Flexible microelectronic device clamps for constant acceleration testers

Abstract

This invention relates to a flexible microelectronic device fixture for a constant acceleration tester, comprising a lower fixing seat for fixing to the inner wall of the test cavity of the constant acceleration tester, and an upper fixing seat connected to the lower fixing seat. A gap is formed between the upper and lower fixing seats, and the shape of the gap is adapted to the shape of the flexible microelectronic device. In this invention, the gap between the upper and lower fixing seats secures the flexible microelectronic device, transforming the originally flexible device into a rigid device, allowing it to be tested using existing constant acceleration testers. This solves the risk of detachment and device damage that exists when testing flexible microelectronic devices under constant acceleration, and expands the testing range of existing constant acceleration testers.

Description

Technical Field

[0001] This invention belongs to the field of integrated circuit constant acceleration testing technology, and relates to a flexible microelectronic device fixture for a constant acceleration tester. Background Technology

[0002] Constant acceleration testing is an important part of the testing methods and procedures for microelectronic devices. The purpose of constant acceleration testing is to reveal structural and mechanical defects that may not be detected during shock and vibration testing. It can also be used as a high-stress test to determine the mechanical strength limits of packages, internal metallization and lead systems, chip or substrate soldering, and other components of microelectronic devices. If an appropriate stress intensity is determined, this test can also be used as a 100% screening test for production lines to detect and reject devices whose structural components have mechanical strength below the nominal value.

[0003] With the development of the microelectronics industry, traditional rigid microelectronic devices can no longer meet the application needs of many scenarios, such as implantable medical devices, smart wearables, and conformal mounting on curved surfaces. Against this backdrop, flexible microelectronic devices have emerged. However, some conventional instruments for testing rigid microelectronic devices (including constant acceleration testers) are no longer sufficient to meet the testing requirements of flexible devices.

[0004] The constant acceleration tester is a cylinder with grooves inside a test chamber. During testing, flexible microelectronic devices are typically glued and fixed into these grooves. However, since the size of the grooves is fixed, it becomes difficult to place larger flexible microelectronic devices within them. Furthermore, directly gluing the flexible microelectronic devices into the test chamber carries the risk of detachment during testing due to the small attachment area. Moreover, because the flexible microelectronic devices are not fully glued, uneven stress can occur during testing, applying additional stress under high-speed testing conditions and posing a risk of device damage. Summary of the Invention

[0005] In view of the shortcomings of the prior art, the technical problem to be solved by the present invention is to provide a flexible microelectronic device fixture for a constant acceleration tester.

[0006] To achieve the above objectives, the present invention provides the following technical solution:

[0007] A flexible microelectronic device fixture for a constant acceleration tester, the constant acceleration tester having a test cavity, the inner wall of the test cavity having multiple strip-shaped protrusions arranged along the circumferential direction, with a groove formed between two adjacent strip-shaped protrusions; the flexible microelectronic device fixture includes a lower fixing seat for fixing to the inner wall of the test cavity of the constant acceleration tester and an upper fixing seat connected to the lower fixing seat, a gap being formed between the upper fixing seat and the lower fixing seat, the shape of the gap being adapted to the shape of the flexible microelectronic device.

[0008] Furthermore, the lower fixing base includes a base plate, the width of which is less than the width of the groove, for attaching and fixing to the inner wall of the test cavity; a side plate is connected to each side of the base plate, one end of which extends into the interior of the test cavity, and the distance between the extended end of the side plate and the interior of the test cavity is greater than the thickness of the strip protrusion; a lower clamping plate is connected to the extended end of each side plate, and the two lower clamping plates are located on the same plane.

[0009] Furthermore, the base plate is arc-shaped, and the shape of the base plate is adapted to the shape of the inner wall of the test cavity.

[0010] Furthermore, the upper fixing seat includes a main clamping plate, the width of which is greater than the width of the lower fixing seat; a snap-fit ​​part is connected to each side of the main clamping plate, the snap-fit ​​part is used to connect the main clamping plate to the lower fixing seat, and a gap is formed between the main clamping plate and the two lower clamping plates.

[0011] Furthermore, the snap-fit ​​part includes an arc-shaped plate, a connecting plate, and a stabilizing plate. The first end of the arc-shaped plate is connected to the main clamping plate, and the second end is connected to the stabilizing plate through the connecting plate. The two arc-shaped plates bend inward relative to each other from their first ends, so that the distance between the two arc-shaped plates gradually decreases, and the minimum distance between the two arc-shaped plates is less than the width of the lower fixing seat. The stabilizing plate is used to bond and fix to the inner wall of the test cavity, thereby keeping the main clamping plate stable.

[0012] Furthermore, the stabilizing plate is arc-shaped, and the shape of the stabilizing plate is adapted to the shape of the inner wall of the test cavity.

[0013] Furthermore, the height of the gap is greater than the thickness of the flexible microelectronic device, and the difference between the height of the gap and the thickness of the flexible microelectronic device is less than or equal to 0.3 cm.

[0014] Furthermore, the width of the gap is greater than the width of the flexible microelectronic device, and the difference between the width of the gap and the width of the flexible microelectronic device is less than or equal to 0.5 cm.

[0015] Furthermore, the length of the upper fixing seat is the same as the length of the lower fixing seat.

[0016] Furthermore, both the upper and lower fixing bases are made of stainless steel.

[0017] In this invention, a gap is formed between the upper and lower fixing seats to secure the flexible microelectronic device, transforming the originally flexible device into a rigid one, allowing it to be tested using existing constant acceleration testers. This solves the risk of detachment and device damage that exists when fixing flexible microelectronic devices for constant acceleration testing, and expands the testing range of existing constant acceleration testers. Furthermore, the flexible microelectronic device fixtures are all made of high-strength stainless steel, meeting various requirements during constant acceleration testing. Fixtures of corresponding sizes can be customized according to the different dimensions of the flexible microelectronic devices, satisfying the constant acceleration testing needs of flexible microelectronic devices of different sizes. Attached Figure Description

[0018] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0019] Figure 1 This is a schematic diagram of the cross-section of a constant acceleration tester.

[0020] Figure 2 This is a cross-sectional schematic diagram of one embodiment of the flexible microelectronic device fixture for a constant acceleration tester according to the present invention.

[0021] Figure 3 This is a schematic diagram of the cross-section of the upper fixed seat.

[0022] Figure 4 This is a schematic diagram of the cross-section of the lower fixed base.

[0023] Figure 5 This is a schematic diagram of the cross-section of a flexible microelectronic device after it has been fixed in a constant acceleration tester using a fixture.

[0024] The meanings of the labels in the attached diagram are as follows:

[0025] Upper fixing base -100; Main clamping plate -110; Arc-shaped plate -121; Connecting plate -122; Stabilizing plate -123;

[0026] Lower fixed base - 200; base plate - 210; side plate - 220; lower clamping plate - 230;

[0027] Gap - 300; Flexible microelectronic device - 400; Constant acceleration tester - 500; Test cavity - 510; Strip bump - 520; Groove - 530. Detailed Implementation

[0028] The following specific examples illustrate the implementation of the present invention. The illustrations provided in the following embodiments are only schematic representations of the basic concept of the present invention. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0029] This invention discloses a flexible microelectronic device fixture for a constant acceleration tester. Please refer to [link to relevant documentation]. Figure 1 The constant acceleration tester 500 is provided with a cylindrical test cavity 510. Multiple strip-shaped protrusions 520 are uniformly arranged along the circumferential direction on the inner wall of the test cavity 510. A groove 530 for placing a flexible microelectronic device 400 is formed between two adjacent strip-shaped protrusions 520.

[0030] Please see Figure 2 The flexible microelectronic device fixture includes a lower fixing seat 200 for fixing to the inner wall of the test cavity 510 of the constant acceleration tester 500, and an upper fixing seat 100 connected to the lower fixing seat 200. The length of the upper fixing seat 100 (i.e., the length along the axis of the test cavity 510) can be the same as the length of the lower fixing seat 200. Both the upper fixing seat 100 and the lower fixing seat 200 can be made of stainless steel. For example, both the upper fixing seat 100 and the lower fixing seat 200 can be made of 304 stainless steel, which has high strength and can meet various requirements in the constant acceleration test process.

[0031] Please see Figure 3 and Figure 4 The lower fixing base 200 includes a base plate 210, the width of which is less than the width of the groove 530. Preferably, the base plate 210 is arc-shaped, matching the shape of the inner wall of the test cavity 510, so that the shape of the base plate 210 matches the shape of the inner wall of the test cavity 510, facilitating the adhesion and fixing of the base plate 210 to the inner wall of the test cavity 510. A side plate 220 is connected to each side of the base plate 210, with one end of the side plate 220 extending into the interior of the test cavity 510. (See also...) Figure 5 The distance h1 between the protruding end of the side plate 220 and the inner wall of the test cavity 510 is greater than the thickness h2 of the strip protrusion 520; each of the protruding ends of the side plate 220 is connected to a lower clamping plate 230, and the two lower clamping plates 230 are located on the same plane so that the distance between the two lower clamping plates 230 and the upper fixing seat 100 remains consistent.

[0032] Please continue reading. Figure 3The upper fixing base 100 includes a main clamping plate 110, the width L1 of which is greater than the width L3 of the lower fixing base 200. A snap-fit ​​portion is connected to each side of the main clamping plate 110, the snap-fit ​​portion being used to connect the main clamping plate 110 to the lower fixing base 200, forming a gap 300 between the main clamping plate 110 and the two lower clamping plates 230. In this embodiment, the snap-fit ​​portion includes an arc-shaped plate 121, a connecting plate 122, and a stabilizing plate 123. The first end of the arc-shaped plate 121 is connected to the main clamping plate 110, and the second end is connected to the stabilizing plate 123 via the connecting plate 122. The two arc-shaped plates 121 bend inwards relative to each other from their first ends, gradually reducing the distance between the two arc-shaped plates 121, and the minimum distance L2 between the two arc-shaped plates 121 is less than the width L1 of the lower fixing base 200. The stabilizing plate 123 is used to bond and fix to the inner wall of the test cavity 510, thereby keeping the main clamping plate 110 stable; the stabilizing plate 123 is preferably arc-shaped with the same shape as the inner wall of the test cavity 510, so that the shape of the stabilizing plate 123 is adapted to the shape of the inner wall of the test cavity 510.

[0033] Please continue reading. Figure 2 A gap 300 is formed between the upper fixing seat 100 and the lower fixing seat 200. The shape of the gap 300 is adapted to the shape of the flexible microelectronic device 400 to fix the flexible microelectronic device 400, thus transforming the originally flexible device into a rigid device, which can then be tested using the existing constant acceleration tester 500. The distance h3 between the main clamping plate 110 and the lower clamping plate 230 (i.e., the height of the gap 300) is greater than the thickness of the flexible microelectronic device 400. Preferably, the difference between the distance between the main clamping plate 110 and the lower clamping plate 230 and the thickness of the flexible microelectronic device 400 is less than or equal to 0.3 cm; for example, the difference between the distance between the main clamping plate 110 and the lower clamping plate 230 and the thickness of the flexible microelectronic device 400 can be 0.2 cm. The width of the gap 300 is greater than the width of the flexible microelectronic device 400, preferably the difference between the width of the gap 300 and the width of the flexible microelectronic device 400 is less than or equal to 0.5 cm; for example, the difference between the width of the gap 300 and the width of the flexible microelectronic device 400 can be 0.3 cm. For flexible microelectronic devices 400 of different sizes, fixtures of corresponding sizes can be customized, as long as the size of the gap 300 meets the above requirements, thereby meeting the needs of conducting constant acceleration experiments on flexible microelectronic devices 400 of different sizes.

[0034] The working principle of this embodiment is as follows:

[0035] Please see Figures 1 to 5Before performing a constant acceleration test on the flexible microelectronic device 400, the lower fixing seat 200 is placed in the groove 530 between two adjacent strip protrusions 520, and the lower fixing seat 200 is attached to the inner wall of the test cavity 510 by applying double-sided tape or other adhesive to the bottom surface of the base plate 210. Since the shape of the base plate 210 matches the inner wall of the test cavity 510, the base plate 210 can be firmly attached to the inner wall of the test cavity 510. Through the design of the height of the side plate 220, the two lower clamping plates 230 can be positioned precisely on the outer edges of the strip protrusions 520 on both sides, thus preventing the angle between the lower clamping plates 230 and the side plate 220 from changing and causing the two lower clamping plates 230 to be out of plane.

[0036] Next, the upper fixing seat 100 is fastened onto the lower fixing seat 200. To prevent the upper fixing seat 100 from shifting during the constant acceleration test, double-sided tape or other adhesive materials can be attached to the bottom surfaces of the two stabilizing plates 123, and the stabilizing plates 123 are then attached to the inner wall of the test cavity 510. This ensures the stability of the upper fixing seat 100 during the constant acceleration test. Finally, the flexible microelectronic device 400 is placed in the gap 300 between the upper fixing seat 100 and the lower fixing seat 200. Since the height and width of the gap 300 are only slightly larger than the thickness and width of the flexible microelectronic device 400, the flexible microelectronic device 400 can be fixed.

[0037] In this embodiment, the upper fixing base 100 and the lower fixing base 200, after assembly, form a cavity for fixing the flexible microelectronic device 400, transforming the originally flexible device into a rigid device, allowing it to be tested using the existing constant acceleration tester 500. This solves the problems of the flexible microelectronic device 400 being difficult to fix in the constant acceleration tester 500, easily falling off during constant acceleration testing, and uneven stress on the flexible microelectronic device 400 during testing, which can apply stress to the flexible device under high-speed testing conditions and pose a risk of device damage. This expands the testing range of the existing constant acceleration tester 500. In addition, both the upper fixing base 100 and the lower fixing base 200 are made of stainless steel, a material with high strength that can meet various requirements in the constant acceleration test process. Fixtures of corresponding sizes can be customized according to the different dimensions of the flexible microelectronic device 400 to meet the constant acceleration testing needs of flexible microelectronic devices 400 of different sizes.

[0038] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. A flexible microelectronic device fixture for a constant acceleration tester, wherein the constant acceleration tester has a test cavity, and a plurality of strip-shaped protrusions are arranged along the circumferential direction on the inner wall of the test cavity, with a groove formed between two adjacent strip-shaped protrusions; characterized in that: The flexible microelectronic device fixture includes a lower fixing seat for fixing to the inner wall of the test cavity of a constant acceleration tester and an upper fixing seat connected to the lower fixing seat. A gap is formed between the upper fixing seat and the lower fixing seat, and the shape of the gap is adapted to the shape of the flexible microelectronic device.

2. The flexible microelectronic device fixture for a constant acceleration tester according to claim 1, characterized in that: The lower fixing base includes a base plate, the width of which is less than the width of the groove, for attaching and fixing to the inner wall of the test cavity; a side plate is connected to each side of the base plate, one end of which extends into the interior of the test cavity, and the distance between the extended end of the side plate and the interior of the test cavity is greater than the thickness of the strip protrusion; a lower clamping plate is connected to the extended end of each side plate, and the two lower clamping plates are located on the same plane.

3. The flexible microelectronic device fixture for a constant acceleration tester according to claim 2, characterized in that: The base plate is arc-shaped, and its shape is adapted to the shape of the inner wall of the test cavity.

4. The flexible microelectronic device fixture for a constant acceleration tester according to claim 2, characterized in that: The upper fixing base includes a main clamping plate, the width of which is greater than the width of the lower fixing base; a snap-fit ​​part is connected to each side of the main clamping plate, the snap-fit ​​part is used to connect the main clamping plate to the lower fixing base, and a gap is formed between the main clamping plate and the two lower clamping plates.

5. The flexible microelectronic device fixture for a constant acceleration tester according to claim 4, characterized in that: The snap-fit ​​part includes an arc-shaped plate, a connecting plate, and a stabilizing plate. The first end of the arc-shaped plate is connected to the main clamping plate, and the second end is connected to the stabilizing plate through the connecting plate. The two arc-shaped plates bend inward from their first ends to each other, so that the distance between the two arc-shaped plates gradually decreases, and the minimum distance between the two arc-shaped plates is less than the width of the lower fixing seat. The stabilizing plate is used to bond and fix to the inner wall of the test cavity, thereby keeping the main clamping plate stable.

6. The flexible microelectronic device fixture for a constant acceleration tester according to claim 5, characterized in that: The stabilizing plate is arc-shaped, and its shape is adapted to the shape of the inner wall of the test cavity.

7. The flexible microelectronic device fixture for a constant acceleration tester according to any one of claims 1 to 6, characterized in that: The height of the gap is greater than the thickness of the flexible microelectronic device, and the difference between the height of the gap and the thickness of the flexible microelectronic device is less than or equal to 0.3 cm.

8. The flexible microelectronic device fixture for a constant acceleration tester according to claim 7, characterized in that: The width of the gap is greater than the width of the flexible microelectronic device, and the difference between the width of the gap and the width of the flexible microelectronic device is less than or equal to 0.5 cm.

9. The flexible microelectronic device fixture for a constant acceleration tester according to any one of claims 1 to 6, characterized in that: The length of the upper fixing seat is the same as the length of the lower fixing seat.

10. The flexible microelectronic device fixture for a constant acceleration tester according to any one of claims 1 to 6, characterized in that: Both the upper and lower fixing bases are made of stainless steel.

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