一种确定窄间隙低气压放电电压的方法及系统
By determining the low-pressure discharge voltage in a narrow gap, and considering secondary electron emission and multipath effects, the problem of narrow gap discharge voltage assessment is solved, and more accurate discharge voltage prediction is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- XIAN INSTITUE OF SPACE RADIO TECH
- Filing Date
- 2023-09-22
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies lack methods for evaluating low-pressure discharge voltage in narrow-gap structures, making it difficult to accurately explain and predict low-pressure discharge phenomena under narrow-gap conditions.
By determining the basic parameters, calculating the secondary electron emission coefficient and the ion-enhanced field emission electron coefficient, considering the multipath effect, optimizing the calculation of the narrow gap discharge voltage, introducing the ion bombardment and field electron emission mechanism, and correcting the traditional Paschen theorem.
A narrow-gap low-pressure discharge voltage value was obtained that is more consistent with the experimental results, thus improving the accuracy and prediction precision of the narrow-gap discharge voltage threshold.
Smart Images
Figure CN117452150B_ABST