Automated test system for integrated circuit devices and automated test method

CN117368684BActive Publication Date: 2026-09-15KINGSTON DIGITAL INC
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Patent Information

Application Number
CN202210769700.1
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-06-30
Publication Date
2026-09-15
Estimated Expiration
2042-06-30

AI Technical Summary

Technical Problem

这样的测试系统不仅出错率高,且于运作上缺乏效率

Benefits of technology

[0009] As described above, the automated testing system and method provided by this invention can automatically install the target device (i.e., the device under test) onto the test carrier for subsequent testing, and can also automatically remove the target device from the test carrier after testing, and classify it according to the test results. The loading/unloading equipment and the testing equipment can perform automated loading/unloading and testing processes respectively, thus improving their respective work efficiency. Furthermore, because the loading/unloading equipment and the testing equipment also have collaborative capabilities, the problem of decreased overall testing efficiency caused by the inability of the two devices to monitor each other's work progress can be avoided. Therefore, the automated testing system and method provided by this invention effectively improve the aforementioned technical problems of traditional testing systems.

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Abstract

An automated test system and an automated test method for integrated circuit devices. In the automated test system, a test computer of a test apparatus and a handler computer of a handler apparatus communicate with each other, and the handler apparatus automatically mounts a plurality of target devices on a plurality of test carriers according to a state of the test apparatus; the test apparatus automatically tests the plurality of target devices mounted on the plurality of test carriers according to a state of the handler apparatus. Furthermore, after the test is completed, the handler apparatus automatically unmounts the plurality of target devices tested from the plurality of test carriers, and automatically classifies the plurality of target devices tested according to test results generated by the test apparatus.
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Description

Technical Field

[0001] This invention relates to an automated testing system. More specifically, this invention relates to an automated testing system for the automatic loading, unloading, testing, and sorting of integrated circuit (IC) devices. Background Technology

[0002] Traditional testing systems for integrated circuit devices rely on operators to install the target device (e.g., memory, CPU, etc.) onto a test carrier (e.g., motherboard), then operate the testing equipment to execute the test program. After testing, the operator removes the tested target device from the test carrier, determines whether it meets standards based on the test results, and stores it in the appropriate classification area. Such testing systems are not only prone to errors but also inefficient. Therefore, improving the operational efficiency of testing integrated circuit devices is a pressing issue in this technical field. Summary of the Invention

[0003] To at least address the aforementioned problems in this technical field, the present invention provides an automated testing system. This automated testing system may include a testing device and a loading / unloading device. The testing device includes a testing computer, and the loading / unloading device includes a loading / unloading computer, and the testing computer and the loading / unloading computer are communicable. The loading / unloading device can be used to automatically mount multiple target devices onto multiple test carriers according to the status of the testing device. The testing device can be used to automatically test the multiple target devices mounted on the multiple test carriers according to the status of the loading / unloading device. Furthermore, the loading / unloading device can also be used to automatically unload the tested multiple target devices from the multiple test carriers and automatically classify the tested multiple target devices according to the test results generated by the testing device.

[0004] Furthermore, to at least address the aforementioned problems in this technical field, the present invention also provides an automated testing method. This automated testing method may include the following steps:

[0005] A loading and unloading device automatically installs multiple target devices onto multiple test carriers based on the status of a test device, wherein a test computer of the test device communicates with a loading and unloading computer of the loading and unloading device.

[0006] The testing equipment automatically tests the multiple target devices installed on the multiple test carriers according to the status of the loading and unloading equipment;

[0007] The loading and unloading equipment automatically unloads the tested target devices from the multiple test carriers; and

[0008] The loading and unloading equipment automatically classifies the tested target devices based on the test results generated by the testing equipment.

[0009] As described above, the automated testing system and method provided by this invention can automatically install the target device (i.e., the device under test) onto the test carrier for subsequent testing, and can also automatically remove the target device from the test carrier after testing, and classify it according to the test results. The loading / unloading equipment and the testing equipment can perform automated loading / unloading and testing processes respectively, thus improving their respective work efficiency. Furthermore, because the loading / unloading equipment and the testing equipment also have collaborative capabilities, the problem of decreased overall testing efficiency caused by the inability of the two devices to monitor each other's work progress can be avoided. Therefore, the automated testing system and method provided by this invention effectively improve the aforementioned technical problems of traditional testing systems. Attached Figure Description

[0010] Figure 1A This is a schematic diagram of an automated testing system according to one or more embodiments of the present invention;

[0011] Figure 1B This is a schematic diagram of an automated testing system according to one or more other embodiments of the present invention;

[0012] Figure 2 This is a schematic diagram illustrating the operation of a loading and unloading device according to one or more embodiments of the present invention;

[0013] Figure 3 These are schematic diagrams of loading / unloading equipment, testing equipment, and transport equipment according to one or more embodiments of the present invention; and

[0014] Figure 4 This is a flowchart of an automated testing method according to one or more embodiments of the present invention.

[0015] [Symbol Explanation]

[0016] As shown below:

[0017] 1: Automated testing system

[0018] 11: Loading and unloading equipment

[0019] 111: Feeding Area

[0020] 112: Material Retrieval Area

[0021] 113: Loading and unloading area

[0022] 114: Category Area

[0023] 115: Discharge Area

[0024] 12: Testing equipment

[0025] 13: Transportation equipment

[0026] 2: Automated testing system

[0027] C1, C2: Categories

[0028] CP1: Loading and unloading computers

[0029] CP2: Test Computer

[0030] CP3: Transport Computer

[0031] D1~D m Target device

[0032] F1: Workplace

[0033] F2: Workspace

[0034] R1: Multi-layer loading and unloading rack

[0035] R2: Multi-layer test fixture

[0036] R3: Multi-layer transport rack

[0037] TC1~TC n Test carrier

[0038] 4: Automated Testing Methods

[0039] 401, 402, 403, 404: Steps Detailed Implementation

[0040] The embodiments described below are not intended to limit the invention to any particular environment, application, structure, process, or step described in those embodiments. Elements unrelated to the invention are not shown in the drawings. The dimensions and dimensional relationships of individual elements in the drawings are merely exemplary examples and are not intended to limit the invention. Unless otherwise specified, the same (or similar) symbols may correspond to the same (or similar) elements in the following description.

[0041] The terminology used herein is for illustrative purposes only and is not intended to limit the invention. The singular form “a” is intended to include the plural form as well, unless the context clearly indicates otherwise. Terms such as “comprising,” “including,” etc., specify the presence of the stated roles, integers, steps, operations, and / or elements, but do not exclude the presence or addition of one or more other roles, integers, steps, operations, elements, and / or combinations thereof. The term “and / or” includes any and all combinations of one or more of the related listed items. Although terms such as “first,” “second,” “third,” etc., may be used herein to describe various elements, such elements should not be limited by such terms. These terms are used only to distinguish one element from another. Thus, by way of example, a first element described below may also be referred to as a second element without departing from the spirit and scope of the invention.

[0042] Figure 1A This is a schematic diagram of an automated testing system according to one or more embodiments of the present invention. Figure 1A The content shown is merely an example and is not intended to limit the scope of the invention. (See also...) Figure 1A An automated testing system 1 may include a loading / unloading device 11 and a testing device 12, with the working areas of the loading / unloading device 11 and the testing device 12 overlapping. The loading / unloading device 11 may include a loading / unloading computer CP1, and the testing device 12 may include a testing computer CP2, with CP1 and CP2 capable of communicating with each other. More specifically, each of the loading / unloading computer CP1 and the testing computer CP2 may include a transceiver for wired or wireless communication. Taking wireless communication as an example, the transceiver may include, but is not limited to, communication elements such as, but not limited to, antennas, amplifiers, modulators, demodulators, detectors, analog-to-digital converters, and digital-to-analog converters. Taking wired communication as an example, the transceiver can be, for example but not limited to: gigabit Ethernet transceiver, gigabit interface converter (GBIC), small form-factor pluggable (SFP) transceiver, ten gigabit small form-factor pluggable (XFP) transceiver, etc.

[0043] Through the communication link between the loading / unloading computer CP1 and the test computer CP2, the loading / unloading equipment 11 can obtain the status of the test equipment 12 in real time (e.g., idle / standby, full load, half load, etc.), and can automatically move untested target devices D1 to D2 according to the status of the test equipment 12. mOne or more of them are installed on one or more test carriers TC1 to TC n The tested target devices D1 to D2 can be automatically placed on the screen. m One or more of the test carriers TC1 to TC n The device can be mounted on a single test carrier, or multiple target devices can be mounted on the same test carrier. In some embodiments, test carriers TC1 to TC2 are... n Each can be a motherboard, and the target devices D1 to D2 can be... m Each of these can be an integrated circuit device such as a memory module, a central processing unit, a graphics card, a sound card, a solid-state drive (SSD), or a non-SSD. The loading / unloading equipment 11 may include at least one robotic arm or other loading / unloading tool for mounting the untested target devices D1 to D2. m Or remove the tested target devices D1 to D m .

[0044] Through the communication link between the loading / unloading computer CP1 and the test computer CP2, the test equipment 12 can also obtain the status of the loading / unloading equipment 11 in real time (e.g., idle / standby, full load, half load, etc.), and can automatically test the equipment installed on the test carriers TC1 to TC2 according to the status of the loading / unloading equipment 11. n The target device D1~D m The test will generate corresponding test results upon completion. Test results may include, for example, whether each target device meets preset test standards.

[0045] Depending on the different testing objectives, the testing equipment 12 may include different testing elements to target devices D1 to D2. m Conduct tests on various items. For example, suppose we want to test target devices D1 to D2. m To assess the heat dissipation capacity and / or heat resistance during operation, the testing equipment 12 may include elements such as a heating element and a temperature sensing element. For example, if the target device D1 to D2 is to be tested... m If the conductivity is such that the test device 12 may include a probe, a meter, or other components related to current measurement.

[0046] After the testing equipment 12 completes the test, the loading and unloading equipment 11 can also automatically unload multiple test carriers TC1 to TC2. n The target devices D1 to D tested by the general m Remove and, based on the test results generated by the test equipment 12, automatically target the tested target devices D1 to D2. mThe data is categorized. The number of categories can be preset as needed. For example, in some embodiments, the categories may include two categories: those that meet the test criteria and those that do not. In other embodiments, the categories may include three categories: those that meet the test criteria, those that do not meet the test criteria, and those that cannot be determined.

[0047] Figure 1B This is a schematic diagram of an automated testing system according to one or more embodiments of the present invention. Figure 1B The content shown is merely an example and is not intended to limit the scope of the invention. (See also...) Figure 1B An automated testing system 2 may include a loading / unloading device 11, a testing device 12, and a transport device 13, wherein the working area F1 of the loading / unloading device 11 and the working area F2 of the testing device 12 do not overlap. Since the working area F1 of the loading / unloading device 11 and the working area F2 of the testing device 12 do not overlap (e.g., the loading / unloading device 11 and the testing device 12 are separated by several meters, tens of meters, or hundreds of meters or more), the transport device 13 is needed to assist in moving the test carriers TC1 to TC2 between the loading / unloading device 11 and the testing device 12. n For use by loading and unloading equipment 11 to install and / or dismantle target devices D1 to D2 m And the test target devices D1 to D2 provided by the test equipment 12 m In some embodiments, when the two fields F1 and F2 are not far apart, on-site personnel can assist in moving the test carriers TC1 to TC2 between the loading / unloading equipment 11 and the testing equipment 12. n The transport equipment 13 may include a transport computer CP3, and the transport computer CP3 may include a wired or wireless transceiver for communicating with the test computer CP2 and the loading / unloading computer CP1.

[0048] Figure 2 This is a schematic diagram illustrating the operation of a loading and unloading device according to one or more embodiments of the present invention. Figure 2 The content shown is merely an example and is not intended to limit the scope of the invention. (See also...) Figure 2 The working area F1 of the loading and unloading equipment 11 may include multiple areas, such as a feeding area 111, a picking area 112, a loading and unloading area 113, a sorting area 114, and a discharging area 115.

[0049] The feeding area 111 can be used to store untested target devices, while the unloading area 112 can be used to place target devices D1 to D2 to be tested. m The loading and unloading tools (e.g., a robotic arm) of the loading and unloading equipment 11 can be used to load test carriers TC1 to TC2. n Move to loading and unloading area 113, and retrieve the target device D1 to D2 to be tested from the self-retrieving area 112. mThen, in loading and unloading area 113, the target devices D1 to D2 to be tested are placed... m Installed on the corresponding test carriers TC1 to TC n Above. In some embodiments, the feeding area 111, picking area 112, loading and unloading area 113, sorting area 114, and discharging area 115 in the working area F1 of the loading and unloading equipment 11 require a total area of ​​about 9 square meters, but are not limited thereto.

[0050] The target devices D1 to D2 to be tested m Installed on the corresponding test carriers TC1 to TC n After that, the loading and unloading equipment 11 of the automated testing system 1 can load the target devices D1 to D2. m Test carriers TC1 to TC n Move to test device 12 and start the test directly.

[0051] Unlike automated testing system 1, automated testing system 2 uses loading and unloading equipment 11 to transport equipment 13 to load the target devices D1 to D2. m Test carriers TC1 to TC n The equipment is moved to the working area F2 of the testing equipment 12 for testing. Specifically, through the communication link between the transport computer CP3 and the testing computer CP2, the transport equipment 13 can obtain the real-time status of the testing equipment 12 (e.g., idle / standby, fully loaded, half-loaded, etc.), and can move the equipment carrying the target devices D1 to D2 according to the status of the testing equipment 12. m Test carriers TC1 to TC n Move to the work area F2 where the test equipment 12 is located, so that the test equipment 12 can take over the test target devices D1 to D2. m Similarly, through the communication link between the transport computer CP3 and the test computer CP1, the transport equipment 13 can obtain the status of the loading and unloading equipment 11 in real time (e.g., idle / standby, fully loaded, half-loaded, etc.), and can load the tested target devices D1 to D2 according to the status of the loading and unloading equipment 11. m Test carriers TC1 to TC n The equipment is moved back to the working area F1 of the loading and unloading equipment 11. Subsequently, the loading and unloading equipment 11 can move the target devices D1 to D2 in the loading and unloading area 113. m From its test carrier TC1~TC n Unload.

[0052] By connecting the loading and unloading computer CP1 and the test computer CP2, the test equipment 12 can also disconnect the tested target devices D1 to D2 after completing the test. mThe test results are transmitted to the loading and unloading equipment 11, so that the loading and unloading equipment 11 can unload the tested target devices D1 to D2 based on the test results. m Classify them, for example, divide them into Figure 2 The categories C1 (e.g., meeting test standards) or C2 (e.g., not meeting test standards) shown are placed in the storage space corresponding to each category in the classification area 114. In some embodiments, the multiple categories may be used to represent, for example, whether a test is passed or not, multiple grades of heat resistance, multiple grades of conductivity, etc. Target devices of a specific category in classification area 114 may be provided to discharge area 115 (e.g., Figure 2 The target devices (D1-D3) shown in the diagram belong to category C1 and are used in subsequent processes. After classification and unloading are completed, the next round of loading, unloading, testing, and transportation of the target devices can proceed.

[0053] Figure 3 This is a structural schematic diagram of loading and unloading equipment, testing equipment, and transportation equipment according to one or more embodiments of the present invention. Figure 3 The content shown is merely an example and is not intended to limit the scope of the invention. (See also...) Figure 3 The transport equipment 13 may include at least one multi-layer transport frame R3, each of which can accommodate test carriers TC1 to TC1 in layers. n The loading and unloading equipment 11 may include at least one multi-layer loading and unloading rack R1, and each multi-layer loading and unloading rack R1 may have a space for accommodating a multi-layer transport rack R3. The testing equipment 12 may include at least one multi-layer test rack R2, and each multi-layer test rack R2 may also have a space for accommodating a multi-layer transport rack R3. In some embodiments, the length, width, and height of the multi-layer transport rack R3 may be, for example, but not limited to, 615 mm, 600 mm, and 1696 mm, respectively; the length, width, and height of the multi-layer test rack R2 may be, for example, but not limited to, 867 mm, 781 mm, and 1765 mm, respectively; and the length, width, and height of the multi-layer loading and unloading rack R1 may be, for example, but not limited to, 2892 mm, 2870 mm, and 2200 mm, respectively.

[0054] In some embodiments, the multi-layer transport frame R3 of the transport device 13 may include multiple fixing elements for fixing the test carriers TC1 to TC2 placed on the multi-layer transport frame R3 respectively. n To prevent items from falling off during transport. Similarly, the multi-layer loading and unloading rack R1 of the loading and unloading equipment 11 and the multi-layer test rack R2 of the testing equipment 12 may each include multiple fixing elements to fix the test carriers TC1 to TC2 placed on the multi-layer loading and unloading rack R1 and the multi-layer test rack R2, respectively. n For example, each fixing element can be a base plate, a set of slide rails, a fixing buckle, a fixing hook, an adhesive material, or a combination of the aforementioned elements.

[0055] The multi-layer transport frame R3 can move between the loading / unloading equipment 11 and the testing equipment 12 via various transportation methods, such as, but not limited to, one of the following: rail transport, magnetic levitation transport, pulley transport, and vehicle transport. For example, in some embodiments, the multi-layer transport frame R3 may include multiple rollers and move between the loading / unloading equipment 11 and the testing equipment 12 via these rollers. Furthermore, in some embodiments, a track may be included between the loading / unloading equipment 11 and the testing equipment 12, and the multi-layer transport frame R3 may run on this track via the multiple rollers, thereby moving between the testing equipment 12 and the loading / unloading equipment 11. In some embodiments, the track may be a bridge beam, in which case the multiple rollers of the multi-layer transport frame R3 may not be located at the bottom of the multi-layer transport frame 131, but rather at its top. In this case, the transport equipment 13 may be equivalent to including a bridge crane.

[0056] In some embodiments, the transport device 13 may further include a control circuit and at least one environmental sensor based on technologies such as imagery, magnetism, and / or Time-of-Flight (ToF). The at least one environmental sensor can be used to detect its distance from other surrounding facilities, and the control circuit can control the movement of the transport device 13 based on the sensor information, thereby avoiding collisions before they occur. This enables automated movement of the transport device 13 between the loading / unloading device 11 and the testing device 12. In this case, the transport device 13 may be equivalent to including an automated guided vehicle.

[0057] In some other embodiments, the transport equipment 13 can also transport items between the test equipment 12 and the loading and unloading equipment 11 by means of, for example, magnetic levitation tracks, conveyor belts, chains, tracks, etc., and adopts multi-layer transport racks R3, multi-layer test racks R2 and multi-layer loading and unloading racks R1 with corresponding structures.

[0058] The space within the multi-layer test fixture R2 may contain test carriers TC1 to TC2. n Multiple testing tools are provided, and the positions of these multiple testing tools can correspond to the test carriers TC1 to TC2 in the multi-layer transport frame R3. n The placement of the test equipment 12 is such that it can directly test the target devices D1 to D2 after the multi-layer transport rack R3 is moved into the accommodating space of the multi-layer test rack R2. m .

[0059] The automated testing system 2 of the present invention not only solves the aforementioned technical problem of poor testing efficiency in this field, but also, because its loading and unloading equipment 11 and testing equipment 12 can be located in two non-overlapping work areas, the user can expand the work area F1 of the loading and unloading equipment 11 or the work area F2 of the testing equipment 12 separately according to needs, without affecting the number of devices and operational efficiency of the other area. Furthermore, thanks to the automated cooperation between the loading and unloading equipment 11, the testing equipment 12, and the transportation equipment 13, the automated testing system 2 of the present invention can fully realize the purpose of an unmanned factory.

[0060] Figure 4 This is a flowchart of an automated testing method according to one or more embodiments of the present invention. Figure 4 The content shown is merely an example and is not intended to limit the scope of the invention. (See also...) Figure 4 An automated testing method 4 may include the following steps:

[0061] A loading and unloading device automatically installs multiple target devices onto multiple test carriers according to the status of a test device, wherein a test computer of the test device communicates with a loading and unloading computer of the loading and unloading device (marked as step 401).

[0062] The testing equipment automatically tests the multiple target devices installed on the multiple test carriers based on the status of the loading and unloading equipment (marked as step 402);

[0063] The loading and unloading equipment automatically unloads the tested target devices from the multiple test carriers (marked as step 403); and

[0064] The loading and unloading equipment automatically classifies the multiple target devices that have been tested based on the test results generated by the testing equipment (marked as step 404).

[0065] In some embodiments, the automated testing method 4 may further include the following steps: depending on the state of the testing equipment, a transport device transports the plurality of test carriers loaded with the plurality of target devices to the testing equipment for testing the plurality of target devices, wherein a transport computer of the transport device communicates with the testing computer and the loading / unloading computer; and depending on the state of the loading / unloading equipment, the transport device transports the plurality of test carriers loaded with the plurality of target devices to the loading / unloading equipment for unloading the plurality of target devices. Furthermore, in the embodiments described, the transport device may include at least one multi-layer transport rack, and the plurality of test carriers may be disposed within the at least one multi-layer transport rack; the testing equipment may include at least one multi-layer test rack, and each multi-layer test rack may have a space for accommodating a multi-layer transport rack; the loading / unloading equipment may include at least one multi-layer loading / unloading rack, and each multi-layer loading / unloading rack may have a space for accommodating a multi-layer transport rack. In the embodiment described above, the at least one multi-layer transport frame may move between the measuring device and the loading and unloading device by one of the following methods: rail transport, magnetic levitation transport, pulley transport, or vehicle transport.

[0066] Each embodiment of the automated testing method 4 corresponds essentially to one embodiment of the automated testing system 1 and the automated testing system 2. Therefore, based solely on the above description of the automated testing system 1, those skilled in the art can fully understand and implement all corresponding embodiments of the automated testing method 4, even if each embodiment of the automated testing method 4 has not been described in detail above.

[0067] The embodiments disclosed above are not intended to limit the present invention. Any changes or modifications to the disclosed embodiments that can be easily conceived by those skilled in the art also fall within the scope of the present invention. The scope of the present invention is defined by the claims.

Claims

1. An automated test system, characterized by Include: A testing device, comprising a testing computer and at least one multi-layer test rack; A loading and unloading device includes a loading and unloading computer, the loading and unloading computer communicating with the test computer, and the loading and unloading device is used for: Based on the status of the testing equipment, multiple target devices are automatically installed on multiple test carriers; The tested target devices are automatically removed from the multiple test carriers; as well as Based on the test results generated by the testing equipment, the tested target devices are automatically classified; and A transport device includes a transport computer and at least one multi-level transport rack, wherein the transport computer communicates with the test computer and the loading / unloading computer. The plurality of test carriers are disposed in the at least one multi-layer transport rack, and the at least one multi-layer test rack has a first space for accommodating the at least one multi-layer transport rack. The first space contains a plurality of test tools corresponding to the plurality of test carriers, and the placement positions of the plurality of test tools correspond to the placement positions of the plurality of test carriers in the at least one multi-layer transport rack. The transport equipment is used to move and carry the plurality of test carriers loaded with the plurality of target devices to the first space for testing through the at least one multi-layer transport rack according to the state of the test equipment. The testing equipment is used to automatically test the multiple target devices installed on the multiple test carriers directly in the first space after the at least one multi-layer transport frame is moved into the first space, according to the state of the loading and unloading equipment.

2. The automated test system of claim 1, wherein, The transport equipment is also used to: transport the plurality of test carriers carrying the plurality of target devices to the loading and unloading equipment according to the state of the loading and unloading equipment, so that the loading and unloading equipment can unload the plurality of target devices.

3. The automated test system of claim 2, wherein: The loading and unloading equipment includes at least one multi-layer loading and unloading rack, and each multi-layer loading and unloading rack has a second space for accommodating a multi-layer transport rack.

4. The automated test system of claim 3, wherein, The at least one multi-layer transport frame is moved between the testing equipment and the loading and unloading equipment by one of the following methods: rail transport, magnetic levitation transport, pulley transport, or vehicle transport.

5. An automated testing method, characterized by Includes the following steps: A loading and unloading device automatically installs multiple target devices onto multiple test carriers based on the status of a test device; A transport device, based on the state of the test device, moves and carries the plurality of test carriers loaded with the plurality of target devices through at least one multi-layer transport rack included in the transport device to a first space in the at least one multi-layer test rack included in the test device for testing. The first space includes a plurality of test tools corresponding to the plurality of test carriers, and the positions of the plurality of test tools respectively correspond to the placement positions of the plurality of test carriers in the at least one multi-layer transport rack. Based on the state of the loading and unloading equipment, the testing equipment automatically tests the multiple target devices installed on the multiple test carriers directly in the first space after the at least one multi-layer transport frame is moved into the first space. The loading and unloading equipment automatically unloads the tested target devices from the multiple test carriers; and The loading and unloading equipment automatically classifies the tested target devices based on the test results generated by the testing equipment. The test computer of the test equipment, the loading and unloading computer of the loading and unloading equipment, and the transportation computer of the transportation equipment communicate with each other.

6. The automated testing method of claim 5, wherein, It also includes the following steps: according to the state of the loading and unloading equipment, the transport equipment transports the plurality of test carriers loaded with the plurality of target devices to the loading and unloading equipment, so that the loading and unloading equipment unloads the plurality of target devices.

7. The automated testing method of claim 6, wherein: The loading and unloading equipment includes at least one multi-layer loading and unloading rack, and each multi-layer loading and unloading rack has a second space for accommodating a multi-layer transport rack.

8. The automated testing method of claim 7, wherein, The at least one multi-layer transport frame is moved between the testing equipment and the loading and unloading equipment by one of the following methods: rail transport, magnetic levitation transport, pulley transport, or vehicle transport.

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