Substance component determination method and apparatus, electronic device, storage medium

Abstract

The application discloses a substance component determination method and device, an electronic device and a storage medium. The substance component determination method comprises the following steps: providing amplitude-energy mapping relationship data of reference scintillation pulses generated by high-energy rays; determining an energy window corresponding to at least one component in a to-be-detected substance and the high-energy rays; determining a scintillation pulse amplitude range corresponding to the at least one component based on the amplitude-energy mapping relationship data and the energy window; determining a count of to-be-detected scintillation pulses falling into the amplitude range according to a comparison between amplitudes of a plurality of to-be-detected scintillation pulses generated by detecting high-energy rays emitted by the to-be-detected substance and the amplitude range; and determining a content of the at least one component in the to-be-detected substance according to the count. The application avoids complex fitting calculation, overcomes the defect that a traditional method is not resistant to high temperature, directly analyzes and judges the content of the substance component through a simple threshold comparison method, has a high sampling rate, and is stable in work.

Description

Technical Field

[0001] This application relates to the field of signal sampling, and in particular to a method and apparatus for determining the composition of a substance, electronic equipment, and storage medium. Background Technology

[0002] In many applications of high-energy ray detection, high-energy rays, such as gamma rays, are converted into visible light by scintillation crystals, and this visible light is further converted into scintillation pulse signals by photoelectric conversion devices.

[0003] Well logging technology is an important technique in the field of petroleum exploration. It combines electronic and computer technologies through various methods, including electrical, acoustic, and radiological methods, to obtain various physical parameters of the formation, and further analyzes the data to obtain oil and gas information. Common well logging techniques include electrical logging, acoustic logging, nuclear logging, and nuclear magnetic resonance logging. Nuclear logging is based on the nuclear physical properties of matter, studying the drilling geological profile based on the nuclear physical properties of rocks, pore fluids, and well media to locate mineral deposits such as coal and oil. Nuclear logging utilizes high-energy radiation detection and employs logging techniques such as natural gamma, density, neutron, and formation elemental analysis, along with supporting instruments and equipment.

[0004] Pulsed neutron logging is a type of nuclear logging. Its principle is to obtain the energy of pulsed neutrons, which are deposited in the formation and released as gamma rays, thus acquiring corresponding energy and time spectrum information. High-energy ray detection primarily uses scintillation crystals coupled to photoelectric conversion devices. The scintillation crystal deposits the energy of high-energy rays to generate visible light, which is then converted into an electrical signal by the photoelectric conversion device to obtain information such as the energy of the high-energy rays. Currently, photomultiplier tubes, which can operate at high temperatures, are commonly used as photoelectric conversion devices to convert the visible light generated by the scintillation crystal into corresponding scintillation pulses. After digitization and subsequent signal processing, the energy information (such as the energy spectrum) and time information (such as the time spectrum) of the gamma rays are obtained. Accordingly, the composition of the logging material, such as the carbon-to-oxygen ratio (C / O), can be determined based on the energy information of the gamma rays.

[0005] There are two traditional methods for obtaining the composition of scintillation materials. One is the direct digitization method using a high-speed ADC, which requires first shaping and broadening the electrical pulse signal before digitizing it using a high-speed ADC (e.g., 1 GSps). Typically, to obtain accurate energy information, digitizing a single pulse in engineering practice requires acquiring multiple (e.g., 20) sampling points, operating under high temperatures (e.g., 175°C). However, at such high temperatures, the sampling rate performance of ADC chips is usually low, and the cost is very high, making it difficult to digitize high-speed scintillation pulse signals, thus hindering the application of the high-speed ADC direct digitization method in oil well logging. The other method is the peak hold method, which uses a peak hold circuit to lock the amplitude of the electrical pulse signal, and then uses an ADC to acquire the amplitude to obtain the pulse's energy information. The peak hold method involves a peak hold lock establishment and peak hold circuit recovery process, with a very long dead time, typically reaching hundreds of microseconds. This greatly limits the digitized pulse throughput (the number of pulses processed per unit time). In oil well logging, the number of pulse events often increases explosively. For example, in common neutron oil logging, the number of pulses can reach 100 kCPS, with an average pulse generated every 10 μs. The dead time of the peak hold method causes many pulse signals to be lost during the digitization process, thus leading to measurement deviations.

[0006] In recent years, the direct digitization of scintillation pulses and the use of software algorithms to replace traditional analog circuits for information extraction have shown great development potential. The Multi-Voltage Threshold (MVT) method has been proposed as an improved method for digitizing scintillation pulses. Currently, there are also proposals to introduce the MVT digitization method into the field of oil exploration.

[0007] Compared to the time-interval sampling method of traditional ADCs, MVT digital sampling fixes multiple threshold voltages and digitally samples the time it takes for the scintillation pulse to cross these threshold voltages. This allows for the acquisition of multiple sampling points during the rapid rising edge phase. In practice, after obtaining a series of time-voltage pairs, pulse fitting methods are used to accurately acquire particle energy deposition information. For example, the Levenberg-Marquardt method is commonly used as the pulse fitting optimization algorithm. It is a widely used nonlinear least squares iterative algorithm that uses gradients to find the maximum (minimum) value. It is a nonlinear optimization method between Newton's method and gradient descent, possessing the advantages of both methods.

[0008] However, due to limitations in chip computing power and the complexity of the fitting method, the MVT fitting algorithm cannot be implemented in embedded chips such as FPGAs, STM32, and DSPs and their accessories. This limits the possibility of implementing the MVT-based fitting algorithm on-site, such as in well exploration. Therefore, the raw sampling points obtained by the MVT method need to be transmitted remotely via Ethernet, serial port, WiFi, or other communication methods to a computer device (also known as a host computer) with greater computing power located far from the site, where energy is calculated using an iterative algorithm. In oil well logging, the scintillation pulses exhibit periodic bursts, resulting in extremely large amounts of data from the raw sampling points, such as 10Mbps to 1Gbps. Furthermore, due to the characteristics of oil exploration applications, such as well depths of tens of thousands of meters and high ambient temperatures, transmission methods are limited; for example, only carrier communication can be used, with a bandwidth of only about 100Kbps. The current method creates a contradiction between the relatively large amount of raw sampling point data and the relatively small transmission bandwidth, leading to a decrease in the count rate. Furthermore, during the fitting process on the host computer, the repeated iterations result in each pulse requiring an extremely high CPU time, which is unacceptable in oil exploration.

[0009] Furthermore, current MVT methods for acquiring scintillation pulse energy information may have several limitations. For example, traditional MVT methods are suitable for acquiring pulses of known types, and the threshold setting is determined based on the known pulse energy range. Consequently, MVT methods require selecting a fixed number and size of thresholds for sampling. Therefore, traditional MVT methods can typically only acquire relatively accurate energy information for pulses within a certain energy range.

[0010] Because MVT requires fitting to calculate accurate energy values, precise time information is needed for each data point. Therefore, a large number of TDCs (clock-to-digital converters) are typically used in the acquisition circuit to collect time information.

[0011] Furthermore, pulse fitting on hardware circuits such as FPGAs and ASICs requires first reconstructing the pulse waveform, then integrating the fitted function to calculate energy information, and finally plotting the energy spectrum. However, this complex calculation process consumes significant hardware resources and increases the power consumption of the hardware circuits. For applications such as well logging equipment that require high-temperature environments, excessive power consumption caused by overly complex pulse fitting and integration processes can further affect the high-temperature resistance of the hardware circuits.

[0012] Therefore, it is desirable to provide a solution that can quickly determine the composition of a substance by rapidly, accurately, and stably acquiring relevant information from scintillation pulse signals generated by high-energy rays, suitable for implementation in hardware circuits such as FPGAs and DSPs, without consuming a large amount of computing resources or using computer equipment with powerful computing capabilities.

[0013] The background art description is provided solely for the purpose of understanding the relevant technologies in this field and is not intended as an admission of prior art. Summary of the Invention

[0014] The technical problem to be solved by the embodiments of this application is to provide a scheme for determining the composition content of scintillation pulses generated by high-energy radiation detection of matter, which is suitable for implementation in hardware circuits such as FPGA and DSP, and can avoid the complex fitting calculations required by traditional methods to obtain pulse, especially scintillation pulse energy information.

[0015] To address the aforementioned problems, this application discloses a method and apparatus for determining the composition of a substance, an electronic device, and a storage medium.

[0016] In a first aspect, a method for determining the composition of a substance is provided, comprising: Provides amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; Determine the energy window of the high-energy rays corresponding to at least one component in the substance to be tested; Based on the amplitude-energy mapping data and the energy window, determine the scintillation pulse amplitude range corresponding to the at least one component; By comparing the amplitudes of multiple scintillation pulses generated by high-energy rays emitted from the analyte with the amplitude range, the count of scintillation pulses falling within the amplitude range is determined; and The content of at least one component of the analyte is determined based on the count.

[0017] In a second aspect, a method for determining the composition of a substance is provided, comprising: Provides amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; Multiple channel addresses are set, wherein the channel address is an energy channel address or an amplitude channel address, each energy channel address has its own energy characterization value and an amplitude characterization value determined according to the amplitude-energy mapping relationship data, and each amplitude channel address has its own amplitude characterization value. The channel address corresponding to the multiple scintillation pulses to be tested is determined by comparing the amplitude values ​​of the multiple channel addresses with the amplitude characterization values ​​of the multiple channel addresses. The multiple scintillation pulses to be tested are generated by high-energy rays emitted by the probe material. Determine the energy window of the high-energy rays corresponding to at least one component in the substance to be tested; Based on the amplitude-energy mapping data and the energy window, the channel address interval corresponding to the energy window is determined; and The content of at least one component of the substance to be tested is determined based on the count of the scintillation pulses within each address and the determined address interval.

[0018] In a third aspect, a material composition determining apparatus is provided, comprising: A mapping database, including amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; An energy window determination unit is configured to determine the energy window of at least one component in the analyte corresponding to the high-energy radiation. An amplitude range determination unit is configured to determine the scintillation pulse amplitude range corresponding to the at least one component based on the amplitude-energy mapping relationship data and the energy window; A counting unit is configured to determine the count of scintillation pulses falling within the amplitude range by comparing the amplitude of multiple scintillation pulses generated by high-energy rays emitted from the analyte with the amplitude range; and The content determination unit is configured to determine the content of at least one component of the analyte based on the count.

[0019] In a fourth aspect, a material composition determining apparatus is provided, comprising: A mapping database, including amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; The channel address setting unit is configured to set multiple channels, wherein the channels are energy channels or amplitude channels, each energy channel has its own energy characterization value and an amplitude characterization value determined according to the amplitude-energy mapping relationship data, and each amplitude channel has its own amplitude characterization value. The channel address determination unit is configured to determine the channel address corresponding to the plurality of scintillation pulses to be tested by comparing the amplitude magnitude of the plurality of scintillation pulses to be tested with the amplitude characterization values ​​of the plurality of channel addresses, wherein the plurality of scintillation pulses to be tested are generated by high-energy rays emitted by the probe material to be tested; An energy window determination unit is configured to determine the energy window of at least one component in the analyte corresponding to the high-energy radiation. The channel address interval determination unit is configured to determine the channel address interval corresponding to the energy window based on the amplitude-energy mapping relationship data and the energy window; and The content determination unit is configured to determine the content of at least one component of the substance to be tested based on the count of scintillation pulses in each address and the determined address interval.

[0020] In a fifth aspect, an electronic device is provided, comprising: a memory, a processor, and an executable program stored in the memory and executable on the processor, wherein the executable program, when executed by the processor, implements the steps of the method according to any one of the embodiments of this application.

[0021] In a sixth aspect, a storage medium is provided, characterized in that an executable program is stored on the storage medium, and when the executable program is executed by a processor, it implements the steps of the method according to any one of the embodiments of this application.

[0022] In other aspects of this application, methods, apparatus, devices for digitizing pulse signals, and correction methods and apparatus suitable for such pulse digitization are also provided.

[0023] Optional features and other effects of the embodiments of this application are described in part below, and in part will be apparent from reading this document. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 2 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 3 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 4 A first module architecture diagram for implementing the material composition acquisition method according to embodiments of this application is shown; Figure 5 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 6 A second module architecture diagram for implementing the material composition acquisition method according to embodiments of this application is shown; Figure 7 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 8 A third module architecture diagram for implementing the material composition acquisition method according to embodiments of this application is shown; Figure 9A schematic diagram is shown in which the energy address corresponding to the pulse amplitude is determined by multi-level comparison using a dichotomy method in the material composition acquisition method according to an embodiment of this application; Figure 10 A fourth module architecture diagram for implementing the material composition acquisition method according to embodiments of this application is shown; Figure 11 A pulse diagram illustrating the application of a quarter-level comparison to determine the amplitude in a material composition acquisition method according to an embodiment of this application is shown, specifically illustrating the first-level comparison; Figure 12 A fifth module architecture diagram for implementing the material composition acquisition method according to embodiments of this application is shown; Figure 13 A sixth module architecture diagram for implementing the material composition acquisition method according to embodiments of this application is shown; Figure 14 A seventh module architecture diagram is shown for implementing the material composition acquisition method according to embodiments of this application; Figure 15 An eighth module architecture diagram is shown for implementing the material composition acquisition method according to an embodiment of this application; Figure 16 A ninth module architecture diagram is shown for implementing the material composition acquisition method according to an embodiment of this application; Figure 17 A diagram of the architecture of a tenth module for implementing a method for obtaining material composition according to an embodiment of this application is shown. Figure 18 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 19 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 20 An eleventh module architecture diagram is shown for implementing the material composition acquisition method according to an embodiment of this application; Figure 21 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 22 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 23 A diagram of the architecture of a twelfth module for implementing a method for obtaining material composition according to an embodiment of this application is shown. Figure 24 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 25 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 26 A thirteenth module architecture diagram is shown for implementing the material composition acquisition method according to embodiments of this application; Figure 27 A schematic diagram is shown of the threshold time (TOT) of the pulse under test and the transition signal used to determine TOT. Figure 28 A fourteenth module architecture diagram is shown for implementing the material composition acquisition method according to embodiments of this application; Figure 29 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 30 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 31 An exemplary flowchart of a method for obtaining material composition according to an embodiment of this application is shown; Figure 32 An exemplary flowchart of a correction method for pulse digitization according to an embodiment of this application is shown; Figure 33 An exemplary flowchart of a method for determining the composition of a substance based on a scintillation pulse according to an embodiment of this application is shown; Figure 34 An exemplary flowchart of a method for determining the composition of a substance based on a scintillation pulse according to an embodiment of this application is shown; Figure 35 A schematic block diagram of a pulse digitization device according to an embodiment of this application is shown; Figure 36 A schematic block diagram of a correction apparatus for pulse digitization according to an embodiment of this application is shown; Figure 37 A schematic block diagram of a material composition determination device based on scintillation pulses according to an embodiment of this application is shown; Figure 38 A schematic block diagram of a material composition determination device based on scintillation pulses according to an embodiment of this application is shown. Implementation

[0026] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0027] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly on the other element or there may be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only. The described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a full understanding of embodiments of this application. However, those skilled in the art will recognize that the technical solutions of this application can be practiced without one or more of these specific details, or other methods, components, materials, devices, or operations may be employed. In these cases, well-known structures, methods, devices, implementations, materials, or operations will not be shown or described in detail.

[0028] The flowcharts shown in the accompanying drawings are merely illustrative and do not necessarily include all content and operations / steps, nor do they necessarily have to be performed in the described order. For example, some operations / steps can be broken down, while others can be combined or partially combined; therefore, the actual execution order may change depending on the specific circumstances.

[0029] The terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that comprises a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to such processes, methods, products, or apparatus. The terms "and / or" or "and / or" include any and all combinations of one or more of the associated listed items.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0031] The following description, with reference to the accompanying drawings, illustrates some preferred embodiments of the present application. It should be noted that the following description is for illustrative purposes only and is not intended to limit the scope of protection of this application.

[0032] Figure 1This is an exemplary flowchart of a method for obtaining the composition of a substance according to some embodiments of this application. In some embodiments, the method 100 for obtaining the composition of a substance may be performed by a pulse digitization device, such as by... Figure 32 The pulse digitization device 3200 shown performs this operation. In some embodiments, the material composition acquisition method 100 can be implemented in software, hardware, firmware, or a combination thereof. In some preferred embodiments, the material composition acquisition method 100 can be implemented by hardware circuitry, such as an implementation based on FPGA, DSP, or similar hardware circuitry. In one preferred embodiment, the material composition acquisition method 100 can be implemented by a device including an FPGA chip.

[0033] In this paper, a pulse signal can be interpreted as any pulse signal that can be sampled. Its essence is a physical quantity that undergoes a sudden change in a short period of time and then quickly returns to its initial value. This physical quantity has certain characteristics.

[0034] In embodiments of this application, pulse digitization may involve converting a pulse signal, for example, in analog or physical form, into numerical parameters characterizing the pulse signal for subsequent reconstruction of the pulse signal image or other purposes related to processing, converting, or transmitting the pulse signal. In specific embodiments, pulse digitization may involve acquiring physical parameter information characterized by the pulse signal, and more specifically, acquiring energy information characterized by the pulse signal. Thus, in some embodiments herein, the method for obtaining material composition may specifically involve a method for determining pulse energy information.

[0035] In the embodiments of this application, pulse digitization can be used in numerous applications of high-energy ray detection. As previously stated, by way of explanation and not limitation, high-energy rays, such as gamma rays, can be converted into visible light by a scintillation crystal, and this visible light can be further converted into a scintillation pulse signal by a photoelectric conversion device. In the embodiments of this application, the pulse signal may in particular include a scintillation pulse. Accordingly, in the embodiments of this application, the method for obtaining the composition of matter can be a scintillation method for obtaining the composition of matter. Similarly, the pulse digitization device or apparatus in the embodiments of this application can be a scintillation pulse digitization device or apparatus.

[0036] Here, several embodiments will be described using scintillation pulses as an example, in which pulses and scintillation pulses can be used interchangeably. For example, in some embodiments, the scintillation pulse typically has a rising edge and a falling edge, and these rising and falling edges can be represented by a functional model. For instance, the scintillation pulse corresponding to a gamma photon typically exhibits a relatively fast rising edge and a relatively slow falling edge, where the rising edge can be characterized by a linear function and the falling edge by an exponential function.

[0037] In some embodiments, the scintillation pulses can be acquired by a detector, such as a PET detector, CT detector, neutron detector, or oil detector. These detectors typically include a scintillation crystal coupled to each other and a photoelectric conversion device. The scintillation crystal is used to convert the detected high-energy rays (such as gamma rays, neutron rays, etc.) into visible light signals, and the photoelectric conversion device (e.g., a photomultiplier tube PMT, a silicon photomultiplier tube SiPM, etc.) is used to convert the visible light signals into electrical signals. The electrical signals are output as scintillation pulse signals through electronic devices connected to the photoelectric conversion device.

[0038] Accordingly, the material composition acquisition method, apparatus, and / or device according to the embodiments of this application can be used in many applications of high-energy ray detection based on the energy information of scintillation pulse signals. For example, the material composition acquisition method, apparatus, and / or device according to the embodiments of this application can be used in well logging employing high-energy ray detection, such as nuclear logging, and more specifically, pulsed neutron logging. Here, the material composition acquisition method, apparatus, and / or device according to the embodiments of this application can be used to acquire energy information, such as energy spectrum, of gamma rays emitted by pulsed neutron logging. Furthermore, the material composition acquisition method, apparatus, and / or device according to the embodiments of this application can also be used in many application fields employing high-energy ray detection, such as, but not limited to, medical imaging technology, high-energy physics, lidar, autonomous driving, precision analysis, and optical communication. In a specific example, the material composition acquisition method, apparatus and / or device according to the embodiments of this application can be used in one or a combination of devices that utilize the principle of high-energy ray conversion, such as positron emission tomography (PET) equipment, CT equipment, MRI equipment, radiation detection equipment, oil detection equipment, low-light detection equipment, SPECT equipment, security inspection equipment, gamma camera, X-ray equipment, DR equipment, etc.

[0039] In other embodiments, the pulse signal can be a non-flickering pulse, and the waveform of the pulse signal can be a triangular wave, a rectangular wave, a sine wave, a cosine wave, or other wave shapes, which will not be described in detail here.

[0040] In this embodiment, the pulse signal can be in the form of an electrical pulse signal, an acoustic pulse signal, a thermal pulse signal, or a pressure wave signal, etc. For example, when the pulse signal is an electrical pulse signal, its corresponding characteristics can be the voltage or current of the electrical pulse signal; when the pulse signal is an acoustic pulse signal, its corresponding characteristic can be the sound intensity of the acoustic pulse signal, and so on, which will not be elaborated further here. Correspondingly, the threshold can have various forms. For example, when the pulse signal is an electrical pulse signal, its corresponding threshold can be a voltage threshold, a current threshold, or an energy threshold; when the pulse signal is an acoustic pulse signal, its corresponding threshold can be a sound intensity threshold, and so on, which will not be elaborated further here.

[0041] Those skilled in the art will understand that the pulse digitization in this application can also be applied to the digitization of continuous signals, simply by considering the continuous signal as a pulse signal arranged according to a certain period. The pulse signal in this application is not intended to limit the sampled signal.

[0042] Continue to refer to Figure 1 This document describes a method 100 for obtaining the composition of a substance according to an embodiment of this application. In this embodiment, based on the correspondence between the energy and (maximum) amplitude of a pulse, such as a scintillation pulse, several amplitude channels can be set for the amplitude of the pulse, such as a scintillation pulse, or several energy channels can be set for the energy of the pulse, such as a scintillation pulse. The number of pulses whose amplitude or energy falls within different channels is statistically analyzed to obtain the energy information of the pulse, such as a scintillation pulse. In one specific embodiment, for example, an energy distribution histogram can be plotted based on the pulse count to obtain the energy spectrum (hereinafter referred to as the energy spectrum). For example, in a specific example, such as in pulsed neutron saturation logging, based on the energy characteristics of the scintillation pulse corresponding to gamma rays (e.g., generally within 9 MeV), the energy of the pulse can be quantized into N (e.g., 256) different levels to obtain N (e.g., 256) different energy channels. The number of pulses at the energy levels corresponding to different energy channels is statistically analyzed, and an energy distribution histogram is plotted to obtain the energy spectrum of the scintillation pulse. Those skilled in the art will understand that the embodiments described below will be based on 256 addresses, but other numbers (N≠256) of addresses are conceivable and fall within the scope of this application.

[0043] Specifically, such as Figure 1 As shown, the material composition acquisition method 100 may include step S110, providing amplitude-energy mapping relationship data of multiple reference pulses.

[0044] In one embodiment, providing amplitude-energy mapping data for multiple reference pulses includes providing an amplitude-energy lookup table for the multiple reference pulses.

[0045] By analyzing prior information, the inventors have discovered a significant linear relationship between pulse energy and pulse (maximum) amplitude. Therefore, pulse energy information can be indirectly obtained by acquiring pulse amplitude information. Accordingly, in this embodiment, an amplitude-energy lookup table for pulses, such as flashing pulses, can be created based on prior pulse information. This lookup table characterizes the mapping relationship between pulse amplitude and pulse energy.

[0046] In one specific embodiment, a large amount of pulse, such as scintillation pulse data, can be collected using an acquisition device, such as an oscilloscope. Each pulse, such as a scintillation pulse, is integrated to obtain its energy value, while simultaneously recording the pulse amplitude. This allows for the acquisition of a large number of reference pulses, such as reference scintillation pulses, and their corresponding mapping relationships to pulse amplitudes. This prior information can then be used to create an amplitude-energy lookup table for pulses, such as scintillation pulses. In some embodiments, these reference pulses may be pulses from the same source as the pulse to be measured. For example, when applied to nuclear logging to obtain energy information of the pulse to be measured, the reference pulses may be scintillation pulses obtained from the same or similar wells (such as oil wells) using the same source. However, in some embodiments, these reference pulses may be pulses similar to the pulse to be measured. For example, when applied to nuclear logging to obtain energy information of the pulse to be measured, the reference pulses may be scintillation pulses converted from the same or similar high-energy rays, such as gamma rays, by a scintillation crystal, but the reference pulses may not originate from the same or similar wells or from different types of wells (such as other energy wells).

[0047] As a supplement to or alternative to amplitude-energy lookup tables, other flicker amplitude-energy mapping data can be used. For example, a function capable of characterizing a simple linear relationship between pulse energy and pulse (maximum) amplitude can be used. Here, the energy corresponding to at least a portion of the amplitude of the pulse under test can be obtained by simple linear interpolation based on the said linear relationship function.

[0048] In a further embodiment, the material composition acquisition method 100 may include step S120, setting multiple addresses.

[0049] In this document, the term "channel address" refers to the channel address that characterizes the pulse characteristic value of a pulse, such as a flashing pulse. In embodiments of this application, the plurality of channel addresses may collectively characterize a continuous range of characteristic values ​​or separately characterize a plurality of sequential characteristic values, as will be further explained below.

[0050] In some embodiments, the address can be an energy address, and each energy address has its own energy characterization value.

[0051] In this embodiment of the application, step S120 may include: determining the energy characterization value corresponding to each energy address and determining the pulse amplitude characterization value corresponding to the energy characterization value according to the amplitude-energy mapping relationship data, so as to set multiple energy addresses.

[0052] In the embodiments of this application, the characterization value can be interpreted broadly, covering a range of characteristic values ​​or a single characteristic value.

[0053] For example, in one embodiment, an energy address (such as the nth energy address, where n is a natural number) can have its corresponding energy range [E]. n En+1 This energy range represents the energy value of the corresponding address. Accordingly, multiple (e.g., N, where N is a natural number) energy addresses can collectively represent a large continuous energy range [E1, E2, ..., E3]. N ].

[0054] In an alternative embodiment, an energy address may have a corresponding single energy characterization value, such as the lower limit, upper limit, or median of the aforementioned energy range. For example, the energy characterization value of the nth energy address is the aforementioned energy range [E]. n E n+1 The lower limit E) n Here, multiple (e.g., N) energy addresses can represent multiple sequential energy values, such as E1, E2, ..., E N .

[0055] Specifically, the energy range or individual energy characterization value corresponding to each energy address can be determined based on the energy information of the pulse to be measured and the number of energy addresses required in practice.

[0056] In this embodiment of the application, each energy address also includes an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data.

[0057] Specifically, the amplitude representation value of each energy address can be determined based on the amplitude-energy mapping relationship data provided in step S110, such as an amplitude-energy lookup table. Similarly, the amplitude representation value can be a pulse amplitude (peak) range or a single amplitude (peak) representation value. Preferably, when the energy representation value is a range, the amplitude representation value is also a range. In this specific embodiment, the energy range of each energy address can be matched with the pulse amplitude (peak) range according to the lookup table to obtain the pulse amplitude range of each energy address.

[0058] In one specific embodiment, the total number of energy addresses can be determined according to the actual application. Based on the provided energy amplitude lookup table of the scintillation pulse, different energy levels (energy ranges) corresponding to different energy addresses are mapped to the corresponding pulse peak ranges, so that the energy addresses (energy ranges) correspond to the pulse peak ranges. In the several specific embodiments described below, the exemplary total number of energy addresses is 256 (N=256). However, those skilled in the art will realize that these embodiments can be implemented with other total number of addresses as needed.

[0059] The pulse amplitude (peak value) in the embodiments of this application includes, but is not limited to, current peak value, voltage peak value, etc. In a further specific embodiment, taking the pulse amplitude (peak value) as including voltage peak value as an example, the pulse voltage amplitude at a certain endpoint of the peak interval corresponding to each energy address is denoted as V1, V2, V3, ... In the several specific embodiments described below, the determination of whether the pulse to be tested falls within the relevant energy address is based on the pulse voltage amplitude V1, V2, V3, ... at the endpoint. However, those skilled in the art will realize that these embodiments can determine whether the pulse to be tested falls within the relevant energy address using other types of pulse amplitudes as needed, or using other values ​​within the interval (such as the other endpoint or the midpoint of the interval), or based on the single amplitude characterization value as described above.

[0060] In some embodiments of this application, the plurality of channel addresses are equally spaced, that is, the range of the represented intervals is equal or the intervals between the sequential individual represented values ​​are equal. In a further specific embodiment, when the channel address is an energy channel address, the energy represented values ​​can be (strictly) equally spaced, or the amplitude represented values ​​can be (strictly) equally spaced. For example, when the channel address is an energy channel address, the (single) energy represented value of the nth energy channel address is E. n The (single) amplitude representation value is V n In some specific embodiments, E n+2 -E n+1 =E n+1 -E n In other specific embodiments, V n+2 -V n+1 =V n+1 -V n Here one will understand that although there is a roughly linear relationship between pulse energy and pulse (maximum) amplitude, energy channels can be divided at equal intervals based on either energy characterization value or amplitude characterization value, both of which fall within the scope of this application.

[0061] Those skilled in the art should understand that the multiple address addresses can also be non-equally spaced, that is, the range of the represented intervals may not be completely equal or completely unequal, or the intervals of the sequential individual represented values ​​may not be completely equal or completely unequal. This is something that those skilled in the art can easily conceive of based on the teachings of this application, and will not be elaborated further here.

[0062] In another embodiment, the channel address can be an amplitude channel address, and each amplitude channel address has its own amplitude representation value.

[0063] In this embodiment, the total number of amplitude addresses can be set as needed, or the amplitude range commonly represented by multiple amplitude addresses can be determined based on prior information such as the reference pulse or other reference pulses described in step S110. Correspondingly, the total number of amplitude addresses and / or the amplitude representation value of each amplitude address can be set specifically according to the characteristics of the pulse under test. In different pulse digitization schemes, the total number of amplitude addresses and / or the amplitude representation value of each amplitude address are different. However, in alternative embodiments, a fixed total number of amplitude addresses and fixed amplitude representation values ​​can be provided for different digitization schemes, which falls within the scope of this application. For example, for different pulse digitization schemes, a given total number of amplitude addresses N (e.g., N=256) and a given amplitude representation value corresponding to each amplitude address (e.g., V1, V2, V3, ...) can be provided.

[0064] In embodiments where multiple amplitude channels are set, the mapping relationship between pulse amplitude and energy can be disregarded. Correspondingly, in embodiments where multiple amplitude channels are set, the energy information of the pulses to be tested can be determined in the step of obtaining the energy information of the multiple pulses to be tested (step S150) based on the pulse count within the amplitude channel and the amplitude-energy mapping relationship data provided in step S110, as further described below. In contrast, in embodiments where multiple energy channels are set, the energy information of the pulses to be tested can be determined directly based on the pulse count within the energy channel (and its corresponding energy characterization value) in the step of obtaining the energy information of the multiple pulses to be tested (step S150).

[0065] In further specific embodiments, the specific features described above with reference to energy addresses can be applied, where appropriate, in an uncontradictory manner to embodiments with multiple amplitude addresses. Furthermore, in the several specific embodiments described below, such as the embodiment of step S140, which are described according to energy addresses and corresponding pulse voltage amplitudes, it will be understood that these embodiments can also be implemented based on amplitude addresses, thereby obtaining new embodiments that fall within the scope of this application.

[0066] Continue to refer to Figure 1 The method for obtaining material composition may further include step S140, which involves determining the channel address corresponding to the multiple pulses to be tested based on the multiple channel addresses set, according to the comparison result between the amplitude magnitude of the multiple pulses to be tested and the amplitude characterization value of the multiple channel addresses.

[0067] In some embodiments, the channel address to which each test pulse falls can be determined through dynamic processing. In some specific embodiments, the dynamic processing involves dynamically processing the amplitude of the test pulse so that the amplitude of the pulse used for subsequent comparison may change. In other specific embodiments, the dynamic processing involves setting the comparison threshold of the comparator to be dynamically variable. In some embodiments of this application, a combination of both may be used.

[0068] In other embodiments, the number of dynamic threshold comparisons can be reduced by pre-screening the address range.

[0069] In some embodiments, the channel address to which each pulse to be tested falls can also be determined by non-dynamic processing of the gate output.

[0070] In such Figure 2 In the embodiment shown that dynamically processes the pulse, step S140 may include: S210: Compare the amplitude of each pulse under test with the comparison thresholds of multiple comparators in sequence; S220: Selectively adjust the amplitude of the pulse to be measured based on the result of the previous comparison before comparison; and S230: Determine the channel address corresponding to each pulse under test based on the comparison results of multiple comparators.

[0071] exist Figure 2 In the illustrated embodiment, the selective adjustment may involve not adjusting the amplitude of the pulse under test if the amplitude is less than the comparison threshold of the previous comparator, and reducing the amplitude of the pulse under test if the amplitude is greater than or equal to the comparison threshold of the previous comparator. In a specific embodiment, the reduction in the amplitude of the pulse under test is equal to the comparison threshold of the previous comparator.

[0072] exist Figure 2 In the illustrated embodiment, the comparison thresholds of the multiple comparators can be determined based on the amplitude representation values ​​of the multiple channel addresses. In a further embodiment, the comparison thresholds of the multiple comparators are a portion of the amplitude representation values ​​of the multiple channel addresses. In a preferred embodiment, the comparison thresholds of the multiple comparators are each determined by sequentially halving the amplitude representation values ​​of the multiple sequentially determined channel addresses (hereinafter referred to as binary-coded addresses). In a specific embodiment, for N channel addresses, the comparison thresholds of the multiple comparators can be calculated by (1 / 2)×N, (1 / 2) 2 ×N,·(1 / 2) 3The amplitude representation values ​​of ×N,…… are determined until the specific channel address to which the pulse under test falls can be determined by comparison. In one example, such as N=256, the comparison thresholds of multiple (e.g., 8) comparators can be determined by the amplitude representation values ​​of the 128th, 64th, 32nd, 16th, 8th, 4th, 2nd, and 1st channel addresses, such as V128, V64, V32, V16, V8, V4, V2, and V1.

[0073] Therefore, in this embodiment of the application, the pulse is dynamically processed so that the amplitude of the pulse input to each comparator is different.

[0074] Specifically, the amplitude of the pulse under test can be selectively and dynamically adjusted (reduced) by combining a subtractor or subtraction circuit, a gating device or gating circuit, and an optional processing unit.

[0075] In such Figure 3 In the specific embodiment shown, step S220 may include: S310: Set a gate according to the previous comparison result, the gate having a first gate branch and a second gate branch for selectively outputting the pulse to be measured; S320: A selector that inputs the pulse to be measured into the pre-set gate; S330: Delays the pulse to be measured output from the first gating branch; and S340: Subtracts the amplitude of the pulse to be measured output from the second gate branch.

[0076] In an optional embodiment, step S310 includes: inputting the comparison result of the previous comparator into the processing unit, and the processing unit setting the gate.

[0077] The following references Figures 2 to 4 This describes a specific example of dynamically processing pulses. Figure 4 A first module architecture diagram for implementing dynamic processing of pulses is shown. In this specific example, there are 256 energy addresses, with amplitude characterization values ​​denoted as V1-V256.

[0078] like Figure 4 As shown, this module architecture, also known as the address determination unit 400, may include multiple (e.g., 8) comparators 410, multiple (e.g., 7) selectors 420, and a processing unit 430 connecting the comparators and selectors. Each selector 420 may include a first selector branch 421 and a second selector branch 422 for selectively outputting the pulse to be measured, wherein a delay unit 440 may be provided in the first selector branch 421, and a subtractor 450 may be provided in the second selector branch 422. Figure 4As shown, the subtractor 450 can be set with a reduction value through the processing unit 430. The size of the reduction value can be the comparison threshold of the previous comparator 410.

[0079] In the illustrated embodiment, multiple comparators 410 are configured as multi-stage parallel comparators. Before the pulse signal to be measured is input to the next stage (e.g., stage n+1), the amplitude of the pulse signal to be measured is selectively and dynamically adjusted based on the comparison results of the previous stage (e.g., stage n) comparators. Figure 4 In the specific embodiment shown, selective dynamic adjustment can be achieved by using a selector 420 between two adjacent comparators 410, and a delay 440 and a subtractor 450 respectively provided in its first selector branch 421 and second selector branch 422.

[0080] Taking a total energy channel address of 256 as an example, refer to Figures 2 to 4 The specific implementation process of the above selective dynamic adjustment is described as follows: 0) can be given to the 0th level comparator ( Figure 4 (Not shown) Set a threshold voltage V00 slightly larger than the maximum amplitude of the noise signal, and after the 0th stage comparator is triggered, subsequent selective dynamic adjustment pulse signals can be used to determine the channel address.

[0081] 1) The comparison threshold of the first terminal (e.g., terminal F) of the first-stage comparator can be set according to the amplitude representation value corresponding to the 128th channel address (i.e., the channel address determined by dividing the total energy channel address 256 by two), such as the upper limit of the amplitude range of the energy channel address, for example, it can be represented by V128. When the pulse enters the second terminal (e.g., terminal P) of the first-stage comparator, if the pulse energy is less than the energy representation value of the 128th channel address, the amplitude of the pulse will be less than the comparison threshold of the 128th channel address, and the comparator will output a result level of 0; if the pulse energy is ≥ the energy representation value of the 128th channel address, the result level will be 1.

[0082] 2) The pulse signal will then enter the second-stage comparator, more specifically, its P-terminal. At this point, the number of channels corresponding to the second-stage comparator is determined by dividing the channel number of the first-stage comparator by two. Here, the comparison threshold at the F-terminal of the second-stage comparator can be set based on the amplitude representation value corresponding to the 64th channel address (i.e., the channel determined by dividing the channel address of the first-stage comparator by two), such as the upper limit of the amplitude range of the energy channel address, for example, it can be represented as V64.

[0083] The pulse signal undergoes selective dynamic adjustment before entering the second-stage comparator. Here, when the output level of the first-stage comparator is 0, the pulse entering the second-stage comparator is the same as the pulse entering the first stage; when the output result of the first-stage comparator is 1, V128 will be reduced according to the previous comparison threshold of the pulse amplitude.

[0084] Here, before the pulse enters the second-stage comparator, it first passes through a selector circuit, a subtractor circuit, and a delay circuit. Therefore, when the output of the first-stage comparator is 0, the selector chooses to leave the pulse amplitude unprocessed, allowing it to pass through the delay circuit before entering the second-stage comparator. In both output states of the selector, the arrival time of the pulse entering the second-stage comparator is consistent. When the output of the first-stage comparator is 1, the selector chooses to pass the pulse through the subtractor circuit, reducing the pulse amplitude by V128.

[0085] 3) Similarly, the pulse signal will continue to enter the third-stage comparator, more specifically, the P terminal of the third-stage comparator. At this point, the number of addresses corresponding to the third-stage comparator is determined by dividing the address number of the previous stage comparator by two. Here, the comparison threshold at the F terminal of the third-stage comparator can be set according to the amplitude representation value corresponding to the 32nd address (i.e., the address determined by dividing the previous stage address by two), such as the lower limit of the amplitude range of the energy address, for example, it can be represented by V32.

[0086] The pulse signal undergoes selective dynamic adjustment before entering the third-stage comparator. Here, when the output level of the second-stage comparator is 0, after processing by the delay unit, the pulse entering the third-stage comparator is the same as the pulse entering the second stage; when the output result of the second-stage comparator is 1, after processing by the subtractor, the pulse amplitude is reduced by V64 from the previous comparison threshold.

[0087] 4) Accordingly, the amplitude of the pulse to be measured can be selectively and dynamically adjusted with reference to steps 2) and 3). When the total energy address is 256, the comparison thresholds of the fourth to eighth level comparators can be set by the corresponding amplitude characterization values ​​of the 16th, 8th, 4th, 2nd and 1st addresses, respectively. For example, the upper limit of the amplitude range of the energy address can be represented by V16, V8, V4, V2 and V1.

[0088] 5) Analyze the output of each comparator stage to determine the channel address into which the pulse to be measured falls. For example, when the output of the 8-stage comparator is binary 00000000, the pulse energy corresponds to channel address 1. Starting from 00000000, each increment of 1 corresponds to an additional channel address. When the output of the 8-stage comparator is binary 10000000, the pulse energy corresponds to channel address 129. When the output of the 8-stage comparator is binary 11111111, the pulse energy corresponds to channel address 256.

[0089] Continue to refer to Figure 5 and Figure 6 This illustrates another embodiment according to this application. Figure 5 and Figure 6 In the illustrated embodiment, the channel address to which each pulse to be tested falls can be determined by non-dynamic processing of the gate output.

[0090] In such Figure 5 In the illustrated embodiment, step S140 may include: S510: Input each pulse to be tested into a multi-level selector array so that the pulse to be tested passes through each level of the multi-level selector array in sequence; S520: Before the pulse to be measured passes through each stage of the gates, the pulse to be measured is compared with the comparator associated with the gates it will pass through. Based on the comparison result, the gates are set, and the selection branch of the gate that outputs the pulse to be measured is determined; and S530: Determine the channel address corresponding to the pulse to be measured based on the output of the multi-stage selector array.

[0091] In such Figure 5 and Figure 6 The embodiments shown in this application provide a specific example of determining the channel address to which each pulse to be tested falls based on a non-dynamic processing method of the gate output. Figure 6 The diagram shows the architecture of a second module used to determine the channel address into which the pulse under test falls. In this specific example, the number of energy channels can also be 256, with amplitude representation values ​​denoted as V1-V256.

[0092] like Figure 6 As shown, this module architecture, also known as the address determination unit 600, may include a multi-level selector array, and each selector 611, 612, 612', 613, ..., 618 has an associated comparator 621. For simplicity, Figure 6 Only the comparator 621 associated with the first-level selector 611 is shown. Furthermore, although... Figure 6 Although not shown, it is conceivable that the modular architecture may also include processing units.

[0093] like Figure 6 As shown, each selector 611, 612, 612', 613, ..., 618 may have a first selector branch 6111 and a second selector branch 6112 for selectively outputting the pulse to be measured. Selectors that are not the last stage are connected to the two selectors of the next stage through the first and second selector branches respectively, while the first and second selector branches 6181 and 6182 of the last stage selector can be used as the output of a multi-stage selector array.

[0094] In this embodiment, the multi-level selector array can be constructed based on a bisection method. In a further specific embodiment, the first-level selector corresponds to a first address determined by bisecting the total number of channel addresses, and the first address defines two address intervals for the next-level selector; each of the remaining selectors corresponds to a second address determined by bisecting the address interval defined by its connected upper-level selector, and the second address defines two address intervals for the next-level selector or for output. Accordingly, the comparison threshold of each comparator is determined by the amplitude characterization value of the corresponding address of the associated selector.

[0095] like Figure 6 In the specific example shown, the channel address corresponding to the first-level selector 611 can be determined by dividing the total number of energy channels by two, such as channel address 128, and correspondingly defines two channel address intervals for the lower-level selectors 612 and 612', such as channel address 1 to channel address 128, i.e., [1, 128] and channel address 129 to channel address 256, i.e., [129, 256]. Accordingly, the comparison threshold of the comparator 621 associated with the first-level selector 611 can be determined based on the amplitude representation value of channel address 128, such as V128.

[0096] Furthermore, in Figure 6 In the illustrated embodiment, these two address intervals can be allocated accordingly based on the gating branch connected to the lower-level gating unit. For example... Figure 6 As shown, the second-level selector 612, connected to the first-level selector 6111 of the first-level selector 611, can allocate an address range from the first channel address to the 128th channel address, and correspondingly correspond to the channel address bisected by this address range, such as channel address 64. Figure 6 As shown, the second-level selector 612', connected to the second-level selector branch 6112 of the first-level selector 611, can allocate an address interval from channel address 129 to channel address 256, and correspondingly correspond to the address bisected by this address interval, such as channel address 192. Accordingly, the comparison threshold of the comparator (not shown) associated with the second-level selector 612 can be determined based on the amplitude characterization value of channel address 64, such as V64; the comparison threshold of the comparator (not shown) associated with the second-level selector 612' can be determined based on the amplitude characterization value of channel address 192, such as V192.

[0097] Here, the channel address corresponding to the subsequent level of strobe and the comparison threshold of the associated comparator can be determined accordingly.

[0098] Therefore, it becomes clear that the two gating branches of the last stage (such as the 8th stage) gating device can constitute the output of a multi-stage gating device, and the channel address into which the pulse to be measured falls can be determined based on the output of the multi-stage gating device. For example, as Figure 6As shown, when the pulse to be tested is output from the first selection branch 6181 of the 8th stage selector 618, it means that the pulse to be tested falls into the first address.

[0099] People will understand that the method features or module architecture features described in other embodiments can be adapted in a non-contradictory manner as needed. Figure 5 and Figure 6 The examples shown are combined.

[0100] In another embodiment, as previously described, the address to which a pulse, such as a flashing pulse, falls can be counted by setting a dynamic comparison threshold.

[0101] In a further embodiment, setting a dynamic comparison threshold can be achieved through multi-level comparison or single-level comparison.

[0102] In such Figure 7 The illustrated embodiment demonstrates setting a dynamic comparison threshold through multi-level comparisons. Specifically, step S140 may include: S710: The first level comparison of the amplitude of each pulse to be measured is performed to determine the channel address interval into which the pulse to be measured falls. Each level comparison defines at least two channel address intervals through at least one comparison threshold. S720: Perform the next level comparison sequentially to determine the channel address interval into which the pulse to be tested falls, until the last level comparison is completed. The comparison threshold of the next level comparison is determined based on the channel address interval determined by the previous level comparison; and S730: Determine the track address into which the pulse to be tested falls based on the results of the last stage comparison.

[0103] In this embodiment of the application, by assigning a dynamically changing threshold to the comparator, the flicker pulses can be counted according to their energy address.

[0104] As an explanation and not a limitation, the above-described multi-level comparison can be implemented by different types of multi-level comparison units, and the address determination unit can be or includes the multi-level comparison unit. It is conceivable that the modular architecture of the multi-level comparison unit may or may not have a "physical" multi-level comparison structure, as long as it can realize multi-level comparison based on dynamic thresholds. The embodiments of this application are intended to cover both situations.

[0105] For example, in some embodiments, multi-level comparisons without a “physical” multi-level comparison structure can be implemented by a single or multiple comparators that connect multiple parallel delay lines, wherein multiple different comparisons in the same level or comparisons at different levels can be implemented by combining adjustable comparators with different delays of the delay lines.

[0106] For example, in another embodiment, a "substance-based" multilevel comparison structure corresponding to a multilevel comparison can be provided, wherein the number of levels in the "substance-based" multilevel comparison structure corresponds to the number of levels in the multilevel comparison, and the number of comparators in each level of the comparison structure corresponds to the number of comparisons in each level.

[0107] The exemplary module architecture of the above embodiments will be described below with reference to the accompanying drawings.

[0108] In some preferred embodiments, the number of comparison thresholds for each level of comparison is the same, so that the number of address intervals defined by the comparison thresholds for each level of comparison is the same.

[0109] In a further preferred embodiment, the address interval defined by the comparison threshold of each comparison level is evenly divided. Here, in a specific embodiment, the comparison threshold set for the first comparison level is such that the address interval defined by the comparison threshold of the first comparison level is evenly divided among the plurality of addresses; the comparison threshold set for the next level comparison level is such that the address interval defined by the comparison threshold of the next level comparison is evenly divided among the address interval determined by the previous level comparison.

[0110] Specifically, with the total number of energy addresses being N=m n (For example, N=256) By setting a dynamic threshold, the test flicker pulse can be compared with the threshold (m-1)×n (m ≥ 2) times to determine the threshold m that the pulse falls into. n A specific energy address in a set of n addresses, where n is the number of levels and m is the number of pulse (maximum) amplitude intervals defined by a preset (m-1) comparison thresholds for each level. It will be understood that, given the correspondence between energy addresses, energy intervals, and pulse amplitude intervals, the embodiments of this application cover equivalent substitutions for dividing m amplitude intervals, energy intervals, and / or address intervals.

[0111] As mentioned earlier, the modular architecture of a multi-level comparison unit may not have a "physical" multi-level comparison structure, but can be achieved by combining different delays of the delay lines with an adjustable comparator.

[0112] In this embodiment, the multi-level comparison is performed by a first multi-level comparison unit that does not have a physical multi-level comparison structure. The first multi-level comparison unit may include a plurality of parallel delay lines connected to the input of the pulse under test, an adjustable comparator connected to the delay lines, and an arbitrator operating on the adjustable comparator, wherein at least some of the delay lines have different delay times.

[0113] In a further embodiment, the adjustable comparator is a single unit, and the delay times of the plurality of parallel delay lines are all different.

[0114] In a further embodiment, the total number of energy addresses is N=m nFor example, if N=256, the threshold comparison of the flicker pulse under test can be performed at most (m-1)×n (m is greater than or equal to 2) times, which can be achieved by using only (m-1)×n parallel delay lines combined with a single comparator.

[0115] like Figure 8 and Figure 10 The illustrated embodiment uses only one comparator combined with delay circuitry to implement energy channel division of the pulse signal. The threshold value set at the negative input of this comparator is determined by an arbitrator. By equipping the corresponding delay circuitry, different comparison threshold values ​​can be set when receiving pulse signals with different delays. Specifically, when the pulse signal is input to the first multi-stage comparison unit from the outside, it will be sent to several circuits with unequal delays. These circuits will ultimately input the signal to the positive input of the same comparator, meaning that the pulse is input to the comparator at several time points at certain time intervals.

[0116] The embodiments of this application cover different comparator threshold setting methods and corresponding matching methods for delay lines.

[0117] exist Figure 8 In the embodiment shown, the comparison threshold for each level of comparison is 1, thereby dividing the two address intervals into two, i.e., m=2.

[0118] like Figure 8 As shown, with a total energy address number of N=m n (For example, N=256) Figure 9 The first multi-level comparison unit 800 includes multiple (8) delay lines 8101-8108 with different delays, an adjustable comparator 820 connected to the delay lines 8101-8108, and an arbitrator 830 that operates connected to the adjustable comparator 820.

[0119] The following is combined Figure 8 and Figure 9 Describe the comparison process.

[0120] When a pulse signal is input to the first-stage comparator unit 800, it will be sent to multiple (eight) delay lines 8101-8108 with different delay times. These multiple (eight) delay lines 8101-8108 are input to the positive input terminal of the same adjustable comparator 820, that is, the pulse is input to the comparator at eight time points at certain time intervals.

[0121] The threshold value set at the negative input terminal of the adjustable comparator 820 is determined by the arbitrator 830. The arbitrator can set the comparison threshold value of the adjustable comparator 820 according to the amplitude characterization value of the set channel address, so that the pulse amplitude values ​​corresponding to different pulse energies are sequentially input to the negative input terminal of the comparator and compared with the pulse to be measured.

[0122] by Figure 9 The diagram illustrates a multi-level comparison using a binary search method. If the total number of energy addresses is N=m... n (For example, N=256), that is, 2 8 The address will be compared (2-1)×8=8 times. The unequal delays will occur during these comparisons. Figure 8 The diagram illustrates this using a different number of delays, meaning the signal is input after eight different delays (achieving the effect of cyclically inputting a signal eight times). Figure 8 and Figure 9 In the embodiment shown, 8 levels of comparison are implemented with a comparison threshold of 1 for each level, but there is no physical 8-level comparison structure; instead, only one adjustable comparator is used.

[0123] Continue to refer to Figure 9 First, in the first-level comparison, two address intervals are obtained by dividing the total energy address number into two intervals, namely addresses 1 to 128 and addresses 129 to 256 (which can also be represented by amplitude intervals, such as V1-V128 and V129-V256). The corresponding comparison threshold is the amplitude representation value of address 128, such as V128.

[0124] After the first-level comparison, if the pulse signal amplitude can exceed the comparison threshold V128, the result of the first-level comparison is that the pulse amplitude is located in V129-V256. Based on the channel address interval (amplitude interval) into which the pulse signal falls determined by the first-level comparison, the comparison threshold of the second level is determined, such as V192, so as to further divide and define the two channel address intervals (amplitude intervals) of the second level, such as V129-V192 and V193 to V256.

[0125] After the second-level comparison, if the pulse signal amplitude can exceed the comparison threshold V192, the result of the second-level comparison is that the amplitude is between V193 and V256. Therefore, the comparison threshold for the third level can be determined based on the channel address interval (amplitude interval) determined by the second-level comparison, for example, it can be set to V224, thereby further dividing and defining the two channel address intervals (amplitude intervals) of the third level, such as V193-V224 and V225 to V256.

[0126] After the third-level comparison, if the pulse signal amplitude can exceed the comparison threshold V224, the result of the third-level comparison is that the amplitude is between V225 and V256. Therefore, the comparison threshold for the fourth level can be determined based on the channel address interval (amplitude interval) determined by the third-level comparison, for example, it can be set to V240, thereby further dividing and defining two channel address intervals (amplitude intervals) for the fourth level, such as V225-V240 and V241 to V256.

[0127] After the fourth-level comparison, if the pulse signal amplitude can exceed the threshold V240, the result of the fourth-level comparison is that the amplitude is between V241 and V256. Therefore, the comparison threshold for the fifth level can be determined based on the channel address interval (amplitude interval) determined by the fourth-level comparison, for example, it can be set to V248, thereby further dividing and defining the two channel address intervals (amplitude intervals) of the fifth level, such as V241-V248 and V249 to V256.

[0128] After the fifth-level comparison, if the pulse signal amplitude can exceed the threshold V248, the result of the fifth-level comparison is that the amplitude is between V249 and V256. Therefore, the comparison threshold for the sixth level can be determined based on the channel address interval (amplitude interval) determined by the fifth-level comparison, for example, it can be set to V252, thereby further dividing and defining two channel address intervals (amplitude intervals) for the sixth level, such as V249-V252 and V253 to V256.

[0129] After the sixth-level comparison, if the pulse signal amplitude can exceed the threshold V252, the result of the sixth-level comparison is that the amplitude is between V253 and V256. Therefore, the comparison threshold for the seventh level can be determined accordingly based on the channel address interval (amplitude interval) determined by the sixth-level comparison. For example, it can be set to V254, thereby further dividing and defining two channel address intervals (amplitude intervals) for the seventh level, such as V253-V254 and V255 to V256.

[0130] After the seventh level comparison, if the pulse signal amplitude exceeds the threshold V254, the result of the seventh level comparison is that the amplitude is between V255 and V256. Therefore, the comparison threshold for the eighth level can be determined based on the address interval (amplitude interval) determined by the seventh level comparison, for example, it can be set to V255, thereby further dividing the eighth level into two address intervals (amplitude intervals), which are two addresses (amplitudes), such as V255 and V256. If the pulse signal amplitude exceeds the comparison threshold V255, then the amplitude of the pulse signal is between V255 (excluding) and V256, and the pulse signal is located at the 256th energy address. It can be seen that the energy address corresponding to the pulse (amplitude) can be determined through 8 comparisons.

[0131] Here, after all the pulses on the delay lines have passed through the comparator, the specific channel address corresponding to the pulse can be determined based on the comparator's output.

[0132] In the embodiments of this application, the arbitrator can be implemented by a microcontroller unit (MCU), and the arbitrator can control the change of the comparison threshold by a digital-to-analog converter (DAC).

[0133] As mentioned earlier, traditional MVT methods employ fixed thresholds and complex fitting calculations, are limited to specific energy ranges, require precise timing information, and suffer from dead time. This leads to disadvantages such as low processing efficiency, high hardware resource consumption, and poor high-temperature tolerance. In contrast, this embodiment directly samples and classifies unknown pulses to corresponding energy addresses through dynamic threshold settings and a simplified processing procedure. This eliminates the need for fitting calculations, TDC, and precise timing information. Compared to traditional methods, this solution simplifies the pulse energy acquisition process, saves hardware resources, reduces FPGA power consumption, and improves high-temperature tolerance. Furthermore, this invention significantly shortens dead time through threshold comparison and table lookup operations, enabling continuous pulse processing and effectively improving system performance.

[0134] One might conceive of other embodiments in which the comparison threshold for each level of comparison could be greater than 1.

[0135] like Figure 10 In the illustrated embodiment, each level has a comparison threshold of 3, thus dividing the channel address intervals into four parts, i.e., m=4. Similarly, the total number of energy channels is N=m. n (For example, if N=256), then the multi-level comparison is 4 levels, and each level has 3 comparison thresholds.

[0136] Similar to Figure 8 The embodiment shown, Figure 10 In the embodiment shown, only one comparator combined with a delay circuit is used to implement the energy address division of the pulse signal. The threshold set at the negative input terminal of this comparator is determined by the arbitrator.

[0137] like Figure 10 As shown, the first multi-level comparison unit 1000 includes multiple (12) delay lines 10101-10112 with different delay times, an adjustable comparator 1020 connected to the delay lines 10101-10112, and an arbitrator 1030 that operates connected to the adjustable comparator 1020.

[0138] The following is combined Figure 10 and Figure 11 Describe the comparison process.

[0139] As mentioned above, in Figure 10 In the illustrated embodiment, the module architecture of the first multi-level comparison unit 1000 may not have a "physical" multi-level comparison structure, but instead achieve multi-level comparison through multiple parallel delay lines and a single adjustable comparator.

[0140] exist Figure 10In the specific embodiment shown, after the first-level comparison, the address interval determined by the first-level comparison is divided into four equal parts. The arbitrator sets the corresponding comparison thresholds for the second-level comparison in turn. Based on the result of the second-level comparison, the address interval determined by the second-level comparison is divided into four equal parts again, thereby completing all multi-level comparisons in turn.

[0141] Therefore, depending on the channel address range into which the pulse falls, if each stage only needs to compare the comparison threshold once to determine the channel address range, then at least 4 comparisons are needed to determine the energy channel address; if each stage needs to compare all 3 comparison thresholds to determine the channel address range, then at most 12 comparisons are needed to determine the energy channel address. Correspondingly, since it does not have a "physical" multi-stage comparison structure, the aforementioned multiple (12) delay lines 10101-10112 with varying delays can dynamically adapt to different comparison counts in the multi-stage comparison, such as between 4 and 12. Figure 10 In the illustrated embodiment, in peer comparisons, the comparison thresholds used for comparison are preferably from small to large.

[0142] Continue to refer to Figure 10 and Figure 11 A specific example describing the division of four address intervals into four parts.

[0143] In the first-level comparison, the arbitrator 1030 can be set with three comparison thresholds, such as V64, V128, and V192. Preferably, in the first-level comparison, V64, V128, and V192 are compared sequentially in ascending order, and after determining the channel address interval into which the pulse falls, the remaining comparison thresholds are no longer compared. For example, in Figure 11 In the example shown, the pulse is located at channel address 193, and its corresponding amplitude representation value is, for example, V193. Therefore, the pulse amplitude sequentially crosses the first comparison threshold V64, the second comparison threshold V128, and the third comparison threshold V192 of the first-level comparison. Thus, the amplitude range of the pulse can be determined to be V193-V256, that is, within the range of channel addresses 193 to 256.

[0144] In the second-level comparison, the arbitrator 1030 can determine, based on the result of the first-level comparison, which of the following is the address interval (amplitude interval) located in V1(0)-V64, V65-V128, V129-V192 or V193-V256 (e.g., the aforementioned V193-V256), and accordingly set three comparison thresholds for the second-level comparison in the address interval determined by the first-level comparison to divide the address interval determined by the first-level comparison into four equal parts, thereby completing all four levels of comparison in sequence.

[0145] For example, suppose the pulse amplitude is located at addresses 1 to 64, specifically addresses 1-4 (not shown), which is represented as 0-V64 (specifically V4): First, set the first comparison threshold (minimum threshold) V64 for the comparator. If the first pulse signal entering the comparator is compared with this threshold, and it cannot exceed the threshold, then the amplitude of the pulse signal is between 0 and V64. Furthermore, to set a second-level comparison threshold for the comparator, we first set the comparator to the first comparison threshold (minimum threshold) V16 of the second level. The second pulse signal after delay is input to the comparator. If it cannot exceed the threshold V16, the amplitude of the pulse signal is between 0 and V16. Furthermore, to set the third-level comparison threshold for the comparator, we first set the comparator to the first comparison threshold (minimum threshold) V4 of the third level. The third pulse signal after delay is input to the comparator. If it cannot exceed the threshold V4, the amplitude of the pulse signal is between 0 and V4. Furthermore, a fourth-level comparison threshold is set for the comparator. First, the comparator is set to the first comparison threshold (minimum threshold) V1 of the fourth level. A delayed pulse signal is input to the comparator. If the pulse signal cannot exceed threshold V1, its amplitude is between 0 and V1, i.e., at the first energy address. If the pulse signal exceeds V1, the comparator is set to the second comparison threshold V2 of the fourth level. If the pulse signal cannot exceed threshold V2, its amplitude is between V1 and V2, i.e., at the second energy address. If the pulse signal exceeds V2, the comparator is set to the third comparison threshold V3 of the fourth level. If the pulse signal cannot exceed threshold V3, its amplitude is between V2 and V3, i.e., at the third energy address. If the pulse signal exceeds V3, its amplitude is between V3 and V4, i.e., at the fourth energy address.

[0146] thus, Figure 10 The embodiment shown uses the quartering method to determine the comparison threshold. Figure 8 The advantages of the simple embodiment shown, which uses a binary search method to determine the comparison threshold, are illustrated. Furthermore, Figure 10 The embodiment shown achieves dynamic thresholding of bit extension by using the quartic method, which has better working efficiency and structural flexibility, and the comparator chain (i.e., the number of comparators and the number of comparison stages in each stage) can be adjusted according to different application scenarios.

[0147] and Figure 10 The embodiments shown are different. Figure 12 The embodiment shown uses multiple comparators combined with delay circuits to achieve energy address allocation of pulse signals.

[0148] Therefore, in Figure 12 In the illustrated embodiment, there are multiple adjustable comparators, and different comparators are connected to different delay lines. The delay times of the delay lines connected to the same comparator are all different.

[0149] like Figure 12 As shown, the first multi-level comparison unit 1200 includes multiple (12) delay lines 12101-12112 with unequal delays, multiple (3) adjustable comparators 1221-1223, and an arbitrator 1230 that operates on the adjustable comparators 1221-1223. The multiple (12) delay lines 12101-12112 are divided into multiple groups of delay lines corresponding to the multiple (3) adjustable comparators 1221-1223, with each group connected to one adjustable comparator. The delay times of delay lines in the same group connected to the same adjustable comparator, such as 12101-12104, 12105-12108, or 12109-12112, are all different. However, as... Figure 12 As shown, each group of delay lines can have the same delay configuration.

[0150] Here, you can refer to the above text. Figure 8 and Figure 10 The embodiment utilizes Figure 12 The first multi-level comparison unit 1200 shown implements multi-level comparison based on dynamic comparison threshold, which will not be described in detail here.

[0151] In a preferred embodiment, the number of the plurality of adjustable comparators can correspond to the number of comparison thresholds for each comparison level. For example, in Figure 12 In the illustrated embodiment, the number of adjustable comparators (3) corresponds to the number of comparison thresholds at each level based on the quartering method. In this preferred embodiment, it is possible to perform comparisons of different comparison thresholds at the same level simultaneously.

[0152] As mentioned earlier, a "physical" multilevel comparison structure corresponding to multilevel comparisons can also be provided to assign dynamically changing thresholds to the comparator, enabling the counting of scintillation pulses according to energy address.

[0153] The following describes an exemplary module architecture of an embodiment having a "physical" multi-level comparison structure with reference to the accompanying drawings. In this embodiment, the multi-level comparison is implemented by a second multi-level comparison unit having a physical multi-level comparison structure. The second multi-level comparison unit includes a plurality of comparator subunits connected to the input pulse to be measured and an arbitrator operating on the plurality of comparator subunits, wherein each comparator subunit corresponds to one of the multi-level comparisons and includes one or more parallel adjustable comparators, and a delay is provided between adjacent comparator subunits.

[0154] In some preferred embodiments, the number of comparison thresholds for each level of comparison is the same, so that the number of address intervals defined by the comparison thresholds for each level of comparison is the same.

[0155] In a further embodiment, the total number of energy addresses is N=m n For example, if N=256, the threshold comparison of the flicker pulse to be tested can be performed at most (m-1)×n (m is greater than or equal to 2) times. Alternatively, it can be achieved by using n-level comparator sub-units (each level comparator sub-unit has (m-1) comparators) combined with delays between adjacent multi-level comparator sub-units.

[0156] exist Figure 13 In the embodiment shown, a multi-level comparator subunit (8 levels) of the entity is set up, with one entity comparator in each level, thereby dividing the two address intervals by binary search, i.e., m=2.

[0157] In terms of multi-level comparisons, Figure 13 The illustrated embodiments are similar to Figure 8 The embodiments shown are illustrated in conjunction with reference to the references. Figure 13 and Figure 9 If the total number of energy addresses is N=m n (For example, N=256), that is, 2 8 The address will be compared (2-1)×8=8 times.

[0158] Therefore, as Figure 13 As shown, the second multi-level comparison unit 1300 includes multiple (8) comparator sub-units 1310 connected to the pulse input to be tested and an arbitrator 1320 that operates on the multiple comparator sub-units 1310. Each comparator sub-unit 1310 corresponds to one of the multiple (8) levels of comparison and includes a single adjustable comparator 1311. A delay unit 1330 is provided between adjacent comparator sub-units.

[0159] Continue to refer to Figure 13 and Figure 9 Each stage uses a comparator to compare with the pulse peak voltage. Each comparison is made between two channel address intervals (amplitude intervals), that is, above or below the comparison threshold set by the comparator at that stage. After 8 stages of comparison, it can be determined which of the 256 channels the pulse falls into, thus forming, for example, a 256-channel energy spectrum. Figure 13 In the example shown, a threshold voltage can be input to the negative input of the adjustable comparator of each comparator subunit, and a delay is set between each comparator subunit to form a small delay (e.g., 5 ns). Thus, the pulse signal serially input to the positive input of the comparator of the multiple (8) comparator subunits is processed by the multiple (8) comparator subunits with different delay times. After passing through the last stage, such as the 8th stage comparator, the energy address of the pulse, such as the flash pulse, can be determined.

[0160] The following will combine Figure 9Description of utilization Figure 13 The second multi-level comparison unit 1300 shown is a specific example of determining the pulse amplitude range corresponding to which energy address the pulse amplitude of an input pulse, such as a flashing pulse signal, is located based on the binary division method.

[0161] According to the binary search method, the intermediate energy address among energy addresses 1-256 is energy address 128. Based on this, a first comparison threshold can be set for the comparator of the first-stage comparator subunit, which is the amplitude representation value of energy address 128. This comparison threshold defines two address intervals: energy addresses 1-128 and energy addresses 129-256. By comparing the amplitude of the input pulse signal with the first comparison threshold, it is determined whether the pulse signal is within the energy address 1-128 interval or within the pulse peak interval corresponding to energy addresses 129-256. If the comparator output is 1, it indicates that the pulse peak of the input signal has exceeded the pulse amplitude representation value corresponding to energy address 128, and the input pulse signal is within the energy address 129-256 interval. If the comparator output is 0, it indicates that the pulse peak of the input signal has not exceeded the pulse amplitude representation value corresponding to energy address 128, and the input pulse signal peak is within the energy address 1-128 interval. The comparison result of the comparator in the first-stage comparator subunit is input to the arbitrator. The arbitrator determines which energy address range or pulse amplitude range the input pulse signal belongs to based on the comparison result. Then, based on this energy address range, it continues to set the comparison threshold for the comparator in the second-stage comparator subunit using a binary search method, and so on, until the comparator in the last-stage comparator subunit determines which energy address the input flash pulse signal belongs to. Then, for example, a counting unit can increment the pulse count within that energy address by 1. For example, with 256 energy addresses, the first address could correspond to 00000000, and the 256th address could correspond to 11111111.

[0162] People will understand that if a higher precision energy spectrum is required, the length of the comparator chain can be increased, that is, the number of comparators per stage and the number of comparator stages.

[0163] As mentioned earlier, traditional MVT methods employ fixed thresholds and complex fitting calculations, are limited to specific energy ranges, require precise timing information, and suffer from dead time. This leads to disadvantages such as low processing efficiency, high hardware resource consumption, and poor high-temperature tolerance. In contrast, this embodiment directly samples and classifies unknown pulses to corresponding energy addresses through dynamic threshold settings and a simplified processing procedure. This eliminates the need for fitting calculations, TDC, and precise timing information. Compared to traditional methods, this solution simplifies the pulse energy acquisition process, saves hardware resources, reduces FPGA power consumption, and improves high-temperature tolerance. Furthermore, this invention significantly shortens dead time through threshold comparison and table lookup operations, enabling continuous pulse processing and effectively improving system performance.

[0164] exist Figure 14 In the embodiment shown, a multi-level comparator subunit (4 levels) of the entity is set up, with 3 entity comparators in each level, thereby dividing the four address intervals into four parts, i.e., m=4.

[0165] In terms of multi-level comparisons, Figure 14 The illustrated embodiments are similar to Figure 10 The embodiments shown are illustrated in conjunction with reference to the references. Figure 14 and Figure 11 If the total number of energy addresses is N=m n (For example, N=256), that is, 2 8 The location will be compared 4 times.

[0166] Therefore, as Figure 14 As shown, the second multi-level comparison unit 1400 includes multiple (4) comparator sub-units 1410 connected to the input of the pulse to be tested and an arbitrator 1420 that operates on the multiple comparator sub-units 1410. Each comparator sub-unit 1410 corresponds to one of the multiple (4) levels of comparison and includes multiple (3) parallel adjustable comparators 1411-1413. A delay unit 1430 is provided between adjacent comparator sub-units.

[0167] People will understand. Figure 10 and Figure 13 The features of the illustrated embodiments can be combined with, as needed, in a non-contradictory manner. Figure 14 New embodiments have been obtained from the previous embodiments, which will not be described again here.

[0168] The following will combine Figure 11 Description of utilization Figure 14 The second multi-level comparison unit 1400 shown is a specific example of determining the pulse amplitude range corresponding to which energy address the pulse amplitude of an input pulse, such as a flashing pulse signal, is located based on the quartic method.

[0169] like Figure 14In the specific example shown, a 4-level comparator subunit 1410 is provided, with each level having 3 adjustable comparators, thereby defining 4 address intervals (or 4 energy intervals or amplitude intervals). Here, this can be represented as n=4, m=4, that is, there are n=4 levels of comparison, and each level divides the unknown energy range into m=4 energy intervals.

[0170] Reference Figure 14 and Figure 11 The negative inputs of the three comparators in the first-stage comparator subunit can determine the three comparison thresholds of the first stage based on the 64th, 128th, and 192nd channels of the 256 channels, for example, represented as V64, V128, and V192. If the amplitude (peak value) of the pulse under test only exceeds V64 but not V128, the arbitrator can determine that the energy of the pulse is between channels 64 and 128. Therefore, in the second-stage comparison, the arbitrator will set the thresholds of the three comparators in the second-stage comparator subunit based on the channel address range determined by the comparison result of the previous stage, such as V65-V128, dividing the range [V65, V128] into four equal parts, and so on, to complete the four-stage comparison and finally determine the specific channel address to which the pulse belongs on the energy spectrum.

[0171] thus, Figure 14 The embodiment shown uses the quartering method to determine the comparison threshold. Figure 13 The advantages of the simple embodiment shown, which uses a binary search method to determine the comparison threshold, are illustrated. Furthermore, Figure 14 The embodiment shown achieves dynamic thresholding of bit extension by using the quartic method, which has better working efficiency and structural flexibility, and the comparator chain (i.e., the number of comparators and the number of comparison stages) can be adjusted according to different application scenarios.

[0172] exist Figures 8 to 14 In the illustrated embodiment, the comparison threshold for the first-level comparison is determined based on the total number of the plurality of channel addresses. However, it is conceivable that the comparison threshold for the first-level comparison could be determined based on pulse characteristics or other features to reduce the number of comparisons.

[0173] In one embodiment, the comparison threshold for the first-level comparison can be determined based on a given prior address range. It will be understood that the prior address range can cover corresponding energy ranges, amplitude ranges, and so on.

[0174] In some embodiments, the given prior address interval is one, and the comparison threshold for the first-level comparison is one and determined based on the magnitude characterization value of one of the endpoint addresses of the prior address interval.

[0175] In one example, let's say the total number of energy addresses is N=mn Taking N=256 as an example, a priori address interval is determined based on the pulse characteristics, which is less than a certain address, such as less than 64 addresses. The first-level comparison threshold can then be determined based on this priori interval. More specifically, the comparison threshold can be determined based on the endpoint (upper end) address of this priori address interval (e.g., 64 addresses), for example, based on the amplitude characteristic value corresponding to the 64th address, denoted as V64. It will be clear that this priori address interval can be set according to different pulse characteristics. For example, in pulsed neutron saturation logging, considering that approximately 80% of the pulse energies of the scintillation pulses corresponding to gamma rays correspond to addresses lower than 64, the address interval is set to less than 64 addresses, and thus, as mentioned above, the comparison threshold for the first comparison is set to V64.

[0176] In this embodiment, during the first-level comparison, it can be determined whether the pulse is located in the prior address interval (low energy range) or not in the prior address interval (high energy range). Then, in subsequent levels of comparison, the comparison threshold can be dynamically set using the principle of binary or quartic methods.

[0177] An embodiment that determines the comparison threshold for the first-level comparison based on a given prior address interval can be implemented in a multi-level comparison unit according to the embodiments of this application. That is, it can be implemented based on a modular architecture combining delay lines and comparators, or it can be implemented based on a "physical" multi-level comparator sub-unit structure, for example... Figure 8 , Figure 10 , Figure 12 , Figure 13 , Figure 14 The multi-level comparison units shown, or similar structures.

[0178] The following will be based on Figure 15 The second multi-level comparison unit 1500 shown is used as an example to describe an embodiment in which the comparison threshold of the first level comparison is determined based on a given prior address interval. In this embodiment, the non-first level comparison is implemented by the binary search method. Figure 15 The second multi-level comparison unit 1500 shown is similar to Figure 13 The second multi-level comparison unit 1300 shown is different in that... Figure 15 The second multi-level comparator unit 1500 shown has two more levels of comparator sub-units, that is, a total of ten levels of comparator sub-units 1510.

[0179] Furthermore, this embodiment is combined with the above. Figure 13 and Figure 9 The difference in the embodiment is that, in this embodiment, the comparison threshold of comparator 1511 in the first-level comparator subunit 1510 is set according to the upper endpoint (64th address) of the above-mentioned prior address interval, for example, V64.

[0180] If the comparison result of the first-stage comparator is that the pulse energy is within the prior address range (low energy range) and the pulse amplitude is between 0 and V64, then the comparison threshold of the comparator in the second-stage comparator subunit can be set to V32 according to the binary division method. Assuming the pulse signal amplitude can exceed the threshold V32, then the pulse signal amplitude is between V32 and V64, and the comparison threshold of the comparator in the third-stage comparator subunit can be set to V48 according to the binary division method. Assuming the pulse signal amplitude cannot exceed the threshold V48, then the pulse signal amplitude is between V32 and V48, and the comparison threshold of the comparator in the fourth-stage comparator subunit can be set to V40 according to the binary division method. Assuming the pulse signal amplitude cannot exceed the threshold V40, then the pulse... If the signal amplitude is between V32 and V40, the comparison threshold of the comparator in the fifth-stage comparator subunit can be set to V36 using the binary division method. Assuming the pulse signal amplitude cannot exceed the threshold V36, the amplitude is between V32 and V36, and the comparison threshold of the comparator in the sixth-stage comparator subunit can be set to V34 using the binary division method. If the pulse signal amplitude cannot exceed the threshold V34, the amplitude is between V32 and V34, and the comparison threshold of the comparator in the seventh-stage comparator subunit can be set to V33 using the binary division method. If the pulse signal amplitude cannot exceed the threshold V33, the amplitude is between V32 and V33, which is the 33rd energy channel address. Therefore, the energy channel address corresponding to the pulse amplitude is determined through seven levels of comparison.

[0181] In the example where approximately 80% of the pulse energy of the scintillation pulse corresponds to a channel address below 64, the number of pulse comparisons for 80% of the pulses is reduced by 1.

[0182] If the comparison result of the first-stage comparator is that the pulse energy belongs to the high-energy range (i.e., outside the prior address range) and the pulse amplitude is between V64 and V256, then the comparison threshold of the comparator in the second-stage comparator subunit can be set to V160 according to the binary division method; assuming that the pulse signal amplitude can exceed the threshold V160, then the pulse signal amplitude is between V160 and V256, and the comparison threshold of the comparator in the third-stage comparator subunit can be set to V208 according to the binary division method; assuming that the pulse signal amplitude cannot exceed the threshold V208, then... If the pulse signal amplitude is between V160 and V208, then the comparison threshold of the comparator in the fourth-stage comparator subunit can be set to V184 using the binary division method. If the pulse signal amplitude cannot exceed the threshold V184, then the pulse signal amplitude is between V160 and V184, and the comparison threshold of the comparator in the fifth-stage comparator subunit can be set to V172 using the binary division method. If the pulse signal amplitude can exceed the threshold V172, then the pulse signal amplitude is between V172 and V184, and the binary division method can be used to... Set the comparison threshold of the comparator in the sixth-stage comparator subunit to V178. Assuming the pulse signal amplitude cannot exceed threshold V178, the amplitude of the pulse signal lies between V172 and V178. Therefore, the comparison threshold of the comparator in the seventh-stage comparator subunit can be set to V175 using a binary search method. Assuming the pulse signal amplitude can exceed threshold V175, the amplitude of the pulse signal lies between V175 and V178. Therefore, the comparison threshold of the comparator in the eighth-stage comparator subunit can be set to V177 using a binary search method. Assuming the pulse signal amplitude exceeds the threshold V177, the pulse signal amplitude is between V177 and V178, located at energy address 178. If the pulse signal cannot exceed the threshold V177, the pulse signal amplitude is between V175 and V177. Then, following the binary search method, the comparison threshold of the comparator in the ninth-stage comparator subunit is set to V176. Assuming the pulse signal amplitude exceeds the threshold V176, the pulse signal amplitude is between V176 and V177, located at energy address 177. Therefore, the energy address corresponding to the pulse amplitude is determined through 8-10 comparisons.

[0183] In the example where about 80% of the pulse energies of the scintillation pulses correspond to addresses below 64, since only about 20% of the pulses are located in the high-energy range (i.e. outside the prior address range), although the number of these scintillation pulses is increased by 1-2 times, a significant reduction in the number of comparisons can still be achieved for all the pulses under test.

[0184] Therefore, except for the first-stage comparator subunit, the negative input terminal of the comparator of each subsequent comparator subunit will be determined by the arbitrator based on the output result of the previous stage comparator subunit, according to the energy range divided by the result, using a binary division principle to select the threshold voltage to be set at the negative input terminal of the comparator of the next stage comparator subunit. Furthermore, a delay unit is set between each stage comparator subunit to form a small delay (e.g., 5ns). Thus, the pulse signals serially input to the positive input terminals of the comparators of multiple comparator subunits are processed by the multiple comparator subunits with different delay times. After passing through the last stage comparator (determined by the arbitrator based on the output result of the first stage comparator), the energy channel address of the pulse, such as a flashing pulse, can be determined.

[0185] People can imagine that it can be achieved through modification Figure 8 The first multi-level comparison unit shown implements the multi-level comparison of the above embodiment, for example by adding two delay lines.

[0186] Furthermore, in the embodiment where the comparison threshold for the first-level comparison is determined based on a given prior address interval, non-first-level comparisons can be implemented using a quartering method.

[0187] The following will be based on Figure 16 The second multi-level comparison unit 1600 shown is used as an example to describe an embodiment of determining the comparison threshold of the first-level comparison based on a given prior address interval. In this embodiment, the non-first-level comparison is implemented by the quartering method. Figure 16 The second multi-level comparison unit 1600 shown is similar to Figure 14 The second multi-level comparison unit 1600 shown is different in that... Figure 16 The second multi-level comparator unit 1600 shown has one more comparator subunit, that is, a total of five levels of comparator subunits 1610, but the first level comparator subunit has only one comparator.

[0188] Furthermore, this embodiment is combined with the above. Figure 14 and Figure 11 The difference in the embodiment is that, in this embodiment, the comparison threshold of comparator 1611 in the first-level comparator subunit 1610 is set according to the upper endpoint (64th address) of the above-mentioned prior address interval, for example, V64.

[0189] If the comparison result of the first-stage comparator is that the pulse energy is within the prior address range (low energy range), then the amplitude of the pulse signal is between 0 and V64. Therefore, the comparison thresholds of the three comparators in the second-stage comparator subunit can be set to V16, V32, and V48 using the quartering method. Assuming the pulse signal amplitude cannot exceed threshold V16, then the amplitude of the pulse signal is between 0 and V16. Similarly, the comparison thresholds of the three comparators in the third-stage comparator subunit can be set to V4, V8, and V12 using the quartering method. Assuming the pulse signal amplitude cannot exceed threshold V4, then the amplitude of the pulse signal is between 0 and V4. Therefore, the comparison thresholds can be set to V4, V8, and V12 using the quartering method. The comparison thresholds of the three comparators in the fourth-stage comparator subunit are set to V1, V2, and V3. Assuming the pulse signal amplitude cannot exceed threshold V1, the amplitude is between 0 and V1, i.e., at the first energy address. If the pulse signal exceeds V1 but cannot exceed threshold V2, the amplitude is between V1 and V2, i.e., at the second energy address. If the pulse signal exceeds V2 but cannot exceed threshold V3, the amplitude is between V2 and V3, i.e., at the third energy address. If the pulse signal exceeds V3, the amplitude is between V3 and V4, i.e., at the fourth energy address. Therefore, using four levels of comparison determines the energy address corresponding to the pulse amplitude.

[0190] In examples where approximately 80% of the pulse energy of the scintillation pulse corresponds to a channel address below 64, the first-stage comparison of 80% of the pulses only requires one operation.

[0191] If the comparison result of the first stage is that the pulse energy belongs to the high-energy range (i.e., outside the prior address range), then the amplitude of the pulse signal is between V64 and V256. Therefore, the comparison thresholds of the three comparators in the second-stage comparator subunit can be set to V112, V160, and V208 according to the quartering method. Assuming the pulse signal amplitude cannot exceed the threshold V112, then the amplitude of the pulse signal is between V64 and V112. Therefore, the comparison thresholds of the three comparators in the third-stage comparator subunit can be set to V76, V88, and V90 according to the quartering method. The delayed pulse signal is input to the comparator. Assuming the pulse signal amplitude cannot exceed the threshold V76, then the amplitude of the pulse signal is between V64 and V76. Therefore, the comparison thresholds of the three comparators in the fourth-stage comparator subunit can be set to V76, V88, and V90 according to the quartering method. Thresholds are set to V67, V70, and V73. A delayed pulse signal is input to the comparator. Assuming the pulse signal amplitude cannot exceed threshold V67, its amplitude is between V64 and V67. The comparison thresholds of the three comparators in the fifth-stage comparator subunit can be set to V65, V66, and V67 using a quartering method. If the pulse signal cannot exceed V65, its amplitude is between V64 and V65, i.e., at energy address 65. If the pulse signal exceeds V65 but cannot exceed threshold V66, its amplitude is between V65 and V66, i.e., at energy address 66. If the pulse signal exceeds V66 but cannot exceed threshold V67, its amplitude is between V66 and V67, i.e., at energy address 67. Therefore, using five levels of comparison determines the energy address corresponding to the pulse amplitude.

[0192] In the example where approximately 80% of the pulse energies of the scintillation pulses correspond to addresses below 64, since only about 20% of the pulses are located in the high-energy range (i.e., outside the prior address range), and the first-stage comparison of each pulse only requires one step, although these scintillation pulses require one more stage, a significant reduction in the number of comparisons can still be achieved for all the pulses under test.

[0193] People can imagine that it can be achieved through modification Figure 10 The multi-level comparison in the above embodiment can be implemented by the first multi-level comparison unit shown in 12, for example by adding a delay line.

[0194] In some embodiments, the given prior address interval is one, and the comparison thresholds for the first-level comparison are two, which are determined based on the amplitude characterization values ​​of the two endpoint addresses of the prior address interval.

[0195] In one example, let's say the total number of energy addresses is N=m nTaking N=256 as an example, based on the pulse characteristics, a priori address interval is determined to be greater than the first address and less than the second address, such as addresses 60 to 64. The first-level comparison threshold can then be determined based on this priori interval. More specifically, the comparison threshold can be determined based on the two endpoint addresses of this priori address interval (such as addresses 60 and 64), for example, based on the amplitude characteristic values ​​corresponding to addresses 60 and 64, denoted as V60 and V64. It will be understood that this priori address interval can be set according to different pulse characteristics. For example, in pulsed neutron saturation logging, assuming that the pulse energy of a significant portion of the gamma rays corresponds to a scintillation pulse whose address is between addresses 60 and 64, the priori address interval is set to addresses 60 to 64, and thus, as mentioned above, the comparison threshold for the first comparison is set to V60 and V64.

[0196] The following will be based on Figure 17 The second multi-level comparison unit 1700 shown is used as an example to describe an embodiment of determining the comparison threshold of the first-level comparison based on a given prior address interval. In this embodiment, the non-first-level comparison is implemented by the quartering method. Figure 17 The second multi-level comparison unit 1700 shown is similar to Figure 16 The second multi-level comparison unit 1600 shown is different in that... Figure 17 The first-stage comparator subunit 1710 in the second multi-stage comparison unit 1700 shown has two comparators 1711 and 1712.

[0197] If the comparison result of the first-stage comparison is that the pulse energy is within the prior address range (called the medium energy range), that is, the amplitude of the pulse signal is between V60 and V64, then the comparison thresholds of the three comparators in the second-stage comparator subunit can be set to V61, V62, and V63 according to the quartering method. If the pulse signal cannot exceed V61, then the amplitude of the pulse signal is between V60 and V61, that is, at the 61st energy address; if the pulse signal exceeds V61 but cannot exceed the threshold V62, then the amplitude of the pulse signal is between V61 and V62, that is, at the 62nd energy address; if the pulse signal exceeds V62 but cannot exceed the threshold V63, then the amplitude of the pulse signal is between V62 and V63, that is, at the 63rd energy address; if the pulse signal exceeds V63, then the amplitude of the pulse signal is between V63 and V64, that is, at the 64th energy address. The energy address corresponding to the pulse amplitude is determined by using two-stage comparison.

[0198] In the significant portion of the flicker pulse, the pulse energy corresponds to the address within the prior address interval. Only two levels of comparison are required in total, and the first level comparison of each pulse only requires two comparisons, which can significantly reduce the number of comparisons.

[0199] If the comparison result of the first level is that the pulse energy is outside the prior address range, and is located in the high-energy or low-energy range, then it can be used as a reference. Figure 16 The described embodiment divides the channel address interval into four parts and compares them. Accordingly, a 4-level or 5-level comparison is used to determine the energy channel address corresponding to the pulse amplitude.

[0200] People can imagine that it can be achieved through modification Figure 15 The second multi-level comparison unit based on the binary search method shown above implements the multi-level comparison of the above embodiment, for example by setting two comparators in the first-level comparator subunit.

[0201] People can imagine that it can be achieved through modification Figure 8 , Figure 10 , Figure 12 The first multi-level comparison unit shown implements the multi-level comparison of the above embodiment, for example by adding a delay line.

[0202] One can conceive of an embodiment, for example, that implements multi-level comparisons based on a time-delay line combined with a comparator, where, if the address interval determined by the first-level comparison is outside the prior address interval, subsequent levels of comparisons prioritize comparing the comparison thresholds closest to the prior address interval. This feature can further reduce the number of comparisons because, even for pulses falling outside the prior address interval, the closer to the prior address interval, the greater the number of pulses.

[0203] For example, given a priori address range of less than 64 addresses, if the first-stage comparison result indicates that the pulse energy belongs to the high-energy range (i.e., outside the priori address range), then the amplitude of the pulse signal is between V64 and V256. The comparison thresholds of the three comparators in the second-stage comparator subunit can be set to V112, V160, and V208 using a quartering method. If this example is implemented using a first multi-stage comparison unit based on a delay line combined with comparators, then in the second-stage comparison, the comparison threshold V112, which is closest to the priori address range (i.e., closest to V64), is preferentially used to compare the pulse signal from a shorter delay line (such as from the second delay line). This is because the probability of the pulse falling into V64-V112 is greater than the probability of it falling into the other three address ranges.

[0204] In some embodiments, the given prior address intervals can be greater than or equal to 2 (M≥2). Accordingly, the comparison threshold for the first-level comparison is 2M and is determined based on the amplitude characterization values ​​of the 2M endpoint addresses of the prior address intervals.

[0205] In a further embodiment, when the pulse to be tested is a scintillation pulse generated by the probe material, especially a scintillation pulse generated by the probe material based on high-energy rays, the prior energy address can be set based on the energy characteristics of the high-energy rays emitted by the material components (elements), such as the energy peak value.

[0206] In a further embodiment, the material composition acquisition method further includes determining M prior address intervals based on the detected material composition. In some embodiments, the detected material composition may be a first component and a second component. In a specific embodiment, for example in well logging applications, the detected material composition may be, for example, carbon (C) and oxygen (O).

[0207] In some embodiments of the present invention, such as Figure 18 As shown, determining the M prior address intervals specifically includes: S1810: Determine M energy windows based on at least two components of the substance being probed. As mentioned above, the at least two components are, for example, a first component and a second component. In some specific embodiments, the first component energy window and the second component energy window can be determined based on the first component and the second component. In one specific embodiment, for example, in C / O energy spectrum logging, the two components are, for example, carbon (C) and oxygen (O). The properties of the downhole substance can be determined based on the ratio of the number of pulses in the energy ranges corresponding to carbon and oxygen elements in the obtained energy spectrum. Accordingly, the energy spectrum properties of carbon and oxygen elements can be used to implement the substance composition acquisition method according to the preferred embodiment of this application.

[0208] Specifically, based on the accuracy requirements of different application scenarios, and based on prior information or the properties of carbon and oxygen elements, the energy range of gamma rays generated by carbon atoms and oxygen atoms is determined respectively, thus obtaining the carbon energy window and the oxygen energy window.

[0209] S1820: Determine the M prior address intervals corresponding to the M energy windows.

[0210] In some embodiments, step S1820 may include: determining M amplitude ranges corresponding to the M energy windows; and determining the M prior address intervals based on the determined M amplitude ranges.

[0211] In some embodiments, the M amplitude ranges corresponding to the M energy windows can be determined in a manner similar to that described in step S110, such as determining the amplitude range corresponding to the first component energy window and determining the amplitude range corresponding to the second component energy window.

[0212] In one specific embodiment, for example in C / O energy spectrum logging, the C pulse amplitude range corresponding to the C energy window and the O pulse amplitude range corresponding to the O energy window can be determined.

[0213] In a specific example, a large number of pulses generated by γ photons can be collected at the highest possible sampling frequency using a high-speed sampling device such as an oscilloscope. The pulse data can be processed to obtain the energy information and voltage peak information of each pulse. A scatter plot of the pulse energy and peak value can be plotted and fitted to theoretically obtain a linear mapping relationship between energy and peak value.

[0214] In another specific example, M amplitude ranges corresponding to M energy windows can be obtained by interpolation using a lookup table between energy and peak value.

[0215] In another embodiment, when the channel address is an energy channel address, step S1820 can directly determine the prior channel address intervals corresponding to the M energy windows based on the energy windows and the energy characterization values ​​corresponding to the energy channel addresses, and correspondingly determine the amplitude range corresponding to the prior channel address intervals.

[0216] For example, in one specific embodiment, after determining the C pulse amplitude range corresponding to the C energy window and the O pulse amplitude range corresponding to the O energy window, multiple comparison thresholds for the first level comparison in the multi-level comparison can be set accordingly as described above. After performing the first level comparison, the comparison thresholds for subsequent level comparisons are dynamically adjusted according to the channel address interval into which the pulse to be tested falls. This will not be elaborated here.

[0217] Furthermore, in a preferred embodiment, the carbon-oxygen ratio (C / O ratio) for C / O energy spectrum logging can be further obtained based on pulse digitization, i.e., based on the energy spectrum of all pulses.

[0218] Here, as Figure 19 In the illustrated embodiment, the method for obtaining the substance composition further includes: S1910: Determine the counts of the scintillation pulses falling into the first component energy window and the second component energy window respectively; and S1920: Determine the ratio of the first component and the second component based on the count.

[0219] In one specific embodiment, for example in C / O energy spectrum logging, the carbon-oxygen ratio can be determined by a carbon-oxygen ratio determination unit independent of the path determination unit, such as... Figure 20 As shown.

[0220] exist Figure 20 In the illustrated embodiment, the carbon-oxygen ratio determination unit 2000 includes a first carbon comparator 2011, a second carbon comparator 2012, a first oxygen comparator 2021, a second oxygen comparator 2022, a carbon counter 2030, an oxygen counter 2040, a calculation unit 2050, and an optional correction unit 2060.

[0221] Therefore, in this embodiment, as Figure 21 As shown, step S1910 may include: S2110: Based on the comparison between the amplitude of the scintillation pulse and the amplitude range, determine whether the scintillation pulse falls within the amplitude range corresponding to the first component energy window or the amplitude range corresponding to the second component energy window; S2120: Perform first component counting on the scintillation pulses falling within the amplitude range corresponding to the first component energy window; and S2130: Perform second component counting on the flicker pulses that fall within the amplitude range corresponding to the second component energy window.

[0222] Specifically, the pulse to be measured is input in parallel to the first carbon comparator, the second carbon comparator, the first oxygen comparator, and the second oxygen comparator. The first carbon comparator sets a comparison threshold based on the lower limit of the amplitude range corresponding to the C energy window, and the second carbon comparator sets a comparison threshold based on the upper limit of the amplitude range corresponding to the C energy window. The first oxygen comparator sets a comparison threshold based on the lower limit of the amplitude range corresponding to the O energy window, and the second oxygen comparator sets a comparison threshold based on the upper limit of the amplitude range corresponding to the O energy window.

[0223] In some embodiments, a carbon counter is connected to a first carbon comparator and a second carbon comparator; an oxygen counter is connected to a first oxygen comparator and a second oxygen comparator; and a calculation unit is connected to the carbon counter and the oxygen counter to calculate the carbon-oxygen ratio.

[0224] An optional correction unit 2060 is connected to the negative terminals of the first carbon comparator 2011, the second carbon comparator 2012, the first oxygen comparator 2021, and the second oxygen comparator 2022, and is used to set the correction threshold.

[0225] Here, the C pulse amplitude range corresponding to the C energy window and the O pulse amplitude range corresponding to the O energy window can be determined in step S1820 above, for example, by determining them according to a linear mapping relationship or a lookup table, or by determining the amplitude range based on the determined prior address interval. Thus, four pulse amplitude (peak) endpoint values ​​corresponding to the endpoints of the carbon energy window and the oxygen energy window can be obtained, for example, denoted as V... Cmin V Cmax V Omin V Omax express.

[0226] Here, for example, the comparison thresholds of the first carbon comparator 2011, the second carbon comparator 2012, the first oxygen comparator 2021, and the second oxygen comparator 2022 can be set to the peak endpoint values ​​V of the four pulses respectively by a digital-to-analog converter. Cmin V Cmax V Omin V OmaxTherefore, when the pulse to be measured enters the system, it will be input to four comparators in parallel. If the pulse to be measured crosses V... Cmin And did not cross V Cmax The carbon counter increments by 1 if the pulse being measured exceeds V. Omin And did not cross V Omax If the oxygen counter increments by 1, then neither of the above two conditions applies. If neither of the above conditions applies, then neither counter needs to make any response.

[0227] After all the pulses to be tested have passed through the system, the C / O value can be obtained by reading and calculating the values ​​of the two counters through the calculation unit.

[0228] As mentioned above, the embodiments of this application may optionally include the step of calibrating the first carbon comparator 2011, the second carbon comparator 2012, the first oxygen comparator 2021, and the second oxygen comparator 2022.

[0229] In real-world logging scenarios, equipment needs to operate in environments with fluctuating temperatures and generally high temperatures. Temperature is often a significant factor affecting the operational status of electronic components. To ensure the instrument can obtain relatively accurate data during downhole operations, a correction unit can be added to the DAC (Digital Converter). This can be achieved by adding an extra DAC channel as input to the correction unit. Based on prior information, the correction unit can determine the output differences of the DAC at different temperatures and use this information to correct the comparison thresholds of the four comparators. For example, taking the DAC used to set the amplitude endpoint and setting the comparison threshold to 3V as an example, if the comparison threshold deviates due to temperature changes, such as a deviation of 0.5V, the correction unit, such as correcting the DAC setting the deviation comparison threshold to -0.5V, can correct the deviations of the carbon and oxygen comparators.

[0230] In this preferred embodiment, based on determining the energy address into which each pulse to be measured falls (e.g., based on a multi-level binary or quartic method), the carbon / oxygen ratio spectrum is determined by an additionally set carbon / oxygen comparator, effectively shortening the spectrum generation time of the carbon / oxygen ratio spectrum.

[0231] In an alternative preferred embodiment, it is also conceivable to obtain the carbon-oxygen ratio by counting the pulse counts within the channel address or channel address interval corresponding to the C energy window and the pulse counts within the channel address or channel address interval corresponding to the amplitude range of the O energy window.

[0232] Therefore, in this embodiment, after determining the energy information of all pulses to be tested at all channels in step S150, such as after generating the energy spectrum of all energy channels, the counts falling into the C energy window and the O energy window are determined based on the energy channels corresponding to the C energy window and the O energy window, respectively. For example, the C energy window corresponds to channel AB, and the O energy window corresponds to channel CD. At this time, it is only necessary to calculate the counts within these two channel intervals to determine the carbon-oxygen ratio.

[0233] Furthermore, as further described below, embodiments of this application also relate to a scintillation pulse-based method for determining material composition, which is independent of or in conjunction with the material composition acquisition method of embodiments of this application.

[0234] In another embodiment, a single-level comparison can be used to compare the amplitude values ​​of multiple pulses under test with the amplitude characterization values ​​of the multiple channel addresses.

[0235] In such Figure 22 The illustrated embodiment shows a single-level comparison. Specifically, step S140 may include: S2210: Perform a single-stage comparison, including multiple comparisons, on the amplitude of each pulse under test to determine the channel address to which the pulse under test falls, wherein the number of comparisons corresponds to the number of channel addresses; and S2220: Determine the channel address into which the pulse to be tested falls based on the comparison result of the single-level comparison.

[0236] To achieve the above single-level comparison, the address determination unit may include or may be a single-level comparison unit.

[0237] In some embodiments, multiple comparisons in the module architecture of the single-level comparison unit for implementing single-level comparisons can be implemented by multiple comparators, wherein the number of multiple comparators is greater than or equal to the number of multiple channel addresses.

[0238] In another embodiment, it can also be implemented by a comparator architecture with fewer than the number of addresses, or even a single comparator architecture, for example by combining an adjustable comparator with different delays of the delay lines.

[0239] like Figure 23 A schematic embodiment of a first single-stage comparison unit 2300 for implementing single-stage comparison is shown. The first single-stage comparison unit 2300 includes multiple parallel delay lines 2310 connected to the input pulse to be measured, an adjustable comparator 2320 connected to the delay lines, and an arbitrator 2330 operating on the adjustable comparator. Preferably, at least some of the delay lines have different delay times. Figure 23In the illustrated embodiment, the delay time of each delay line is different. Preferably, the number of parallel delay lines is greater than or equal to the number of the plurality of channel addresses. In the illustrated embodiment, N parallel delay lines 2310 are shown.

[0240] For example, if the total number of energy channels is N=256, then the number of N parallel delay lines 2310 corresponds to the total number of energy channels. Therefore, a single-stage N-division method can be used to determine the channel address to which the pulse under test falls. In this single-stage comparison, the number of comparisons is the same as the number of energy channels.

[0241] Specifically, the input pulse can be passed through 256 delay lines with different delays before being input to the comparator. That is, the pulse signal is repeatedly input to the positive input terminal of the comparator 256 times. The threshold voltage for each comparison is set by the arbitrator. The arbitrator assigns the comparison threshold to the negative input terminal of the comparator in sequence according to the amplitude characterization value corresponding to the energy spectrum channel address, such as V1, V2, V3, ..., V256. After 256 comparisons, the specific channel address to which the energy of the input pulse to be measured belongs can be obtained.

[0242] This embodiment simplifies the dynamic threshold spectrum generation scheme that uses multi-level comparisons, setting only one level of comparison. Compared with the dynamic threshold spectrum generation scheme that uses multi-level comparisons, it can reduce or avoid errors introduced by differences between comparators to a certain extent. As an explanation, and not a limitation, in the dynamic threshold spectrum generation scheme that uses multi-level comparisons to compare the input pulses, differences between comparators may introduce errors in the comparison of pulse peaks, which ultimately affect the accuracy of the generated energy spectrum.

[0243] As previously mentioned, in some embodiments, multiple comparisons in the module architecture of a single-level comparison unit for implementing single-level comparisons can be implemented by multiple comparators.

[0244] Although not shown in the figure, it is conceivable to set up N parallel comparators greater than or equal to the number of energy addresses, preferably the same as the number of energy addresses.

[0245] For example, taking a total of 256 channels as an example, 256 comparators are set up in parallel. For example, the corresponding DAC provides each comparator with the amplitude representation value corresponding to the energy channel address (such as the endpoint value of the pulse peak interval corresponding to the energy channel address) as the comparison threshold.

[0246] As mentioned above, in the embodiments of this application, the channel address interval into which each pulse to be tested falls can also be pre-determined based on time parameters.

[0247] In a further specific embodiment, a Time Over Threshold (TOT) method combined with a dynamic comparison threshold can be used to count the address to which a pulse, such as a flashing pulse, falls.

[0248] In one specific embodiment, such as Figure 24 As shown, step S140 may include: S2410: Provides data on the mapping relationship between threshold time and energy range for multiple reference pulses.

[0249] In a specific embodiment, the threshold-crossing time-energy range mapping data is a threshold-crossing time-energy range lookup table.

[0250] In some embodiments, the plurality of reference pulses in step S2410 are the plurality of reference pulses or a portion thereof described in step S110, or the plurality of reference pulses in steps S2410 and S110 partially overlap with each other.

[0251] In another preferred embodiment, the plurality of pulses in step S2410 are different from the reference pulses described in step S110, for example, pulses shaped from the reference pulses described in step S110 or other acquired pulses.

[0252] Here, a lookup table corresponding to the pulse energy range and TOT can be obtained based on prior information.

[0253] For example, a comparison threshold slightly larger than the maximum noise amplitude can be set for the comparator, such as a threshold voltage V. t1 A large number of pulses with known energy are passed through this channel, and the time it takes for each pulse to cross a threshold is recorded, i.e., the threshold crossing time (TOT). Using prior information, for example, the threshold voltage V can be obtained. t1 A lookup table for the pulse energy range corresponding to the TOT (Transmission Toll) signal. As a supplement or alternative, other comparison thresholds can be set for the comparator, such as a threshold voltage V. t2 V t3 And so on, and accordingly obtain the time to cross the threshold (TOT) at these comparison thresholds, such as the threshold voltage. Therefore, based on prior information, the correspondence between TOT and energy range can be obtained.

[0254] As an explanation rather than a limitation, since the pulse widths of the pulse signals are not significantly different, and if the pulses are shaped, the pulse widths of the shaped pulses may be even more similar, the TOTs of the pulse signals that cross the threshold voltage are not significantly different, resulting in the same TOT potentially corresponding to multiple pulse energies, i.e., a certain energy range.

[0255] S2420: Obtain at least one threshold crossing time of the pulse to be tested, and each threshold crossing time corresponds to an amplitude threshold.

[0256] As previously stated, step S140 can be implemented by the address determination unit. Figure 26 and Figure 28 It shows what can be used for implementation Figure 24 The channel address determination units 2600 and 2800 of the illustrated embodiments particularly include a threshold time unit connected to the input of the pulse to be tested.

[0257] like Figure 26 As shown, the channel address determination unit 2600 may include a comparison unit 2610 connected to the pulse input to be tested, a threshold crossing time unit 2630 connected to the pulse input to be tested, and an arbitrator 2620 that operates the threshold crossing time unit 2630 and the comparison unit 2610.

[0258] exist Figure 26 In the illustrated embodiment, the comparison unit 2610 includes physical multi-stage comparator subunits 2611, each of which includes a single physical adjustable comparator, which can, for example, perform a binary comparison in subsequent single-stage or multi-stage comparisons. It will be conceivable that... Figure 26 The comparison unit shown can be configured or modified with reference to the single-level or multi-level comparison unit structure described in other embodiments of this application, such as... Figure 8 , Figure 10 , Figures 12-17 , Figure 23 The comparison unit structure is shown. In particular, Figure 26 When the comparison unit shown is used to implement multi-level comparison, it may include a physical multi-level comparator subunit, or it may include multiple parallel delay lines with different delays and an adjustable comparator connecting the delay lines for implementing multi-level comparison, both of which fall within the scope of this application.

[0259] Continue to refer to Figure 26 The threshold time unit 2630 may include a threshold time comparator 2631 and a threshold time (TOT) acquisition processor 2634 connected to the threshold time comparator 2631.

[0260] Reference Figure 26 and Figure 27 The threshold time comparator 2631 can be set with a comparison threshold, which in this case is an amplitude threshold, such as a voltage threshold V. t1Accordingly, by inputting the pulse to be measured 2710 into the threshold crossing time comparator 2631, the threshold crossing time comparator 2631 will output a transition signal 2720, such as from low level 0 to high level 1 and from high level 1 to low level 0, when the pulse to be measured crosses the amplitude threshold, including crossing from bottom to top and from top to bottom. Accordingly, the time of generation of the transition signal, such as t1 and t2, can be determined by a time determination unit, such as a TDC. Thus, the TOT acquisition processor 2634 can determine the time interval, such as t2-t1, between two transition moments from the same threshold crossing time comparator 2631 to determine the amplitude threshold, such as the voltage threshold V. t1 TOT below.

[0261] In another embodiment, multiple TOTs can be determined based on multiple amplitude thresholds.

[0262] like Figure 28 As shown, the channel address determination unit 2800 may include a comparison unit 2810 connected to the pulse input to be tested, a threshold crossing time unit 2830 connected to the pulse input to be tested, and an arbitrator 2820 that operates the threshold crossing time unit 2830 and the comparison unit 2810.

[0263] Continue to refer to Figure 28 The threshold time unit 2830 may include multiple (e.g., 3) threshold time comparators 2831 and a threshold time (TOT) acquisition processor 2834 connected to the threshold time comparators 2831.

[0264] Here, Figure 28 The threshold crossing time unit 2830 shown is... Figure 26 The difference between the threshold crossing time unit 2630 and the threshold crossing time unit 2830 shown is that the threshold crossing time unit 2830 includes multiple (e.g., three) threshold crossing time comparators 2831, each of which can be set with a different comparison threshold, in this case an amplitude threshold, such as a voltage threshold V. t1 V t2 V t3 Therefore, in Figure 28 In the illustrated embodiment, multiple (e.g., 3) TOTs can be determined based on multiple amplitude values.

[0265] S2430: Determine the first address interval based on the at least one threshold crossing time of the pulse under test and the mapping relationship data between the threshold crossing time and the energy range.

[0266] In this embodiment, the address is an energy address.

[0267] Therefore, based on the mapping relationship data provided in step S2410, such as a lookup table, the energy range corresponding to the TOT determined in step S2420 can be determined, and then based on the energy characterization value corresponding to the energy address set in step S120, the first address interval corresponding to the TOT can be determined, which can be referred to as the TOT address interval.

[0268] In a specific example, the comparison threshold, such as the threshold voltage, of the cross-threshold time comparator 2631 can be set to V by the arbitrator 2620 and / or the TOT acquisition processor 2634. t1 The pulse to be tested crosses the threshold V after passing the threshold time comparator 2631. t1 The TOT acquisition processor 2634 determines the TOT value at which the pulse signal crosses the threshold. The arbitrator 2620 determines the range of pulse energy corresponding to the TOT value based on the obtained lookup table, thereby determining the first address interval corresponding to the TOT. For example, the energy values ​​at the two endpoints of the energy range are mapped to two energy addresses, and the energy segment between these two energy addresses is the first address interval after reduction relative to the total number of addresses. More specifically, the threshold comparison threshold of the threshold time comparator 2631, such as the threshold voltage V, is used for comparison. t1 For example, the threshold voltage is slightly larger than the maximum amplitude of the noise. Based on the determined threshold time value (i.e., TOT value) of the pulse under test, the energy range corresponding to the TOT value can be obtained by looking up the table, for example, the range [3.48MeV, 3.66MeV], and then it is determined that the two energy values ​​are located at the 100th energy address and the 105th energy address, respectively. The energy address interval determined in this way is the 100th to the 105th energy address.

[0269] As previously stated, multiple TOTs can be determined in step S2420 based on multiple amplitude thresholds. Correspondingly, in step S2430, a first address interval (TOT address interval) can be determined based on the energy ranges corresponding to the multiple TOTs. For example, it can be determined by the intersection and / or subset of the energy ranges corresponding to the multiple TOTs. Figure 28 In the specific embodiment shown, multiple (e.g., 3) voltage thresholds V can be used. t1 V t2 V t3 The first channel address interval (TOT channel address interval) is determined by the intersection of the energy ranges corresponding to multiple (e.g., 3) TOTs. In a specific example, this could be the voltage threshold V. t1 The energy address range corresponding to the determined TOT is from energy address 100 to energy address 120, and the voltage threshold V t2 The energy address range corresponding to the determined TOT is from energy address 90 to energy address 110, and the voltage threshold V t3The energy address range corresponding to the determined TOT is from the 88th energy address to the 105th energy address. Therefore, the final first address range (TOT address range) can be determined as the 100th to the 105th energy address range based on the intersection of the energy range or address range.

[0270] S2440: Performs a single-level comparison or a multi-level comparison of the amplitude of each pulse under test to determine the second address interval into which the pulse under test falls.

[0271] In this embodiment of the application, each level of comparison defines at least two second address intervals by at least one comparison threshold, and the comparison threshold of the single-level comparison or the first level comparison threshold of the multi-level comparison is determined according to the first address interval.

[0272] S2450: Determine the channel address into which the pulse to be tested falls based on the single-level or multi-level comparison results.

[0273] The first address interval (TOT interval) determined in step S2430 above can be used to dynamically determine the comparison threshold for subsequent single-level or multi-level comparisons. The comparison method described in this embodiment can, for example, refer to the single-level or multi-level comparison methods described in other embodiments. In some embodiments, the comparison can be based on one or more parallel adjustable comparators. In other embodiments, the comparison can be based on a combination of delay lines and adjustable comparators.

[0274] For example, taking the aforementioned energy addresses 100-105 as an example, since the number of addresses in the first address interval is small, they can be directly compared. For example, the intermediate energy address can be determined as energy address 102. If the amplitude of the pulse signal exceeds the amplitude representation value corresponding to energy address 102, it is located in energy address 103-105. Then, the amplitude representation value corresponding to energy address 104 is used as a comparison threshold. If it is greater than the comparison threshold, it is located in energy address 105; if it is less than the comparison threshold, it is located in energy address 103-104. Then, the amplitude representation value corresponding to energy address 103 is used as a comparison threshold. If the pulse signal exceeds the comparison threshold, it is located in energy address 104; otherwise, it is located in energy address 103.

[0275] As Figure 24 An alternative to the illustrated embodiment can be that the first address interval is dynamically pre-determined according to a preset standard. In one specific embodiment, refer to... Figure 25 Step S140 may include: S2510: Provides threshold time-energy range mapping data for multiple reference pulses.

[0276] In step S2510, you can refer to Figure 24 Step S2410 as described in the illustrated embodiment.

[0277] like Figure 25 As shown, step S140 further includes repeatedly executing the following steps: S2520: Set a threshold value for a single image. S2530: Obtain the threshold crossing time of the pulse to be tested, wherein the threshold crossing time corresponds to the set amplitude threshold. S2540: Determine or update the first address interval based on the threshold crossing time and the threshold crossing time-energy range mapping data of the pulse under test, and S2550: Determine whether it meets the preset standard.

[0278] If yes, exit the loop; otherwise, continue executing the loop steps.

[0279] In some embodiments, the above-described cyclic execution steps can be utilized Figure 28 The address determination unit 2800 shown is used for implementation. As previously described, the threshold time unit 2830 may include multiple (e.g., 3) threshold time comparators 2831 and a threshold time (TOT) acquisition processor 2834 connected to the threshold time comparators 2831.

[0280] Accordingly, there are multiple threshold time comparators, and the multiple threshold time comparators are set with different amplitude thresholds for each other.

[0281] In some embodiments, the preset standard is a preset number of amplitude thresholds. For example, when the set amplitude thresholds are greater than or equal to 3, the loop exits, and subsequent steps are executed based on the newly determined first address interval.

[0282] In other embodiments, the preset standard is that the number of addresses in the first address interval is less than a preset number. For example, when the number of addresses in the first address interval is small, such as less than 5, the loop can be exited, and subsequent steps can be performed based on the newly determined first address interval.

[0283] After exiting the loop, step S140 may further include: S2560: Performs a single-level comparison or a multi-level comparison of the amplitude of each pulse under test to determine the second address interval into which the pulse under test falls.

[0284] In a specific embodiment, each level of comparison defines at least two second address intervals by at least one comparison threshold, and the comparison threshold of the single-level comparison or the first-level comparison threshold of the multi-level comparison is determined according to the first address interval.

[0285] S2570: Determine the channel address into which the pulse to be tested falls based on the single-level or multi-level comparison results.

[0286] Similar to step S2450, the comparison method described in step S2570 can refer to single-stage or multi-stage comparison methods described in other embodiments. In some embodiments, the comparison may be based on a single or multiple parallel adjustable comparators. In other embodiments, the comparison may be based on a combination of delay lines and adjustable comparators.

[0287] exist Figures 24 to 28 In the various embodiments shown, using Time OverThreshold (TOT) combined with a dynamic comparison threshold to count the channel addresses to which pulses, such as scintillation pulses, fall is more advantageous in applications involving high-precision energy spectrum mapping. This effectively shortens the spectrum generation time and changes the order of voltages compared with the pulses, thus accelerating the acquisition of comparison results overall. Furthermore, in... Figure 25 or Figure 25 Combination Figure 28 In the illustrated embodiment, the energy address range was pre-screened, which further improved the spectrum formation efficiency and effectively reduced the comparison time.

[0288] Continue back as Figure 1 As shown, the material composition acquisition method 100 may further include step S150: obtaining the energy information of the plurality of pulses to be tested based on the count of the pulses to be tested in each channel and the amplitude-energy mapping relationship data or the energy characterization value of the energy channel.

[0289] More specifically, step S150 includes generating the energy spectrum of the plurality of pulses to be tested.

[0290] In some embodiments, when the channel address set in step S120 is an energy channel address, the energy spectrum can be obtained directly by plotting a histogram based on the statistical count of scintillation pulses within each energy channel address.

[0291] In an alternative embodiment, when the channel address set in step S120 is an amplitude channel address, the amplitude distribution can be obtained based on the statistical count of scintillation pulses within the amplitude channel address, for example, by plotting a histogram. Next, the energy range corresponding to each amplitude channel address can be determined according to amplitude-energy mapping data, such as an amplitude-energy lookup table, and the amplitude distribution can be converted into energy information, such as an energy spectrum.

[0292] In this embodiment of the application, before counting the pulses to be tested, a threshold correction step S2930 is also included.

[0293] Optionally, when the channel address is set to an energy channel address, such as Figure 29 As shown, the method for obtaining material composition may further include a correction step S2930, namely: correcting the amplitude characterization values ​​of the multiple energy addresses relative to the energy characterization values ​​of the multiple energy addresses.

[0294] People will understand. Figure 29 Steps S2910, S2920, S2940, and S2950 in the illustrated embodiment can be referred to respectively. Figure 1 Steps S110, S120, S140, and S150 in the illustrated embodiment will not be described in detail here.

[0295] like Figure 30 In the illustrated embodiment, step S2930 may include: S3010: Determine the energy address corresponding to the plurality of first correction pulses based on the comparison results between the amplitude magnitudes of the plurality of first correction pulses and the amplitude characterization values ​​of the plurality of energy addresses; S3020: Generate the energy spectrum of the first correction pulse based on the first correction pulse count in each energy address and the energy characterization value of the energy address. The energy spectrum of the first correction pulse has a first characteristic peak. S3030: Set multiple first correction energy addresses; Wherein, the energy range corresponding to the plurality of first corrected energy addresses is smaller than the energy range corresponding to the plurality of energy addresses, and each corrected energy address has its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; S3040: Determine the correction energy address corresponding to the plurality of second correction pulses based on the comparison results between the amplitude magnitudes of the plurality of second correction pulses and the amplitude characterization values ​​of the plurality of first correction energy addresses; S3050: Based on the count of the second correction pulses within each first correction energy address and the energy characterization value of the correction energy address, generate the energy spectrum of the second correction pulse, wherein the energy spectrum of the second correction pulse has a first correction characteristic peak; and S3090: Based on the first difference between the first characteristic peak and the first correction characteristic peak, correct the energy characterization value or amplitude characterization value of the plurality of energy addresses.

[0296] In some embodiments, energy address calibration can be achieved by setting different address partitioning methods. This can be achieved by setting different operating modes. One such mode is a normal operating mode or a calibration mode similar to a normal operating mode, in which a "normal" energy address, also known as the energy address to be calibrated, is used for the pulse under test. Other calibration modes can be used at calibration energy addresses with an energy range smaller than the "normal" energy address. For ease of distinction, the former can be referred to as the first calibration mode, and the latter as the second calibration mode.

[0297] In some embodiments of this application, the correction step uses a single characteristic peak. This will be discussed in conjunction with... Figure 30The illustrated embodiment describes a specific example of implementing correction using a single characteristic peak.

[0298] Specifically, as shown in steps S3010 and S3020, the method for digitally acquiring energy information described above can be used in a first correction mode similar to the normal operating mode. It can operate normally for one cycle under the required operating environment, obtaining an energy spectrum of 256 energy channels characterizing an energy range within 9 MeV. In the low-energy range of this spectrum, there is a clearly identifiable characteristic peak (a peak composed of pulses formed by γ-photons generated by H (hydrogen) atoms, hereinafter referred to as the H peak), thereby obtaining the corresponding first characteristic peak value. Optionally, the channel address E corresponding to the H peak in the energy spectrum obtained under this first correction mode can be acquired. H1 .

[0299] In some embodiments, in step S3030, the plurality of first correction energy addresses can be set according to the first characteristic peak value, so that the first characteristic peak value falls within the energy range corresponding to the first correction energy address.

[0300] In a further embodiment, in step S3030, the plurality of first corrected energy addresses can be set according to the first characteristic peak and the preset shrinkage ratio, so as to shrink the energy range corresponding to the plurality of energy addresses according to the preset shrinkage ratio to obtain the energy range corresponding to the plurality of first corrected energy addresses, and make the first characteristic peak fall into the energy range corresponding to the first corrected energy address.

[0301] In a further embodiment, in step S3030, the first characteristic peak value is the median value of the energy range corresponding to the first corrected energy address.

[0302] In a further embodiment, in step S3030, the number of energy addresses to be corrected can correspond to the number of energy addresses to be corrected, for example, both being 256.

[0303] The following describes specific embodiments of steps S3030 to S3050. For example, it can be set to a second calibration mode. In the second calibration mode, the underlying logic of the system operation is the same as that of the first calibration mode, which is similar to the normal operation mode. However, the difference is that in the second calibration mode, the energy range corresponding to the multiple first calibration energy addresses is smaller than the energy range corresponding to the multiple energy addresses to be measured. For example, referring to the specific example described above, the energy range corresponding to the multiple first calibration energy addresses is no longer the original 0~9MeV, but is determined by the first characteristic peak and a predetermined shrinkage ratio. For example, the 900keV energy range centered on the first characteristic peak of 2.25MeV is 1.8MeV~2.7MeV, and the shrinkage ratio is 1 / 10. Accordingly, the center of the energy range corresponding to the multiple first calibration energy addresses is the theoretical energy value of the H peak, 2.25MeV, and the range size is set at 900keV, which is one-tenth of the original range of 0~9MeV. The number of energy addresses remains 256. Accordingly, the current energy range of 1.8 MeV to 2.7 MeV can be divided into 256 parts. Based on this range, the energy (characteristic value) corresponding to each channel address on the energy spectrum is redefined, that is, the corresponding pulse peak or maximum amplitude characterization value is found based on the energy corresponding to each channel address. Here, following the method of digitally acquiring energy information described above, one working cycle can be run in the second correction mode, at which point a more accurate but narrower energy spectrum will be obtained. The energy range of the energy spectrum corresponding to the first corrected energy channel address includes the region where the H peak is located, and a more accurate energy value of the H peak (i.e., the first corrected characteristic peak) can be obtained through this energy spectrum. The first corrected channel address E of the H peak at this time is recorded. H2 .

[0304] Subsequently, as described in step S3090, the energy characterization values ​​or amplitude characterization values ​​of the plurality of energy addresses can be corrected based on the first difference between the first characteristic peak and the first correction characteristic peak. As an example, it can be determined that in the first correction mode, which is similar to the normal operating mode, the energy corresponding to the H peak is 9 × E. H1 / 256 MeV (denoted as Energy) H1 In the second correction mode, the energy corresponding to the H peak is (1.8 + 0.9 × E). H2 / 256) MeV (denoted as Energy) H2 (The range is 1.8 MeV to 2.7 MeV, and within this range, the channel addresses are arranged from 0 to 255, so an initial value of 1.8 MeV needs to be added.) The difference in the proportion of H peak occurrence can be obtained as k = Energy. H1 / Energy H2 .

[0305] exist Figure 30 In the illustrated embodiment, a linear function y=kx can be used for correction. Therefore, in the first correction mode, similar to the normal operating mode, the energy value represented by each energy address should be 1 / k times the original value. That is, in the subsequent normal operating mode used for the pulse under test, the energy value represented by each energy address should also be 1 / k times the original value. Different forms of correction can be performed accordingly. In one embodiment, the energy characterization value corresponding to the energy address to be corrected can be adjusted to 1 / k times the original value. In another embodiment, the amplitude characterization value corresponding to the energy address to be corrected can be adjusted to k times the original value. For example, the voltage threshold corresponding to the energy address to be corrected can be adjusted to k times the original value. This completes the relative correction of the energy characterization value and amplitude characterization value of the energy address, reducing the resulting energy spectrum shift.

[0306] It will become clear that more than one characteristic peak can be used for correction. Accordingly, the correction function includes, but is not limited to, a linear function y=kx, and the accuracy of the correction can be improved by increasing the characteristic peak used for correction and the parameters or degree in the corresponding function model.

[0307] like Figure 31 In the illustrated embodiment, step S2930 may include: S3110: Determine the energy address corresponding to the plurality of first correction pulses based on the comparison results between the amplitude magnitudes of the plurality of first correction pulses and the amplitude characterization values ​​of the plurality of energy addresses; S3120: Generate the energy spectrum of the first correction pulse based on the first correction pulse count in each energy address and the energy characterization value of the energy address. The energy spectrum of the first correction pulse has a first characteristic peak and a second characteristic peak. S3130: Set multiple first correction energy addresses; Wherein, the energy range corresponding to the plurality of first corrected energy addresses is smaller than the energy range corresponding to the plurality of energy addresses, and each corrected energy address has its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; S3140: Determine the correction energy address corresponding to the plurality of second correction pulses based on the comparison results between the amplitude magnitudes of the plurality of second correction pulses and the amplitude characterization values ​​of the plurality of first correction energy addresses; S3150: Based on the count of the second correction pulses within each first correction energy address and the energy characterization value of the correction energy address, generate the energy spectrum of the second correction pulse, wherein the energy spectrum of the second correction pulse has a first correction characteristic peak. S3160: Set multiple second correction energy addresses; Wherein, the energy range corresponding to the plurality of second corrected energy addresses is smaller than the energy range corresponding to the plurality of energy addresses, and each second corrected energy address has its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; S3170: Determine the second correction energy address corresponding to the plurality of third correction pulses by comparing the amplitude values ​​of the plurality of third correction pulses with the amplitude characterization values ​​of the plurality of second correction energy addresses; S3180: Based on the count of the third correction pulse within each second correction energy address and the energy characterization value of the second correction energy address, generate the energy spectrum of the third correction pulse, wherein the energy spectrum of the third correction pulse has a second correction characteristic peak; and S3190: Based on the first difference between the first characteristic peak and the first corrected characteristic peak and the second difference between the second characteristic peak and the second corrected characteristic peak, correct the energy characterization value or amplitude characterization value of the plurality of energy addresses.

[0308] exist Figure 31 In the illustrated embodiment, steps S3110-S3140 can refer to steps S3010-3040.

[0309] In step S3150, the energy spectrum of the first correction pulse also has a second characteristic peak. Accordingly, the second correction characteristic peak can be obtained in steps S3160-3180. Further, in step S3190, the energy address is corrected based on the difference between the two characteristic values ​​and their correction values.

[0310] Accordingly, in Figure 31 In the embodiment shown, in step S3170, the plurality of second correction energy addresses can be set according to the second characteristic peak value, so that the second characteristic peak value falls within the energy range corresponding to the second correction energy address.

[0311] In a further embodiment, in step S3170, the plurality of second corrected energy addresses can be set according to the second characteristic peak value and the preset shrinkage ratio, so as to shrink the energy range corresponding to the plurality of energy addresses according to the preset shrinkage ratio to obtain the energy range corresponding to the plurality of second corrected energy addresses, and make the second characteristic peak value fall into the energy range corresponding to the second corrected energy address.

[0312] In a further embodiment, in step S3170, the second characteristic peak value is the median value of the energy range corresponding to the second corrected energy address.

[0313] In a further embodiment, in step S3170, the number of second corrected energy addresses can correspond to the number of energy addresses to be corrected, for example, both being 256.

[0314] For example, when using y=kx+b, y=ax 2 When choosing a function like +bx as the mathematical model for correction, the two unknown parameters in the model can be obtained by solving the problem using two sets of corresponding data.

[0315] Since two correction modes similar to the second correction mode described above can be set, correspondingly, a first correction mode similar to the normal operating mode, as well as second and third correction modes, can be established. For example, the second correction mode can also be called the H correction mode, and the newly added third mode can be named the C correction mode (the peak composed of pulses formed by γ photons generated by C atoms, hereinafter referred to as the C peak). Similar to the H correction mode, in the C correction mode, the energy range of 900 keV centered on the second characteristic peak, such as the C peak (4.43 MeV), is used as the energy range corresponding to multiple second correction energy addresses, and the energy corresponding to the C peak is denoted as Energy. C2 Meanwhile, the energy corresponding to the C peak obtained in the first corrected operating mode, which is similar to the normal operating mode, is denoted as Energy. C1 , will (Energy C2 Energy C1 ), (Energy H2 Energy H1 Substituting (x, y) into the determined function model, the unknown parameters can be obtained, yielding the function expression y = f(x). Since the pulse peak value and pulse energy have a certain definite functional relationship, namely E = g(V), let the amplitude characterization value before correction, such as the threshold voltage, be V1, and the energy (characterization value) corresponding to V1 in the energy spectrum before correction be E1. The actual energy value corresponding to V1 should be E2, so E2 = g(V1) and E1 = f(E2). The threshold voltage after correction is V2, and the energy corresponding to V2 in the energy spectrum after correction is E1, i.e., E1 = g(V2). Therefore, g(V2) = f(E2) = f(g(V1)), i.e., V2 = g -1 (f(g(V1))).

[0316] Although this paper illustrates an embodiment of correction based on one or two characteristic peaks, the parameters in the mathematical model can be further increased if needed, along with the number of characteristic peaks used for correction. For example, characteristic peaks of a certain element can be taken to obtain its precise energy spectrum, and the above steps can be repeated to achieve correction.

[0317] Compared to the traditional MVT method, which is suitable for sampling known pulses and whose threshold is determined based on the energy range of the known pulses, the digitization method described in the above embodiments of this application can sample unknown pulses by dynamically processing the pulses or dynamically setting the thresholds, and by combining several set thresholds, and can classify unknown pulses to the corresponding energy addresses without fitting calculations.

[0318] Compared with the traditional MVT method, the digital method of this application eliminates the need to solve a system of equations to obtain a function curve for fitting the pulse waveform during pulse signal processing. This simplifies the pulse energy acquisition process and saves more hardware resources when FPGA resources are limited, reducing FPGA power consumption and improving the chip's high-temperature tolerance. Previous MVT methods involved acquiring pulse voltage values ​​through each channel, fitting the pulse waveform using sampling points, calculating the pulse energy value through integration, and finally plotting the energy spectrum. In this application, the input pulse voltage is directly processed by several comparators and / or selectors and / or delay circuits to generate the spectrum for each channel, eliminating the need for fitting. The channel address can be determined simply by the comparator output value.

[0319] Conventional MVT sampling with fixed thresholds, because the number and size of thresholds are fixed, only provides excellent results for specific energy ranges. MVT requires fitting scintillation pulses and acquiring the precise time corresponding to each point, thus requiring a large number of digital time converters (TDCs). This application embodiment significantly reduces or eliminates TDCs by counting scintillation pulses according to energy channel addresses, making the system simpler and more widely applicable.

[0320] Traditional MVT methods require complex fitting calculations, resulting in a dead time during which the system cannot process new pulses after each pulse ends. This invention bypasses the complex calculations for pulse waveform fitting, directly obtaining the energy spectrum through simple threshold comparison and table lookup. Furthermore, it significantly shortens the dead time of the acquisition circuit. Therefore, the digitization method of this application has no dead time or a very short dead time, essentially enabling the processing of continuous pulses.

[0321] Some embodiments of this application dynamically process the amplitude of the pulse under test to determine the channel address into which each pulse falls, thus realizing a scheme for rapid pulse spectrum generation.

[0322] Some embodiments of this application extend the structure of the comparator chain, allowing for flexible adjustment of the number of comparators in each stage and the number of comparison stages according to actual conditions.

[0323] Some embodiments of this application predetermine the comparison range based on pulse characteristics on the basis of comparator chain, and combine pulse characteristics with comparator chain-based methods such as binary division and quaternion expansion methods to pre-divide the pulse into the corresponding energy channel address interval. This is more advantageous in application scenarios of drawing high-precision energy spectra and can effectively shorten the spectrum generation time.

[0324] Some embodiments of this application employ a time-to-threshold (TOT) combined with dynamic threshold spectrum generation, which is more advantageous in applications involving high-precision energy spectrum mapping. It can effectively shorten the spectrum generation time and change the order of voltages compared with the pulse, thus accelerating the acquisition of comparison results overall.

[0325] In some embodiments of this application, considering the possibility of differences between comparators in a multi-level comparator chain, a single-level comparator scheme is adopted. Only one level comparator is needed to obtain the energy spectrum, which can reduce or avoid errors introduced by differences between comparators to a certain extent.

[0326] Some embodiments of this application also provide a step for correcting energy addresses, which further improves the accuracy of energy spectrum plotting using the digital scheme of this application.

[0327] Accordingly, different embodiments of this application may have at least some of the following advantages: 1) Compared with the traditional MVT method, the pulse energy spectrum can be obtained without solving a system of equations to obtain a function curve in the process of pulse signal processing. This simplifies the pulse energy acquisition process and can significantly save hardware resources, reduce FPGA power consumption, and improve the chip's high temperature tolerance when FPGA resources are limited.

[0328] 2) Compared with the ADC method of directly sampling pulses, the energy spectrum can be obtained directly without accumulating the collected voltage values, which simplifies the calculation process.

[0329] 3) Traditional MVT methods require complex fitting calculations, and the system cannot process new pulses for a specific period of time after each pulse ends. This time is called the dead time of the system. The digital scheme of this application embodiment has no dead time or a very small dead time, and can basically complete the processing of continuous pulses.

[0330] Accordingly, embodiments of this application relate to a correction method 3200 for pulse digitization. For example... Figure 32 As shown, the correction method 3200 may include steps S3210-S3280.

[0331] like Figure 32 In the illustrated embodiment, the correction method 3200 may include: S3210: Acquire amplitude-energy mapping data of multiple reference pulses; S3220: Obtain multiple energy channels to be corrected, wherein each energy channel to be corrected has its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; S3230: Based on the comparison results between the amplitude values ​​of the multiple first correction pulses and the amplitude characterization values ​​of the multiple energy addresses to be corrected, determine the energy addresses to be corrected corresponding to the multiple first correction pulses; S3240: Generate the energy spectrum of the first correction pulse based on the first correction pulse count in each energy address to be corrected and the energy characterization value of the energy address to be corrected, wherein the energy spectrum of the first correction pulse has a first characteristic peak. S3250: Set multiple first correction energy addresses; Wherein, the energy range corresponding to the plurality of first corrected energy addresses is smaller than the energy range corresponding to the plurality of energy addresses, and each corrected energy address has its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; S3260: Determine the correction energy address corresponding to the plurality of second correction pulses based on the comparison results between the amplitude magnitudes of the plurality of second correction pulses and the amplitude characterization values ​​of the plurality of first correction energy addresses; S3270: Based on the count of the second correction pulses within each first correction energy address and the energy characterization value of the correction energy address, generate the energy spectrum of the second correction pulse, wherein the energy spectrum of the second correction pulse has a first correction characteristic peak; and S3280: Based on the first difference between the first characteristic peak and the first correction characteristic peak, correct the energy characterization value or amplitude characterization value of the plurality of energy addresses to be corrected.

[0332] In some embodiments, the correction method may be based on a single characteristic peak.

[0333] In another embodiment, the correction method may be based on two or more characteristic peaks. Accordingly, the correction method 3200 may further include: setting a plurality of second correction energy addresses, wherein the energy range corresponding to the plurality of second correction energy addresses is smaller than the energy range corresponding to the plurality of energy addresses to be corrected, each second correction energy address having its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; determining the second correction energy address corresponding to the plurality of third correction pulses by comparing the amplitude magnitudes of the plurality of third correction pulses with the amplitude characterization values ​​of the plurality of second correction energy addresses; and generating the energy spectrum of the third correction pulses based on the third correction pulse counts within each second correction energy address and the energy characterization values ​​of the second correction energy addresses, wherein the energy spectrum of the third correction pulses has a second correction characteristic peak. Accordingly, step S3280 may include: correcting the energy characterization value or amplitude characterization value of the plurality of energy addresses to be corrected based on a first difference between the first characteristic peak and the first correction characteristic peak and a second difference between the second characteristic peak and the second correction characteristic peak.

[0334] In the embodiments of this application, the correction method 3200 may also include, as needed and in an inconsistent manner, the steps or features of the material composition acquisition method, especially such as Figures 26 to 29 The sub-steps or features related to the correction steps shown, or the correction method 3200, can be combined with the material composition acquisition method to obtain new embodiments, or vice versa.

[0335] Furthermore, embodiments of this application may also relate to a method for determining the composition of a substance based on scintillation pulses.

[0336] In different embodiments of this application, the method for determining material composition based on scintillation pulses may employ a digital scheme for determining the address, either independently or in combination with such a scheme.

[0337] In some embodiments, the digitization scheme independent of determining the road address can be combined with, for example, a combination of Figure 20 The structure shown is implemented.

[0338] Combination Figures 20 to 22 ,like Figure 33 In the illustrated embodiment, the material composition determination method 3300 may include steps S3310-S3350: S3310: Provides amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; S3320: Determine the energy window of at least one component in the analyte corresponding to the high-energy radiation; S3330: Determine the scintillation pulse amplitude range corresponding to the at least one component based on the amplitude-energy mapping relationship data and the energy window; S3340: Based on the comparison between the amplitudes of multiple scintillation pulses generated by high-energy rays emitted by the substance under test and the amplitude range, determine the count of scintillation pulses falling within the amplitude range; and S3350: Determine the content of at least one component of the analyte based on the count.

[0339] In some embodiments, there are two components.

[0340] Accordingly, in some embodiments, determining that at least one component in the test substance corresponds to the energy window of the high-energy radiation includes: determining that a first component in the test substance corresponds to a first energy window of the high-energy radiation, and determining that a second component in the test substance corresponds to a second energy window of the high-energy radiation.

[0341] Accordingly, in some embodiments, determining the scintillation pulse amplitude range corresponding to the at least one component based on the amplitude-energy mapping relationship data and the energy window includes: determining a first amplitude range corresponding to the first component based on the amplitude-energy mapping relationship data and the first energy window, and determining a second amplitude range corresponding to the second component based on the amplitude-energy mapping relationship data and the second energy window.

[0342] Accordingly, in some embodiments, determining the count of the scintillation pulse falling within the amplitude range includes: determining a first count and a second count of the scintillation pulse falling within the first amplitude range and the second amplitude range, respectively. Accordingly, in some embodiments, determining the content of at least one component of the analyte based on the counts includes: determining the relative content of the first component and the second component based on the first count and the second count.

[0343] In some embodiments, the first component is carbon (C) and the second component is oxygen (O), wherein the relative content of the first component and the second component is a carbon-oxygen ratio (C / O).

[0344] In such Figure 34 In the illustrated embodiment, the material composition determination method can be implemented in conjunction with a digital scheme for determining road addresses.

[0345] like Figure 34 In the illustrated embodiment, the material composition determination method 3400 may include steps S3410-S3460: S3410: Provides amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; S3420: Set multiple track addresses The channel address is either an energy channel address or an amplitude channel address. Each energy channel address has its own energy characterization value and an amplitude characterization value determined according to the amplitude-energy mapping relationship data. Each amplitude channel address has its own amplitude characterization value. S3430: Based on the comparison results between the amplitude of the multiple scintillation pulses to be tested and the amplitude characterization values ​​of the multiple channel addresses, determine the channel address corresponding to the multiple scintillation pulses to be tested, wherein the multiple scintillation pulses to be tested are generated by high-energy rays emitted by the substance to be tested; S3440: Determine the energy window of at least one component in the analyte corresponding to the high-energy radiation; S3450: Determine the channel address interval corresponding to the energy window based on the amplitude-energy mapping relationship data and the energy window; and S3460: Determine the content of at least one component of the substance to be tested based on the count of the scintillation pulses in each address and the determined address interval.

[0346] In this embodiment, the means for determining the channel address described in the digital method of this application embodiment can be used to determine the component content, but it is not limited to whether to obtain relevant energy information or generate an energy spectrum.

[0347] Accordingly, the method 3400 for determining the composition of substances described in the embodiments of this application can be referred to. Figures 1 to 32 The different embodiments shown determine the channel address to which the flash pulse falls, which falls within the scope of this application.

[0348] In some embodiments, such as reference Figures 2 to 4 Step S3430 may include: sequentially comparing the amplitude of each scintillation pulse to be tested with the comparison thresholds of multiple comparators, and selectively adjusting the amplitude of the scintillation pulse to be tested based on the previous comparison result before comparison, such that if the amplitude of the scintillation pulse to be tested is less than the comparison threshold of the previous comparator, the amplitude of the scintillation pulse to be tested is not adjusted, and if it is greater than or equal to the comparison threshold of the previous comparator, the amplitude of the scintillation pulse to be tested is reduced, wherein the comparison thresholds of the multiple comparators are determined based on the amplitude characterization values ​​of the multiple channel addresses; and determining the channel address corresponding to each scintillation pulse to be tested based on the comparison results of the multiple comparators.

[0349] In some embodiments, such as reference Figure 5 and Figure 6Step S3430 may include: inputting each scintillation pulse to be tested into a multi-stage selector array such that the scintillation pulse to be tested passes sequentially through each stage of the multi-stage selector array, wherein each selector is associated with its own comparator and has a first and second selection branch for selectively outputting the scintillation pulse to be tested, and selectors not in the last stage are connected to two selectors in the next stage through the first and second selection branches respectively, wherein the comparison threshold of the comparator is determined based on the amplitude characterization values ​​of the plurality of channel addresses; before the scintillation pulse to be tested passes through each stage of the selector, comparing the scintillation pulse to be tested with the comparator associated with the selector through which it passes, setting the selector according to the comparison result, and determining the selection branch of the selector that outputs the scintillation pulse to be tested; and determining the channel address corresponding to the scintillation pulse to be tested based on the output of the multi-stage selector array.

[0350] In some embodiments, such as reference Figures 7 to 14 Step S3430 may include: performing a first-level comparison of the amplitude of each scintillation pulse to be tested to determine the channel address interval into which the scintillation pulse to be tested falls, wherein each level of comparison defines at least two channel address intervals by at least one comparison threshold; performing the next level of comparison sequentially to determine the channel address interval into which the scintillation pulse to be tested falls, until the last level of comparison is completed, wherein the comparison threshold of the next level of comparison is determined based on the channel address interval determined by the previous level of comparison; and determining the channel address into which the scintillation pulse to be tested falls based on the result of the last level of comparison.

[0351] In some embodiments, such as reference Figures 10 to 13 The multi-level comparison is implemented by a first multi-level comparison unit, which includes multiple parallel delay lines connected to the input of the flash pulse to be tested, an adjustable comparator connected to the delay lines, and an arbitrator connected to the adjustable comparator, wherein at least some of the delay lines have different delay times.

[0352] In some embodiments, such as reference Figures 10 to 13 The multi-level comparison is implemented by a second multi-level comparison unit, which includes multiple comparator sub-units connected to the input of the flash pulse to be tested and an arbitrator that operates on the multiple comparator sub-units. Each comparator sub-unit corresponds to one of the multi-level comparisons and includes one or more parallel adjustable comparators. A delay is provided between adjacent comparator sub-units.

[0353] In one embodiment, the comparison threshold for the first-level comparison is determined based on a given prior address range.

[0354] In some embodiments, such as reference Figures 23 to 24Step S3430 may include: performing a single-level comparison, which includes multiple comparisons, on the amplitude of each scintillation pulse to be tested to determine the channel address into which the scintillation pulse to be tested falls, wherein the number of multiple comparisons in the single-level comparison is greater than or equal to the number of multiple channel addresses; and determining the channel address into which the scintillation pulse to be tested falls based on the comparison results of the single-level comparison.

[0355] In some embodiments, such as reference Figure 24 Step S3430 may include: providing threshold-crossing time-energy range mapping data for multiple reference scintillation pulses; acquiring at least one threshold-crossing time for the scintillation pulse to be tested, each threshold-crossing time corresponding to an amplitude threshold; determining a first channel address interval based on the at least one threshold-crossing time of the scintillation pulse to be tested and the threshold-crossing time-energy range mapping data; performing a single-level comparison or a multi-level comparison on the amplitude of each scintillation pulse to be tested to determine a second channel address interval in which the scintillation pulse to be tested falls, wherein each level of comparison defines at least two second channel address intervals through at least one comparison threshold, and the comparison threshold of the single-level comparison or the first level comparison threshold of the multi-level comparison is determined based on the first channel address interval; and determining the channel address in which the scintillation pulse to be tested falls based on the results of the single-level or multi-level comparison.

[0356] In some embodiments, such as reference Figures 24 to 25 Step S3430 may include: The system provides threshold-crossing time-energy range mapping data for multiple reference scintillation pulses; acquires at least one threshold-crossing time for a scintillation pulse under test, each threshold-crossing time corresponding to an amplitude threshold; determines a first channel address interval based on the at least one threshold-crossing time and the threshold-crossing time-energy range mapping data for the scintillation pulse under test; performs single-level or multi-level comparisons on the amplitude of each scintillation pulse under test to determine a second channel address interval into which the scintillation pulse under test falls, wherein each level of comparison defines at least two second channel address intervals through at least one comparison threshold, and the comparison threshold for the single-level comparison or the first-level comparison threshold for the multi-level comparison is determined based on the first channel address interval; and determines the channel address into which the scintillation pulse under test falls based on the results of the single-level or multi-level comparisons.

[0357] In other embodiments, such as reference Figure 25 Step S3430 may include: providing threshold-energy range mapping data for multiple reference scintillation pulses; and cyclically executing the following steps: A threshold value is set, and the threshold crossing time of the flicker pulse to be tested is obtained. The threshold crossing time corresponds to the set amplitude threshold value. The first channel address interval is determined or updated based on the threshold crossing time and the threshold crossing time-energy range mapping data of the flicker pulse to be tested. It is determined whether it meets the preset standard. If yes, the loop is exited; if no, the loop steps are continued. The amplitude of each flicker pulse to be tested is compared at a single level or at multiple levels to determine the second channel address interval into which the flicker pulse to be tested falls. Each level of comparison defines at least two second channel address intervals through at least one comparison threshold, and the comparison threshold of the single-level comparison or the first level comparison threshold of the multi-level comparison is determined based on the first channel address interval. The channel address into which the flicker pulse to be tested falls is determined based on the results of the single-level or multi-level comparison.

[0358] In this embodiment of the application, determining that at least one component in the test substance corresponds to the energy window of the high-energy radiation includes: determining that a first component in the test substance corresponds to a first energy window of the high-energy radiation, and determining that a second component in the test substance corresponds to a second energy window of the high-energy radiation.

[0359] In this embodiment of the application, determining the channel address interval corresponding to the energy window based on the amplitude-energy mapping relationship data and the energy window includes: determining the first channel address interval corresponding to the first energy window based on the amplitude-energy mapping relationship data and the first energy window, and determining the second channel address interval corresponding to the second energy window based on the amplitude-energy mapping relationship data and the second energy window.

[0360] In this embodiment of the application, determining the content of at least one component of the substance to be tested based on the count of the scintillation pulses to be tested within each address and the determined address interval includes: determining a first count of the scintillation pulses to be tested within a first address interval; determining a second count of the scintillation pulses to be tested within the first address interval; and determining the relative content of the first component and the second component based on the first count and the second count.

[0361] In the embodiments of this application, the first component is carbon (C) and the second component is oxygen (O), wherein the relative content of the first component and the second component is the carbon-oxygen ratio (C / O).

[0362] In the embodiments of this application, the material composition determination methods 3300 and 3400 may, as needed and in a non-contradictory manner, include the steps or features of the material composition acquisition method, especially as follows: Figures 20 to 22 The sub-steps or features related to the embodiments shown, or the material composition determination methods 3300 and 3400, can be combined with the material composition acquisition method to obtain new embodiments, and vice versa.

[0363] Accordingly, different embodiments of this application may provide a pulse digitization device 3500.

[0364] Figure 35 This is an exemplary block diagram of a pulse digitization device 3500 according to some embodiments of this application. The pulse digitization device 3500 may include a mapping relationship database 3510, including amplitude-energy mapping relationship data of multiple reference pulses, preferably including an amplitude-energy lookup table of the multiple reference pulses; an address setting unit 3520, configured to set multiple addresses, wherein the addresses are energy addresses or amplitude addresses, each energy address having its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data, and each amplitude address having its own amplitude characterization value; an address determination unit 3530, configured to determine the address corresponding to the multiple pulses to be tested based on a comparison result between the amplitude magnitude of the multiple pulses to be tested and the amplitude characterization values ​​of the multiple addresses; and an energy information acquisition unit 3540, configured to obtain the energy information of the multiple pulses to be tested based on the count of the pulses to be tested in each address and the amplitude-energy mapping relationship data or the energy characterization value of the energy address.

[0365] In this embodiment, the channel address determination unit 3530 of the pulse digitization device 3500 can be implemented in various different forms, such as reference Figures 1 to 31 Features of the material composition acquisition methods shown in different embodiments.

[0366] In some embodiments, such as reference Figure 4 The address determination unit 3530 may include multiple comparators, multiple gates, and a processing unit connecting the comparators and gates. The multiple comparators are multi-stage parallel comparators, and the gates are arranged between adjacent comparators. Each gate includes a first gate branch and a second gate branch for selectively outputting the pulse to be tested to the next level comparator. A delay unit is provided in the first gate branch, and a subtractor is provided in the second gate branch.

[0367] In some embodiments, the processing unit may be configured to receive the comparison result output by the superior comparator and set the gate according to the comparison result.

[0368] In some embodiments, the processing unit may be configured to set the reduction value of the subtractor in the gate based on the comparison result.

[0369] In some embodiments, the selector can be configured to output the pulse under test to the first and second selection branches of the next-level comparator according to the output level of the previous-level selector. If the output level of the previous-level comparator is 0, the pulse under test is output to the first selection branch of the next-level comparator; if the output level of the previous-level comparator is 1, the pulse under test is output to the second selection branch of the next-level comparator.

[0370] In some embodiments, the subtractor may be configured to reduce the amplitude of the pulse under test by a reduction value equal to the comparison threshold of the previous comparator.

[0371] In some embodiments, such as reference Figure 6 The address determination unit 3530 may include a multi-stage selector array, each selector being associated with a comparator and including a first selector branch and a second selector branch for selectively outputting the pulse to be tested to the next-stage comparator.

[0372] In some embodiments, such as reference Figure 8 , Figure 10 , Figure 12 , Figure 26 The address determination unit 3530 may include multiple parallel delay lines connected to the pulse input to be tested, an adjustable comparator connected to the delay lines, and an arbitrator operating the adjustable comparator, wherein at least some of the delay lines have different delay times.

[0373] In some embodiments, such as reference Figures 13 to 17 The address determination unit 3530 may include multiple comparator subunits connected to the pulse input to be tested and an arbitrator that operates on the multiple comparator subunits, wherein each comparator subunit corresponds to one of the multi-level comparisons and includes one or more parallel adjustable comparators, and a delay unit is provided between adjacent comparator subunits.

[0374] In some embodiments, the channel address determination unit 3530 may include a plurality of parallel adjustable comparators connected to the pulse input to be tested and an arbitrator operating the plurality of parallel adjustable comparators, wherein the number of the plurality of parallel adjustable comparators is greater than or equal to the number of the plurality of channel addresses.

[0375] In the embodiments of this application, for example, refer to Figures 13 to 17 The arbitrator can be configured to set the comparison threshold of the adjustable comparator based on the amplitude representation value of the set channel address.

[0376] In some embodiments, such as reference Figure 26 and Figure 28 The address determination unit 3530 may include a threshold time unit connected to the pulse input to be tested, a comparison unit connected to the pulse input to be tested, and an arbitrator that operates the threshold time unit and the comparison unit.

[0377] In some embodiments, such as reference Figure 26 and Figure 28 The threshold crossing time unit includes a threshold crossing time comparator and a threshold crossing time acquisition processor connected to the threshold crossing time comparator.

[0378] In some embodiments, the threshold time comparator is configured to output a transition signal when the pulse under test crosses a set amplitude threshold.

[0379] In some embodiments, the threshold crossing time acquisition processor is configured to determine the threshold crossing time based on the time interval between two transition signals from the same threshold crossing time comparator.

[0380] In some embodiments, the arbitrator is configured to determine the first address interval corresponding to the threshold crossing time based on an amplitude-energy lookup table of the plurality of reference pulses.

[0381] In some embodiments, such as reference Figure 28 There are multiple threshold time comparators, and the multiple threshold time comparators are set with different amplitude thresholds for each other.

[0382] In the embodiments of this application, the pulse digitization device 3500 can be used to implement the material composition acquisition method 100 or the methods described in other embodiments herein, and can be selectively combined with features of the material composition acquisition method 100 or other methods, or vice versa.

[0383] Accordingly, different embodiments of this application may provide a correction device 3600.

[0384] Figure 35This is an exemplary block diagram of a correction device 3600 according to some embodiments of this application. The correction device 3600 may include: a first acquisition unit 3610 configured to acquire amplitude-energy mapping relationship data of a plurality of reference pulses; a second acquisition unit 3620 configured to acquire a plurality of energy addresses to be corrected, wherein each energy address to be corrected has its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; a first address determination unit 3630 configured to determine the energy address to be corrected corresponding to the plurality of first correction pulses by comparing the amplitude magnitudes of the plurality of first correction pulses with the amplitude characterization values ​​of the plurality of energy addresses to be corrected; a first energy spectrum generation unit 3640 configured to generate an energy spectrum of the first correction pulses based on the count of the first correction pulses within each energy address to be corrected and the energy characterization value of the energy address to be corrected, wherein the energy spectrum of the first correction pulse has a first characteristic peak value; and a first correction address setting unit 3650 configured to set a plurality of first correction energy addresses. The energy range corresponding to the plurality of first corrected energy addresses is smaller than the energy range corresponding to the plurality of energy addresses. Each corrected energy address has its own energy characterization value and an amplitude characterization value determined according to the amplitude-energy mapping relationship data. The second address determination unit 3660 is configured to determine the corrected energy address corresponding to the plurality of second corrected pulses based on the comparison result between the amplitude magnitude of the plurality of second corrected pulses and the amplitude characterization values ​​of the plurality of first corrected energy addresses. The second energy spectrum generation unit 3670 is configured to generate the energy spectrum of the second corrected pulse based on the count of the second corrected pulses in each first corrected energy address and the energy characterization value of the corrected energy address. The energy spectrum of the second corrected pulse has a first corrected characteristic peak. The correction unit 3680 is configured to correct the energy characterization value or amplitude characterization value of the plurality of energy addresses to be corrected based on the first difference between the first characteristic peak and the first corrected characteristic peak.

[0385] Optionally, the correction device 3600 may further include: a second correction address setting unit configured to set a plurality of second correction energy addresses, wherein the energy range corresponding to the plurality of second correction energy addresses is smaller than the energy range corresponding to the plurality of energy addresses to be corrected, and each second correction energy address has its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data; a third address determination unit configured to determine the second correction energy address corresponding to the plurality of third correction pulses based on a comparison between the amplitude magnitude of the plurality of third correction pulses and the amplitude characterization values ​​of the plurality of second correction energy addresses; and a third energy spectrum generation unit configured to generate the energy spectrum of the third correction pulses based on the count of the third correction pulses in each second correction energy address and the energy characterization value of the second correction energy address, wherein the energy spectrum of the third correction pulses has a second correction characteristic peak.

[0386] Optionally, the correction unit 3600 is further configured to correct the energy characterization value or amplitude characterization value of the plurality of energy addresses to be corrected based on a first difference between the first characteristic peak and the first correction characteristic peak and a second difference between the second characteristic peak and the second correction characteristic peak.

[0387] In the embodiments of this application, the correction device 3600 can be used to implement the correction method 2900 or the method described in other embodiments herein, and can selectively combine features of the correction method 2900 or other methods, or vice versa.

[0388] Accordingly, different embodiments of this application may provide a material composition determination device 3700, 3800.

[0389] like Figure 37 As shown, the material composition determination device 3700 may include: a mapping relationship database 3710, including amplitude-energy mapping relationship data of reference scintillation pulses generated by high-energy rays; an energy window determination unit 3720, configured to determine the energy window of the high-energy rays corresponding to at least one component in the analyte; an amplitude range determination unit 3730, configured to determine the amplitude range of the scintillation pulses corresponding to the at least one component based on the amplitude-energy mapping relationship data and the energy window; a counting unit 3740, configured to determine the count of scintillation pulses falling into the amplitude range based on the comparison result of the amplitude of multiple scintillation pulses generated by the high-energy rays emitted by the analyte and the amplitude range; and a content determination unit 3750, configured to determine the content of the at least one component in the analyte based on the count.

[0390] In some embodiments, the energy window determination unit in the material composition determination device 3700 is configured to determine a first energy window of the first component of the substance to be tested corresponding to the high-energy radiation and a second energy window of the second component of the substance to be tested corresponding to the high-energy radiation.

[0391] In some embodiments, the amplitude range determination unit in the material composition determination device 3700 includes a first amplitude determination subunit and a second amplitude determination subunit, configured to determine the first scintillation pulse amplitude range and the second scintillation pulse amplitude range corresponding to the first component and the second component based on the amplitude-energy mapping relationship data and the first energy window and the second energy window.

[0392] In one embodiment, the counting unit in the material composition determination device 3700 further includes: a first comparison subunit configured to determine whether the flash pulse to be tested falls within the first flash pulse amplitude range based on a comparison between the amplitude of the flash pulse to be tested and the amplitude range of the first flash pulse; and a second comparison subunit configured to determine whether the flash pulse to be tested falls within the second flash pulse amplitude range based on a comparison between the amplitude of the flash pulse to be tested and the amplitude range of the second flash pulse.

[0393] In a further embodiment, the first comparison subunit in the material composition determination device 3700 includes a first comparator and a second comparator, wherein the first comparator sets a comparison threshold based on the lower limit of the amplitude range corresponding to the first energy window, and the second comparator sets a comparison threshold based on the upper limit of the amplitude range corresponding to the first energy window; and the second comparison subunit includes a third comparator and a fourth comparator, wherein the third comparator sets a comparison threshold based on the lower limit of the amplitude range corresponding to the second energy window, and the fourth comparator sets a comparison threshold based on the upper limit of the amplitude range corresponding to the second energy window.

[0394] In other embodiments, the material composition determination device 3700 further includes a correction unit configured to acquire the operating temperature of the comparator, determine the comparison threshold deviation of the comparator at the operating temperature based on prior information, and correct the comparison threshold of the comparator based on the comparison threshold deviation.

[0395] like Figure 37 As shown, the material composition determination device 3800 may include: a mapping relationship database 3810, including amplitude-energy mapping relationship data of reference scintillation pulses generated by high-energy rays; a channel address setting unit 3820, configured to set multiple channels, wherein the channels are energy channels or amplitude channels, each energy channel address having its own energy characterization value and an amplitude characterization value determined accordingly based on the amplitude-energy mapping relationship data, and each amplitude channel address having its own amplitude characterization value; and a channel address determination unit 3830, configured to compare the amplitude magnitude of multiple scintillation pulses to be measured with the amplitude characterization values ​​of the multiple channels. As a result, the channel addresses corresponding to the plurality of scintillation pulses to be tested are determined, the plurality of scintillation pulses to be tested being generated by high-energy rays emitted by the substance to be tested; the energy window determination unit 3840 is configured to determine the energy window of the high-energy rays corresponding to at least one component in the substance to be tested; the channel address interval determination unit 3850 is configured to determine the channel address interval corresponding to the energy window based on the amplitude-energy mapping relationship data and the energy window; and the content determination unit 3860 is configured to determine the content of the at least one component in the substance to be tested based on the count of scintillation pulses to be tested in each channel address and the determined channel address interval.

[0396] In some embodiments, the address determination unit in the material composition determination device 3800 may include a plurality of comparators, a plurality of gates, and a processing unit connecting the comparators and the gates. The plurality of comparators are multi-stage parallel comparators, and the gates are arranged between adjacent comparators. Each gate includes a first gate branch and a second gate branch for selectively outputting the scintillation pulse to be tested to the next level comparator. A delay unit is provided in the first gate branch, and a subtractor is provided in the second gate branch.

[0397] In some embodiments, the address determination unit in the material composition determination apparatus 3800 may include a plurality of parallel delay lines connected to the scintillation pulse input to be tested, an adjustable comparator connected to the delay lines, and an arbitrator operating the adjustable comparator, wherein at least some of the delay lines have different delay times.

[0398] In some embodiments, the address determination unit in the material composition determination device 3800 may include a plurality of comparator subunits connected to the scintillation pulse input to be tested and an arbitrator operating the plurality of comparator subunits, wherein each comparator subunit corresponds to one of the multi-level comparisons and includes one or more parallel adjustable comparators, and a delay unit is provided between adjacent comparator subunits.

[0399] In another embodiment, the address determination unit in the material composition determination device 3800 may include a threshold time unit connected to the scintillation pulse input to be tested, a comparison unit connected to the scintillation pulse input to be tested, and an arbitrator that operates the threshold time unit and the comparison unit.

[0400] In the embodiments of this application, the material composition determination apparatus 3700, 3800 can be used to implement the material composition determination method 3300, 3400 or the method described in other embodiments herein, and can selectively combine features of the material composition determination method 3300, 3400 or other methods, and vice versa.

[0401] In the embodiments of this application, the pulse digitization device 3500 may also include components or features of the correction device 3600 and / or the material composition determination device 3700, 3800 in a non-contradictory manner as needed, or the pulse digitization device 3500 may be combined with the correction device 3600 and / or the material composition determination device 3700, 3800 to obtain new embodiments, and vice versa.

[0402] It should be noted that the descriptions of the various steps in the accompanying drawings are merely illustrative and do not limit the scope of this application. Those skilled in the art can make various modifications and changes to the steps in the relevant drawings under the guidance of this application. However, these modifications and changes are still within the scope of this application.

[0403] It should be understood that the methods and apparatus described and implemented in the embodiments of this application can be implemented by different systems and their modules. For example, in some embodiments, the system and its modules can be implemented by hardware, software, or a combination of software and hardware. The hardware portion can be implemented using dedicated logic; the software portion can be stored in memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated hardware. Those skilled in the art will understand that the above-described methods and systems can be implemented using computer-executable instructions and / or included in processor control code, for example, such code provided on a carrier medium such as a disk, CD, or DVD-ROM, a programmable memory such as read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The systems and modules of this application can be implemented not only by hardware circuits such as very large-scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, or programmable hardware devices such as field-programmable gate arrays, programmable logic devices, etc., but also by software executed by various types of processors, or by a combination of the above-described hardware circuits and software (e.g., firmware).

[0404] It should be noted that the above description of the modules is for convenience only and should not be construed as limiting this application to the scope of the embodiments described. It is understood that those skilled in the art, after understanding the principle of the system, may arbitrarily combine the modules or construct subsystems connected to other modules without departing from this principle. For example, the data acquisition module and the threshold switching module may be the same comparison module. Another example is that the sampling module may also include a comparison module. Yet another example is that the modules may share a single storage module, or each module may have its own separate storage module. Such variations are all within the scope of protection of this application.

[0405] In some embodiments, this application also provides a digitizing device, which may include the digitizing apparatus mentioned in the above embodiments. This digitizing device can be used to acquire corresponding pulse signals, such as scintillation pulse data, and generate the required energy information, such as energy spectrum. In one specific example, the pulse digitizing device provided in this application can be applied to well logging technology, for example, as a nuclear well logging device. In another specific example, the pulse digitizing device provided in this application can be applied to positron emission tomography (PET). In a PET system, gamma photon data can be acquired using the scheme described in the embodiments of this application, followed by image reconstruction. In other specific examples of this application, the pulse digitizing device provided in this application can be applied to various digitizing devices, such as CT equipment, MRI equipment, radiation detection equipment, oil exploration equipment, low-light detection equipment, SPECT equipment, security inspection equipment, gamma cameras, X-ray equipment, DR equipment, and other devices utilizing the principle of high-energy ray conversion, as well as one or a combination of other photoelectric conversion application devices.

[0406] Although not shown, some embodiments also provide an electronic device characterized by comprising: a memory, a processor, and an executable program stored in the memory and executable on the processor, wherein the executable program, when executed by the processor, implements the steps of the method described in any embodiment of this application.

[0407] Although not shown, some embodiments also provide a storage medium storing an executable program configured to, when executed, implement the steps of the method described in any of the embodiments of this application. The executable program includes various program modules / units constituting the apparatus according to the embodiments of this application, and the computer program composed of these program modules / units, when executed, can perform the functions corresponding to the various steps in the methods described in the above embodiments. The executable program can also run on an electronic device as described in the embodiments of this application.

[0408] The basic concepts have been described herein. It is obvious that the detailed disclosure above is merely illustrative and does not constitute a limitation of this application. Although not explicitly stated herein, various modifications, improvements, and corrections may be made to this application by those skilled in the art. Such modifications, improvements, and corrections are suggested in this application and therefore remain within the spirit and scope of the exemplary embodiments of this application.

[0409] Furthermore, this application uses specific terms to describe its embodiments. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic related to at least one embodiment of this application. Therefore, it should be emphasized and noted that "an embodiment," "one embodiment," or "an alternative embodiment" mentioned twice or more in different locations in this application do not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of this application can be appropriately combined.

[0410] Furthermore, those skilled in the art will understand that aspects of this application can be described and illustrated through several patentable types or situations, including any new and useful combination of processes, machines, products, or substances, or any new and useful improvements thereof. Accordingly, aspects of this application can be implemented entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. All of the above hardware or software may be referred to as “data block,” “module,” “engine,” “unit,” “component,” or “system.” Furthermore, aspects of this application may be presented as products located on one or more readable media, including readable program code.

[0411] The storage medium may contain a propagated data signal with program encoding, for example, on baseband or as part of a carrier wave. This propagated signal may take various forms, including electromagnetic, optical, or suitable combinations thereof. The storage medium can be any readable medium other than a readable storage medium, which can be connected to an instruction execution system, apparatus, or device to enable communication, propagation, or transmission of a program for use. The program encoding located on the storage medium can be propagated through any suitable medium, including radio, cable, fiber optic cable, RF, or similar media, or any combination of the above media.

[0412] Furthermore, unless expressly stated in the claims, the order of processing elements and sequences, the use of numbers and letters, or other names described in this application are not intended to limit the order of the processes and methods of this application. Although the foregoing disclosure has discussed some currently considered useful embodiments of the invention through various examples, it should be understood that such details are for illustrative purposes only, and the appended claims are not limited to the disclosed embodiments; rather, the claims are intended to cover all modifications and equivalent combinations that conform to the substance and scope of the embodiments of this application. For example, while the system components described above can be implemented using hardware devices, they can also be implemented solely through software solutions, such as installing the described system on existing servers or mobile devices.

[0413] Similarly, it should be noted that, in order to simplify the description of the present application and thus aid in the understanding of one or more embodiments of the invention, the foregoing description of the embodiments of the present application sometimes combines multiple features into a single embodiment, drawing, or description thereof. However, this disclosure method does not imply that the subject matter of the application requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of the single embodiments disclosed above.

[0414] In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used in the description of embodiments are modified in some examples with the terms "approximately," "approximately," or "generally." Unless otherwise stated, "approximately," "approximately," or "generally" indicates that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and claims are approximate values, which may be changed depending on the characteristics required by individual embodiments. In some embodiments, numerical parameters should take into account specified significant digits and employ a general method of digit reservation. Although the numerical ranges and parameters used to confirm their breadth of scope in some embodiments of this application are approximate values, in specific embodiments, such values ​​are set as precisely as feasible.

[0415] For each patent, patent application, patent application publication, and other material such as articles, books, specifications, publications, and documents referenced in this application, the entire contents of that material are incorporated herein by reference. This excludes historical application documents that are inconsistent with or conflict with the content of this application, as well as documents that limit the broadest scope of the claims in this application (currently or subsequently appended to this application). It should be noted that if there is any inconsistency or conflict between the descriptions, definitions, and / or terminology used in the supplementary materials of this application and the content of this application, the descriptions, definitions, and / or terminology used in this application shall prevail.

[0416] Finally, it should be understood that the embodiments described in this application are merely illustrative of the principles of the embodiments of this application. Other modifications may also fall within the scope of this application. Therefore, alternative configurations of the embodiments of this application are considered as examples and not limitations, and are regarded as consistent with the teachings of this application. Accordingly, the embodiments of this application are not limited to the embodiments explicitly described and illustrated in this application.

Claims

1. A method for determining the composition of a substance, characterized in that, The method for determining the composition of the substance includes: Provides amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; Multiple channel addresses are set, wherein the channel address is an energy channel address or an amplitude channel address, each energy channel address has its own energy characterization value and an amplitude characterization value determined according to the amplitude-energy mapping relationship data, and each amplitude channel address has its own amplitude characterization value. Based on the comparison results between the amplitude of multiple scintillation pulses to be tested and the amplitude characterization values ​​of the multiple channel addresses, the channel addresses corresponding to the multiple scintillation pulses to be tested are determined. Determine the energy window of the high-energy rays corresponding to at least one component in the substance to be tested; Based on the amplitude-energy mapping data and the energy window, the channel address interval corresponding to the energy window is determined; and The content of at least one component of the substance to be tested is determined based on the count of the scintillation pulses within each address and the determined address interval.

2. The method for determining the composition of a substance according to claim 1, characterized in that, Determining the energy window of at least one component in the analyte corresponding to the high-energy radiation includes: The first and second components in the analyte are determined to correspond to the first and second energy windows of the high-energy radiation, respectively. Determining the channel address interval corresponding to the energy window based on the amplitude-energy mapping relationship data and the energy window includes: Based on the amplitude-energy mapping relationship data and the first energy window and the second energy window, the first address interval corresponding to the first energy window and the second address interval corresponding to the second energy window are determined respectively. Determining the content of at least one component of the substance to be tested based on the count of the scintillation pulses to be tested within each address and the determined address interval includes: determining a first count of the scintillation pulses to be tested within a first address interval; The second count of the scintillation pulses to be measured within the first address interval is determined; and The relative content of the first component and the second component is determined based on the first count and the second count.

3. The method for determining the composition of a substance according to claim 1 or 2, characterized in that, Based on the comparison results between the amplitude values ​​of multiple scintillation pulses under test and the amplitude characterization values ​​of the multiple channel addresses, the channel addresses corresponding to the multiple scintillation pulses under test are determined, including: The amplitude of each scintillation pulse to be tested is compared sequentially with the comparison thresholds of multiple comparators, and the amplitude of the scintillation pulse to be tested is selectively adjusted based on the previous comparison result before comparison. Based on the comparison results of multiple comparators, the channel address corresponding to each scintillation pulse under test is determined.

4. The method for determining the composition of a substance according to claim 3, characterized in that, The selective adjustment of the amplitude of the scintillation pulse under test based on the previous comparison result includes: If the amplitude of the flicker pulse to be tested is less than the comparison threshold of the previous comparator, then the amplitude of the flicker pulse to be tested will not be adjusted. If the amplitude of the scintillation pulse to be tested is greater than or equal to the comparison threshold of the previous comparator, then the amplitude of the scintillation pulse to be tested is reduced, wherein the comparison thresholds of the plurality of comparators are determined based on the amplitude characterization values ​​of the plurality of channel addresses.

5. The method for determining the material composition according to claim 1, wherein the channel address corresponding to the plurality of scintillation pulses is determined by comparing the amplitude magnitudes of the plurality of scintillation pulses to be tested with the amplitude characterization values ​​of the plurality of channel addresses, comprising: Each scintillation pulse to be tested is input into a multi-stage selector array such that the scintillation pulse to be tested passes sequentially through each stage of the multi-stage selector array, wherein each selector is associated with its own comparator and has a first and second selection branch for selectively outputting the scintillation pulse to be tested; selectors not in the last stage are connected to the two selectors of the next stage through the first and second selection branches respectively; wherein the comparison threshold of the comparator is determined based on the amplitude characterization values ​​of the plurality of channel addresses. Before the scintillation pulse to be tested passes through each stage of the gate, the scintillation pulse to be tested is compared with the comparator associated with the gate that it passes through. The gate is set according to the comparison result, and the selection branch of the gate that outputs the scintillation pulse to be tested is determined. as well as The channel address corresponding to the scintillation pulse under test is determined based on the output of the multi-stage selector array.

6. The method for determining the material composition according to claim 1, wherein the channel address corresponding to the plurality of scintillation pulses is determined by comparing the amplitude magnitudes of the plurality of scintillation pulses to be tested with the amplitude characterization values ​​of the plurality of channel addresses, comprising: The amplitude of each scintillation pulse to be tested is compared in multiple stages. The first stage of comparison determines the channel address interval into which the scintillation pulse to be tested falls. Each stage of comparison defines at least two channel address intervals through at least one comparison threshold. The next level of comparison is performed sequentially to determine the channel address interval into which the scintillation pulse to be tested falls, until the last level of comparison is completed. The comparison threshold for each subsequent level of comparison is determined based on the channel address interval determined by the previous level of comparison; and The channel address into which the scintillation pulse to be tested falls, determined based on the results of the last-stage comparison.

7. The method for determining the composition of a substance according to claim 6, characterized in that, The multi-level comparison is implemented by a first multi-level comparison unit, which includes multiple parallel delay lines connected to the input of the flash pulse to be tested, an adjustable comparator connected to the delay lines, and an arbitrator that operates on the adjustable comparator, wherein at least some of the delay lines have different delay times.

8. The method for determining the composition of a substance according to claim 6, characterized in that, The multi-level comparison is implemented by a second multi-level comparison unit, which includes multiple comparator sub-units connected to the input of the flash pulse to be tested and an arbitrator that operates on the multiple comparator sub-units. Each comparator sub-unit corresponds to one of the multi-level comparisons and includes one or more parallel adjustable comparators. A delay is provided between adjacent comparator sub-units.

9. The method for determining the composition of a substance according to claim 6, characterized in that, The comparison threshold for the first-level comparison is determined based on a given prior address range.

10. The method for determining the composition of a substance according to claim 1, wherein the channel address corresponding to the plurality of scintillation pulses is determined by comparing the amplitude magnitudes of the plurality of scintillation pulses to be tested with the amplitude characterization values ​​of the plurality of channel addresses, comprising: The amplitude of each scintillation pulse to be tested is subjected to a single-stage comparison, which includes multiple comparisons, to determine the channel address to which the scintillation pulse to be tested falls. The number of multiple comparisons in the single-stage comparison is greater than or equal to the number of multiple channel addresses. The channel address into which the scintillation pulse falls is determined based on the comparison result of the single-level comparison.

11. The method for determining the composition of a substance according to claim 10, characterized in that, Based on the comparison results between the amplitude values ​​of multiple scintillation pulses under test and the amplitude characterization values ​​of the multiple channel addresses, the channel addresses corresponding to the multiple scintillation pulses under test are determined, including: Provides threshold-energy range mapping data for multiple reference scintillation pulses; Obtain at least one threshold crossing time of the flicker pulse to be tested, and each threshold crossing time corresponds to an amplitude threshold. The first address interval is determined based on the at least one threshold crossing time and the threshold crossing time-energy range mapping data of the scintillation pulse to be tested; The amplitude of each scintillation pulse under test is compared in a single-level or multi-level manner to determine the second address interval into which the scintillation pulse falls. Each level of comparison defines at least two second address intervals using at least one comparison threshold, and the comparison threshold for the single-level comparison or the first-level comparison threshold for the multi-level comparison is determined based on the first address interval. The channel address into which the scintillation pulse to be tested falls, determined based on the results of the single-level or multi-level comparison.

12. The method for determining the composition of a substance according to claim 10, characterized in that, Based on the comparison results between the amplitude values ​​of multiple scintillation pulses under test and the amplitude characterization values ​​of the multiple channel addresses, the channel addresses corresponding to the multiple scintillation pulses under test are determined, including: Provides threshold-energy range mapping data for multiple reference scintillation pulses; Repeat the following steps: Set a threshold value. Obtain the threshold crossing time of the flicker pulse to be tested, wherein the threshold crossing time corresponds to a set amplitude threshold. The first address interval is determined or updated based on the threshold crossing time and the threshold crossing time-energy range mapping data of the scintillation pulse under test. Determine if the preset criteria are met. If yes, exit the loop; otherwise, continue executing the loop steps. The amplitude of each scintillation pulse under test is compared in a single-level or multi-level manner to determine the second address interval into which the scintillation pulse falls. Each level of comparison defines at least two second address intervals using at least one comparison threshold, and the comparison threshold for the single-level comparison or the first-level comparison threshold for the multi-level comparison is determined based on the first address interval. The channel address into which the scintillation pulse to be tested falls, determined based on the results of the single-level or multi-level comparison.

13. A device for determining the composition of a substance, characterized in that, The material composition determination device includes: A mapping database, including amplitude-energy mapping data for reference scintillation pulses generated by high-energy rays; The channel address setting unit is configured to set multiple channels, wherein the channels are energy channels or amplitude channels, each energy channel has its own energy characterization value and an amplitude characterization value determined according to the amplitude-energy mapping relationship data, and each amplitude channel has its own amplitude characterization value. The channel address determination unit is configured to determine the channel address corresponding to the multiple scintillation pulses under test by comparing the amplitude magnitude of the multiple scintillation pulses under test with the amplitude characterization values ​​of the multiple channel addresses; An energy window determination unit is configured to determine the energy window of at least one component in the analyte corresponding to the high-energy radiation. The channel address interval determination unit is configured to determine the channel address interval corresponding to the energy window based on the amplitude-energy mapping relationship data and the energy window; and The content determination unit is configured to determine the content of at least one component of the substance to be tested based on the count of scintillation pulses in each address and the determined address interval.

14. The material composition determining apparatus according to claim 13, characterized in that, The address determination unit includes multiple comparators, multiple gates, and a processing unit connecting the comparators and gates. The multiple comparators are multi-stage parallel comparators, and the gates are arranged between adjacent comparators. Each gate includes a first gate branch and a second gate branch for selectively outputting the scintillation pulse to be tested to the next level comparator. A delay unit is provided in the first gate branch, and a subtractor is provided in the second gate branch.

15. The material composition determining apparatus according to claim 13, characterized in that, The address determination unit includes multiple parallel delay lines connected to the input of the scintillation pulse to be tested, an adjustable comparator connected to the delay lines, and an arbitrator that operates on the adjustable comparator, wherein at least some of the delay lines have different delay times.

16. The material composition determining apparatus according to claim 13, characterized in that, The channel address determination unit includes multiple comparator subunits connected to the scintillation pulse input to be tested and an arbitrator that operates on the multiple comparator subunits. Each comparator subunit corresponds to one of the multi-level comparisons and includes one or more parallel adjustable comparators. A delay unit is provided between adjacent comparator subunits.

17. The material composition determining apparatus according to claim 13, characterized in that, The address determination unit includes a threshold time unit connected to the input of the scintillation pulse to be tested, a comparison unit connected to the input of the scintillation pulse to be tested, and an arbitrator that operates the threshold time unit and the comparison unit.

18. An electronic device, characterized in that, include: The memory, the processor, and the executable program stored in the memory and executable on the processor, wherein the executable program, when executed by the processor, implements the steps of the method for determining the composition of a substance as described in any one of claims 1 to 12.

19. A storage medium, characterized in that, An executable program is stored on the storage medium, which, when executed by a processor, implements the steps of the method for determining the composition of a substance as described in any one of claims 1 to 12.

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