Optoelectronic system closed-loop tracking performance testing device and testing method

Abstract

The present application belongs to the technical field of photoelectric system testing, and particularly relates to a photoelectric system closed-loop tracking performance testing device and a testing method. The photoelectric system closed-loop tracking performance testing device comprises an optical platform and an adjusting mechanism thereof, a dynamic target source, a self-collimating light pipe, a self-collimating mirror and a data analysis device. The present application can realize rapid and objective testing of the tracking performance of a photoelectric system under test, and can also realize testing of the frequency domain performance of a tracking loop.

Description

Technical Field

[0001] This invention belongs to the field of optoelectronic system testing technology, specifically relating to a device and method for testing the closed-loop tracking performance of an optoelectronic system. Background Technology

[0002] An electro-optical system is an airborne ground-attack electro-optical detection system, typically equipped with an electro-optical imaging component and a laser ranging component. The electro-optical system uses its electro-optical imaging component to search for, identify, and track targets, and its laser ranging component to illuminate and range targets. Its primary purpose is to illuminate and designate targets for laser-guided weapons, and it can also provide initial target information for short-range television and infrared image-guided air-to-ground missiles. Utilizing its laser ranging capability, it can also provide precise target distance information for fire control calculations.

[0003] The principle of target tracking in an optoelectronic system is to image the target in a detector located on a stable platform, and then use an image processing computer to detect the angular deviation of the target from the center of the image. This deviation is then used to establish a closed-loop optical axis control system. The input to the closed-loop optical axis control system is the angular projection of the relative motion between the target and the carrier aircraft in the detector system. The feedback is the deviation between the target and the center of the image detected by the image processing computer after the target is imaged by the detector, and the output is the optical axis angle.

[0004] The tracking performance of an optoelectronic system is mainly divided into frequency domain performance and time domain performance. Time domain performance is tested using typical step or sinusoidal inputs to the target, with tracking accuracy being the primary indicator. Frequency domain performance is tested using random or swept-frequency inputs to the target, with bandwidth being the primary indicator.

[0005] Current methods for testing the tracking performance of optoelectronic systems primarily involve mounting the system on a moving target turntable, driving a target source on the turntable to move, and having the tested optoelectronic system track the target source while recording the tracking video. The tracking performance is then analyzed frame-by-frame offline. However, this method has several drawbacks. First, the test data is obtained directly from the tested optoelectronic system itself, and the image resolution and frame rate are limited by the system's specifications, making it a self-test with insufficient observability. Second, the testing efficiency is low, requiring video recording followed by offline frame-by-frame analysis. More importantly, it cannot test the frequency domain performance of the tracking loop. Summary of the Invention

[0006] In view of this, the present invention provides a test device and test method for closed-loop tracking performance of an optoelectronic system, which can realize rapid and objective testing of the tracking performance of the optoelectronic system under test, and can also realize testing of the frequency domain performance of the tracking loop.

[0007] To achieve the above-mentioned technical objectives, the specific technical solution adopted by the present invention is as follows:

[0008] A closed-loop tracking performance testing device for an optoelectronic system includes: an optical platform and its adjustment mechanism, a dynamic target source, a self-collimating light tube, a self-collimating mirror, and data analysis equipment;

[0009] The optical platform includes a precision optical platform and a dynamic target source adjustment mechanism and an autocollimating tube adjustment mechanism installed on the precision optical platform. The dynamic target source adjustment mechanism and the autocollimating tube adjustment mechanism are used to precisely adjust the position and attitude of the dynamic target source and the autocollimating tube, respectively.

[0010] The dynamic target source consists of a composite light source, a target plate, a target simulation system, and a target motion system.

[0011] The target simulation system, target plate, and composite light source work together to provide radiation to the outside world, which is output in the form of parallel light; the target motion system controls the deflection angle of the parallel light under the drive of the data analysis equipment, and feeds back the actual deflection angle of the parallel light to the data analysis equipment;

[0012] The autocollimating mirror is fixed to the detector in the photoelectric system, and the deflection angle of the optical axis of the photoelectric system under test is obtained through the autocollimating light tube.

[0013] The data analysis equipment is configured to excite the target motion system, and collects the deflection angle of the parallel light fed back by the dynamic target source and the deflection angle of the optical axis of the photoelectric system fed back by the optical axis of the autocollimating tube. The data is analyzed to complete the closed-loop tracking performance test of the photoelectric system.

[0014] Furthermore, the target motion system is a fast-reflecting mirror or a servo control system with a deflectable optical path.

[0015] Furthermore, the light emitted from the autocollimating light source in the autocollimating tube passes through the reticle, the semi-reflective lens, and the objective lens before being projected onto the autocollimating mirror, which is fixed to the detector of the photoelectric system under test. The light reflected by the autocollimating mirror is then reflected by the semi-reflective lens into the high-speed camera.

[0016] Furthermore, the test types of the test device include frequency domain testing and time domain testing; wherein frequency domain testing is used to obtain the closed-loop frequency response curve of the photoelectric system tracking loop; and time domain testing is used to measure the tracking deviation of the photoelectric system tracking system.

[0017] Furthermore, the specific method for stimulating dynamic target sources is as follows:

[0018] When performing the frequency domain test, the test signal is a random signal or a swept frequency signal; when performing the time domain test, the test signal is a sine wave, a step signal, a square wave, or a trapezoidal wave signal.

[0019] Furthermore, the judgment index for the frequency domain test is the closed-loop bandwidth, which is obtained by performing spectrum analysis on the input and output time-domain signals to obtain the closed-loop frequency response curve of the photoelectric system tracking loop; the judgment index for the time domain test is the tracking accuracy, which is obtained by subtracting the input and output signals at the same time and calculating the root mean square.

[0020] Furthermore, the control bandwidth of the target motion system is more than five times higher than the tracking bandwidth of the photoelectric system under test.

[0021] This invention also proposes a method for testing the closed-loop tracking performance of an optoelectronic system based on the aforementioned optoelectronic system closed-loop tracking performance testing device, comprising the following steps:

[0022] Step 1: Power on the dynamic target source, including powering on the composite light source and implementing closed-loop control of the target motion system, while simultaneously powering on the autocollimating light tube;

[0023] Step 2: Power on the photoelectric system under test and control the optical axis of the photoelectric system under test to point in the direction of the dynamic target source;

[0024] Step 3: Adjust the position and attitude of the dynamic target source through the dynamic target source adjustment mechanism on the optical platform, and at the same time adjust the position, attitude and optical axis pointing of the photoelectric system under test to complete the optical axis alignment of the dynamic target source and the photoelectric system under test, so that the image of the target plate in the dynamic target source appears on the focal plane of the detector of the photoelectric system under test.

[0025] Step 4: Attach the autocollimating mirror to the photoelectric system under test and fix the autocollimating mirror and the optical axis of the photoelectric system under test; adjust the position and orientation of the autocollimating tube so that the outgoing light in the autocollimating tube returns to the detector of the autocollimating tube after being reflected by the autocollimating mirror.

[0026] Step 5: Excite the dynamic target source according to the test type; sample the target motion feedback in the dynamic target source and sample the optical axis motion angle of the photoelectric system under test in the collimating light tube.

[0027] Step six: Perform data analysis on the information obtained from sampling in step five to obtain the closed-loop tracking performance of the tested optoelectronic system.

[0028] The beneficial effects of this invention:

[0029] 1. Tracking performance testing does not require a moving target turntable; it only requires aligning the optical axis of the photoelectric system under test with the optical axis of this invention, thus saving the cost of using a moving target turntable and a significant amount of test preparation time.

[0030] 2. Test results can be automatically analyzed in real time, significantly reducing test data analysis time, and can also be used to test the frequency domain characteristics of the tracking loop;

[0031] 3. The optical axis motion angle of the target under test can be automatically obtained by the autocollimating light tube, without the need to record video through the photoelectric system under test. The accuracy of the autocollimating light tube is much higher than that of the photoelectric system under test, and the test results are accurate and objective. Attached Figure Description

[0032] To more clearly illustrate the technical solutions of the embodiments of this disclosure, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0033] Figure 1 This is a schematic diagram of the overall structure of a closed-loop tracking performance testing device for an optoelectronic system.

[0034] Figure 2 This is a schematic diagram of the dynamic target source structure;

[0035] Figure 3 A flowchart of the operation of a closed-loop tracking performance testing device for an optoelectronic system;

[0036] Among them: 101, dynamic target source; 102, parallel light; 103, data analysis equipment; 104, optoelectronic system; 105, optical axis of optoelectronic system; 106, detector; 107, autocollimating mirror; 108, autocollimating light tube; 109, outgoing light ray; 110, output data; 111, input data; 112, optical platform; 113, dynamic target source adjustment mechanism; 114, autocollimating light tube adjustment mechanism; 201, composite light source; 202, target plate; 203, target motion system; 204, target simulation system; 207, actual deflection angle. Detailed Implementation

[0037] The embodiments of this disclosure will now be described in detail with reference to the accompanying drawings.

[0038] The following specific examples illustrate the implementation of this disclosure. Those skilled in the art can easily understand other advantages and effects of this disclosure from the content disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of this disclosure, and not all of them. This disclosure can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this disclosure. It should be noted that, in the absence of conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments in this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0039] It should be noted that various aspects of embodiments within the scope of the appended claims are described below. It will be apparent that the aspects described herein can be embodied in a wide variety of forms, and any particular structure and / or function described herein is merely illustrative. Based on this disclosure, those skilled in the art will understand that one aspect described herein can be implemented independently of any other aspect, and two or more of these aspects can be combined in various ways. For example, any number of aspects set forth herein can be used to implement the device and / or practice the method. Additionally, this device and / or method can be implemented using other structures and / or functionalities besides one or more of the aspects set forth herein.

[0040] It should also be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this disclosure. The drawings only show the components related to this disclosure and are not drawn according to the number, shape and size of the components in actual implementation. In actual implementation, the form, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0041] Furthermore, specific details are provided in the following description to facilitate a thorough understanding of the examples. However, those skilled in the art will understand that the described aspects can be practiced without these specific details.

[0042] In one embodiment of the present invention, a closed-loop tracking performance testing device for an optoelectronic system is proposed, such as... Figure 1 , 2 As shown, it includes: an optical platform 112, a dynamic target source 101, a self-collimating light tube 108, a self-collimating mirror 107, and a data analysis device 103;

[0043] The optical platform 112 consists of a precision optical platform and a dynamic target source adjustment mechanism 113 and an autocollimating tube adjustment mechanism installed on the precision optical platform. The dynamic target source adjustment mechanism 113 and the autocollimating tube adjustment mechanism are used to precisely adjust the position and attitude of the dynamic target source 101 and the autocollimating tube 108, respectively.

[0044] The dynamic target source 101 consists of a composite light source 201, a target plate 202, a target simulation system 204, and a target motion system 203.

[0045] The target simulation system 204, target plate 202, and composite light source 201 work together to provide radiation to the outside world, which is output in the form of parallel light 102; the target motion system 203 controls the deflection angle of the parallel light 102 under the drive of the data analysis device 103, and feeds back the actual deflection angle 207 of the parallel light 102 to the data analysis device 103.

[0046] The autocollimating mirror 107 is fixed to the detector 106 in the photoelectric system 104, and the deflection angle of the optical axis of the photoelectric system 104 under test is obtained through the autocollimating light tube 108.

[0047] The data analysis device 103 is configured to excite the target motion system 203, and collects the deflection angle of the parallel light 102 fed back by the dynamic target source 101 and the optical axis deflection angle of the photoelectric system 104 fed back by the optical axis of the autocollimating light tube 108, performs data analysis, and completes the closed-loop tracking performance test of the photoelectric system 104.

[0048] In this embodiment, the target motion system 203 is a fast-reflecting mirror or a servo control system for a deflectable optical path.

[0049] In this embodiment, the light emitted from the autocollimating light source in the autocollimating light tube 108 passes through the reticle, the semi-reflective lens and the objective lens and is then projected onto the autocollimating mirror 107, which is fixed to the detector 106 of the photoelectric system under test 104. The light reflected by the autocollimating mirror 107 is then reflected by the semi-reflective lens into the high-speed camera.

[0050] In this embodiment, the test types of the test device include frequency domain testing and time domain testing; wherein the frequency domain testing is used to obtain the closed-loop frequency response curve of the tracking loop of the photoelectric system 104; and the time domain testing is used to measure the tracking deviation of the photoelectric system 104 tracking system.

[0051] In this embodiment, the method for exciting the dynamic target source 101 is as follows:

[0052] When performing the frequency domain test, the test signal is a random signal or a swept frequency signal; when performing the time domain test, the test signal is a sine wave, a step signal, a square wave, or a trapezoidal wave signal.

[0053] In this embodiment, the judgment index of the frequency domain test is the closed-loop bandwidth, which is obtained by performing spectrum analysis on the input and output time domain signals to obtain the closed-loop frequency characteristic curve of the tracking loop of the optoelectronic system 104; the judgment index of the time domain test is the tracking accuracy, which is obtained by subtracting the input and output signals at the same time and calculating their root mean square.

[0054] In this embodiment, the control bandwidth of the target motion system 203 is more than five times higher than the tracking bandwidth of the photoelectric system 104 under test.

[0055] A preferred embodiment of the present invention includes the following components: an optical platform, a dynamic target source 101, a self-collimating light tube 108, a self-collimating mirror 107, and a data analysis device 103.

[0056] The optical platform 112 consists of a precision optical platform and a dynamic target source adjustment mechanism 113 and an autocollimating tube adjustment mechanism 114 installed on the precision optical platform 112, which are used to precisely adjust the position and attitude of the dynamic target source 101 and the autocollimating tube 108.

[0057] The autocollimating mirror 107 is fixed to the detector in the photoelectric system 104, and the deflection angle of the optical axis 105 of the photoelectric system under test is obtained through the autocollimating light tube 108.

[0058] In this invention, the dynamic target source 101 receives angle commands from the data analysis device 103 and outputs deflectable parallel light 102. Simultaneously, the data analysis device 103 collects the deflection angle data of the parallel light output by the dynamic target source 101 as input data 111. The photoelectric system under test 104 tracks the target in the parallel light 102 output by the dynamic target source 101. The outgoing light 109 from the autocollimating tube 108 is reflected by the autocollimating mirror 107, which is fixed to the optical axis 105 and the detector 106 of the photoelectric system. The autocollimating tube 108 captures and deflects the light reflected by the autocollimating mirror 107, thereby obtaining the output data 110 tracked by the photoelectric system under test 104, which is then reported to the data analysis device. The data analysis device 103 processes the input data 111 and the output data 110 to obtain the closed-loop tracking performance of the photoelectric system under test 104.

[0059] To further illustrate the working principle of this invention, the following description is in conjunction with the accompanying drawings. Figure 2 The composition and function of the dynamic target source 101 in this invention will be described in detail with reference to the preferred embodiments of this invention:

[0060] The dynamic target source 101 consists of a composite light source 201, a target plate 202, a target simulation system 204, and a target motion system 203.

[0061] The composite light source 201 outputs uniform infrared and visible light point light sources, which generate a target in the light after passing through the target plate 202. The target motion system 203 deflects the light passing through the target plate 202, and finally the light passes through the target simulation system 204 to output deflectable parallel light 102. Driven by the angle command issued by the data analysis device 103, the target motion system 203 controls the deflection angle of the dynamic target source 101 according to different test contents, and feeds back the actual deflection angle 207 to the data analysis device 103.

[0062] In one embodiment of the present invention, a method for testing the closed-loop tracking performance of an optoelectronic system 104 based on the above-described optoelectronic system 104 closed-loop tracking performance testing device is also proposed, comprising the following steps:

[0063] Step 1: Power on the dynamic target source 101, including powering on the composite light source 201 and performing closed-loop control on the target motion system 203, while simultaneously powering on the autocollimating light tube 108.

[0064] Step 2: Power on the photoelectric system 104 under test and control the optical axis of the photoelectric system 104 under test to point in the direction of the dynamic target source 101;

[0065] Step 3: The position and attitude of the dynamic target source 101 are adjusted by the adjustment mechanism of the dynamic target source 101 on the optical platform 112. At the same time, the position, attitude and optical axis pointing of the photoelectric system under test 104 are adjusted to complete the optical axis alignment of the dynamic target source 101 and the photoelectric system under test 104, so that the image of the target plate 202 in the dynamic target source 101 appears on the focal plane of the detector 106 of the photoelectric system under test 104.

[0066] Step 4: Attach the autocollimating mirror 107 to the photoelectric system 104 under test, so that the autocollimating mirror 107 and the optical axis of the photoelectric system 104 under test are fixedly connected; adjust the position and orientation of the autocollimating tube 108 so that the outgoing light in the autocollimating tube 108 returns to the detector 106 of the autocollimating tube 108 after being reflected by the autocollimating mirror 107.

[0067] Step 5: Excite the dynamic target source 101 according to the test type; sample the target motion feedback in the dynamic target source 101 and sample the optical axis motion angle of the photoelectric system 104 under test in the collimating tube 108.

[0068] Step six: Perform data analysis on the information obtained from sampling in step five to obtain the closed-loop tracking performance of the tested optoelectronic system 104.

[0069] The following is combined with Figure 3 The test process of this embodiment is explained.

[0070] Step 300: Proceed to the performance tracking test process;

[0071] Step 301: Power on the dynamic target source 101, including powering on the composite light source and performing closed-loop control on the target motion system, and simultaneously powering on the autocollimating light tube 108.

[0072] Step 302: Power on the photoelectric system 104 under test and control the optical axis 105 of the photoelectric system under test to point in the direction of the dynamic target source 101;

[0073] Step 303: The position and attitude of the dynamic target source 101 are adjusted by the dynamic target source adjustment mechanism 113 on the optical platform 112. At the same time, the position, attitude and optical axis pointing of the photoelectric system under test 104 are adjusted to complete the optical axis alignment of the dynamic target source 101 and the photoelectric system under test 104, so that the image of the target plate 202 in the dynamic target source 101 appears on the focal plane of the detector 106 of the photoelectric system under test 104.

[0074] Step 304: Attach the autocollimating mirror 107 to the photoelectric system under test 104, so that the autocollimating mirror 107 is fixedly connected to the optical axis 105 of the photoelectric system under test; adjust the position and orientation of the autocollimating tube 108 so that the outgoing light in the autocollimating tube 108 returns to the detector of the autocollimating tube 108 after being reflected by the autocollimating mirror 107 fixedly connected to the optical axis 105 of the photoelectric system under test.

[0075] Step 305: Excite the dynamic target source according to the test type. The test types in this invention are divided into frequency domain testing and time domain testing. Frequency domain testing can measure the closed-loop frequency characteristics of the photoelectric tracking system; time domain testing can measure the tracking deviation of the photoelectric tracking system. Specifically, the excitation of the dynamic target source in this invention is as follows: for frequency domain testing, random signals, swept-frequency signals, etc.; for time domain testing, sinusoidal signals, step signals, square waves, or trapezoidal wave signals, etc.

[0076] Step 306: Sample the target motion feedback in the dynamic target source 101;

[0077] Step 307: Sample the motion angle of the optical axis 105 of the photoelectric system under test in the collimating tube 108;

[0078] Step 308: Perform data analysis on the information obtained from sampling in step 305 to obtain the closed-loop tracking performance of the photoelectric system 104 under test.

[0079] The target motion system controls the angular deflection of the parallel light output from the dynamic target source. This can typically be achieved using a fast-reflecting mirror or a similar servo control system capable of deflecting the optical path. In a preferred embodiment of the invention, a 2-axis fast-reflecting mirror is used to control the deflection of the optical axis output from the dynamic target source.

[0080] The principle of using an autocollimating light tube to measure the deflection angle of the optical axis 105 of the photoelectric system under test is as follows: the light emitted from the autocollimating light source in the autocollimating light tube passes through the reticle, the semi-reflective lens and the objective lens and is then projected onto the autocollimating mirror fixed to the detector of the pod under test. If the optical axis 105 of the photoelectric system under test is tilted, the light reflected by the autocollimating mirror will be reflected by the semi-reflective lens and the image of the reticle in the high-speed camera will also deviate from the zero position. The deflection of the optical axis can be measured by determining the position of this image.

[0081] In this embodiment, the frequency domain test metric is the closed-loop bandwidth. The closed-loop frequency response curve of the photoelectric system tracking loop is obtained by performing spectrum analysis on the input and output time domain signals. The time domain test metric is the tracking accuracy. The tracking accuracy is obtained by subtracting the input and output signals at the same time and calculating their root mean square.

[0082] The above description is merely a specific embodiment of this disclosure, but the scope of protection of this disclosure is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this disclosure should be included within the scope of protection of this disclosure. Therefore, the scope of protection of this disclosure should be determined by the scope of the claims.

Claims

1. A device for testing the closed-loop tracking performance of a photoelectric system, characterized in that, include: Optical platform, dynamic target source, autocollimating light tube, autocollimating mirror, and data analysis equipment; The optical platform includes a precision optical platform and a dynamic target source adjustment mechanism and an autocollimating tube adjustment mechanism installed on the precision optical platform. The dynamic target source adjustment mechanism and the autocollimating tube adjustment mechanism are used to precisely adjust the position and attitude of the dynamic target source and the autocollimating tube, respectively. The dynamic target source consists of a composite light source, a target plate, a target simulation system, and a target motion system. The target simulation system, target plate, and composite light source work together to provide radiation to the outside world, which is output in the form of parallel light; the target motion system controls the deflection angle of the parallel light under the drive of the data analysis equipment, and feeds back the actual deflection angle of the parallel light to the data analysis equipment; The autocollimating mirror is fixed to the detector in the photoelectric system, and the deflection angle of the optical axis of the photoelectric system under test is obtained through the autocollimating light tube. The data analysis equipment is configured to excite the target motion system, and collects the deflection angle of the parallel light fed back by the dynamic target source and the deflection angle of the optical axis of the photoelectric system fed back by the optical axis of the autocollimating tube. The data is analyzed to complete the closed-loop tracking performance test of the photoelectric system.

2. The photoelectric system closed-loop tracking performance testing device according to claim 1, characterized in that, The target motion system is a fast-reflecting mirror or a servo control system with a deflectable optical path.

3. The photoelectric system closed-loop tracking performance testing device according to claim 2, characterized in that, The light emitted from the autocollimating light source in the autocollimating tube passes through the reticle, the semi-reflective lens, and the objective lens before hitting the autocollimating mirror fixed to the detector of the photoelectric system under test. The light reflected by the autocollimating mirror is then reflected by the semi-reflective lens into the high-speed camera.

4. The photoelectric system closed-loop tracking performance testing device according to claim 3, characterized in that, The testing device includes frequency domain testing and time domain testing; frequency domain testing is used to obtain the closed-loop frequency response curve of the photoelectric system tracking loop; time domain testing is used to measure the tracking deviation of the photoelectric system tracking system.

5. The photoelectric system closed-loop tracking performance testing device according to claim 4, characterized in that, The specific method for stimulating dynamic target sources is as follows: When performing the frequency domain test, the test signal is a random signal or a swept frequency signal; when performing the time domain test, the test signal is a sine wave, a step signal, a square wave, or a trapezoidal wave signal.

6. The photoelectric system closed-loop tracking performance testing device according to claim 5, characterized in that, The judgment criterion for the frequency domain test is the closed-loop bandwidth, which is obtained by performing spectral analysis on the input and output time-domain signals to obtain the closed-loop frequency response curve of the photoelectric system tracking loop; the judgment criterion for the time domain test is the tracking accuracy, which is obtained by subtracting the input and output signals at the same time and calculating the root mean square.

7. The photoelectric system closed-loop tracking performance testing device according to claim 6, characterized in that, The control bandwidth of the target motion system is more than five times higher than the tracking bandwidth of the photoelectric system under test.

8. A method for testing the closed-loop tracking performance of an optoelectronic system, implemented by the optoelectronic system closed-loop tracking performance testing device according to any one of claims 1-7, is characterized in that, Includes the following steps: Step 1: Power on the dynamic target source, including powering on the composite light source and implementing closed-loop control of the target motion system, while simultaneously powering on the autocollimating light tube; Step 2: Power on the photoelectric system under test and control the optical axis of the photoelectric system under test to point in the direction of the dynamic target source; Step 3: Adjust the position and attitude of the dynamic target source through the dynamic target source adjustment mechanism on the optical platform, and at the same time adjust the position, attitude and optical axis pointing of the photoelectric system under test to complete the optical axis alignment of the dynamic target source and the photoelectric system under test, so that the image of the target plate in the dynamic target source appears on the focal plane of the detector of the photoelectric system under test. Step 4: Attach the autocollimating mirror to the photoelectric system under test and fix the autocollimating mirror and the optical axis of the photoelectric system under test; adjust the position and orientation of the autocollimating tube so that the outgoing light in the autocollimating tube returns to the detector of the autocollimating tube after being reflected by the autocollimating mirror. Step 5: Excite the dynamic target source according to the test type; sample the target motion feedback in the dynamic target source and sample the optical axis motion angle of the photoelectric system under test in the collimating tube; Step six: Perform data analysis on the information obtained from sampling in step five to obtain the closed-loop tracking performance of the tested optoelectronic system.

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