A display panel driving defect analysis method, device, equipment and medium

Abstract

The application discloses a display panel driving defect analysis method, device, equipment and medium, wherein the method comprises: obtaining a plurality of products corresponding to a first analysis picture of a defect, and classifying and dividing based on a preset defect picture library; dividing into a first type of repairable defect picture and a second type of unrepairable defect picture; obtaining a second analysis picture of the product corresponding to the first type of defect picture after repair, if the second analysis picture is different from a normal picture, then dividing into a first type of product; and analyzing the defect reason of the first type of product; obtaining a third analysis picture of the product corresponding to the second type of defect picture after replacing a light number machine and re-lighting test, if the third analysis picture is the same as the first analysis picture, then dividing into a second type of product; and analyzing the defect reason of the second type of product, so as to find the defect reason in time and classify, and repair the defect, so as to improve the product yield.

Description

Technical Field

[0001] This invention relates to the field of display panel technology, and in particular to a method, apparatus, device, and medium for analyzing display panel driving malfunctions. Background Technology

[0002] With the advancement of technology, display devices are being used in all aspects of life, bringing great convenience to people's lives.

[0003] Currently, display panel technology is mature, but in actual production, various processes may still produce some defects, which may manifest as defects such as spots, lines, mura, and image defects in the display. Analyzing the types of defects, finding the causes, and classifying them are important for subsequent repairs and improving product yield.

[0004] In related technologies, products with poor performance are classified and repaired based on experience. If they still cannot display normally, they are discarded. This not only causes great waste, but also fails to attribute the cause of the poor display and lacks a unified repair guide for products that fail again, thus reducing repair efficiency and yield. Summary of the Invention

[0005] The purpose of this invention is to provide a method, apparatus, device, and medium for analyzing defects in display panel drivers, so as to analyze the causes of defects that occur during the display panel manufacturing process and improve product yield.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] Firstly, a method for analyzing display panel driver malfunctions is provided, including:

[0008] The system acquires the first defective images corresponding to multiple products and classifies them based on a preset defective image library. If the first defective image is the same as or nearly the same as a defective image in the preset defective image library, it is classified as a repairable first-class defective image; otherwise, it is classified as an unrepairable second-class defective image.

[0009] The system obtains a second image to be analyzed after repairing the product corresponding to the first type of defective image. If the second image to be analyzed is different from the normal image, it is classified as the first type of product. The system obtains the first coordinate of the defective location of the first type of product based on the second image to be analyzed. The system then traverses the drive circuit of the display panel along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to analyze the cause of the defect in the first type of product.

[0010] The third image to be analyzed is obtained when the product corresponding to the second type of defective image undergoes a relighting test after the light-lighting machine is replaced. If the third image to be analyzed is the same as the first image to be analyzed, it is classified as the second type of product. Based on the second preset number of traversal coordinates, the drive circuit of the display panel is traversed from the top or bottom corner of the display panel to the opposite corner along the direction of the first straight line to analyze the cause of the defect of the second type of product. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel.

[0011] As a preferred embodiment of the display panel driver defect analysis method, the preset defective screen library includes at least a first screen, a second screen, a third screen, and a fourth screen;

[0012] The defect in the first image is a non-lit ray that starts from the left or right side of the display panel and ends in the middle of the display panel;

[0013] The defect in the second image is a rectangular shadow that starts from the left or right side of the display panel, ends at the center of the display panel where there is no light, and radiates outwards to the bottom of the display panel.

[0014] The defect in the third image is a dark straight line running from the left to the right side of the display panel;

[0015] The defect in the fourth image is a dark straight line running from the left to the right of the display panel, radiating from the dark straight line toward the top of the display panel, and simultaneously forming a rectangular shadow radiating from the left or right side of the display panel toward the center of the display panel.

[0016] As a preferred embodiment of the display panel driver malfunction analysis method, after obtaining the third image to be analyzed—the image of the product corresponding to the second type of malfunction image after the lighting test is repeated following the replacement of the lighting indicator—it further includes:

[0017] If the third image to be analyzed is different from the first image to be analyzed, then for the products corresponding to the second type of defective images, the step of reclassifying and dividing them based on the third image to be analyzed and the preset defective image library is returned, and at the same time the cleaning equipment is controlled to clean the original signal light machine.

[0018] As a preferred embodiment of the display panel driver defect analysis method, before obtaining the second image to be analyzed after the product corresponding to the first type of defective image has been repaired, the method further includes:

[0019] Based on the first image to be analyzed, obtain the third coordinates of the product corresponding to the first type of defective image;

[0020] The laser repair equipment, controlled by the third coordinate, performs laser repair on the drive circuit of the product corresponding to the first type of defective image.

[0021] As a preferred embodiment of the display panel driver failure analysis method, the step of traversing the display panel's driver circuit along the direction of the first straight line based on the first coordinate and a first preset number of traversal coordinates to analyze the cause of failure for the first type of product includes:

[0022] Along the direction of the first straight line, the driving circuit of the display panel is traversed upward from the first coordinate by a first preset number of traversal coordinates and / or downward by a first preset number of traversal coordinates to confirm whether any actual defects are found.

[0023] If an actual defect is found, the type of the actual defect and its location between layers in the display panel are obtained to determine the cause of the defect.

[0024] If no actual defects are found, thermal imaging is performed on the driving circuit of the display panel, and the cause of the defect is identified based on a preset normal thermal imaging image.

[0025] As a preferred embodiment of the display panel driver failure analysis method, the driver circuit of the display panel is traversed from the top or bottom corner of the display panel to the opposite corner along the direction of the first straight line, based on a second preset number of traversal coordinates, to perform failure cause analysis on the second type of product, including:

[0026] From the top corner of the display panel towards the bottom, or from the bottom corner of the display panel towards the top, the driving circuit of the display panel is traversed a second preset number of traversal coordinates to confirm whether any actual defects are found.

[0027] If an actual defect is found, the type of the actual defect and its location between layers in the display panel are obtained to determine the cause of the defect.

[0028] If no actual defects are found, thermal imaging is performed on the driving circuit of the display panel, and the cause of the defect is identified based on a preset normal thermal imaging image.

[0029] As a preferred embodiment of the display panel driving defect analysis method, after obtaining the type of the actual defect and its interlayer location in the display panel, the method further includes: establishing an actual defect analysis mapping table.

[0030] The establishment of the actual defect analysis mapping table includes:

[0031] Obtain the type and interlayer location of N consecutive historical actual defects in the display panel;

[0032] If the type of actual defect and its interlayer location in the display panel are the same in more than the first threshold number of N detections, or if the type of actual defect and its interlayer location in the display panel are the same in the second consecutive threshold number of detections, then it is determined that the corresponding layer manufacturing process of the display panel has introduced a defect.

[0033] An actual defect analysis mapping table is created based on the type of actual defect, its interlayer location in the display panel, and the manufacturing process, where N is a positive integer.

[0034] Secondly, a display panel driver malfunction analysis device is provided, comprising:

[0035] The classification module is used to acquire the first defective images to be analyzed corresponding to multiple products, and classify the first defective images to be analyzed based on a preset defective image library; wherein, if the first defective image to be analyzed is the same as or nearly the same as the defective images in the preset defective image library, it is classified as a repairable first type of defective image; otherwise, it is classified as an unrepairable second type of defective image.

[0036] The first analysis module is used to obtain the second image to be analyzed after the product corresponding to the first type of defective image has been repaired. If the second image to be analyzed is different from the normal image, it is classified as the first type of product. The first coordinate of the defective position of the first type of product is obtained based on the second image to be analyzed. The driving circuit of the display panel is traversed along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to analyze the cause of the defect of the first type of product.

[0037] The second analysis module is used to obtain the third image to be analyzed of the product corresponding to the second type of defective image after the lighting test is repeated after the lighting machine is replaced. If the third image to be analyzed is the same as the first image to be analyzed, it is classified as the second type of product. Based on the second preset number of traversal coordinates, the drive circuit of the display panel is traversed from the corner of the top or bottom of the display panel to the corner of the opposite side along the direction of the first straight line to analyze the cause of the defect of the second type of product. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel.

[0038] Thirdly, an electronic device is provided, the electronic device comprising:

[0039] At least one processor; and

[0040] A memory communicatively connected to the at least one processor; wherein,

[0041] The memory stores a computer program that can be executed by the at least one processor, which enables the at least one processor to perform the display panel driver malfunction analysis method according to any embodiment of the present invention.

[0042] Fourthly, a computer-readable storage medium is provided, the computer-readable storage medium storing computer instructions for causing a processor to execute the display panel driver malfunction analysis method according to any embodiment of the present invention.

[0043] The beneficial effects of the present invention are as follows: According to the real-time display panel driver defect analysis method, apparatus, device, and medium provided by the present invention, the method includes: acquiring a first screen to be analyzed corresponding to defects of multiple products, and classifying the first screen to be analyzed based on a preset defect screen library; wherein, if the first screen to be analyzed is the same as or nearly the same as a defect screen in the preset defect screen library, it is classified as a repairable first type of defect screen; otherwise, it is classified as an unrepairable second type of defect screen; acquiring a second screen to be analyzed after repairing the product corresponding to the first type of defect screen; if the second screen to be analyzed is different from the normal screen, it is classified as a first type of product; and acquiring the first type of product defects based on the second screen to be analyzed. The system firstly identifies the location's coordinates and then traverses the display panel's drive circuit along the direction of a first straight line based on these coordinates and a preset number of traversal coordinates to analyze the causes of defects in the first category of products. It then obtains the third image to be analyzed for the second category of defective images, obtained after the product undergoes a re-lighting test following a replacement of the indicator light. If the third image is identical to the first image, it is classified as a second category product. Finally, based on a second preset number of traversal coordinates, the system traverses the display panel's drive circuit from the top or bottom corner of the display panel towards the opposite corner along the direction of the first straight line to analyze the causes of defects in the second category of products. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel. This allows for timely identification and classification of defect causes, enabling repairs and improving product yield.

[0044] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0045] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0046] Figure 1 This is a flowchart of the display panel driver malfunction analysis method provided in the embodiments of the present invention;

[0047] Figure 2 This is a schematic diagram of the first screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention;

[0048] Figure 3 This is a schematic diagram of the second screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention;

[0049] Figure 4 This is a schematic diagram of the third screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention;

[0050] Figure 5 This is a schematic diagram of the fourth screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention;

[0051] Figure 6 This is a flowchart of a display panel driver malfunction analysis method proposed in a specific embodiment of the present invention;

[0052] Figure 7 A schematic diagram of an electronic device that can be used to implement embodiments of the present invention is shown. Detailed Implementation

[0053] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0054] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0055] In a first aspect, embodiments of the present invention provide a method for analyzing display panel driving malfunctions; Figure 1 This is a flowchart of a display panel driver malfunction analysis method provided in an embodiment of the present invention. Figure 1 As shown, the analytical method includes:

[0056] S101, obtain the first defective screen to be analyzed corresponding to multiple products, and classify the first defective screen to be analyzed based on the preset defective screen library; if the first defective screen to be analyzed is the same as or nearly the same as the defective screen in the preset defective screen library, it is classified as a repairable first type of defective screen; otherwise, it is classified as an unrepairable second type of defective screen.

[0057] The preset defective image library contains representative defective images caused by dead pixels in the display panel's drive circuit, collected based on historical experience. After the lamp test, a first defective image to be analyzed can be obtained. If this first image is one of those in the preset defective image library, or similar to one of those images (for example, if one image in the library is a straight line from left to right, then if they are identical, the first image to be analyzed will display exactly the same image, i.e., the coordinates of the line are the same; if they are similar, then the defect in the first image to be analyzed will also be a straight line from left to right, but the coordinates of the line will be different from those in the preset defective image library), then it indicates that the product corresponding to this first image to be analyzed has a defect caused by the drive circuit. The drive circuit can then be repaired immediately. Therefore, this type of repairable first image to be analyzed is classified as a first category of defective images.

[0058] Furthermore, if the first screen to be analyzed is completely different from or dissimilar to any screen in the preset defective screen library, it indicates that the product corresponding to the first screen to be analyzed has a defect caused by other reasons. Since the cause cannot be clearly identified, it cannot be repaired temporarily. Therefore, this type of temporarily unrepairable second screen to be analyzed is classified as a second type of defective screen, and the cause of the defect will be further analyzed later.

[0059] S102, obtain the second screen to be analyzed after repairing the product corresponding to the first type of defective screen. If the second screen to be analyzed is different from the normal screen, it is classified as the first type of product. Obtain the first coordinate of the defective position of the first type of product based on the second screen to be analyzed. Traverse the driving circuit of the display panel along the direction of the first straight line based on the first coordinate and the first preset traversal coordinate number to analyze the cause of the defect of the first type of product.

[0060] Understandably, after classifying the first set of defective images to be analyzed, products corresponding to the first category of defective images that can be repaired immediately are repaired. After repair, a re-lighting test is performed to obtain the corresponding second set of defective images to be analyzed. If the second set of defective images is the same as the normal image, it indicates that the display is normal, meaning the defective pixels in the display panel's drive circuit have been repaired, and the product is considered a good product. Here, the normal image is the display image of a good product. If the second set of defective images is different from the normal image, for example, if it is still the same as the first set of defective images, it indicates that although the drive circuit of the display panel has been repaired, the repair has not resolved the display defect. This suggests that there may be other reasons for the display defect, or that the repaired drive circuit is not located at the location of the drive circuit causing the display defect.

[0061] Therefore, for the first type of product that still displays poorly after repair, it is necessary to traverse the display panel's drive circuit along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to find the true cause of the display malfunction. How to find the true cause of the display malfunction will be explained further in the following content.

[0062] S103, obtain the third image to be analyzed for the product corresponding to the second type of defective image after the light-lighting machine is replaced and the light-lighting test is performed again. If the third image to be analyzed is the same as the first image to be analyzed, it is classified as the second type of product. Based on the second preset number of traversal coordinates, traverse the drive circuit of the display panel from the corner point of the top or bottom of the display panel to the corner point on the opposite side along the direction of the first straight line to analyze the cause of the defect for the second type of product. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel.

[0063] Understandably, for products corresponding to the second type of defective display, the cause of the defect is analyzed by replacing the indicator light and retesting these products to rule out whether the defect is caused by poor contact between the indicator light and the product or other reasons. If, after replacing the indicator light, the third image to be analyzed for the products corresponding to the second type of defective display still displays poorly and is the same as the first image to be analyzed, then it indicates that the display defect is not caused by the indicator light, but by other internal reasons within these products. As for the cause, based on the second preset number of traversal coordinates, the drive circuit of the display panel is traversed from the top or bottom corner of the display panel to the opposite corner along the direction of the first straight line to analyze the cause of the defect for the second type of product. This part will be further introduced in the following content.

[0064] In addition, as a preferred embodiment of the display panel driver malfunction analysis method, after obtaining the third image to be analyzed (the image corresponding to the second type of malfunction, after the product undergoes a re-lighting test following replacement of the light-emitting device), the method further includes:

[0065] If the third screen to be analyzed is different from the first screen to be analyzed, then for the products corresponding to the second type of defective screen, the process of reclassifying and dividing them based on the third screen to be analyzed and the preset defective screen library is returned, and at the same time the cleaning equipment is controlled to clean the origin light machine.

[0066] In other words, if the product still displays poorly after replacing the signal ignition machine, but the displayed image (the third image to be analyzed) differs from the first image to be analyzed on the same display panel previously tested, then the poor display on that panel is partly due to a problem with the signal ignition machine. Therefore, the original signal ignition machine needs to be cleaned. That is, after identifying the cause of the problem, the signal ignition machine causing the display malfunction is repaired to prevent further display problems caused by the signal ignition machine. Simultaneously, the products that still display poorly are reclassified based on the third image to be analyzed and a preset database of faulty images to reassess whether they are repairable or not.

[0067] In other words, if the third image to be analyzed is one of the images in the preset defective image library, or is similar to one of the images in the preset defective image library, then it indicates that the product corresponding to the third image to be analyzed has a defect caused by the drive circuit, and is classified as a first-class defective image. After repair and re-evaluation, if the product still displays a defective image, it is classified as a first-class defective image. If the third image to be analyzed is completely different from or completely dissimilar to an image in the preset defective image library, then it is classified as a second-class defective image. Since a lamp-lighting test has just been performed, if a different lamp-lighting machine is used for testing, the displayed image will most likely be the same as the third image to be analyzed. Therefore, the product corresponding to the second-class defective image can be directly classified as a second-class product without changing the lamp-lighting test.

[0068] Next, the reasons for the display defects of the first and second types of products will be further analyzed.

[0069] In summary, by using a pre-set defective image library, defective images were categorized, and different causes of defects were analyzed for each category. During this process, repairable defective products were repaired, while unrepairable defective products were analyzed for external causes, specifically whether the indicator light machine was causing the display failure. Further analysis was then conducted on the first and second categories of products that still exhibited display failures. Consequently, some products with display failures were repaired, and some were re-inspected with replaced indicator lights. This process identified products that displayed correctly after repair, as well as those that were falsely detected despite already having good display quality, thus improving the product yield.

[0070] As a preferred solution for display panel driver malfunction analysis methods, such as Figures 2 to 5As shown, the preset bad screen library includes at least the first screen, the second screen, the third screen, and the fourth screen;

[0071] The defects in the first screen start from the left or right side of the display panel and end at the dark ray in the middle of the display panel;

[0072] The defects in the second image are rectangular shadows that start from the left or right side of the display panel, end at the center of the display panel where no light shines, and radiate outwards to the bottom of the display panel.

[0073] The defect in the third image is a dark straight line running from the left to the right side of the display panel;

[0074] The defect in the fourth image is a dark straight line running from the left to the right of the display panel, radiating from the dark straight line to the top of the display panel, and simultaneously forming a rectangular shadow radiating from the left or right side of the display panel to the center of the display panel.

[0075] Understandable, Figure 2 This is a schematic diagram of the first screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention. Figure 2 As shown, in the first image, the defect starts at point A on the right side of the display panel and ends at the unlit ray in the center of the display panel. Since the driving circuits in the display panel are generally located on the left and right sides, when the first image or a similar image appears in the first image to be analyzed, it can be assumed that point A in the right-side driving circuit of the display panel is faulty. Figure 2 The malfunction in the display is assumed to be caused by a fault at point A in the right-side drive circuit of the display panel.

[0076] In another example, the defect in the first image could also be a non-lit ray starting from the left side of the display panel and ending in the center of the display panel. This defect is assumed to be caused by a fault at that point in the left-side drive circuit of the display panel. It should be noted that the defect in the first image is a line defect caused by a fault at point A. For example, it could be due to a problem with the voltage transmitted to the faulty row in the drive circuit, preventing the pixels in that row from lighting up.

[0077] Figure 3 This is a schematic diagram of the second screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention. Figure 3 As shown, in the second image, the defect originates from point B on the right side of the display panel, ends at a non-lit ray in the center of the display panel, and radiates outwards to the bottom of the display panel, forming a rectangular shadow. Therefore, when the second image or a similar image appears on the first image to be analyzed, it can be assumed that point B in the right-side drive circuit of the display panel is faulty. Figure 3 The malfunction in the display is assumed to be caused by a fault at point B of the right-side drive circuit in the display panel.

[0078] In another example, the defect in the second image could also be a rectangular shadow formed by a non-lit ray starting from the left side of the display panel, ending in the center of the display panel, and radiating towards the bottom of the display panel. This defect is assumed to be caused by a fault at that point in the left-side drive circuit of the display panel. It should be noted that the defect in the second image is a surface defect caused by a fault at point B. For example, it's possible that a component in the drive circuit that transmits signals downwards has an open circuit, preventing the corresponding signal from being transmitted downwards from point B.

[0079] Figure 4 This is a schematic diagram of the third screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention. Figure 4 As shown, the defect in the third image is a non-lit straight line running from the left to the right side of the display panel. When the first image to be analyzed displays a third image or a similar third image, it can be assumed that point E in the left-side drive circuit and / or point F in the right-side drive circuit of the display panel is faulty. In other words, Figure 4 The default cause of the defective display is assumed to be a fault in point E of the left-side drive circuit and / or point F of the right-side drive circuit in the display panel. It should be noted that the defect in the third display is a line defect caused by a fault in point E and / or point F.

[0080] Figure 5 This is a schematic diagram of the fourth screen in the preset defective screen library in the display panel driver defect analysis method provided in this embodiment of the invention. Figure 5 As shown, the defect in the fourth image is a non-lit straight line running from the left to the right of the display panel, radiating towards the top of the display panel, and simultaneously forming a rectangular shadow radiating from the right side of the display panel towards the center. In this case, when the first image to be analyzed displays a fourth image or a similar fourth image, it can be assumed that point D in the left-side drive circuit of the display panel may be faulty, and point C in the right-side drive circuit may be faulty. That is to say, Figure 5 The default assumption for a defective display is that a fault may be present at point D in the left-side drive circuit of the display panel, or at point C in the right-side drive circuit. It should be noted that the defect in the fourth display is caused by a fault at point C, or a fault at both points C and D.

[0081] In another example, the defect in the fourth frame could also be a dark straight line running from the left to the right of the display panel, radiating from the dark straight line toward the top of the display panel, and simultaneously forming a rectangular shadow radiating from the left side of the display panel toward the center of the display panel.

[0082] Understandably, the aforementioned pre-set fault image library is compiled based on historical experience by collecting fault images commonly encountered in drive circuit malfunctions. Whether the fault is caused by a single point (line or image), or by two points (line or image), the specific causes can be predicted in advance based on experience. Therefore, when the first image to be analyzed matches the image type in the pre-set fault image library, the fault in the drive circuit can be identified and repaired promptly.

[0083] As a preferred embodiment of the display panel driver defect analysis method, before obtaining the second image to be analyzed after repairing the product corresponding to the first type of defective image, the method further includes:

[0084] Based on the first image to be analyzed, obtain the third coordinate of the product corresponding to the first type of defective image (this can be obtained by observation under a microscope);

[0085] The laser repair equipment based on the third coordinate control performs laser repair on the drive circuit of the product corresponding to the first type of defective image.

[0086] After obtaining the third coordinate, the row position in the drive circuit can be accurately located, thereby controlling the laser repair equipment to perform laser repair on the drive circuit of the product corresponding to the first type of defective image.

[0087] The following is a cause analysis for the first type of products that still exhibit display problems after repair.

[0088] As a preferred embodiment of the display panel driver failure analysis method, the driver circuit of the display panel is traversed along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to analyze the cause of failure for the first type of product, including:

[0089] Along the direction of the first straight line, the driving circuit of the display panel is traversed upward from the first coordinate by a first preset number of traversal coordinates and / or downward by a first preset number of traversal coordinates to confirm whether any actual defects are found.

[0090] If an actual defect is found, the type of the defect and its location between layers in the display panel are obtained to determine the cause of the defect.

[0091] If no actual defects are found, thermal imaging is used to perform thermal imaging on the driving circuit of the display panel, and the cause of the defect is identified based on the preset normal thermal imaging image.

[0092] In other words, if a second image to be analyzed still displays a defect after repair (likely the same as the first image), then the laser repair location may not be the cause of the fault. Therefore, using the first coordinate (obtained through microscopic observation, where the third coordinate is the same as the first when the second image is identical) as a baseline, the search area is expanded upwards or downwards. If the actual defect is found after expanding the search area, its type and interlayer location in the display panel can be analyzed to determine the cause of the defect. This defect type might be foreign matter or static electricity; foreign matter could be dust or metal particles. After discovering the defect, its type needs to be analyzed (through component analysis and microscopic observation) for classification. Otherwise, thermal imaging is used to determine the cause of the defect.

[0093] For example, the first preset number of traversal coordinates can be 5 pixels. If the first coordinate point is the 50th pixel from top to bottom, and the defective image is the first image, then the traversal can proceed sequentially upwards from the 50th pixel, traversing up to a maximum of 5 pixels. If an actual defect is found (which can be confirmed by microscopic observation), the actual defect type and its interlayer location in the display panel are obtained to determine the cause of the defect. If no actual defect is found (which can be confirmed by microscopic observation), the traversal continues sequentially downwards from the 50th pixel, traversing up to a maximum of 5 pixels. If an actual defect is found, the actual defect type and its interlayer location in the display panel are obtained to determine the cause of the defect. If no actual defect is found, the cause of the defect is determined using thermal imaging.

[0094] The following is a cause analysis for the second type of products that still have display problems after relighting the lights.

[0095] As a preferred embodiment of a display panel driver defect analysis method, based on a second preset number of traversal coordinates, the driver circuit of the display panel is traversed from the top or bottom corner of the display panel to the opposite corner along the direction of the first straight line to analyze the cause of defects in the second type of product, including:

[0096] From the top corner of the display panel towards the bottom, or from the bottom corner of the display panel towards the top, the driving circuit of the display panel is traversed a second preset number of traversal coordinates to confirm whether any actual defects are found.

[0097] If an actual defect is found, the type of the defect and its location between layers in the display panel are obtained to determine the cause of the defect.

[0098] If no actual defects are found, thermal imaging is used to perform thermal imaging on the driving circuit of the display panel, and the cause of the defect is identified based on the preset normal thermal imaging image.

[0099] Unlike the first type of product, analyzing the causes of defects in the second type of product requires traversing the display panel's driving circuitry a second preset number of coordinates, either from the top corner of the display panel towards the bottom or from the bottom corner towards the top, to confirm whether any actual defects are found. For example, the second type of product typically exhibits full-screen display failure and a cluttered image, which may indicate problems with the driving circuitry on both sides of the display panel.

[0100] Then, starting from the top left corner of the display panel, traverse 10 pixels downwards. If an actual defect is found (which can be confirmed by observation with a microscope), obtain the type of the actual defect and its location between layers in the display panel to clarify the cause of the defect.

[0101] If no actual defect is found, continue traversing 10 pixels upwards from the bottom left corner of the display panel. If an actual defect is found (which can be confirmed by observation with a microscope), obtain the type of the actual defect and its location between layers in the display panel to determine the cause of the defect.

[0102] If no actual defect is found, traverse 10 pixels downwards from the top right corner of the display panel. If an actual defect is found (which can be confirmed by observation with a microscope), obtain the type of the actual defect and its location between layers in the display panel to determine the cause of the defect.

[0103] If no actual defect is found, traverse 10 pixels upwards from the top right corner of the display panel. If an actual defect is found (which can be confirmed by observation with a microscope), obtain the type of the actual defect and its location between layers in the display panel to determine the cause of the defect.

[0104] If no actual defect is found, the cause of the defect is determined based on the preset normal thermal imaging image.

[0105] In the two examples above, as a preferred embodiment of the display panel driver defect analysis method, after obtaining the type of actual defect and its interlayer location in the display panel, the method further includes: establishing an actual defect analysis mapping table.

[0106] The establishment of the actual defect analysis mapping table includes:

[0107] Obtain the type and interlayer location of N consecutive historical actual defects in the display panel;

[0108] If the type of actual defect and its interlayer location in the display panel are the same in more than the first threshold number of N detections, or if the type of actual defect and its interlayer location in the display panel are the same in the second consecutive threshold number of detections, then it is determined that the corresponding layer manufacturing process of the display panel has introduced a defect.

[0109] An actual defect analysis mapping table is created based on the type of actual defect, its interlayer location in the display panel, and the manufacturing process, where N is a positive integer.

[0110] In other words, during the historical discovery of actual defects, the type of the defect and its interlayer location in the display panel can be recorded, along with its sequence number. For example, if there are N samples, and the type of the historical actual defect and its interlayer location in the display panel are the same for two consecutive historical actual defects (a second threshold number of times), or if the type of the historical actual defect and its interlayer location in the display panel are detected more than the first threshold number of times in the N total samples, then the defect is categorized, and it is inferred that the actual defect may originate from the process of preparing that layer. This allows for adjustments to the process of preparing that layer to repair that type of actual defect. The first and second thresholds can be set based on the total number of samples. No specific limitations are specified here.

[0111] For example, in 100 sample display panels, samples 20 through 80 have a dust defect. Looking at a cross-section of the display panel, the dust is located at the same position between the fourth and fifth layers from top to bottom. It can be inferred that the dust originated from the process between the fourth and fifth layers. The process between the fourth and fifth layers can then be detected and adjusted to repair the dust at that location. Alternatively, in 100 sample display panels, 50 samples, not consecutively, have a dust defect, and looking at a cross-section of the display panel, the dust is located at the same position between the fourth and fifth layers from top to bottom. It can be inferred that the dust originated from the process between the fourth and fifth layers. The process between the fourth and fifth layers can then be detected and adjusted to repair the dust at that location.

[0112] Figure 6 This is a flowchart of a display panel driver malfunction analysis method proposed in a specific embodiment of the present invention. Figure 6 As shown, the analytical method includes:

[0113] S201, Start, acquire the first defective screen to be analyzed;

[0114] S202, determine whether it is the same as or nearly the same as the defective image in the preset defective image library. If yes, execute S203; otherwise, execute S207.

[0115] S203, perform repairs and obtain the second screen to be analyzed;

[0116] S204, determine whether the second screen to be analyzed is the same as the normal screen. If yes, execute S206; otherwise, execute S205.

[0117] S205 is classified as a Category I product.

[0118] S206 is classified as a good product.

[0119] S207, replace the signal light machine and re-test the lights, and obtain the third image to be analyzed;

[0120] S208, determine whether it is the same as the first screen to be analyzed previously obtained for the corresponding product. If yes, proceed to S209; otherwise, proceed to S210.

[0121] S209 is classified as a second-category product.

[0122] S210, cleaning signal light machine;

[0123] S211, determine whether the third screen to be analyzed is the same as or nearly the same as the defective screen in the preset defective screen library. If yes, execute S212; otherwise, execute S214.

[0124] S212, perform repairs and obtain the fourth screen to be analyzed;

[0125] S213, determine whether the fourth screen to be analyzed is the same as the normal screen; if yes, execute S215; if no, execute S216.

[0126] S214, determine whether the third screen to be analyzed is the same as the normal screen. If yes, execute S215; otherwise, execute S209.

[0127] S215 is classified as a good product;

[0128] S216 is classified as a Category I product.

[0129] Following steps S205 and S216, the method further includes:

[0130] S222, traverse 5 pixels upwards and / or downwards from the coordinates of the defective point to find the actual defect;

[0131] S223, confirm whether an actual defect has been found; if yes, proceed to S224; otherwise, proceed to S226.

[0132] S224, obtain the actual defect type and interlayer location;

[0133] S225, Establish an actual defect mapping table;

[0134] S226, Thermal Imaging Analysis.

[0135] Following S209, it also includes:

[0136] S217, Traverse 10 pixels upwards and / or downwards from the four corner points to find the actual defects;

[0137] S218, confirm whether an actual defect has been found; if yes, proceed to S220; otherwise, proceed to S219.

[0138] S219, Thermal Imaging Analysis;

[0139] S220, obtain the actual defect type and interlayer location;

[0140] S221, Establish an actual defect mapping table.

[0141] In step S207, after changing the signal light machine, at least two lighting tests are performed.

[0142] In S220 and S224, compositional analysis (such as cross-sectional structural analysis) can be used.

[0143] In S219 and S226, the location of the bad pixels can be compared with a preset normal thermal image.

[0144] In a second aspect, embodiments of the present invention provide a display panel driving failure analysis device, comprising:

[0145] The classification module is used to obtain the first defective images to be analyzed for multiple products, and classify the first defective images to be analyzed based on the preset defective image library. If the first defective image to be analyzed is the same as or nearly the same as the defective images in the preset defective image library, it is classified as a repairable first-class defective image; otherwise, it is classified as an unrepairable second-class defective image.

[0146] The first analysis module is used to obtain the second image to be analyzed after the product corresponding to the first type of defective image has been repaired. If the second image to be analyzed is different from the normal image, it is classified as the first type of product. The first coordinate of the defective position of the first type of product is obtained based on the second image to be analyzed. The driving circuit of the display panel is traversed along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to analyze the cause of the defect of the first type of product.

[0147] The second analysis module is used to obtain the third image to be analyzed of the product corresponding to the second type of defective image after the lighting test is repeated after the lighting machine is replaced. If the third image to be analyzed is the same as the first image to be analyzed, it is classified as the second type of product. Based on the second preset number of traversal coordinates, the drive circuit of the display panel is traversed from the top or bottom corner of the display panel to the opposite corner along the direction of the first straight line to analyze the cause of the defect of the second type of product. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel.

[0148] As a preferred method for analyzing display panel driver defects, the preset defective screen library includes at least a first screen, a second screen, a third screen, and a fourth screen.

[0149] The defects in the first screen start from the left or right side of the display panel and end at the dark ray in the middle of the display panel;

[0150] The defects in the second image are rectangular shadows that start from the left or right side of the display panel, end in the middle of the display panel (where no light shines), and radiate outwards to the bottom of the display panel.

[0151] The defect in the third image is a dark straight line running from the left to the right side of the display panel;

[0152] The defect in the fourth image is a dark straight line running from the left to the right of the display panel, radiating from the dark straight line to the top of the display panel, and simultaneously forming a rectangular shadow radiating from the left or right side of the display panel to the center of the display panel.

[0153] As a preferred embodiment of the display panel driver failure analysis method, the second analysis module in the display panel driver failure analysis device is also used for,

[0154] If the third screen to be analyzed is different from the first screen to be analyzed, then for the products corresponding to the second type of defective screen, the process of reclassifying and dividing them based on the third screen to be analyzed and the preset defective screen library is returned, and at the same time the cleaning equipment is controlled to clean the origin light machine.

[0155] As a preferred embodiment of the display panel driver failure analysis method, the first analysis module in the display panel driver failure analysis device is further used for,

[0156] Based on the first image to be analyzed, obtain the third coordinate of the product corresponding to the first type of defective image;

[0157] The laser repair equipment based on the third coordinate control performs laser repair on the drive circuit of the product corresponding to the first type of defective image.

[0158] As a preferred embodiment of the display panel driver malfunction analysis method, the first analysis module includes:

[0159] The first traversal module is used to traverse the drive circuit of the display panel upwards from the first coordinate by a first preset number of traversal coordinates and / or downwards from the first preset number of traversal coordinates along the direction of the first straight line to confirm whether any actual defects are found.

[0160] The first confirmation module is used to obtain the type of actual defect and its location between layers in the display panel if an actual defect is found, and to clarify the cause of the defect.

[0161] The first confirmation module is also used to perform thermal imaging on the driving circuit of the display panel if no actual defect is found, and to identify the cause of the defect based on a preset normal thermal imaging image.

[0162] As a preferred embodiment of the display panel driver malfunction analysis method, the second analysis module includes:

[0163] The second traversal module is used to traverse the drive circuit of the display panel from the top corner of the display panel to the bottom, or from the bottom corner of the display panel to the top, a second preset number of traversal coordinates to confirm whether any actual defects are found.

[0164] The second confirmation module is used to obtain the type of actual defect and its location between layers in the display panel if an actual defect is found, and to clarify the cause of the defect.

[0165] The second confirmation module is used to perform thermal imaging on the driving circuit of the display panel if no actual defect is found, and to identify the cause of the defect based on a preset normal thermal imaging image.

[0166] As a preferred embodiment of the display panel driver defect analysis method, the display panel driver defect analysis device further includes: a creation module, used to create an actual defect analysis mapping table;

[0167] The establishment of the actual defect analysis mapping table includes:

[0168] Obtain the type and interlayer location of N consecutive historical actual defects in the display panel;

[0169] If the type of actual defect detected more than the first threshold number of times in N tests is the same as the interlayer location in the display panel, or if the type of actual defect detected in the second threshold number of consecutive tests is the same as the interlayer location in the display panel, then it is determined that the corresponding layer manufacturing process of the display panel has introduced a defect.

[0170] An actual defect analysis mapping table is created based on the type of actual defect, its interlayer location in the display panel, and the manufacturing process, where N is a positive integer.

[0171] The display panel driver failure analysis device provided in this embodiment of the invention can execute the display panel driver failure analysis method provided in any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the method execution.

[0172] Thirdly, embodiments of the present invention provide an electronic device, the electronic device comprising:

[0173] At least one processor; and

[0174] A memory communicatively connected to the at least one processor; wherein,

[0175] The memory stores a computer program that can be executed by the at least one processor, which enables the at least one processor to perform the display panel driver malfunction analysis method according to any embodiment of the present invention.

[0176] Fourthly, embodiments of the present invention provide a computer-readable storage medium storing computer instructions for causing a processor to execute the display panel driver malfunction analysis method described in any embodiment of the present invention.

[0177] Figure 7 A schematic diagram of an electronic device that can be used to implement embodiments of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0178] like Figure 7As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded from storage unit 18 into the RAM 13. The RAM 13 may also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0179] Multiple components in electronic device 10 are connected to input / output (I / O) interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of monitors, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0180] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as display panel driver defect analysis methods.

[0181] In some embodiments, the display panel driver defect analysis method may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on electronic device 10 via read-only memory (ROM) 12 and / or communication unit 19. When the computer program is loaded into random access memory (RAM) 13 and executed by processor 11, one or more steps of the display panel driver defect analysis method described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the display panel driver defect analysis method by any other suitable means (e.g., by means of firmware).

[0182] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0183] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0184] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0185] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0186] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0187] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0188] The beneficial effects of the present invention are as follows: According to the real-time display panel driver defect analysis method, apparatus, device, and medium provided by the present invention, the method includes: acquiring a first screen to be analyzed corresponding to defects of multiple products, and classifying the first screen to be analyzed based on a preset defect screen library; wherein, if the first screen to be analyzed is the same as or nearly the same as a defect screen in the preset defect screen library, it is classified as a repairable first type of defect screen; otherwise, it is classified as an unrepairable second type of defect screen; acquiring a second screen to be analyzed after repairing the product corresponding to the first type of defect screen; if the second screen to be analyzed is different from the normal screen, it is classified as a first type of product; and acquiring the first type of product defects based on the second screen to be analyzed. The system firstly identifies the location's coordinates and then traverses the display panel's drive circuit along the direction of a first straight line based on these coordinates and a preset number of traversal coordinates to analyze the causes of defects in the first category of products. It then obtains the third image to be analyzed for the second category of defective images, obtained after the product undergoes a re-lighting test following a replacement of the indicator light. If the third image is identical to the first image, it is classified as a second category product. Finally, based on a second preset number of traversal coordinates, the system traverses the display panel's drive circuit from the top or bottom corner of the display panel towards the opposite corner along the direction of the first straight line to analyze the causes of defects in the second category of products. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel. This allows for timely identification and classification of defect causes, enabling repairs and improving product yield.

[0189] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0190] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A method for analyzing display panel driver malfunctions, characterized in that, include: The system acquires the first defective images corresponding to multiple products and classifies them based on a preset defective image library. If the first defective image is the same as or nearly the same as a defective image in the preset defective image library, it is classified as a repairable first-class defective image; otherwise, it is classified as an unrepairable second-class defective image. The system obtains a second image to be analyzed after repairing the product corresponding to the first type of defective image. If the second image to be analyzed is different from the normal image, it is classified as the first type of product. The system obtains the first coordinate of the defective location of the first type of product based on the second image to be analyzed. The system then traverses the drive circuit of the display panel along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to analyze the cause of the defect in the first type of product. The third image to be analyzed is obtained after the product corresponding to the second type of defective image undergoes a relighting test after the light-lighting machine is replaced. If the third image to be analyzed is the same as the first image to be analyzed, it is classified as the second type of product. Based on the second preset number of traversal coordinates, the drive circuit of the display panel is traversed from the corner point of the top or bottom of the display panel to the corner point on the opposite side along the direction of the first straight line to analyze the cause of the defect of the second type of product. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel.

2. The display panel driver malfunction analysis method according to claim 1, characterized in that, The preset bad image library includes at least a first image, a second image, a third image, and a fourth image; The defect in the first image is a non-lit ray that starts from the left or right side of the display panel and ends in the middle of the display panel; The defect in the second image is a rectangular shadow that starts from the left or right side of the display panel, ends at the center of the display panel where there is no light, and radiates outwards to the bottom of the display panel. The defect in the third image is a dark straight line running from the left to the right side of the display panel; The defect in the fourth image is a dark straight line running from the left to the right of the display panel, radiating from the dark straight line toward the top of the display panel, and simultaneously forming a rectangular shadow radiating from the left or right side of the display panel toward the center of the display panel.

3. The display panel driver malfunction analysis method according to claim 1, characterized in that, After obtaining the third image to be analyzed, which shows the product corresponding to the second type of defective image undergoing a re-lighting test after the light-emitting machine was replaced, the analysis also includes: If the third image to be analyzed is different from the first image to be analyzed, then for the products corresponding to the second type of defective images, the step of reclassifying and dividing them based on the third image to be analyzed and the preset defective image library is returned, and at the same time the cleaning equipment is controlled to clean the original signal light machine.

4. The display panel driver malfunction analysis method according to claim 1, characterized in that, Before obtaining the second image to be analyzed after repairing the product corresponding to the first type of defective image, the method further includes: Based on the first image to be analyzed, obtain the third coordinates of the product corresponding to the first type of defective image; The laser repair equipment, controlled by the third coordinate, performs laser repair on the drive circuit of the product corresponding to the first type of defective image.

5. The display panel driver malfunction analysis method according to claim 1, characterized in that, The driving circuit that traverses the display panel along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to perform defect cause analysis for the first type of product includes: Along the direction of the first straight line, the driving circuit of the display panel is traversed upward from the first coordinate by a first preset number of traversal coordinates and / or downward by a first preset number of traversal coordinates to confirm whether any actual defects are found. If an actual defect is found, the type of the actual defect and its location between layers in the display panel are obtained to determine the cause of the defect. If no actual defects are found, thermal imaging is performed on the driving circuit of the display panel, and the cause of the defect is identified based on a preset normal thermal imaging image.

6. The display panel driver malfunction analysis method according to claim 1, characterized in that, The driving circuit that traverses the display panel from the top or bottom corner to the opposite corner along the direction of the first straight line, based on a second preset number of traversal coordinates, is used to analyze the causes of defects in the second type of product, including: From the top corner of the display panel towards the bottom, or from the bottom corner of the display panel towards the top, the driving circuit of the display panel is traversed a second preset number of traversal coordinates to confirm whether any actual defects are found. If an actual defect is found, the type of the actual defect and its location between layers in the display panel are obtained to determine the cause of the defect. If no actual defects are found, thermal imaging is performed on the driving circuit of the display panel, and the cause of the defect is identified based on a preset normal thermal imaging image.

7. The display panel driver malfunction analysis method according to claim 5 or 6, characterized in that, After obtaining the type of the actual defect and its interlayer location in the display panel, the method further includes: establishing an actual defect analysis mapping table; The establishment of the actual defect analysis mapping table includes: Obtain the type and interlayer location of N consecutive historical actual defects in the display panel; If the type of actual defect detected more than the first threshold number of times in N tests is the same as the interlayer location in the display panel, or if the type of actual defect detected in the second threshold number of consecutive tests is the same as the interlayer location in the display panel, then it is determined that the corresponding layer manufacturing process of the display panel has introduced a defect. The actual defect analysis mapping table is created based on the type of actual defect, its interlayer location in the display panel, and the manufacturing process, where N is a positive integer.

8. A display panel driver malfunction analysis device, characterized in that, include: The classification module is used to acquire the first defective images to be analyzed corresponding to multiple products, and classify the first defective images to be analyzed based on a preset defective image library; wherein, if the first defective image to be analyzed is the same as or nearly the same as the defective images in the preset defective image library, it is classified as a repairable first type of defective image; otherwise, it is classified as an unrepairable second type of defective image. The first analysis module is used to obtain the second image to be analyzed after the product corresponding to the first type of defective image has been repaired. If the second image to be analyzed is different from the normal image, it is classified as the first type of product. The first coordinate of the defective position of the first type of product is obtained based on the second image to be analyzed. The driving circuit of the display panel is traversed along the direction of the first straight line based on the first coordinate and the first preset number of traversal coordinates to analyze the cause of the defect of the first type of product. The second analysis module is used to obtain the third image to be analyzed of the product corresponding to the second type of defective image after the lighting test is repeated after the lighting machine is replaced. If the third image to be analyzed is the same as the first image to be analyzed, it is classified as the second type of product. Based on the second preset number of traversal coordinates, the drive circuit of the display panel is traversed from the corner of the top or bottom of the display panel to the corner of the opposite side along the direction of the first straight line to analyze the cause of the defect of the second type of product. The direction of the first straight line is parallel to the direction from the top to the bottom of the display panel.

9. An electronic device, characterized in that, The electronic device includes: At least one processor; and A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program that can be executed by the at least one processor, the computer program being executed by the at least one processor to enable the at least one processor to perform the display panel driver malfunction analysis method according to any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that cause a processor to execute the display panel driver malfunction analysis method according to any one of claims 1-7.

Images