Substrate classification methods, apparatus, electronic devices and storage media

Abstract

This application provides a method, apparatus, electronic device, and storage medium for classifying substrates. The method includes obtaining reference dimensions of multiple shrinkable substrates and obtaining shrinkage values ​​for each shrinkable substrate; obtaining shrinkage correction parameters for each shrinkable substrate based on the shrinkage values; determining correction dimensions for each shrinkable substrate based on the reference dimensions and the correction parameters; dividing the correction dimensions into multiple shrinkage correction intervals; and classifying the shrinkable substrates according to the shrinkage correction intervals. This allows shrinkable substrates belonging to the same shrinkage correction interval to be grouped into the same category, enabling rapid classification of each shrinkable substrate and improving the efficiency of substrate stacking. Furthermore, shrinkable substrates located in the same shrinkage correction interval can be printed using the same printing screen.

Description

Technical Field

[0001] This application relates to the field of display device technology, and in particular to a method, apparatus, electronic device and storage medium for classifying substrates. Background Technology

[0002] Mini-LED technology plays an important role in the realization of high dynamic range (HDR) image sensors and full-screen displays. As an important component of the Mini-LED backlight module, the substrate generally requires the use of a stencil to print solder on it during the die bonding process. However, due to the different expansion and contraction of Mini-LED substrates, it is often necessary to stack the substrates to classify them, so that each stack corresponds to a different stencil.

[0003] However, currently, the standards for substrate stacking in the die bonding section are not uniform, resulting in low stacking efficiency. Moreover, the existing substrate stacking methods often lead to the printing stencils failing to achieve effective substrate coverage, resulting in a large number of printing stencils that need to be made through molds, which in turn leads to high manufacturing costs for MiniLED light boards. Summary of the Invention

[0004] This application provides a method, apparatus, electronic device, and storage medium for classifying substrates to solve the problem of high manufacturing costs for light boards.

[0005] On one hand, this application provides a method for classifying substrates, including: Obtain reference dimensions for multiple expansion and contraction substrates and obtain individual expansion and contraction values ​​for each of the expansion and contraction substrates; The expansion and contraction correction parameters for each substrate are obtained based on the expansion and contraction values. The correction dimensions of each expansion / contraction substrate are determined based on the reference dimensions and each of the expansion / contraction correction parameters; Each of the aforementioned correction dimensions is divided into multiple expansion and contraction correction intervals; Each substrate is classified according to its respective expansion / contraction correction range.

[0006] In one possible implementation of this application, each of the expansion and contraction substrates includes two first horizontal edges and two first vertical edges connected to each other, the expansion and contraction correction parameters include horizontal edge correction parameters and vertical edge correction parameters, and the correction dimensions include horizontal edge equivalent dimensions and vertical edge equivalent dimensions. The step of obtaining reference dimensions for multiple expansion and contraction substrates and obtaining expansion and contraction values ​​for each of the expansion and contraction substrates includes: Obtain the theoretical lengths of the first horizontal edge and the first vertical edge respectively; The actual lengths of the two first horizontal edges and two first vertical edges of the expansion and contraction substrate are obtained respectively. Determining the correction dimension of each expansion / contraction substrate based on the reference dimension and each of the expansion / contraction correction parameters includes: Based on the theoretical length of the first horizontal side and the various horizontal side correction parameters, multiple equivalent dimensions of the horizontal side are obtained, and based on the theoretical length of the first vertical side and the various vertical side correction parameters, multiple equivalent dimensions of the vertical side are obtained.

[0007] In one possible implementation of this application, determining the various correction dimensions of the expansion / contraction substrate based on the reference dimension and the various expansion / contraction correction parameters includes: Calculate the difference between the actual length of each of the two first horizontal sides and the theoretical length of the corresponding first horizontal side, and calculate the difference between the actual length of each of the two first vertical sides and the theoretical length of the corresponding first vertical side. If both the difference between the horizontal side and the difference between the vertical side are less than or equal to a preset error threshold, then the equivalent size of the horizontal side is obtained based on the actual lengths of the two first horizontal sides and the horizontal side correction parameter, and the equivalent size of the vertical side is obtained based on the actual lengths of the two first vertical sides and the vertical side correction parameter.

[0008] In one possible implementation of this application, the expansion and contraction substrate is a polygonal structure, and the expansion and contraction substrate includes multiple geometric vertices and multiple connecting edges; The process of obtaining the expansion and contraction values ​​of each expansion and contraction substrate includes: In each of the expansion and contraction substrates, any one of the geometric vertices is selected as the origin to establish a rectangular coordinate system in order to obtain the coordinate data of each of the geometric vertices; The expansion / contraction values ​​of each connecting edge are obtained based on the coordinate data of the geometric vertices.

[0009] In one possible implementation of this application, the expansion and contraction substrate is a rectangular structure, the plurality of connecting sides include two first horizontal sides, and the plurality of geometric vertices include a first vertex, a second vertex, a third vertex, and a fourth vertex; The first vertex and the second vertex, the fourth vertex and the third vertex respectively form a first horizontal side; The expansion / contraction correction parameters include the lateral edge correction parameters; The step of obtaining the expansion / contraction correction parameters for each expansion / contraction substrate based on each expansion / contraction value includes: Obtain the coordinates of the first geometric vertex, the second geometric vertex, the third geometric vertex, and the fourth geometric vertex of the expansion and contraction substrate, wherein the coordinates of the first geometric vertex are the coordinates of the origin. The first difference is obtained based on the difference between the x-coordinate values ​​of the third vertex and the second vertex; Half of the sum of the first difference and the second vertex x-coordinate value is used as the lateral edge correction parameter of the expansion and contraction substrate.

[0010] In one possible implementation of this application, the plurality of connecting edges further includes two first vertical edges, wherein the first vertex and the fourth vertex, the second vertex and the third vertex respectively constitute a first vertical edge; The expansion / contraction correction parameters also include longitudinal edge correction parameters; The step of obtaining the expansion / contraction correction parameters for each expansion / contraction substrate based on each expansion / contraction value includes: The second difference is obtained based on the difference between the ordinate values ​​of the third vertex and the fourth vertex; The second difference and half of the sum of the second vertex x-coordinate value are used as the longitudinal edge correction parameter of the expansion and contraction substrate.

[0011] In one possible implementation of this application, after classifying each of the expansion and contraction substrates according to each of the expansion and contraction correction intervals, the method further includes: The target size is determined based on the expansion and contraction correction range, and the target size is used as the manufacturing size of the printing screen.

[0012] In one possible implementation of this application, the expansion and contraction substrate is a rectangular structure, the plurality of connecting sides include two first horizontal sides and two first vertical sides, and the expansion and contraction correction interval includes a horizontal side correction interval and a vertical side correction interval. The target size is determined based on the expansion and contraction correction range, and the target size is used as the manufacturing size of the printing screen, including: Select a target horizontal edge interval from among the plurality of horizontal edge correction intervals, and select a target vertical edge interval from among the plurality of vertical edge correction intervals; A target horizontal side dimension is determined based on the target horizontal side interval, and a target vertical side dimension is determined based on the target vertical side interval; The target horizontal side dimension is used as the horizontal side manufacturing dimension of the printing screen, and the target vertical side dimension is used as the vertical side manufacturing dimension of the printing screen.

[0013] On the other hand, this application provides a substrate sorting device, comprising: The acquisition module is used to acquire the reference dimensions of multiple expansion and contraction substrates and to acquire the expansion and contraction values ​​of each expansion and contraction substrate. The first processing module is used to obtain the expansion and contraction correction parameters of each expansion and contraction substrate according to each expansion and contraction value, and to determine each correction dimension of the expansion and contraction substrate according to the reference dimension and each expansion and contraction correction parameter. The second processing module is used to divide each of the correction dimensions into multiple expansion and contraction correction intervals, and to classify each of the expansion and contraction substrates according to each of the expansion and contraction correction intervals.

[0014] On the other hand, this application provides an electronic device, which includes: One or more processors; Memory; and One or more applications, wherein the applications are stored in memory and configured to be executed by a processor to implement the above-described substrate classification method.

[0015] On the other hand, this application provides a computer-readable storage medium having a computer program stored thereon, which is loaded by a processor to perform the steps of the above-described substrate classification method.

[0016] This application provides a method, apparatus, electronic device, and storage medium for classifying substrates. By acquiring reference dimensions of multiple expandable / contractable substrates and obtaining expansion / contraction values ​​for each substrate, expansion / contraction correction parameters are obtained for each substrate based on these values. Corrected dimensions for each substrate are determined based on the reference dimensions and correction parameters. These corrected dimensions are then divided into multiple expansion / contraction correction intervals. The substrates are classified according to these intervals. This allows substrates belonging to the same correction interval to be grouped together based on their corrected dimensions, enabling rapid classification and improving substrate stacking efficiency. Furthermore, substrates within the same correction interval can be printed on the same screen, improving printing accuracy, reducing the number of printing plates required, and ultimately saving manufacturing costs. Attached Figure Description

[0017] The technical solution and other beneficial effects of this application will become apparent from the following detailed description of specific embodiments in conjunction with the accompanying drawings.

[0018] Figure 1 This is a schematic diagram of the architecture of the substrate classification system in the embodiments of this application. Figure 2 This is a schematic diagram of the fabrication process of the substrate classification method provided in the embodiments of this application.

[0019] Figure 3 A schematic diagram of the fabrication process coordinate system for the substrate classification method provided in this application embodiment. Figure 4 This is a schematic diagram illustrating the calculation of corrected dimensions in the substrate classification method of this application embodiment.

[0020] Figure 5 Provided for the embodiments of this application Figure 4 A magnified structural diagram at point D.

[0021] Figure 6 This is a schematic diagram of the structure of one embodiment of the substrate sorting device in this application. Figure 7 This is a schematic diagram of the structure of one embodiment of the electronic device provided in this application. Detailed Implementation

[0022] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0023] In the description of this application, it should be understood that the features referred to by the terms "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified. It should be noted that, unless otherwise explicitly specified and limited, the terms "connected" and "linked" should be interpreted broadly; for example, they may refer to a direct connection or an indirect connection through an intermediate medium, or they may refer to the internal connection of two elements or the interaction between two elements. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0024] The following disclosure provides many different embodiments or examples for implementing different structures of this application. To simplify the disclosure, specific examples of components and arrangements are described below. Of course, these are merely examples and are not intended to limit the scope of this application. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, various specific examples of processes and materials are provided in this application, but those skilled in the art will recognize the application of other processes and / or the use of other materials.

[0025] This application provides a method, apparatus, electronic device, and storage medium for classifying substrates, which will be described in detail below.

[0026] The following section will use the substrate classification method applied to Mini-LED substrates as an example, as shown in the figure. Please refer to [the figure]. Figure 1 , Figure 1This is a schematic diagram of the substrate classification system in an embodiment of this application. The substrate classification method provided by this invention can be deployed on a server 300. The classification device 200 is located above the Mini-LED substrate 100. After the classification device 200 sends the detected expansion and contraction data of multiple Mini-LED substrates 100 to the server 300, the server 300 processes this expansion and contraction data to generate a stacking result of the multiple Mini-LED substrates 100. The server 300 then sends the classification result to the classification device 200, which displays the classification result. The classification device 200 may include devices for taking pictures, such as a CCD camera or an infrared camera sensor.

[0027] It should be noted that, Figure 1 The schematic diagram of the substrate classification system shown is merely an example. The substrate classification system and scenarios described in this application are for the purpose of more clearly illustrating the technical solutions of this application, and do not constitute a limitation on the technical solutions provided in this application. As those skilled in the art will know, with the evolution of substrate classification systems and the emergence of new business scenarios, the technical solutions provided in this application are also applicable to similar technical problems.

[0028] Please refer to Figure 2 This application provides a method for classifying substrates, specifically including the following steps S100-S500: S100: Obtain the reference dimensions of multiple expansion and contraction substrates and obtain the expansion and contraction values ​​of each expansion and contraction substrate.

[0029] In this embodiment, the expansion / contraction substrate can be a polygonal substrate, specifically a quadrilateral substrate. Correspondingly, the reference size of the expansion / contraction substrate can be the substrate size under ideal conditions where there is no expansion or contraction, that is, the reference size is the ideal size without expansion or contraction deformation. Taking a rectangular substrate as an example, the reference size can be a reference rectangle, which can be characterized by the side lengths of the four connecting sides of the rectangular substrate. Specifically, this reference rectangle can be a rectangle formed by four vertices (marking points) defined on the rectangular substrate through drawing design before the expansion / contraction substrate is manufactured, and is independent of the actual shape of the expansion / contraction substrate. Multiple expansion / contraction substrates can simultaneously correspond to one reference size.

[0030] Correspondingly, the expansion and contraction value of the expansion and contraction substrate refers to the dimensional value of the expansion and contraction of the substrate during actual production due to factors such as temperature and welding process. However, this expansion and contraction is not proportional.

[0031] It should be noted that this embodiment is described with a quadrilateral expansion and contraction substrate, which can meet most expansion and contraction adjustment needs. Of course, in other preferred embodiments, the expansion and contraction substrate can also be triangular, pentagonal, circular, elliptical, or other shapes.

[0032] S200: Obtain the expansion correction parameters for each expansion substrate based on each expansion value.

[0033] S300: Determine the correction dimensions of each expansion / contraction substrate based on the reference dimensions and each expansion / contraction correction parameter.

[0034] Specifically, the value of the expansion / contraction correction parameter can be positive or negative. Therefore, the correction dimension of each expansion / contraction substrate can be calculated by adding the reference dimension and the expansion / contraction correction parameter.

[0035] S400: Divide each correction dimension into multiple expansion / contraction correction intervals.

[0036] S500: Classify each expansion / contraction substrate according to each expansion / contraction correction range.

[0037] The substrate classification method of this application embodiment obtains reference dimensions of multiple expansion and contraction substrates and expansion and contraction values ​​of each expansion and contraction substrate. Based on these values, expansion and contraction correction parameters are obtained for each substrate. Correction dimensions are determined for each substrate based on the reference dimensions and correction parameters. Each correction dimension is divided into multiple expansion and contraction correction intervals. Substrates are then classified according to these intervals. This allows expansion and contraction substrates belonging to the same correction interval to be grouped into the same category based on their corrected dimensions. This enables rapid classification of each substrate, improving the efficiency of substrate stacking. Furthermore, substrates located within the same correction interval can be printed on the same screen, improving printing accuracy, reducing the number of printing plates required, and ultimately saving manufacturing costs.

[0038] In some embodiments, each expansion and contraction substrate includes two first horizontal edges and two first vertical edges connected to each other, the expansion and contraction correction parameters include horizontal edge correction parameters and vertical edge correction parameters, and the correction dimensions include horizontal edge equivalent dimensions and vertical edge equivalent dimensions.

[0039] Since the expansion and contraction of each connecting edge of the expansion and contraction substrate is not proportional, in order to avoid large calculation errors caused by the different expansion and contraction ratios of each connecting edge of the expansion and contraction substrate, it is necessary to measure the actual lengths of the two first horizontal edges and the two first vertical edges respectively.

[0040] Specifically, step S100, obtaining the reference dimensions of multiple expansion and contraction substrates and obtaining the expansion and contraction values ​​of each expansion and contraction substrate, includes the following steps S101-S102: S101. Obtain the theoretical lengths of the first horizontal edge and the first vertical edge respectively.

[0041] The embodiments of this application obtain the reference dimensions of the expansion and contraction substrate. Since the expansion and contraction substrate in this embodiment is quadrilateral, the reference dimensions of the expansion and contraction substrate include the theoretical dimensions of the two interconnected first horizontal sides and the theoretical dimensions of the two first vertical sides, i.e., the dimensions of the reference quadrilateral. The theoretical lengths of the two first horizontal sides E and the two first vertical sides F are the same. The theoretical lengths of the first horizontal sides and the first vertical sides can be the same or different. The theoretical lengths of the first horizontal sides E and the first vertical sides F can be obtained through direct measurement and calculation, or by establishing a Cartesian coordinate system for the reference rectangle and calculating the coordinates of each vertex of the reference rectangle.

[0042] S102. Obtain the actual lengths of the two first horizontal edges and two first vertical edges of the current expansion and contraction substrate respectively.

[0043] Correspondingly, step S300, determining the correction dimensions of the expansion and contraction substrate based on the reference dimensions and various expansion and contraction correction parameters, specifically includes the following step S301: S301. Based on the theoretical length of the first horizontal side and the correction parameters of each horizontal side, obtain multiple equivalent dimensions of the horizontal side, and based on the theoretical length of the first vertical side and the correction parameters of each vertical side, obtain multiple equivalent dimensions of the vertical side.

[0044] This application embodiment uses equivalent dimensions for the horizontal sides to convert the dimensions of the two first horizontal sides that are not proportionally expanding or contracting into equivalent dimensions for the horizontal sides that are proportionally expanding or contracting. Correspondingly, using equivalent dimensions for the vertical sides, the dimensions of the two first vertical sides that are not proportionally expanding or contracting into equivalent dimensions for the vertical sides that are proportionally expanding or contracting can be converted into equivalent dimensions for the vertical sides that are proportionally expanding or contracting. This simplifies calculations within the allowable error range, thereby improving the classification efficiency of the substrate and thus improving the substrate manufacturing efficiency.

[0045] In some embodiments, step S300, determining the various correction dimensions of the expansion and contraction substrate based on the reference dimensions and various expansion and contraction correction parameters, specifically includes the following steps S301-S302: S301. Calculate the difference between the actual length of the two first horizontal sides and the theoretical length of the corresponding first horizontal side, and calculate the difference between the actual length of the two first vertical sides and the theoretical length of the corresponding first vertical side.

[0046] S302. If the difference between the horizontal side and the difference between the vertical side are both less than or equal to the preset error threshold, then the equivalent size of the horizontal side is obtained based on the actual length of the two first horizontal sides and the horizontal side correction parameter, and the equivalent size of the vertical side is obtained based on the actual length of the two first vertical sides and the vertical side correction parameter.

[0047] This application embodiment uses a preset error threshold as a comparison threshold, thereby excluding substrates that exhibit large expansion and contraction. This avoids large errors when calculating the expansion and contraction correction parameters and correction dimensions of the substrates, which helps improve the accuracy of substrate classification results and improve substrate manufacturing yield.

[0048] Specifically, the preset error threshold can be 0.03%, 0.05%, 0.01%, etc., and no specific limit is made to the preset error threshold here.

[0049] In this embodiment, the preset error threshold can be set to one or two. Taking two preset error thresholds as an example, the preset error thresholds can include a preset horizontal edge error threshold and a preset vertical edge error threshold. The horizontal edge error threshold and the vertical edge error threshold take different values. When the difference between the horizontal edge and the vertical edge is less than or equal to the horizontal edge error threshold and the difference between the vertical edge and the vertical edge is less than or equal to the vertical edge error threshold, the equivalent size of the horizontal edge and the equivalent size of the vertical edge are calculated.

[0050] In some embodiments, the expansion and contraction substrate is a polygonal structure, and the expansion and contraction substrate includes multiple geometric vertices and multiple connecting edges; Step S100 involves obtaining the expansion and contraction values ​​of each expansion and contraction substrate, specifically including the following steps: S103. Select any geometric vertex in each expansion and contraction substrate as the origin and establish a rectangular coordinate system to obtain the coordinate data of each geometric vertex. S104. Obtain the expansion and contraction values ​​of each connecting edge based on the coordinate data of the geometric vertices.

[0051] In some embodiments, the expansion and contraction substrate is a rectangular structure, with multiple connecting sides including two first horizontal sides E', and multiple geometric vertices including a first vertex O, a second vertex A', a third vertex B', and a fourth vertex C'; Among them, the first vertex O, the second vertex A', the fourth vertex C', and the third vertex B' each form a first horizontal side. Correspondingly, the expansion and contraction correction parameters include the horizontal side correction parameters. Step S200: Obtain the expansion and contraction correction parameters for each expansion and contraction substrate based on each expansion and contraction value, specifically including the following steps S201-S203: S201. Obtain the coordinates of the first vertex O, the second vertex A', the third vertex B', and the fourth vertex C' of the expansion and contraction substrate, respectively, wherein the coordinates of the first vertex O are the coordinates of the origin.

[0052] For details, please refer to Figure 2 Using the reference dimensions of the expansion and contraction substrate as a benchmark, in this embodiment, the reference dimensions of the expansion and contraction substrate are the dimensions of a reference rectangle, wherein the reference rectangle includes a first reference vertex, a second reference vertex, a third reference vertex, and a fourth reference vertex. A Cartesian coordinate system is established with the first reference vertex of the reference rectangle as the origin. Let the theoretical length of the two first horizontal sides be E, and the theoretical length of the two first vertical sides be F. Correspondingly, if the coordinates of the first vertex O are (0, 0), then the coordinates of the second vertex A' are defined as (0, F+y). a The coordinates of the third vertex B' are (E+x) b , F+y b The coordinates of the fourth vertex C' are (E+x) c y c ).

[0053] S202. Based on the difference in x-coordinates between the third vertex B' and the second vertex A', obtain the first difference Δx. b .

[0054] S203, calculate the first difference Δx b The sum of the horizontal coordinates of the second vertex A' is used as the horizontal edge correction parameter of the expansion and contraction substrate.

[0055] in, Δx b =x b - x a Then the lateral edge correction parameter of the expansion and contraction substrate L’= ， Correspondingly, the horizontal edge correction dimension L=E+L'=E+ 。

[0056] This application embodiment uses horizontal edge correction parameters and vertical edge correction parameters. This application embodiment can also classify according to the horizontal edge correction parameters and / or vertical edge correction parameters during classification, thereby improving the level of classification precision.

[0057] In some embodiments, the multiple connecting edges also include two first vertical edges F, with the first vertex O and the fourth vertex C', the second vertex A' and the third vertex B' each forming a first vertical edge F. Correspondingly, the expansion / contraction correction parameter also includes a vertical edge correction parameter. Step S200: Obtain the expansion and contraction correction parameters for each expansion and contraction substrate based on each expansion and contraction value, specifically including the following steps S204-S205: S204. Based on the difference in the ordinate values ​​between the third vertex B' and the fourth vertex C', obtain the second difference value Δy. c .

[0058] S205, the second difference Δy c The sum of the ordinate values ​​of the second vertex A' is used as half of the longitudinal edge correction parameter of the expansion and contraction substrate.

[0059] Specifically, Δy b =y b - y c Then the longitudinal edge correction parameter of the expansion and contraction substrate W’= Correspondingly, the longitudinal edge correction dimension of the expansion and contraction substrate W=F +W'=F + 。

[0060] Combination Figures 3-5 As shown in the embodiments of this application, the transverse side correction dimension L and the longitudinal side correction dimension W of the expansion and contraction substrate can be obtained by the following calculations: First, define: Δx b =x b - x a (1) Δy b =y b - y c (2) Calculate the coordinates of point K, which is the intersection of line A'B' and line AB, and the equation of line A'B' is L. A'B' It can be represented as: y = (3) Since line AB is parallel to the X-axis, its equation is y = F. Substituting this into equation (2), we can obtain the coordinates of point K as follows: K ( (F)(4) Similarly, point L is the intersection of line A'B' and line BC. Line BC is parallel to the y-axis, and its equation is x=E. Substituting this into equation (1), we can obtain the coordinates of point L as follows: L(E, (5) Furthermore, point M is the intersection of line B'C' and line BC, and the equation of line B'C' is L. B'C' It can be represented as: (6) Substituting the equation of line BC into the formula, we can obtain the coordinates of point M as follows: M(E, (7) like Figure 5 As shown, select the foot N of the perpendicular from LB'M onto LM. Since the coordinates of the foot N are (E, F + Δyb), the area of ​​quadrilateral OA'B'C' can be expressed as: S OA'B'C' =S OABC +S AA'K +S B'LM -S MCC' -S KBL = (8) The equation can be further simplified to: y = Δyb or xc = Δxb, i.e., when expansion and contraction are proportional. S OA'B'C' = (9) Observing equation (8), it can be seen that after any non-uniform expansion and contraction, the quadrilateral area of ​​the expansion and contraction substrate can be approximately expressed as the product of the two expressions shown in equation (9), where, The term is a small quantity. Therefore, within the allowable error range, any expansion / contraction substrate can be equivalently represented as a substrate with a long side of... The width is The rectangle is obtained from the horizontal side correction dimension L and the vertical side correction dimension W of the expansion and contraction substrate.

[0061] It should be noted that, in the embodiments of this application, the values ​​of the transverse edge correction parameter L' and the longitudinal edge correction parameter W' can be positive or negative. When the connecting edge of the expansion and contraction substrate is equivalent to a proportional expansion, the correction parameter is positive; when the connecting edge of the expansion and contraction substrate is equivalent to a proportional contraction, the correction parameter is negative.

[0062] S600. Determine the target size based on the expansion and contraction correction range, and use the target size as the production size of the printing screen.

[0063] In the embodiments of this application, when there are multiple expansion and contraction correction intervals, the number of target sizes can also be multiple, and the manufacturing size of the printing screen can also be multiple. That is, multiple printing screens of different sizes can be manufactured according to the number of classification results.

[0064] In this embodiment, the printing stencil can be used to print stencils, which can be used to print materials such as solder paste and adhesive. Of course, in other embodiments, the printing stencil can also be a screen printing stencil or other stencils, and no specific limitation is made to the printing stencil here.

[0065] This application embodiment determines the printing screen manufacturing size based on the target horizontal edge range and the target vertical edge range respectively, thereby ensuring that the printing screen can cover the expansion and contraction substrate corresponding to the target range, which helps to improve the accuracy of the printing screen size and the coverage of the printing screen.

[0066] In some embodiments, the expansion and contraction substrate has a rectangular structure, and the multiple connecting edges include two first horizontal edges and two first vertical edges.

[0067] The expansion / contraction correction range includes the horizontal edge correction range and the vertical edge correction range. Step S400: Divide each correction dimension into multiple expansion / contraction correction ranges, specifically including step S401: S401. Divide the equivalent dimensions of each horizontal side into N horizontal side correction intervals and divide the equivalent dimensions of each vertical side into N vertical side correction intervals.

[0068] Where N and M are positive integers greater than 0. In the embodiments of this application, the values ​​of M and N can be the same or different.

[0069] Correspondingly, step S600, selecting a target size as the classification size of the substrate from each expansion / contraction correction interval, specifically includes the following steps S601-S603: S601. Select a target horizontal edge interval from multiple horizontal edge correction intervals, and select a target vertical edge interval from multiple vertical edge correction intervals.

[0070] S602. Determine a target horizontal side dimension based on the target horizontal side interval, and determine a target vertical side dimension based on the target vertical side interval.

[0071] S603, Use the target horizontal edge size as the horizontal edge manufacturing size of the printing screen, and use the target vertical edge size as the vertical edge manufacturing size of the printing screen.

[0072] This application embodiment determines the manufacturing dimensions of the horizontal and vertical edges of the printing screen based on the target horizontal edge range and the target vertical edge range, respectively. This ensures that the printing screen can cover the expansion and contraction substrate corresponding to the target vertical edge range and the target horizontal edge range, further improving the accuracy of the printing screen dimensions and thus improving the coverage of the printing screen.

[0073] To better implement the substrate classification method of this application embodiment, based on the substrate classification method, this application embodiment also provides a substrate classification device, such as... Figure 6 As shown, the substrate sorting device 700 includes: The acquisition module 701 is used to acquire the reference dimensions of multiple expansion and contraction substrates and acquire the expansion and contraction values ​​of each expansion and contraction substrate. The first processing module 702 is used to obtain the expansion and contraction correction parameters of each expansion and contraction substrate according to each expansion and contraction value, and to determine each correction dimension of the expansion and contraction substrate according to the reference dimension and each expansion and contraction correction parameter. The second processing module 703 is used to divide each correction dimension into multiple expansion and contraction correction intervals, and to classify each expansion and contraction substrate according to each expansion and contraction correction interval.

[0074] In some embodiments, each expansion and contraction substrate includes two first transverse sides and two first longitudinal sides connected to each other, the expansion and contraction correction parameters include transverse side correction parameters and longitudinal side correction parameters, and the correction dimensions include transverse side equivalent dimensions and longitudinal side equivalent dimensions. The acquisition module 701 is also used for: Obtain the theoretical lengths of the first horizontal edge and the first vertical edge respectively; Obtain the actual lengths of the two first horizontal edges and two first vertical edges of the current expansion and contraction substrate respectively; The first processing module 702 is also used for: Based on the theoretical length of the first horizontal edge and the correction parameters of each horizontal edge, multiple equivalent dimensions of the horizontal edges are obtained.

[0075] In some embodiments, the first processing module 702 is further configured to: Calculate the difference between the actual length of the two first horizontal sides and the theoretical length of the corresponding first horizontal side, and calculate the difference between the actual length of the two first vertical sides and the theoretical length of the corresponding first vertical side. If the difference between the horizontal side and the difference between the vertical side are both less than or equal to the preset error threshold, then the equivalent size of the horizontal side is obtained based on the actual length of the two first horizontal sides and the horizontal side correction parameter, and the equivalent size of the vertical side is obtained based on the actual length of the two first vertical sides and the vertical side correction parameter.

[0076] In some embodiments, the expansion and contraction substrate is a polygonal structure, and the expansion and contraction substrate includes multiple geometric vertices and multiple connecting edges; The acquisition module 701 is also used for: In each expansion and contraction substrate, any geometric vertex is selected as the origin to establish a rectangular coordinate system in order to obtain the coordinate data of each geometric vertex. The expansion and contraction values ​​of each connecting edge are obtained based on the coordinate data of the geometric vertices.

[0077] In some embodiments, the expansion and contraction substrate is a rectangular structure, the multiple connecting edges include two first horizontal edges, the multiple geometric vertices include a first vertex, a second vertex, a third vertex and a fourth vertex; the first vertex and the second vertex, the fourth vertex and the third vertex respectively constitute a first horizontal edge; the expansion and contraction correction parameters include horizontal edge correction parameters. The first processing module 702 is also used for: Obtain the coordinates of the first geometric vertex, the second geometric vertex, the third geometric vertex, and the fourth geometric vertex of the expansion and contraction substrate, with the first geometric vertex coordinates being the origin coordinates; The first difference is obtained based on the difference between the x-coordinates of the third vertex and the second vertex; Half of the sum of the first difference and the second vertex x-coordinate value is used as the lateral edge correction parameter of the expansion and contraction substrate.

[0078] In some embodiments, the multiple connecting edges further include two first vertical edges, with the first vertex and the fourth vertex, and the second vertex and the third vertex each forming a first vertical edge; the expansion / contraction correction parameters also include vertical edge correction parameters; The first processing module 702 is also used for: The second difference is obtained based on the difference between the ordinate values ​​of the third and fourth vertices; Half of the sum of the second difference and the horizontal coordinate of the second vertex is used as the longitudinal edge correction parameter of the expansion and contraction substrate.

[0079] In some embodiments, the second processing module 703 is further configured to: Select a target size from each expansion / contraction correction range as the manufacturing size of the printing screen.

[0080] In some embodiments, the expansion and contraction substrate is a rectangular structure, and the multiple connecting sides include two first horizontal sides and two first vertical sides, and the expansion and contraction correction interval includes a horizontal side correction interval and a vertical side correction interval. The second processing module 703 is also used for: Select any interval from multiple horizontal correction intervals as the target horizontal interval, and select any interval from multiple vertical correction intervals as the target vertical interval. The target horizontal edge size is used as the horizontal edge manufacturing size of the printing screen, and the target vertical edge size is used as the vertical edge manufacturing size of the printing screen.

[0081] The substrate classification device provided in this application obtains reference dimensions of multiple expansion and contraction substrates and expansion and contraction values ​​of each expansion and contraction substrate. Based on these values, it obtains expansion and contraction correction parameters for each substrate. Then, it determines the correction dimensions of each substrate based on the reference dimensions and correction parameters. Each correction dimension is divided into multiple expansion and contraction correction intervals. The substrates are classified according to these intervals. This allows expansion and contraction substrates belonging to the same correction interval to be grouped into the same category based on their corrected dimensions. This enables rapid classification of each substrate, improving the efficiency of substrate stacking. Furthermore, substrates located within the same correction interval can be printed on the same screen, improving printing accuracy, reducing the number of printing plates required, and ultimately saving manufacturing costs.

[0082] This application also provides an electronic device that integrates the substrate sorting device provided in any embodiment of this application. Please refer to... Figure 7 , Figure 7 The present application illustrates a schematic diagram of the structure of an electronic device according to an embodiment of the present application. Specifically: The electronic device may include components such as a processor 801 with one or more processing cores, a memory 802 with one or more computer-readable storage media, a power supply 803, and an input unit 804. Those skilled in the art will understand that... Figure 7 The electronic device structure shown does not constitute a limitation on the electronic device and may include more or fewer components than shown, or combine certain components, or have different component arrangements. Wherein: The processor 801 is the control center of the electronic device. It connects various parts of the electronic device via various interfaces and lines. By running or executing software programs and / or modules stored in the memory 802, and by calling data stored in the memory 802, it performs various functions and processes data, thereby providing overall monitoring of the electronic device. Optionally, the processor 801 may include one or more processing cores; preferably, the processor 801 may integrate an application processor and a modem processor, wherein the application processor mainly handles the operating system, user interface, and applications, and the modem processor mainly handles wireless communication. It is understood that the modem processor may not be integrated into the processor 801.

[0083] The memory 802 can be used to store software programs and modules. The processor 801 executes various functional applications and data processing by running the software programs and modules stored in the memory 802. The memory 802 may mainly include a program storage area and a data storage area. The program storage area may store the operating system, application programs required for at least one function (such as sound playback function, image playback function, etc.), etc.; the data storage area may store data created according to the use of the electronic device, etc. In addition, the memory 802 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device. Accordingly, the memory 802 may also include a memory controller to provide the processor 801 with access to the memory 802.

[0084] The electronic device also includes a power supply 803 that supplies power to the various components. Preferably, the power supply 803 can be logically connected to the processor 801 through a power management system, thereby enabling functions such as charging, discharging, and power consumption management through the power management system. The power supply 803 may also include one or more DC or AC power supplies, recharging systems, power fault detection circuits, power converters or inverters, power status indicators, and other arbitrary components.

[0085] The electronic device may also include an input unit 804, which can be used to receive input digital or character information and generate keyboard, mouse, joystick, optical or trackball signal inputs related to user settings and function control.

[0086] Although not shown, the electronic device may also include a display unit, etc., which will not be described in detail here. Specifically, in the embodiments of this application, the processor 801 in the electronic device loads the executable files corresponding to the processes of one or more applications into the memory 802 according to the following instructions, and the processor 801 runs the applications stored in the memory 802 to realize various functions, as follows: The process involves obtaining reference dimensions for multiple expansion and contraction substrates and obtaining expansion and contraction values ​​for each substrate; obtaining expansion and contraction correction parameters for each substrate based on the expansion and contraction values; determining correction dimensions for each substrate based on the reference dimensions and the correction parameters; dividing each correction dimension into multiple expansion and contraction correction intervals; and classifying each substrate based on the expansion and contraction correction intervals.

[0087] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be performed by instructions, or by instructions controlling related hardware. These instructions can be stored in a computer-readable storage medium and loaded and executed by a processor.

[0088] Therefore, embodiments of this application provide a computer-readable storage medium, which may include: read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk, etc. A computer program is stored thereon, which is loaded by a processor to execute the steps in any of the substrate classification methods provided in embodiments of this application. For example, the computer program loaded by the processor can execute the following steps: The process involves obtaining reference dimensions for multiple expansion and contraction substrates and obtaining expansion and contraction values ​​for each substrate; obtaining expansion and contraction correction parameters for each substrate based on the expansion and contraction values; determining correction dimensions for each substrate based on the reference dimensions and the correction parameters; dividing each correction dimension into multiple expansion and contraction correction intervals; and classifying each substrate based on the expansion and contraction correction intervals.

[0089] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not detailed in a particular embodiment, please refer to the relevant descriptions in other embodiments. In specific implementation, each of the above units or structures can be implemented as an independent entity, or can be arbitrarily combined to be implemented as the same or several entities. For specific implementations of the above units or structures, please refer to the preceding method embodiments, which will not be repeated here.

[0090] The foregoing has provided a detailed description of a substrate classification method, apparatus, electronic device, and storage medium provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of the embodiments of this application. The descriptions of the embodiments above are only for the purpose of helping to understand the technical solutions and core ideas of the embodiments of this application. Those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A method for classifying substrates, characterized in that, include: Obtain reference dimensions for multiple expansion and contraction substrates and obtain individual expansion and contraction values ​​for each of the expansion and contraction substrates; The expansion and contraction correction parameters of each expansion and contraction substrate are obtained based on each expansion and contraction value. The correction dimensions of each expansion / contraction substrate are determined based on the reference dimensions and each of the expansion / contraction correction parameters; Each of the aforementioned correction dimensions is divided into multiple expansion and contraction correction intervals; Each expansion and contraction substrate is classified according to its respective expansion and contraction correction range; Each of the expansion and contraction substrates includes two first horizontal edges and two first vertical edges that are connected to each other. The expansion and contraction correction parameters include horizontal edge correction parameters and vertical edge correction parameters. The correction dimensions include horizontal edge equivalent dimensions and vertical edge equivalent dimensions. The step of obtaining the reference dimensions of multiple expansion and contraction substrates and obtaining the expansion and contraction values ​​of each of the expansion and contraction substrates includes: obtaining the theoretical lengths of the first horizontal edge and the first vertical edge respectively; and obtaining the actual lengths of the two first horizontal edges and the two first vertical edges of the current expansion and contraction substrate respectively. The step of determining the corrected dimensions of each expansion and contraction substrate according to the reference dimensions and each of the expansion and contraction correction parameters includes: obtaining multiple equivalent dimensions of the horizontal side according to the theoretical length of the first horizontal side and each of the horizontal side correction parameters, and obtaining multiple equivalent dimensions of the vertical side according to the theoretical length of the first vertical side and each of the vertical side correction parameters. The step of determining the corrected dimensions of each expansion and contraction substrate based on the reference dimensions and each of the expansion and contraction correction parameters further includes: calculating the difference between the actual length of each of the two first horizontal sides and the theoretical length of the corresponding first horizontal side, and calculating the difference between the actual length of each of the two first vertical sides and the theoretical length of the corresponding first vertical side; if both the difference between the horizontal sides and the difference between the vertical sides are less than or equal to a preset error threshold, then the equivalent dimension of the horizontal side is obtained based on the actual length of the two first horizontal sides and the horizontal side correction parameters, and the equivalent dimension of the vertical side is obtained based on the actual length of the two first vertical sides and the vertical side correction parameters.

2. The substrate classification method as described in claim 1, characterized in that, The expansion and contraction substrate has a polygonal structure, and the expansion and contraction substrate includes multiple geometric vertices and multiple connecting edges; The process of obtaining the expansion and contraction values ​​of each expansion and contraction substrate includes: In each of the expansion and contraction substrates, any one of the geometric vertices is selected as the origin to establish a rectangular coordinate system in order to obtain the coordinate data of each of the geometric vertices; The expansion / contraction values ​​of each connecting edge are obtained based on the coordinate data of the geometric vertices.

3. The substrate classification method as described in claim 2, characterized in that, The expansion and contraction substrate has a rectangular structure, the plurality of connecting sides include two first horizontal sides, and the plurality of geometric vertices include a first vertex, a second vertex, a third vertex, and a fourth vertex. The first vertex and the second vertex, the fourth vertex and the third vertex respectively form a first horizontal side; The expansion / contraction correction parameters include the lateral edge correction parameters; The step of obtaining the expansion / contraction correction parameters for each expansion / contraction substrate based on each expansion / contraction value includes: The coordinates of the first vertex, the second vertex, the third vertex, and the fourth vertex of the expansion and contraction substrate are obtained respectively, with the coordinates of the first vertex being the origin coordinates; The first difference is obtained based on the difference in the x-coordinate values ​​between the third vertex and the second vertex; Half of the sum of the first difference and the second vertex x-coordinate value is used as the lateral edge correction parameter of the expansion and contraction substrate.

4. The substrate classification method as described in claim 3, characterized in that, The plurality of connecting edges also include two first vertical edges, wherein the first vertex and the fourth vertex, the second vertex and the third vertex respectively constitute a first vertical edge; The expansion / contraction correction parameters also include longitudinal edge correction parameters; The step of obtaining the expansion / contraction correction parameters for each expansion / contraction substrate based on each expansion / contraction value includes: The second difference is obtained based on the difference between the ordinate values ​​of the third vertex and the fourth vertex; The sum of the second difference and the ordinate of the second vertex is taken as the longitudinal edge correction parameter of the expansion and contraction substrate.

5. The method for classifying substrates as described in any one of claims 1-4, characterized in that, The step of classifying each expansion / contraction substrate according to each expansion / contraction correction interval further includes: The target size is determined based on the expansion and contraction correction range, and the target size is used as the manufacturing size of the printing screen.

6. The substrate classification method as described in claim 5, characterized in that, The expansion and contraction substrate has a rectangular structure, the plurality of connecting sides include two first horizontal sides and two first vertical sides, and the expansion and contraction correction interval includes a horizontal side correction interval and a vertical side correction interval. The target size is determined based on the expansion and contraction correction range, and the target size is used as the manufacturing size of the printing screen, including: Select a target horizontal edge interval from among the plurality of horizontal edge correction intervals, and select a target vertical edge interval from among the plurality of vertical edge correction intervals; A target horizontal side dimension is determined based on the target horizontal side interval, and a target vertical side dimension is determined based on the target vertical side interval; The target horizontal side dimension is used as the horizontal side manufacturing dimension of the printing screen, and the target vertical side dimension is used as the vertical side manufacturing dimension of the printing screen.

7. A substrate sorting device, characterized in that, include: The acquisition module is used to acquire the reference dimensions of multiple expansion and contraction substrates and to acquire the expansion and contraction values ​​of each expansion and contraction substrate. The first processing module is used to obtain the expansion and contraction correction parameters of each expansion and contraction substrate according to each expansion and contraction value, and to determine each correction dimension of the expansion and contraction substrate according to the reference dimension and each expansion and contraction correction parameter. The second processing module is used to divide each of the correction dimensions into multiple expansion and contraction correction intervals, and to classify each of the expansion and contraction substrates according to each of the expansion and contraction correction intervals. Each of the expansion and contraction substrates includes two first horizontal edges and two first vertical edges that are connected to each other. The expansion and contraction correction parameters include horizontal edge correction parameters and vertical edge correction parameters. The correction dimensions include horizontal edge equivalent dimensions and vertical edge equivalent dimensions. The acquisition module is also used to acquire the theoretical lengths of the first horizontal edge and the first vertical edge respectively; and to acquire the actual lengths of the two first horizontal edges and the two first vertical edges of the current expansion and contraction substrate respectively; The first processing module is further configured to obtain multiple equivalent dimensions of the horizontal side based on the theoretical length of the first horizontal side and each of the horizontal side correction parameters, and to obtain multiple equivalent dimensions of the vertical side based on the theoretical length of the first vertical side and each of the vertical side correction parameters. The first processing module is further configured to calculate the difference between the actual length of the two first horizontal sides and the theoretical length of the corresponding first horizontal side, and to calculate the difference between the actual length of the two first vertical sides and the theoretical length of the corresponding first vertical side; if the difference between the horizontal sides and the difference between the vertical sides are both less than or equal to a preset error threshold, then the equivalent size of the horizontal side is obtained based on the actual length of the two first horizontal sides and the horizontal side correction parameter, and the equivalent size of the vertical side is obtained based on the actual length of the two first vertical sides and the vertical side correction parameter.

8. An electronic device, characterized in that, The electronic device includes: One or more processors; Memory; and One or more applications, wherein the one or more applications are stored in the memory and configured to be executed by the processor to implement the substrate classification method of any one of claims 1-6.

9. A computer-readable storage medium, characterized in that, It stores a computer program, which is loaded by a processor to perform the steps of the substrate classification method according to any one of claims 1-6.

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