A direct scanning method for process paths expressed by curves using laser scanning galvanometers

By using parametric curve equations to directly express the process path in additive manufacturing, the problem that laser scanning galvanometers do not support smooth curve motion is solved, improving data processing efficiency and part printing accuracy, and making it suitable for efficient printing of complex curved surface parts.

CN117483802BActive Publication Date: 2026-05-26NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
Filing Date
2023-12-01
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

The laser scanning galvanometers used in existing additive manufacturing equipment do not support smooth curve motion, resulting in loss of accuracy and low efficiency in the printing of complex curved parts.

Method used

The process path is directly expressed by parametric curve equations. By generating, analyzing, splitting and calculating the curve scanning method of the laser scanning galvanometer, the galvanometer is directly driven to perform laser printing, reducing data conversion and calculation workload and improving printing accuracy.

Benefits of technology

It improves the data processing efficiency and part printing accuracy of additive manufacturing, reduces the loss of shape accuracy of complex curved parts during the printing process, and is suitable for the integrated design and printing of high surface quality parts.

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Abstract

This invention discloses a direct scanning method for process paths expressed by curves using a laser scanning galvanometer, relating to the field of additive manufacturing technology. The method includes the following steps: generating predefined additive manufacturing process path data on a host computer and sending the generated process path data to a slave computer; parsing the input process path on the slave computer, identifying the curve type and parameters, and calculating the arc length of each Bezier curve segment; calculating the corresponding curve sampling number based on the curve arc length, and generating a control time set and a sampling point coordinate set based on the sampling period; calculating the error-corrected digital voltage signal based on the calculated sampling point coordinates and the galvanometer error calibration matrix; converting the digital voltage signal into an analog voltage signal and driving the galvanometer to perform additive manufacturing trajectory scanning. This invention can reduce part accuracy loss during additive manufacturing and save significant computational costs in the data processing steps.
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