Data processing method, apparatus, and device

Abstract

The application discloses a kind of data processing method, device, equipment, belongs to oil and gas seismic exploration development technical field.The method comprises: obtaining first migration data, second migration data and the fracture profile interpretation result corresponding to second migration data;Determine a plurality of target seismic reflection horizon and the elevation depth and two-way travel time corresponding to each target seismic reflection horizon;According to the elevation depth and two-way travel time corresponding to each target seismic reflection horizon, determine the interval velocity between the first target seismic reflection horizon in the multiple target seismic reflection horizon and the datum surface and the interval velocity between adjacent two target seismic reflection horizons;According to the interval velocity between the first target seismic reflection horizon and the datum surface and the interval velocity between adjacent two target seismic reflection horizons, determine the fracture profile interpretation result corresponding to first migration data.Improves the acquisition efficiency of the fracture profile interpretation result corresponding to first migration data.

Description

Technical Field

[0001] This application relates to the field of oil and gas seismic exploration and development technology, and in particular to a data processing method, apparatus, and equipment. Background Technology

[0002] With the continuous development and advancement of seismic exploration and development technologies for oil and gas, seismic data processing techniques have evolved from time migration to depth migration. The processing results of seismic data are closely related to the actual exploration and development stage. For seismic data acquired from the same block, multiple rounds of processing are required to maximize the potential of the seismic data and meet the geological needs of different exploration and development stages.

[0003] In related technologies, after obtaining seismic data, a corresponding profile map is obtained. Based on experience, multiple points are selected in the profile map by manual personnel, and two adjacent points are connected to obtain multiple faults, which is the result of the fault profile interpretation of the seismic data.

[0004] However, the above methods require manual processing of seismic data based on personal experience, resulting in low processing efficiency and low processing accuracy. Summary of the Invention

[0005] This application provides a data processing method, apparatus, and device, which can be used to solve problems in related technologies. The technical solution is as follows:

[0006] On one hand, embodiments of this application provide a data processing method, the method comprising:

[0007] Obtain the fracture profile interpretation results corresponding to the first offset data, the second offset data, and the second offset data. The blocks corresponding to the first offset data and the second offset data are the same, and the acquisition time of the first offset data is different from that of the second offset data. The first offset data and the second offset data are either pre-stack time offset data or pre-stack depth offset data, and the second offset data is different from the first offset data.

[0008] Based on the first migration data, the second migration data, and the interpretation results of the fault profiles corresponding to the second migration data, multiple target seismic reflection horizons and the corresponding elevation depths and round-trip travel times of each target seismic reflection horizon are determined.

[0009] Based on the elevation depth and two-way travel time corresponding to each target seismic reflection layer, determine the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers.

[0010] Based on the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers, the interpretation results of the fault profile corresponding to the first migration data are determined.

[0011] In one possible implementation, the first offset data is the pre-stack time offset data, and the second offset data is the pre-stack depth offset data;

[0012] The step of determining multiple target seismic reflection horizons and the corresponding elevation depths and round-trip travel times for each target seismic reflection horizon based on the first migration data, the second migration data, and the interpretation results of the fault profiles corresponding to the second migration data includes:

[0013] Based on the interpretation results of the fracture profile corresponding to the pre-stack depth migration data, multiple target seismic reflection horizons are determined among multiple reference seismic reflection horizons. The multiple reference seismic reflection horizons are determined based on the pre-stack time migration data and the pre-stack depth migration data.

[0014] Based on the pre-stack time migration data, determine the two-way travel time corresponding to each target seismic reflection layer;

[0015] Based on the pre-stack depth migration data, the elevation depth corresponding to each target seismic reflection layer is determined.

[0016] In one possible implementation, before determining multiple target seismic reflection horizons among multiple reference seismic reflection horizons based on the interpretation results of the fracture profiles corresponding to the pre-stack depth migration data, the method further includes:

[0017] Determine the pre-stack time migration profile corresponding to the pre-stack time migration data, and determine the pre-stack depth migration profile corresponding to the pre-stack depth migration data;

[0018] Multiple candidate seismic reflection horizons were identified in the pre-stack time migration profile.

[0019] Multiple reference seismic reflection horizons are determined in the pre-stack depth migration profile, each corresponding to one of the multiple candidate seismic reflection horizons.

[0020] In one possible implementation, determining the two-way travel time corresponding to each target seismic reflection horizon based on the pre-stack time migration data includes:

[0021] In the pre-stack time migration profile corresponding to the target seismic reflection horizon, a candidate seismic reflection horizon is determined.

[0022] The two-way travel time of the candidate seismic reflection horizon corresponding to the target seismic reflection horizon is taken as the two-way travel time corresponding to the target seismic reflection horizon.

[0023] The step of determining the elevation depth corresponding to each target seismic reflection layer based on the pre-stack depth migration data includes:

[0024] In the pre-stack depth migration profile corresponding to the target seismic reflection horizon, a reference seismic reflection horizon is determined.

[0025] The elevation depth of the reference seismic reflection layer corresponding to the target seismic reflection layer is taken as the elevation depth corresponding to the target seismic reflection layer.

[0026] In one possible implementation, the fracture profile interpretation results corresponding to the pre-stack depth migration data include multiple faults and the starting and ending depths of each fault.

[0027] The step of determining multiple target seismic reflection horizons among multiple reference seismic reflection horizons based on the interpretation results of the fracture profiles corresponding to the pre-stack depth migration data includes:

[0028] Based on the interpretation results of the fracture profile corresponding to the pre-stack depth migration data, the shallowest depth and the deepest depth are determined according to the starting depth and ending depth of the multiple faults.

[0029] A first number of seismic reflection horizons are determined in the reference seismic reflection horizons whose elevation depth is lower than the shallowest depth;

[0030] A second number of seismic reflection horizons are determined in the reference seismic reflection horizons with an elevation depth higher than the deepest depth;

[0031] A third number of seismic reflection horizons are determined from the reference seismic reflection horizons whose elevation depth is between the shallowest depth and the deepest depth;

[0032] The first number of seismic reflection horizons, the second number of seismic reflection horizons, and the third number of seismic reflection horizons are taken as the target seismic reflection horizons.

[0033] In one possible implementation, determining the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, based on the elevation depth and two-way travel time corresponding to each target seismic reflection layer, includes:

[0034] Determine a first depth difference between the elevation depth corresponding to the first target seismic reflection layer and the elevation depth corresponding to the reference surface; determine the layer velocity between the first target seismic reflection layer and the reference surface based on the first depth difference and the two-way travel time corresponding to the first target seismic reflection layer;

[0035] Determine the second depth difference between the elevation depth corresponding to the first seismic reflection layer and the elevation depth corresponding to the second seismic reflection layer; determine the time difference between the two-way travel time corresponding to the first seismic reflection layer and the two-way travel time corresponding to the second seismic reflection layer; determine the layer velocity between the first seismic reflection layer and the second seismic reflection layer based on the second depth difference and the time difference, wherein the first seismic reflection layer and the second seismic reflection layer are two adjacent seismic reflection layers among the plurality of target seismic reflection layers.

[0036] In one possible implementation, the first offset data is the pre-stack time offset data, and the second offset data is the pre-stack depth offset data;

[0037] Before determining the fault profile interpretation result corresponding to the first migration data based on the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers, the method further includes:

[0038] Construct an initial layer velocity volume, wherein the maximum elevation depth corresponding to the initial layer velocity volume is not less than the maximum elevation depth among the multiple target seismic reflection layers, and the minimum elevation depth corresponding to the initial layer velocity volume is not greater than the minimum elevation depth among the multiple target seismic reflection layers.

[0039] The step of determining the fault profile interpretation results corresponding to the first migration data based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, includes:

[0040] Based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, the initial layer velocity volume is updated layer by layer under the control of the target seismic reflection layer to obtain the target layer velocity volume.

[0041] Based on the target layer velocity volume, the fracture profile interpretation results corresponding to the pre-stack depth migration data are subjected to depth-time conversion to obtain the fracture profile interpretation results of the pre-stack time migration data.

[0042] In one possible implementation, the step of performing a depth-time conversion on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume to obtain the fracture profile interpretation results of the pre-stack time migration data includes:

[0043] Based on the target layer velocity volume, the fracture profile interpretation results corresponding to the pre-stack depth migration data are subjected to depth-time conversion to obtain the reference fracture profile interpretation results.

[0044] The interpretation results of the reference fracture profile are projected onto the pre-stack time migration data;

[0045] Determine the degree of matching between the interpretation results of the reference fracture profile and the pre-stack time migration data;

[0046] Based on the matching degree meeting the matching requirements, the interpretation result of the reference fracture profile is used as the interpretation result of the fracture profile corresponding to the pre-stack time migration data.

[0047] On the other hand, embodiments of this application provide a data processing apparatus, the apparatus comprising:

[0048] The acquisition module is used to acquire the first offset data, the second offset data, and the fracture profile interpretation results corresponding to the second offset data. The blocks corresponding to the first offset data and the blocks corresponding to the second offset data are the same, and the acquisition time of the first offset data is different from that of the second offset data. The first offset data and the second offset data are either pre-stack time offset data or pre-stack depth offset data, and the second offset data is different from the first offset data.

[0049] The determination module is used to determine multiple target seismic reflection horizons and the corresponding elevation depth and round-trip travel time of each target seismic reflection horizon based on the first migration data, the second migration data and the interpretation results of the fault profile corresponding to the second migration data;

[0050] The determining module is further configured to determine the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers based on the elevation depth and round-trip travel time corresponding to each target seismic reflection layer.

[0051] The determining module is further configured to determine the fracture profile interpretation results corresponding to the first migration data based on the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers.

[0052] In one possible implementation, the first offset data is the pre-stack time offset data, and the second offset data is the pre-stack depth offset data;

[0053] The determining module is used to determine multiple target seismic reflection horizons among multiple reference seismic reflection horizons based on the interpretation results of the fault profiles corresponding to the pre-stack depth migration data. The multiple reference seismic reflection horizons are determined based on the pre-stack time migration data and the pre-stack depth migration data. Based on the pre-stack time migration data, the module determines the two-way travel time corresponding to each target seismic reflection horizon. Based on the pre-stack depth migration data, the module determines the elevation depth corresponding to each target seismic reflection horizon.

[0054] In one possible implementation, the determining module is further configured to determine a pre-stack time migration profile corresponding to the pre-stack time migration data, and a pre-stack depth migration profile corresponding to the pre-stack depth migration data; determine multiple candidate seismic reflection horizons in the pre-stack time migration profile; and determine multiple reference seismic reflection horizons corresponding to the multiple candidate seismic reflection horizons in the pre-stack depth migration profile.

[0055] In one possible implementation, the determining module is configured to: determine a candidate seismic reflection horizon corresponding to the target seismic reflection horizon in the pre-stack time migration profile corresponding to the pre-stack time migration data; use the two-way travel time of the candidate seismic reflection horizon corresponding to the target seismic reflection horizon as the two-way travel time corresponding to the target seismic reflection horizon; determine a reference seismic reflection horizon corresponding to the target seismic reflection horizon in the pre-stack depth migration profile corresponding to the pre-stack depth migration data; and use the elevation depth of the reference seismic reflection horizon corresponding to the target seismic reflection horizon as the elevation depth corresponding to the target seismic reflection horizon.

[0056] In one possible implementation, the fracture profile interpretation results corresponding to the pre-stack depth migration data include multiple faults and the starting and ending depths of each fault.

[0057] The determining module is used to determine the shallowest depth and the deepest depth based on the starting depth and ending depth of the multiple faults included in the interpretation results of the fault profile corresponding to the pre-stack depth migration data; determine a first number of seismic reflection horizons in reference seismic reflection horizons with an elevation depth lower than the shallowest depth; determine a second number of seismic reflection horizons in reference seismic reflection horizons with an elevation depth higher than the deepest depth; determine a third number of seismic reflection horizons in reference seismic reflection horizons with an elevation depth between the shallowest depth and the deepest depth; and use the first number of seismic reflection horizons, the second number of seismic reflection horizons, and the third number of seismic reflection horizons as the target seismic reflection horizons.

[0058] In one possible implementation, the determining module is configured to: determine a first depth difference between the elevation depth corresponding to the first target seismic reflection layer and the elevation depth corresponding to the reference surface; determine the layer velocity between the first target seismic reflection layer and the reference surface based on the first depth difference and the two-way travel time corresponding to the first target seismic reflection layer; determine a second depth difference between the elevation depth corresponding to the first seismic reflection layer and the elevation depth corresponding to the second seismic reflection layer; determine the time difference between the two-way travel time corresponding to the first seismic reflection layer and the two-way travel time corresponding to the second seismic reflection layer; and determine the layer velocity between the first seismic reflection layer and the second seismic reflection layer based on the second depth difference and the time difference, wherein the first seismic reflection layer and the second seismic reflection layer are two adjacent seismic reflection layers among the plurality of target seismic reflection layers.

[0059] In one possible implementation, the first offset data is the pre-stack time offset data, and the second offset data is the pre-stack depth offset data;

[0060] The device further includes:

[0061] A construction module is used to construct an initial layer velocity volume, wherein the maximum elevation depth corresponding to the initial layer velocity volume is not less than the maximum elevation depth among the multiple target seismic reflection layers, and the minimum elevation depth corresponding to the initial layer velocity volume is not greater than the minimum elevation depth among the multiple target seismic reflection layers.

[0062] The determining module is used to update the initial layer velocity volume layer by layer under the control of the target seismic reflection layer, based on the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers, to obtain the target layer velocity volume; and to perform depth-time conversion on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume, to obtain the fracture profile interpretation results of the pre-stack time migration data.

[0063] In one possible implementation, the determining module is configured to perform a depth-time conversion on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume to obtain a reference fracture profile interpretation result; project the reference fracture profile interpretation result onto the pre-stack time migration data; determine the matching degree between the reference fracture profile interpretation result and the pre-stack time migration data; and, based on the matching degree meeting the matching requirements, use the reference fracture profile interpretation result as the fracture profile interpretation result corresponding to the pre-stack time migration data.

[0064] On the other hand, embodiments of this application provide an electronic device, which includes a processor and a memory. The memory stores at least one piece of program code, which is loaded and executed by the processor to enable the electronic device to implement any of the data processing methods described above.

[0065] On the other hand, a computer-readable storage medium is also provided, wherein at least one piece of program code is stored therein, the at least one piece of program code being loaded and executed by a processor to enable a computer to implement any of the data processing methods described above.

[0066] On the other hand, a computer program or computer program product is also provided, wherein the computer program or computer program product stores at least one computer instruction, which is loaded and executed by a processor to enable the computer to implement any of the above-described data processing methods.

[0067] The technical solution provided in this application has at least the following beneficial effects:

[0068] The technical solution provided in this application utilizes first migration data, second migration data, and the fracture profile interpretation results corresponding to the second migration data to determine the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers. Then, based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, the fracture profile interpretation results corresponding to the first migration data are determined. This fully utilizes the fracture profile interpretation results corresponding to the second migration data, improving the processing efficiency and accuracy of the first migration data. Attached Figure Description

[0069] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0070] Figure 1 This is a schematic diagram of the implementation environment of a data processing method provided in an embodiment of this application;

[0071] Figure 2 This is a flowchart of a data processing method provided in an embodiment of this application;

[0072] Figure 3 This is a schematic diagram showing a pre-stack time offset profile and a pre-stack depth offset profile provided in an embodiment of this application;

[0073] Figure 4 This is a plan view of the two-way travel time corresponding to a target seismic reflection layer provided in an embodiment of this application;

[0074] Figure 5 This is a plan view of the elevation depth corresponding to a target seismic reflection layer provided in an embodiment of this application;

[0075] Figure 6 This is a plan view of the layer velocity between two adjacent target seismic reflection layers provided in an embodiment of this application;

[0076] Figure 7 This is a cross-sectional view of an initial layer velocity body provided in an embodiment of this application;

[0077] Figure 8 This is a cross-sectional view of a first-layer velocity body provided in an embodiment of this application;

[0078] Figure 9 This is a cross-sectional view of a second-layer velocity body provided in an embodiment of this application;

[0079] Figure 10 This is a cross-sectional view of a third-layer velocity body provided in an embodiment of this application;

[0080] Figure 11 This is a cross-sectional view of a fourth-layer velocity body provided in an embodiment of this application;

[0081] Figure 12 This is a cross-sectional view of a fifth-layer velocity body provided in an embodiment of this application;

[0082] Figure 13 This is a cross-sectional view of a target layer velocity body provided in an embodiment of this application;

[0083] Figure 14 This is a schematic diagram showing a target layer velocity volume provided in an embodiment of this application;

[0084] Figure 15 This is a comparison diagram of the fracture profile interpretation results corresponding to pre-stack time migration data and the fracture profile interpretation results corresponding to pre-stack depth migration data provided in the embodiments of this application;

[0085] Figure 16 This is a schematic diagram of the structure of a data processing device provided in an embodiment of this application;

[0086] Figure 17 This is a schematic diagram of the structure of a terminal device provided in an embodiment of this application;

[0087] Figure 18 This is a schematic diagram of the structure of a server provided in an embodiment of this application. Detailed Implementation

[0088] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0089] Figure 1 This is a schematic diagram illustrating the implementation environment of a data processing method provided in an embodiment of this application, such as... Figure 1 As shown, the implementation environment includes an electronic device 101. The electronic device 101 can be a terminal device or a server, and this embodiment of the application does not limit it in this way.

[0090] When electronic device 101 is a terminal device, the terminal device can be at least one of a smartphone, desktop computer, tablet computer, e-book reader, and laptop computer.

[0091] A terminal device can refer to one of multiple terminal devices; this embodiment uses only one terminal device as an example. Those skilled in the art will understand that the number of terminal devices can be more or less. For example, there may be only one terminal device, or there may be dozens or hundreds, or even more. This application embodiment does not limit the number or type of terminal devices.

[0092] When electronic device 101 is a server, the server can be a single server, a server cluster consisting of multiple servers, or any of the following: a cloud computing platform or a virtualization center. This application embodiment does not limit this. The server and terminal devices communicate via a wired or wireless network. The server has data receiving, data processing, and data sending functions. Of course, the server may also have other functions, which are not limited in this application embodiment.

[0093] Those skilled in the art should understand that the above-described terminal devices and servers are merely illustrative examples. Other existing or future terminal devices or servers that are applicable to this application should also be included within the scope of protection of this application, and are hereby incorporated by reference.

[0094] This application provides a data processing method that can be applied to the above-described implementation environment. Figure 2 The flowchart shown in this application embodiment illustrates a data processing method. This method can be implemented by... Figure 1 The electronic device 101 in the system performs the operation. For example... Figure 2 As shown, the method includes the following steps:

[0095] In step 201, the fracture profile interpretation results corresponding to the first offset data, the second offset data, and the second offset data are obtained.

[0096] In this embodiment, the block corresponding to the first migration data is the same as the block corresponding to the second migration data, and the acquisition time of the first migration data is different from that of the second migration data. The acquisition time of the first migration data can be earlier or later than that of the second migration data, and this embodiment does not limit this. The first migration data and the second migration data are either pre-stack time migration data and pre-stack depth migration data, respectively, and the second migration data is different from the first migration data. For example, the first migration data is pre-stack time migration data, and the second migration data is pre-stack depth migration data. Optionally, pre-stack time migration (PSTM) is one of the most effective methods for imaging complex structures, which can adapt to situations with large changes in longitudinal and lateral velocities and is suitable for migration imaging at large dip angles. Pre-stack depth migration (PSDM) is a processing technology for realizing the spatial positioning of geological structures. Pre-stack time migration data is data obtained based on pre-stack time migration technology, and pre-stack depth migration data is data obtained based on pre-stack depth migration technology.

[0097] Regardless of whether the first and second offset data are pre-stack time offset data or pre-stack depth offset data, in one possible implementation, the electronic device stores the block name of each block, the first offset data of each block, the second offset data of each block, and the fracture profile interpretation results corresponding to the second offset data of each block. This application does not limit the storage method of the block name of each block, the first offset data of each block, the second offset data of each block, and the fracture profile interpretation results corresponding to the second offset data of each block. For example, the block name of each block, the first offset data of each block, the second offset data of each block, and the fracture profile interpretation results corresponding to the second offset data of each block are stored according to the storage method shown in Table 1 below.

[0098] Table 1

[0099]

[0100] Optionally, the method provided in this application embodiment may also store the block name and the first offset data corresponding to the block, the block name and the second offset data corresponding to the block, and the fracture profile interpretation results corresponding to the block name and the second offset data corresponding to the block. This application embodiment does not limit this.

[0101] In one possible implementation, the electronic device determines the target block in each block, and then obtains the first offset data corresponding to the target block, the second offset data corresponding to the target block, and the fracture profile interpretation results corresponding to the second offset data of the target block from the storage space.

[0102] The process by which the electronic device determines the target block among various blocks includes: the electronic device randomly selecting a block from among the blocks where the fracture profile interpretation results corresponding to the first offset data have not been obtained as the target block. Alternatively, when the electronic device is a terminal device, it displays multiple blocks, and in response to receiving a trigger operation for any block, the electronic device designates any block as the target block. When the electronic device is a server, it sends multiple blocks to the terminal device, which then displays the multiple blocks. In response to the terminal device receiving a trigger operation for any block, the terminal device sends the block name of the block to which the trigger operation was received to the electronic device, thereby causing the electronic device to designate the block to which the trigger operation was received as the target block. Optionally, the trigger operation for any block can be a selection operation for any block, or other operations; this embodiment does not limit this.

[0103] In step 202, based on the interpretation results of the fault profiles corresponding to the first migration data, the second migration data, and the second migration data, multiple target seismic reflection horizons and the corresponding elevation depth and round-trip travel time of each target seismic reflection horizon are determined.

[0104] Two-way travel time refers to the time required for a seismic wave to travel between the top and bottom of the seismic reflection layer. Elevation depth is the distance between the seismic reflection layer and the reference surface. The elevation depth corresponding to the reference surface is a constant value; it is negative above sea level and positive below sea level. The two-way travel time corresponding to the reference surface is 0.

[0105] In one possible implementation, the first migration data is pre-stack time migration data, and the second migration data is pre-stack depth migration data. The process of determining multiple target seismic reflection horizons and their corresponding elevation depths and two-way travel times based on the fault profile interpretation results corresponding to the first, second, and third migration data includes: determining multiple target seismic reflection horizons from multiple reference seismic reflection horizons based on the fault profile interpretation results corresponding to the pre-stack depth migration data; the multiple reference seismic reflection horizons are determined based on the pre-stack time migration data and the pre-stack depth migration data. The number of target seismic reflection horizons is no greater than the number of reference seismic reflection horizons. The two-way travel time corresponding to each target seismic reflection horizon is determined based on the pre-stack time migration data; the elevation depth corresponding to each target seismic reflection horizon is determined based on the pre-stack depth migration data.

[0106] Before determining multiple target seismic reflection horizons from multiple reference seismic reflection horizons, it is necessary to first determine multiple reference seismic reflection horizons. This application embodiment does not limit the process of determining multiple reference seismic reflection horizons. Exemplarily, the process of determining multiple reference seismic reflection horizons includes: determining a pre-stack time migration profile corresponding to pre-stack time migration data, and determining a pre-stack depth migration profile corresponding to pre-stack depth migration data. Multiple candidate seismic reflection horizons are determined in the pre-stack time migration profile, and multiple reference seismic reflection horizons corresponding to the multiple candidate seismic reflection horizons are determined in the pre-stack depth migration profile.

[0107] Optionally, pre-stack time migration data is input into application software, which processes the data to obtain pre-stack time migration profiles. The process of determining the pre-stack depth migration profile corresponding to the pre-stack depth migration data is similar to the process of determining the pre-stack time migration profile described above, and will not be repeated here. The application software can be SeismicPro (a seismic profile display software). SeismicPro is a seismic profile display software that can extract two-dimensional profiles of longitudinal and transverse lines from standard SEG-Y format (one of the standard magnetic tape data formats proposed by the Society of Exploration Geophysicists) seismic data volumes, and display them professionally in various ways such as waveform, variable area, and variable density. It allows for one-click switching of display modes and can customize the development of overlay well trajectories and logging curves. The application software can also be other software, and this application embodiment does not limit its use.

[0108] Optionally, multiple candidate seismic reflection horizons in the pre-stack time migration data can be determined through well-seismic composite record calibration. The well-seismic composite record is a simplified one-dimensional forward modeling process. The well-seismic composite record can be expressed as follows: (1).

[0109] S(t) = W(t) R(t) formula (1)

[0110] In the above formula (1), S(t) is the well-seismic composite record, W(t) is the seismic wavelet, and R(t) is the reflection coefficient. This represents convolution. The seismic wavelet can be a Yuzlich wavelet or a Ricker wavelet, and its dominant frequency can be set based on actual data.

[0111] In one possible implementation, the process of determining multiple reference seismic reflection horizons corresponding to multiple candidate seismic reflection horizons in the pre-stack depth migration profile includes: selecting seismic reflection horizons in the pre-stack depth migration profile that are similar to the candidate seismic reflection horizons as reference seismic reflection horizons corresponding to the candidate seismic reflection horizons. Optionally, the reference seismic reflection horizons corresponding to the candidate seismic reflection horizons are determined in the pre-stack depth migration profile based on the similarity of seismic reflection characteristics. Here, satisfying the similarity requirement means having the highest similarity.

[0112] It should be noted that each candidate seismic reflection horizon in the pre-stack time migration profile needs to have a corresponding reference seismic reflection horizon determined. The process for determining the reference seismic reflection horizon for each candidate seismic reflection horizon is similar and will not be elaborated here.

[0113] like Figure 3 This is a schematic diagram showing a pre-stack time migration profile and a pre-stack depth migration profile provided for embodiments of this application. Figure 3 In the diagram, the right image shows the pre-stack time migration profile, and the left image shows the pre-stack depth migration profile. Multiple candidate seismic reflection horizons are identified in the pre-stack time migration profile: TK1bs, TK, TO1p, TH3, TH2, and TH. The reference seismic reflection horizons D1 (corresponding to TK1bs), D2 (corresponding to TK), D3 (corresponding to TO1p), D4 (corresponding to TH3), D5 (corresponding to TH2), and D6 (corresponding to TH) are identified in the pre-stack depth migration profile. This results in multiple reference seismic reflection horizons: D1, D2, D3, D4, D5, and D6.

[0114] In one possible implementation, the fault profile interpretation results corresponding to the pre-stack depth migration data include multiple faults and the starting and ending depths of each fault. After determining multiple reference seismic reflection horizons, the process of determining multiple target seismic reflection horizons among the multiple reference seismic reflection horizons based on the fault profile interpretation results corresponding to the pre-stack depth migration data includes: determining the shallowest depth and the deepest depth based on the starting and ending depths of the multiple faults included in the fault profile interpretation results corresponding to the pre-stack depth migration data. A first number of seismic reflection horizons are determined among the reference seismic reflection horizons with elevation depths lower than the shallowest depth; a second number of seismic reflection horizons are determined among the reference seismic reflection horizons with elevation depths higher than the deepest depth; a third number of seismic reflection horizons are determined among the reference seismic reflection horizons with elevation depths between the shallowest and deepest depths; and the first, second, and third number of seismic reflection horizons are used as target seismic reflection horizons. The first, second, and third numbers are all set based on experience or adjusted according to the implementation environment; this embodiment does not limit this. For example, the first quantity is 2, the second quantity is 2, and the third quantity is 2.

[0115] Optionally, the starting and ending depths of a fault are used to indicate the extent of the fault from the starting depth to the ending depth, and the absolute value of the difference between the starting and ending depths refers to the depth of the fault. The shallowest and deepest depths are determined based on the starting and ending depths corresponding to each fault. For example, the shallowest depth among the multiple faults included in the pre-stack depth migration profile is 4100 meters, and the deepest depth is 8500 meters.

[0116] In one possible implementation, after identifying multiple target seismic reflection horizons, the two-way travel time and elevation depth corresponding to each seismic reflection horizon are determined. This process includes: identifying candidate seismic reflection horizons corresponding to the target seismic reflection horizons in the pre-stack time migration profile corresponding to the pre-stack time migration data, and using the two-way travel time of the candidate seismic reflection horizons as the two-way travel time corresponding to the target seismic reflection horizon; and identifying a reference seismic reflection horizon corresponding to the target seismic reflection horizon in the pre-stack depth migration profile corresponding to the pre-stack depth migration data, and using the elevation depth of the reference seismic reflection horizon as the elevation depth corresponding to the target seismic reflection horizon.

[0117] For example, taking the determination of the two-way travel time and elevation depth corresponding to the first target seismic reflection layer as an example, the two-way travel time of the candidate seismic reflection layer corresponding to the first target seismic reflection layer is determined in the pre-stack time migration profile, and the elevation depth of the reference seismic reflection layer corresponding to the first target seismic reflection layer is determined in the pre-stack depth migration profile. That is, the two-way travel time and elevation depth corresponding to the first target seismic reflection layer are obtained. The determination process of the two-way travel time and elevation depth corresponding to other target seismic reflection layers is similar to the determination process of the two-way travel time and elevation depth corresponding to the first target seismic reflection layer, and will not be described in detail here.

[0118] For example, six target seismic reflection horizons were obtained, namely the first to the sixth target seismic reflection horizons. The first target seismic reflection horizon corresponds to an elevation depth of 3750 meters and a round-trip travel time of 2.95 seconds; the second target seismic reflection horizon corresponds to an elevation depth of 4100 meters and a round-trip travel time of 3.15 seconds; the third target seismic reflection horizon corresponds to an elevation depth of 6400 meters and a round-trip travel time of 4.2 seconds; the fourth target seismic reflection horizon corresponds to an elevation depth of 7250 meters and a round-trip travel time of 4.5 seconds; the fifth target seismic reflection horizon corresponds to an elevation depth of 7750 meters and a round-trip travel time of 4.65 seconds; and the sixth target seismic reflection horizon corresponds to an elevation depth of 8250 meters and a round-trip travel time of 4.85 seconds.

[0119] Figure 4 This is a plan view of the two-way travel time corresponding to a target seismic reflection layer provided in an embodiment of this application. Figure 4 The image shows a plan view of the two-way travel time for each of the six target seismic reflection horizons. The corresponding figure is a plan view of the two-way travel time corresponding to the first target seismic reflection layer; The corresponding figure is a plan view of the two-way travel time corresponding to the second target seismic reflection layer; The corresponding figure is a plan view of the two-way travel time corresponding to the third target seismic reflection layer; The corresponding figure is a plan view of the two-way travel time corresponding to the fourth target seismic reflection layer; The corresponding figure is a plan view of the two-way travel time corresponding to the fifth target seismic reflection layer; The corresponding figure is a plan view of the two-way travel time corresponding to the sixth target seismic reflection layer.

[0120] Figure 5 This is a plan view of the elevation depth corresponding to a target seismic reflection layer provided in an embodiment of this application. Figure 5The image shows a plan view with elevation depths corresponding to six target seismic reflection horizons. The corresponding figure is a plan view showing the elevation and depth of the seismic reflection layer of the first target. The corresponding figure is a plan view showing the elevation and depth of the seismic reflection layer of the second target. The corresponding figure is a plan view of the elevation and depth corresponding to the seismic reflection layer of the third target. The corresponding figure is a plan view showing the elevation and depth of the seismic reflection layer of the fourth target. The corresponding figure is a plan view showing the elevation and depth of the seismic reflection layer of the fifth target. The corresponding figure is a plan view of the elevation and depth corresponding to the sixth target seismic reflection layer.

[0121] In step 203, based on the elevation depth and round-trip travel time corresponding to each target seismic reflection layer, the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers, are determined.

[0122] In one possible implementation, layer velocity refers to a value where the propagation velocity of seismic P-waves beneath rocks and lithofacies tends to stabilize in a stable sedimentary environment. The process of determining the layer velocity between the first target seismic reflection horizon and the reference surface, based on the elevation depth corresponding to the first target seismic reflection horizon and the two-way travel time, includes: determining a first depth difference between the elevation depth corresponding to the first target seismic reflection horizon and the elevation depth corresponding to the reference surface; and determining the layer velocity between the first target seismic reflection horizon and the reference surface based on the first depth difference and the two-way travel time corresponding to the first target seismic reflection horizon.

[0123] Optionally, since the first depth difference refers to the distance from the first target seismic reflection layer to the reference surface, and the two-way travel time corresponding to the first target seismic reflection layer refers to the propagation time of the seismic wave between the first target seismic reflection layer and the reference surface (i.e., the time it takes for the seismic wave to travel from the first target seismic reflection layer to the reference surface and back), after determining the first depth difference, a reference depth difference is determined based on it. The quotient between the reference depth difference and the two-way travel time corresponding to the first target seismic reflection layer is then determined, and this quotient is used as the layer velocity between the first target seismic reflection layer and the reference surface. Alternatively, the quotient between the reference depth difference and the two-way travel time corresponding to the first target seismic reflection layer can be smoothed, and the smoothed result can be used as the layer velocity between the first target seismic reflection layer and the reference surface. Here, the reference depth difference is twice the first depth difference. The purpose of smoothing is to eliminate layer velocity anomalies caused by factors such as inconsistencies in the interpretation schemes of seismic reflection horizons between pre-stack depth migration data and pre-stack time migration data.

[0124] Optionally, the layer velocity between the first target seismic reflection layer and the reference surface is determined according to the following formula (2) based on the elevation depth corresponding to the first target seismic reflection layer, the two-way travel time, and the elevation depth corresponding to the reference surface.

[0125] Formula (2)

[0126] In the above formula (2), The layer velocity between the first target seismic reflection layer and the reference surface. The elevation depth corresponds to the seismic reflection horizon of the first target. The elevation depth corresponding to the reference surface. The two-way travel time corresponding to the first target seismic reflection layer.

[0127] For example, the elevation depth corresponding to the first target seismic reflection layer is 3750 meters, and the round-trip travel time is 2.95 seconds. The elevation depth corresponding to the reference surface is 750 meters. According to the above formula (2), the layer velocity between the first target seismic reflection layer and the reference surface is determined as follows: meters per second.

[0128] In one possible implementation, the process of determining the layer velocity between the first and second seismic reflection layers, based on the two-way travel time and elevation depth corresponding to the first seismic reflection layer and the two-way travel time and elevation depth corresponding to the second seismic reflection layer, includes: determining a second depth difference between the elevation depth corresponding to the first and second seismic reflection layers; determining a time difference between the two-way travel time corresponding to the first and second seismic reflection layers; and determining the layer velocity between the first and second seismic reflection layers based on the second depth difference and the time difference. Here, the first and second seismic reflection layers are two adjacent seismic reflection layers among multiple target seismic reflection layers, with the first seismic reflection layer located above the second seismic reflection layer.

[0129] Optionally, since the second depth difference refers to the distance from the first target seismic reflection layer to the second target seismic reflection layer, and the time difference refers to the round-trip propagation time of the seismic wave between the first and second target seismic reflection layers (i.e., the time it takes for the seismic wave to travel from the first target seismic reflection layer to the second target seismic reflection layer and back), after determining the second depth difference, the target depth difference is determined based on it. The quotient between the target depth difference and the time difference is then used as the layer velocity between the first and second target seismic reflection layers. Alternatively, the quotient between the target depth difference and the time difference can be smoothed, and the smoothed result can be used as the layer velocity between the first and second target seismic reflection layers. The target depth difference is twice the second depth difference.

[0130] Optionally, the layer velocity between the first and second seismic reflection layers is determined according to the following formula (3) based on the two-way travel time and elevation depth corresponding to the first seismic reflection layer and the two-way travel time and elevation height corresponding to the second seismic reflection layer.

[0131] Formula (3)

[0132] In the above formula (3), The layer velocity is between the first and second seismic reflection layers. This represents the elevation depth corresponding to the second seismic reflection layer. The elevation depth corresponding to the first seismic reflection layer. For the two-way travel time corresponding to the second seismic reflection layer, This is the two-way travel time corresponding to the first seismic reflection layer.

[0133] For example, the second target seismic reflection layer corresponds to an elevation depth of 4100 meters and a round-trip travel time of 3.15 seconds; the third target seismic reflection layer corresponds to an elevation depth of 6400 meters and a round-trip travel time of 4.2 seconds. The layer velocity between the second and third target seismic reflection layers is determined according to the above formula (3). meters per second.

[0134] It should be noted that the process for determining the layer velocity between the other two adjacent target seismic reflection layers is similar to the process for determining the layer velocity between the first and second seismic reflection layers, and will not be repeated here.

[0135] Figure 6 This is a plan view of the layer velocity between two adjacent target seismic reflection layers provided in an embodiment of this application. The corresponding figure is a plan view of the layer velocity between the first target seismic reflection layer and the reference plane; The corresponding figure is a plan view of the layer velocity between the first target earthquake reflection layer and the second target earthquake reflection layer; The corresponding figure is a plan view of the layer velocity between the second and third target earthquake reflection layers; The corresponding figure is a plan view of the layer velocity between the third and fourth target earthquake reflection layers; The corresponding figure is a plan view of the layer velocity between the fourth and fifth target earthquake reflection layers; The corresponding figure is a plan view of the layer velocity between the fifth and sixth target seismic reflection layers.

[0136] In step 204, the interpretation results of the fault profile corresponding to the first migration data are determined based on the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers.

[0137] In one possible implementation, the first migration data is pre-stack time migration data, and the second migration data is pre-stack depth migration data. An initial layer velocity volume is constructed, where the maximum elevation depth corresponding to the initial layer velocity volume is not less than the maximum elevation depth among multiple target seismic reflection horizons, and the minimum elevation depth corresponding to the initial layer velocity volume is not greater than the minimum elevation depth among multiple target seismic reflection horizons. Based on the layer velocity between the first target seismic reflection horizon and the reference surface, and the layer velocity between two adjacent target seismic reflection horizons, the initial layer velocity volume is updated layer by layer under the control of the target seismic reflection horizons to obtain the target layer velocity volume. The fracture profile interpretation results corresponding to the pre-stack depth migration data are then subjected to depth-time conversion based on the target layer velocity volume to obtain the fracture profile interpretation results of the pre-stack time migration data.

[0138] In one possible implementation, the first migration data is pre-stack depth migration data, and the second migration data is pre-stack time migration data. An initial layer velocity volume is constructed, where the maximum time corresponding to the initial layer velocity volume is not less than the maximum value of the two-way travel times corresponding to multiple target seismic reflection layers, and the minimum time corresponding to the initial layer velocity volume is not greater than the minimum value of the two-way travel times corresponding to multiple target seismic reflection layers. Based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, the initial layer velocity volume is updated layer by layer under the control of the target seismic reflection layers to obtain the target layer velocity volume. The fracture profile interpretation results corresponding to the pre-stack time migration data are then time-depth converted based on the target layer velocity volume to obtain the fracture profile interpretation results of the pre-stack depth migration data.

[0139] like Figure 7 This is a cross-sectional view of an initial layer velocity body provided in an embodiment of this application. The minimum elevation depth corresponding to the initial layer velocity body is -500 meters, and the maximum elevation depth corresponding to the initial layer velocity body is 11,000 meters.

[0140] Based on the layer velocity between the first target seismic reflection horizon and the reference surface, and the layer velocity between two adjacent target seismic reflection horizons, the initial layer velocity volume is updated layer by layer under the control of the target seismic reflection horizons. The process to obtain the target layer velocity volume includes: dividing the initial layer velocity volume into layers according to the elevation depth corresponding to each target seismic reflection horizon, ensuring that the number of strata included in the initial layer velocity volume is the same as the number of target seismic reflection horizons. For the first stratum in the initial layer velocity volume, if the elevation depth of the first stratum is less than the elevation depth corresponding to the first target seismic reflection horizon, then the layer velocity of the first stratum is updated to the layer velocity between the first target seismic reflection horizon and the reference surface. For the Nth stratum in the middle of the initial layer velocity volume, if the elevation depth of the Nth stratum is less than the elevation depth corresponding to the Nth target seismic reflection horizon, but greater than the elevation depth corresponding to the (N-1)th target seismic reflection horizon, then the layer velocity of the Nth stratum is updated to the layer velocity between the (N-1)th and Nth target seismic reflection horizons. For the last stratum in the initial layer velocity volume, if the elevation depth of the last stratum is greater than the elevation depth corresponding to the last target seismic reflection layer, the layer velocity of the last stratum is updated to the layer velocity between the last target seismic reflection layer and the second-to-last target seismic reflection layer, thus obtaining the target layer velocity volume.

[0141] Specifically, the layer velocity of the first stratum is updated to the layer velocity between the first target seismic reflection layer and the reference surface, and the initial layer velocity volume is updated to the first layer velocity volume. Since the layer velocity between the first target seismic reflection layer and the reference surface is two-dimensional planar data, and the first layer velocity volume is three-dimensional data, the longitudinal layer velocity of the first stratum remains unchanged for each seismic trace, and the layer velocity values ​​at the sampling points are the same.

[0142] For example, taking a target seismic reflection layer with 6 layers and an initial velocity volume comprising 6 strata, the process of filling the initial velocity volume to obtain the target velocity volume is illustrated as follows: For the first stratum, if the elevation depth of the first stratum is less than the elevation depth corresponding to the first target seismic reflection layer, the velocity of the first stratum is updated to the velocity between the first target seismic reflection layer and the reference surface, resulting in the first velocity volume. For the second stratum, if the elevation depth of the second stratum is less than the elevation depth corresponding to the second target seismic reflection layer but greater than the elevation depth corresponding to the first target seismic reflection layer, the velocity of the second stratum is updated to the velocity between the first target seismic reflection layer and the second seismic reflection layer, resulting in the second velocity volume. For the third stratum, if the elevation depth of the third stratum is less than the elevation depth corresponding to the third target seismic reflection layer but greater than the elevation depth corresponding to the second target seismic reflection layer, the velocity of the third stratum is updated to the velocity between the second target seismic reflection layer and the third seismic reflection layer, resulting in the third velocity volume. For the fourth stratum, if its elevation depth is less than the elevation depth corresponding to the fourth target seismic reflection horizon but greater than the elevation depth corresponding to the third target seismic reflection horizon, then the layer velocity of the fourth stratum is updated to the layer velocity between the third and fourth target seismic reflection horizons, resulting in the fourth layer velocity volume. For the fifth stratum, if its elevation depth is less than the elevation depth corresponding to the fifth target seismic reflection horizon but greater than the elevation depth corresponding to the fourth target seismic reflection horizon, then the layer velocity of the fifth stratum is updated to the layer velocity between the fourth and fifth target seismic reflection horizons, resulting in the fifth layer velocity volume. For the sixth stratum, if its elevation depth is less than the elevation depth corresponding to the sixth target seismic reflection horizon but greater than the elevation depth corresponding to the fifth target seismic reflection horizon, then the layer velocity of the sixth stratum is updated to the layer velocity between the fifth and sixth target seismic reflection horizons, resulting in the target layer velocity volume.

[0143] like Figure 8 This is a cross-sectional view of a first-layer velocity body provided in an embodiment of this application. Figure 8 In this context, the layer velocity of the first stratum is the layer velocity between the first target seismic reflection layer and the reference surface.

[0144] like Figure 9 This is a cross-sectional view of a second-layer velocity body provided in an embodiment of this application. Figure 9 In this context, the layer velocity of the first stratum is the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity of the second stratum is the layer velocity between the first target seismic reflection layer and the second target seismic reflection layer.

[0145] like Figure 10 This is a cross-sectional view of a third-layer velocity body provided in an embodiment of this application. Figure 10 In the first stratum, the layer velocity is the layer velocity between the first target seismic reflection layer and the reference surface; the layer velocity of the second stratum is the layer velocity between the first and second target seismic reflection layers; and the layer velocity of the third stratum is the layer velocity between the second and third target seismic reflection layers.

[0146] like Figure 11 This is a cross-sectional view of a fourth-layer velocity body provided in an embodiment of this application. Figure 11 In the above, the layer velocity of the first stratum is the layer velocity between the first target seismic reflection layer and the reference surface; the layer velocity of the second stratum is the layer velocity between the first and second target seismic reflection layers; the layer velocity of the third stratum is the layer velocity between the second and third target seismic reflection layers; and the layer velocity of the fourth stratum is the layer velocity between the third and fourth target seismic reflection layers.

[0147] like Figure 12 This is a cross-sectional view of a fifth-layer velocity body provided in an embodiment of this application. Figure 12 In the above, the layer velocity of the first stratum is the layer velocity between the first target seismic reflection layer and the reference surface; the layer velocity of the second stratum is the layer velocity between the first and second target seismic reflection layers; the layer velocity of the third stratum is the layer velocity between the second and third target seismic reflection layers; the layer velocity of the fourth stratum is the layer velocity between the third and fourth target seismic reflection layers; and the layer velocity of the fifth stratum is the layer velocity between the fourth and fifth target seismic reflection layers.

[0148] like Figure 13 This is a cross-sectional view of a target layer velocity body provided in an embodiment of this application. Figure 13 In the above, the layer velocity of the first stratum is the layer velocity between the first target seismic reflection layer and the reference surface; the layer velocity of the second stratum is the layer velocity between the first and second target seismic reflection layers; the layer velocity of the third stratum is the layer velocity between the second and third target seismic reflection layers; the layer velocity of the fourth stratum is the layer velocity between the third and fourth target seismic reflection layers; the layer velocity of the fifth stratum is the layer velocity between the fourth and fifth target seismic reflection layers; and the layer velocity of the sixth stratum is the layer velocity between the fifth and sixth target seismic reflection layers.

[0149] Figure 14 This is a schematic diagram showing a target layer velocity volume provided in an embodiment of this application.

[0150] Depth-time conversion is the process of converting seismic data from the depth domain to the time domain. It relies on velocity to reveal the underground geological structure. Time-depth conversion is the process of converting seismic data from the time domain to the depth domain. It relies on velocity to reveal the underground geological structure.

[0151] After determining the target layer velocity volume, the process of performing a depth-time transformation on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume to obtain the fracture profile interpretation results for the pre-stack time migration data includes: performing a depth-time transformation on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume to obtain a reference fracture profile interpretation result, and using the reference fracture profile interpretation result as the fracture profile interpretation result corresponding to the pre-stack time migration data. Alternatively, the reference fracture profile interpretation result can be projected onto the pre-stack time migration data, the matching degree between the reference fracture profile interpretation result and the pre-stack time migration data can be determined, and if the matching degree meets the matching requirements, the reference fracture profile interpretation result can be used as the fracture profile interpretation result corresponding to the pre-stack time migration data.

[0152] The process of projecting the reference fracture profile interpretation results onto pre-stack time-migration data and determining the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data, when the electronic device is a terminal device, includes: projecting the reference fracture profile interpretation results onto the pre-stack time-migration data, displaying the pre-stack time-migration data with the projected reference fracture profile interpretation results, and having the user judge whether the reference fracture profile interpretation results match the pre-stack time-migration data based on experience. The page displaying the pre-stack time-migration data with the reference fracture profile interpretation results also displays a first control and a second control. The first control indicates that the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data meets the matching requirements, and the second control indicates that the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data does not meet the matching requirements. Upon receiving an operation command for the first control, the terminal device determines that the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data meets the matching requirements.

[0153] Optionally, in response to the electronic device being a server, the process of projecting the reference fracture profile interpretation results onto pre-stack time-migration data and determining the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data includes: projecting the reference fracture profile interpretation results onto the pre-stack time-migration data, sending the pre-stack time-migration data with the projected reference fracture profile interpretation results to the terminal device for display. The page displaying the pre-stack time-migration data with the reference fracture profile interpretation results also displays a first control and a second control. The first control indicates that the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data meets the matching requirements, and the second control indicates that the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data does not meet the matching requirements. When the terminal device receives an operation instruction for the first control, the terminal device sends a first message to the server, the first message informing the server that the matching degree between the reference fracture profile interpretation results and the pre-stack time-migration data meets the matching requirements. When the terminal device receives the operation instruction for the second control, the terminal device sends a second message to the server. The second message is used to inform the server that the matching degree between the interpretation results of the reference fracture profile and the pre-stack time migration data does not meet the matching requirements.

[0154] If the matching degree between the interpretation results of the reference fault profile and the pre-stack time migration data does not meet the matching requirements, the process returns to the step of determining the target seismic reflection horizon and re-determines multiple target seismic reflection horizons. The number of re-determined target seismic reflection horizons is greater than the number of previously determined target seismic reflection horizons. Then, the process of steps 202 to 204 above is repeated until the matching degree between the determined interpretation results of the reference fault profile and the pre-stack time migration data meets the matching requirements.

[0155] Figure 15 This is a comparison diagram of the fracture profile interpretation results corresponding to pre-stack time migration data and the fracture profile interpretation results corresponding to pre-stack depth migration data provided in the embodiments of this application. Figure 15 The upper figure is a schematic diagram of the fracture profile interpretation results corresponding to pre-stack depth migration data. Figure 15 The figure below is a schematic diagram of the fracture profile interpretation results corresponding to pre-stack time migration data.

[0156] It should be noted that the experimental study was conducted in Block F of the carbonate oil and gas field in the Tarim Basin. One person spent 18 working days interpreting the fracture profiles of pre-stack depth migration data using pre-stack depth migration data. Similarly, if the same conventional seismic profile fracture interpretation method were used to interpret the fracture profiles of pre-stack time migration data, it would also take 18 working days. However, using the data processing method provided in the embodiments of this application, the time required to interpret the fracture profiles of pre-stack time migration data is reduced to 3 working days, significantly improving efficiency. This lays a solid foundation for the rapid search, comprehensive evaluation, and well placement of clastic and carbonate rock exploration and development targets in the Tarim Basin.

[0157] The above method utilizes first migration data, second migration data, and the fault profile interpretation results corresponding to the second migration data to determine the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers. Then, based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, the fault profile interpretation results corresponding to the first migration data are determined. This fully utilizes the fault profile interpretation results corresponding to the second migration data, improving the processing efficiency and accuracy of the first migration data.

[0158] Figure 16 The diagram shown is a structural schematic of a data processing device provided in an embodiment of this application. Figure 16 As shown, the device includes:

[0159] The acquisition module 1601 is used to acquire the fracture profile interpretation results corresponding to the first offset data, the second offset data and the second offset data. The blocks corresponding to the first offset data and the second offset data are the same, and the acquisition time of the first offset data is different from that of the second offset data. The first offset data and the second offset data are either pre-stack time offset data or pre-stack depth offset data, and the second offset data is different from the first offset data.

[0160] The determination module 1602 is used to determine multiple target seismic reflection horizons and the corresponding elevation depth and round-trip travel time of each target seismic reflection horizon based on the interpretation results of the fault profiles corresponding to the first migration data, the second migration data, and the second migration data.

[0161] The determination module 1602 is also used to determine the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers based on the elevation depth and two-way travel time corresponding to each target seismic reflection layer.

[0162] The determination module 1602 is also used to determine the fault profile interpretation results corresponding to the first migration data based on the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers.

[0163] In one possible implementation, the first offset data is pre-stack time offset data, and the second offset data is pre-stack depth offset data.

[0164] The determination module 1602 is used to determine multiple target seismic reflection horizons among multiple reference seismic reflection horizons based on the interpretation results of the fault profiles corresponding to the pre-stack depth migration data. The multiple reference seismic reflection horizons are determined based on pre-stack time migration data and pre-stack depth migration data. Based on the pre-stack time migration data, the two-way travel time corresponding to each target seismic reflection horizon is determined. Based on the pre-stack depth migration data, the elevation depth corresponding to each target seismic reflection horizon is determined.

[0165] In one possible implementation, the determining module 1602 is further configured to determine a pre-stack time migration profile corresponding to the pre-stack time migration data, and a pre-stack depth migration profile corresponding to the pre-stack depth migration data; determine multiple candidate seismic reflection horizons in the pre-stack time migration profile; and determine multiple reference seismic reflection horizons corresponding to the multiple candidate seismic reflection horizons in the pre-stack depth migration profile.

[0166] In one possible implementation, the determining module 1602 is used to determine a candidate seismic reflection horizon corresponding to the target seismic reflection horizon in the pre-stack time migration profile corresponding to the pre-stack time migration data; to take the two-way travel time of the candidate seismic reflection horizon corresponding to the target seismic reflection horizon as the two-way travel time corresponding to the target seismic reflection horizon; to determine a reference seismic reflection horizon corresponding to the target seismic reflection horizon in the pre-stack depth migration profile corresponding to the pre-stack depth migration data; and to take the elevation depth of the reference seismic reflection horizon corresponding to the target seismic reflection horizon as the elevation depth corresponding to the target seismic reflection horizon.

[0167] In one possible implementation, the interpretation results of the fracture profile corresponding to the pre-stack depth migration data include multiple faults and the starting and ending depths of each fault.

[0168] The determination module 1602 is used to determine the shallowest depth and the deepest depth based on the starting depth and ending depth of multiple faults included in the interpretation results of the fault profile corresponding to the pre-stack depth migration data; determine a first number of seismic reflection horizons in the reference seismic reflection horizons with an elevation depth lower than the shallowest depth; determine a second number of seismic reflection horizons in the reference seismic reflection horizons with an elevation depth higher than the deepest depth; determine a third number of seismic reflection horizons in the reference seismic reflection horizons with an elevation depth between the shallowest depth and the deepest depth; and use the first number of seismic reflection horizons, the second number of seismic reflection horizons, and the third number of seismic reflection horizons as target seismic reflection horizons.

[0169] In one possible implementation, the determining module 1602 is used to determine a first depth difference between the elevation depth corresponding to the first target seismic reflection layer and the elevation depth corresponding to the reference surface; determine the layer velocity between the first target seismic reflection layer and the reference surface based on the first depth difference and the two-way travel time corresponding to the first target seismic reflection layer; determine a second depth difference between the elevation depth corresponding to the first seismic reflection layer and the elevation depth corresponding to the second seismic reflection layer; determine the time difference between the two-way travel time corresponding to the first seismic reflection layer and the two-way travel time corresponding to the second seismic reflection layer; and determine the layer velocity between the first seismic reflection layer and the second seismic reflection layer based on the second depth difference and the time difference, wherein the first seismic reflection layer and the second seismic reflection layer are two adjacent seismic reflection layers among a plurality of target seismic reflection layers.

[0170] In one possible implementation, the first offset data is pre-stack time offset data, and the second offset data is pre-stack depth offset data.

[0171] The device also includes:

[0172] The construction module is used to construct the initial layer velocity volume. The maximum elevation depth corresponding to the initial layer velocity volume is not less than the maximum elevation depth among the multiple target seismic reflection layers, and the minimum elevation depth corresponding to the initial layer velocity volume is not greater than the minimum elevation depth among the multiple target seismic reflection layers.

[0173] The determination module 1602 is used to fill and update the initial layer velocity volume layer by layer under the control of the target seismic reflection layer, based on the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers, to obtain the target layer velocity volume; and to perform depth-time conversion on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume to obtain the fracture profile interpretation results of the pre-stack time migration data.

[0174] In one possible implementation, module 1602 is used to perform depth-time conversion on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume to obtain reference fracture profile interpretation results; project the reference fracture profile interpretation results onto the pre-stack time migration data; determine the matching degree between the reference fracture profile interpretation results and the pre-stack time migration data; and, based on the matching degree meeting the matching requirements, use the reference fracture profile interpretation results as the fracture profile interpretation results corresponding to the pre-stack time migration data.

[0175] The aforementioned device utilizes first migration data, second migration data, and the fracture profile interpretation results corresponding to the second migration data to determine the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers. Then, based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, it determines the fracture profile interpretation results corresponding to the first migration data. This fully utilizes the fracture profile interpretation results corresponding to the second migration data, improving the processing efficiency and accuracy of the first migration data.

[0176] It should be understood that the above-described apparatus is only illustrated by the division of the functional modules described above when implementing its functions. In practical applications, the functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the apparatus and method embodiments provided in the above embodiments belong to the same concept, and their specific implementation process can be found in the method embodiments, which will not be repeated here.

[0177] Figure 17 A structural block diagram of a terminal device 1700 provided in an exemplary embodiment of this application is shown. The terminal device 1700 may be a portable mobile terminal, such as a smartphone, tablet computer, MP3 player (Moving Picture Experts Group Audio Layer III), MP4 player (Moving Picture Experts Group Audio Layer IV), laptop computer, or desktop computer. The terminal device 1700 may also be referred to as a user device, portable terminal, laptop terminal, desktop terminal, or other names.

[0178] Typically, terminal device 1700 includes a processor 1701 and a memory 1702.

[0179] Processor 1701 may include one or more processing cores, such as a quad-core processor, an octa-core processor, etc. Processor 1701 may be implemented using at least one hardware form selected from DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), and PLA (Programmable Logic Array). Processor 1701 may also include a main processor and a coprocessor. The main processor, also known as a CPU (Central Processing Unit), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, processor 1701 may integrate a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content required to be displayed on the screen. In some embodiments, processor 1701 may also include an AI (Artificial Intelligence) processor, which is used to handle computational operations related to machine learning.

[0180] Memory 1702 may include one or more computer-readable storage media, which may be non-transitory. Memory 1702 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In some embodiments, the non-transitory computer-readable storage media in memory 1702 is used to store at least one instruction, which is executed by processor 1701 to implement the data processing method provided in the method embodiments of this application.

[0181] In some embodiments, the terminal device 1700 may also optionally include a peripheral device interface 1703 and at least one peripheral device. The processor 1701, memory 1702, and peripheral device interface 1703 can be connected via a bus or signal line. Each peripheral device can be connected to the peripheral device interface 1703 via a bus, signal line, or circuit board. Specifically, the peripheral device includes at least one of the following: a radio frequency circuit 1704, a display screen 1705, a camera assembly 1706, an audio circuit 1707, a positioning assembly 1708, and a power supply 1709.

[0182] Peripheral interface 1703 can be used to connect at least one I / O (Input / Output) related peripheral device to processor 1701 and memory 1702. In some embodiments, processor 1701, memory 1702 and peripheral interface 1703 are integrated on the same chip or circuit board; in some other embodiments, any one or two of processor 1701, memory 1702 and peripheral interface 1703 can be implemented on separate chips or circuit boards, which is not limited in this embodiment.

[0183] The radio frequency (RF) circuit 1704 is used to receive and transmit RF (Radio Frequency) signals, also known as electromagnetic signals. The RF circuit 1704 communicates with communication networks and other communication devices via electromagnetic signals. The RF circuit 1704 converts electrical signals into electromagnetic signals for transmission, or converts received electromagnetic signals back into electrical signals. Optionally, the RF circuit 1704 includes: an antenna system, an RF transceiver, one or more amplifiers, a tuner, an oscillator, a digital signal processor, a codec chipset, a user identity module card, etc. The RF circuit 1704 can communicate with other terminal devices through at least one wireless communication protocol. This wireless communication protocol includes, but is not limited to: the World Wide Web, metropolitan area networks, intranets, various generations of mobile communication networks (2G, 3G, 4G, and 5G), wireless local area networks, and / or WiFi (Wireless Fidelity) networks. In some embodiments, the RF circuit 1704 may also include circuitry related to NFC (Near Field Communication), which is not limited in this application.

[0184] Display screen 1705 is used to display a UI (User Interface). This UI may include graphics, text, icons, videos, and any combination thereof. When display screen 1705 is a touch display screen, it also has the ability to collect touch signals on or above its surface. These touch signals can be input as control signals to processor 1701 for processing. In this case, display screen 1705 can also be used to provide virtual buttons and / or a virtual keyboard, also known as soft buttons and / or a soft keyboard. In some embodiments, there may be one display screen 1705, disposed on the front panel of terminal device 1700; in other embodiments, there may be at least two display screens, disposed on different surfaces of terminal device 1700 or in a folded design; in still other embodiments, display screen 1705 may be a flexible display screen, disposed on a curved or folded surface of terminal device 1700. Furthermore, display screen 1705 may be configured as a non-rectangular, irregular shape, i.e., a non-rectangular screen. The display screen 1705 can be made of materials such as LCD (Liquid Crystal Display) and OLED (Organic Light-Emitting Diode).

[0185] The camera assembly 1706 is used to acquire images or videos. Optionally, the camera assembly 1706 includes a front-facing camera and a rear-facing camera. Typically, the front-facing camera is located on the front panel of the terminal device 1700, and the rear-facing camera is located on the back of the terminal device 1700. In some embodiments, there are at least two rear-facing cameras, which are any one of a main camera, a depth-sensing camera, a wide-angle camera, and a telephoto camera, to achieve background blurring by fusion of the main camera and the depth-sensing camera, panoramic shooting by fusion of the main camera and the wide-angle camera, VR (Virtual Reality) shooting, or other fusion shooting functions. In some embodiments, the camera assembly 1706 may also include a flash. The flash can be a single-color temperature flash or a dual-color temperature flash. A dual-color temperature flash refers to a combination of a warm light flash and a cool light flash, which can be used for light compensation at different color temperatures.

[0186] The audio circuit 1707 may include a microphone and a speaker. The microphone is used to collect sound waves from the user and the environment, converting the sound waves into electrical signals that are input to the processor 1701 for processing, or input to the radio frequency circuit 1704 for voice communication. For stereo sound acquisition or noise reduction purposes, multiple microphones may be used, each located at a different part of the terminal device 1700. The microphone may also be an array microphone or an omnidirectional microphone. The speaker is used to convert electrical signals from the processor 1701 or the radio frequency circuit 1704 into sound waves. The speaker may be a conventional diaphragm speaker or a piezoelectric ceramic speaker. When the speaker is a piezoelectric ceramic speaker, it can convert electrical signals not only into audible sound waves but also into inaudible sound waves for purposes such as distance measurement. In some embodiments, the audio circuit 1707 may also include a headphone jack.

[0187] Positioning component 1708 is used to locate the current geographic location of terminal device 1700 in order to enable navigation or LBS (Location Based Service). Positioning component 1708 can be a positioning component based on the US GPS (Global Positioning System), China's BeiDou system, Russia's Granas system, or the European Union's Galileo system.

[0188] Power supply 1709 is used to power the various components in terminal device 1700. Power supply 1709 can be AC ​​power, DC power, a disposable battery, or a rechargeable battery. When power supply 1709 includes a rechargeable battery, the rechargeable battery can be a wired rechargeable battery or a wireless rechargeable battery. A wired rechargeable battery is a battery that is charged via a wired line, and a wireless rechargeable battery is a battery that is charged via a wireless coil. The rechargeable battery can also be used to support fast charging technology.

[0189] In some embodiments, the terminal device 1700 further includes one or more sensors 1710. The one or more sensors 1710 include, but are not limited to: an accelerometer 1711, a gyroscope 1712, a pressure sensor 1713, a fingerprint sensor 1714, an optical sensor 1715, and a proximity sensor 1716.

[0190] Accelerometer 1711 can detect the magnitude of acceleration along the three coordinate axes of a coordinate system established by terminal device 1700. For example, accelerometer 1711 can be used to detect the components of gravitational acceleration along the three coordinate axes. Processor 1701 can control display screen 1705 to display the user interface in either a landscape or portrait view based on the gravitational acceleration signal acquired by accelerometer 1711. Accelerometer 1711 can also be used for games or for acquiring user motion data.

[0191] The gyroscope sensor 1712 can detect the orientation and rotation angle of the terminal device 1700. The gyroscope sensor 1712 can work in conjunction with the accelerometer sensor 1711 to acquire the user's 3D movements on the terminal device 1700. Based on the data acquired by the gyroscope sensor 1712, the processor 1701 can perform the following functions: motion sensing (e.g., changing the UI based on the user's tilt), image stabilization during shooting, game control, and inertial navigation.

[0192] The pressure sensor 1713 can be disposed on the side bezel of the terminal device 1700 and / or on the lower layer of the display screen 1705. When the pressure sensor 1713 is disposed on the side bezel of the terminal device 1700, it can detect the user's grip signal on the terminal device 1700, and the processor 1701 can perform left / right hand recognition or quick operation based on the grip signal collected by the pressure sensor 1713. When the pressure sensor 1713 is disposed on the lower layer of the display screen 1705, the processor 1701 can control the operable controls on the UI interface based on the user's pressure operation on the display screen 1705. The operable controls include at least one of button controls, scroll bar controls, icon controls, and menu controls.

[0193] The fingerprint sensor 1714 is used to collect a user's fingerprint. The processor 1701 identifies the user based on the fingerprint collected by the fingerprint sensor 1714, or vice versa. When the user's identity is identified as trusted, the processor 1701 authorizes the user to perform relevant sensitive operations, including unlocking the screen, viewing encrypted information, downloading software, making payments, and changing settings. The fingerprint sensor 1714 can be located on the front, back, or side of the terminal device 1700. When the terminal device 1700 has a physical button or manufacturer logo, the fingerprint sensor 1714 can be integrated with the physical button or manufacturer logo.

[0194] An optical sensor 1715 is used to collect ambient light intensity. In one embodiment, the processor 1701 can control the display brightness of the display screen 1705 based on the ambient light intensity collected by the optical sensor 1715. Specifically, when the ambient light intensity is high, the display brightness of the display screen 1705 is increased; when the ambient light intensity is low, the display brightness of the display screen 1705 is decreased. In another embodiment, the processor 1701 can also dynamically adjust the shooting parameters of the camera assembly 1706 based on the ambient light intensity collected by the optical sensor 1715.

[0195] The proximity sensor 1716, also known as a distance sensor, is typically located on the front panel of the terminal device 1700. The proximity sensor 1716 is used to detect the distance between the user and the front of the terminal device 1700. In one embodiment, when the proximity sensor 1716 detects that the distance between the user and the front of the terminal device 1700 is gradually decreasing, the processor 1701 controls the display screen 1705 to switch from a screen-on state to a screen-off state; when the proximity sensor 1716 detects that the distance between the user and the front of the terminal device 1700 is gradually increasing, the processor 1701 controls the display screen 1705 to switch from a screen-off state to a screen-on state.

[0196] Those skilled in the art will understand that Figure 17 The structure shown does not constitute a limitation on the terminal device 1700, and may include more or fewer components than shown, or combine certain components, or use different component arrangements.

[0197] Figure 18 This is a schematic diagram of the server structure provided in the embodiments of this application. The server 1800 can vary considerably due to different configurations or performance. It may include one or more Central Processing Units (CPUs) 1801 and one or more memories 1802. The one or more memories 1802 store at least one line of program code, which is loaded and executed by the one or more processors 1801 to implement the data processing methods provided in the various method embodiments described above. Of course, the server 1800 may also have wired or wireless network interfaces, a keyboard, and input / output interfaces for input and output. The server 1800 may also include other components for implementing device functions, which will not be elaborated here.

[0198] In an exemplary embodiment, a computer-readable storage medium is also provided, which stores at least one piece of program code that is loaded and executed by a processor to enable a computer to implement any of the above-described data processing methods.

[0199] Optionally, the aforementioned computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a compact disc read-only memory (CD-ROM), magnetic tape, floppy disk, and optical data storage device, etc.

[0200] In an exemplary embodiment, a computer program or computer program product is also provided, which stores at least one computer instruction, which is loaded and executed by a processor to enable the computer to implement any of the above-described data processing methods.

[0201] It should be noted that all information (including but not limited to user device information, user personal information, etc.), data (including but not limited to data used for analysis, stored data, displayed data, etc.), and signals involved in this application have been authorized by the user or fully authorized by all parties, and the collection, use, and processing of related data must comply with the relevant laws, regulations, and standards of the relevant countries and regions. For example, the first offset data, the second offset data, and the fracture profile interpretation results corresponding to the second offset data involved in this application were all obtained with full authorization.

[0202] It should be understood that "multiple" as used in this article refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0203] The sequence numbers of the embodiments in this application are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0204] The above description is merely an exemplary embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, improvements, etc., made within the principles of this application should be included within the protection scope of this application.

Claims

1. A data processing method, characterized in that, The method includes: Obtain the fracture profile interpretation results corresponding to the first offset data, the second offset data, and the second offset data. The blocks corresponding to the first offset data and the second offset data are the same, and the acquisition time of the first offset data is different from that of the second offset data. The first offset data and the second offset data are either pre-stack time offset data or pre-stack depth offset data, and the second offset data is different from the first offset data. Based on the first migration data, the second migration data, and the interpretation results of the fault profiles corresponding to the second migration data, multiple target seismic reflection horizons and the corresponding elevation depths and round-trip travel times of each target seismic reflection horizon are determined. Based on the elevation depth and two-way travel time corresponding to each target seismic reflection layer, determine the layer velocity between the first target seismic reflection layer and the reference surface, as well as the layer velocity between two adjacent target seismic reflection layers. Based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, the interpretation result of the fault profile corresponding to the first migration data is determined. Wherein, the first offset data is the pre-stack time offset data, and the second offset data is the pre-stack depth offset data; The step of determining multiple target seismic reflection horizons and the corresponding elevation depths and round-trip travel times for each target seismic reflection horizon based on the first migration data, the second migration data, and the interpretation results of the fault profiles corresponding to the second migration data includes: Based on the interpretation results of the fracture profile corresponding to the pre-stack depth migration data, multiple target seismic reflection horizons are determined among multiple reference seismic reflection horizons. The multiple reference seismic reflection horizons are determined based on the pre-stack time migration data and the pre-stack depth migration data. Based on the pre-stack time migration data, determine the two-way travel time corresponding to each target seismic reflection layer; Based on the pre-stack depth migration data, the elevation depth corresponding to each target seismic reflection layer is determined.

2. The method according to claim 1, characterized in that, Before determining multiple target seismic reflection horizons among multiple reference seismic reflection horizons based on the interpretation results of the fracture profiles corresponding to the pre-stack depth migration data, the method further includes: Determine the pre-stack time migration profile corresponding to the pre-stack time migration data, and determine the pre-stack depth migration profile corresponding to the pre-stack depth migration data; Multiple candidate seismic reflection horizons were identified in the pre-stack time migration profile. Multiple reference seismic reflection horizons are determined in the pre-stack depth migration profile, each corresponding to one of the multiple candidate seismic reflection horizons.

3. The method according to claim 1, characterized in that, The step of determining the two-way travel time corresponding to each target seismic reflection layer based on the pre-stack time migration data includes: In the pre-stack time migration profile corresponding to the target seismic reflection horizon, a candidate seismic reflection horizon is determined. The two-way travel time of the candidate seismic reflection horizon corresponding to the target seismic reflection horizon is taken as the two-way travel time corresponding to the target seismic reflection horizon. The step of determining the elevation depth corresponding to each target seismic reflection layer based on the pre-stack depth migration data includes: In the pre-stack depth migration profile corresponding to the target seismic reflection horizon, a reference seismic reflection horizon is determined. The elevation depth of the reference seismic reflection layer corresponding to the target seismic reflection layer is taken as the elevation depth corresponding to the target seismic reflection layer.

4. The method according to claim 1, characterized in that, The fracture profile interpretation results corresponding to the pre-stack depth migration data include multiple faults and the starting and ending depths of each fault. The step of determining multiple target seismic reflection horizons among multiple reference seismic reflection horizons based on the interpretation results of the fracture profiles corresponding to the pre-stack depth migration data includes: Based on the interpretation results of the fracture profile corresponding to the pre-stack depth migration data, the shallowest depth and the deepest depth are determined according to the starting depth and ending depth of the multiple faults. A first number of seismic reflection horizons are determined in the reference seismic reflection horizons whose elevation depth is lower than the shallowest depth; A second number of seismic reflection horizons are determined in the reference seismic reflection horizons with an elevation depth higher than the deepest depth; A third number of seismic reflection horizons are determined from the reference seismic reflection horizons whose elevation depth is between the shallowest depth and the deepest depth; The first number of seismic reflection horizons, the second number of seismic reflection horizons, and the third number of seismic reflection horizons are taken as the target seismic reflection horizons.

5. The method according to any one of claims 1 to 4, characterized in that, The step of determining the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, based on the elevation depth and two-way travel time corresponding to each target seismic reflection layer, includes: Determine a first depth difference between the elevation depth corresponding to the first target seismic reflection layer and the elevation depth corresponding to the reference surface; determine the layer velocity between the first target seismic reflection layer and the reference surface based on the first depth difference and the two-way travel time corresponding to the first target seismic reflection layer; Determine the second depth difference between the elevation depth corresponding to the first seismic reflection layer and the elevation depth corresponding to the second seismic reflection layer; determine the time difference between the two-way travel time corresponding to the first seismic reflection layer and the two-way travel time corresponding to the second seismic reflection layer; determine the layer velocity between the first seismic reflection layer and the second seismic reflection layer based on the second depth difference and the time difference, wherein the first seismic reflection layer and the second seismic reflection layer are two adjacent seismic reflection layers among the plurality of target seismic reflection layers.

6. The method according to any one of claims 1 to 4, characterized in that, Before determining the fault profile interpretation result corresponding to the first migration data based on the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers, the method further includes: Construct an initial layer velocity volume, wherein the maximum elevation depth corresponding to the initial layer velocity volume is not less than the maximum elevation depth among the multiple target seismic reflection layers, and the minimum elevation depth corresponding to the initial layer velocity volume is not greater than the minimum elevation depth among the multiple target seismic reflection layers. The step of determining the fault profile interpretation results corresponding to the first migration data based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, includes: Based on the layer velocity between the first target seismic reflection layer and the reference surface, and the layer velocity between two adjacent target seismic reflection layers, the initial layer velocity volume is updated layer by layer under the control of the target seismic reflection layer to obtain the target layer velocity volume. Based on the target layer velocity volume, the fracture profile interpretation results corresponding to the pre-stack depth migration data are subjected to depth-time conversion to obtain the fracture profile interpretation results of the pre-stack time migration data.

7. The method according to claim 6, characterized in that, The step of performing a depth-time conversion on the fracture profile interpretation results corresponding to the pre-stack depth migration data based on the target layer velocity volume to obtain the fracture profile interpretation results of the pre-stack time migration data includes: Based on the target layer velocity volume, the fracture profile interpretation results corresponding to the pre-stack depth migration data are subjected to depth-time conversion to obtain the reference fracture profile interpretation results. The interpretation results of the reference fracture profile are projected onto the pre-stack time migration data; Determine the degree of matching between the interpretation results of the reference fracture profile and the pre-stack time migration data; Based on the matching degree meeting the matching requirements, the interpretation result of the reference fracture profile is used as the interpretation result of the fracture profile corresponding to the pre-stack time migration data.

8. A data processing apparatus, characterized in that, The device includes: The acquisition module is used to acquire the first offset data, the second offset data, and the fracture profile interpretation results corresponding to the second offset data. The blocks corresponding to the first offset data and the blocks corresponding to the second offset data are the same, and the acquisition time of the first offset data is different from that of the second offset data. The first offset data and the second offset data are either pre-stack time offset data or pre-stack depth offset data, and the second offset data is different from the first offset data. The determination module is used to determine multiple target seismic reflection horizons and the corresponding elevation depth and round-trip travel time of each target seismic reflection horizon based on the first migration data, the second migration data and the interpretation results of the fault profile corresponding to the second migration data; The determining module is further configured to determine the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers based on the elevation depth and round-trip travel time corresponding to each target seismic reflection layer. The determining module is further configured to determine the fracture profile interpretation results corresponding to the first migration data based on the layer velocity between the first target seismic reflection layer and the reference surface and the layer velocity between two adjacent target seismic reflection layers. Wherein, the first offset data is the pre-stack time offset data, and the second offset data is the pre-stack depth offset data; The determining module is specifically used for: Based on the interpretation results of the fracture profile corresponding to the pre-stack depth migration data, multiple target seismic reflection horizons are determined among multiple reference seismic reflection horizons. The multiple reference seismic reflection horizons are determined based on the pre-stack time migration data and the pre-stack depth migration data. Based on the pre-stack time migration data, determine the two-way travel time corresponding to each target seismic reflection layer; Based on the pre-stack depth migration data, the elevation depth corresponding to each target seismic reflection layer is determined.

9. An electronic device, characterized in that, The electronic device includes a processor and a memory, the memory storing at least one piece of program code, which is loaded and executed by the processor to enable the electronic device to implement the data processing method as described in any one of claims 1 to 7.

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