Method and device for processing characteristics of a vibration excitation source of a marine equipment pedestal

CN117419878BActive Publication Date: 2026-09-22HARBIN ENG UNIV +1
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Patent Information

Application Number
CN202311211494.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-09-20
Publication Date
2026-09-22
Estimated Expiration
2043-09-20

AI Technical Summary

Technical Problem

如何基于这些指标数据获取设备基座振动特性数据,尚无有效方法流程,制约了基于定量计算分析的总体方案振动噪声指标评估工作的开展

Benefits of technology

[0047]本发明提供的方法基于船舶设备机脚参数及隔振装置参数,计算得到设备基座全频段范围内各频率振动指标限值线数据,该方法简单易行且合理,解决了船舶总体方案评估中船舶振动噪声特性预报分析对设备基座振动激励源特性数据的迫切需求问题,可有效促进定量计算在船舶总体方案振动噪声指标评估工作中的应用,提高船舶方案评估结果的准确性、合理性。

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Abstract

A ship equipment base vibration excitation source characteristic processing method and device, relate to the field of ship vibration and noise reduction evaluation technology, the method comprises the following steps: collecting ship equipment foot parameters and vibration isolation device parameters; determining a master vibration isolation device based on the vibration isolation device parameters and obtaining vibration isolation test data of the master vibration isolation device; obtaining foot full-band vibration index limit line data based on the ship equipment foot parameters; obtaining vibration isolation device full-band vibration isolation index limit line data based on the vibration isolation test data of the master vibration isolation device and the ship equipment foot parameters; based on the foot full-band vibration index limit line data and the vibration isolation device full-band vibration isolation index limit line data, the vibration index limit line data of each frequency in the full-band range of the equipment base is calculated; the method and device can effectively promote the application of quantitative calculation in the evaluation of ship vibration and noise indicators, and improve the accuracy and rationality of the evaluation results of the ship scheme.
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Description

Technical Field

[0001] This invention relates to the field of ship vibration reduction and noise reduction assessment technology. Background Technology

[0002] The vibration and noise levels of a ship directly determine its service life and technical performance, significantly impacting its navigation and operations at sea. Vibration and noise characteristics are core indicators of concern in the overall ship design evaluation.

[0003] Equipment is a major contributor to ship vibration and noise, and its excitation source characteristics directly determine the ship's vibration and noise levels. These excitation source characteristics are primarily characterized by the vibration characteristics of the engine mounts or base, such as vibration acceleration, vibration velocity, and vibration displacement. Compared to engine mount vibration characteristic data, base vibration characteristic data better reflects the excitation characteristics of the equipment on the hull structure and is crucial input data for analyzing ship vibration and noise characteristics and assessing the achievability of ship vibration and noise performance indicators during the design phase. Equipment base vibration characteristic data obtained from tests conducted in actual ship installation environments more accurately reflects the excitation source characteristics of the equipment on the hull structure. Currently, research on methods for analyzing equipment excitation source characteristics, both domestically and internationally, mainly focuses on the identification of excitation source characteristics and the mutual conversion of data under different installation environments. While some achievements have been made, and preliminary methods and application procedures for converting equipment excitation source characteristics under different installation environments have been established, these methods and procedures rely on test data and actual installation parameters as input. They cannot be applied in the design phase and are even less suitable for addressing the need for equipment excitation source characteristic data in overall scheme evaluation.

[0004] During the overall design phase, vibration indicators for the equipment's mounting feet and vibration isolation indicators for the equipment's vibration isolation devices are typically provided. The mounting foot vibration indicators include the total vibration index across the entire frequency band, the total vibration index in the low-frequency band, and the low-frequency band vibration index limit. The vibration isolation device indicators include the total vibration isolation index across the entire frequency band and the low-frequency band vibration isolation index. However, there is currently no effective method or procedure for obtaining vibration characteristic data of the equipment base based on these indicators, which hinders the development of overall vibration and noise index assessment work based on quantitative calculation and analysis.

[0005] Therefore, how to provide a processing method that can acquire the characteristic data of the vibration excitation source of the equipment base has become a technical problem that urgently needs to be solved in this field. Summary of the Invention

[0006] To address the aforementioned technical problems, this invention provides a method and apparatus for processing the characteristics of vibration excitation sources of ship equipment bases. Based on the parameters of the ship equipment's engine mounts and vibration isolation devices, this method and apparatus calculate the limit line data of vibration indicators at each frequency within the full frequency range of the equipment base. This can effectively promote the application of quantitative calculation in the evaluation of vibration and noise indicators of overall ship design, and improve the accuracy and rationality of ship design evaluation results.

[0007] Based on the same inventive concept, this invention has four independent technical solutions:

[0008] 1. A method for processing the characteristics of vibration excitation sources on ship equipment foundations, comprising the following steps:

[0009] S1. Collect parameters of ship equipment mounting feet and vibration isolation devices;

[0010] S2. Determine the parent vibration isolation device based on the parameters of the vibration isolation device, and obtain the vibration isolation quantity test data of the parent vibration isolation device;

[0011] S3. Based on the parameters of the ship's equipment mounting feet, obtain the limit line data A for the full-frequency vibration index of the mounting feet. fm ;

[0012] S4. Based on the vibration isolation test data of the parent type vibration isolation device obtained in step S2 and the parameters of the ship equipment's engine mounts, obtain the full-frequency band vibration isolation index limit line data ΔA of the vibration isolation device. fm ;

[0013] S5. Based on the limit line data A of the full-frequency vibration index of the machine foot obtained in step S3. fm And the full-frequency band vibration isolation index limit data ΔA of the vibration isolation device obtained in step S4. fm The vibration index limit line data for each frequency in the full frequency range of the equipment base were calculated and obtained. fm .

[0014] Furthermore, the device foot parameters include the total vibration index A across the entire frequency band of the foot. f1-fN Total vibration index A in the low-frequency range of the machine feet f1-fn The data includes the vibration index limit line data for the low-frequency band of the machine feet, which includes the vibration index A at the lower limit frequency f1 of the low-frequency band of the machine feet. f1 Vibration index A of the upper limit frequency fn in the low frequency band of the machine foot fn ;

[0015] The parameters of the vibration isolation device include the total vibration isolation index ΔA across the entire frequency band. f1-fN and the total vibration isolation index ΔA in the low-frequency band f1-fn .

[0016] Further, step S3 includes the following steps:

[0017] S31, Based on the total vibration index A of the machine foot across the entire frequency band f1-fN and the total vibration index A of the low-frequency band of the machine foot f1 -fn, the total vibration index A of the mid-to-high frequency band of the machine foot is calculated using the energy difference formula. fn-fN ;

[0018] S32, Based on the total vibration index A of the high-frequency band of the machine foot. fn-fN The vibration index A of the upper limit frequency fN of the entire frequency band of the machine foot was calculated using the energy average formula. fN ;

[0019] S33, Vibration index A based on the upper limit frequency fn of the low-frequency band of the machine foot. fn And the vibration index A of the upper limit frequency fN of the full frequency band of the machine foot. fN The vibration index A at each frequency point fi in the high-frequency band of the machine foot is calculated using a linear interpolation formula. fi ;

[0020] S34. Based on the vibration index A of the lower limit frequency f1 of the low-frequency band of the machine foot collected in step S1. f1 Vibration index A of the upper limit frequency fn in the low frequency band of the machine foot fn The vibration index A of fu at each frequency point in the low-frequency band of the machine foot was calculated using a linear interpolation formula. fu ;

[0021] S35. Based on the calculation results of steps S33 and S34, the limit line data A of the full-frequency vibration index of the machine foot is obtained. fm .

[0022] Furthermore, the calculation process in step S32 is expressed by the following formula:

[0023]

[0024] Δf = (fN - fn) / (1Hz);

[0025] In the formula, ΔfN is the bandwidth value at frequency fN.

[0026] Furthermore, the vibration index A of fu at various frequency points within the low-frequency band of the machine foot... fu Calculated using the following formula:

[0027]

[0028] Where u = 1, 2, 3, ..., n.

[0029] Further, step S4 includes the following steps:

[0030] S41, Based on the aforementioned low-frequency band total vibration isolation index ΔA f1-fn Test data of total vibration isolation in the low-frequency band of the parent type vibration isolation device ΔA' f1-fn Test data ΔA' of the lower limit of vibration isolation in the low-frequency band of the parent type vibration isolation device f1 And the test data ΔA' of the upper limit of vibration isolation in the low-frequency band of the parent type vibration isolation device. fnThe lower limit vibration isolation index ΔA of the vibration isolation device in the low-frequency range is obtained through linear algebraic operations. f1 and the upper limit vibration isolation index ΔA in the low frequency band fn ;

[0031] S42, Based on the total vibration isolation index ΔA across the entire frequency band f1-fN Test data of total vibration isolation of the parent type vibration isolation device across the entire frequency band ΔA' f1-fN And the test data ΔA' of the upper frequency isolation amount of the parent type vibration isolation device across the entire frequency band. fN The upper frequency vibration isolation index ΔA of the vibration isolation device across the entire frequency band is obtained through linear algebraic operations. fN ;

[0032] S43. Based on the calculation results of step S41, the vibration isolation index of each frequency point in the low-frequency band of the vibration isolation device is calculated by linear interpolation formula.

[0033] S44. Based on the low-frequency band upper limit vibration isolation index ΔA obtained in step S41 fn And the vibration isolation index ΔA of the full-frequency upper limit frequency of the vibration isolation device obtained in step S42. fN The vibration isolation index of each frequency point in the high-frequency band of the vibration isolation device is calculated by linear interpolation formula.

[0034] S45. Based on the calculation results of steps S43 and S44, the limit line data ΔA of the vibration isolation index of the vibration isolation device across the entire frequency band is obtained. fm .

[0035] Furthermore, the vibration index limit line data a for each frequency across the entire frequency range of the equipment base. fm Calculated using the following formula:

[0036] a fm =A fm -ΔA fm ;

[0037] In the formula, A fm For the full-frequency vibration index limit line data of the machine foot, ΔA fm This provides the limit values ​​for vibration isolation indicators across the entire frequency band of the vibration isolation device.

[0038] 2. A device for processing the characteristics of vibration excitation sources on ship equipment foundations, comprising:

[0039] The parameter acquisition module is used to collect parameters of ship equipment mounting feet and vibration isolation devices.

[0040] The parent vibration isolation data acquisition module is used to determine the parent vibration isolation device based on the parameters of the vibration isolation device, and to acquire the vibration isolation quantity test data of the parent vibration isolation device;

[0041] The engine mount limit line data calculation module is used to obtain engine mount full-frequency vibration index limit line data A based on the engine mount parameters of the ship equipment. fm ;

[0042] The vibration isolation limit line data calculation module is used to obtain the full-frequency band vibration isolation index limit line data ΔA of the vibration isolation device based on the vibration isolation quantity test data of the parent type vibration isolation device and the parameters of the ship equipment mounting feet. fm ;

[0043] The equipment base index calculation module is used to calculate the index based on the full-frequency vibration index limit line data A of the machine foot. fm And the full-frequency band vibration isolation index limit data ΔA of the vibration isolation device. fm The vibration index limit line data for each frequency in the full frequency range of the equipment base were calculated and obtained. fm .

[0044] 3. A computer-readable storage medium storing a computer program, characterized in that the computer program implements the above-described method when executed by a processor.

[0045] 4. An electronic device, comprising a processor and a storage device, characterized in that the storage device stores a plurality of instructions, and the processor is configured to read the plurality of instructions in the storage device and execute the above method.

[0046] The method and apparatus for processing the characteristics of vibration excitation sources of ship equipment bases provided by the present invention have at least the following beneficial effects:

[0047] The method provided by this invention is based on the parameters of the ship's equipment mounting base and the parameters of the vibration isolation device. It calculates the limit line data of vibration index of each frequency in the full frequency range of the equipment base. The method is simple, easy to implement and reasonable. It solves the urgent need for vibration excitation source characteristic data of equipment base in the prediction and analysis of ship vibration and noise characteristics in the overall ship scheme evaluation. It can effectively promote the application of quantitative calculation in the evaluation of vibration and noise index of the overall ship scheme and improve the accuracy and rationality of the ship scheme evaluation results. Attached Figure Description

[0048] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0049] Figure 1 A flowchart of one embodiment of the method for processing the characteristics of vibration excitation source of ship equipment base provided by the present invention;

[0050] Figure 2 A schematic diagram of the vibration limit line for the low-frequency band (1 / 3 octave band) of the equipment feet;

[0051] Figure 3 A schematic diagram of the vibration limit line for the equipment feet across the entire frequency band at 1 / 3 octave band.

[0052] Figure 4 A schematic diagram of the vibration isolation index limit line of the equipment vibration isolation device in the full frequency band 1 / 3 octave band;

[0053] Figure 5 This is a schematic diagram of the vibration index limit line for the equipment base in the full frequency band of 1 / 3 octave band. Detailed Implementation

[0054] To better understand the above technical solutions, the following will provide a detailed explanation of the technical solutions in conjunction with the accompanying drawings and specific implementation methods.

[0055] Example 1:

[0056] It should be noted that the vibration excitation sources of ship equipment bases, arranged in order of importance, are: the main engine, first-class auxiliary machinery (diesel or steam turbine generators, steam turbines, etc.), second-class auxiliary machinery (various fans, air compressors, large heat exchangers, and various pumps, etc.), third-class auxiliary machinery (oil-water separators, small heat exchangers, and various cabinets, etc.), and various auxiliary boilers, etc. This embodiment provides a processing method for the vibration excitation sources of the equipment bases mentioned above.

[0057] See Figure 1 In some embodiments, a method for processing the characteristics of vibration excitation sources of ship equipment bases is provided, including the following steps:

[0058] S1. Collect parameters of ship equipment mounting feet and vibration isolation devices;

[0059] S2. Determine the parent vibration isolation device based on the parameters of the vibration isolation device, and obtain the vibration isolation quantity test data of the parent vibration isolation device;

[0060] S3. Based on the parameters of the ship's equipment mounting feet, obtain the limit line data A for the full-frequency vibration index of the mounting feet. fm ;

[0061] S4. Based on the vibration isolation test data of the parent type vibration isolation device obtained in step S2 and the parameters of the ship equipment's engine mounts, obtain the full-frequency band vibration isolation index limit line data ΔA of the vibration isolation device. fm ;

[0062] S5. Based on the limit line data A of the full-frequency vibration index of the machine foot obtained in step S3. fmAnd the full-frequency band vibration isolation index limit data ΔA of the vibration isolation device obtained in step S4. fm The vibration index limit line data for each frequency in the full frequency range of the equipment base were calculated and obtained. fm .

[0063] Specifically, in step S1, the device foot parameters include the total vibration index A across the entire frequency band of the foot. f1-fN Total vibration index A in the low-frequency range of the machine feet f1-fn The data includes the vibration index limit line data for the low-frequency band of the machine feet, which includes the vibration index A at the lower limit frequency f1 of the low-frequency band of the machine feet. f1 Vibration index A of the upper limit frequency fn in the low frequency band of the machine foot fn All parameters are in decibels.

[0064] The parameters of the vibration isolation device include the total vibration isolation index ΔA across the entire frequency band. f1-fN and the total vibration isolation index ΔA in the low-frequency band f1-fn .

[0065] The full frequency band is defined as the frequency band from f1 to fN, the low frequency band is defined as the frequency band from f1 to fn, where fN>fn>f1, and the mid-to-high frequency band is defined as the frequency band from fn to fN.

[0066] In step S2, based on the vibration isolation device parameters collected in step S1, an existing parent vibration isolation device with similar or identical parameters is selected. The vibration isolation quantity test results are analyzed to determine the vibration isolation quantity test data of the parent vibration isolation device, including the total vibration isolation quantity test data ΔA' of the parent vibration isolation device across the entire frequency band. f1-fN Test data of total vibration isolation in the low-frequency band of the parent type vibration isolation device ΔA' f1-fn Test data ΔA' of vibration isolation amount at the lower limit frequency of the low-frequency band of the parent type vibration isolation device f1 Test data ΔA' of vibration isolation amount at the upper frequency limit of the low-frequency band of the parent type vibration isolation device fn Test data ΔA' of vibration isolation amount at the upper frequency limit of the entire frequency band of the parent type vibration isolation device. fN All test data above are in decibels.

[0067] In step S3, based on the total vibration index A of the machine foot across the entire frequency band collected in step S1... f1-fN Low-frequency total vibration index A f1-fn Based on the low-frequency vibration index limit data, the full-frequency vibration index limit data A of the machine foot is calculated using the energy difference formula, energy averaging formula, and linear interpolation formula. fm Specifically, it includes the following steps:

[0068] S31, Based on the total vibration index A of the machine foot across the entire frequency band f1-fN and the total vibration index A of the low-frequency band of the machine footf1-fn The total vibration index A in the mid-to-high frequency range of the machine foot was calculated using the energy difference formula. fn-fN ;

[0069] S32, Based on the total vibration index A of the high-frequency band of the machine foot. fn-fN The vibration index A of the upper limit frequency fN of the entire frequency band of the machine foot was calculated using the energy average formula. fN ;

[0070] S33, Vibration index A based on the upper limit frequency fn of the low-frequency band of the machine foot. fn And the vibration index A of the upper limit frequency fN of the full frequency band of the machine foot. fN The vibration index A at each frequency point fi in the high-frequency band of the machine foot is calculated using a linear interpolation formula. fi ;

[0071] S34. Based on the vibration index A of the lower limit frequency f1 of the low-frequency band of the machine foot collected in step S1. f1 Vibration index A of the upper limit frequency fn in the low frequency band of the machine foot fn The vibration index A of fu at each frequency point in the low-frequency band of the machine foot was calculated using a linear interpolation formula. fu ;

[0072] S35. Based on the calculation results of steps S33 and S34, the limit line data A of the full-frequency vibration index of the machine foot is obtained. fm .

[0073] The calculation process in step S31 is represented by the following formula:

[0074]

[0075] The calculation process in step S32 is represented by the following formula:

[0076]

[0077] Δf = (fN - fn) / (1Hz);

[0078] In the formula, ΔfN represents the bandwidth at frequency fN. For example, when fN is a 1Hz narrowband line spectrum, its bandwidth ΔfN is 1; when fN is the center frequency of a 1 / 3 octave band, its bandwidth ΔfN is the bandwidth value of the 1 / 3 octave band frequency where fN is located, i.e.

[0079] In step S33, the vibration index A of each frequency point fi in the high-frequency band of the machine foot is... fi Calculated using the following formula:

[0080]

[0081] Among them, i=n,n+1,n+2,…,N;

[0082] In step S34, the vibration index A of each frequency point fu in the low-frequency band of the machine foot is... fu Calculated using the following formula:

[0083]

[0084] Where u = 1, 2, 3, ..., n. See also Figure 2 , Figure 2 This is a schematic diagram of the vibration index limit line for the machine foot in the low-frequency band of 1 / 3 octave.

[0085] In step S35, the vibration index limit line data A of the equipment foot across the entire frequency band (f1 to fN frequency band) is obtained based on the calculation results of steps S33 and S34. fm Where m = 1, 2, ..., N. See also Figure 3 , Figure 3 This is a schematic diagram of the vibration index limit line for the equipment foot at 1 / 3 octave band of the full frequency range.

[0086] In step S4, based on the total vibration isolation index ΔA of the vibration isolation device across the entire frequency band collected in step S1... f1-fN and the total vibration isolation index ΔA in the low-frequency band f1-fn The vibration isolation quantity test data of the parent vibration isolation device obtained in step S2 are used to obtain the full-frequency vibration isolation index limit line data ΔA of the vibration isolation device through linear algebra calculation. fm Specifically, it includes the following steps:

[0087] S41, Based on the aforementioned low-frequency band total vibration isolation index ΔA f1-fn Test data of total vibration isolation in the low-frequency band of the parent type vibration isolation device ΔA' f1-fn Test data ΔA' of the lower limit of vibration isolation in the low-frequency band of the parent type vibration isolation device f1 And the test data ΔA' of the upper limit of vibration isolation in the low-frequency band of the parent type vibration isolation device. fn The lower limit vibration isolation index ΔA of the vibration isolation device in the low-frequency range is obtained through linear algebraic operations. f1 and the upper limit vibration isolation index ΔA in the low frequency band fn ;

[0088] S42, Based on the total vibration isolation index ΔA across the entire frequency band f1-fN Test data of total vibration isolation of the parent type vibration isolation device across the entire frequency band ΔA' f1-fN And the test data ΔA' of the upper frequency isolation amount of the parent type vibration isolation device across the entire frequency band. fN The upper frequency vibration isolation index ΔA of the vibration isolation device across the entire frequency band is obtained through linear algebraic operations. fN ;

[0089] S43. Based on the calculation results of step S41, the vibration isolation index of each frequency point in the low-frequency band of the vibration isolation device is calculated by linear interpolation formula.

[0090] S44. Based on the low-frequency band upper limit vibration isolation index ΔA obtained in step S41 fn And the vibration isolation index ΔA of the full-frequency upper limit frequency of the vibration isolation device obtained in step S42. fN The vibration isolation index of each frequency point in the high-frequency band of the vibration isolation device is calculated by linear interpolation formula.

[0091] S45. Based on the calculation results of steps S43 and S44, the limit line data ΔA of the vibration isolation index of the vibration isolation device across the entire frequency band is obtained. fm .

[0092] The specific calculation process in step S41 is as follows:

[0093] ΔA f1 =ΔA' f1 +(ΔA f1-fn -ΔA' f1-fn );

[0094] ΔA fn =ΔA' fn +(ΔA f1-fn -ΔA' f1-fn );

[0095] In step S42, the specific calculation process is as follows:

[0096] ΔA fN =ΔA' fN +(ΔA f1-fN -ΔA' f1-fN );

[0097] In step S43, the vibration isolation index of each frequency point in the low-frequency band of the vibration isolation device is calculated using the following formula:

[0098]

[0099] Where h = 1, 2, ..., n.

[0100] In step S44, the vibration isolation index of each frequency point in the high-frequency band of the vibration isolation device is calculated using the following formula:

[0101]

[0102] Where j = n, n+1, n+2, ... N.

[0103] In step S45, the vibration isolation index limit line data ΔA of the equipment vibration isolation device across the entire frequency band (f1 to fN frequency band) is obtained based on the calculation results of steps S43 and S44 above. fm Where m = 1, 2, ..., N. See also Figure 4 , Figure 4 This is a schematic diagram of the vibration isolation index limit line for the full-frequency band 1 / 3 octave band of the vibration isolation device.

[0104] In step S5, the vibration index limit data a of each frequency in the full frequency range of the equipment base is... fm Calculated using the following formula:

[0105] a fm =A fm -ΔA fm ;

[0106] In the formula, A fm For the full-frequency vibration index limit line data of the machine foot, ΔA fm This provides the full-frequency vibration isolation performance limit data for vibration isolation devices. See also... Figure 4 , Figure 4 This is a schematic diagram of the vibration index limit line for the equipment base in the full frequency band of 1 / 3 octave band.

[0107] As can be seen from the above steps, this method can quickly calculate the vibration excitation source characteristic data of the equipment base based on data such as the vibration index of the equipment engine feet and the vibration isolation index of the vibration isolation device in the overall ship design.

[0108] Example 2:

[0109] In some embodiments, a device for processing the characteristics of a vibration excitation source on a ship's equipment base is provided, comprising:

[0110] The parameter acquisition module is used to collect parameters of ship equipment mounting feet and vibration isolation devices.

[0111] The parent vibration isolation data acquisition module is used to determine the parent vibration isolation device based on the parameters of the vibration isolation device, and to acquire the vibration isolation quantity test data of the parent vibration isolation device;

[0112] The engine mount limit line data calculation module is used to obtain engine mount full-frequency vibration index limit line data A based on the engine mount parameters of the ship equipment. fm ;

[0113] The vibration isolation limit line data calculation module is used to obtain the full-frequency band vibration isolation index limit line data ΔA of the vibration isolation device based on the vibration isolation quantity test data of the parent type vibration isolation device and the parameters of the ship equipment mounting feet. fm ;

[0114] The equipment base index calculation module is used to calculate the index based on the full-frequency vibration index limit line data A of the machine foot. fmAnd the full-frequency band vibration isolation index limit data ΔA of the vibration isolation device. fm The vibration index limit line data for each frequency in the full frequency range of the equipment base were calculated and obtained. fm .

[0115] In a preferred embodiment, the parameter acquisition module includes the device foot parameters, specifically the total vibration index A across the entire frequency band of the foot. f1-fN Total vibration index A in the low-frequency range of the machine feet f1-fn The data includes the vibration index limit line data for the low-frequency band of the machine feet, which includes the vibration index A at the lower limit frequency f1 of the low-frequency band of the machine feet. f1 Vibration index A of the upper limit frequency fn in the low frequency band of the machine foot fn ;

[0116] The parameters of the vibration isolation device include the total vibration isolation index ΔA across the entire frequency band. f1-fN and the total vibration isolation index ΔA in the low-frequency band f1-fn .

[0117] In a preferred embodiment, the foot limit line data calculation module includes the following sub-modules:

[0118] The first sub-module of the machine foot is used to determine the total vibration index A of the machine foot across the entire frequency band. f1-fN and the total vibration index A of the low-frequency band of the machine foot f1-fn The total vibration index A in the mid-to-high frequency range of the machine foot was calculated using the energy difference formula. fn-fN ;

[0119] Sub-module 2 of the machine foot is used to determine the total vibration index A of the high-frequency band of the machine foot. fn-fN The vibration index A of the upper limit frequency fN of the entire frequency band of the machine foot was calculated using the energy average formula. fN ;

[0120] Sub-module three of the machine foot is used to measure the vibration index A based on the upper limit frequency fn of the low-frequency band of the machine foot. fn And the vibration index A of the upper limit frequency fN of the full frequency band of the machine foot. fN The vibration index A at each frequency point fi in the high-frequency band of the machine foot is calculated using a linear interpolation formula. fi ;

[0121] Sub-module four for the machine foot is used to measure the vibration index A of the lower limit frequency f1 of the low frequency band of the machine foot acquired by the parameter acquisition module. f1 Vibration index A of the upper limit frequency fn in the low frequency band of the machine foot fn The vibration index A of fu at each frequency point in the low-frequency band of the machine foot was calculated using a linear interpolation formula. fu ;

[0122] The fifth sub-module of the machine foot is used to obtain the limit line data A of the full-frequency vibration index of the machine foot based on the calculation results of the third and fourth sub-modules of the machine foot. fm .

[0123] In the second sub-module of the machine foot, the calculation process is represented by the following formula:

[0124]

[0125] Δf = (fN - fn) / (1Hz);

[0126] In the formula, ΔfN is the bandwidth value at frequency fN.

[0127] Among them, in the fourth sub-module of the machine foot, the vibration index A of each frequency point fu in the low-frequency band of the machine foot is... fu Calculated using the following formula:

[0128]

[0129] Where u = 1, 2, 3, ..., n.

[0130] As a preferred implementation, the vibration isolation limit line data calculation module includes the following sub-modules:

[0131] Vibration isolation module one is used to determine the total vibration isolation index ΔA in the low-frequency band. f1-fn Test data of total vibration isolation in the low-frequency band of the parent type vibration isolation device ΔA' f1-fn Test data ΔA' of the lower limit of vibration isolation in the low-frequency band of the parent type vibration isolation device f1 And the test data ΔA' of the upper limit of vibration isolation in the low-frequency band of the parent type vibration isolation device. fn The lower limit vibration isolation index ΔA of the vibration isolation device in the low-frequency range is obtained through linear algebraic operations. f1 and the upper limit vibration isolation index ΔA in the low frequency band fn ;

[0132] Vibration isolation module two is used to determine the total vibration isolation index ΔA across the entire frequency band. f1 -fN, Test data of total vibration isolation of the parent type vibration isolation device across the entire frequency band ΔA' f1-fN And the test data ΔA' of the upper frequency isolation amount of the parent type vibration isolation device across the entire frequency band. fN The upper frequency vibration isolation index ΔA of the vibration isolation device across the entire frequency band is obtained through linear algebraic operations. fN ;

[0133] Vibration isolation module three is used to calculate the vibration isolation index of each frequency point in the low-frequency band of the vibration isolation device based on the calculation results of vibration isolation module one through a linear interpolation formula.

[0134] Vibration isolation module four is used to obtain the low-frequency upper limit vibration isolation index ΔA based on vibration isolation module one. fn And the vibration isolation index ΔA of the upper frequency limit of the vibration isolation device across the entire frequency band obtained by the vibration isolation sub-module 2. fN The vibration isolation index of each frequency point in the high-frequency band of the vibration isolation device is calculated by linear interpolation formula.

[0135] Vibration isolation module five is used to obtain the full-frequency band vibration isolation index limit line data ΔA of the vibration isolation device based on the calculation results of vibration isolation module three and vibration isolation module four. fm .

[0136] As a preferred implementation, in the equipment base index calculation module, the vibration index limit line data a for each frequency within the full frequency range of the equipment base is... fm Calculated using the following formula:

[0137] a fm =A fm -ΔA fm ;

[0138] In the formula, A fm For the full-frequency vibration index limit line data of the machine foot, ΔA fm This provides the limit values ​​for vibration isolation indicators across the entire frequency band of the vibration isolation device.

[0139] Example 3:

[0140] In some embodiments, a computer-readable storage medium is provided, the computer-readable storage medium storing a computer program, characterized in that the computer program, when executed by a processor, implements the method of Embodiment 1.

[0141] Example 4:

[0142] In some embodiments, an electronic device is provided, including a processor and a storage device, characterized in that the storage device stores a plurality of instructions, and the processor is configured to read the plurality of instructions in the storage device and execute the method of Embodiment 1.

[0143] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention. Clearly, those skilled in the art can make various alterations and modifications to the invention without departing from its spirit and scope. Thus, if these modifications and modifications of the invention fall within the scope of the claims and their equivalents, the invention is also intended to include these modifications and modifications.

Claims

1. A method for processing the characteristics of vibration excitation sources on ship equipment foundations, characterized in that, Includes the following steps: S1. Collect parameters of ship equipment mounting feet and vibration isolation devices; S2. Determine the parent vibration isolation device based on the parameters of the vibration isolation device, and obtain the vibration isolation quantity test data of the parent vibration isolation device; S3. Obtain the limit line data of the full-frequency vibration index of the ship equipment mounting base based on the aforementioned ship equipment mounting base parameters. ; S4. Based on the vibration isolation test data of the parent type vibration isolation device obtained in step S2 and the parameters of the ship equipment's engine mounts, obtain the full-frequency band vibration isolation index limit line data of the vibration isolation device. ; S5. Based on the limit line data of the full-frequency vibration index of the machine foot obtained in step S3. and the full-frequency band vibration isolation index limit data of the vibration isolation device obtained in step S4. The vibration index limit data of each frequency in the full frequency range of the equipment base were calculated. ; The device foot parameters include the total vibration index of the foot across the entire frequency band. Total vibration index of machine feet in the low-frequency range The data includes the lower limit frequency of the low-frequency vibration index of the machine feet. Vibration index and the upper limit frequency of the low-frequency band of the pin Vibration index ; The parameters of the vibration isolation device include the overall vibration isolation index across the entire frequency band. and low-frequency overall vibration isolation index ; Step S3 includes the following steps: S31. Based on the total vibration index of the machine foot across the entire frequency band. and the total vibration index of the low-frequency band of the machine foot The total vibration index of the machine foot in the mid-to-high frequency range was calculated using the energy difference formula. ; S32, Based on the total vibration index of the high-frequency band of the machine foot. The upper limit frequency of the entire frequency band of the base is calculated using the energy average formula. Vibration index ; S33, Based on the upper limit frequency of the low-frequency band of the aforementioned pin Vibration index and the upper limit frequency of the entire frequency band of the aforementioned pin Vibration index The frequency points in the high-frequency band of the machine foot are calculated using linear interpolation formulas. Vibration index ; S34. Based on the lower limit frequency of the low-frequency band of the machine foot collected in step S1. Vibration index and the upper limit frequency of the low-frequency band of the pin Vibration index The frequency points in the low-frequency band of the machine foot are calculated using linear interpolation formulas. Vibration index ; S35. Based on the calculation results of steps S33 and S34, the limit line data of the full-frequency vibration index of the machine foot is obtained. .

2. The method according to claim 1, characterized in that, The calculation process in step S32 is represented by the following formula: ; ; In the formula, In order to be in The bandwidth value of the frequency.

3. The method according to claim 1, characterized in that, Low-frequency points of the machine pin Vibration index Calculated using the following formula: ; Where u = 1, 2, 3, ..., n.

4. The method according to claim 1, characterized in that, Step S4 includes the following steps: S41. Based on the aforementioned low-frequency band total vibration isolation index Test data of total vibration isolation in the low-frequency band of the parent type vibration isolation device Test data of the lower limit of vibration isolation in the low-frequency band of the parent type vibration isolation device And test data of the upper limit of vibration isolation in the low-frequency band of the parent type vibration isolation device The lower limit vibration isolation index of the vibration isolation device in the low-frequency range was obtained through linear algebraic operations. and the upper limit of vibration isolation index in the low frequency band ; S42. Based on the total vibration isolation index across the entire frequency band. Test data of total vibration isolation of the parent type vibration isolation device across the entire frequency band And test data of vibration isolation amount at the upper frequency limit of the entire frequency band of the parent type vibration isolation device. The upper frequency vibration isolation index of the vibration isolation device across the entire frequency band was obtained through linear algebraic operations. ; S43. Based on the calculation results of step S41, the vibration isolation index of each frequency point in the low-frequency band of the vibration isolation device is calculated by linear interpolation formula. S44. The low-frequency band upper limit vibration isolation index obtained in step S41 and the upper frequency isolation index of the vibration isolation device across the entire frequency band obtained in step S42. The vibration isolation index of each frequency point in the high-frequency band of the vibration isolation device is calculated by linear interpolation formula. S45. Based on the calculation results of steps S43 and S44, the limit line data of the vibration isolation index of the vibration isolation device across the entire frequency band is obtained. .

5. The method according to claim 1, characterized in that, The vibration index limit data of the equipment base across the entire frequency range. Calculated using the following formula: ; In the formula, This provides the limit line data for the full-frequency vibration index of the machine feet. This provides the limit values ​​for vibration isolation indicators across the entire frequency band of the vibration isolation device.

6. A device for processing the characteristics of a vibration excitation source on a ship's equipment base, characterized in that, The device is implemented based on the method of claim 1, comprising: The parameter acquisition module is used to collect parameters of ship equipment mounting feet and vibration isolation devices. The parent vibration isolation data acquisition module is used to determine the parent vibration isolation device based on the parameters of the vibration isolation device, and to acquire the vibration isolation quantity test data of the parent vibration isolation device; The engine mount limit line data calculation module is used to obtain full-frequency vibration index limit line data of the engine mount based on the engine mount parameters of the ship equipment. ; The vibration isolation limit line data calculation module is used to obtain the full-frequency band vibration isolation index limit line data of the vibration isolation device based on the vibration isolation quantity test data of the parent vibration isolation device and the engine mount parameters of the ship equipment. ; The equipment base index calculation module is used to calculate the vibration index limit line data of the machine feet across the entire frequency band. and the full-frequency band vibration isolation index limit data of the vibration isolation device. The vibration index limit data of each frequency in the full frequency range of the equipment base were calculated. .

7. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the method as described in any one of claims 1-5.

8. An electronic device comprising a processor and a storage device, characterized in that, The storage device contains a plurality of instructions, and the processor is used to read the plurality of instructions in the storage device and execute the method as described in any one of claims 1-5.

Citation Information

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