moving part 3 into the second housing 2;

[0068] S30: Close the sealing door 12, break the vacuum in the second chamber 2, and remove the movable part 3 from the inside of the second chamber 2 to disassemble or replace the sample 100.

[0069] In step S10, when the sample 100 is subjected to low temperature testing, the sealing door 12 is opened, the first cavity 11 and the second cavity 21 are connected to each other and are both in a vacuum state, and the sample 100 is subjected to relevant tests in the first cavity 11.

[0070] In step S20, after the low-temperature test of sample 100 is completed, the movable part 3 moves along its own axis away from the first chamber 1 under the action of human power or the second drive device until sample 100 reaches the second chamber 21.

[0071] Subsequently, in step S30, the first chamber 11 and the second chamber 21 are separated by closing the sealing door 12, so that the first chamber 11 is kept in a vacuum and low temperature state, and then the vacuum in the second chamber 21 is broken to disassemble or replace the sample 100.

[0072] During this process, the refrigerator 4 does not need to be repeatedly turned on and off, and the first chamber 11 does not need to be repeatedly cooled and reheated, saving a lot of time. The sample 100 can be disassembled or replaced without stopping the refrigerator 4, which is conducive to quickly conducting the next low-temperature test and greatly improves the efficiency of low-temperature testing.

[0073] The low-temperature testing method provided by this invention, by setting a first chamber 1 and a second chamber 2 adjacent to each other and a sealing door 12 between them, can achieve communication or separation between the first chamber 1 and the second chamber 2 by opening or closing the sealing door 12; by setting a movable part 3 that can be movably inserted into the second chamber 2, after the test is completed, the movable part 3 can be driven to move, thereby transferring the sample 100 to the second chamber 2, which is convenient for disassembly or replacement of the sample; by closing the sealing door 12, the vacuum state and low temperature state inside the first chamber 1 can be maintained at all times, the refrigeration unit 4 does not need to be stopped, eliminating the long process of reheating and cooling of the low-temperature testing system, greatly improving the testing efficiency of the low-temperature testing system, and facilitating continuous and repeated low-temperature testing.

[0074] Specifically, such as Figure 5 or Figure 6 As shown, before placing the end of the movable part 3 on which the sample 100 is mounted into the first housing 1 in step S10, the method further includes:

[0075] S101: Close the sealing door 12, evacuate the inside of the first chamber 1, and when the vacuum level inside the first chamber 1 reaches the preset vacuum level, turn on the refrigeration unit 4 so that the temperature inside the first chamber 1 reaches the preset temperature.

[0076] S102: Install the sample 100 to the end of the movable part 3, and place the end of the movable part 3 inside the second housing 2;

[0077] S103: Vacuum the inside of the second chamber 2. Once the vacuum level inside the second chamber 2 reaches the preset vacuum level, open the sealing door 12.

[0078] In step S101, in the initial state, ensure that the sealing door 12 is closed, evacuate the first chamber 11, and when the vacuum level of the first chamber 11 reaches the preset vacuum level, the requirement for starting the refrigerator 4 is met, and the refrigerator 4 is turned on to cool down. The preset vacuum level is the target vacuum level that needs to be achieved in the low-temperature test environment. In the initial state, the first chamber 11 is at room temperature, and the refrigerator 4 needs to perform cooling for a relatively long time.

[0079] After the temperature of the first chamber 11 reaches the preset temperature, in step S102, the sample 100 is installed onto the end of the movable part 3, and the position of the movable part 3 is adjusted so that the sample 100 is located in the second chamber 21. The low-temperature testing system also includes a heat-conducting element 6, which is disposed at the end of the movable part 3. The sample 100 is installed onto one side of the heat-conducting element 6, so that the sample 100 and the heat-conducting element 6 have thermal contact.

[0080] In step S103, the interior of the second chamber 2 is evacuated to a preset vacuum level. The sealing door 12 is then opened, connecting the first chamber 11 and the second chamber 21. At this point, both the first chamber 11 and the second chamber 21 are under vacuum. Then, the process proceeds to step S10, where the end of the movable part 3, on which the sample 100 is mounted, is placed inside the first chamber 1 for low-temperature testing.

[0081] Specifically, the low-temperature testing system includes a seal 8, a second housing 2 with an opening 22, the seal 8 being detachably installed at the opening 22, and a movable member 3 being movably inserted into the seal 8. Step S102 involves installing the sample 100 to the end of the movable member 3, placing the end of the movable member 3 inside the second housing 2, specifically including:

[0082] Insert the movable part 3 into the sealing part 8, install the sample 100 onto the end of the movable part 3, place the end of the movable part 3 inside the second housing 2 through the opening 22, and lock the sealing part 8.

[0083] Specifically, the sealing element 8 is a quick-release sealing flange, which provides an installation position for the movable part 3 and allows for quick installation and removal. By locking the sealing element 8, the second cavity 21 can be isolated from the external environment, facilitating the vacuuming of the second chamber 2; in step S30, by removing the sealing element 8, the movable part 3 can be removed from the second chamber 2, facilitating the replacement or removal of the sample 100.

[0084] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A low-temperature testing system, characterized in that, Includes a first enclosure, a second enclosure, moving parts, and a refrigeration unit; The first box and the second box are adjacent to each other and a sealed door is provided between them. The sealed door can be opened or closed to connect or separate the first box and the second box. The refrigeration unit is at least partially disposed in the first chamber, the movable part is movably inserted into the second chamber, the end of the movable part is used to install the sample, and when the sealed door is open, the end of the movable part can enter the first chamber; The movable component has a hollow structure, and the interior of the movable component is used to accommodate functional elements or wires. A first drive device and a control device are connected by communication. The first drive device is connected to the sealing door in a transmission manner. The control device sends an opening signal or a closing signal to the first drive device. The second driving device is connected to the moving part in a transmission manner and is used to drive the moving part to move. A cryogenic platform, which is installed at one end of the refrigerator and has thermal contact with the refrigerator; A thermally conductive component is disposed at the end of the movable component and is used for thermal contact with the sample and the cryogenic platform. The heat-conducting component has a first heat-conducting surface, and the cryogenic platform has a second heat-conducting surface. The shapes of the first heat-conducting surface and the second heat-conducting surface are adapted to each other so that the heat-conducting component and the cryogenic platform are in close contact through the first heat-conducting surface and the second heat-conducting surface.

2. The low-temperature testing system according to claim 1, characterized in that, The low-temperature testing system also includes a cold screen, which is disposed inside the first chamber and connected to the refrigeration unit, and the low-temperature platform is located within the space enclosed by the cold screen.

3. The low-temperature testing system according to claim 1, characterized in that, The low-temperature testing system also includes a seal, the second housing has an opening, the seal is detachably installed at the opening, and the movable part is movably inserted into the seal.

4. A low-temperature testing method, based on the low-temperature testing system according to any one of claims 1 to 3, characterized in that, include: The end of the movable part with the sample installed is placed in the first chamber for low-temperature testing, wherein the sealing door is in the open state, and the inside of the first chamber and the inside of the second chamber are in a vacuum state. After the low-temperature test is completed, the end of the movable part is moved into the second chamber; Close the sealed door, break the vacuum in the second chamber, and remove the movable part from inside the second chamber to disassemble or replace the sample.

5. The low-temperature testing method according to claim 4, characterized in that, Before placing the end of the movable part with the sample mounted on it into the first housing, the method further includes: Close the sealing door and evacuate the inside of the first chamber. Once the vacuum level inside the first chamber reaches the preset vacuum level, turn on the refrigeration unit to bring the temperature inside the first chamber to the preset temperature. The sample is installed to the end of the movable part, and the end of the movable part is placed inside the second housing; The interior of the second chamber is evacuated. Once the vacuum level inside the second chamber reaches the preset vacuum level, the sealing door is opened.

6. The low-temperature testing method according to claim 5, characterized in that, The low-temperature testing system includes a seal, the second housing has an opening, the seal is detachably installed at the opening, and the movable member is movably inserted into the seal; The step of installing the sample to the end of the movable part and placing the end of the movable part inside the second housing specifically includes: Insert the movable part into the seal, install the sample onto the end of the movable part, place the end of the movable part inside the second housing through the opening, and lock the seal.

Images