A pulse current source output current index measurement method and system

Abstract

The present application relates to a kind of pulse current source output current index measurement method and system, system includes: the main circuit of current source to be measured and its load, power supply control device, current measuring device and synchronous control device;The main circuit of current source to be measured and its load includes the main circuit of current source to be measured and magnet load, and the output end of the main circuit of current source to be measured is connected with the excitation coil of the magnet load both ends to form current path;The power supply control device is used to under the control of the synchronous control device, the output current of the main circuit of current source to be measured is controlled in closed loop;The current measuring device is used to under the control of the synchronous control device, the output current of the main circuit of current source to be measured is collected, and the output current index of the main circuit of current source to be measured is obtained by calculation.The present application can be widely applied in the field of synchrotron particle accelerator.

Description

Technical Field

[0001] This invention belongs to the field of synchrotron particle accelerators, and relates to the field of high-precision synchronous pulse current source output current quality measurement for providing excitation current to synchrotron particle accelerator magnets. Specifically, it relates to a method and system for measuring the output current index of a pulse current source. Background Technology

[0002] Particle accelerators accelerate charged particles to produce high-energy particle beams for high-energy physics experiments. To reduce the length and footprint of particle accelerator facilities, most particle accelerators worldwide employ a ring structure, including synchrotrons based on the principle of automatic phase stabilization. Synchrotrons accelerate charged particles using a high-frequency electric field and constrain their trajectory using a changing magnetic field. The synchrotron's ring track houses a high-frequency cavity and various magnets driven by an excitation current source. The high-frequency cavity generates a high-frequency electric field with controllable frequency, amplitude, and phase, ensuring its frequency is an integer multiple of the particle beam's cyclotron frequency. The magnets generate controllable deflection and confinement magnetic fields, allowing the charged particles to move within the synchrotron's vacuum chamber. During synchrotron operation, the particle beam's cyclotron frequency changes with the particle's energy; the frequency, amplitude, and phase of the high-frequency electric field must be synchronously adjusted to match the real-time energy changes of the particle beam. At the same time, the excitation current source device needs to provide a changing excitation current so that the magnet generates a magnetic field that adapts to the real-time changes in particle energy, so that the charged particle beam is subjected to a suitable Lorentz force and moves along the designed trajectory.

[0003] The synchronization of the magnet excitation current with the particle energy and the high-frequency cavity is crucial for the normal operation and acceleration of the charged beam in an accelerator. During the beam acceleration cycle of a synchrotron, the excitation current source needs to output a pulsed current waveform. According to the internal model principle, the current source device based on a proportional-integral (PI) controller, widely used in engineering, exhibits an error in its output current when the given current dynamically changes. This error is related to the electromagnetic inertia of the excitation current source device and the rate of change of the given current waveform. The excitation power supply used to generate the magnetic field for the accelerator deflector magnets, together with the magnet load, forms a large electromagnetic inertia system, and the first derivative of its pulsed given current waveform is not fixed. Therefore, the output current of the excitation power supply will inevitably have a time-varying error with the given current, i.e., a tracking error. Simultaneously, the voltage reference of the actual analog-to-digital converter (ADC) of the current source has a relative error on the order of ppm (parts per million), resulting in repeatability differences on the order of ppm between the relative tracking errors of multiple pulse currents output by the current source. Follow-up errors and their repeatability variations will affect the matching degree between the deflection magnet excitation current and the particle energy, thereby reducing accelerator beam efficiency or even causing beam loss. In addition, the output current of the actual current source will inevitably be superimposed with high-frequency current ripple, which will induce corresponding magnetic field ripple errors in the magnet, causing deviation of the beam from the designed trajectory and modulation of lateral oscillations, which will also reduce beam efficiency.

[0004] Therefore, it is necessary to measure and quantify the following error, repeatability, and ripple error of the excitation current source output current in order to evaluate the ripple performance of the excitation current source and provide a reference for analyzing the impact of magnetic field ripple on beam efficiency.

[0005] However, traditional current quality testing methods focus on observing the ripple and long-term stability of DC current, and use independent current sampling devices to sample the DC output current. This method uses the short-term ripple band width as the current ripple index and the long-term ripple band centerline offset as the stability index. Its measurement results are easily affected by factors such as abnormal data points, resulting in high uncertainty, and it cannot be conveniently applied to pulse current index measurements. Furthermore, the traditional definition of current source stability index as the relative distribution of error at the maximum output current value cannot accurately reflect the current source performance across the entire operating current range; it also does not consider the response characteristics of the accelerator magnet's magnetic field, and additionally includes high-frequency components that do not affect the magnetic field. Summary of the Invention

[0006] To address the problems of low efficiency, low accuracy, and incomplete indicators in traditional current quality testing methods, this invention aims to provide a highly efficient, accurate, and comprehensive method and system for measuring the output current indicators of a pulse current source, capable of comprehensively reflecting the performance of the current source across its entire operating range. This method includes the measurement and quantification of tracking error, ripple error, and repeatability indicators, meeting the needs for reasonable evaluation of the ripple performance of excitation current sources and providing a reference for analyzing the impact of magnetic field ripple on beam efficiency.

[0007] To achieve the above objectives, the present invention adopts the following technical solution:

[0008] In a first aspect, the present invention provides a pulse current source output current index measurement system, comprising:

[0009] The main circuit of the current source under test and its load, power control device, current measuring device and synchronization control device;

[0010] The main circuit of the current source under test and its load include the main circuit of the current source under test and the magnetic load, and the output terminal of the main circuit of the current source under test is connected to the two ends of the excitation coil of the magnetic load to form a current path.

[0011] The power control device is used to perform closed-loop control of the output current of the main circuit of the current source under test under the control of the synchronization control device.

[0012] The current measuring device is used to collect the output current of the main circuit of the current source under test under the control of the synchronous control device, and to calculate the output current index of the main circuit of the current source under test.

[0013] Furthermore, the power control device includes a first host computer, a first controller, a first ADC, and a first current sensor;

[0014] The first host computer is used to generate a current given waveform according to the test requirements and send it to the first controller;

[0015] The first controller is used to interpolate the current given waveform to generate a current given interpolation waveform, and after receiving the synchronization pulse trigger signal of the synchronization control device, it controls the output current of the main circuit of the power supply under test, and sends the current given interpolation waveform to the current measuring device.

[0016] The first current sensor is used to collect the output current of the main circuit of the current source under test. After sampling by the first ADC, the current is sent to the first controller to realize closed-loop control of the output current of the main circuit of the current source under test.

[0017] Furthermore, the current measuring device includes a second host computer, a second controller, a second ADC, and a second current sensor;

[0018] The second current sensor is used to collect the output current of the main circuit of the current source under test, and after sampling by the second ADC, it is sent to the second controller;

[0019] The second controller is used to start storing the current measurement waveform of the output current sampled by the second ADC after receiving the synchronization pulse trigger signal from the synchronization control device, and then send it to the second host computer.

[0020] The second host computer calculates the output current index of the main circuit of the current source under test based on the interpolated waveform of the current given and the current measurement waveform.

[0021] Furthermore, the synchronization control device employs a synchronization trigger.

[0022] Secondly, the present invention provides a method for measuring the output current index of a pulse current source, comprising the following steps:

[0023] Configure a pulse current source output current index measurement system, which includes a power control device, a current measurement device, and a synchronization control device;

[0024] The power control device generates a current-set interpolated waveform I according to the test requirements. SET (n), and under the control of the synchronous control device, the output current of the main circuit of the current source under test is controlled in a closed loop;

[0025] The current measuring device acquires the output current of the main circuit of the current source under test in real time, and measures the current measurement waveform I of the output current of the main circuit of the current source under test under the control of the synchronous control device. M (n);

[0026] Based on current-given interpolated waveform I SET (n) and current measurement waveform I M (n) is used to calculate the output current index of the current source under test.

[0027] Furthermore, the current-based interpolated waveform I SET (n) and current measurement waveform I M (n), the output current parameters of the current source under test are calculated, including:

[0028] The current error waveform I is obtained by subtracting the measured current waveform and the interpolated current waveform. Error (n);

[0029] Gaussian smoothing is applied to the current error waveform to obtain the low-frequency following error I of the output current of the current source under test.ErrorF (n);

[0030] Current error I Error (n) minus the low-frequency following error I ErrorF (n), to obtain the high-frequency ripple error I of the output current of the current source under test. ErrorR (n);

[0031] Based on current error I Error (n), Low-frequency following error I ErrorF (n) and high-frequency ripple error I ErrorR (n) is used to calculate the output current parameters of the current source under test.

[0032] Furthermore, before subtracting the current measurement waveform and the current given interpolation waveform, the current measurement waveform and the current given interpolation waveform need to be low-pass filtered.

[0033] Furthermore, the low-frequency following error is expressed as follows:

[0034]

[0035] In the formula, h G (k) is the weighting function; W is the window length; n∈[0:N], and N is the number of discretization points of the current given waveform within the time interval [0:T], and T is the period of the current source device under test.

[0036] Furthermore, the high-frequency ripple error I ErrorR The formula for calculating (n) is:

[0037] I ErrorR (n)=I Error (n)-I ErrorF (n).

[0038] Furthermore, the output current parameters of the current source under test include the following parameters: ...

[0039] The present invention has the following advantages due to the adoption of the above technical solutions:

[0040] 1. Because the present invention is equipped with a synchronous trigger, it ensures that the output current measuring device and the current source device start current output or data sampling at the same time, thus minimizing the measurement error introduced by the time difference between the two systems.

[0041] 2. This invention decouples the current error waveform from the following error and the ripple error, and quantifies the current quality from two aspects.

[0042] 3. This invention utilizes methods such as synchronous trigger acquisition, error decoupling processing, and statistical calculation to achieve synchronous acquisition and synchronous quantitative calculation and analysis of current following error and current ripple error, which greatly simplifies the measurement and index quantification process and greatly reduces the uncertainty of measurement results.

[0043] 4. The error curve of this invention provides a reference for frequency adjustment of the high-frequency electric field of the high-frequency cavity system.

[0044] 5. The following error of three times the standard deviation of the present invention provides a quantitative evaluation basis for the current source following performance.

[0045] 6. The repeatability index of the following error in this invention provides a quantitative basis for evaluating the repeatability performance of the current source output.

[0046] 7. The current ripple error of the present invention after low-pass filtering is three times the standard deviation, which provides a quantitative evaluation basis for the ripple performance of the excitation current source and provides a reference for analyzing the influence of the magnetic field ripple of the accelerator magnet on the beam. The low-pass filtering effectively removes the high-frequency ripple components that have almost no influence on the magnetic field of the magnet.

[0047] 8. The three-standard-deviation calculation method of this invention, as a statistical method, effectively avoids the influence of individual noise and outliers in the sampling on the quantization results, making the quantization results more accurately reflect the actual current ripple quality.

[0048] 9. The excitation current ripple error spectrum analysis of this invention provides a basis for predicting the influence of different frequency components in the accelerator magnetic field ripple on the beam.

[0049] Therefore, this invention can be widely applied in the field of synchrotron particle accelerators. Attached Figure Description

[0050] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Throughout the drawings, the same reference numerals denote the same parts. In the drawings:

[0051] Figure 1 A structural diagram of a pulse power supply output current measurement system provided in an embodiment of the present invention;

[0052] Figure 2 A flowchart of a pulse current source output current index measurement method provided in an embodiment of the present invention;

[0053] Figure 3 The output pulse current waveform diagram of the pulse current source provided in the embodiment of the present invention;

[0054] Figure 4The pulse current source output current error waveform diagram provided in the embodiment of the present invention;

[0055] Figure 5 The pulse current source output current following error waveform diagram provided in the embodiment of the present invention;

[0056] Figure 6 The waveform diagram of the output current ripple error of the pulse current source provided in the embodiment of the present invention;

[0057] The components in the diagram are labeled as follows:

[0058] 1. Main circuit of the current source under test and its load; 11. Main circuit of the current source under test; 12. Magnet load; 2. Power control device; 21. First host computer; 22. First controller; 23. First current sensor; 3. Current measuring device; 31. Second host computer; 32. Second controller; 33. Second current sensor; 4. Synchronization control device. Detailed Implementation

[0059] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the described embodiments of the present invention are within the scope of protection of the present invention.

[0060] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0061] In some embodiments of the present invention, a method for measuring the output current index of a pulsed current source is provided. This method first extracts the low-frequency following error from the current error using Gaussian smoothing, and subtracts the low-frequency following error from the current error to obtain the high-frequency ripple error. Then, three times the standard deviation of the low-frequency following error is used as the current source's following performance index, and three times the standard deviation and spectrum of the filtered high-frequency ripple error are used as the current source's ripple performance index. Multiple sets of following error curves are used to calculate the current source's repeatability index. This invention provides a basis for frequency adjustment of the high-frequency electric field in accelerator high-frequency systems and for analyzing the impact of magnetic field ripple on accelerator beams, and provides a scheme for quantifying the output current ripple and following performance of current sources.

[0062] Correspondingly, in other embodiments of the present invention, a pulse current source output current index measurement system is provided.

[0063] Example 1

[0064] like Figure 1 As shown, this embodiment provides a pulse current source output current index measurement system. This system collects the current data output by the current source through an external current measuring device. A synchronization control device ensures that the power supply and the current measuring device synchronously start current output and data acquisition to obtain corresponding current error data. Specifically, it includes: the main circuit of the current source under test and its load, a power control device, a current measuring device, and a synchronization control device. The main circuit of the current source under test and its load include the main circuit of the power source under test and a magnetic load, with the output terminal of the main circuit of the power source under test connected to the two ends of the excitation coil of the magnetic load to form a current path. The power control device performs closed-loop control of the output current of the main circuit of the current source under test under the control of the synchronization control device. The current measuring device collects the output current of the main circuit of the current source under test under the control of the synchronization control device and calculates the output current index of the main circuit of the current source under test.

[0065] Furthermore, the power control device includes a first host computer, a first controller, a first ADC (not shown in the figure), and a first current sensor. The first host computer generates a current-given waveform according to the test requirements and sends it to the first controller. The first controller interpolates the current-given waveform to generate an interpolated current-given waveform, and upon receiving a synchronization pulse trigger signal from the synchronization control device, controls the output current of the main circuit of the power supply under test, while simultaneously sending the interpolated current-given waveform to the current measuring device. The first current sensor collects the output current of the main circuit of the power supply under test, samples it through the first ADC, and sends it to the first controller, thus realizing closed-loop control of the output current of the main circuit of the current source under test.

[0066] Furthermore, the current measuring device includes a second host computer, a second controller, a second ADC (not shown in the figure), and a second current sensor. The second current sensor is used to collect the output current of the main circuit of the power supply under test, which is then sampled by the second ADC and sent to the second controller. The second controller, upon receiving a synchronization pulse trigger signal from the synchronization control device, begins storing the current measurement waveform of the output current sampled by the second ADC and sends it to the second host computer. The second host computer calculates the output current index of the current source under test based on the current given interpolation waveform and the current measurement waveform.

[0067] In reality, if temperature drift occurs in the DCCT+ADC of a power supply device, the power supply closed-loop control will eliminate the effect of temperature drift by changing the output current. At this time, the actual output current changes, but the DCCT+ADC sampling value remains unchanged. Therefore, simply referring to the DCCT+ADC sampling value of the power supply device itself cannot determine whether temperature drift has occurred, nor can it determine the repeatability performance of the power supply output. Therefore, in this embodiment, a second current sensor is used to sample the output current of the main circuit of the current source under test. Only through multiple measurements by a second set of current measuring equipment can the repeatability performance of the power supply output be reflected.

[0068] Furthermore, the synchronization control device employs a synchronization trigger.

[0069] The working principle of this measurement system is described below:

[0070] The output terminal of the main circuit of the current source under test is connected to the two ends of the excitation coil of the magnetic load to form a current path. The main circuit of the current source under test can convert AC power from the power grid into DC power and provide an adjustable DC excitation current for the magnetic load. The first current sensor and the first ADC read the output current of the main circuit of the current source under test in real time and feed it back to the first controller. The first host computer sends the output current given waveform to the first controller. The first controller can calculate the difference between the output current of the main circuit of the current source under test and the given interpolated current in real time and complete the negative feedback control, so that the output current of the main circuit of the current source under test is close to the given current, and immediately control the output current of the main circuit of the power source under test according to the given current waveform after receiving the external synchronous trigger signal.

[0071] The second current sensor and the second ADC read back the output current of the current source device to the second controller in real time. Upon receiving the synchronization trigger signal from the synchronous trigger, the second controller immediately begins storing a fixed-length current readback waveform and uploading it to the second host computer. The second controller must ensure that the length of the stored waveform is equal to the interpolated waveform length of the current setpoint from the first controller.

[0072] Example 2

[0073] like Figure 2 As shown, based on the pulse current source output current index measurement system provided in Embodiment 1, this embodiment provides a pulse current source output current index measurement method, which includes the following steps:

[0074] 1) The power control device generates a current-set interpolated waveform I according to the test requirements. SET (n), and under the control of the synchronous control device, the output current of the main circuit of the current source under test is controlled in a closed loop;

[0075] 2) The current measuring device acquires the output current of the main circuit of the current source under test in real time, and measures the current measurement waveform I of the output current of the main circuit of the current source under test under the control of the synchronous control device. M (n);

[0076] 3) Interpolation waveform I based on current setting SET (n) and current measurement waveform I M (n) is used to calculate the output current index of the current source under test.

[0077] Furthermore, step 3) above includes the following steps:

[0078] 3.1) Based on the current measurement waveform and the current given interpolation waveform, the difference is taken to obtain the current error waveform I. Error (n).

[0079] When subtracting the current measurement waveform from the current given interpolation waveform, the second controller needs to perform low-pass filtering using a digital first-order low-pass filter.

[0080] 3.2) Gaussian smoothing is applied to the current error waveform to obtain the low-frequency following error I of the output current of the current source under test. ErrorF (n).

[0081] Among them, the low-frequency following error of the excitation power supply of the diode magnet can be used for frequency adjustment of the high-frequency electric field of the high-frequency cavity system.

[0082] 3.3) The current error I Error (n) minus the low-frequency following error I ErrorF (n), to obtain the high-frequency ripple error I of the output current of the current source under test. ErrorR (n).

[0083] Since both the current measurement waveform and the current input interpolation waveform have been low-pass filtered, the high-frequency ripple error can be equated to the low-pass filtered current ripple error.

[0084] 3.4) Based on current error I Error (n), Low-frequency following error I ErrorF (n) and high-frequency ripple error I ErrorR (n) calculates the output current parameters of the current source under test, including the following error parameter, the ripple error parameter, and the following performance repeatability parameter.

[0085] Preferably, in step 3.2) above, Gaussian smoothing is a weighted average calculation, and the window length W and the corresponding weight function h can be set according to actual needs. G (n), the weight function is as follows:

[0086]

[0087] Where μ is the expectation of the Gaussian distribution, σ is the standard deviation of the Gaussian distribution, and σ is one-fifth of the window length, i.e., σ = W / 5.

[0088] The calculated current following error is as follows:

[0089]

[0090] For example, if the current measuring device is set to a data sampling frequency of 100kHz and the window length W is 3000, corresponding to a window time of 0.03s, then σ is 600, corresponding to a standard deviation of 0.006s; the expected value μ is usually chosen to be 0 so that the smoothing process does not introduce additional time delay.

[0091] Furthermore, in step 3.3) above, the formula for calculating the ripple error is:

[0092] I ErrorR (n)=I Error (n)-I ErrorF (n)

[0093] Furthermore, in step 3.4) above, the following error index is obtained by calculating three times the standard deviation of the following error of the output current of the current source under test. The calculation formula is as follows:

[0094]

[0095] Furthermore, in step 3.4) above, the ripple error index is obtained by calculating three times the standard deviation of the current source output current ripple error and the frequency domain amplitude at the critical frequency. The calculation formula is as follows:

[0096] Calculate I Error Three standard deviations of (n) 3std_I ErrorR and spectrum I ErrorR (f), its calculation formula is as follows:

[0097]

[0098]

[0099] Furthermore, in step 3.4) above, the calculation method for the follow-up performance repeatability index includes:

[0100] The current following error I is obtained by calculating m experiments. ErrorF1 I ErrorF2 , ..., I ErrorFm Average current following error The calculation formula is as follows:

[0101]

[0102] The current following error I was obtained by calculating m experiments respectively. ErrorF1 I ErrorF2 , ..., I ErrorFm With average current following error The difference is calculated using the following formula:

[0103]

[0104] Find m ΔI ErrorFi (n) The maximum value of the curve maxΔI ErrorF and minimum value minΔI ErrorF The repeatability index Rep_I of the following error is obtained. ErrorF The calculation formula is as follows:

[0105] Rep_I ErrorF =maxΔI ErrorF -minΔI ErrorF

[0106] Example 3

[0107] This embodiment further illustrates the content of the present invention with specific examples.

[0108] like Figure 3 As shown, each time the synchronous trigger sends a synchronous trigger signal, the current source device outputs a current pulse I(t) with a period of T, t∈[0:T]. The first host computer saves the current given interpolated waveform I uploaded by the first controller within this period. SET (n), n∈[0:N] (N is the number of discretization points of the current given waveform within the time interval [0:T]). Simultaneously, the second controller stores the current readback waveform I for this period. M (n).

[0109] like Figure 4 As shown, the current readback waveform I after 2kHz filtering is... M (n) Subtract the 2kHz filtered current-based interpolated waveform I SET (n), to obtain the current error waveform I after filtering at 2kHz for this period. Error (n).

[0110] like Figure 5 As shown, the current error waveform is Gaussian smoothed to obtain the current following error I. ErrorF (n).

[0111] like Figure 6 As shown, this is the waveform of the current error I. Error (n) Subtract the current following error I ErrorF(n) Obtain the ripple error waveform I ErrorR (n).

[0112] In summary, the current following error I can be calculated. ErrorF (n) The waveform serves as a reference for frequency adjustment of the high-frequency electric field in the high-frequency cavity system; the current following error, three times the standard deviation 3std_I, is obtained. ErrorF This was used to quantify the tracking performance of the current source device; the current ripple error was obtained as three times the standard deviation 3std_I. ErrorR and current ripple error spectrum I ErrorR (f) is used to quantify the ripple performance of the current source device and predict the impact of accelerator excitation current ripple on the beam; the repeatability index Rep_I is obtained. ErrorF It is used to quantify the repetitive performance of the current source output.

[0113] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for measuring the output current index of a pulse current source, characterized in that, Includes the following steps: Configure a pulse current source output current index measurement system. The system includes the main circuit of the current source under test and its load, power control device, current measurement device and synchronization control device. The main circuit of the current source under test and its load include the main circuit of the current source under test and the magnetic load, and the output terminal of the main circuit of the current source under test is connected to the two ends of the excitation coil of the magnetic load to form a current path. The power control device is used to perform closed-loop control of the output current of the main circuit of the current source under test under the control of the synchronization control device. The current measuring device is used to collect the output current of the main circuit of the current source under test under the control of the synchronous control device, and to calculate the output current index of the main circuit of the current source under test. The power control device generates a current-set interpolated waveform according to the test requirements. And under the control of the synchronous control device, the output current of the main circuit of the current source under test is controlled in a closed loop; The current measuring device acquires the output current of the main circuit of the current source under test in real time, and measures the current waveform of the output current of the main circuit of the current source under test under the control of the synchronous control device. ; Interpolated waveform based on current setting and current measurement waveform The output current index of the current source under test is calculated. The current-based interpolated waveform and current measurement waveform The output current parameters of the current source under test are calculated, including: The current error waveform is obtained by subtracting the measured current waveform and the interpolated current waveform. ; Gaussian smoothing is applied to the current error waveform to obtain the low-frequency following error of the output current of the current source under test. ; Current error Subtract low-frequency following error The high-frequency ripple error of the output current of the current source under test is obtained. ; Based on current error Low-frequency following error and high-frequency ripple error The output current parameters of the current source under test are calculated.

2. The method for measuring the output current index of a pulse current source as described in claim 1, characterized in that, The power control device includes a first host computer, a first controller, a first ADC, and a first current sensor; The first host computer is used to generate a current given waveform according to the test requirements and send it to the first controller; The first controller is used to interpolate the current given waveform to generate a current given interpolation waveform, and after receiving the synchronization pulse trigger signal of the synchronization control device, it controls the output current of the main circuit of the current source under test, and sends the current given interpolation waveform to the current measuring device. The first current sensor is used to collect the output current of the main circuit of the current source under test. After sampling by the first ADC, the current is sent to the first controller to realize closed-loop control of the output current of the main circuit of the current source under test.

3. The method for measuring the output current index of a pulse current source as described in claim 2, characterized in that, The current measuring device includes a second host computer, a second controller, a second ADC, and a second current sensor; The second current sensor is used to collect the output current of the main circuit of the current source under test, and after sampling by the second ADC, it is sent to the second controller; The second controller is used to start storing the current measurement waveform of the output current sampled by the second ADC after receiving the synchronization pulse trigger signal from the synchronization control device, and then send it to the second host computer. The second host computer calculates the output current index of the main circuit of the current source under test based on the interpolated waveform of the current given and the current measurement waveform.

4. The method for measuring the output current index of a pulse current source as described in claim 1, characterized in that, The synchronization control device uses a synchronization trigger.

5. The method for measuring the output current index of a pulse current source as described in claim 1, characterized in that, The current error waveform is obtained by subtracting the measured current waveform and the interpolated current waveform. Previously, low-pass filtering was required for the current measurement waveform and the current input interpolation waveform.

6. The method for measuring the output current index of a pulse current source as described in claim 1, characterized in that, The low-frequency following error is as follows: ； In the formula, For weighting functions; The length of the window; And N is the number of discretization points of the given current waveform within the time interval [0:T]. The period of the current source device under test.

7. The method for measuring the output current index of a pulse current source as described in claim 1, characterized in that, The high-frequency ripple error The calculation formula is: 。 8. The method for measuring the output current index of a pulse current source as described in claim 1, characterized in that, The output current parameters of the current source under test include the following parameters: tracking error, ripple error, and tracking performance repeatability.

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