用于超镜面抛光的抛光装置

By combining the sample fixing part, base, polishing part and polishing liquid delivery part, the sample can move and rotate in multiple directions, which solves the problem of low polishing accuracy of existing devices, improves the uniformity and accuracy of polishing, and is suitable for ultra-mirror polishing of vacuum semiconductor equipment.

CN117340768BActive Publication Date: 2026-07-17HEFEI NATIONAL LABORATORY +1

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
HEFEI NATIONAL LABORATORY
Filing Date
2023-11-20
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing polishing equipment cannot precisely control the polishing slurry composition, polishing slurry delivery volume, polishing medium material, and polishing pressure in vacuum semiconductor equipment, resulting in low polishing accuracy and failing to guarantee the uniformity and precision of ultra-mirror polishing of precision parts.

Method used

By designing a combination of sample fixing part, base, polishing part and polishing liquid delivery part, the sample can move and rotate in multiple directions, and the polishing liquid composition, delivery volume, polishing medium material and polishing pressure can be controlled to form working conditions with different polishing coefficients.

Benefits of technology

It improves the uniformity and precision of polishing, meeting the ultra-mirror polishing requirements of different precision parts in vacuum semiconductor equipment.

✦ Generated by Eureka AI based on patent content.

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Abstract

本发明公开了一种用于超镜面抛光的抛光装置,包括:样品固定部,被构造成夹持样品并驱动样品绕自身轴线转动;基座,被构造成能够分别沿横向方向、纵向方向、高度方向移动;抛光部,沿高度方向延伸,在样品的下方安装在基座上,被构造成能够绕自身轴线转动,并随基座沿横向方向、纵向方向、高度方向往复直线移动,以调整抛光部与样品之间的相对位置;以及抛光液输送部,一端安装在抛光部上,被构造成向抛光部单独定量输送多种抛光液中的一种或向抛光部输送由多种抛光液按照预定比例混合的混合抛光液;其中,根据抛光液输送部向抛光部输送的抛光液的组分以及输送量、抛光介质的材料类型以及施加在样品上的抛光压力的不同,形成不同抛光系数的工况。
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