Universal automated test set, method, apparatus, and media for infrared imaging systems

By designing an automated testing device for the infrared imaging system, simultaneous testing and unified data management of multiple products were achieved, solving the problems of long testing time and low efficiency in existing technologies, and improving testing efficiency and data management efficiency.

CN117367607BActive Publication Date: 2026-11-06TIANJIN JINHANG INST OF TECH PHYSICS
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Patent Information

Application Number
CN202311303740.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-10-10
Publication Date
2026-11-06
Estimated Expiration
2043-10-10

AI Technical Summary

Technical Problem

The testing process for existing infrared imaging systems is time-consuming, inefficient, and the test data is scattered, making it difficult to achieve efficient whole-system testing and environmental screening.

Method used

Design a general-purpose automated testing device for infrared imaging systems, including a control center unit, a data acquisition unit, and a temperature chamber. Through automated testing software, multiple testing devices can be coordinated and controlled to achieve synchronous testing and unified data management of multiple products.

Benefits of technology

It enables rapid testing of infrared imaging systems, shortens the testing cycle, improves testing efficiency, and provides unified data storage for easy subsequent analysis and retrieval.

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Abstract

The application discloses an infrared imaging system universal automatic testing device, method, equipment and medium, and belongs to the field of automatic testing equipment. The automatic testing device comprises a shell and a control center unit. The shell is internally provided with the control center unit; the control center unit is divided into a communication control unit and a data acquisition unit; the communication control unit is used for sending control instructions to a testing device; the data acquisition unit is used for acquiring operation parameters and infrared images of a measured infrared imaging system; the testing device at least comprises a temperature box; the infrared imaging system is arranged in the temperature box; the communication control unit comprises a plurality of data interfaces, and the data interfaces are respectively used for being connected with different measured infrared imaging systems, power supply devices and the temperature box. The infrared imaging system universal automatic testing device designed by the application can simultaneously detect a plurality of products of the same batch, so that the whole testing process is faster.
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Description

Technical Field

[0001] This disclosure generally relates to the field of automated testing equipment technology, and specifically to a general automated testing device and testing method for infrared imaging systems. Background Technology

[0002] Currently, the commissioning and testing of infrared imaging systems mainly relies on manual methods for overall system testing and environmental screening tests. Test results are recorded manually, and the data is stored separately on the computers of various testers. Products are transported by trailer, and different product models require different testing equipment and software.

[0003] Infrared imaging systems typically take approximately 20 hours for a single temperature screening process, with temperature data calibration taking about 8 hours. Furthermore, only one set of products can be calibrated at a time, resulting in low testing efficiency and excessive time consumption. Therefore, we propose a universal automated testing device for infrared imaging systems to address these issues. Summary of the Invention

[0004] In view of the above-mentioned defects or deficiencies in the prior art, it is desirable to provide a general automated testing device, method, equipment and medium for infrared imaging systems that can improve testing efficiency and shorten the testing cycle;

[0005] In a first aspect, this application provides a general automated testing device for infrared imaging systems, comprising:

[0006] The automated testing device includes:

[0007] The housing; a control center unit is installed inside the housing;

[0008] The control center unit is divided into a communication control unit and a data acquisition unit; the communication control unit is used to send control commands to the test equipment; the data acquisition unit is used to acquire the operating parameters and infrared images of the infrared imaging system under test.

[0009] The testing equipment includes at least: a temperature chamber; the infrared imaging system is installed in the temperature chamber;

[0010] The communication control unit includes several data interfaces, which are respectively used to connect to different infrared imaging systems under test, power supply equipment, and the temperature chamber, so as to transmit control commands to the temperature chamber to control the temperature chamber to apply different temperatures to the infrared system, thereby testing its performance.

[0011] According to the technical solution provided in the embodiments of this application, the testing equipment further includes a blackbody temperature control system; the blackbody temperature control system is used to emit an infrared radiation beam to the infrared imaging system;

[0012] The communication control unit comprises a product control module, a blackbody control module, a temperature chamber control module, and a power control module.

[0013] The product control module is used to control the operating conditions of the infrared imaging system.

[0014] The blackbody control module is used to control the operating parameters of the blackbody temperature control system.

[0015] The power control module is used to control the operating conditions of the power supply equipment.

[0016] According to the technical solution provided in the embodiments of this application, the data acquisition unit includes at least an independently configured USB acquisition module, an analog video acquisition module, and an SDI acquisition module;

[0017] The USB acquisition module, the analog video acquisition module, and the SDI acquisition module are respectively used to acquire the operating parameters of different types of the infrared imaging system under test; the operating parameters include at least the infrared images of the infrared imaging system under test during the performance test and its corresponding performance indicators; the performance indicators include at least the voltage signal, current signal, lens temperature, focal plane temperature, integration time, image mean, self-test status, and debugging status.

[0018] According to the technical solution provided in the embodiments of this application, the control center unit further includes:

[0019] The data storage unit includes a data persistence module and a log module.

[0020] The data persistence module is used to persistently store the data to be stored.

[0021] The log module is used to record and store the control process of the automated testing device.

[0022] According to the technical solution provided in the embodiments of this application, the top and bottom of the housing are respectively provided with a display screen and multiple sets of sliding wheels;

[0023] The display screen is used to display the instruction options of the automated testing device, the list of configuration software operating parameters, and the infrared image;

[0024] The sliding wheel is used to move the automated testing device.

[0025] According to the technical solution provided in the embodiments of this application, a transfer drawer is also provided at the bottom of the housing; the transfer drawer is used to transfer the infrared imaging system after the performance test is completed.

[0026] Secondly, this application provides an automated testing method for an infrared imaging system, applied to the aforementioned general automated testing device for infrared imaging systems, comprising the following steps:

[0027] The power supply equipment, the main control computer in the control center unit, the temperature chamber, the blackbody temperature control system, and the test data management system are connected to the same local area network via network cables;

[0028] Each infrared imaging system under test is connected through the power interface and the data interface in the power supply equipment.

[0029] Log in to the automated testing software of the automated testing device, and send control commands to the testing device by configuring the command operation parameters of the testing software;

[0030] According to the testing requirements, the infrared imaging system, the power supply equipment, the blackbody temperature control system, and the temperature chamber under test are scheduled to conduct performance tests on the infrared imaging system.

[0031] According to the technical solution provided in the embodiments of this application, after performing performance testing on the infrared imaging system, the method further includes:

[0032] The log module automatically records the communication between the automated testing software and each of the testing devices, the infrared imaging system, and the power supply equipment.

[0033] The performance test results corresponding to each of the infrared imaging systems are stored in a local database and uploaded to the test data management system for unified archiving.

[0034] After the performance test is completed, the tested infrared imaging system and cables are placed in the transfer drawer at the bottom of the automated testing device and transported to the next production stage.

[0035] Thirdly, this application provides a terminal device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the automated testing method for the infrared imaging system described above.

[0036] Fourthly, this application provides a computer-readable storage medium having a computer program that, when executed by a processor, implements the steps of the automated testing method for the infrared imaging system described above.

[0037] In summary, this technical solution specifically discloses a general automated testing device, method, equipment, and medium for infrared imaging systems. The automated testing device includes: a housing; a control center unit is housed within the housing; the control center unit is divided into: a communication control unit and a data acquisition unit; the communication control unit is used to send control commands to the testing equipment; the data acquisition unit is used to acquire the operating parameters of the infrared imaging system under test; the testing equipment includes at least: a temperature chamber; the infrared imaging system is housed within the temperature chamber; the communication control unit includes: several data interfaces, which are respectively used to connect to different infrared imaging systems under test, power supply equipment, and the temperature chamber to transmit control commands to the temperature chamber, controlling the temperature chamber to apply different temperatures to the infrared system, thereby testing its performance.

[0038] To address the issues of long processing times and low efficiency in the single-temperature screening process used in existing technologies for performance testing of infrared imaging systems, this application presents a universal automated testing device for infrared imaging systems. This device can simultaneously test multiple products from the same batch, making the entire testing process faster. Furthermore, the automated testing device can control multiple performance testing devices to coordinate and cooperate, further simplifying the entire testing process and improving testing efficiency. Attached Figure Description

[0039] Other features, objects, and advantages of this application will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0040] Figure 1 This is a first side view of a general-purpose automated testing device for infrared imaging systems.

[0041] Figure 2 This is a second side view of a general-purpose automated testing device for infrared imaging systems.

[0042] Figure 3 This is a schematic diagram of the control center unit of a general-purpose automated testing device for infrared imaging systems.

[0043] Figure 4 This is a flowchart illustrating an automated testing method for an infrared imaging system.

[0044] Figure 5 This is a schematic diagram of a terminal device.

[0045] The diagram shows the following components: 100, housing; 200, communication control unit; 201, data interface; 202, product control module; 203, blackbody control module; 204, temperature chamber control module; 205, power control module; 300, data acquisition unit; 301, USB acquisition module; 302, analog video acquisition module; 303, SDI acquisition module; 400, data storage unit; 401, data persistence module; 402, log module; 500, display screen; 600, pulley; 700, transfer drawer; 800, push rod. Detailed Implementation

[0046] The present application will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, only the parts relevant to the invention are shown in the accompanying drawings.

[0047] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0048] Example 1

[0049] Please refer to Figure 1 The first side view of a general automated testing device for an infrared imaging system provided in this embodiment is shown below. Figure 3 The schematic diagram of the control center unit shown indicates that the automated testing device includes:

[0050] Housing 100; a control center unit is provided inside the housing 100;

[0051] The control center unit is divided into: a communication control unit 200 and a data acquisition unit 300; the communication control unit 200 is used to send control commands to the test equipment; the data acquisition unit is used to acquire the operating parameters and infrared images of the infrared imaging system under test;

[0052] The testing equipment includes at least: a temperature chamber; the infrared imaging system is installed in the temperature chamber;

[0053] The communication control unit 200 includes several data interfaces 201, which are respectively used to connect to different infrared imaging systems under test, power supply equipment, and temperature chambers to transmit control commands to the temperature chambers, control the temperature chambers to apply different temperatures to the infrared systems, and thus test their performance.

[0054] Specifically, the definition of an infrared imaging system is as follows: Infrared radiation is an electromagnetic wave with the same nature as radio waves and visible light. The technology that uses an electronic device to convert the temperature distribution of an object's surface into a visible image and displays it in different colors is called infrared thermal imaging technology, and the system containing this electronic device can be called an infrared thermal imaging system.

[0055] Since infrared thermal imaging systems are used to describe temperature changes of the object or scene being measured, their performance at different temperatures is crucial. During testing, a temperature chamber is used to apply different ambient temperatures to the infrared system, and its operating parameters and infrared images are observed to determine their quality under these conditions.

[0056] The testing equipment also includes a blackbody temperature control system; the blackbody temperature control system is used to emit infrared radiation beams to the infrared imaging system, thereby observing the infrared images of blackbodies at different temperatures in the infrared imaging system.

[0057] In specific testing processes, the following methods may be included:

[0058] (1) Control the blackbody temperature control system to perform data calibration on the infrared imaging system under test in order to improve the thermal response performance of the product. The data calibration step can be simply understood as placing the product under test in front of the blackbody temperature control system, taking N blackbody temperatures as target temperatures, recording the corresponding infrared imaging system response values, and then using the best square approximation method to perform curve fitting to obtain the response approximation function of the infrared imaging system.

[0059] (2) Control the temperature inside the chamber to perform performance tests on the infrared imaging system under test, and observe whether the various indicators of the tested product are within the preset range at different temperatures. The performance indicators include at least: voltage signal, current signal, lens temperature, focal plane temperature, integration time, image average, self-test status, and debugging status, etc.

[0060] Alternatively, the blackbody temperature control system and the infrared imaging system under test can be placed together in a temperature chamber. By changing the blackbody temperature under different ambient temperatures, the relationship between the imager's grayscale output and the focal plane temperature at the same blackbody temperature can be found, obtaining a grayscale-focal plane temperature fitting curve. The functional performance can then be analyzed based on this curve. It should be noted that the above testing methods are merely examples and do not limit the functions of each testing device or the way they are used together. Other testing methods will not be elaborated upon further.

[0061] The communication control unit 200 is the key to the coordinated operation of multiple modules in the automated testing device. Specifically, the communication control unit 200 includes: product control module 202, blackbody control module 203, temperature chamber control module 204, and power control module 205.

[0062] The product control module 202 is used to control the operating conditions of the infrared imaging system. Here, the operating conditions include at least turning the infrared imaging system on or off.

[0063] The blackbody control module 203 is used to control the operating parameters of the blackbody temperature control system, including the temperature of the blackbody in the blackbody temperature control system.

[0064] The power control module 205 is used to control the operating conditions of the power supply equipment, where the operating conditions include turning the power on or off.

[0065] In this embodiment, the automated testing device is linked with the infrared imaging system under test, power supply equipment, temperature chamber, blackbody temperature control system and other equipment through data interface 201. Furthermore, through the development of automated testing software (the software program can be developed according to the integrated functions, and no specific limitation is made), the power supply equipment, external temperature chamber, blackbody temperature control system and other equipment are automatically run according to the preset test process to perform functional performance tests such as data calibration, temperature screening, and parfocality calibration on the product under test (infrared imaging system).

[0066] Specifically, the data interface 201 is the key to the interconnection of multiple devices. In this embodiment, the data interface 201 includes 8 analog channels, 4 serial digital interfaces (SDI), 4 camera link interfaces, and 4 low voltage differential signaling (LVDS) interfaces. It can cover the testing of multiple models of infrared imaging systems such as uncooled core components and zoom thermal imagers, and realize the simultaneous parallel testing of multiple infrared imaging systems of the same model.

[0067] like Figure 2 As shown, the data acquisition unit 300 includes at least an independently configured USB acquisition module 301, an analog video acquisition module 302, and an SDI acquisition module 303.

[0068] To accommodate information acquisition from various infrared imaging systems, the data acquisition unit 300 includes multiple data acquisition modules that can be adaptively connected according to the requirements of the product under test. The USB acquisition module 301, the analog video acquisition module 302, and the SDI acquisition module 303 are respectively used to acquire operating parameters of different types of the infrared imaging systems under test. These operating parameters include at least the infrared images of the infrared imaging system under test during performance testing and its corresponding performance indicators. The performance indicators include at least the following: voltage signal, current signal, lens temperature, focal plane temperature, integration time, image average, self-test status, and debugging status.

[0069] After data collection, it is also necessary to retain the data or to have a module that records the entire testing process, which also facilitates the centralized archiving of performance testing data later. The control center unit also includes: a data storage unit 400, and the data recording unit 400 includes: a data persistence module 401 and a log module 402;

[0070] The data persistence module 401 is used to persistently store the data to be stored.

[0071] The log module 402 is used to record and store the control process of the automated testing device for subsequent review of the entire testing process.

[0072] The top and bottom of the housing 100 are respectively provided with a display screen 500 and multiple sets of sliding wheels 500. Similarly, a push rod 800 is also provided on the top of the housing 100. The push rod 800 makes it easier to move the automated testing device. Technicians can use the push rod 800 to move the position of the automated testing device as needed.

[0073] The display screen 500 is used to display the instruction options of the automated testing device, the list of configuration software operating parameters, infrared images, and other adjustable parameters or some collected data that need to be displayed.

[0074] The command options can control the opening or closing of the temperature chamber or the blackbody temperature control system; the configuration software's operating parameter list can include temperature options for the temperature chamber and the blackbody temperature control system, etc.; and the infrared image is the functional effect presented by the infrared imaging system itself.

[0075] In addition, the automated testing device in this application also includes a signal distributor and a screen splitter. The signal distributor splits the input dynamic video signal about the infrared image into two. One of them is used to acquire the image data of the product under test in real time through the built-in analog / digital acquisition card of the testing device. The other signal is used to split multiple sets of product videos into 4-grid or 8-grid segments and display them on the same display.

[0076] The sliding wheel 600 is used to move the automated testing device. Because the entire performance testing process includes not only the signal transmission in software or communication, but also the connection between the serial port and the product under test, etc., the sliding wheel 600 under the housing 100 of the automated testing device can make the entire testing process more convenient and can complete the testing of the product under test at different distances.

[0077] Correspondingly, also for the purpose of optimizing the convenience of the entire testing process, a transfer drawer 700 is provided at the bottom of the housing 100; the transfer drawer 700 is used to transfer the infrared imaging system after the performance test is completed.

[0078] Example 2

[0079] like Figure 4 As shown, this embodiment provides an automated testing method for an infrared imaging system, applied to the general automated testing device for infrared imaging systems described in Embodiment 1, and includes the following steps:

[0080] S100: Connect the power supply equipment, the main control computer in the control center unit, the temperature chamber, the blackbody temperature control system, and the test data management system to the same local area network via a network cable;

[0081] The equipment used to test the functionality and performance of the infrared imaging system will be connected to a unified local area network via network cables, enabling unified planning and control of the entire testing equipment.

[0082] S200: Connect each infrared imaging system under test through the power interface in the power supply equipment and the data interface 201; in addition, the image data interface of the automated testing device also needs to be connected. There are no special restrictions on the relationship between the various interfaces. They can be connected reasonably according to the actual use requirements.

[0083] S300: Log in to the automated testing software of the automated testing device and send control commands to the testing equipment by configuring the command operation parameters of the testing software; the command operation parameters here include the opening or closing of the infrared imaging system as described in the aforementioned embodiment 1, as well as the temperature of the blackbody temperature control system or the temperature inside the temperature chamber, etc. The specific operation parameters need to be adjusted according to the actual test.

[0084] S400: According to the test requirements, schedule each of the infrared imaging systems under test, the power supply equipment, the blackbody temperature control system, and the temperature chamber to perform performance tests on the infrared imaging systems.

[0085] Furthermore, after performing performance testing on the infrared imaging system, the process further includes:

[0086] The log module 402 automatically records the communication between the automated testing software and each of the testing devices, the infrared imaging system, and the power supply equipment.

[0087] The performance test results corresponding to each infrared imaging system are stored in a local database and uploaded to the test data management system for unified archiving. This facilitates subsequent statistical analysis or review of the performance test results for this batch of products, and also makes it easier for technicians to retrieve and query the data.

[0088] After the performance test is completed, the tested infrared imaging system and cables are placed in the transfer drawer 700 at the bottom of the automated testing device and transported to the next production stage. The design of the transfer drawer further improves the testing efficiency.

[0089] Example 3

[0090] A terminal device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of an automated testing method for an infrared imaging system as described in Embodiment 2.

[0091] In this embodiment, as Figure 5 As shown, the terminal device 500 includes a CPU (Central Processing Unit) 501, which can perform various appropriate actions and processes according to a program stored in ROM (Read-Only Memory) 502 or a program loaded from storage into RAM (Random Access Memory) 503. RAM 503 also stores various programs and data required for system operation. The CPU 501, ROM 502, and RAM 503 are interconnected via a bus 504. An I / O (Input / Output) interface 505 is also connected to the bus 504.

[0092] The following components are connected to I / O interface 505: an input section 506 including a keyboard, mouse, etc.; an output section 507 including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and speakers, etc.; a storage section 508 including a hard disk, etc.; and a communication section 509 including a network interface card such as a LAN card, modem, etc. The communication section 509 performs communication processing via a network such as the Internet. A drive is also connected to I / O interface 505 as needed. A removable medium 511, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., is installed on drive 510 as needed so that computer programs read from it can be installed into storage section 508 as needed.

[0093] In particular, according to embodiments of the present invention, the above-described flowchart is as follows. Figure 3The described process can be implemented as a computer software program. For example, Embodiment 3 of the present invention includes a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network via a communication component, and / or installed from a removable medium. When the computer program is executed by the central processing unit (CPU) 501, it performs the functions defined in the system of the present invention.

[0094] It should be noted that the computer-readable medium shown in this invention can be a computer-readable signal medium or a computer-readable storage medium, or any combination thereof. A computer-readable storage medium can be, for example,—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of a computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM) 503, read-only memory (ROM) 502, erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this invention, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. In this invention, a computer-readable signal medium can include a data signal propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals can take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media can also be any computer-readable medium other than computer-readable storage media, which can send, propagate, or transmit a program for use by or in connection with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium can be transmitted using any suitable medium, including but not limited to: wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0095] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present invention. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in a block diagram or flowchart, and combinations of blocks in a block diagram or flowchart, may be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0096] The units described in the embodiments of the present invention can be implemented in software or hardware, and the described units can also be located in a processor. The names of these units do not necessarily limit the specific unit itself. The described units or modules can also be located in a processor; for example, a processor can be described as including a first generation module, an acquisition module, a search module, a second generation module, and a merging module. The names of these units or modules do not necessarily limit the specific unit or module itself; for example, the acquisition module can also be described as "an acquisition module for acquiring multiple instances to be probed in the base table".

[0097] Example 4

[0098] The present invention also provides a computer-readable medium, which may be included in the electronic device described in the above embodiments; or it may exist independently and not assembled into the electronic device. The computer-readable medium carries one or more programs, which, when executed by the electronic device, cause the electronic device to implement an automated testing method for an infrared imaging system as described in the above embodiments.

[0099] The above description is merely a preferred embodiment of this application and an explanation of the technical principles employed. Those skilled in the art should understand that the scope of the invention involved in this application is not limited to technical solutions formed by specific combinations of the above-described technical features, but should also cover other technical solutions formed by arbitrary combinations of the above-described technical features or their equivalents without departing from the inventive concept. For example, technical solutions formed by substituting the above features with (but not limited to) technical features with similar functions disclosed in this application.

Claims

1. A universal automated testing device for infrared imaging systems, characterized in that, The automated testing device includes: Housing (100); a control center unit is provided inside the housing (100); The control center unit is divided into: a communication control unit (200) and a data acquisition unit (300); the communication control unit (200) is used to send control commands to the test equipment; the data acquisition unit is used to acquire the operating parameters and infrared images of the infrared imaging system under test; The testing equipment includes at least: a temperature chamber; the infrared imaging system is installed in the temperature chamber; The communication control unit (200) includes several data interfaces (201), which are respectively used to connect to different infrared imaging systems under test, power supply equipment, and temperature chambers to transmit control commands to the temperature chambers to control the temperature chambers to apply different temperatures to the infrared imaging systems, thereby testing their functional performance.

2. The universal automated testing device for infrared imaging systems according to claim 1, characterized in that, The testing equipment also includes a blackbody temperature control system; the blackbody temperature control system is used to emit infrared radiation beams to the infrared imaging system. The communication control unit (200) includes: a product control module (202), a blackbody control module (203), a temperature chamber control module (204), and a power control module (205); The product control module (202) is used to control the operating conditions of the infrared imaging system; The blackbody control module (203) is used to control the operating parameters of the blackbody temperature control system; The power control module (205) is used to control the operating conditions of the power supply equipment.

3. The universal automated testing device for infrared imaging systems according to claim 2, characterized in that, The data acquisition unit (300) includes at least an independently configured USB acquisition module (301), an analog video acquisition module (302), and an SDI acquisition module (303); The USB acquisition module (301), the analog video acquisition module (302), and the SDI acquisition module (303) are respectively used to acquire the operating parameters of different types of the infrared imaging system under test; The operating parameters include at least the infrared images of the infrared imaging system under test during the performance test and its corresponding performance indicators; the performance indicators include at least the voltage signal, current signal, lens temperature, focal plane temperature, integration time, image mean, self-test status, and debugging status.

4. The universal automated testing device for infrared imaging systems according to claim 3, characterized in that, The control center unit also includes: The data storage unit (400) includes: a data persistence module (401) and a log module (402); The data persistence module (401) is used to persistently store the data to be stored; The log module (402) is used to record and store the control process of the automated testing device.

5. The universal automated testing device for infrared imaging systems according to claim 1, characterized in that, The top and bottom of the housing (100) are respectively provided with a display screen (500) and multiple sets of sliding wheels (500); The display screen (500) is used to display the instruction options of the automated testing device, the list of configuration software operating parameters, and the infrared image; The sliding wheel (600) is used to move the automated testing device.

6. The universal automated testing device for infrared imaging systems according to claim 5, characterized in that, The bottom of the housing (100) is also provided with a transfer drawer (700); the transfer drawer (700) is used to transfer the infrared imaging system after the performance test is completed.

7. An automated testing method for an infrared imaging system, characterized in that, The general automated testing device for the infrared imaging system according to any one of claims 1-6 includes the following steps: The power supply equipment, the main control computer in the control center unit, the temperature chamber, the blackbody temperature control system, and the test data management system are connected to the same local area network via network cables; Each infrared imaging system under test is connected through the power interface and the data interface (201) in the power supply equipment; Log in to the automated testing software of the automated testing device, and send control commands to the testing device by configuring the command operation parameters of the testing software; According to the testing requirements, the infrared imaging system, the power supply equipment, the blackbody temperature control system, and the temperature chamber under test are scheduled to conduct performance tests on the infrared imaging system.

8. The automated testing method for the infrared imaging system according to claim 7, characterized in that, After performing performance testing on the infrared imaging system, the process further includes: The log module (402) automatically records the communication between the automated testing software and each of the testing devices, the infrared imaging system, and the power supply equipment; The performance test results corresponding to each of the infrared imaging systems are stored in a local database and uploaded to the test data management system for unified archiving. After the performance test is completed, the tested infrared imaging system and cables are placed in the transfer drawer (700) at the bottom of the automated testing device and transported to the next production stage.

9. A terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of an automated testing method for an infrared imaging system as described in any one of claims 7 and 8.

10. A computer-readable storage medium storing a computer program thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the automated testing method for the infrared imaging system as described in any one of claims 7 and 8.

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