A transformer testing tool and a testing method thereof

Abstract

The application discloses a transformer testing tool and a testing method thereof, and belongs to the technical field of transformer performance testing, which comprises elastic telescopic probes, probe racks, sliding blocks and a transformer placing table. The transformer placing table is installed in the middle of the base. Two groups of elastic telescopic probes are symmetrically arranged on both sides of the transformer placing table. Each group of elastic telescopic probes is arranged in two rows in an interlaced manner on the probe rack. The probe rack is fixedly connected to the upper end of the sliding block. The sliding block is connected to two guide rods through two linear bearings. The two guide rods are fixedly connected to the transformer placing table. The sliding block is fixedly connected to the cylinder rod of a telescopic cylinder. The cylinder base of the telescopic cylinder is fixedly connected to a cylinder rack. The cylinder rack is fixedly connected to the base. The elastic telescopic probes are abutted against the pins of the multi-pin transformer, stable electrical connection is realized, the problem of poor contact in the testing process is avoided, the testing accuracy of the multi-pin transformer is improved, the elastic contact pins also reduce the probability of pin damage.

Description

Technical Field

[0001] This invention relates to a transformer testing fixture and its testing method, belonging to the technical field of transformer performance testing equipment. Background Technology

[0002] When testing the electrical performance of multi-pin transformers (such as inductance turns ratio and RDC polarity), they are usually tested by snapping them onto a circuit board. However, during the snapping process between the pins and the circuit board, unreliable contact can easily occur, leading to inaccurate testing. Moreover, the small pins are also prone to damage during connection. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a transformer testing fixture and testing method to solve the problems existing in the prior art.

[0004] The technical solution adopted by the present invention is as follows: a transformer testing fixture, including an elastic telescopic probe, a probe holder, a sliding block and a transformer placement platform. The transformer placement platform is installed in the middle of the base. Two sets of elastic telescopic probes are arranged, symmetrically located on both sides of the transformer placement platform. The probe holder is fixedly connected to the upper end of the sliding block. The sliding block is connected to two guide rods through two linear bearings. The two guide rods are fixedly connected to the transformer placement platform. The sliding block is fixedly connected to the cylinder rod of the telescopic cylinder. The cylinder seat of the telescopic cylinder is fixedly connected to the cylinder frame. The cylinder frame is fixedly connected to the base.

[0005] Furthermore, each set of elastic telescopic probes is arranged in two staggered rows on the probe holder, with the upper row of elastic telescopic probes resting against the side of the pin and the lower row of pins abutting against the vertical surface of the pin.

[0006] Furthermore, the probe holder is provided with a square through hole in the middle, and a probe mounting through hole is provided on the side of the square through hole facing the elastic telescopic probe.

[0007] Furthermore, two strip-shaped horizontal holes are provided on both sides of the probe holder, and the probe holder is fixedly connected to the sliding block by screws passing through the two strip-shaped horizontal holes.

[0008] Furthermore, the aforementioned transformer placement platform includes a supporting sliding platform and a supporting slide block. The top of the supporting slide block is provided with a longitudinal sliding groove, and the bottom of the supporting sliding platform is provided with a longitudinal sliding bar, which is movably embedded into the longitudinal sliding groove.

[0009] Furthermore, the top of the transformer placement platform is provided with a U-shaped groove structure. The two side walls of the groove structure are provided with two sets of guide holes facing the two sets of elastic telescopic probes. The bottom of both sides of the groove structure is provided with two pin placement strip slots. The boss between the two pin placement strip slots is symmetrically provided with positioning plates.

[0010] Furthermore, the aforementioned positioning plate is provided with strip-shaped mounting holes, and the positioning plate is fixed to the transformer placed on the platform by passing locking screws through the strip-shaped mounting holes.

[0011] A test method for a transformer test fixture is provided. The method is as follows: a multi-pin transformer under test is mounted on a transformer placement platform, with the pins mounted at two sets of guide holes on the transformer placement platform. Telescopic cylinders on both sides are controlled to drive the elastic telescopic probe to move. Finally, the elastic telescopic probe abuts against the pin and feeds the signal back to the tester to realize the performance test of the transformer. After the test is completed, the elastic telescopic probe is retracted and the next transformer under test is placed.

[0012] The beneficial effects of the present invention are as follows: Compared with the prior art, the present invention has the following advantages: (1) The present invention uses an elastic telescopic probe for testing. The probes on both sides directly and elastically abut against the pins of the multi-pin transformer to achieve a stable electrical connection, avoid the problem of poor contact during the test, improve the test accuracy of the multi-pin transformer, and reduce the probability of pin damage by elastically contacting the pins. (2) The present invention uses double-row elastic telescopic probes arranged in an alternating manner. The upper row of elastic telescopic probes is close to the side of the pin, and the lower row of pins is close to the vertical surface of the pin. This avoids the small probes from easily deforming and causing test failure. The reason is that multiple test probes are arranged horizontally in one layer, and all probes directly contact the vertical surface of the pin. When the pin spacing is small, very small probes need to be selected. Furthermore, test probes are easily deformed, causing short circuit test failure between adjacent test probes. (3) The present invention provides a guide hole to improve the guiding accuracy and the contact stability of the small probe, and avoids bending caused by force. It provides a pin placement groove to facilitate the placement of the transformer pin in the groove. During the probe contact extension and retraction process, it can improve the support stability and make the elastic contact more reliable. It provides a positioning plate to facilitate the rapid positioning of the transformer and improve the testing efficiency. The strip mounting hole facilitates the position adjustment. The positioning plate is embedded in the directional groove on the boss, which can quickly realize directional movement and improve the positioning accuracy and reliability of the transformer device. Attached Figure Description

[0013] Figure 1 This is a three-dimensional structural diagram of a transformer testing fixture; Figure 2 This is a front view schematic diagram of the transformer testing fixture; Figure 3 This is a top view schematic diagram of the transformer testing fixture; Figure 4 This is a schematic diagram of the left-hand structure of a transformer testing fixture; Figure 5 yes Figure 1 Schematic diagram of the cross-sectional structure of the middle AA section; Figure 6 This is a schematic diagram of a dual-row probe contact pin arrangement structure. Detailed Implementation

[0014] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0015] Example 1: As Figure 1-6 As shown, a transformer testing fixture includes an elastic telescopic probe 1, a probe holder 2, a sliding block 3, and a transformer placement platform 4. The transformer placement platform 4 is installed in the middle of the base 5. Two sets of elastic telescopic probes 1 are arranged symmetrically on both sides of the transformer placement platform 4. Each set of elastic telescopic probes 1 has two staggered rows arranged vertically on the probe holder 2. The upper row of elastic telescopic probes rests against the side of the pin, and the lower row of pins abuts against the vertical surface of the pin. The probe holder 2 is fixedly connected to the upper end of the sliding block 3. The sliding block 3 is connected to two guide rods 7 through two linear bearings 6. The two guide rods 7 are fixedly connected to the transformer placement platform 4. The sliding block 3 is fixedly connected to the cylinder rod of the telescopic cylinder 8. The cylinder seat of the telescopic cylinder 8 is fixedly connected to the cylinder frame 9. The cylinder frame 9 is fixedly connected to the base 5.

[0016] The test employs a double-row flexible telescopic probe with staggered arrangement. The upper row of flexible telescopic probes rests against the side of the pin, while the lower row of pins rests against the vertical surface of the pin. This avoids the small probes from easily deforming and causing test failure. The reason for this is that multiple test probes are arranged horizontally in one layer, and all probes directly contact the vertical surface of the pin. When the pin spacing is small, very small probes need to be selected, and test probes are prone to deformation, which can cause short circuits between adjacent test probes and test failure.

[0017] To facilitate the connection of the elastic telescopic probe, a square through hole 10 is provided in the middle of the probe holder 2. The square through hole 10 facing the elastic telescopic probe 1 has a square through hole for probe installation. The square through hole facilitates the placement of space after the cable is connected to the elastic probe. Two strip-shaped horizontal holes 11 are provided on both sides of the probe holder 2. The probe holder 2 is fixedly connected to the sliding block 3 by screws passing through the two strip-shaped horizontal holes 11. The strip-shaped horizontal holes enable quick adjustment and locking of the lateral position.

[0018] Furthermore, the aforementioned transformer placement platform 4 includes a supporting sliding platform 401 and a supporting slide 402. The top of the supporting slide 402 is provided with a longitudinal groove, and the bottom of the supporting sliding platform 401 is provided with a longitudinal slide bar. The longitudinal slide bar is movably embedded into the longitudinal groove, enabling longitudinal position adjustment and facilitating quick and easy longitudinal positioning. The top of the transformer placement platform 4 is provided with a U-shaped groove structure 12. The two side walls of the groove structure 12 are provided with two sets of guide holes facing the two sets of elastic telescopic probes 1. The guide holes improve guiding accuracy and the stability of the small probes, preventing bending under stress. Two pin placement strips are provided at the bottom of both sides of the groove structure 12. The through slot 13 is provided with a pin placement slot, which facilitates the placement of transformer pins in the slot. During the probe's contact and extension process, it can improve support stability and make the elastic contact more reliable. The boss between the two pin placement slots 13 is symmetrically arranged with positioning plates 14. The positioning plates facilitate the rapid positioning of the transformer and improve testing efficiency. The positioning plates 14 are provided with strip-shaped mounting holes 15. The positioning plates 14 are fixed on the transformer placement platform 4 by locking screws passing through the strip-shaped mounting holes 15. The strip-shaped mounting holes facilitate position adjustment. The positioning plates are embedded in the directional grooves on the bosses, which can quickly realize directional movement and improve the positioning accuracy and reliability of the transformer devices.

[0019] Example 2: A test method for a transformer test fixture. The method is as follows: a multi-pin transformer under test is mounted on a transformer placement platform. The pins are mounted at two sets of guide holes on the transformer placement platform. The telescopic cylinders on both sides are controlled to drive the elastic telescopic probe to move. Finally, the elastic telescopic probe abuts against the pin and feeds the signal back to the tester to realize the performance test of the transformer. After the test is completed, the elastic telescopic probe is retracted and the next transformer under test is placed.

[0020] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of protection of the claims.

Claims

1. A transformer testing fixture, characterized in that: The system includes an elastic telescopic probe (1), a probe holder (2), a sliding block (3), and a transformer placement platform (4). The transformer placement platform (4) is installed in the middle of the base (5). Two sets of elastic telescopic probes (1) are set up and are symmetrically located on both sides of the transformer placement platform (4). The probe holder (2) is fixedly connected to the upper end of the sliding block (3). The sliding block (3) is connected to two guide rods (7) through two linear bearings (6). The two guide rods (7) are fixedly connected to the transformer placement platform (4). The sliding block (3) is fixedly connected to the cylinder rod of the telescopic cylinder (8). The cylinder seat of the telescopic cylinder (8) is fixedly connected to the cylinder frame (9). The cylinder frame (9) is fixedly connected to the base (5). Each set of elastic telescopic probes (1) has two staggered rows arranged on the probe holder (2), with the upper row of elastic telescopic probes against the side of the pin and the lower row of pins against the vertical surface of the pin.

2. The transformer testing fixture according to claim 1, characterized in that: The probe holder (2) is provided with a square through hole (10) in the middle, and a probe mounting through hole is provided on the side of the square through hole (10) facing the elastic telescopic probe (1).

3. The transformer testing fixture according to claim 1, characterized in that: Two strip-shaped horizontal holes (11) are provided on both sides of the probe holder (2). The probe holder (2) is fixedly connected to the sliding block (3) by screws passing through the two strip-shaped horizontal holes (11).

4. The transformer testing fixture according to claim 1, characterized in that: The transformer placement platform (4) includes a support sliding platform (401) and a support slide (402). The support slide (402) has a longitudinal groove at the top and a longitudinal slide bar at the bottom of the support sliding platform (401). The longitudinal slide bar is movably embedded into the longitudinal groove.

5. A transformer testing fixture according to claim 1, characterized in that: The transformer placement platform (4) has a U-shaped groove structure (12) on the top. The two sides of the groove structure (12) have two sets of guide holes facing the two sets of elastic telescopic probes (1). The bottom of the two sides of the groove structure (12) has two pin placement strip slots (13). The boss between the two pin placement strip slots (13) is symmetrically positioned with positioning plates (14).

6. A transformer testing fixture according to claim 5, characterized in that: The positioning plate (14) is provided with a strip-shaped mounting hole (15). The positioning plate (14) is fixed on the transformer placement platform (4) by passing the locking screw through the strip-shaped mounting hole (15).

7. A test method for a transformer testing fixture according to any one of claims 1-2 and 4-6, characterized in that: The multi-pin transformer under test is mounted on the transformer placement platform. The pins are mounted at two sets of guide holes on the transformer placement platform. The telescopic cylinders on both sides are controlled to drive the elastic telescopic probe to move. Finally, the elastic telescopic probe abuts against the pin and feeds the signal back to the tester to realize the performance test of the transformer. After the test is completed, the elastic telescopic probe is retracted and the next transformer under test is placed.

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